Electronic stand-alone service life analysis method and related equipment
By acquiring the basic and degradation timing parameters of the electronic single-unit functional circuit, and combining them with a preset model library for parametric calculation, the problem of long life prediction cycle in the prior art is solved, and rapid and accurate life assessment is achieved.
Patent Information
- Application Number
- CN202511722465.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-11-21
- Publication Date
- 2026-04-24
AI Technical Summary
Existing technologies for predicting the lifespan of electronic devices are time-consuming and labor-intensive, making it difficult to meet the needs for rapid evaluation, especially during the product development stage.
By obtaining the basic parameters and degradation timing parameters of the internal functional circuit units of the electronic unit, and combining them with a preset model library, the lifespan of the electronic unit is determined by parametric calculation, thus avoiding physical accelerated testing and long-term storage testing.
It enables rapid and accurate assessment of the lifespan of electronic units, reduces costs and time consumption, and meets the needs of rapid assessment during the development phase.
Smart Images
Figure CN121920035A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of electronic single-unit life analysis technology, and in particular to an electronic single-unit life analysis method and related equipment. Background Technology
[0002] The operational reliability of electronic devices is closely related to their service life. If they continue to be used beyond their expected lifespan, their performance stability and operational safety cannot be effectively guaranteed. Therefore, accurate analysis and prediction of the lifespan of electronic devices is of great significance. However, current technologies for predicting the lifespan of electronic devices often require conducting lifespan tests on actual products. This is not only time-consuming and resource-intensive, but also fails to meet the practical need for rapid lifespan assessment, especially for products in the development stage. Summary of the Invention
[0003] In view of this, the purpose of this application is to propose a method and related equipment for analyzing the lifespan of electronic devices, so as to solve the problem of long and time-consuming prediction cycles for the lifespan of electronic devices in the prior art.
[0004] To achieve the above objectives, this application provides a method for analyzing the lifespan of an electronic unit, comprising the following steps: Acquire the electronic unit to be analyzed and identify the multiple functional circuit units inside the electronic unit to be analyzed; At least one target functional circuit unit is identified from among the plurality of said functional circuit units; Obtain the basic parameters of the target functional circuit unit, and obtain the degradation timing parameters of the target functional circuit unit over time. The lifetime of the electronic unit to be analyzed is determined based on the basic parameters and degradation timing parameters of at least one of the target functional circuit units. The basic parameters and the degradation timing parameters are both parameters used to characterize the signal transmission performance of the functional circuit unit.
[0005] Optionally, obtaining the degradation timing parameters of the target functional circuit unit over time includes: Based on the model number of the target functional circuit unit and the preset model library, obtain the functional circuit model corresponding to the target functional circuit unit, wherein the functional circuit model is a model of the signal transmission performance parameters of the target functional circuit unit changing over time during operation. Based on the functional circuit model, the degradation timing parameters of the target functional circuit unit over time are determined.
[0006] Optionally, determining the lifetime of the electronic unit to be analyzed based on the basic parameters and degradation timing parameters of the at least one target functional circuit unit includes: Based on the model of the electronic unit to be analyzed and the preset model library, obtain the overall model corresponding to the electronic unit to be analyzed; wherein, the overall model corresponding to the electronic unit to be analyzed is the signal transmission performance model of the electronic unit to be analyzed during operation, and the overall model includes the basic parameters of each functional circuit unit; The basic parameters of the target functional circuit unit in the overall model corresponding to the electronic unit to be analyzed are replaced with the degradation timing parameters of the target functional circuit unit to obtain an updated overall model, and the lifetime of the electronic unit is determined based on the updated overall model.
[0007] Optionally, replacing the basic parameters of the target functional circuit unit in the overall model corresponding to the electronic unit to be analyzed with the degradation timing parameters of the target functional circuit unit to obtain an updated overall model, and determining the lifetime of the electronic unit based on the updated overall model, includes: Replace the basic parameters of the target functional circuit unit in the overall model corresponding to the electronic unit to be analyzed with the degradation timing parameters of the target functional circuit unit, and determine the updated overall model; Based on the updated overall model, the degraded timing signal transmission performance data of the electronic unit to be analyzed is determined; Based on the degradation timing signal transmission performance data of the electronic unit to be analyzed, the lifetime of the electronic unit to be analyzed is determined.
[0008] Optionally, determining the lifetime of the electronic unit under analysis based on the degradation timing signal transmission performance data of the electronic unit under analysis includes: Based on the overall model corresponding to the electronic unit to be analyzed, the basic signal transmission performance data of the electronic unit to be analyzed are determined. Based on the basic signal transmission performance data and the degradation timing signal transmission performance data of the electronic unit to be analyzed, the lifetime of the electronic unit to be analyzed is determined.
[0009] Optionally, determining the lifetime of the electronic unit under analysis based on the degradation timing signal transmission performance data of the electronic unit under analysis includes: Based on the degradation timing signal transmission performance data and preset failure signal transmission performance data of the electronic unit to be analyzed, the lifespan of the electronic unit to be analyzed is determined.
[0010] Optionally, the determination of the degraded timing signal transmission performance data of the electronic unit to be analyzed based on the updated overall model includes: Based on the application environment of the electronic unit to be analyzed, the application environment parameters of the electronic unit to be analyzed are determined. Based on the updated overall model and the application environment parameters of the electronic unit to be analyzed, the degradation timing signal transmission performance data of the electronic unit to be analyzed is determined.
[0011] Optionally, the application environment includes temperature environment, humidity environment, and stress environment. Determining the application environment parameters of the electronic unit to be analyzed based on its application environment includes: Based on the temperature, humidity, and stress environments of the electronic unit to be analyzed, the temperature, humidity, and stress environment parameters of the electronic unit to be analyzed are determined. Based on the temperature, humidity, and stress environmental parameters of the electronic unit to be analyzed, the application environment parameters of the electronic unit to be analyzed are determined.
[0012] Based on the same inventive concept, this disclosure also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable by the processor, wherein the processor implements the method described above when executing the computer program.
[0013] Based on the same inventive concept, this disclosure also provides a non-transitory computer-readable storage medium that stores computer instructions for causing a computer to perform the method described above.
[0014] Based on the same inventive concept, this disclosure also provides a computer program product, including computer program instructions that, when run on a computer, cause the computer to perform the method described above.
[0015] As described above, this analysis method identifies a target functional circuit unit from multiple functional circuit units in the electronic device under analysis. This target functional circuit unit is related to the core function of the electronic device under analysis. By using the basic parameters and degradation timing parameters of the target functional circuit unit, the lifetime of the electronic device under analysis can be determined. This is mainly because the degree of performance degradation of each target functional unit in the electronic device under analysis directly determines its lifetime. The basic parameters of the target functional circuit unit serve as its initial performance benchmark, reflecting its signal transmission performance before degradation. The degradation timing parameters of the target functional unit reflect its signal transmission performance value over time. Therefore, by using these two values, the performance of each functional circuit unit can be accurately quantified as it gradually degrades from its initial state over time. Combined with the relationship between the performance of each functional circuit unit and the overall performance of the electronic device, the overall lifetime of the electronic device under analysis can be obtained. This analysis method eliminates the need for physical accelerated testing or long-term storage testing, thus avoiding the problems of high product loss, long cycle, and high cost in traditional testing. It also ensures the accuracy of life analysis results through parametric calculations, effectively meeting the needs of rapid assessment of the life of electronic units during the development stage. Attached Figure Description
[0016] To more clearly illustrate the technical solutions in this application or related technologies, the drawings used in the description of the embodiments or related technologies will be briefly introduced below. Obviously, the drawings described below are only embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0017] Figure 1 This is a flowchart illustrating the electronic unit lifetime analysis method in an embodiment of this application; Figure 2 This is a schematic diagram illustrating the variation of the standing wave ratio (VSWR) of a surface acoustic wave bandpass filter according to an embodiment of this application. Figure 3 This is a schematic diagram illustrating the gain variation of a surface acoustic wave bandpass filter according to an embodiment of this application; Figure 4 This is a schematic diagram illustrating the variation of the standing wave ratio (VSWR) of the duplexer in an embodiment of this application; Figure 5 This is a schematic diagram illustrating the changes in the long-term storage performance parameters of the microwave electronic product S11 according to an embodiment of this application; Figure 6 This is a schematic diagram illustrating the changes in the long-term storage performance parameters of the microwave electronic product S21, as shown in an embodiment of this application.
[0018] Figure 7 This application illustrates the changes in the long-term storage performance parameters of microwave electronic products, specifically the standing wave ratio (VSWR) parameter. Figure 8 Plot of probability density and cumulative distribution function of target annual gain parameter for equivalent storage of microwave electronic products; Figure 9 A graph showing the change in the reliability of microwave electronic products over storage years; Figure 10 This is a schematic diagram of the electronic device. Detailed Implementation
[0019] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with specific embodiments and the accompanying drawings.
[0020] It should be noted that, unless otherwise defined, the technical or scientific terms used in the embodiments of this application should have the ordinary meaning understood by one of ordinary skill in the art to which this application pertains. The terms "first," "second," and similar terms used in the embodiments of this application do not indicate any order, quantity, or importance, but are merely used to distinguish different components. Terms such as "comprising" or "including" mean that the element or object preceding the word encompasses the elements or objects listed after the word and their equivalents, without excluding other elements or objects. Terms such as "connected" or "linked" are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. Terms such as "upper," "lower," "left," and "right" are only used to indicate relative positional relationships; when the absolute position of the described object changes, the relative positional relationship may also change accordingly.
[0021] As mentioned in the background, there is an inseparable link between the operational reliability of electronic components and their service life. Stable service life is a core prerequisite for the long-term reliable operation of electronic components. In the overall operating system of electronic equipment, the electronic component, as a basic building block, directly affects the overall performance stability and operational safety of the equipment. Once an electronic component continues to operate beyond its preset lifespan, problems such as the aging of internal materials and the drift of performance parameters will gradually become apparent. This may not only lead to decreased operating efficiency and malfunctions, but also potentially cause safety hazards such as short circuits and overheating, resulting in unpredictable losses to related application scenarios. Therefore, accurate analysis and scientific prediction of the service life of electronic components are crucial for ensuring the safe and stable operation of electronic equipment and optimizing product design and maintenance strategies. This has significant practical implications and application value in various fields such as industrial production, aerospace, and electronic communications.
[0022] However, current technologies for predicting the lifespan of electronic devices still face many practical bottlenecks. Most mainstream methods rely on conducting accelerated or conventional life tests on actual products to observe the failure process and deduce lifespan patterns. While these methods can obtain relatively intuitive lifespan data, they have significant limitations: firstly, the testing cycle is generally long, especially for high-reliability, long-life electronic devices, often requiring months or even years to complete, severely impacting product development and iteration progress; secondly, the testing process requires a large investment of samples, specialized equipment, and professional personnel, resulting in high testing costs.
[0023] This problem is particularly prominent during the product development phase. Products in this phase are typically in a critical period of design optimization and performance verification, requiring rapid acquisition of electronic unit life assessment results to support decisions such as design adjustments and material selection optimization. Therefore, overcoming the limitations of existing life prediction technologies and exploring more efficient and economical electronic unit life assessment methods has become a pressing technical challenge for the industry.
[0024] The following is in conjunction with the appendix Figure 1-10 The embodiments of this application will be described in detail below.
[0025] A method for analyzing the lifespan of a single electronic device includes the following steps: S100: Acquire the electronic unit to be analyzed and determine the multiple functional circuit units inside the electronic unit to be analyzed; In this step, the electronic unit to be analyzed is a microwave radio frequency electronic unit as an example. The design drawings and electronic unit list of the radio frequency electronic unit are obtained from the product technical manual of the microwave radio frequency electronic unit. The electronic unit is composed of multiple electronic units. For example, the microwave radio frequency electronic unit includes three types of core functional circuit units: XND1100MEB model low noise amplifier (signal amplification unit), XG2185 model surface acoustic wave bandpass filter (signal filtering unit), and CD1S047-17(FH) model duplexer (multi-port signal splitting and combining unit).
[0026] S200: Determine at least one target functional circuit unit among the plurality of said functional circuit units; In this step, the target functional circuit unit is the functional circuit unit (e.g., component) related to the core function of the electronic unit to be analyzed. Taking the microwave radio frequency electronic unit mentioned above as an example, its core function is to stably amplify the target frequency signal and achieve transmit-receive isolation. Therefore, the signal amplification unit (which determines the signal amplification capability), the signal filtering unit (which determines the signal filtering accuracy), and the multi-port signal splitting and combining unit (which determines the transmit-receive signal isolation) are all its target functional circuit units.
[0027] S300: Obtain the basic parameters of the target functional circuit unit and obtain the degradation timing parameters of the target functional circuit unit over time; In this step, the basic parameters of the target functional circuit unit can be obtained from the instruction manual of the target functional circuit unit or by measurement using a measuring device. Taking the aforementioned microwave RF electronic unit as an example, the basic parameters of the signal amplification unit (which determines the signal amplification capability) are gain parameters, and the basic parameters of the signal filtering unit (which determines the signal filtering accuracy) and the multi-port signal combining / splitting unit (which determines the isolation between transmitted and received signals, i.e., port isolation and port transmission coefficient) are VSWR parameters. The timing parameters of the target functional circuit unit that degrade over time are the signal transmission performance parameters of the target functional circuit unit that degrade over time, and these degradation timing parameters can be obtained from the degradation timing model corresponding to each target functional circuit unit.
[0028] S400: Determine the lifetime of the electronic unit to be analyzed based on the basic parameters and degradation timing parameters of the at least one of the target functional circuit units; The basic parameters and the degradation timing parameters are both parameters used to characterize the signal transmission performance of the functional circuit unit.
[0029] In this step, the degree of performance degradation of each target functional unit in the electronic device under analysis directly determines its lifespan. Therefore, by using the basic parameters of the target functional circuit unit (serving as the initial performance benchmark of the target functional circuit unit, reflecting the normal state of the functional circuit unit before degradation) and the degradation timing parameters (reflecting the signal transmission performance values of each target functional circuit unit at different time points), the signal transmission performance values of each functional circuit unit degraded over time can be accurately quantified. Furthermore, based on the coupling relationship between the performance of each functional circuit unit and the overall performance of the electronic device, the lifespan of the electronic device under analysis can be derived. This analysis method eliminates the need for physical accelerated testing or long-term storage testing, avoiding the problems of high product wear, long cycles, and high costs associated with traditional testing. It also ensures the accuracy of lifespan analysis results through parametric calculations, effectively meeting the needs of rapid lifespan assessment for electronic devices during the development phase.
[0030] In addition, this analysis method can also accurately analyze the impact of a single functional circuit unit on the overall lifespan of the electronic unit under analysis. For example, if only the signal amplification unit is taken as the target functional circuit unit, and the parameters of the signal filtering unit and the multi-port signal splitting and combining unit are kept unchanged as the base values, the changes in the overall lifespan of the electronic unit under analysis can be observed through subsequent simulations when the signal amplification unit degrades individually. Similarly, the signal filtering unit and the multi-port signal splitting and combining unit can be taken as target units separately, and the impact analysis of each functional unit on the overall lifespan of the electronic unit under analysis can be carried out in sequence.
[0031] In this embodiment, the analysis method identifies a target functional circuit unit from multiple functional circuit units in the electronic device under analysis. This target functional circuit unit is related to the core function of the electronic device under analysis. By using the basic parameters and degradation timing parameters of the target functional circuit unit, the lifetime of the electronic device under analysis can be determined. This is mainly because the degree of performance degradation of each target functional unit in the electronic device under analysis directly determines its lifetime. The basic parameters of the target functional circuit unit serve as the initial performance benchmark of the functional circuit unit, reflecting the signal transmission performance of the functional circuit unit before degradation. The degradation timing parameters of the target functional unit reflect the signal transmission performance value of the target functional unit as it changes over time. Therefore, by using these two values, the performance of each functional circuit unit can be accurately quantified as it gradually degrades from its initial state over time. By combining the relationship between the performance of each functional circuit unit and the overall performance of the electronic device, the overall lifetime of the electronic device under analysis can be obtained. This analysis method eliminates the need for physical accelerated testing or long-term storage testing, thus avoiding the problems of high product loss, long cycle, and high cost in traditional testing. It also ensures the accuracy of life analysis results through parametric calculations, effectively meeting the needs of rapid assessment of the life of electronic units during the development stage.
[0032] In some embodiments, in step S300, obtaining the degradation timing parameters of the target functional circuit unit over time includes: S301: Based on the model number of the target functional circuit unit and the preset model library, obtain the functional circuit model corresponding to the target functional circuit unit, wherein the functional circuit model is a model of the signal transmission performance parameters of the target functional circuit unit changing over time during operation. In this step, the preset model library is constructed based on historical test data, accelerated aging test results, and industry standard degradation patterns of a massive amount of similar functional circuit units. Each model is associated with the electronic unit model identifier and includes key attributes such as model type, parameter range, applicable environment, and confidence level. Taking the aforementioned microwave RF electronic units as examples, such as the XND1100MEB low-noise amplifier (signal amplification unit), XG2185 surface acoustic wave bandpass filter (signal filtering unit), and CD1S047-17(FH) duplexer (multi-port signal splitting and combining unit), the model keywords of each target unit (such as "XND1100MEB" and "XG2185") are extracted and precisely matched with the model index in the preset model library to automatically select the corresponding functional circuit model. For example, the signal amplification unit matches the power-law degradation model, the signal filtering unit matches the linear degradation model, and the multi-port signal splitting and combining unit matches the exponential degradation model combined with the Arrhenius equation.
[0033] S302: Based on the functional circuit model, determine the degradation timing parameters of the target functional circuit unit as it degrades over time.
[0034] In this step, the expected storage duration (e.g., 0-10 years) of the electronic unit to be analyzed is input into the matched functional circuit model. The model will automatically calculate the performance parameter values of the target functional circuit unit at each time node based on the built-in degradation equation, and finally output the performance parameter values corresponding to the time nodes, i.e., degradation timing parameters. For example, the signal amplification unit has a gain of 35dB at 0 years, 32dB at 3 years, 28.5dB at 8 years, and 27dB at 10 years, clearly showing the degradation trajectory of the target functional circuit unit's performance over time, providing accurate data support for the subsequent overall lifespan analysis of the electronic unit.
[0035] In this embodiment, based on the model number of the target functional circuit unit and the preset model library, the corresponding functional circuit model is obtained, thereby saving the tedious process of building a model from scratch and greatly improving the efficiency of obtaining the degradation timing parameters of the target functional circuit unit. The functional circuit model will automatically calculate the performance parameter values of the target functional circuit unit at each time node based on the built-in degradation equation, and finally output the performance parameter values corresponding to the time nodes, providing accurate data support for the overall life analysis of the electronic unit to be analyzed.
[0036] In some embodiments, in step S400, determining the lifetime of the electronic unit to be analyzed based on the basic parameters and degradation timing parameters of the at least one target functional circuit unit includes: S401: Based on the model of the electronic unit to be analyzed and the preset model library, obtain the overall model corresponding to the electronic unit to be analyzed; wherein, the overall model corresponding to the electronic unit to be analyzed is the signal transmission performance model of the electronic unit to be analyzed during operation, and the overall model includes the basic parameters of each functional circuit unit. In this step, based on the model of the electronic unit to be analyzed, the corresponding overall signal transmission performance model is retrieved from the preset model library. This overall model includes the basic parameters of each functional circuit unit. Essentially, this overall model is a collection of sub-models corresponding to each target functional circuit unit. It should be noted that these sub-models are not the functional circuit models described earlier. The function of the functional circuit models described earlier is to generate degenerate timing parameters. These degenerate timing parameters ultimately replace the basic parameters and are substituted into the sub-models to obtain the updated overall model. This updated overall model can output the actual signal data of the electronic unit to be analyzed based on the input actual signal data.
[0037] S402: Replace the basic parameters of the target functional circuit unit in the overall model corresponding to the electronic unit to be analyzed with the degradation timing parameters of the target functional circuit unit to obtain an updated overall model, and determine the lifetime of the electronic unit based on the updated overall model.
[0038] In this step, each sub-model in the overall model of the microwave RF electronic unit can adopt the standard two-port / three-port network model (S2P / S3P model) of the microwave electronic unit. Each sub-model includes basic parameters describing its own signal transmission performance. The sub-model can output the actual signal data of the corresponding functional circuit unit based on the actual input signal data. The basic parameters and degradation timing parameters need to be standardized in terms of unit and form through a unified conversion logic. For example, for the two-port S2P model corresponding to the XG2185 surface acoustic wave bandpass filter and the three-port S3P model corresponding to the CD1S047-17(FH) duplexer, the basic parameters and degradation timing parameters are expressed as standing wave ratios. The S11 parameters need to be calculated in reverse using formula (1), and then the S11 parameters are converted to dB units using formula (2) to complete the standardization of the basic parameters. The following are the specific expressions of formula (1) and formula (2): (1) Where VSWR is the standing wave ratio and S11 is the input signal reflection parameter; (2) Where S is the signal performance parameter.
[0039] For the two-port S2P model corresponding to the XND1100MEB low-noise amplifier, its basic parameters and degradation timing parameters are parameters that characterize the signal amplification capability (directly corresponding to the S21 parameters), and only need to be converted to dB units through the above formula (2).
[0040] After all basic parameters and degradation timing parameters are standardized, the overall model can operate normally and output corresponding signal data normally from the input signal data.
[0041] Based on the simulation analysis results of microwave electronic product performance degradation, the changes in performance parameters over different storage times are obtained. The dispersion of performance parameters for the target storage life is analyzed, and a storage lifetime distribution is fitted to calculate storage reliability. Due to data uncertainty, the performance parameters obtained for the target storage life can be expressed as follows: Statistical analysis of performance parameter data using normal distribution or other distributions can be represented by the following distribution types:
[0042] If the performance threshold is M, then the formula can be used: The reliability of the target storage life performance parameters is calculated, and the specific formula is determined by combining the performance threshold as the upper or lower boundary.
[0043] For each target sub-model (corresponding to the target functional circuit unit) in the overall model, its basic parameters (i.e., signal transmission parameters characterizing the initial working state of the functional circuit unit) are first located. Then, according to preset aging time nodes (such as "3 years", "8 years", etc.), the degradation timing parameters corresponding to those times are replaced with the original basic parameters. For example, to simulate the state of an electronic unit "aging for X years", the degradation timing parameters corresponding to "X years" in all target sub-models are replaced with the basic parameters of each sub-model one by one. After the replacement is completed, the overall model that originally characterized the initial normal working state of the electronic unit to be analyzed is updated to a "potential performance damage model after X years of aging", which can accurately reflect the performance state of the electronic unit to be analyzed at that time node, thereby determining the lifespan of the electronic unit to be analyzed.
[0044] In this embodiment, by calling the overall model corresponding to the electronic unit under analysis (i.e., the signal transmission performance model, which includes the basic parameters of each functional circuit unit), and then replacing the corresponding basic parameters in the overall model with the degradation timing parameters of the target functional circuit unit, an updated aging potential performance damage model is finally obtained. Based on this model, the performance degradation data for each year during the operation of the electronic unit under analysis can be accurately obtained, effectively ensuring the accuracy of the life assessment of the electronic unit under analysis.
[0045] In some embodiments, in step S402, replacing the basic parameters of the target functional circuit unit in the overall model corresponding to the electronic unit to be analyzed with the degradation timing parameters of the target functional circuit unit to obtain an updated overall model, and determining the lifetime of the electronic unit based on the updated overall model, includes: S4021: Replace the basic parameters of the target functional circuit unit in the overall model corresponding to the electronic unit to be analyzed with the degradation timing parameters of the target functional circuit unit, and determine the updated overall model; S4022: Determine the degraded timing signal transmission performance data of the electronic unit to be analyzed based on the updated overall model; In this step, the updated overall model is imported into microwave simulation software (such as ADS). By inputting standard test signals, the output signal data of the electronic unit under analysis is obtained. By comparing the input standard test signal data with the output signal data, the degradation time-series signal transmission performance data (such as signal amplification factor, reflection ratio, transmission loss, etc.) at the aging node is calculated. The updated overall model is obtained at preset time intervals (such as annually), and the above simulation operation is repeated to obtain the degradation time-series signal transmission performance data of the electronic unit under analysis from its initial state to aging failure, forming a complete performance degradation time series.
[0046] S4023: Determine the lifetime of the electronic unit under analysis based on the degradation timing signal transmission performance data of the electronic unit under analysis.
[0047] In this step, the degradation timing signal transmission performance data of the electronic unit to be analyzed is directly related to the lifespan of the electronic unit to be analyzed. For example, if the degradation timing signal transmission performance data of the electronic unit to be analyzed decreases by 40% compared with the initial signal transmission performance data, then the time point corresponding to the degradation timing signal transmission performance data is the lifespan of the electronic unit to be analyzed.
[0048] In this embodiment, the method of determining the lifespan of the electronic unit under analysis by using the degradation timing signal transmission performance data of the electronic unit under analysis is relatively accurate, supported by clear regular data, and can effectively avoid missing key aging stages.
[0049] In some embodiments, in step S4023, determining the lifetime of the electronic unit to be analyzed based on the degradation timing signal transmission performance data of the electronic unit to be analyzed includes: Based on the overall model corresponding to the electronic unit to be analyzed, the basic signal transmission performance data of the electronic unit to be analyzed are determined. In this step, based on the overall model corresponding to the electronic unit to be analyzed (i.e., the model containing the initial basic parameters of each functional circuit unit in step S401), the initial state signal transmission performance test of the electronic unit to be analyzed is carried out through microwave simulation software: the standard test signal consistent with the degradation test (the same as the standard test signal in step S4022) is input into the model, and after collecting the output signal data, the basic signal transmission performance data of the electronic unit to be analyzed under the unaged and normal working state is calculated to quantify the initial performance of the electronic unit to be analyzed.
[0050] Based on the basic signal transmission performance data and the degradation timing signal transmission performance data of the electronic unit to be analyzed, the lifetime of the electronic unit to be analyzed is determined.
[0051] In this step, the basic signal transmission performance data and the degraded timing signal transmission performance data obtained in S4022 need to be analyzed. For example, if the degraded timing signal transmission performance data drops to a preset threshold of the basic signal transmission performance data, then the corresponding number of years is the lifespan of the electronic unit to be analyzed. For example, it is stipulated that when the signal amplification factor drops below 40% of the initial basic data, the electronic unit cannot meet the working requirements; when the signal amplification factor (or other core performance indicators) at a certain time point first reaches the preset failure standard, the time point corresponding to that point is the lifespan of the electronic unit to be analyzed.
[0052] This embodiment uses basic signal transmission performance data as a reference benchmark and compares it with degraded timing signal transmission performance data to determine the lifespan of the electronic unit under analysis, effectively improving the accuracy and rationality of lifespan determination.
[0053] In some embodiments, in step S4023, determining the lifetime of the electronic unit to be analyzed based on the degradation timing signal transmission performance data of the electronic unit to be analyzed includes: Based on the degradation timing signal transmission performance data and preset failure signal transmission performance data of the electronic unit to be analyzed, the lifespan of the electronic unit to be analyzed is determined.
[0054] In this step, the preset failure signal transmission performance data is a critical performance value that the electronic unit cannot meet the operational requirements of, defined in advance based on the actual application scenario, industry performance standards, or design specifications of the electronic unit to be analyzed. Taking a microwave communication electronic unit as an example, if it needs to guarantee a signal amplification factor of at least 28dB in the communication system to achieve effective signal coverage, then "signal amplification factor ≤ 28dB" is set as the preset failure signal transmission performance data. From the degradation time-series signal transmission performance data obtained from S4022, the core performance indicators (such as amplification factor and VSWR) for each time node (such as each year or every two years) are extracted and matched one by one with the preset failure data. Taking the amplifier as an example again, the degradation time-series data shows: amplification factor of 35dB in year 1, 32dB in year 5, and 27dB in year 8. When comparing to year 8, the amplification factor (27dB) of that year is lower than the preset failure threshold (28dB) for the first time, indicating that the electronic unit can no longer meet the operational requirements of signal coverage and has reached a failure state. Ultimately, the time point when the performance index first reaches the preset failure data is directly determined as the lifespan of the electronic unit to be analyzed. The entire process does not require additional reference to other benchmarks. Lifespan determination can be completed quickly and clearly simply by directly comparing the degradation data and failure standards. Moreover, the determination results are highly consistent with the actual working requirements of the electronic unit.
[0055] In some embodiments, in step S4022, determining the degraded timing signal transmission performance data of the electronic unit to be analyzed based on the updated overall model includes: Based on the application environment of the electronic unit to be analyzed, the application environment parameters of the electronic unit to be analyzed are determined. Based on the updated overall model and the application environment parameters of the electronic unit to be analyzed, the degradation timing signal transmission performance data of the electronic unit to be analyzed is determined.
[0056] In addition, the application environment includes temperature environment, humidity environment, and stress environment. Determining the application environment parameters of the electronic unit to be analyzed based on its application environment includes: Based on the temperature, humidity, and stress environments of the electronic unit to be analyzed, the temperature, humidity, and stress environment parameters of the electronic unit to be analyzed are determined. Based on the temperature, humidity, and stress environmental parameters of the electronic unit to be analyzed, the application environment parameters of the electronic unit to be analyzed are determined.
[0057] Specifically, incorporating the application environment parameters of the electronic unit under analysis into the degradation timing signal transmission performance data can recreate the actual usage scenario of the electronic unit under analysis, making the performance degradation data more consistent with actual working conditions. This is because the performance degradation of microwave electronic units (such as signal amplification attenuation and increased signal reflectivity) is significantly affected by environmental factors such as temperature, humidity, and stress. High temperatures accelerate component aging, high humidity easily leads to circuit corrosion, and mechanical or electrical stress may damage signal transmission paths. Therefore, the application environment needs to be broken down into three core dimensions: temperature environment, humidity environment, and stress environment, and then converted into quantifiable parameters one by one. For the temperature environment, time-series temperature data is extracted based on the deployment scenario of the electronic unit (such as outdoor communication base stations and indoor equipment rooms). For example, for outdoor base stations, the annual average operating temperature range (-20℃~40℃) and the duration of high temperature (>40℃) each month need to be statistically analyzed to form temperature environment parameters. For the humidity environment, based on the climate of the deployment area (such as coastal high salt spray areas and northern dry areas), the monthly average relative humidity (such as 60% RH~90% RH in coastal areas), the percentage of high humidity days, or the salt spray influence coefficient are statistically analyzed to form humidity environment parameters. For the stress environment, the vibration frequency, amplitude, etc. of the electronic unit to be analyzed are recorded to form stress environment parameters.
[0058] Based on the temperature, humidity, and stress environmental parameters of the electronic unit to be analyzed, the application environment parameters of the electronic unit are determined. For example, the temperature, humidity, and stress environmental parameters are first converted into influence coefficients ranging from 0 to 1, and then integrated into time-series application environment parameters according to their respective weights in relation to the degradation of the electronic unit.
[0059] After determining the application environment parameters, they will be imported into microwave simulation software (such as ADS) along with the updated overall model. The software will bind the environmental parameters corresponding to the time nodes to each sub-model of the model and automatically correct the performance of the sub-models. For example, the application environment parameters can be used as degradation influence coefficients and multiplied with the output data of each sub-model to finally obtain the overall performance output of the electronic unit that reflects the dynamic influence of the environment.
[0060] In this embodiment, the application environment parameters of the electronic unit to be analyzed are introduced into the degradation timing signal transmission performance data, which can restore the real usage scenario of the electronic unit to be analyzed and make the performance degradation data more consistent with the actual working conditions.
[0061] In some embodiments, taking a microwave electronic product with three typical components such as the CD1S047-17(FH) duplexer, XND1100MEB low-noise amplifier, and XG2185 surface acoustic wave bandpass filter as an example, if the signal transmission performance of the components deteriorates, it will affect the signal stability of the entire microwave electronic product, thereby causing abnormal output of the microwave electronic product.
[0062] The typical storage lifetime characterization parameter for surface acoustic wave bandpass filters and duplexers is the standing wave ratio (SWR), which is calculated using formula (1) as the S11 parameter. The typical storage lifetime characterization parameter for low-noise amplifiers is the gain, which is the transmission characteristic after conversion of the S21 parameter. The typical degradation timing parameter changes of the above three components are shown in [reference needed]. Figures 2-4 As shown.
[0063] Through the analysis method in this embodiment, such as Figure 5 and Figure 6 As shown, the degradation timing parameters of three typical components, namely CD1S047-17(FH) duplexer, XND1100MEB low noise amplifier, and XG2185 surface acoustic wave bandpass filter, are used to replace the basic parameters in the overall model of the microwave electronic product. The degradation timing signal transmission performance data (S11 parameter and S21 parameter) of the microwave electronic product are obtained by simulation calculation.
[0064] Converting the S11 parameters of microwave electronic products to VSWR parameters yields the changes in long-term storage performance parameters of the VSWR parameters. Figure 7 As shown.
[0065] according to Figures 6-7The results show that since the VSWR is an ideal value, it can be regarded as the first half of the microwave electronic product being an ideal value, and gradually increasing in the second half, but the rate of increase is relatively slow. The S21 parameter of the microwave electronic product can be expressed as a gain parameter. As the storage time increases, the gain parameter of the microwave electronic product shows a significant downward trend, which has a significant impact on the signal output of the microwave electronic product. It should be analyzed as a key parameter for the characterization of storage life.
[0066] In this embodiment, the gain parameter is selected as the lifetime characterization parameter of the microwave electronic product, and the performance failure threshold of the gain parameter is preset to 28: that is, when the gain parameter obtained by simulation is lower than 28, the corresponding microwave electronic product is determined to have reached the storage failure state.
[0067] Using the above analysis method, we first simulate the state of microwave electronic products when they reach the target storage life, and then statistically analyze the gain parameter data of the products under this state to obtain their probability density and cumulative distribution function graph. Figure 8 ),like Figure 8 As shown, the gain parameters are mainly concentrated around 28~28.5, which can help determine the failure probability; Figure 9 This shows the reliability changes of microwave electronic products in different storage years. The product's storage reliability is almost 1 for the first 20 years, and drops sharply after 20 years, indicating that its storage life is about 20 years.
[0068] It should be noted that the method in this embodiment can be executed by a single device, such as a computer or server. The method can also be applied in a distributed scenario, where multiple devices cooperate to complete the task. In such a distributed scenario, one of these devices may execute only one or more steps of the method in this embodiment, and the multiple devices will interact with each other to complete the method described.
[0069] It should be noted that the above description describes some embodiments of this application. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recorded in the claims can be performed in a different order than that shown in the above embodiments and still achieve the desired result. Furthermore, the processes depicted in the drawings do not necessarily require a specific or sequential order to achieve the desired result. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.
[0070] Based on the same inventive concept, corresponding to the methods of any of the above embodiments, this application also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the electronic single-machine lifetime analysis method described in any of the above embodiments.
[0071] Figure 10 This embodiment illustrates a more specific hardware structure of an electronic device. The device may include a processor 1010, a memory 1020, an input / output interface 1030, a communication interface 1040, and a bus 1050. The processor 1010, memory 1020, input / output interface 1030, and communication interface 1040 are interconnected internally via the bus 1050.
[0072] The processor 1010 can be implemented using a general-purpose CPU (Central Processing Unit), microprocessor, application-specific integrated circuit (ASIC), or one or more integrated circuits, and is used to execute relevant programs to implement the technical solutions provided in the embodiments of this specification.
[0073] The memory 1020 can be implemented in the form of ROM (Read Only Memory), RAM (Random Access Memory), static storage device, dynamic storage device, etc. The memory 1020 can store the operating system and other applications. When the technical solutions provided in the embodiments of this specification are implemented by software or firmware, the relevant program code is stored in the memory 1020 and is retrieved and executed by the processor 1010.
[0074] The input / output interface 1030 is used to connect input / output modules to realize information input and output. Input / output modules can be configured as components within the device (not shown in the figure) or externally connected to the device to provide corresponding functions. Input devices may include keyboards, mice, touchscreens, microphones, various sensors, etc., while output devices may include displays, speakers, vibrators, indicator lights, etc.
[0075] The communication interface 1040 is used to connect a communication module (not shown in the figure) to enable communication between this device and other devices. The communication module can communicate via wired means (such as USB, Ethernet cable, etc.) or wireless means (such as mobile network, WIFI, Bluetooth, etc.).
[0076] Bus 1050 includes a pathway for transmitting information between various components of the device, such as processor 1010, memory 1020, input / output interface 1030, and communication interface 1040.
[0077] It should be noted that although the above-described device only shows the processor 1010, memory 1020, input / output interface 1030, communication interface 1040, and bus 1050, in specific implementations, the device may also include other components necessary for normal operation. Furthermore, those skilled in the art will understand that the above-described device may only include the components necessary for implementing the embodiments of this specification, and not necessarily all the components shown in the figures.
[0078] The electronic devices described in the above embodiments are used to implement the corresponding electronic single-unit lifetime analysis method in any of the foregoing embodiments, and have the beneficial effects of the corresponding method embodiments, which will not be repeated here.
[0079] Based on the same inventive concept, corresponding to the methods of any of the above embodiments, this application also provides a non-transitory computer-readable storage medium storing computer instructions for causing the computer to execute the electronic single-machine lifetime analysis method as described in any of the above embodiments.
[0080] The computer-readable medium of this embodiment includes permanent and non-permanent, removable and non-removable media, and information storage can be implemented by any method or technology. Information can be computer-readable instructions, data structures, program modules, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other non-transfer medium that can be used to store information accessible by a computing device.
[0081] The computer instructions stored in the storage medium of the above embodiments are used to cause the computer to execute the electronic single-machine lifetime analysis method as described in any of the above embodiments, and have the beneficial effects of the corresponding method embodiments, which will not be repeated here.
[0082] It is understood that before using the technical solutions of the various embodiments in this disclosure, users will be informed of the type, scope of use, and usage scenarios of the personal information involved in an appropriate manner, and user authorization will be obtained.
[0083] For example, upon receiving a user's active request, a prompt message is sent to the user to explicitly inform them that the requested operation will require the acquisition and use of the user's personal information. This allows the user to independently choose, based on the prompt message, whether to provide personal information to the software or hardware such as electronic devices, applications, servers, or storage media performing the operations of this disclosed technical solution.
[0084] As an optional but not limited implementation, in response to a user's active request, sending a prompt message to the user can be done via a pop-up window, where the prompt message can be presented in text format. Furthermore, the pop-up window can also include a selection control allowing the user to choose "agree" or "disagree" to provide personal information to the electronic device.
[0085] It is understood that the above notification and user authorization process are merely illustrative and do not constitute a limitation on the implementation of this disclosure. Other methods that comply with relevant laws and regulations may also be applied to the implementation of this disclosure.
[0086] Those skilled in the art should understand that the discussion of any of the above embodiments is merely exemplary and is not intended to imply that the scope of this application is limited to these examples; under the concept of this application, the technical features of the above embodiments or different embodiments can also be combined, the steps can be implemented in any order, and there are many other variations of different aspects of the embodiments of this application as described above, which are not provided in detail for the sake of brevity.
[0087] Additionally, to simplify the description and discussion, and to avoid obscuring the embodiments of this application, the well-known power / ground connections to integrated circuit (IC) chips and other components may or may not be shown in the provided drawings. Furthermore, the apparatus may be shown in block diagram form to avoid obscuring the embodiments of this application, and this also takes into account the fact that the details of the implementation of these block diagram apparatuses are highly dependent on the platform on which the embodiments of this application will be implemented (i.e., these details should be fully understood by those skilled in the art). While specific details (e.g., circuits) have been set forth to describe exemplary embodiments of this application, it will be apparent to those skilled in the art that the embodiments of this application can be implemented without these specific details or with variations thereof. Therefore, these descriptions should be considered illustrative rather than restrictive.
[0088] Although this application has been described in conjunction with specific embodiments thereof, many substitutions, modifications, and variations of these embodiments will be apparent to those skilled in the art from the foregoing description. For example, other memory architectures (e.g., dynamic RAM (DRAM)) may be used with the embodiments discussed.
[0089] The embodiments of this application are intended to cover all such substitutions, modifications, and variations that fall within the broad scope of the claims of this application. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the embodiments of this application should be included within the protection scope of this application.
Claims
1. A method for analyzing the lifespan of a single electronic device, characterized in that, Includes the following steps: Acquire the electronic unit to be analyzed and identify the multiple functional circuit units inside the electronic unit to be analyzed; At least one target functional circuit unit is identified from among the plurality of said functional circuit units; Obtain the basic parameters of the target functional circuit unit, and obtain the degradation timing parameters of the target functional circuit unit over time. The lifetime of the electronic unit to be analyzed is determined based on the basic parameters and degradation timing parameters of at least one of the target functional circuit units. The basic parameters and the degradation timing parameters are both parameters used to characterize the signal transmission performance of the functional circuit unit.
2. The method according to claim 1, characterized in that, The step of obtaining the degradation timing parameters of the target functional circuit unit over time includes: Based on the model number of the target functional circuit unit and the preset model library, obtain the functional circuit model corresponding to the target functional circuit unit, wherein the functional circuit model is a model of the signal transmission performance parameters of the target functional circuit unit changing over time during operation. Based on the functional circuit model, the degradation timing parameters of the target functional circuit unit over time are determined.
3. The method according to claim 2, characterized in that, Determining the lifetime of the electronic unit to be analyzed based on the basic parameters and degradation timing parameters of the at least one of the target functional circuit units includes: Based on the model of the electronic unit to be analyzed and the preset model library, obtain the overall model corresponding to the electronic unit to be analyzed; wherein, the overall model corresponding to the electronic unit to be analyzed is the signal transmission performance model of the electronic unit to be analyzed during operation, and the overall model includes the basic parameters of each functional circuit unit; The basic parameters of the target functional circuit unit in the overall model corresponding to the electronic unit to be analyzed are replaced with the degradation timing parameters of the target functional circuit unit to obtain an updated overall model, and the lifetime of the electronic unit is determined based on the updated overall model.
4. The method according to claim 3, characterized in that, The step of replacing the basic parameters of the target functional circuit unit in the overall model corresponding to the electronic unit to be analyzed with the degradation timing parameters of the target functional circuit unit to obtain an updated overall model, and determining the lifetime of the electronic unit based on the updated overall model, includes: Replace the basic parameters of the target functional circuit unit in the overall model corresponding to the electronic unit to be analyzed with the degradation timing parameters of the target functional circuit unit, and determine the updated overall model; Based on the updated overall model, the degraded timing signal transmission performance data of the electronic unit to be analyzed is determined; Based on the degradation timing signal transmission performance data of the electronic unit to be analyzed, the lifetime of the electronic unit to be analyzed is determined.
5. The method according to claim 4, characterized in that, The determination of the lifetime of the electronic unit under analysis based on the degradation timing signal transmission performance data of the electronic unit under analysis includes: Based on the overall model corresponding to the electronic unit to be analyzed, the basic signal transmission performance data of the electronic unit to be analyzed are determined. Based on the basic signal transmission performance data and the degradation timing signal transmission performance data of the electronic unit to be analyzed, the lifetime of the electronic unit to be analyzed is determined.
6. The method according to claim 4, characterized in that, The determination of the lifetime of the electronic unit under analysis based on the degradation timing signal transmission performance data of the electronic unit under analysis includes: Based on the degradation timing signal transmission performance data and preset failure signal transmission performance data of the electronic unit to be analyzed, the lifespan of the electronic unit to be analyzed is determined.
7. The method according to claim 4, characterized in that, The updated overall model determines the degraded timing signal transmission performance data of the electronic unit to be analyzed, including: Based on the application environment of the electronic unit to be analyzed, the application environment parameters of the electronic unit to be analyzed are determined. Based on the updated overall model and the application environment parameters of the electronic unit to be analyzed, the degradation timing signal transmission performance data of the electronic unit to be analyzed is determined.
8. The method according to claim 7, characterized in that, The application environment includes temperature, humidity, and stress environments. Determining the application environment parameters of the electronic unit to be analyzed based on its application environment includes: Based on the temperature, humidity, and stress environments of the electronic unit to be analyzed, the temperature, humidity, and stress environment parameters of the electronic unit to be analyzed are determined. Based on the temperature, humidity, and stress environmental parameters of the electronic unit to be analyzed, the application environment parameters of the electronic unit to be analyzed are determined.
9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that, When the processor executes the program, it implements the method as described in any one of claims 1 to 8.
10. A non-transitory computer-readable storage medium storing computer instructions, characterized in that, The computer instructions are used to cause the computer to perform the method according to any one of claims 1 to 8.
11. A computer program product comprising computer program instructions, characterized in that, When the computer program instructions are executed on a computer, the computer causes the computer to perform the method as described in any one of claims 1-8.