Pre-sintering test system and pre-sintering test module thereof

Abstract

A pre-burning test module comprises a main frame, a connecting card assembly, a driving board and a pre-burning board or a system board. The connecting clamp assembly is located on the main frame. The drive board is electrically connected to one side of the connection card assembly. The presintering plate is electrically connected to the other side of the connecting clamp assembly, the main frame comprises a first pair of parallel sliding rails which are connected with the presintering plate in a sliding mode, and the first pair of parallel sliding rails are perpendicular to the long axis direction of the connecting clamp assembly. The presintering test module and the system thereof are beneficial to improving the maintenance efficiency and the automation of a production line.

Description

Technical Field

[0001] This invention relates to a pre-burn-in testing system and its pre-burn-in testing module. Background Technology

[0002] The known high-power pre-burn-in board / top-bottom operation mode requires the pre-burn-in board to be replaced every time the integrated circuit device under test is picked up or placed, which can easily cause wear on the gold fingers of the pre-burn-in board, or even damage to the pre-burn-in board due to improper handling by personnel.

[0003] As integrated circuit devices become larger and chip power increases, the weight of high-power pre-burn-in boards continues to rise, placing a heavy burden on manual handling. To address these issues with high-power pre-burn-in boards, the demand for production line automation is increasing. Summary of the Invention

[0004] This invention proposes a pre-burn-in testing system and its pre-burn-in testing module, which solves the problems of prior art.

[0005] According to some embodiments of the present invention, a pre-firing test system includes a furnace body, a multi-layer test rack, and a pre-firing test module. The furnace body includes a test chamber. The multi-layer test rack is located within the test chamber. The pre-firing test module is slidably connected to each layer of the multi-layer test rack, wherein the pre-firing test module includes a main frame and a pre-firing plate, wherein the main frame includes a first pair of parallel slide rails slidably connected to the pre-firing plate.

[0006] According to some embodiments of the present invention, each layer of the multi-layer test rack includes a second pair of parallel slide rails slidably connected to the main frame, the second pair of parallel slide rails being parallel to the first pair of parallel slide rails.

[0007] According to some embodiments of the present invention, the pre-burn-in test module further includes a connector assembly located on the main frame, wherein the first pair of parallel slide rails are perpendicular to the long axis of the connector assembly.

[0008] According to some embodiments of the present invention, the main frame includes two parallel rods, the first pair of parallel slide rails are located on the two parallel rods, and the pre-burnt plate is assembled from the openings of the two parallel rods and slidably connected to the first pair of parallel slide rails.

[0009] According to some embodiments of the present invention, the pre-burn test module further includes a drive board electrically connected to one side of the connector assembly. The drive board includes a drag chain support plate and a movable drag chain, which operates above the drag chain support plate.

[0010] According to some embodiments of the present invention, the pre-burn-in test system further includes a loading and unloading module comprising: a plurality of upright rods; a platform slidably connected to the upright rods; a carrier plate located on the platform for carrying a plurality of integrated circuit devices under test; and a third pair of parallel slide rails located on the platform and aligned with the opening of the test chamber.

[0011] According to some embodiments of the present invention, the loading and unloading module further includes a movable component, wherein the movable component is adjacent to the third pair of parallel slide rails, and the movable component moves between the loading and unloading module and the test chamber.

[0012] According to some embodiments of the present invention, the moving component is fixed to the main frame of the pre-burn-in test module, and the moving component moves the pre-burn-in test module from the test chamber to the loading and unloading module.

[0013] According to some embodiments of the present invention, the pre-burning test module is moved from the test chamber to the area of ​​the loading and unloading module, which at least includes the pre-burning plate.

[0014] According to some embodiments of the present invention, the loading and unloading module further includes a disassembly and assembly mechanism disposed on the platform, and the disassembly and assembly mechanism is located between the pre-burn-in test module and the platform. The pre-burn-in test module further includes a connection card assembly disposed on the main frame, and the disassembly and assembly mechanism is respectively connected to the main frame and the pre-burn-in board.

[0015] According to some embodiments of the present invention, the disassembly and assembly mechanism includes a translation component and a stop component. The translation component is connected to the pre-burned plate, and the stop component is connected to the main frame adjacent to the connecting card assembly. The translation component provides the driving force required for separating or assembling the pre-burned plate from the connecting card assembly by displacement toward or away from the stop component.

[0016] According to some embodiments of the present invention, the platform slides along the uprights in a first direction, and the third pair of parallel slide rails extend in a second direction perpendicular to the first direction.

[0017] According to some embodiments of the present invention, when the third pair of parallel slide rails is aligned and connected to the second pair of parallel slide rails, the main frame of the pre-burn-in test module is slidably connected to the second pair of parallel slide rails and the third pair of parallel slide rails.

[0018] According to some embodiments of the present invention, a pre-burn-in test module includes a main frame, a connector assembly, a driver board, and a pre-burn-in plate. The connector assembly is located on the main frame. The driver board is electrically connected to one side of the connector assembly. The pre-burn-in plate is electrically connected to the other side of the connector assembly, wherein the main frame includes a first pair of parallel slide rails slidably connected to the pre-burn-in plate, the first pair of parallel slide rails being perpendicular to the long axis direction of the connector assembly.

[0019] According to some embodiments of the present invention, the driver board includes a storage device for storing test software.

[0020] According to some embodiments of the present invention, the connection card assembly includes a power module.

[0021] According to some embodiments of the present invention, the main frame includes two parallel rods, and the first pair of parallel slide rails are located on the two parallel rods.

[0022] According to some embodiments of the present invention, the preheated plate is assembled from the opening of the two parallel rods and is slidably connected to the first pair of parallel slide rails.

[0023] According to some embodiments of the present invention, the drive board and the preheating board are electrically connected to two opposite sides of the connection card assembly.

[0024] According to some embodiments of the present invention, the main frame includes a second pair of parallel slide rails slidably connected to the drive plate, the second pair of parallel slide rails being perpendicular to the long axis direction of the connecting card assembly.

[0025] According to some embodiments of the present invention, the main frame includes a second pair of parallel slide rails slidably connected to the connecting card assembly, the second pair of parallel slide rails being parallel to the long axis direction of the connecting card assembly.

[0026] According to some embodiments of the present invention, the pre-burn-in board includes multiple connection interfaces. After the pre-burn-in board is electrically connected to a system board through the connection interfaces, the system board is subjected to pre-burn-in testing.

[0027] In summary, the pre-burning test system and module of the present invention can move in and out of the pre-burning furnace by carrying the drive board, the connection card assembly and the pre-burning board on the main frame. This can reduce the risk of damage to the gold fingers caused by repeatedly plugging and unplugging the pre-burning board when picking up and putting down the integrated circuit device under test, and facilitate the replacement of the drive board and the connection card assembly, which is conducive to increasing maintenance efficiency and production line automation.

[0028] The above description will be given in detail below with reference to the embodiments, and a further explanation of the technical solution of the present invention will be provided. Attached Figure Description

[0029] To make the above and other objects, features, advantages and embodiments of the present invention more apparent and understandable, the accompanying drawings are described below:

[0030] Figure 1 This is a perspective view of the pre-burning test system of the present invention;

[0031] Figure 2 Illustration Figure 1 A 3D view of the pre-burn-in test system removing the loading and unloading modules;

[0032] Figure 3A Illustration Figure 2 A three-dimensional view of the pre-burning test system with part of the shell removed from another perspective;

[0033] Figure 3B Illustration Figure 3A Enlarged view of part of it;

[0034] Figure 4 Illustration Figure 2 A partially enlarged view of the pre-burning test system;

[0035] Figure 5 This is a partially enlarged perspective view of the pre-burn-in test system of the present invention when the pre-burn-in test module is loaded;

[0036] Figure 6 A perspective view of the pre-burn-in test module according to the present invention is shown;

[0037] Figure 7 Illustration Figure 6 A partial exploded view of the pre-burn-in test module;

[0038] Figure 8 Illustration Figure 6 A three-dimensional view of the pre-burn-in test module from another perspective;

[0039] Figure 9A This is a cross-sectional schematic diagram of the snap-fit ​​mechanism of a pre-burning test module according to an embodiment of the present invention;

[0040] Figure 9B This is a cross-sectional schematic diagram of the snap-fit ​​mechanism of a pre-burn-in test module according to another embodiment of the present invention;

[0041] Figure 10A This is a schematic diagram illustrating the first state of the disassembly and assembly mechanism of the pre-fired plate of the present invention;

[0042] Figure 10B This is a schematic diagram illustrating the second state of the disassembly and assembly mechanism of the pre-fired plate of the present invention;

[0043] Figure 11 The diagram illustrates a cross-sectional view of the pre-burning system plate used in this invention.

[0044] Figure label:

[0045] 100: Pre-burn-in test system

[0046] 110: Furnace body

[0047] 110a: Test Chamber

[0048] 120: Multi-layer test fixture

[0049] 122: Floor

[0050] 124a: Slide rail

[0051] 124b: Slide rail

[0052] 200: Pre-burn-in test module

[0053] 201: Main Frame

[0054] 201a: Slide rail

[0055] 201b: Slide rail

[0056] 201c: Stop groove

[0057] 202a: Pole

[0058] 202b: Pole

[0059] 203a: Slide rail

[0060] 203b: Slide rail

[0061] 204a: Slide rail

[0062] 204b: Slide rail

[0063] 205a: Elastic element

[0064] 205b: Positioning Post

[0065] 205c: Positioning bead

[0066] 210: Connector Card Component

[0067] 210a: Slot

[0068] 220: Pre-fired plate

[0069] 222: Frame

[0070] 222a: Border

[0071] 222b: Frame edge

[0072] 222d: Positioning groove

[0073] 222e: Snap-on groove

[0074] 224: Circuit Board

[0075] 224a: Gold finger connection plate edge

[0076] 224b: Connection interface

[0077] 225: System Board

[0078] 226: Integrated Circuit Device Under Test

[0079] 230: Driver board

[0080] 231: Frame

[0081] 232: Active dragging

[0082] 234: Circuit Board

[0083] 235: Tractor bearing plate

[0084] 236: Storage device

[0085] 300: Loading / Exiting Module

[0086] 302: Platform

[0087] 304: Carrier Disk

[0088] 305: Translation component

[0089] 305a: Horizontal drive component

[0090] 305b: Vertical drive

[0091] 305c: Sliding fastener

[0092] 305d: Horizontal bar

[0093] 306: Upright pole

[0094] 307: Stop assembly

[0095] 307a: Drive unit

[0096] 307b: Stop fastener

[0097] 308: Slide rail

[0098] 309: Mobile Components

[0099] D 1: Direction

[0100] D 2: Direction

[0101] LD: Major axis direction Detailed Implementation

[0102] To provide a more detailed and complete description of the invention, reference can be made to the accompanying drawings and the various embodiments described below, in which the same numbers represent the same or similar components. Furthermore, well-known components and steps are not described in the embodiments to avoid unnecessarily limiting the invention.

[0103] In the implementation methods and the scope of the patent application, unless otherwise specified in the text, "a" and "the" may refer to one or more.

[0104] Please refer to Figures 1-3A , Figure 1A perspective view of the pre-burning test system 100 of the present invention is shown. Figure 2 Illustration Figure 1 The pre-burn-in test system removes the loading and unloading module 300 in a 3D view. Figure 3A Illustration Figure 2 The image shows a perspective view of the pre-burn-in test system 100 with a portion of the housing removed. The pre-burn-in test system 100 is a system used to test the reliability and stability of integrated circuits (ICs). By operating at high temperatures for a period of time, the pre-burn-in test system 100 can detect potential defects and faults early, thereby improving product quality and reliability. The pre-burn-in test system 100 includes a furnace body 110 and a loading / unloading module 300. The furnace body 110 includes a test chamber 110a. A multi-layer test rack 120 is disposed within the test chamber 110a. Each layer 122 of the multi-layer test rack 120 can accommodate a pre-burn-in test module 200 for pre-burn-in testing. In some embodiments of the invention, each layer 122 of the multi-layer test rack 120 includes a parallel slide rail (124a, 124b) slidably connected to the main frame of the pre-burn-in test module 200.

[0105] In some embodiments of the present invention, the loading / unloading module 300 includes a plurality of upright rods 306, a platform 302, a carrier tray 304, and a pair of parallel slide rails 308. The platform 302 is slidably connected to the upright rods 306 on both sides, allowing the platform 302 to move up and down along direction D1 (vertical direction). The carrier tray 304 is disposed on the platform 302 and is used to carry a plurality of integrated circuit devices under test. The pair of parallel slide rails 308 are located on the platform 302 and aligned with the opening of the test chamber 110a. The pair of parallel slide rails 308 extend along direction D2, which is perpendicular to direction D1. The pair of parallel slide rails 308 are used to load or unload the pre-burn-in test module 200 into or out of the test chamber 110a along direction D2 (horizontal direction).

[0106] Please refer to Figure 4 Its illustration Figure 2 A partially enlarged view of the pre-burn-in test system 100, specifically an enlarged view of the opening side of the test chamber 110a, showing a single layer 122 of the multi-layer test rack and the single pre-burn-in test module 200 it houses. Two parallel rods (202a, 202b) of the pre-burn-in test module 200 are slidably connected to a pair of parallel slide rails (124a, 124b) of the multi-layer test rack.

[0107] Please refer to the following at the same time Figure 4 , 5 , Figure 5 This is a partially enlarged perspective view of the pre-burn-in test system 100 of the present invention when it is unloaded from the pre-burn-in test module 200. The loading / unloading module 300 further includes a moving component 309 (see reference). Figure 1The moving component 309 is disposed adjacent to the parallel slide rail 308. The moving component 309 can be moved into the test chamber 110a by any of the following driving methods: cylinder, screw, motor and belt. The moving component 309 will then move closer to the main frame 201, contact and fix itself to the main frame 201. Then, by any of the following moving methods: cylinder, screw, motor and belt, the moving component 309 will drive the pre-burning test module 200 to move and move part of the pre-burning test module 200 out of the test chamber 110a. When the pair of parallel slide rails 308 of the loading / unloading module 300 are aligned with the pair of parallel slide rails (124a, 124b) corresponding to the multi-layer test frame 120, the moving component 309 can move between the loading / unloading module 300 and the test chamber 110a as described above. The moving component 309 also moves at least a portion of the pre-burned test module 200 out of the test chamber 110a and moves the area of ​​the pre-burned test module 200 containing at least the pre-burned plate 220 to the loading / unloading module 300. The main frame 201 of the single pre-burned test module 200 (e.g., 202a / 202b in the figure) can be driven and slid on the parallel slide rails 308 and parallel slide rails (124a, 124b) by the moving component 309, allowing the single pre-burned test module 200 to move along direction D. 2. Loading or unloading test chamber 110a, wherein the design of the moving component 309 in the loading / unloading module 300 allows a single moving component 309 to correspond to multiple sets of pre-burned test modules 200. The loading / unloading module 300 can move between the layers 122 of the multi-layer test rack 120, and the moving component 309 moves each pre-burned test module 200 to the loading / unloading module 300, so that the area of ​​the pre-burned test module 200 containing at least the pre-burned plate 220 is removed from the test chamber 110a in the multi-layer test rack 120. Then, other modules can pick up or put down the pre-burned plate 220 as a test object or perform other operations on the pre-burned test module 200. After replacing the pre-burning plate 220, the moving component 309 moves the area containing at least the pre-burning plate 220 in the pre-burning test module 200 from the position of the loading and unloading module 300 back to the test chamber 110a. Finally, the moving component 309 separates from the main frame 201 and exits the multi-layer test rack 120, thus completing the movement of the pre-burning test module 200 between the test chamber 110a and the loading and unloading module 300. The design of configuring a single moving component 309 with the loading and unloading module 300 can not only effectively save the cost of equipment construction, but also flexibly move multiple sets of pre-burning test modules 200 in conjunction with the movement of the loading and unloading module 300.In another embodiment, the moving component 309 can be disposed on the multi-layer test rack 120 or the slide rails (124a, 124b). In this embodiment, the moving component 309 and the pre-burn-in test module 200 are designed one-to-one. When the parallel slide rail 308 of the loading and unloading module 300 is docked with the parallel slide rails (124a, 124b) corresponding to the pre-burn-in test module 200 to be moved in the multi-layer test rack 120, the moving component 309 approaches the main frame 201, contacts and is fixed to the main frame 201. The moving component 309 can then drive the pre-burn-in test module 200 in and out of the test chamber 110a by any of the driving methods of cylinder, screw or motor and belt. This design can quickly move the pre-burn-in test module 200 to the loading and unloading module 300 from the multi-layer test rack 120, effectively shortening the movement time of the pre-burn-in test module 200. When a portion of a single pre-burn-in test module 200 (e.g., pre-burn-in board 220) extends out of the test chamber 110a, the integrated circuit device under test (ICD) 226 can be moved from the pre-burn-in board 220 to the carrier plate 304 or vice versa. After one layer 122 of the multilayer test fixture 120 has completed loading or unloading of the ICD 226, the moving component 309 separates from the main frame 201, and the platform 302 can move along direction D1 to the next layer 122, continuing to extend the pre-burn-in board 220 of the single pre-burn-in test module 200 out of the test chamber 110a and move it to the area of ​​the loading / unloading module 300 to perform loading or unloading of the ICD 226. This continues until all layers 122 of the multilayer test fixture 120 have completed loading or unloading of the ICD 226.

[0108] Please refer to the following at the same time Figures 6-8 , Figure 6 A perspective view of the pre-burn-in test module 200 according to the present invention is shown. Figure 7 Illustration Figure 6 A partial exploded view of the pre-burn-in test module 200. Figure 8 Draw Figure 6This is a perspective view of the pre-burn-in test module 200 (with movable drag link 232 removed). The pre-burn-in test module 200 includes a main frame 201, a connector assembly 210, a drive board 230, and a pre-burn-in plate 220. The connector assembly 210 is located on the main frame 201. The drive board 230 is electrically connected to one side of the connector assembly 210, and the pre-burn-in plate 220 is electrically connected to the other side of the connector assembly 210. The drive board 230 and the pre-burn-in plate 220 are electrically connected to two opposite sides of the connector assembly 210. The main frame 201 includes a pair of parallel slide rails (203a, 203b) slidably connected to the pre-burn-in plate 220. These parallel slide rails (203a, 203b) are perpendicular to another pair of parallel slide rails (201a, 201b). The connector assembly 210 can be assembled onto the main frame 201 via slide rails (201a, 201b). The long axis direction LD of the connector assembly 210 is parallel to the slide rails (201a, 201b) in the long axis direction LD of the connector assembly 210.

[0109] In some embodiments of the invention, the driver board 230 includes a storage device 236 (e.g., a read-only memory) for storing software required for pre-burn-in testing. In some embodiments of the invention, the connection card assembly 210 includes a power module required for pre-burn-in testing.

[0110] In some embodiments of the present invention, the pre-burn-in board 220 includes a frame 222, a circuit board 224, and a gold finger connecting edge 224a. The circuit board 224 includes a plurality of sockets for inserting an integrated circuit device 226 under test. The frame 222 is disposed around the periphery of the circuit board 224.

[0111] In some embodiments of the present invention, the main frame 201 includes two parallel rods (202a, 202b), and the two parallel rods (202a, 202b) have a pair of parallel slide rails (203a, 203b). The pre-burnt plate 220 can be assembled from the openings of the parallel slide rails (203a, 203b), such that the two frame edges (222a, 222b) of its frame 222 are slidably connected to the two parallel slide rails (203a, 203b). When the pre-burnt plate 220 approaches the connector assembly 210 along the two parallel slide rails (203a, 203b), the gold finger connecting plate edge 224a of the pre-burnt plate 220 will insert into the slot 210a of the connector assembly 210 to achieve electrical connection. The two parallel rods (202a, 202b) have another pair of parallel slide rails (204a, 204b). Parallel slide rails (204a, 204b) electrically connect the drive board 230 to the connector assembly 210 in a manner similar to that of parallel slide rails (203a, 203b). The slide rails (201a, 201b) are oriented differently from those (203a, 203b) and (204a, 204b), resulting in different sliding directions for the connector assembly 210 and the drive board 230 or preheated board 220 during installation and removal, effectively preventing interference during installation or removal.

[0112] Please refer to the following at the same time Figure 3A , 3B 6. In some embodiments of the present invention, the drive board 230 includes a frame 231, a circuit board 234, a drag chain support plate 235, a movable drag chain 232, and a storage device 236. The drag chain support plate 235 and the circuit board 234 are arranged side by side and surrounded by the frame 231. The movable drag chain 232 is used to accommodate pre-burned wires / signal lines (not shown in the figure) inside it. One end of the movable drag chain 232 is fixed to the furnace body 110 for connecting to external power supply and signal transmission, and the other end is fixed to the drag chain support plate 235. The pre-burned wires / signal lines provided in the movable drag chain 232 extend and are fixed to the drag chain support plate 235, and are electrically connected to the connection card assembly 210 and the drive board 230 respectively. The pre-burned wires / signal lines can be plugged in and installed to the connection card assembly 210 and the drive board 230 through electrical connection interfaces, so that each module in the pre-burned test module 200 can be flexibly replaced as needed. With the pre-burn-in test module 200 adopting the design of the movable loading and unloading test chamber 110a, the design of the movable drag chain 232 effectively avoids the pulling and interference of the wires, and can stably provide the signal and power supply to the pre-burn-in test module 200. It can also meet the requirements of stable power and test signal supply after flexible replacement of each module.

[0113] When the drive board 230 slides along direction D2, interference between the wires and components on the circuit board 234 is avoided. When the drive board 230 slides along direction D2, the movable drag chain 232 will only operate above the drag chain support plate 235, reducing the chance of interference between the movable drag chain 232 and components on the circuit board 234.

[0114] Please refer to the following at the same time Figure 9A , 9B The diagram illustrates a cross-sectional view of the locking mechanism of the pre-burning test module according to two embodiments of the present invention. The locking mechanism is used to position the pre-burning plate 220 and the drive plate 230 on the slide rail of the main frame 201. Figure 9A , 9B Only the relevant latching mechanism of the pre-fired plate 220 is shown. The side wall of the frame 222 of the pre-fired plate 220 has a positioning groove 222d. The side wall of the slide rail 203a has an elastic element 205a and a positioning post 205b. The elastic force of the elastic element 205a provides a pushing force to the positioning post 205b, causing it to protrude from the opening of the side wall of the slide rail 203a. When the positioning groove 222d and the positioning post 205b are aligned, the positioning post 205b is engaged in the positioning groove 222d, thereby positioning the pre-fired plate 220 on the slide rail 203a. When the positioning post 205b is disengaged from the positioning groove 222d, the pre-fired plate 220 can slide along the slide rail 203a. Figure 9B Implementation examples and Figure 9A One embodiment uses a positioning bead 205c instead of a positioning post 205b. In another embodiment, a positioning groove can be provided on the side wall of the slide rail 203a, while the elastic element and the positioning post 205b or positioning bead 205c can be provided on the side wall of the frame 222 of the pre-fired plate 220. The design of the positioning groove, elastic element, and positioning post 205b or positioning bead 205c can make the pre-fired plate 220 stably fixed on the slide rail 203a.

[0115] Please refer to the following at the same time Figure 10A , 10B The diagram illustrates two states of the disassembly and assembly mechanism of the pre-burning plate of the present invention. The loading and unloading module further includes a disassembly and assembly mechanism disposed on the platform 302. When the pre-burning test module 200 is removed from the test chamber 110a, the disassembly and assembly mechanism is clamped between the pre-burning test module 200 and the platform 302, and is used to separate the connecting card assembly 210 from the pre-burning plate 220. Figure 10B ) or assembly ( Figure 10AThis allows for the automated installation of the pre-burned plate. The disassembly and assembly mechanism includes a translation component 305 and a stop component 307. The translation component 305 can be connected to the frame 222 of the pre-burned plate 220, while the stop component 307 can be connected to the main frame 201 adjacent to the connecting card assembly 210. The connection and separation between the pre-burned plate 220 and the connecting card assembly 210 are achieved by adjusting the distance between the translation component 305 and the stop component 307. The stop component 307 includes a drive component 307a and a stop fastener 307b, which are fixed on the platform 302. The drive component 307a drives the stop fastener 307b to move up and down in direction D1 (e.g., vertical direction). The stop fastener 307b is inserted into the stop groove 201c adjacent to the main frame 201 of the connecting card assembly 210, thereby fixing the connecting card assembly 210 to the main frame 201. The translation assembly 305 includes a horizontal drive member 305a, a vertical drive member 305b, a translation fastener 305c, and a horizontal rod 305d. The horizontal drive member 305a drives the horizontal rod 305d to move along direction D2 (e.g., horizontally). The vertical drive member 305b is located at the end of the horizontal rod 305d and is used to drive the translation fastener 305c to move up and down along direction D1. The translation fastener 305c is used to insert into the snap-fit ​​groove 222e of the preheated plate 220 frame 222. When the horizontal drive member 305a moves closer to or away from the stop assembly 307 in direction D2, the horizontal drive member 305a provides the driving force required for the separation or assembly of the preheated plate 220 and the connecting clip assembly 210.

[0116] Please refer to Figure 11 The diagram illustrates a cross-sectional view of the pre-burn-in board used in this invention to pre-burn-in a system board. In other embodiments of this invention, the pre-burn-in board 220 can also pre-burn-in test a system board 225. The system board 225 is a circuit board used in practical applications, carrying and connecting all integrated circuit devices under test (UTDs), providing power and signal transmission. The system board 225 is also part of the final product and is directly used in the actual operation of the equipment. When the UTD is pre-burn-in tested using the system board 225, the system board 225 is placed on the carrier 304 for transport. After being transported to the loading / unloading module 300, the system board 225 is exchanged between the carrier 304 and the pre-burn-in board 220. The pre-burn-in board 220 and the system board 225 can be electrically connected via the connection interface 224b for pre-burn-in testing.

[0117] The pre-burn-in test system and module of this invention can move the drive board, connection card assembly, and pre-burn-in board into and out of the pre-burn-in furnace body via a main frame. This reduces the risk of damage to the gold fingers caused by repeatedly inserting and removing the pre-burn-in board when handling the integrated circuit device under test, and facilitates the replacement of the drive board and connection card assembly, thereby increasing maintenance efficiency and production line automation. The pre-burn-in test module integrates the drive board, pre-burn-in board, and connection card into one unit via the main frame. The main frame includes slide rails in two directions, allowing for the movable installation and removal of the drive board, pre-burn-in board, and connection card assembly, facilitating maintenance and module replacement. The pre-burn-in test module can be installed into the furnace body via the main frame. The furnace body contains multiple layers of spaced-apart stacked main frames to increase space utilization.

[0118] Although the present invention has been disclosed above by way of embodiments, it is not intended to limit the present invention. Any person skilled in the art can make various modifications and refinements without departing from the spirit and scope of the present invention. Therefore, the scope of protection of the present invention shall be determined by the appended claims.

Claims

1. A pre-burn-in test system, characterized in that, Include: Furnace body, including the test chamber; A multi-layer test fixture is located within the test chamber; and The pre-burning test module is slidably connected to each layer of the multi-layer test rack. The pre-burning test module includes a main frame and a pre-burning plate. The main frame includes a first pair of parallel slide rails that are slidably connected to the pre-burning plate.

2. The pre-burn-in test system as described in claim 1, characterized in that, Each layer of the multi-layer test rack includes a second pair of parallel slide rails that are slidably connected to the main frame, and the second pair of parallel slide rails are parallel to the first pair of parallel slide rails.

3. The pre-burn-in test system as described in claim 1, characterized in that, The pre-burn-in test module also includes a connector assembly located on the main frame, with the first pair of parallel slide rails perpendicular to the long axis of the connector assembly.

4. The pre-burn-in test system as described in claim 1, characterized in that, The main frame includes two parallel rods, and the first pair of parallel slide rails are located on the two parallel rods. The pre-burnt plate is assembled from the openings of the two parallel rods and is slidably connected to the first pair of parallel slide rails.

5. The pre-burn-in test system as described in claim 3, characterized in that, The pre-burn-in test module also includes a drive board electrically connected to one side of the connector assembly. The drive board includes a drag chain support plate and a movable drag chain that operates above the drag chain support plate.

6. The pre-burn-in test system as described in claim 2, characterized in that, It also includes a loading / unloading module, which contains: Multiple upright poles; The platform is slidably connected to these upright poles; A carrier disk, located on the platform, is used to carry multiple integrated circuit devices under test; as well as The third pair of parallel slide rails are located on the platform and aligned with the opening of the test chamber.

7. The pre-burn-in test system as described in claim 6, characterized in that, The loading and unloading module further includes a movable component, which is adjacent to the third pair of parallel slide rails and moves between the loading and unloading module and the test chamber.

8. The pre-burn-in test system as described in claim 7, characterized in that, The moving component is fixed to the main frame of the pre-burn-in test module, and moves the pre-burn-in test module from the test chamber to the loading and unloading module by the moving component.

9. The pre-burn-in test system as described in claim 8, characterized in that, The pre-burning test module is moved from the test chamber to the area of ​​the loading and unloading module, which at least includes the pre-burning plate.

10. The pre-burn-in test system as described in claim 9, characterized in that, The loading / unloading module further includes a disassembly / assembly mechanism disposed on the platform, and the disassembly / assembly mechanism is located between the pre-burn-in test module and the platform. The pre-burn-in test module further includes a connection card assembly disposed on the main frame, and the disassembly / assembly mechanism is respectively connected to the main frame and the pre-burn-in board.

11. The pre-burn-in test system as described in claim 10, characterized in that, The disassembly and assembly mechanism includes a translation component and a stop component. The translation component is connected to the pre-burned plate, and the stop component is connected to the main frame adjacent to the connector assembly. The translation component provides the driving force required for the separation or assembly of the pre-burned plate and the connector assembly by displacement toward or away from the stop component.

12. The pre-burn-in test system as described in claim 6, characterized in that, The platform slides along the first direction on the uprights, and the third pair of parallel slide rails extend along the second direction, which is perpendicular to the first direction.

13. The pre-burn-in test system as described in claim 12, characterized in that, When the third pair of parallel slide rails is aligned and connected to the second pair of parallel slide rails, the main frame of the pre-burn-in test module is slidably connected to the second pair of parallel slide rails and the third pair of parallel slide rails.

14. A pre-burn-in test module, characterized in that, Include: Main framework; The connection card assembly is located on this main frame; The driver board is electrically connected to one side of the connector card assembly; and A pre-burning plate is electrically connected to the other side of the connector assembly, wherein the main frame includes a first pair of parallel slide rails that are slidably connected to the pre-burning plate, the first pair of parallel slide rails being perpendicular to the long axis of the connector assembly.

15. The pre-burn-in test module as described in claim 14, characterized in that, The driver board includes a storage device for storing test software.

16. The pre-burn-in test module as described in claim 14, characterized in that, The connection card assembly includes a power module.

17. The pre-burn-in test module as described in claim 14, characterized in that, The main frame contains two parallel rods, and the first pair of parallel slide rails are located on the two parallel rods.

18. The pre-burn-in test module as described in claim 17, characterized in that, The preheated plate is assembled from the openings of the two parallel rods and is slidably connected to the first pair of parallel slide rails.

19. The pre-burn-in test module as described in claim 14, characterized in that, The drive board and the preheated plate are electrically connected to the two opposite sides of the connector card assembly.

20. The pre-burn-in test module as described in claim 14, characterized in that, The main frame includes a second pair of parallel slide rails that are slidably connected to the drive plate, the second pair of parallel slide rails being perpendicular to the long axis direction of the connecting card assembly.

21. The pre-burn-in test module as described in claim 14, characterized in that, The main frame includes a second pair of parallel slide rails that are slidably connected to the connector assembly, the second pair of parallel slide rails being parallel to the long axis direction of the connector assembly.

22. The pre-burn-in test module as described in claim 14, characterized in that, The pre-burn-in board contains multiple connection interfaces. After the pre-burn-in board is electrically connected to the system board through these connection interfaces, the system board is pre-burn-in tested.

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