XAFS automatic sample changing device integrating light intensity management and operation method

Abstract

The invention relates to the technical field of synchrotron radiation experiments, in particular to an XAFS automatic sample changing device integrating light intensity management and an operation method.The XAFS automatic sample changing device integrating light intensity management comprises an optical filter wheel, a sample table and a control assembly, the optical filter wheel and the sample table form an integrated structure used for XAFS experiments, the sample switching process is matched with the incident X-ray light intensity adjusting process, and the XAFS automatic sample changing device integrating light intensity management is achieved. Therefore, light intensity management is realized in an automatic sample changing process; an optical filter wheel capable of automatically switching, a sample table capable of accurately positioning and a temperature monitoring and remote control system cooperating with the sample table are introduced into a synchrotron radiation X-ray optical path, so that the photon flux incident on a sample can be optimized in real time according to the signal state of a detector and the thermal load of an optical filter; the stability, repeatability and safety of an XAFS experiment are remarkably improved while signal saturation and equipment overheating are avoided, so that manual intervention is reduced, the debugging time is shortened, and the operation efficiency of a whole light beam line is improved.

Description

Technical Field

[0001] This invention relates to the field of synchrotron radiation experimental technology, specifically to an XAFS automatic sample changing device and its operation method that integrates light intensity management. Background Technology

[0002] Synchrotron radiation is a high-intensity, wide-spectrum electromagnetic wave released tangentially by electrons moving at near-light speed in a storage ring when they are deflected in a magnetic field. This light source possesses excellent characteristics such as high brightness, high collimation, wide spectrum, polarization, and pulse time structure, and has become an indispensable tool for fundamental and cutting-edge scientific research, driving breakthroughs in multiple disciplines including materials science, chemistry, physics, life sciences, and environmental science.

[0003] Among the many experimental methods in synchrotron radiation, X-ray absorption fine structure spectroscopy (XAFS) is a unique structural characterization technique. XAFS does not rely on long-range ordered structures and can precisely detect local atomic structure information around absorbing atoms, including the type, number, distance, and disorder of coordinating atoms. This makes XAFS crucial in studying amorphous materials, catalyst active centers, ionic species in solutions, the charging and discharging processes of battery electrode materials, and the migration and transformation of environmental pollutants. The objects studied in these fields often lack perfect crystal structures, and XAFS provides the powerful ability to resolve their "chemical environment" at the atomic scale.

[0004] In existing synchrotron XAFS experiments, the incident light intensity is prone to dynamic range mismatch due to energy scanning and beam fluctuations. This often leads to detector signal saturation, linear distortion, or insufficient signal-to-noise ratio due to untimely or inaccurate manual filter replacement, resulting in absorption spectrum data deviation and reduced repeatability. At the same time, high-throughput irradiation can cause cumulative temperature rise of the filters, and without effective monitoring and cooling, thermal drift, deformation, or even failure can occur, causing optical path instability, experimental interruptions, and increased maintenance costs. Furthermore, if the equipment is not operated in the station building with a reliable remote control and one-button reset mechanism, problems such as positioning drift, misoperation, and time-consuming reset can easily occur, further reducing experimental efficiency and increasing operational risks in the radiation area. Summary of the Invention

[0005] To address the shortcomings of existing technologies, this invention provides an integrated XAFS automatic sample changing device and operating method with integrated light intensity management. By introducing an automatically switchable filter wheel, a precisely positioned sample stage, and a coordinated temperature monitoring and remote control system into the synchrotron X-ray optical path, the photon flux incident on the sample can be optimized in real time based on the detector signal status and filter thermal load. This significantly improves the stability, repeatability, and safety of XAFS experiments while avoiding signal saturation and equipment overheating, thereby reducing manual intervention, shortening debugging time, and improving the overall beamline operating efficiency.

[0006] To achieve the above objectives, the present invention adopts the following technical solution: An integrated XAFS automatic sample changing device with integrated light intensity management includes: a filter wheel, a sample stage, and a control component. The filter wheel is disposed on the synchrotron X-ray transmission path and is used to selectively attenuate the passing X-rays. The sample stage is used to carry multiple samples, and different samples are sequentially entered into the X-ray irradiation area by position switching. The control component is electrically connected to the filter wheel and the sample stage respectively, and is used to coordinate and control the working state of the filter wheel and the sample stage. The filter wheel and the sample stage constitute an integrated structure for XAFS experiments, so that the sample changing process and the incident X-ray intensity adjustment process are coordinated, thereby realizing light intensity management during automatic sample changing.

[0007] Preferably, the sample stage is provided with multiple sample mounting holes, each sample mounting hole is used to mount one sample, and the sample stage is rotated to allow different sample mounting holes to enter the X-ray irradiation position in sequence.

[0008] Preferably, the sample stage is a turntable structure that rotates around a fixed axis, and multiple sample mounting holes are distributed along the circumference of the sample stage.

[0009] Preferably, the filter wheel is provided with multiple filter slots, which are used to install filters or light-blocking plates to form different X-ray attenuation states.

[0010] Preferably, the filter slot is a detachable structure, allowing different filter slots to be replaced according to experimental needs.

[0011] Preferably, a thermocouple is provided on at least one filter slot, the thermocouple being used to detect the temperature of the filter during X-ray irradiation.

[0012] Preferably, the filter wheel is provided with a condensate inlet for introducing a cooling medium to cool the filter.

[0013] Preferably, the device is equipped with a zeroing control key for returning the filter wheel and / or sample stage to a preset reference position.

[0014] Preferably, the device is adapted to be placed in the X-ray optical path after the synchrotron radiation source passes through the dual-crystal monochromator, with the sample located between the front ionization chamber and the rear ionization chamber.

[0015] Preferably, the method of operating the XAFS automatic sampling device with integrated light intensity management includes the following steps: S1. In the X-ray optical path formed by the synchrotron radiation source and the dual-crystal monochromator, a filter wheel and a sample stage are set up, wherein the filter wheel is used to adjust the intensity of the incident X-ray light, and the sample stage is used to support multiple samples. S2. The sample stage is rotated by the control component, so that the samples installed in different sample mounting holes enter the X-ray irradiation position in sequence, thereby realizing automatic sample switching. S3. During the sample switching process, the filter wheel is controlled by the control component to switch between different filter slots, so as to change the state of the filter or light-blocking plate in the X-ray light path, thereby adjusting the intensity of the X-ray light incident on the sample. S4. During X-ray irradiation, the temperature information of the filter is obtained by using a thermocouple set on the filter slot, and the filter is cooled through the condensate interface when the temperature reaches a preset threshold. S5. The sample switching step and the light intensity adjustment step are carried out in the same experimental procedure to balance testing efficiency and the safety of samples and filters during continuous XAFS testing.

[0016] Compared with the prior art, the present invention has the following beneficial effects: 1. This invention proposes an X-ray filtering and sample management device that integrates adaptive light intensity adjustment and thermal safety protection. By introducing an automatically switchable filter wheel, a precisely positioned sample stage, and a temperature monitoring and remote control system in the synchrotron X-ray optical path, the photon flux incident on the sample can be optimized in real time according to the detector signal status and filter thermal load. This significantly improves the stability, repeatability, and safety of XAFS experiments while avoiding signal saturation and equipment overheating, thereby reducing manual intervention, shortening debugging time, and improving the operating efficiency of the entire beamline.

[0017] 2. In this invention, the filter wheel is designed as a modular structure with multiple filter slots. Filters or light-blocking plates of different materials or thicknesses are installed in different slots, thereby forming a set of light intensity gradients covering multiple X-ray attenuation ratios. This allows the system to flexibly adjust the incident light intensity over a wide energy range and a large dynamic range. When the detector feedback signal indicates that the light intensity is too high and tends to saturate, the control system can drive the filter wheel to automatically switch to a filter with a higher attenuation level, rapidly reducing the photon flux received by the sample. When the light intensity is insufficient or the signal-to-noise ratio needs to be improved, it switches to a lower attenuation level, realizing the transformation of light intensity adjustment from passively relying on manual operation to active intelligent control, significantly improving experimental efficiency and data consistency.

[0018] 3. The present invention further includes a thermocouple on at least one filter slot and a condensate inlet integrated on the filter wheel, so that the temperature rise generated by the filter during X-ray irradiation can be monitored in real time and removed in a timely manner; when the thermocouple detects an abnormal increase in the filter temperature, the system can determine that the current filter is absorbing too much photon energy, automatically link the filter wheel to switch to a thinner filter or reduce the attenuation load, and at the same time introduce a circulating cooling medium through the condensate inlet to accelerate heat dissipation, thereby effectively avoiding performance drift, deformation or failure of the filter caused by long-term high temperature, and ensuring long-term stable operation of the device under high-flux synchrotron radiation conditions.

[0019] 4. In this invention, the filter wheel and sample stage are each equipped with a drive motor and connected to the control system via a data transmission interface. The control system then communicates with a remote operation panel outside the station building via a data cable, allowing experimenters to select filters and adjust sample positions without entering the radiation area. The system has an independent zeroing control key, which can quickly return the filter wheel and sample stage to the preset reference position after the start of the experiment, abnormal interruption, or component replacement, eliminating accumulated errors and ensuring positional consistency. At the same time, a manual adjustment channel is retained on the basis of automatic control, allowing users to directly select the filter level through adjustment buttons to meet debugging or special experimental needs, achieving an organic unity of automation, reliability, and operational flexibility. Attached Figure Description

[0020] Figure 1 This is a schematic diagram of the overall structure and connection of the device of the present invention; Figure 2 This is a schematic diagram of the sample stage and filter wheel of the device of the present invention; Figure 3 This is a schematic diagram of the remote control panel of the device of the present invention.

[0021] In the diagram: 1. Filter wheel; 2. Sample stage; 3. Sample mounting hole; 4. Filter slot; 5. Thermocouple; 6. Condensate inlet; 7. Data transmission interface; 8. Zeroing control key; 9. Filter wheel control button; 10. Sample stage control button; 11. Rear ionization chamber; 12. Sample; 13. Light-blocking plate; 14. Front ionization chamber; 15. Dual-crystal monochromator; 16. Synchrotron radiation source. Detailed Implementation

[0022] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments.

[0023] Contents not described in detail in this specification are prior art known to those skilled in the art. In the description of this invention, it should be understood that terms such as "center," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," and "counterclockwise," indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings and are only for the convenience of describing the invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of the invention. Furthermore, terms such as "first," "second," and "third," etc., are only used to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0024] Figures 1-3 As shown, an integrated XAFS automatic sample changing device with integrated light intensity management includes: a filter wheel 1, a sample stage 2, and a control component. The filter wheel 1 is disposed on the synchrotron X-ray transmission path and is used to selectively attenuate the passing X-rays. The sample stage 2 is used to carry multiple samples 12, and different samples 12 are sequentially entered into the X-ray irradiation area by switching their positions. The control component is electrically connected to the filter wheel 1 and the sample stage 2 respectively, and is used to coordinate and control the working state of the filter wheel 1 and the sample stage 2. The filter wheel 1 and the sample stage 2 constitute an integrated structure for XAFS experiments, so that the sample changing process and the incident X-ray light intensity adjustment process are coordinated with each other, thereby realizing light intensity management during automatic sample changing.

[0025] This invention proposes an X-ray filtering and sample management device that integrates adaptive light intensity adjustment and thermal safety protection. By introducing an automatically switchable filter wheel 1, a precisely positioned sample stage 2, and a temperature monitoring and remote control system in the synchrotron X-ray optical path, the photon flux incident on the sample 12 can be optimized in real time according to the detector signal status and filter thermal load. This significantly improves the stability, repeatability, and safety of XAFS experiments while avoiding signal saturation and equipment overheating, thereby reducing manual intervention, shortening debugging time, and improving the operating efficiency of the entire beamline.

[0026] The filter wheel 1 and sample stage 2 are each equipped with a drive motor, which drives the filter wheel 1 and / or sample stage 2 to rotate. The drive motor is electrically connected to a remote control system. The control system is connected via a data cable to a remote operation panel located outside the beamline station shed, enabling remote operation and status display of the device from outside the shed. The control system includes a sample stage position controller and an independent zeroing control key 8, used to select the workstation position of sample stage 2 and return the filter wheel 1 and / or sample stage 2 to a preset reference position. The filter selection is automatically switched to the appropriate filter level by the control system based on the detector signal strength and the real-time temperature monitoring results of the thermocouple 5, to avoid signal saturation and suppress the risk of filter overheating. Simultaneously, the control system also includes an adjustment button to support manual filter selection, meeting user debugging, special operating conditions, or manual intervention needs.

[0027] It should be noted that the filter wheel 1 and the sample stage 2 are respectively connected to the control component through the data transmission interface 7, thereby realizing the issuance of position commands, the transmission of operating status, and interlock control.

[0028] Furthermore, the sample stage 2 is provided with a plurality of sample mounting holes 3, each sample mounting hole 3 is used to mount a sample 12, and the sample stage 2 rotates to allow different sample mounting holes 3 to enter the X-ray irradiation position in sequence; The sample stage 2 is provided with multiple sample mounting holes 3 for mounting one sample 12 at a time. This allows the sample stage 2 to sequentially send different sample mounting holes 3 into the X-ray irradiation position during rotation, thereby realizing continuous automatic sample changing and batch testing of multiple samples, reducing the frequency of manual operation in the greenhouse and improving the utilization rate of the beam machine. Furthermore, when the sample stage 2 is uniformly opened with twelve sample mounting holes 3 along the circumference, it can simultaneously carry the unknown sample to be tested as well as commonly used metal standard samples 12 such as Cu foil and Fe foil placed in advance. This allows standard sample measurements to be interspersed as needed during the experiment for energy calibration and drift verification, improving data consistency and comparability. At the same time, it avoids the positioning error and contamination risk caused by frequent sample loading and unloading, comprehensively improving testing efficiency, repeatability and experimental stability.

[0029] Furthermore, the sample stage 2 is a turntable structure that rotates around a fixed axis, and multiple sample mounting holes 3 are distributed along the circumference of the sample stage 2; the sample stage 2 has twelve workstations, and six light-blocking plates of different thicknesses are installed on the filter wheel; the position of the sample stage is set manually, and the position of the filter stage is automatically switched by the detector signal strength received by the system and the thermocouple transmission temperature value or manually switched by the system.

[0030] The sample stage 2 is a turntable structure that rotates around a fixed axis. Multiple sample mounting holes 3 are distributed around the circumference of the sample stage 2 to form twelve usable stations, enabling the samples 12 to be loaded in batches and switched sequentially at a fixed pace, thereby improving the continuous testing throughput while ensuring positioning consistency. Six light-blocking plates 13 of different thicknesses are installed on the filter wheel 1, which can provide multiple levels of light intensity attenuation to adapt to the testing requirements of samples 12 with different absorption intensities and different radiation tolerances, avoiding detector overload and improving the availability of the effective signal range. The position of the sample stage 2 can also be manually set, which makes it easy for the experimenter to quickly specify the test sample 12 and the standard sample station according to the predetermined test sequence. The position of the filter wheel 1 can be automatically switched by the system according to the detector signal strength and the temperature value transmitted by the thermocouple 5, realizing dynamic constraints on incident light intensity and heat load, or manually switched when needed, thereby taking into account automatic protection and manual controllability, reducing the risk of overheating of the filter wheel 1 and improving the stability and repeatability of the entire experiment.

[0031] Furthermore, the filter wheel 1 is provided with a plurality of filter slots 4, which are used to install filters or light-blocking plates 13 to form different X-ray attenuation states; the sample stage and the filter wheel are made of coated aluminum alloy material; the light-blocking plate is installed on the filter wheel by a slot and is replaceable.

[0032] Multiple filter slots 4 are provided on the filter wheel 1. The filter slots 4 are used to install filters or light-blocking plates 13 to form different X-ray attenuation states. The sample stage 2 and the filter wheel 1 are made of coated aluminum alloy material to take into account strength, corrosion resistance and thermal stability. The light-blocking plate 13 is installed on the filter wheel 1 in a slot-type manner and can be quickly replaced, so as to facilitate the configuration of attenuation levels according to experimental energy range and flux requirements. The filter slots 4 are preferably configured as 6, corresponding to 6 light-blocking plates 13 of different materials or thicknesses, to provide light intensity gradients covering different attenuation ratios. Each filter slot 4 is externally connected to a thermocouple 5 to realize real-time detection of filter temperature and connected to the condensate circulation system corresponding to the condensate interface 6 for active temperature control. The filter group communicates with the remote control system outside the shed through the data transmission interface 7. When the detector signal intensity indicates that the incident light intensity is too high and causes signal saturation, the system automatically switches to a thicker filter to reduce the photon flux received by the sample 12. When the thermocouple 5 detects that the filter temperature is too high, the system automatically switches to a thinner filter to reduce absorption and heat generation and achieve an adaptive balance between signal quality and thermal safety, thereby reducing manual intervention, reducing the risk of filter overheating failure and experimental interruption, and improving data stability and repeatability. The filter can be replaced by an insert-type slot, allowing users to replace the entire filter set according to experimental needs and shorten preparation time. At least one set of spare components is provided, including spare sample stage 2 and spare filter wheel 1 with the same structure as sample stage 2 and filter wheel 1, so as to achieve non-stop replacement in case of component failure or need for rapid configuration change and improve the availability and operation continuity of the device.

[0033] Furthermore, the filter slot 4 is a detachable structure, allowing different filter slots 4 to be replaced according to experimental needs.

[0034] By setting the filter slot 4 as a detachable structure, the filter wheel 1 can quickly replace different filter slots 4 and their corresponding filters or light-blocking plates 13 according to the experimental energy range, target attenuation ratio and thermal load conditions without changing the main components. This enables modular and standardized management of filter configuration, shortens the changeover and maintenance time, reduces assembly errors and wear risks caused by repeated disassembly and assembly, and improves the adaptability and operational reliability of the device for different XAFS test tasks.

[0035] Furthermore, a thermocouple 5 is provided on at least one filter slot 4, the thermocouple 5 being used to detect the temperature of the filter during X-ray irradiation.

[0036] A thermocouple 5 is installed on at least one filter slot 4 to detect the temperature of the filter during X-ray irradiation. This allows the device to obtain the thermal load status of the filter in real time and issue an over-temperature warning or trigger corresponding intensity adjustment and cooling control. This reduces the risk of performance drift, deformation or failure of the filter due to overheating and improves the stability of intensity adjustment and the safety and continuity of the experimental process.

[0037] Furthermore, the filter wheel 1 is provided with a condensate inlet 6 for introducing a cooling medium to cool the filter.

[0038] The filter wheel 1 is equipped with a condensate inlet 6, which is used to introduce a cooling medium to cool the filter. This allows the filter to remove heat in time when heat accumulates during X-ray irradiation and maintain its operating temperature within a safe range. This reduces the risk of performance drift, deformation, or failure of the filter due to overheating, improves the continuous operation capability and light intensity adjustment stability of the filter wheel 1, and reduces experimental interruptions and maintenance costs caused by thermal problems.

[0039] Furthermore, the device is equipped with a zeroing control key 8, which is used to return the filter wheel 1 and / or the sample stage 2 to a preset reference position.

[0040] The device is equipped with a zeroing control key 8, which is used to return the filter wheel 1 and / or sample stage 2 to the preset reference position with one key. This allows for a quick return to a uniform initial working condition after filter replacement, sample loading / unloading 12, or abnormal shutdown, eliminating alignment deviations caused by accumulated step errors and position drift. This facilitates position calibration and station identification, reduces the risk of misoperation, and improves system reset efficiency, operational reliability, and experimental repeatability.

[0041] Furthermore, the device is adapted to be placed in the X-ray path of the synchrotron radiation source 16 after passing through the dual-crystal monochromator 15, with the sample 12 located between the front ionization chamber 14 and the rear ionization chamber 11.

[0042] The device is adapted to be placed in the X-ray path after the synchrotron radiation source 16 passes through the dual-crystal monochromator 15, and to position the sample 12 between the front ionization chamber 14 and the rear ionization chamber 11, so that the sample 12 can be measured by transmission XAFS under the stable energy conditions after monochromatization. The front ionization chamber 14 provides the incident intensity reference and the rear ionization chamber 11 obtains the transmission intensity signal to realize real-time normalization correction of beam fluctuations, thereby improving the signal-to-noise ratio and energy scan repeatability of the absorption spectrum data, reducing the influence of system drift on the measurement results, and enhancing the data comparability between different samples 12 and different batches of experiments.

[0043] It should be noted that the filter wheel 1 and the sample stage 2 are connected to the control system via the data transmission interface 7 to realize the issuance of position commands, feedback of operating status, and interlock control. At the same time, the remote operation panel is equipped with a filter wheel control button 9 and a sample stage control button 10. Users can manually select, jog, and confirm the filter wheel 1 through the filter wheel control button 9, and switch the workstation, jog, and confirm the position of the sample stage 2 through the sample stage control button 10. This provides necessary manual intervention channels in addition to the automatic switching strategy, ensuring the continuity of operation and the reliability of control of the device under debugging, maintenance, and special experimental conditions.

[0044] The method for operating the XAFS automatic sampling device with integrated light intensity management includes the following steps: S1. In the X-ray optical path formed by the synchrotron radiation source 16 and the dual-crystal monochromator 15, a filter wheel 1 and a sample stage 2 are set up, wherein the filter wheel 1 is used to adjust the intensity of the incident X-ray light, and the sample stage 2 is used to support multiple samples 12. S2. The sample stage 2 is rotated by the control component, so that the samples 12 installed in different sample mounting holes 3 enter the X-ray irradiation position in sequence, thereby realizing the automatic switching of samples. S3. During the sample switching process, the filter wheel 1 is controlled by the control component to switch different filter slots 4 to change the state of the filter or light-blocking plate 13 in the X-ray light path, thereby adjusting the intensity of the X-ray light incident on the sample 12. S4. During X-ray irradiation, the temperature information of the filter is obtained by using the thermocouple 5 set on the filter slot 4, and the filter is cooled by the condensate interface 6 when the temperature reaches the preset threshold. S5. The sample switching step and the light intensity adjustment step are carried out in the same experimental procedure to balance testing efficiency and the safety of samples and filters during continuous XAFS testing.

[0045] The present invention has been illustrated through the above embodiments, but the present invention is not limited to the above embodiments, that is, it does not mean that the present invention must rely on the above embodiments to be implemented. Those skilled in the art should understand that all related improvements to the present invention fall within the protection and disclosure scope of the present invention.

Claims

1. An XAFS automatic sampling device with integrated light intensity management, characterized in that, include: The system comprises a filter wheel (1), a sample stage (2), and a control component. The filter wheel (1) is positioned on the synchrotron X-ray transmission path and is used to selectively attenuate the passing X-rays. The sample stage (2) is used to carry multiple samples (12) and allows different samples (12) to enter the X-ray irradiation area sequentially by switching their positions. The control component is electrically connected to the filter wheel (1) and the sample stage (2) respectively and is used to coordinate and control the working state of the filter wheel (1) and the sample stage (2). The filter wheel (1) and the sample stage (2) constitute an integrated structure for XAFS experiments, so that the sample switching process and the incident X-ray intensity adjustment process are coordinated with each other, thereby realizing light intensity management during automatic sample changing.

2. The XAFS automatic sampling device with integrated light intensity management according to claim 1, characterized in that, The sample stage (2) is provided with multiple sample mounting holes (3), each sample mounting hole (3) is used to mount a sample (12), and the sample stage (2) rotates to allow different sample mounting holes (3) to enter the X-ray irradiation position in sequence.

3. The XAFS automatic sampling device with integrated light intensity management according to claim 2, characterized in that, The sample stage (2) is a turntable structure that rotates around a fixed axis, and multiple sample mounting holes (3) are distributed along the circumference of the sample stage (2).

4. The XAFS automatic sampling device with integrated light intensity management according to claim 1, characterized in that, The filter wheel (1) is provided with multiple filter slots (4), which are used to install filters or light-blocking plates (13) to form different X-ray attenuation states.

5. The XAFS automatic sampling device with integrated light intensity management according to claim 4, characterized in that, The filter slot (4) is a detachable structure, allowing different filter slots (4) to be replaced according to experimental requirements.

6. The XAFS automatic sampling device with integrated light intensity management according to claim 4, characterized in that, A thermocouple (5) is provided on at least one filter slot (4), the thermocouple (5) being used to detect the temperature of the filter during X-ray irradiation.

7. The XAFS automatic sampling device with integrated light intensity management according to claim 6, characterized in that, The filter wheel (1) is provided with a condensate inlet (6) for introducing a cooling medium to cool the filter.

8. The XAFS automatic sampling device with integrated light intensity management according to claim 1, characterized in that, The device is equipped with a zeroing control key (8) for returning the filter wheel (1) and / or the sample stage (2) to a preset reference position.

9. The XAFS automatic sampling device with integrated light intensity management according to claim 1, characterized in that, The device is adapted to be placed in the X-ray path of the synchrotron radiation source (16) after passing through the dual crystal monochromator (15), with the sample (12) located between the front ionization chamber (14) and the rear ionization chamber (11).

10. A method of operating the XAFS automatic sampling device with integrated light intensity management as described in any one of claims 1-9, characterized in that, Includes the following steps: S1. In the X-ray optical path formed by the synchrotron radiation source (16) and the double crystal monochromator (15), a filter wheel (1) and a sample stage (2) are set up, wherein the filter wheel (1) is used to adjust the intensity of the incident X-ray light, and the sample stage (2) is used to carry multiple samples (12). S2. The sample stage (2) is rotated by the control component, so that the samples (12) installed in different sample mounting holes (3) enter the X-ray irradiation position in sequence, thereby realizing the automatic switching of samples; S3. During the sample switching process, the filter wheel (1) is controlled by the control component to switch different filter slots (4) to change the state of the filter or light-blocking plate (13) in the X-ray light path, thereby adjusting the intensity of the X-ray light incident on the sample (12). S4. During X-ray irradiation, the temperature information of the filter is obtained by using the thermocouple (5) set on the filter slot (4), and the filter is cooled by the condensate interface (6) when the temperature reaches the preset threshold. S5. The sample switching step and the light intensity adjustment step are carried out in the same experimental procedure to balance testing efficiency and the safety of samples and filters during continuous XAFS testing.

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