The invention discloses a large-temperature-difference
dielectric test device and a large-temperature-difference
dielectric test method, relates to the technical field of
dielectric test, and solves the problems that dielectric
test equipment is insufficient in temperature field space uniformity, weak in dynamic temperature change
simulation capability and lack of multi-
physical field coupling test. The interior of a furnace body of the sealing test furnace is divided into a high-temperature area and a low-temperature area through a heat insulation plate; three
silicon carbide rods are arranged at the top of the furnace body to heat the high-temperature area, an electromagnetic injection valve is arranged at the bottom of the furnace body, and a
liquid nitrogen tank is communicated with the electromagnetic injection valve to provide
liquid nitrogen for the low-temperature area. A through hole is formed in the center of the heat insulation plate, and a sample is placed in the through hole; two electrodes of the
pilot frequency
dielectric loss tester respectively penetrate through the high-temperature area and the low-temperature area and are in contact with the upper surface and the lower surface of the sample; and the
pilot frequency
dielectric loss tester is connected with the
test data analyzer. Accurate characterization of the dielectric property of the material under the extreme working condition can be achieved, it is predicted that the research and
development period of an
insulation system can be shortened by 40%, and core
technical support is provided for reliability improvement of major equipment.