Crystal oscillator, device and method for single particle test

Abstract

The embodiment of the invention discloses a crystal oscillator, device and method for a single particle test. In a specific implementation mode, the crystal oscillator comprises a to-be-radiated chip, a differential chip, a quartz oscillator, a first base and a second base, the to-be-radiated chip is bonded in the cavity of the first base through a conductive adhesive, and the first base exposes the to-be-radiated chip; the differential chip is electrically connected with each port in the cavity of the first base through gold wire bonding; the quartz oscillator is bonded on a wafer placing platform in the cavity of the first base through a conductive adhesive and is electrically connected with the chip to be radiated to form an oscillation loop, and the orthographic projection of the quartz oscillator in the first base is not overlapped with the orthographic projection of the chip to be radiated in the first base; and the first base is mounted on the second base through a conductive adhesive.

Description

Technical Field

[0001] This invention relates to the design and testing of crystal oscillators. More specifically, it relates to a crystal oscillator, apparatus, and method for single-event experiments. Background Technology

[0002] Currently, single-event immunity is a crucial metric for evaluating space devices and a mandatory requirement for devices operating in space. The single-event immunity of crystal oscillators needs to be assessed through single-event testing. As specialized devices with hybrid integrated structures, crystal oscillators are far more complex to verify for radiation resistance than ordinary chips due to their intricate structure, especially since single-event testing is significantly more expensive and complex.

[0003] Traditional crystal oscillator integrated circuit chips are integrated inside the crystal oscillator and are usually covered by a quartz crystal. During single-event effect (SEE) testing, high-energy charged particles cannot directly enter the chip, making it impossible to assess the SEE performance of the crystal oscillator. Traditional crystal oscillator SEE testing lacks real-time online monitoring systems; performance can only be tested at the start and end of the test. There is no corresponding real-time online monitoring system or testing equipment for crystal oscillator SEE testing, making real-time online monitoring impossible. Furthermore, the fact that SEE sources are typically located in an equipment room, far from the outside environment, also leads to the unique challenges in setting up a real-time online monitoring system for crystal oscillator SEE testing. Summary of the Invention

[0004] The purpose of this invention is to provide a crystal oscillator, apparatus, and method for single-event experiments, in order to solve at least one of the problems existing in the prior art.

[0005] To achieve the above objectives, the present invention adopts the following technical solution: The first aspect of the present invention provides a crystal oscillator for single-event experiments, comprising: a chip to be irradiated, a differential chip, a quartz oscillator, a first base, and a second base; The chip to be irradiated is bonded to the cavity of the first base with conductive adhesive, and the first base exposes the chip to be irradiated. The differential chip is electrically connected to each port inside the cavity of the first base via gold wire bonding. The quartz oscillator is bonded to the wafer placement platform inside the cavity of the first base by conductive adhesive and is electrically connected to the chip to be irradiated to form an oscillation circuit. The orthographic projection of the quartz oscillator in the first base does not overlap with the orthographic projection of the chip to be irradiated in the first base. The first base is attached to the second base with conductive adhesive.

[0006] Optionally, the first base is a ceramic base.

[0007] Optionally, the quartz oscillator is a quartz oscillator made of a quartz wafer plated with electrodes.

[0008] Optionally, the length of the quartz wafer ranges from 1.9 nm to 2.1 nm; The width of the quartz wafer ranges from 1.2 nm to 1.4 nm.

[0009] Optionally, the electrode is a rectangular electrode; The length of the rectangular electrode ranges from 0.9 nm to 1.1 nm; The width of the rectangular electrode ranges from 0.7 nm to 0.9 nm.

[0010] A second aspect of the present invention provides an apparatus for single-event experiments, comprising: a crystal oscillator, an oscilloscope, a counter, a test fixture, an ion accelerator, and a processor; The test fixture is used to insert the crystal oscillator and apply a working voltage to the crystal oscillator; The oscilloscope and the counter are used to monitor the first output signal and the first operating current of the crystal oscillator before it is irradiated by a single-particle beam. The ion accelerator is used to output a single-particle beam and irradiate the crystal oscillator; The oscilloscope and the counter are also used to monitor the second output signal and the second operating current of the crystal oscillator when it is irradiated by a single-particle beam. The ion accelerator is also used to stop the output of single-particle beams; The oscilloscope and the counter are also used to monitor the third output signal and the third operating current of the crystal oscillator after it is irradiated by a single-particle beam. The processor is used to determine single-event effects based on the third output signal and the third operating current.

[0011] Optionally, the processor is configured to determine whether there is an abnormal current in the third operating current, and to determine the number of single-event lock-in events and the lock-in occurrence time based on the determination result.

[0012] Optionally, the processor is configured to determine whether there is an abnormal signal in the third output signal, and to determine the number of single-event effect flips and the flip time based on the determination result.

[0013] Optionally, the device further includes an irradiation target chamber, a sample holder, and an adapter; The crystal oscillator is placed on the sample holder; The sample holder is disposed in the irradiation target chamber; The adapter is used to enable data exchange between the crystal oscillator inside the irradiation target chamber and the oscilloscope, counter, and processor outside the irradiation target chamber.

[0014] A third aspect of the present invention provides a method for single-event testing using the aforementioned device, comprising: The crystal oscillator is inserted using the test fixture, and a working voltage is applied to the crystal oscillator. The oscilloscope and the counter are used to monitor the first output signal and the first operating current of the crystal oscillator before it is irradiated by a single-particle beam. The ion accelerator outputs a single-particle beam, which is then irradiated onto the crystal oscillator. The oscilloscope and the counter are used to monitor the second output signal and the second operating current of the crystal oscillator when it is irradiated by a single-particle beam. The ion accelerator is used to stop the output of single-particle beams; The oscilloscope and the counter are used to monitor the third output signal and the third operating current of the crystal oscillator after it has been irradiated by a single-particle beam. The processor determines single-event effects based on the third output signal and the third operating current.

[0015] The beneficial effects of this invention are as follows: The technical solution described in this invention solves the problem that traditional crystal oscillators cannot be tested for single-event effects, and meets the needs of crystal oscillators to carry out single-event effect tests. It can test the electrical performance parameters such as frequency and waveform of subsequent products in real time, so as to obtain online monitoring data of the product in the single-event state in real time, and test the state of the product in the single-event state. It can more comprehensively evaluate the single-event resistance index of crystal oscillators and provide test basis for improving the reliability of products. Attached Figure Description

[0016] The specific embodiments of the present invention will be described in further detail below with reference to the accompanying drawings.

[0017] Figure 1 This diagram illustrates a crystal oscillator for single-event experiments provided in an embodiment of the present invention.

[0018] Figure 2 A physical diagram of a crystal oscillator for single-event experiments provided in an embodiment of the present invention is shown.

[0019] Figure 3 This diagram illustrates a crystal oscillator apparatus for single-event experiments provided in an embodiment of the present invention. Detailed Implementation

[0020] To more clearly illustrate the present invention, the following description, in conjunction with embodiments and accompanying drawings, further explains the invention. Similar components in the drawings are indicated by the same reference numerals. Those skilled in the art should understand that the specific description below is illustrative rather than restrictive and should not be construed as limiting the scope of protection of the present invention.

[0021] Currently, single-event immunity is a crucial metric for evaluating space devices and a mandatory requirement for devices operating in space. The single-event immunity of crystal oscillators needs to be assessed through single-event testing. As specialized devices with hybrid integrated structures, crystal oscillators are far more complex to verify for radiation resistance than ordinary chips due to their intricate structure, especially since single-event testing is significantly more expensive and complex.

[0022] Traditional crystal oscillator integrated circuit chips are integrated inside the crystal oscillator and are usually covered by a quartz crystal. During single-event effect (SEE) testing, high-energy charged particles cannot directly enter the chip, making it impossible to assess the SEE performance of the crystal oscillator. Traditional crystal oscillator SEE testing lacks real-time online monitoring systems; performance can only be tested at the start and end of the test. There is no corresponding real-time online monitoring system or testing equipment for crystal oscillator SEE testing, making real-time online monitoring impossible. Furthermore, the fact that SEE sources are typically located in an equipment room, far from the outside environment, also leads to the unique challenges in setting up a real-time online monitoring system for crystal oscillator SEE testing.

[0023] In view of this, one embodiment of the present invention provides a crystal oscillator for single-event experiments, comprising: a chip to be irradiated, a differential chip, a quartz oscillator, a first base, and a second base; the chip to be irradiated is bonded to the cavity of the first base by conductive adhesive, and the first base exposes the chip to be irradiated; the differential chip is electrically connected to each port inside the cavity of the first base by gold wire bonding; the quartz oscillator is bonded to a wafer placement platform inside the cavity of the first base by conductive adhesive and is electrically connected to the chip to be irradiated to form an oscillation circuit, wherein the orthographic projection of the quartz oscillator in the first base does not overlap with the orthographic projection of the chip to be irradiated in the first base; the first base is mounted on the second base by conductive adhesive.

[0024] In a specific example, the crystal oscillator used for single-event testing is in the form of a DIP14 package, on which a surface-mount SMD7050 crystal oscillator for single-event effect testing is mounted, and the internal chip to be irradiated of the surface-mount SMD7050 crystal oscillator is fully exposed.

[0025] In a specific example, the crystal oscillator includes: a chip to be radiated 101, a quartz oscillator 102, an SMD7050 ceramic substrate 103, and a DIP14 substrate 104.

[0026] Furthermore, the chip to be irradiated 101 is bonded to the inside of the SMD7050 ceramic substrate 103 cavity using conductive adhesive, and then the differential chip pads and the ports inside the surface-mount ceramic substrate are electrically connected by gold wire bonding; when bonding the irradiated chip with conductive adhesive, the position of the chip to be irradiated on the SMD7050 ceramic substrate 103 can be slightly to the right, such as... Figure 1 and Figure 2 As shown, ensure that the chip inside the crystal oscillator is fully exposed to meet the requirements of single-event effect testing.

[0027] In a specific example, the SMD7050 ceramic base 103 cavity houses the chip 101 to be irradiated and the quartz oscillator 102, which are externally mounted on the DIP14 base with conductive adhesive.

[0028] In a specific example, the SMD7050 ceramic substrate 103 is mounted on the DIP14 base 104 using conductive adhesive to achieve electrical connection. Its pin connections adopt the common DIP14 crystal oscillator electrical connection method: pin 1 is empty, pin 2 is ground, pin 3 is output, and pin 4 is power supply.

[0029] The technical solution described in this invention solves the problem that traditional crystal oscillators cannot be tested for single-event effects, and meets the needs of crystal oscillators to carry out single-event effect tests. It can test the electrical performance parameters such as frequency and waveform of subsequent products in real time, so as to obtain online monitoring data of the product in the single-event state in real time, and test the state of the product in the single-event state. It can more comprehensively evaluate the single-event resistance index of crystal oscillators and provide test basis for improving the reliability of products.

[0030] In one possible implementation, the first base is a ceramic base. In another possible implementation, the quartz oscillator is a quartz oscillator made of a quartz wafer plated with electrodes.

[0031] In a specific example, a quartz oscillator 102, made from a plated quartz wafer, is bonded to the SMD7050 ceramic substrate 103 cavity wafer placement platform using conductive adhesive. The quartz oscillator is horizontally mounted and supported at two points on the surface-mount ceramic substrate using conductive adhesive, forming an oscillating electrical circuit with the chip to be radiated. The product output frequency is adjusted by frequency fine-tuning. When bonding the quartz oscillator with conductive adhesive, the bonding position of the quartz oscillator on the SMD7050 ceramic substrate 103 can be slightly to the left, such as... Figure 1 As shown, ensure that the quartz oscillator does not block the chip to be irradiated, in order to meet the requirements of single-event effect experiments.

[0032] In one possible implementation, the length of the quartz wafer ranges from 1.9 nm to 2.1 nm, and the width of the quartz wafer ranges from 1.2 nm to 1.4 nm.

[0033] In one possible implementation, the electrode is a rectangular electrode; the length of the rectangular electrode ranges from 0.9 nm to 1.1 nm; and the width of the rectangular electrode ranges from 0.7 nm to 0.9 nm.

[0034] In a specific example, the quartz wafer is selected as an AT-cut quartz wafer with a length of 2.0 mm and a width of 1.3 mm; the electrode is a rectangular electrode with a length of 1.0 mm and a width of 0.8 mm.

[0035] Another embodiment of the present invention provides an apparatus for single-event experiments, comprising: a crystal oscillator, an oscilloscope, a counter, a test fixture, an ion accelerator, and a processor; the test fixture is used to insert the crystal oscillator and apply an operating voltage to the crystal oscillator; the oscilloscope and the counter are used to monitor a first output signal and a first operating current of the crystal oscillator before it is irradiated by a single-event beam; the ion accelerator is used to output a single-event beam and irradiate the crystal oscillator; the oscilloscope and the counter are also used to monitor a second output signal and a second operating current of the crystal oscillator when it is irradiated by a single-event beam; the ion accelerator is also used to stop outputting the single-event beam; the oscilloscope and the counter are also used to monitor a third output signal and a third operating current of the crystal oscillator after it is irradiated by a single-event beam; the processor is used to determine the single-event effect based on the third output signal and the third operating current.

[0036] In a specific example, the surface-mount crystal oscillator for single-event effect testing is placed in a dedicated powered test fixture. Simply inserting the crystal oscillator into the DIP14 crystal test fixture allows for convenient single-event testing and data measurement. The apparatus for single-event testing offers advantages such as short testing cycles, low cost, and ease of operation.

[0037] In one possible implementation, the processor is configured to determine whether there is an abnormal current in the third operating current, and to determine the number of single-event lock-in events and the lock-in occurrence time based on the determination result.

[0038] In one possible implementation, the processor is configured to determine whether there is an abnormal signal in the third output signal, and to determine the number of single-event effect flips and the flip time based on the determination result.

[0039] In a specific example, when the current increases significantly (typically greater than 100mA for surface-mount crystal oscillators), it is determined that a lockout has occurred, and the number of times and the time are recorded.

[0040] In a specific example, when a waveform jumps, it is determined that a flip has occurred, and the number of times and the time are recorded.

[0041] In a specific example, a single-event effect (SEE) test is conducted by applying an operating voltage to a surface-mount crystal oscillator (SMO). The SMO's output signal and operating current are monitored using an oscilloscope and a counter, and the operating current and frequency of the product are recorded. A single-event beam is then applied, irradiating the test sample during the test. Throughout the test, the SMO's output signal and operating current are monitored and recorded in real-time using an oscilloscope and a counter.

[0042] In a specific example, a surface-mount crystal oscillator for single-event effect testing is placed in a single-event test monitoring system, which consists of a power supply device, a single-event board, an oscilloscope, a frequency counter, etc. During the single-event test, a nominal voltage is applied to the single-event board to ensure that the product is powered on. The frequency signal and waveform of the product are monitored in real time online through the oscilloscope and the counter, thus realizing online monitoring of the product.

[0043] In a specific example, the surface-mount crystal oscillator used in the single-event effect (SEE) test monitors and records its output signal and operating current in real time during the test using an oscilloscope and a counter. By determining whether there are any abnormalities in the product's output signal, the number of SEE flips and the timing of the flips in the test can be determined.

[0044] In a specific example, after a single-event effect (SEE) test, the surface-mount crystal oscillator is evaluated for any abnormalities in its current and output signal. The presence of abnormally high current is used to determine the number of SEE lock-ups and their timing during the test. Similarly, the presence of abnormal output signal is used to determine the number of SEE flips and their timing during the test.

[0045] In one possible implementation, the device further includes an irradiation target chamber, a sample holder, and an adapter; the crystal oscillator is placed on the sample holder; the sample holder is disposed in the irradiation target chamber; the adapter is used to enable data exchange between the crystal oscillator inside the irradiation target chamber and an oscilloscope, counter, and processor outside the irradiation target chamber.

[0046] In a specific example, the block diagram of the surface-mount crystal oscillator single-event effect experimental setup is shown below. Figure 3 As shown. The test sample is placed in the sample holder, and the control signals and test signals are connected to the test system via DB9 adapters and SMA adapters.

[0047] Another embodiment of the present invention provides a method for single-event testing using a device, comprising: inserting the crystal oscillator using the test fixture and applying an operating voltage to the crystal oscillator; monitoring a first output signal and a first operating current of the crystal oscillator before being irradiated by a single-event beam using the oscilloscope and the counter; outputting a single-event beam from the ion accelerator and irradiating the crystal oscillator using the oscilloscope and the counter; monitoring a second output signal and a second operating current of the crystal oscillator when irradiated by the single-event beam using the oscilloscope and the counter; stopping the output of the single-event beam using the ion accelerator; monitoring a third output signal and a third operating current of the crystal oscillator after being irradiated by the single-event beam using the oscilloscope and the counter; and determining the single-event effect using the processor based on the third output signal and the third operating current.

[0048] In a specific example, the specific steps of a real-time online monitoring method for single-event effect (SEE) testing of a crystal oscillator are as follows: Step 1: Preparation for the SEE test. Before the SEE test, a specially designed surface-mount crystal oscillator is fabricated to fully expose the internal chip of the sample, and placed in a dedicated power-on test fixture. Step 2: SEE test process. Initially, a working voltage is applied to the surface-mount crystal oscillator. The output signal and working current of the surface-mount crystal oscillator are monitored using an oscilloscope and counter, and the working current and frequency of the product are recorded. The single-event beam is turned on, and the test sample is irradiated by the single-event beam. During the test, the output signal and working current of the surface-mount crystal oscillator are monitored and recorded in real time using an oscilloscope and counter. Step 3: Post-SEE test result processing. The single-event beam is turned off, and the product current and output signal are checked for any abnormalities. By checking for abnormally high currents in the product, the number of SEE lock-ups and the lock-up time during the test are determined. By checking for any abnormalities in the product output signal, the number of SEE flips and the flip time during the test are determined.

[0049] Obviously, the above embodiments of the present invention are merely examples for clearly illustrating the present invention, and are not intended to limit the implementation of the present invention. For those skilled in the art, other variations or modifications can be made based on the above description. It is impossible to exhaustively list all the implementation methods here. All obvious variations or modifications derived from the technical solutions of the present invention are still within the protection scope of the present invention.

Claims

1. A crystal oscillator for single-event experiments, characterized in that, include: Chip to be irradiated, differential chip, quartz oscillator, first base, second base; The chip to be irradiated is bonded to the cavity of the first base with conductive adhesive, and the first base exposes the chip to be irradiated. The differential chip is electrically connected to each port inside the cavity of the first base via gold wire bonding. The quartz oscillator is bonded to the wafer placement platform inside the cavity of the first base by conductive adhesive and is electrically connected to the chip to be irradiated to form an oscillation circuit. The orthographic projection of the quartz oscillator in the first base does not overlap with the orthographic projection of the chip to be irradiated in the first base. The first base is attached to the second base with conductive adhesive.

2. The crystal oscillator for single-event experiments according to claim 1, characterized in that, The first base is a ceramic base.

3. The crystal oscillator for single-event experiments according to claim 2, characterized in that, The quartz oscillator is a quartz oscillator made of a quartz wafer plated with electrodes.

4. The crystal oscillator for single-event experiments according to claim 3, characterized in that, The length of the quartz wafer ranges from 1.9 nm to 2.1 nm; The width of the quartz wafer ranges from 1.2 nm to 1.4 nm.

5. The crystal oscillator for single-event experiments according to claim 4, characterized in that, The electrode is a rectangular electrode; The length of the rectangular electrode ranges from 0.9 nm to 1.1 nm; The width of the rectangular electrode ranges from 0.7 nm to 0.9 nm.

6. An apparatus for single-particle experiments, characterized in that, include: The crystal oscillator, oscilloscope, counter, test fixture, ion accelerator, and processor as described in any one of claims 1 to 5; The test fixture is used to insert the crystal oscillator and apply a working voltage to the crystal oscillator; The oscilloscope and the counter are used to monitor the first output signal and the first operating current of the crystal oscillator before it is irradiated by a single-particle beam. The ion accelerator is used to output a single-particle beam and irradiate the crystal oscillator; The oscilloscope and the counter are also used to monitor the second output signal and the second operating current of the crystal oscillator when it is irradiated by a single-particle beam. The ion accelerator is also used to stop the output of single-particle beams; The oscilloscope and the counter are also used to monitor the third output signal and the third operating current of the crystal oscillator after it is irradiated by a single-particle beam. The processor is used to determine single-event effects based on the third output signal and the third operating current.

7. The apparatus for single-event experiments according to claim 6, characterized in that, The processor is used to determine whether there is an abnormal current in the third operating current, and to determine the number of single-event lock-in events and the lock-in occurrence time based on the determination result.

8. The apparatus for single-event experiments according to claim 7, characterized in that, The processor is used to determine whether there is an abnormal signal in the third output signal, and to determine the number of single-event effect flips and the flip time based on the determination result.

9. The apparatus for single-event experiments according to claim 8, characterized in that, The device also includes an irradiation target chamber, a sample rack, and an adapter; The crystal oscillator is placed on the sample holder; The sample holder is disposed in the irradiation target chamber; The adapter is used to enable data exchange between the crystal oscillator inside the irradiation target chamber and the oscilloscope, counter, and processor outside the irradiation target chamber.

10. A method for single-event testing using the apparatus according to any one of claims 6 to 9, characterized in that, include: The crystal oscillator is inserted using the test fixture, and a working voltage is applied to the crystal oscillator. The oscilloscope and the counter are used to monitor the first output signal and the first operating current of the crystal oscillator before it is irradiated by a single-particle beam. The ion accelerator outputs a single-particle beam, which is then irradiated onto the crystal oscillator. The oscilloscope and the counter are used to monitor the second output signal and the second operating current of the crystal oscillator when it is irradiated by a single-particle beam. The single-particle beam output was stopped using the ion accelerator. The oscilloscope and the counter are used to monitor the third output signal and the third operating current of the crystal oscillator after it has been irradiated by a single-particle beam. The processor uses the third output signal and the third operating current to determine single-event effects.

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