Integrated electronic brake function detection system

Abstract

The invention discloses an integrated electronic brake function detection system. The integrated electronic brake function detection system comprises an upper computer, a test module and an acquisition module, the upper computer sends a test instruction to the test module and generates a test report; the test module comprises a microcontroller, a power supply detection unit, a communication detection unit, a sensor detection unit, a chip self-inspection unit and an actuator detection unit, the microcontroller coordinates all the detection units for orderly testing, and all the detection units respectively detect power supply voltage, controller local area network channel communication, sensor performance, chip state and actuator function; the acquisition module acquires test data and converts and transmits the test data to the upper computer. According to the invention, the integrated detection of the integrated electronic brake function is realized through the modular design, the detection is qualified only when all detection items meet the preset standard, the detection comprehensiveness and accuracy are improved, and the reliability of the integrated electronic brake function is guaranteed.

Description

Technical Field

[0001] This application relates to the field of automotive electronic testing technology, and in particular to an integrated electronic brake function testing system. Background Technology

[0002] With the rapid development of automotive intelligence, Integrated Electronic Brake System (IEBS) has become a key core technology in the modern automotive braking field. Therefore, comprehensive and accurate functional testing of IEBS is crucial. However, existing technologies typically employ a decentralized testing method, using different testing equipment and procedures for different functional modules of the IEBS. This testing approach has the following shortcomings: Low testing efficiency: Multiple connections and switching of testing equipment are required, the testing process is cumbersome and time-consuming.

[0003] Insufficient detection coverage: Traditional detection methods struggle to fully and automatically trigger and verify the complex self-test functions within chips.

[0004] Therefore, there is an urgent need for a system that can achieve integrated and automated IEBS detection to solve the aforementioned problems in existing technologies. Summary of the Invention

[0005] The main purpose of this application is to provide an integrated electronic brake function testing system, which aims to solve the problem of automating and comprehensively verifying the functions of each module of the IEBS, improving testing efficiency and increasing test coverage, so as to ensure the reliability of the IEBS function.

[0006] This application provides an integrated electronic brake function detection system, which employs the following technology: An integrated electronic brake function testing system includes a host computer, a testing module, and a data acquisition module. The host computer is used to send test commands to the test module and generate a test report; The testing module includes a microcontroller, a power supply detection unit, a communication detection unit, a sensor detection unit, a chip self-test unit, and an actuator detection unit. The microcontroller controls each detection unit to perform test operations according to the test instructions. The power supply detection unit is used to detect multiple power supply voltages of the integrated electronic braking system. The communication detection unit is used to detect the controller local area network channel communication function of the integrated electronic braking system. The sensor detection unit is used to detect the sensors of the integrated electronic braking system. The chip self-test unit is used to detect the motor drive chip and power management chip in the integrated electronic braking system. The actuator detection unit is used to detect the brake light control function, memory read / write performance, and temperature signal acquisition function of the integrated electronic braking system. The acquisition module is used to acquire the test data of the test module, convert it, and transmit it to the host computer.

[0007] Optionally, the power supply detection unit includes a voltage acquisition subunit and a power supply standard comparison subunit, wherein: The voltage acquisition unit establishes an electrical connection with the preset power supply test points and acquires the voltage of each preset power supply test point. The power supply standard comparison unit is used to compare the voltage with a preset standard and generate preliminary power supply detection results.

[0008] Optionally, the power detection unit collects multiple power supply voltages, including battery power supply voltage, microcontroller input / output interface voltage, microcontroller core voltage, controller area network power supply voltage, and analog-to-digital conversion reference voltage.

[0009] Optionally, the communication detection unit includes a message generation subunit and a message receiving subunit, wherein: The message generation subunit is used to generate a preset communication message according to the test instruction and transmit it to the microcontroller; The message receiving subunit is used to receive the response message generated by the microcontroller and generate preliminary communication detection results.

[0010] Optionally, the sensor detection unit includes a displacement sensor detection subunit and an angle sensor detection subunit, wherein: The displacement sensor detection subunit is used to detect the displacement sensor and generate preliminary displacement sensor detection results. The angle sensor detection subunit is used to detect the angle sensor and generate preliminary angle sensor detection results.

[0011] Optionally, the chip self-test unit includes a first chip self-test subunit and a second chip self-test subunit, wherein: The first chip self-test subunit is used to perform a self-test on the motor drive chip and generate the first chip self-test result; The second chip self-test subunit is used to perform a self-test on the power management chip and generate the second chip self-test result.

[0012] Optionally, the actuator detection unit includes a brake light detection subunit, a motor drive detection subunit, a storage detection subunit, and a temperature detection subunit, wherein: The brake light detection subunit is used to detect the control signal output from the microcontroller to the brake light and the voltage at the brake light control output terminal, and to generate preliminary brake light detection results. The motor drive detection subunit is used to detect the motor operating status in the integrated electronic braking system and generate preliminary motor drive detection results. The storage detection subunit is used to perform read and write tests on the EEPROM memory and generate preliminary storage detection results; The temperature detection subunit is used to detect the temperature sensor values ​​in the integrated electronic braking system and generate preliminary temperature detection results.

[0013] Optionally, the host computer includes an instruction generation unit, a data parsing unit, and a report generation unit, wherein: The instruction generation unit is used to generate test instructions for each detection unit of the test module; The data parsing unit is used to parse the test data; The report generation unit is used to compare the parsed test data with preset standards and generate a test report.

[0014] Optionally, the report generation unit determines that the integrated braking system is functionally qualified only when the detection data from the power supply detection unit, communication detection unit, sensor detection unit, chip self-test unit, and actuator detection unit all meet the preset standards.

[0015] Optionally, the microcontroller is an STM32F103C8T6 model.

[0016] This application proposes an integrated electronic brake function testing system that integrates the testing of multiple modules of an integrated electronic brake system into a unified test sequence, eliminating the need for multiple device switching and significantly reducing testing time. It also performs chip self-tests on the motor drive chip and power management chip, improving testing coverage. Furthermore, it improves the accuracy of testing results based on a dual judgment logic of test point acquisition and chip self-test results. Attached Figure Description

[0017] Figure 1 A structural block diagram of an integrated electronic brake function detection system provided in an embodiment of this application; Figure 2 This is a circuit diagram of a power management chip according to an embodiment of this application; Figure 3 This is a circuit diagram of an angle detection subunit according to an embodiment of this application; Figure 4 This is a circuit diagram of a brake light detection subunit according to an embodiment of this application.

[0018] The realization of the purpose, functional features and advantages of this application will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0019] To make the objectives, technical solutions, and advantages of this application clearer, the application will be described in detail below with reference to the accompanying drawings and specific embodiments. It should be noted that the following embodiments are for illustrative purposes only and are not intended to limit the scope of this application.

[0020] The main solution in this application embodiment is: An integrated electronic brake function testing system includes a host computer, a testing module, and a data acquisition module. The host computer is used to send test commands to the test module and generate a test report; The test module includes a microcontroller, a power supply detection unit, a communication detection unit, a sensor detection unit, a chip self-test unit, and an actuator detection unit. The microcontroller controls each detection unit to perform test operations according to test instructions. The power supply detection unit is used to detect multiple power supply voltages of the integrated electronic braking system. The communication detection unit is used to detect the controller LAN channel communication function of the integrated electronic braking system. The sensor detection unit is used to detect the sensors of the integrated electronic braking system. The chip self-test unit is used to detect the motor drive chip and power management chip in the integrated electronic braking system. The actuator detection unit is used to detect the brake light control function, memory read / write performance, and temperature signal acquisition function of the integrated electronic braking system. The data acquisition module is used to collect test data from the test module, convert it, and transmit it to the host computer.

[0021] The present invention will now be described in further detail with reference to the accompanying drawings and specific embodiments to enable those skilled in the art to understand it. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of the invention. Rather, these embodiments are provided to make the disclosure more thorough and complete, and to fully convey the scope of the disclosure to those skilled in the art.

[0022] refer to Figure 1 One embodiment of this application provides an integrated electronic brake function testing system, including a host computer, a data acquisition module, and a testing module. The host computer is used to send test commands to the testing module and generate a test report.

[0023] In one specific embodiment, the host computer loads preset standard data from the standard storage module. After establishing communication connections with the test module and the data acquisition module and verifying the link is working, it sends test commands to the test module.

[0024] The testing module includes a microcontroller, a power supply detection unit, a communication detection unit, a sensor detection unit, a chip self-test unit, and an actuator detection unit. The microcontroller controls each detection unit to perform test operations according to test instructions. The power supply detection unit detects multiple power supply voltages of the integrated electronic braking system. The power supply detection unit includes a voltage acquisition subunit and a power supply standard comparison subunit. The voltage acquisition subunit establishes an electrical connection with preset power supply test points and acquires the voltages at each preset power supply test point. The power supply standard comparison subunit compares the voltages with preset standards and generates preliminary power supply test results. The multiple power supply voltages acquired by the power supply detection unit include battery power supply voltage, microcontroller input / output interface voltage, microcontroller core voltage, controller area network power supply voltage, and analog-to-digital conversion reference voltage.

[0025] In one specific embodiment, reference is made to Figure 2 The host computer sends test commands to the test module. The microcontroller in the test module synchronizes the voltage standard range preset by the host computer to the power supply detection unit, ensuring consistency between the comparison standard and the host computer's settings. The microcontroller controls the power supply detection unit to execute test operations. The power supply detection unit collects voltage signals from each preset power supply test point: TP54 collects the microcontroller's input / output interface voltage, TP64 collects the microcontroller's core voltage, TP4 collects the controller's LAN power supply voltage, and TP55 collects the analog-to-digital conversion reference voltage. The power supply standard comparison subunit compares the voltages of each preset power supply test point collected by the voltage acquisition subunit with the corresponding preset standard range one by one. If the voltage of a preset power supply test point is within the preset standard range, the test is considered passed; otherwise, it is considered a failure. Preliminary power supply test results are generated, and the voltages of each preset power supply test point and the preliminary power supply test results are recorded synchronously.

[0026] The communication detection unit includes a message generation subunit and a message receiving subunit. The message generation subunit is used to generate a preset communication message according to the test command and transmit it to the microcontroller. The message receiving subunit is used to receive the response message generated by the microcontroller and generate a preliminary communication detection result.

[0027] In one specific embodiment, the host computer sends a test command to the test module. The microcontroller synchronizes with the communication standard sent by the host computer. The message verification subunit generates a preset communication message conforming to the CAN protocol according to the test command. This preset communication message is sent to the integrated electronic braking system via CAN high and low test points. The integrated electronic braking system parses the preset communication message. If the preset communication message is valid, it generates a corresponding response message, which is then output to the communication detection unit via the controller area network channels CAN1 and CAN2. The communication detection unit parses the received response message, comparing whether the response delay is ≤10ms and whether the message content is consistent with the preset rules. If the delay meets the standard and the message parsing is correct, the communication function is deemed to have passed. If no response is received within the timeout period, the message verification is incorrect, or the content does not match, the communication function is deemed to have failed. A preliminary communication detection result is generated, and the preset communication message content, response message content, response delay, and preliminary communication detection result are recorded synchronously.

[0028] The sensor detection unit includes a displacement sensor detection subunit and an angle sensor detection subunit. The displacement sensor detection subunit is used to detect the displacement sensor and generate preliminary displacement sensor detection results.

[0029] In one specific embodiment, the host computer sends a test command to the test module. The microcontroller synchronizes with the preset standard sent by the host computer. The displacement sensor detection subunit generates a PWM wave with a duty cycle of 5%-95%, which is input to the displacement sensor of the integrated electronic braking system. The displacement sensor converts the PWM signal into an electrical signal. The microcontroller receives the converted electrical signal from the displacement sensor, analyzes it, and restores it to a specific displacement value. The displacement value is then transmitted to the displacement sensor detection subunit. The displacement sensor detection subunit compares the displacement value with the preset standard: if the correspondence between the displacement value and the PWM duty cycle conforms to the preset rule and the feedback delay is ≤10ms, the displacement sensor detection is considered successful; if the correspondence between the displacement value and the PWM duty cycle does not conform to the preset rule, or the feedback delay is >10ms, the displacement sensor detection is considered unsuccessful. A preliminary displacement sensor detection result is generated, and the displacement value and the preliminary displacement sensor detection result are recorded.

[0030] The angle sensor detection subunit is used to detect the angle sensor and generate preliminary angle sensor detection results.

[0031] In one specific embodiment, reference is made to Figure 3The host computer sends test commands to the test module, and the microcontroller synchronizes with the preset standards sent by the host computer. The angle sensor selected is the TLE5012, which is adaptable to IEBS automotive environments and industrial testing scenarios, ensuring the stability of angle signal acquisition. TP23, TP24, TP44, TP57, TP59, and TP61 are the first test points, and TP22, TP25, TP56, TP58, TP60, and TP61 are the second test points. The angle sensor detection unit synchronously acquires the rotation angle of the brake pedal in the integrated electronic braking system through two independent acquisition channels using the TLE5012 angle sensor. The acquired rotation angle is compared with the preset standard. If the rotation angle acquired by the two acquisition channels is within 0°-360°, and the mapping error with the preset rotation angle is ≤0.5%, the angle sensor test is considered passed; if the rotation angle acquired by the two acquisition channels is not within 0°-360°, or the mapping error with the preset rotation angle is >0.5%, the angle sensor test is considered failed. Generate preliminary angle sensor detection results and record the displacement value and the acquired rotation angle.

[0032] The chip self-test unit includes a first chip self-test subunit and a second chip self-test subunit. The first chip self-test subunit is used to perform self-test on the motor drive chip and generate the first chip self-test result.

[0033] In one specific embodiment, the motor drive chip selected is the TLE9183 chip. The TLE9183 can withstand IEBS automotive electromagnetic interference and industrial testing environments, ensuring drive stability. The host computer sends test commands to the test module. The microcontroller synchronizes with the preset standards sent by the host computer. The TLE9183 motor drive chip in the first chip self-test subunit enters self-test mode and executes a series of self-test items, such as VCC undervoltage test, high-side / low-side short-circuit current test, and current sensor gain test. The microcontroller reads the self-test result code returned by the TLE9183 in real time via the SPI bus. The read self-test result codes are compared with preset pass codes. If all self-test item codes match the preset pass codes, the motor drive chip self-test is considered passed; if any self-test item code does not match the preset pass code, the motor drive chip self-test is considered failed. Preliminary first chip self-test results are generated, and the displacement value and each self-test result code are recorded.

[0034] The second chip self-test subunit is used to perform a self-test on the power management chip and generate the second chip self-test result.

[0035] In one specific embodiment, the power management chip selected is the TLE35584 chip. The TLE35584 is adapted to the environmental requirements of industrial testing scenarios, ensuring the continuous stability of power output. The host computer sends test commands to the test module, and the microcontroller synchronizes with the preset standards sent by the host computer. The power management chip TLE35584 in the second chip self-test subunit enters self-test mode and executes a series of self-test items, such as the working status of the window watchdog, function watchdog, and error pins, etc., reading the self-test result code returned by the TLE35584 in real time. The read self-test result codes are compared item by item with preset pass codes. If all self-test item codes match the preset pass codes, the power management chip TLE35584 self-test is considered passed; if any self-test item code does not match the preset pass code, the power management chip TLE35584 self-test is considered failed. Preliminary second chip self-test results are generated, and the displacement value and each self-test result code are recorded.

[0036] The actuator detection unit includes a brake light detection subunit, a motor drive detection subunit, a storage detection subunit, and a temperature detection subunit. The brake light detection subunit is used to detect the control signal output from the microcontroller to the brake light and the voltage at the brake light control output terminal, and to generate preliminary brake light detection results.

[0037] In one specific embodiment, reference is made to Figure 4 The host computer sends test commands to the test module. The microcontroller synchronizes with the preset standards sent by the host computer. The brake light detection subunit checks whether the control signal output from the microcontroller to the brake light is valid and whether the voltage at the brake light control output terminal is within the preset range. The specific working process of the brake light detection subunit is as follows: When braking, the input terminal of the brake light detection unit receives a high-level signal. After current limiting by the 35th resistor R35, it is transmitted to the integrated driver U11. The MOSFET inside U11 conducts, forming a current loop. The current is output to the brake light through the output terminal L_OUT of the brake light detection unit, and the brake light is powered on and illuminates normally. The self-resetting fuse R84 monitors the loop current in real time. If the current is within the rated range, it remains conducting. When not braking, the input terminal of the brake light detection unit receives a low-level signal. The MOSFET inside U11 is cut off, the current loop is broken, the brake light loses power supply, and it is normally turned off. The high and low level signals received at the input terminal of the brake light detection unit can be measured through test point TP26 to quickly check whether the signal received at the input terminal of the brake light detection unit is normal.

[0038] If the voltage at the output terminal of the brake light control is within the preset range, the brake light test is deemed to have passed; if the voltage at the output terminal of the brake light control is not within the preset range, the brake light test is deemed to have failed.

[0039] The motor drive detection subunit is used to detect the operating status of the motor in the integrated electronic braking system and generate preliminary motor drive detection results.

[0040] In one specific embodiment, the host computer sends a test command to the test module. The microcontroller synchronizes with the preset standard sent by the host computer. The motor drive detection unit outputs a three-phase drive signal through the driver chip TLE9183, starting the motor in forward / reverse direction. The motor drive detection unit collects the motor speed, number of rotations, and operating current in real time. If the motor speed, number of rotations, and operating current are all within the preset standard range, the motor drive test is deemed to have passed; if the motor speed, number of rotations, or operating current is not within the preset standard range, the motor drive test is deemed to have failed.

[0041] The storage detection subunit is used to perform read and write tests on the EEPROM memory and generate preliminary storage detection results.

[0042] In one specific embodiment, the host computer sends test commands to the test module. The microcontroller synchronizes with the preset standard sent by the host computer. The storage detection unit uses an AT25M01 SPI interface EEPROM. The storage detection unit generates three segments of differentiated test data at 1KB / segment and writes the corresponding test data sequentially to three different storage blocks of the EEPROM via the SPI interface. After writing, the data is read in the same block order, and the timestamp and integrity of each segment of read data are recorded. During the reading process, the read data is synchronously compared with the original test data cached locally to mark whether there are any bit inconsistencies. If the three segments of data are completely consistent with the read data, with no bit errors, no packet loss in SPI communication, and a response delay ≤10ms, the storage test is considered to have passed. If the three segments of data are inconsistent with the read data, the packet loss rate is >0, or the response delay is >10ms, the storage test is considered to have failed. A preliminary storage test result is generated, and the three segments of read / write data and the storage test result are recorded.

[0043] The temperature detection subunit is used to detect the temperature sensor values ​​in the integrated electronic braking system and generate preliminary temperature detection results.

[0044] In one specific embodiment, the host computer sends a test command to the test module. The microcontroller synchronizes with the preset standard sent by the host computer, and the temperature detection subunit generates three sets of operating conditions with different standard ambient temperatures. The temperature sensor collects the ambient temperatures of the three sets of operating conditions and compares them with the corresponding standard ambient temperatures. If the error of the three sets of temperatures is ≤ ±2℃, the temperature detection is considered passed; if the error of any set of temperatures is > ±2℃, the temperature detection is considered failed. A preliminary temperature detection result is generated, and the ambient temperature collected by the temperature sensor and the temperature detection result are recorded.

[0045] The acquisition module is used to acquire the test data of the test module, convert it, and transmit it to the host computer.

[0046] In one specific embodiment, the acquisition module collects the detection data from each detection unit in the testing module and uploads it to the host computer. The data parsing unit parses the detection data from each detection unit, and the report generation unit compares the parsed data with preset standard data to determine whether it meets the standard and generates the host computer's detection results. The host computer's detection results are compared with the preliminary detection results of each detection unit. If the two detection results are consistent, a detection report is generated; if the two detection results are inconsistent, both the testing module and the host computer re-perform the test until the two detection results are the same.

[0047] In summary, the integrated electronic brake function testing system provided in this application embodiment generates test instructions for each testing unit of the test module through an instruction generation unit and sends them to the test module; the microcontroller receives the test instructions from the host computer and coordinates and controls each testing unit of the test module to perform test operations in an orderly manner; the power supply detection unit collects the voltage of each preset power supply test point, compares it with a preset standard, and generates preliminary voltage detection results; the message generation subunit sends a preset communication message to the controller local area network channel, the message receiving subunit verifies the response, and generates preliminary communication detection results; the displacement sensor detection subunit and the angle sensor detection subunit respectively detect the displacement sensor and the angle sensor, verify the sensor signal detection capability, and generate preliminary displacement sensor detection results and preliminary angle sensor detection results; the chip self-test unit includes a first chip self-test subunit... The first and second chip self-test subunits perform self-tests and generate self-test result codes for the first and second chips. The brake light detection subunit, motor drive detection subunit, storage detection subunit, and temperature detection subunit respectively test the brake light function, motor forward and reverse rotation, EEPROM read / write performance, and temperature signal fluctuation. If all functions are normal, the test is considered passed, and preliminary actuator test results are generated. The acquisition module collects test data from all detection units in the test module, converts it into data that can be processed by the host computer, and transmits it to the host computer. The host computer compares the converted test data with the preset standard to generate test results, and compares the test results with the preliminary test results of each detection unit. If the two results are consistent, a test report is generated and stored. If the two results are inconsistent, the system returns to the instruction generation unit to regenerate test instructions until the two results are consistent.

[0048] The above embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to limit it. Any modifications, equivalent substitutions, and improvements made by those skilled in the art within the spirit and principles of the present invention should be included within the protection scope of the present invention.

[0049] In the description of this application, it should be noted that the terms "first", "second", and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0050] Those skilled in the art will understand that, for the sake of convenience and brevity, the specific working processes of the systems, devices, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0051] In the several embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. The apparatus embodiments described above are merely illustrative. For example, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. Furthermore, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Additionally, the shown or discussed mutual couplings, direct couplings, or communication connections may be through some communication interfaces; indirect couplings or communication connections between devices or units may be electrical, mechanical, or other forms.

[0052] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0053] In addition, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit.

[0054] Finally, it should be noted that the above-described embodiments are merely specific implementations of this application, used to illustrate the technical solutions of this application, and not to limit them. The protection scope of this application is not limited thereto. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that any person skilled in the art can still modify or easily conceive of changes to the technical solutions described in the foregoing embodiments, or make equivalent substitutions for some of the technical features, within the technical scope disclosed in this application. Such modifications, changes, or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application, and should all be covered within the protection scope of this application. Therefore, the protection scope of this application should be determined by the protection scope of the claims.

[0055] Furthermore, although the operations of the method of this application are described in a specific order in the accompanying drawings, this does not require or imply that these operations must be performed in that specific order, or that all the operations shown must be performed to achieve the desired result. Additionally or alternatively, certain steps may be omitted, multiple steps may be combined into one step, and / or one step may be broken down into multiple steps.

Claims

1. An integrated electronic brake function detection system, characterized in that, Includes a host computer, a testing module, and a data acquisition module: The host computer is used to send test commands to the test module and generate a test report; The testing module includes a microcontroller, a power supply detection unit, a communication detection unit, a sensor detection unit, a chip self-test unit, and an actuator detection unit. The microcontroller is used to control each detection unit to perform test operations according to the test instructions. The power supply detection unit is used to detect multiple power supply voltages of the integrated electronic braking system. The communication detection unit is used to detect the controller local area network channel communication function of the integrated electronic braking system. The sensor detection unit is used to detect the sensors of the integrated electronic braking system. The chip self-test unit is used to detect the motor drive chip and power management chip in the integrated electronic braking system. The actuator detection unit is used to detect the brake light control function, motor drive function, memory read / write performance, and temperature signal acquisition function of the integrated electronic braking system. The acquisition module is used to acquire the test data of the test module, convert it, and transmit it to the host computer.

2. The integrated electronic brake function detection system according to claim 1, characterized in that, The power supply detection unit includes a voltage acquisition subunit and a power supply standard comparison subunit, wherein: The voltage acquisition unit establishes an electrical connection with the preset power supply test points and acquires the voltage of each preset power supply test point. The power supply standard comparison unit is used to compare the voltage with a preset standard and generate preliminary power supply detection results.

3. The integrated electronic brake function detection system according to claim 2, characterized in that, The power detection unit collects multiple power supply voltages, including battery power supply voltage, microcontroller input / output interface voltage, microcontroller core voltage, controller area network power supply voltage, and analog-to-digital conversion reference voltage.

4. The integrated electronic brake function detection system according to claim 1, characterized in that, The communication detection unit includes a message generation subunit and a message receiving subunit, wherein: The message generation subunit is used to generate a preset communication message according to the test instruction and transmit it to the microcontroller; The message receiving subunit is used to receive the response message generated by the microcontroller and generate preliminary communication detection results.

5. The integrated electronic brake function detection system according to claim 1, characterized in that, The sensor detection unit includes a displacement sensor detection subunit and an angle sensor detection subunit, wherein: The displacement sensor detection subunit is used to detect the displacement sensor and generate preliminary displacement sensor detection results. The angle sensor detection subunit is used to detect the angle sensor and generate preliminary angle sensor detection results.

6. The integrated electronic brake function detection system according to claim 1, characterized in that, The chip self-test unit includes a first chip self-test subunit and a second chip self-test subunit, wherein: The first chip self-test subunit is used to perform a self-test on the motor drive chip and generate the first chip self-test result; The second chip self-test subunit is used to perform a self-test on the power management chip and generate the second chip self-test result.

7. The integrated electronic brake function detection system according to claim 1, characterized in that, The actuator detection unit includes a brake light detection subunit, a motor drive detection subunit, a storage detection subunit, and a temperature detection subunit, wherein: The brake light detection subunit is used to detect the control signal output from the microcontroller to the brake light and the voltage at the brake light control output terminal, and to generate preliminary brake light detection results. The motor drive detection subunit is used to detect the motor operating status in the integrated electronic braking system and generate preliminary motor drive detection results. The storage detection subunit is used to perform read and write tests on the EEPROM memory and generate preliminary storage detection results; The temperature detection subunit is used to detect the temperature sensor values ​​in the integrated electronic braking system and generate preliminary temperature detection results.

8. The integrated electronic brake function detection system according to claim 1, characterized in that, The host computer includes an instruction generation unit, a data parsing unit, and a report generation unit, wherein: The instruction generation unit is used to generate test instructions for each detection unit of the test module; The data parsing unit is used to parse the test data; The report generation unit is used to compare the parsed test data with preset standards and generate a test report.

9. The integrated electronic brake function detection system according to claim 8, characterized in that, The report generation unit determines that the integrated braking system is functionally qualified only when the detection data from the power supply detection unit, communication detection unit, sensor detection unit, chip self-test unit, and actuator detection unit all meet the preset standards.

10. The integrated electronic braking function detection method according to claim 1, characterized in that, The microcontroller used is an STM32F103C8T6.

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