Virtual data write-in quantity test method, data write-in method, storage medium and memory

Abstract

The invention discloses a virtual data write-in quantity testing method, a data write-in method, a storage medium and a storer, the virtual data write-in quantity testing method is used for the storer, and the virtual data write-in quantity testing method comprises the following steps: selecting any open block as a target open block, and writing in data; reading data written in the target open block, and recording the number of error bits of the data of the target open block; sequentially writing a plurality of pieces of virtual data into the target open block, and executing the previous step once when each piece of virtual data is written; and when the number of the error bits recorded at the Nth time is less than the number of the error bits recorded at the (N-1) th time and greater than the number of the error bits recorded at the (N + 1) th time, recording the value N of the virtual data written into the target open block at the current time as the optimal number value of the virtual data written into the firmware. According to the method, the virtual data are continuously written, and the optimal quantity value of the virtual data written into the firmware is found through the quantity of the error bits, so that the stability of the written data is ensured.

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