BMS on-load aging test device and system
By integrating testing functions into the BMS-based aging test device and system, the problems of complex structure and high cost in existing technologies have been solved, achieving efficient BMS testing and improving testing efficiency and quality control capabilities.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- ANHUI SHARP INNOVATION ENERGY TECH CO LTD
- Filing Date
- 2025-12-31
- Publication Date
- 2026-04-28
AI Technical Summary
Existing BMS load aging test systems are complex in structure, have high testing equipment costs, and use inefficient cyclic testing methods, making it impossible to fully cover all test items.
A load-bearing aging test device and system for a BMS is provided, including a test cabinet, a communication and control module, and a high-temperature chamber. The test functions are integrated through a relay test board and a functional test board, providing a high-temperature aging environment and providing charging signals, insulation resistance and individual unit temperature sensing signals to the BMS host and slave, realizing CAN communication and signal detection.
It simplifies the structure of the testing equipment, reduces equipment costs, improves testing efficiency and quality control capabilities, simplifies layout and wiring, and enhances testing convenience.
Smart Images
Figure CN121933844A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of BMS testing technology, and more specifically to a BMS load aging test device and system. Background Technology
[0002] The BMS, or Battery Management System, is the "brain" of a power battery pack. It monitors, manages, and protects the battery pack, ensuring its safe, efficient, and long-lasting operation. It is the core link between the battery and external devices (such as controllers and chargers in new energy vehicles). Without the BMS, the power battery pack cannot operate stably. One extremely important test during the production testing process of the BMS is the load aging test. This test verifies the reliability, safety, and stability of the BMS in long-term operation in a more realistic way, overcoming the limitations of short-term and no-load tests. It is an indispensable "quality gate" from R&D to mass production—directly related to the safety, lifespan, and user experience of the battery system, especially crucial in scenarios with extremely high reliability requirements, such as new energy vehicles.
[0003] Currently, commonly used BMS load aging test systems have complex structures, high test equipment costs, low efficiency of cyclic testing methods, and cannot fully cover all test items, increasing manufacturing costs and factors that lead to unstable product quality. Summary of the Invention
[0004] The purpose of this invention is to provide a BMS load aging test device and system, which solves the problems of complex structure, high cost of test equipment, and low efficiency of cyclic testing method in BMS load aging test systems. To achieve the above objectives, the present invention provides a BMS load aging test apparatus, characterized in that the test apparatus comprises: Test cabinet; The test module is located inside the test cabinet; A communication and control module, connected to the test module, is used to communicate with the test module and test the BMS host or slave. The high-temperature chamber, located inside the test cabinet, is used to house the BMS and provide a high-temperature aging environment.
[0005] Optionally, the test cabinet includes: A placement rack, wherein multiple partitions are provided in the vertical direction; The front door is located on one side of the placement rack; Side doors are located on both sides of the shelf and are connected to the front door; Casters are provided at the bottom of the placement rack; The functional test board compartment is located on the side of the placement rack away from the front door.
[0006] Optionally, the high-temperature chamber includes: The enclosure is equipped with drawers for housing the BMS, which includes a BMS master unit and a BMS slave unit. The transfer test board compartment is located above the drawer; A fan is installed at the top of the housing.
[0007] Optionally, the enclosure is provided with ventilation openings and cable routing holes.
[0008] Optionally, the test module includes: The relay test board is located in the relay test board compartment and is used to provide charging signals, insulation resistance, and simulate load driving for high and low side relays to the BMS host, and to provide individual temperature sensing signals to the BMS slave. The functional test board is located in the functional test board compartment and is used to provide CAN communication to the BMS host, CAN communication or daisy-chain communication to the slave, and various signal detection and signal injection to the BMS host. A relay harness, one end of which is connected to the relay test board, and the other end of which is connected to the functional test board; The test harness has one end connected to the relay test board and the other end connected to the BMS.
[0009] Optionally, the test module further includes an insulating pad disposed between the relay test board and the relay test board compartment.
[0010] Optionally, the communication and control module includes: A simulated battery, disposed inside the mounting rack, is used to provide the test object to the BMS; A DC power supply, located below the analog battery, is used to supply power to the BMS; The rail is positioned below the DC power supply; A power supply assembly is mounted on the rail to supply power to the transfer test board and the functional test board.
[0011] Optionally, the communication and control module further includes: An industrial control computer is positioned between the rail and the DC power supply for communicating with the functional test board, the analog battery, and the DC power supply. A 24-channel switch is located below the card rail and connected to the functional test board.
[0012] Optionally, the communication and control module further includes a barcode scanner assembly, which is disposed on the side of the placement rack and is used by production line personnel to scan the SN code of the BMS.
[0013] On the other hand, the present invention also provides a BMS load aging test system, the system comprising a BMS and a test device as described above.
[0014] Through the above technical solution, this invention provides a BMS load aging test device and system. A high-temperature chamber provides the high-temperature aging environment. A relay test board provides charging signals, insulation resistance readings, and simulated load driving for high and low side relays to the BMS host, and provides individual unit temperature sensing signals to the BMS slave. A functional test board provides CAN communication to the BMS host and provides signals to the slave. Compared with existing technologies, each test board in this invention corresponds to a test channel, and they are independent and can work simultaneously, greatly improving the load aging efficiency. Integrating all functional tests onto the board replaces instruments and meters, greatly enhancing the convenience of the test device. Furthermore, by reducing the use of instruments such as simulated batteries, high-voltage sources, and multimeters, it not only simplifies the internal layout and wiring of the test cabinet and optimizes the test wiring harness, but also effectively reduces equipment costs.
[0015] Other features and advantages of the embodiments of the present invention will be described in detail in the following detailed description section. Attached Figure Description
[0016] The accompanying drawings are provided to further illustrate embodiments of the present invention and form part of the specification. They are used together with the following detailed description to explain the embodiments of the present invention, but do not constitute a limitation thereof. In the drawings: Figure 1 This is a schematic diagram of a testing apparatus according to one embodiment of the present invention; Figure 2 This is a schematic diagram of a testing apparatus according to one embodiment of the present invention; Figure 3 This is a schematic diagram of a high-temperature chamber according to one embodiment of the present invention; Figure 4 This is a schematic diagram of a testing apparatus according to one embodiment of the present invention; Figure 5 This is a schematic diagram of a high-temperature chamber according to one embodiment of the present invention; Figure 6 This is a schematic diagram of a relay test board according to one embodiment of the present invention; Figure 7 This is a schematic diagram of a functional test board according to an embodiment of the present invention; Figure 8This is a schematic diagram of a partial structure of a testing apparatus according to an embodiment of the present invention.
[0017] Explanation of reference numerals in the attached figures Detailed Implementation
[0018] The specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are for illustration and explanation only and are not intended to limit the scope of the present invention.
[0019] In embodiments of the present invention, unless otherwise stated, directional terms such as "upper," "lower," "top," and "bottom" are generally used to describe the relative positional relationships of components in relation to the directions shown in the accompanying drawings or in relation to the vertical, perpendicular, or gravitational directions.
[0020] Furthermore, if the embodiments of this invention involve descriptions such as "first" or "second," these descriptions are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of those features. Additionally, the technical solutions of various embodiments can be combined with each other, but this must be based on the ability of those skilled in the art to implement them. When the combination of technical solutions is contradictory or impossible to implement, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection claimed by this invention.
[0021] Figure 1 This is a schematic diagram of a testing apparatus according to one embodiment of the present invention. Figure 2 This is a schematic diagram of a testing apparatus according to one embodiment of the present invention. Figure 3 This is a schematic diagram of a high-temperature chamber according to an embodiment of the present invention. In this diagram, the testing device includes a test cabinet 1, a test module, a communication and control module, and a high-temperature chamber 2. The test module is located inside the test cabinet 1. The communication and control module is connected to the test module and is used to communicate with the test module and perform tests on the BMS master or slave unit. The high-temperature chamber 2 is located inside the test cabinet 1 and is used to house the BMS and provide a high-temperature aging environment. Compared with the prior art, the present invention has advantages such as a simpler structure, lower cost, simultaneous load aging testing of all master / slave boards, and coverage of all test items, effectively reducing production testing costs, improving load aging testing efficiency, and enhancing quality control capabilities.
[0022] Furthermore, in this embodiment, the specific composition of the test cabinet 1 can be various as known to those skilled in the art. In one example of the present invention, such as... Figure 4 As shown, the test cabinet 1 includes a rack 3, a front door 4, a side door 5, casters 6, and a functional test board compartment 7. The rack 3 has multiple partitions vertically. The front door 4 is located on one side of the rack 3, and the side doors 5 are located on both sides of the rack 3 and connected to the front door 4. The casters 6 are located at the bottom of the rack 3. The functional test board compartment 7 is located on the side of the rack 3 away from the front door 4 and is used to hold functional test boards 12. Specifically, the front door 4 mainly includes a screen, a flip-up mouse and keyboard, a monitor, a power indicator light, a signal indicator light cam switch, an emergency stop button, and a door lock. The side door 5 uses a quick-release floating nut for easy maintenance of the test cabinet 1. The functional test board compartment 12 mainly integrates the test boards into the cabinet. A network adapter is located above the functional test board compartment 12 for connecting to the production line MES, and an aviation plug (i.e., an analog battery 13 output socket) is also provided.
[0023] In this embodiment, the specific composition of the high-temperature chamber 2 can be various that are known to those skilled in the art, provided that it provides a high-temperature aging environment. In one example of the present invention, such as... Figure 5 As shown, the high-temperature chamber 2 includes a chamber body 8, a transfer test board compartment 9, and a fan 10. The chamber body 8 has drawers for housing the BMS, which includes a BMS master unit and BMS slave units. The transfer test board compartment 9 is located above the drawers, facilitating the installation of transfer test boards 11. The fan 10 is located on top of the chamber body 8 to drive air circulation within the test chamber 1.
[0024] In order to allow air to circulate between the high-temperature chamber 2 and the outside environment and maintain the stability of the internal environment of the high-temperature chamber 2, in this embodiment, the chamber body 8 is provided with ventilation openings and wire passage holes.
[0025] In this embodiment, to enhance the convenience of the testing device, all functional tests are integrated onto a single board. Specifically, such as... Figure 6 and Figure 7 As shown, the test module includes a relay test board 11, a functional test board 12, a relay wiring harness, and a test wiring harness. The relay test board 11, located in the relay test board compartment 9, provides charging signals, insulation resistance readings, and simulated load driving for high and low side relays to the BMS host, and provides individual cell temperature sensing signals to the BMS slave. The functional test board 12, located in the functional test board compartment 7, provides CAN communication to the BMS host, CAN communication or daisy-chain communication to the slave, and provides various signal detection and signal injection to the BMS host. One end of the relay wiring harness is connected to the relay test board 11, and the other end is connected to the functional test board 12. The relay wiring harness also connects the simulated battery 13 to the relay test board 11. One end of the test wiring harness is connected to the relay test board 11, and the other end is connected to the BMS.
[0026] Specifically, the relay test board 11 is used to provide the BMS host with fast / slow charging temperature sensing signals, shunt temperature sensing signals, and charging signals such as CC, CC1, and CC2. The functional test board 12 is located in the functional test board compartment 7 and is used to provide CAN communication to the BMS host, CAN communication or daisy-chain communication to the slave device, and to provide various signal detection and signal injection to the BMS host. Copper busbars serve as terminals for AFE power supply, connecting to the power supply input of the AFE chips on each master and slave board. Because the copper busbars have low impedance, the impact of contact impedance on the power supply voltage of each AFE chip can be reduced. In a preferred embodiment of the invention, the relay test board 11 includes a BMS test line connection port 1, a BMS test line connection port, a BMS test line connection port, a BMS test line connection port, a BMS test line connection port, a BMS test line connection port, a BMS test line connection port, a BMS communication input interface with the master and slave BMS, a relay output port connector for the analog battery 13, and an input port for the analog battery 13, all disposed on the board. In the diagram, from left to right, the first row consists of the analog battery 13 input port, the analog battery 13 relay output port connector, and the communication input with the master / slave BMS. The second row consists of the BMS test line connection port 1, the BMS test line connection port 2, the BMS test line connection port 3, and the BMS test line connection port 4.
[0027] Specifically, the functional test board 12 is used to detect various signals of the BMS host, such as high and low side relay drive, solenoid valve drive, high and low side signal output, and collision signal. It can also provide the BMS host with total voltage, shunt / Hall signal, CP signal, etc. The functional test board includes connectors, lock-on screws, a first board power supply plug, a Type-C interface, a network port connector, a second board power supply plug, board fixing sheet metal, and indicator lights on the board body. The board body is drawer-shaped, with a network port connector in the middle of the opening. Board power supply plug 1 and board power supply plug 2 are respectively located on both sides of the network port connector. A Type-C interface is located between the network port connector and board power supply plug 1. A connector is located in the middle of the side of the drawer-shaped board away from the opening, and an indicator light is located on one side of the connector. Symmetrical lock-on screws are located on the outside of the indicator light. The connector communicates with the master and slave BMS. The quick-release screws facilitate future maintenance. The first board power supply plug powers the test board. The Type-C interface is for board download and debugging. The network port connector is used for communication with the host computer. The second board power supply plug is a programmable source interface, providing load for some test signals. The board fixing and mounting sheet metal is mainly used for fixing the board. The indicator light is used to reflect the board's operating status.
[0028] Compared with existing technologies, each test board in this invention corresponds to a test channel, which are independent and can work simultaneously, greatly improving the efficiency of load aging. Integrating all functional tests onto the board replaces instruments and meters, significantly enhancing the convenience of the testing device. Furthermore, by reducing the use of instruments such as the analog battery 13, high-voltage source, and multimeter, it not only simplifies the internal layout and wiring of the test cabinet 1 and optimizes the test wiring harness, but also effectively reduces equipment costs. Simultaneously, placing the self-developed transfer test board 11 inside the high-temperature chamber 2 greatly shortens the length of the test wiring harness, reducing the cost of replacement and improving the convenience of replacement. In addition, the test boards of this invention provide comprehensive functional testing coverage without interference, effectively improving quality control capabilities.
[0029] Considering the need to ensure insulation between the transit test board 11 and the transit test board compartment 9, in this embodiment, the test module also includes an insulating pad, which is disposed between the transit test board 11 and the transit test board compartment 9.
[0030] In this embodiment, the composition of the communication and control module can be various as known to those skilled in the art. In one example of the present invention, such as... Figure 8 As shown, the communication and control module includes an analog battery 13, a DC power supply 14, a mounting rail 15, and a power supply assembly. The analog battery 13 is located inside the mounting bracket 3 and provides the BMS with the voltage of the device under test (DUT), i.e., the slave unit of the BMS. The DC power supply 14 is located below the analog battery 13 and provides power to the BMS. Further, the DC power supply 14 includes a programmable source RU12 and a programmable source RU60. Programmable source RU12 powers the AFE chip on the master / slave board under test, and programmable source RU60 powers the master board under test. The mounting rail 15 is located below the DC power supply 14 and is used to mount the power supply assembly for relays and contactors that provide power to the boards. The power supply assembly is located on the mounting rail 15 to power the relay test board and the functional test board.
[0031] Furthermore, the communication and control module also includes an industrial computer 16 and a 24-channel switch 17. The industrial computer 16 is positioned between the mounting rail 15 and the DC power supply 14, and is used to communicate with the functional test board, the analog battery 13, and the DC power supply 14. The 24-channel switch 17 is positioned below the mounting rail 15 and is connected to the functional test board 12. Specifically, the industrial computer 16 includes three network ports for information exchange with the DC power supply 14 and the analog battery 13, one VGA communication interface for information exchange with the display screen, and is also used for running the BMS load aging test host computer software program. Furthermore, mounting rails 15 are located above and below the 24-channel switch 17, and the 24-channel switch 17 connects to the functional test board 12 and each power supply device to transmit information.
[0032] Furthermore, the communication and control module also includes a barcode scanner assembly 18, which is located on the side of the placement rack 3 and is used by production line personnel to scan the SN code of the BMS. Open the load aging test host computer test software, select the corresponding product test list, pick up the product to be tested, scan the SN code, and place it in the high-temperature aging chamber in sequence. Connect the test harness, and after all the products under test are placed in the high-temperature chamber 2, close the door of the high-temperature chamber 2. Click "Start Test" on the host computer test software. During the test, the test status of each product can be monitored in real time through the host computer test software. When the test ends, the test result of each channel can be clearly seen as PASS or FAIL. All test information will be saved locally in an Excel spreadsheet or uploaded to the MES for future problem feedback and traceability.
[0033] On the other hand, the present invention also provides a BMS load aging test system, the system including a BMS and a test device as described above.
[0034] Through the above technical solution, this invention provides a BMS load aging test device and system. A high-temperature chamber provides the high-temperature aging environment. A relay test board provides charging signals, insulation resistance readings, and simulated load driving for high and low side relays to the BMS host, and provides individual unit temperature sensing signals to the BMS slave. A functional test board provides CAN communication to the BMS host, CAN communication or daisy-chain communication to the slave, and various signal detection and injection to the BMS host. Compared with existing technologies, each test board in this invention corresponds to a test channel, and they are independent and can work simultaneously, greatly improving the load aging efficiency. Integrating all functional tests onto the board replaces instruments and meters, greatly enhancing the convenience of the test device. Furthermore, by reducing the use of instruments such as simulated batteries, high-voltage sources, and multimeters, it not only simplifies the internal layout and wiring of the test cabinet and optimizes the test wiring harness, but also effectively reduces equipment costs.
[0035] The optional embodiments of the present invention have been described in detail above with reference to the accompanying drawings. However, the embodiments of the present invention are not limited to the specific details in the above embodiments. Within the scope of the technical concept of the embodiments of the present invention, various simple modifications can be made to the technical solutions of the embodiments of the present invention, and these simple modifications all fall within the protection scope of the embodiments of the present invention.
[0036] It should also be noted that the various specific technical features described in the above embodiments can be combined in any suitable manner without contradiction. To avoid unnecessary repetition, the embodiments of the present invention will not describe the various possible combinations separately.
[0037] Furthermore, various different embodiments of the present invention can be combined arbitrarily, as long as they do not violate the spirit of the embodiments of the present invention, they should also be regarded as the content disclosed by the embodiments of the present invention.
Claims
1. A BMS load aging test device, characterized in that, The testing apparatus includes: Test cabinet; The test module is located inside the test cabinet; A communication and control module, connected to the test module, is used to communicate with the test module and test the BMS host or slave. The high-temperature chamber, located inside the test cabinet, is used to house the BMS and provide a high-temperature aging environment.
2. The testing apparatus according to claim 1, characterized in that, The test cabinet includes: A placement rack, wherein multiple partitions are provided in the vertical direction; The front door is located on one side of the placement rack; Side doors are located on both sides of the shelf and are connected to the front door; Casters are provided at the bottom of the placement rack; The functional test board compartment is located on the side of the placement rack away from the front door.
3. The testing apparatus according to claim 2, characterized in that, The high-temperature chamber includes: The enclosure is equipped with drawers for housing the BMS, which includes a BMS master unit and a BMS slave unit. The transfer test board compartment is located above the drawer; A fan is installed at the top of the housing.
4. The testing apparatus according to claim 3, characterized in that, The enclosure is equipped with ventilation openings and cable routing holes.
5. The testing apparatus according to claim 3, characterized in that, The testing module includes: The relay test board is located in the relay test board compartment and is used to provide charging signals, insulation resistance, and simulate load driving for high and low side relays to the BMS host, and to provide individual temperature sensing signals to the BMS slave. The functional test board is located in the functional test board compartment and is used to provide CAN communication to the BMS host, CAN communication or daisy-chain communication to the slave, and various signal detection and signal injection to the BMS host. A relay harness, one end of which is connected to the relay test board, and the other end of which is connected to the functional test board; The test harness has one end connected to the relay test board and the other end connected to the BMS.
6. The testing apparatus according to claim 5, characterized in that, The test module also includes an insulating pad, which is disposed between the transfer test board and the transfer test board compartment.
7. The testing apparatus according to claim 5, characterized in that, The communication and control module includes: A simulated battery, disposed inside the mounting rack, is used to provide the test object to the BMS; A DC power supply, located below the analog battery, is used to supply power to the BMS; The rail is positioned below the DC power supply; A power supply assembly is mounted on the rail to supply power to the transfer test board and the functional test board.
8. The testing apparatus according to claim 7, characterized in that, The communication and control module also includes: An industrial control computer is positioned between the rail and the DC power supply for communicating with the functional test board, the analog battery, and the DC power supply. A 24-channel switch is located below the card rail and connected to the functional test board.
9. The testing apparatus according to claim 2, characterized in that, The communication and control module also includes a barcode scanner assembly, which is located on the side of the placement rack and is used by production line personnel to scan the SN code of the BMS.
10. A BMS load aging test system, characterized in that, The system includes a BMS and a test apparatus as described in any one of claims 1 to 9.