Device for calibrating an x-ray system, x-ray device and method for calibrating an x-ray device

Abstract

According to the invention, a device for calibrating an X-ray system having an X-ray source and an X-ray detector, said calibration device comprising a set of at least two X-ray absorbing elements, each element extending in a longitudinal direction and a lateral direction, characterized in that the X-ray absorbing elements are arranged in the longitudinal direction and in the lateral direction. The device is configured to be able to adjust the position of each element along a closed curve in a plane extending transverse to the lateral direction and parallel to the longitudinal direction such that the elements in each of the first and second subsets of the group of elements are positioned with their longitudinal directions aligned in an alignment direction transverse to the curve, and wherein a first total length of the elements in the first subset in the longitudinal direction is different from a second total length of the elements in the second subset in the longitudinal direction.

Description

Technical Field

[0001] This invention relates to an apparatus for calibrating an X-ray system having an X-ray source and an X-ray detector, the calibration apparatus comprising a set of at least two X-ray absorbing elements, each extending in both longitudinal and lateral directions. The calibration apparatus is particularly suitable for calibrating X-ray systems in which an object to be examined is transported along a transmission path between the X-ray source and the X-ray detector. The invention also relates to an X-ray device comprising an X-ray system and a calibration apparatus, and a method for calibrating the X-ray device. Background Technology

[0002] X-ray systems have a variety of applications, including product inspection. For example, in the food industry, reliably detecting foreign objects in food is crucial. To do this, the object to be inspected can be transported, for example, along a conveyor path between the X-ray source and the X-ray detector of the X-ray system. The X-ray source can generate a fan-shaped beam, and the X-ray detector can be arranged to receive this beam and configured to output a signal in response to the received radiation dose. In this way, a two-dimensional X-ray image of the object to be inspected can be created. In the food inspection example described above, the X-ray image allows for the inference of the presence of foreign objects in the food.

[0003] X-ray systems are based on the physical phenomenon of X-ray absorption. For monochromatic beams, according to... According to the Beer-Lambert law, the absorption is directly related to the distance x that the X-rays travel in a homogeneous body. Here, I is the intensity of the incident radiation, I is the intensity of the transmitted radiation, and b is the X-ray absorption coefficient that depends on the material.

[0004] X-ray systems must be calibrated regularly to ensure that the detector's output signal indicates the amount of radiation received. This is because the characteristics of an X-ray system, particularly the X-ray source and the X-ray detector, can change over time. Furthermore, the characteristics of a newly manufactured X-ray system may not be fully understood. For example, an X-ray detector may include a scintillation material that responds to incident X-ray radiation. This scintillation material may not be homogeneous. Additionally, for a line detector made up of multiple individual detector elements, these elements may have slightly different properties, thus requiring calibration before use.

[0005] In typical calibration procedures, a phantom, an object with known absorption characteristics, is placed within the X-ray beam between the X-ray source and the X-ray detector. The detector's output signal is recorded against the phantom, and the X-ray system can be calibrated such that the output signal indicates the amount of radiation that has necessarily passed through the phantom. In some calibration procedures, a phantom with spatially varying absorption characteristics is required to perform the calibration.

[0006] Various possible calibration devices (phantoms) are known in the prior art. Typically, calibration devices are suited for calibrating specific types of X-ray systems. US 5,214,578 discloses a method for calibrating an X-ray system having an X-ray source and an X-ray detector, wherein the X-ray detector is rotatable about the object under study along an axis, and wherein a circular phantom is positioned such that its center is off-center relative to the axis of rotation of the X-ray system. This calibration device is particularly well-suited for calibrating X-ray systems with rotatable detectors.

[0007] JP 7102190 B2 discloses a calibration device for an X-ray CT scanner. The calibration device comprises multiple concentric layers, and at multiple rotation angles, at least one of the composition and concentration of a substance contained in each of the multiple layers differs from the others. The calibration device is scanned at multiple different rotation angles. This calibration device is well-suited for calibrating X-ray systems based on scanning at different rotation angles.

[0008] US 4,400,827 discloses a calibration apparatus for calibrating rapid sequence radiography. The apparatus includes a disk on which a plurality of X-ray absorbing elements of varying thicknesses are arranged in a stepped manner along the periphery of the disk in a direction perpendicular to the disk surface. The disk rotates synchronously with the cinematography mechanism of a cinematography apparatus along a central axis perpendicular to its surface, thereby changing the thickness of the X-ray absorbing material of the disk for each frame of cinematography.

[0009] US 5,565,678 discloses a calibration target for a radiographic imaging system, the calibration target having multiple X-ray absorption disks stacked on top of each other. This creates regions with different absorption characteristics in the radial direction.

[0010] EP 4 201 334 A1 discloses a calibration phantom for calibrating a CT imaging system, the calibration phantom including a base and a plurality of calibration lines dispersedly connected to the base.

[0011] US 2020 / 0261050 A1 discloses a calibration phantom for an X-ray imaging system having a plurality of second and third objects arranged around the periphery of a first intermediate object. At least one of the second and third objects is made of a second and a third material respectively, such that the first, second, and third materials are different from each other. The calibration phantom moves within the X-ray path, determines the path lengths through the different materials of the phantom, and performs calibration by generating a mapping between the path lengths and the detector response of the X-ray detector.

[0012] The aforementioned calibration apparatus is not particularly suitable for calibrating X-ray systems in which the object to be inspected is transported along the transmission path between the X-ray source and the X-ray detector. US 2003 / 0072417 A1 and US 10,813,618 B2 each disclose a calibration apparatus comprising multiple X-ray absorbing elements of varying heights arranged in a stepped configuration. The different heights of the elements result in different path lengths for the X-ray radiation. This calibration apparatus is particularly suitable for X-ray systems with fan-beam and line detectors, in which the object to be inspected is transported along the transmission path between the X-ray source and the X-ray detector. Due to unavoidable inaccuracies in the positioning of the calibration apparatus, reliable calibration of the X-ray system requires the object to pass through the X-ray system multiple times. Summary of the Invention

[0013] Due to these problems in the prior art, the object of the present invention is to provide a calibration apparatus for efficiently and reliably calibrating X-ray systems, particularly for calibrating X-ray systems in which an object to be inspected is transported along a transmission path between an X-ray source and an X-ray detector. According to a first aspect of the invention, this problem is solved by an apparatus for calibrating an X-ray system of the aforementioned type, wherein the apparatus is configured to adjust the position of each element along a closed curve in a plane extending transversely to the lateral direction and parallel to the longitudinal direction, such that elements in each of a first subset and a second subset of the element group are positioned such that their longitudinal directions are aligned in an alignment direction transverse to the curve, and wherein the first total length of the elements in the first subset in the longitudinal direction is different from the second total length of the elements in the second subset in the longitudinal direction.

[0014] The term "closed curve" should be interpreted to also encompass a curve extending between two turning points, on which the position of the element can be adjusted between the two turning points. In this case, the area enclosed by the curve becomes zero.

[0015] In the construction of this invention, each of the two subsets corresponds to an aligned configuration of a plurality of absorption elements corresponding to the number of elements in the respective subset. Adjustment of the position of the alignment configuration allows each alignment direction to successively coincide with the radiation beam path extending between the X-ray source and the X-ray detector. Therefore, different configurations achieve different absorption lengths of radiation passing through these configurations along their alignment directions.

[0016] Therefore, the calibration apparatus according to the first aspect of the invention is configured to adjust the position of the X-ray absorbing element along a closed curve, such that the X-ray beams traveling through the aligned elements of the first and second subsets travel different distances in the alignment direction. Thus, compared to the prior art, calibration can be performed without moving the calibration apparatus along the transmission path between the X-ray source and the X-ray detector; the calibration apparatus can be stationary. In this way, efficient and reliable calibration can be performed. Furthermore, this calibration apparatus can be universally applied to the calibration of X-ray devices. The calibration apparatus can be constructed in a small and compact form.

[0017] The calibration apparatus includes a group of at least two X-ray absorbing elements. Preferably, the calibration apparatus includes more than two X-ray absorbing elements. In one example, the elements in the group may be made of the same material, but the invention is not limited thereto. In one example, the material may be a polymer material. In one example, the material may be PE or PMMA, but the invention is not limited thereto. In another example, the material may be a metal, such as aluminum or iron.

[0018] The longitudinal and lateral directions are defined relative to each element. In particular, the lateral extension dimensions of all elements can be parallel to each other.

[0019] In an advantageous example, the lateral extension dimension of the element can be greater than the longitudinal extension dimension. In one example, the lateral extension dimensions of all elements can be the same. In one example, the lateral extension dimension can be selected to be equal to or greater than the width of a typical X-ray detector used in the X-ray system to be calibrated, preferably at least 2%, 5%, or 10% larger than the width of a typical X-ray detector used in the X-ray system to be calibrated. In another example, the element can have a cuboid shape.

[0020] In another example, the plane may be perpendicular to the lateral extension dimension of the element. In yet another example, the longitudinal and lateral directions may be orthogonal.

[0021] The first subset may include one or more elements. Furthermore, the second subset may include one or more elements. The first and second subsets are different from each other. Specifically, the first and second subsets differ in at least one element. However, in one example, the first and second subsets may also differ in more than one element or in all elements.

[0022] In another advantageous example, the calibration device is configured to adjust the position of each element in the element group along the closed curve, such that the elements in each of a plurality of different element subsets are positioned such that their longitudinal directions are aligned in an alignment direction transverse to the curve, and wherein the total length of the elements in the longitudinal direction in each subset differs from the total length of the elements in the longitudinal direction in other subsets. The plurality of subsets may be three, four, or more than four element subsets. Therefore, multiple different travel distances of the X-ray beam through the aligned elements in the different subsets in the alignment direction can be created.

[0023] In advantageous examples, the alignment directions of two or more subsets of elements can be the same. This is particularly advantageous for X-ray systems having X-ray sources configured to emit X-ray beams in a fixed direction.

[0024] Each element has a first longitudinal end and a second longitudinal end in the longitudinal direction, and the first longitudinal end and the second longitudinal end can move along the curve during adjustment.

[0025] The first longitudinal end can be located closer to the center of the curve than the second longitudinal end. In one example, one of the ends is located on the curve.

[0026] In one example, the alignment direction can be a direction perpendicular to the curve.

[0027] In one example, the curve is a convex curve.

[0028] According to another embodiment of the first aspect of the invention, the curves may include a plurality of nested and non-intersecting curves, each element may be associated with one of the plurality of curves, and the device may be configured to adjust the position of each element along the associated curves independently of the position of elements associated with other curves. According to this embodiment, the device is configured to adjust the position of each element along the associated curves of a plurality of K ≥ 2 curves. The curves are all located in the same plane. Each curve has a different perimeter, and each curve, except for the curve with the largest perimeter, is entirely located within the curve with the larger perimeter. In one example, the device may be configured to adjust the position of an element along two curves. In another example, the device may be configured to adjust the position of an element along more than two curves, for example, along three, four, or five curves. According to this embodiment, the device is configured to adjust the position of all elements associated with one curve simultaneously and independently of the position of elements associated with other curves. In one example, the first subset and the second subset, and potentially additional subsets of elements, may include elements associated with different curves among the plurality of curves. However, the invention is not limited thereto, and the first subset, the second subset, and potentially other subsets of elements may contain only elements associated with the same curve.

[0029] In one embodiment, the calibration device may be configured to simultaneously, and in particular only simultaneously, adjust the position of elements associated with the same curve.

[0030] In another embodiment, the curve may be a concentric curve. The center of the concentric curve may be considered as a center of rotation. In another embodiment, the curve is circular. In one example, the longitudinal direction of the element may be perpendicular to the curve, and the alignment direction of the element may be a normal direction. The lateral direction of the element may be orthogonal to the longitudinal direction and may be perpendicular to the plane of the curve.

[0031] In another embodiment of the calibration apparatus according to the first aspect of the invention, at least two elements may have different longitudinal extension scales. When the apparatus is configured to adjust the position of each element along a single closed curve, the at least two elements on that single curve may have different longitudinal extension scales. In this case, the first subset and the second subset may each contain one of the at least two elements with different longitudinal extension scales. When the apparatus is configured to adjust the position of each element along more than one closed curve, the positions of the at least two elements with different longitudinal extension scales may be adjusted on the same or different curves.

[0032] In another example of the invention, the device may include at least three elements, wherein two of the elements have the same longitudinal extension scale, and wherein a first subset and a second subset each contain one of the two elements having the same longitudinal extension scale, and one of the two subsets contains another element having the same or different longitudinal extension scales.

[0033] In another embodiment of the calibration apparatus according to the invention, the elements may be discrete elements. For each pair of adjacent elements, the distance between adjacent elements along the same curve may be the same or different. In one example, at least some elements may be in contact at their first or second ends.

[0034] In an advantageous example of the above embodiments, the device can be configured to adjust the position of the elements such that a channel is formed extending straight through the curve without any elements positioned therein. In this way, the device can operate to adjust the position of the elements along the closed curve, allowing the X-ray beam to pass through the device without passing through any X-ray absorbing elements. In particular, in one example, the channel may extend in an alignment direction.

[0035] In another embodiment of the calibration apparatus according to the first aspect of the invention, the first subset and / or the second subset may include two elements associated with the same curve. For example, when the closed curve is circular and the longitudinal directions of the elements in the first subset and / or the second subset are respectively aligned perpendicular to the curve, the two elements associated with the same curve are positioned relative to the diameter of the curve. Therefore, two elements having a second length and a third length in the longitudinal direction can be arranged relative to the diameter of the curve instead of a single element having a first length in the longitudinal direction, wherein the sum of the second length and the third length is equal to the first length. This reduces the overall height of the calibration apparatus, which is advantageous because X-ray systems typically have limited space between the X-ray source and the X-ray detector.

[0036] According to another embodiment of the calibration device, the first and second side ends of the element can be respectively mounted on a first and a second support spaced apart in the lateral direction, and the device can be configured to allow the first and second supports to rotate independently about a common axis extending in the lateral direction, thereby adjusting the position of the element along a closed curve. In one example, the device may include a stepper motor configured to drive the first and second supports. This embodiment allows for a simple and constructive implementation of an element that adjusts along a curve. In this embodiment, the lateral lengths of all elements can be the same. In a preferred example, the first and second supports can be disc-shaped. However, the invention is not limited thereto.

[0037] In another embodiment of the calibration apparatus according to the first aspect of the invention, the first support and the second support may each comprise a plurality of first segments and second segments, and the apparatus may be configured to enable the first segments and second segments to rotate relative to each other, thereby allowing relative movement of elements associated with different curves. In one example, the segments may have an annular shape, but the invention is not limited thereto.

[0038] For calibration purposes, the calibration device needs to be positioned between an X-ray source and an X-ray detector. Therefore, in another embodiment of the invention, the device may include a positioning member for positioning the calibration device on the X-ray system in a manner that places it between the X-ray source and the X-ray detector. In one example, the positioning member may include a magnetic member. The magnetic member may be configured to interact with complementary magnetic members arranged in the X-ray system to achieve the positioning of the calibration device. In another example, the positioning member may include a support frame.

[0039] In another embodiment of the calibration apparatus according to the invention, the calibration apparatus may include a fixed X-ray absorber arranged within the curve. The fixed X-ray absorber cannot be moved by operation of the calibration apparatus. Thus, X-ray radiation passing through the calibration apparatus can be absorbed independently of the position of the element along the curve.

[0040] According to a second aspect of the invention, an X-ray apparatus is provided, comprising: an X-ray system having an X-ray source operable to emit an X-ray beam along a radiation path and an X-ray detector arranged to receive the X-ray beam and output a signal in response to the received radiation amount; and a calibration device according to any one of the preceding claims, wherein the calibration device is arranged between the X-ray source and the X-ray detector such that when the longitudinal directions of elements in a first subset and a second subset are aligned in an alignment direction, the longitudinal extension dimensions of the elements in the first subset and the second subset lie in a radiation plane along the radiation path of the X-ray beam. The X-ray apparatus according to the second aspect of the invention allows calibration using a fixed calibration device, wherein different travel distances of the X-ray beam through the elements are obtained by adjusting the position of the X-ray absorbing elements along the closed curve or multiple curves. The X-ray apparatus according to the second aspect of the invention allows for efficient and reliable calibration of the X-ray system.

[0041] In one embodiment, the X-ray device may be configured to emit a fan-shaped X-ray beam in a radiation plane, and the X-ray detector may include a line detector arranged in the radiation plane to receive the radiation beam.

[0042] According to a third aspect of the present invention, a method for calibrating an X-ray system of an X-ray apparatus according to a second embodiment is provided, the method comprising the following steps: The position of the components of the calibration device is adjusted to the first position, so that the longitudinal direction of the components of the first subset is aligned in the alignment direction; After the element is adjusted to the first position, the X-ray source is operated to receive a first signal indicating the amount of radiation that has traveled through the first subset of elements; The position of the components of the calibration device is adjusted to the second position, so that the longitudinal direction of the components of the second subset is aligned in the alignment direction; After the element is adjusted to the second position, the X-ray device is operated to receive a second signal indicating the amount of radiation that has traveled through the second subset of elements; The X-ray system is calibrated based on the first signal and the second signal.

[0043] Since the absorption characteristics of the elements in the first and second subsets are known, the X-ray system can be calibrated so that the output signal indicates the amount of radiation received. Preferably, the calibration apparatus may include multiple subsets of elements with different total lengths in the longitudinal direction, and the method may include adjusting the positions of the elements such that the aligned longitudinal direction of each subset of elements lies in the radiation plane.

[0044] In one embodiment, the method further includes the following steps: Adjust the position of the components of the calibration device to the zero position so that no component is aligned in the alignment direction; After adjusting the element to the zero position, the X-ray device is operated to receive a reference signal indicating the maximum amount of radiation that has been received without traveling through any subset of the elements. Attached Figure Description

[0045] The invention will be described in more detail below with reference to the accompanying drawings, wherein: Figure 1a This is a perspective cross-sectional view of an X-ray device according to a second aspect of the present invention, the X-ray device comprising an X-ray system and a calibration device according to a first aspect of the present invention; Figure 1b yes Figure 1a The image shows an enlarged view of parts of the X-ray system and calibration apparatus; Figure 2 This is a side view of the elements of the calibration apparatus according to the first aspect of the invention, wherein a portion of the elements has been removed for ease of illustration; Figures 3a-3c Through operation Figure 2Cross-sectional views of different configurations obtained from the calibration device in the image. Detailed Implementation

[0046] Figure 1a This is a perspective cross-sectional view of an embodiment of an X-ray apparatus 1000 according to a second aspect of the present invention. The X-ray apparatus 1000 includes an X-ray system 200 and a calibration device 100 according to an embodiment of a first aspect of the present invention. The X-ray system 200 includes an X-ray source 210. The X-ray source is operated to emit a fan-shaped beam 211 in a radiation plane. The X-ray system 200 also includes an X-ray detector, which is a line detector 220, and is vertically spaced from the X-ray source 210. The X-ray detector 220 may include, for example, a plurality of detector elements having a scintillation material, which convert incident X-ray radiation into electrical signals, which are processed in the X-ray apparatus 1000 and calibrated by comparison with a standard to provide a measurement output indicating the amount of incident X-ray radiation. However, the calibration may change during use, and the X-ray apparatus 1000 may need to be recalibrated. All of this can be achieved by using the calibration device 100, which is further detailed below.

[0047] The X-ray system 200 also includes a belt conveyor 230 configured to transport the object to be inspected along a transmission path transverse to, and particularly perpendicular to, the radiation plane.

[0048] Figure 1b yes Figure 1a The image shows an enlarged view of portions of the X-ray system 200 and the calibration device 100. Figure 1b As can be seen, the calibration device 100 includes a plurality of X-ray absorbing elements 1, 2. The calibration device 100 is configured to adjust the position of the elements 1, 2 as further described below, such that the selected elements 1, 2 are located in the radiation plane.

[0049] The calibration device 100 also includes a positioning member 40 configured to position the calibration device 100 between the X-ray source 210 and the X-ray detector 220.

[0050] Figure 2 It is based on Figure 1a and Figure 1b A perspective view of components 1 and 2 of the calibration apparatus 100 shown in the embodiment. For ease of illustration, a portion of components 1 and 2 has been partially removed. Figure 2 As can be seen, the calibration device 100 includes multiple (internal) elements 1 associated with the first (internal) curve (see...). Figures 3a-3c), and multiple (external) elements 2 associated with the second (external) curve (see Figures 3a-3c The calibration device 100 is configured to allow adjustment of the position of the inner element 1 along an inner curve and to allow adjustment of the position of the outer element 2 along an outer curve independently of the inner element 1. In this embodiment, the curve is a concentric circular curve about a common axis A.

[0051] In this embodiment, elements 1 and 2 are cuboids. Each element 1 and 2 has an extension dimension in the longitudinal direction LO and an extension dimension in the lateral direction LA. The lateral direction LA is parallel to the common axis A. The longitudinal direction LO is perpendicular to the curve. .

[0052] The calibration device 100 is configured to be able to align along the associated curve. The position of each element is adjusted such that the longitudinal directions of elements 1 and 2 in each of the first subset 10 and the second subset 20 of the element group are aligned in an alignment direction perpendicular to the curve, wherein the first total length of elements 1 and 2 in the longitudinal direction in the first subset 10 is different from the second total length of elements 1 and 2 in the longitudinal direction in the second subset 20. Specifically, the position of elements 1 and 2 is adjustable such that when the longitudinal directions of elements 1 and 2 in the first subset 10 and the second subset 20 are aligned in the alignment direction, the longitudinal extension dimensions of the elements in the first and second subsets are correspondingly located in the radiation plane along the radiation path R of the X-ray beam. (Reference) Figures 3a-3c Let's explain this feature further.

[0053] Figures 3a-3c Three different configurations of the calibration device 100 according to an embodiment of the present invention are shown. From Figures 3a to 3c It can be seen that each element 1, 2 has a distal end and a proximal end in the longitudinal direction LO. The proximal end is the end closer to the common axis A, and the distal end is the end farther from the common axis A. The calibration device 100 has a first (internal) curve. (Dotted line) Associated with six (internal) elements 1. With the first curve The distal end of the associated element 1 is along the first curve During the adjustment of its position along the first curve Movement. Seven (external) elements 2 and the second (external) curve. (Dotted line) Related to the second curve. The proximal end of the associated element 2 is along the second curve Adjusting its position along the second curve Move. Each closed curve It has at least two elements 1 and 2 with different longitudinal extension scales associated with it.

[0054] Figure 3a The first configuration of the calibration device 100 is shown, which is Figure 2 The configuration. From Figure 3a It can be seen that the longitudinal direction LO of the three elements 1a, 2a, and 2b is perpendicular to the closed curve. The alignment direction AD is aligned. The radiation path R of the X-ray beam extends through elements 1 and 2 of the first subset 10 and the second subset 20 along the longitudinal direction LO, which are already aligned. These three elements are elements of the first subset 10, which is composed of internal curves. Associated element 1a and external curve It consists of related components 2a and 2b. The longitudinal extension dimension of component 1a is... The longitudinal extension dimension of element 2a is And the longitudinal extension dimension of element 2b is Therefore, the total length of components 1a, 2a, and 2b in the longitudinal direction LO is... + + When the calibration device 100 is in the first configuration, the X-ray radiation emitted from the X-ray source 210 travels along a radiation path R parallel to the alignment direction AD through the three elements 1a, 2a, 2b, and thus travels in the longitudinal direction through the first total length of the X-ray absorbing elements 1a, 2a, 2b.

[0055] Figure 3b A second configuration of the calibration apparatus 100 according to an embodiment of the present invention is shown. The longitudinal directions LO of the four elements 1b, 1c, 2c, 2d of the second subset 200 are aligned in the alignment direction AD. The longitudinal extension dimension LO of element 1b is... The longitudinal extension dimension LO of component 1c is The longitudinal extension dimension of component 2c is And the longitudinal extension dimension of element 2d is Components 1b and 1c and their internal curves Related components 2c and 2d and the external curve Related. The second total length of elements 1b, 1c, 2c, and 2d in the longitudinal direction is... + + + .from Figure 3a and Figure 3bIt is evident that the first total length in the longitudinal direction is different from the second total length in the longitudinal direction. When X-ray radiation emitted from X-ray source 210 is emitted, it travels along a radiation path R parallel to the alignment direction AD through four elements 1b, 1c, 2c, 2d, and thus travels through the second total length of the X-ray absorbing element in the longitudinal direction.

[0056] Figure 3c A third configuration of the calibration apparatus 100 according to an embodiment of the present invention is shown. From Figure 3c As can be seen, no component intersects with the radiation path R of the X-ray radiation. Therefore, the X-ray radiation is not absorbed when passing through the calibration device 100.

[0057] List of reference numerals

Claims

1. An apparatus (100) for calibrating an X-ray system (200) having an X-ray source (210) and an X-ray detector (220), the calibration apparatus (100) comprising a set of at least two X-ray absorbing elements (1, 2), each element (1, 2) extending in a longitudinal direction (LO) and a lateral direction (LA), characterized in that, The device (100) is configured to be able to extend along a closed curve in a plane that extends laterally in the lateral direction (LA) and parallel to the longitudinal direction (LO). Adjust the position of each element (1, 2) such that in each of the first subset (10) and the second subset (20) of the element (1, 2) group, the element (1, 2) is positioned such that its longitudinal direction (LO) is transverse to the curve ( Aligned in the alignment direction of the elements (1, 2) in the first subset (10) with a first total length in the longitudinal direction (LO) different from the second total length in the longitudinal direction (LO) of the elements (1, 2) in the second subset (20).

2. The apparatus (100) according to claim 1, wherein, The curve ( This includes multiple nested, non-intersecting curves located in a plane extending laterally (LA) and parallel to longitudinally (LO). ), each element (1, 2) and one of the multiple curves ( Associated with other curves, and the device (100) is configured to be independent of other curves. The positions of the associated elements (1, 2) are along the associated curve ( Adjust the position of each component (1, 2).

3. The apparatus (100) according to claim 2, wherein, The curve ( () are concentric curves.

4. The apparatus (100) according to any one of the preceding claims, wherein, The curve ( Each of the numbers in the array is circular.

5. The apparatus (100) according to any one of the preceding claims, wherein, At least two elements have different longitudinal extension dimensions. ).

6. The apparatus (100) according to any one of the preceding claims, wherein, The components (1, 2) are discrete components (1, 2).

7. The apparatus (100) according to claim 6, wherein, The device (100) is configured to adjust the position of the element to form a channel that extends straight through the curve and in which no element is positioned.

8. The apparatus (100) according to any one of the preceding claims, wherein, At least one of the first subset (10) and the second subset (20) includes the same curve ( The two related elements (1, 2).

9. The apparatus (100) according to any one of the preceding claims, wherein, The first side end (3) and the second side end (4) of the elements (1, 2) are mounted on the first support (30a) and the second support (30b) spaced apart in the lateral direction, and the device is configured to allow the first support (30a) and the second support (30b) to rotate independently about a common axis (A) extending in the lateral direction (LA), thereby along a closed curve ( Adjust the position of the components (1, 2).

10. The apparatus (100) according to claims 2 and 9, wherein, The first support (30a) and the second support (30b) each include a plurality of first segments (31a, 31b) and second segments (32a, 32b), and the device (100) is configured to enable the first segments (31a, 31b) and the second segments (32a, 32b) to rotate relative to each other, thereby allowing them to interact with different curves ( The associated components (1, 2) are able to move relative to each other.

11. The apparatus (100) according to any one of the preceding claims, wherein, The device (100) also includes a positioning member (40) for positioning the calibration device (100) in the X-ray system (200) in such a manner that it is located between the X-ray source (210) and the X-ray detector (220).

12. The apparatus (100) according to any one of the preceding claims, wherein, The device (100) also includes a section arranged on the curve ( Fixed X-ray absorber inside.

13. An X-ray apparatus (1000), comprising: X-ray system (200) having an X-ray source (210) operable to emit an X-ray beam (211) in a radiation plane and an X-ray detector (220) arranged to receive the X-ray beam (211) and output a signal in response to the received radiation amount; and a calibration device (100) according to any one of the preceding claims, wherein the calibration device (100) is arranged between the X-ray source (210) and the X-ray detector (220) such that when the longitudinal directions of the elements (1, 2) in the first subset (10) and the second subset (20) are aligned in the alignment direction, the longitudinal extension dimensions of the elements (1, 2) in the first subset (10) and the second subset (20) are located in the radiation plane along the radiation path (R) of the X-ray beam.

14. The X-ray apparatus (1000) according to claim 13, wherein, The X-ray source (210) is configured to emit a fan-shaped X-ray beam (211) in the radiation plane, and the X-ray detector (220) includes a line detector arranged in the radiation plane to receive the radiation beam (211).

15. A method for calibrating an X-ray system of an X-ray apparatus (1000) according to claim 13 or 14, wherein, The method includes the following steps: The positions of the elements (1, 2) of the calibration device (100) are adjusted to the first position, such that the aligned longitudinal direction (LO) of the elements (1, 2) of the first subset (10) is located in the radiation plane; After adjusting the elements (1, 2) to the first position, the X-ray source (210) is operated to receive a first signal in response to the first radiation quantity of the elements (1, 2) that have passed through the first subset (10); The positions of the elements (1, 2) of the calibration device (100) are adjusted to the second position, such that the aligned longitudinal direction (LO) of the elements (1, 2) of the second subset (20) is located in the radiation plane; After adjusting the elements (1, 2) to the second position, the X-ray source (210) is operated to receive a second signal in response to the second radiation quantity of the elements (1, 2) that have passed through the second subset (20); The X-ray system (200) is calibrated based on the first signal and the second signal.

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