Test sorting machine

Abstract

The invention relates to the field of semiconductor test equipment, and discloses a test sorting machine which has a first direction and a second direction which are perpendicular to each other and horizontally extend, the test sorting machine comprises a machine table, a test table, a braid carrying mechanism, a material pipe carrying mechanism, a material disc carrying mechanism and a material moving mechanism, and the test table, the braid carrying mechanism, the material pipe carrying mechanism, the material disc carrying mechanism and the material moving mechanism are connected to the machine table. The braid carrying mechanism and the material pipe carrying mechanism are arranged on the two sides of the testing table in the first direction respectively, the material disc carrying mechanism is arranged on one side of the testing table in the second direction, at least one of the braid carrying mechanism, the material pipe carrying mechanism and the material disc carrying mechanism is used for supplying a to-be-tested chip, and the material moving mechanism is used for moving the to-be-tested chip to the testing clamp. Namely, the testing and sorting machine is provided with various feeding mechanisms, the testing and sorting machine can test the chips in three packaging forms of winding tape packaging, material pipe packaging and tray packaging, and the compatibility is good.

Description

Technical Field

[0001] This invention belongs to the field of semiconductor testing equipment, and more specifically, relates to a test sorting machine. Background Technology

[0002] Different types of chips have different packaging formats. Currently, testing and sorting machines are usually used for large-scale testing of one type of chip. To adapt to the corresponding packaging format of the chip, such testing and sorting machines are only equipped with one feeding mechanism. This feeding mechanism can only feed chips of that specific type and cannot adapt to chips with other different packaging formats. Therefore, testing and sorting machines cannot test chips with other packaging formats, resulting in poor compatibility. Summary of the Invention

[0003] The main objective of this invention is to provide a test and sorting machine with good compatibility.

[0004] According to a first aspect of the present invention, a test sorting machine is provided, having a first direction and a second direction extending perpendicularly and horizontally. The test sorting machine includes a machine base and a test table, a tape loading mechanism, a tube loading mechanism, a tray loading mechanism, and a transfer mechanism connected to the machine base. A test fixture is connected to the test table. The tape loading mechanism and the tube loading mechanism are respectively disposed on both sides of the test table in the first direction. The tray loading mechanism is disposed on one side of the test table in the second direction. At least one of the tape loading mechanism, the tube loading mechanism, and the tray loading mechanism is used to supply a chip to be tested. The transfer mechanism is used to transfer the chip to be tested onto the test fixture.

[0005] In a specific embodiment of the present invention, the test fixture includes a test base and a cover plate;

[0006] The test bench includes a support platform, a first drive mechanism, a lifting rod, a force control sensor, and a connecting seat. The support platform is fixedly connected to the machine base, and its top surface is a bearing surface. The test seat is detachably connected to the bearing surface. The support platform has a mounting cavity, and the first drive mechanism is fixedly connected to the mounting cavity. One end of the lifting rod along its length is fixedly connected to the first drive mechanism. The lifting rod extends vertically and passes through the support platform. The other end of the lifting rod is located above the bearing surface and is fixedly connected to the force control sensor. The force control sensor is fixedly connected to the connecting seat, and a cover plate is detachably connected to the connecting seat. The first drive mechanism drives the lifting rod to move up and down, causing the connecting seat to move the cover plate. The cover plate is used to cover the test seat. The transfer mechanism is used to transfer the chip to be tested onto the test seat.

[0007] In a specific embodiment of the present invention, the first driving mechanism includes a first mounting plate, a contact member, an elastic member, a motor, and a cam. The first mounting plate is fixedly connected to the mounting cavity. The contact member is fixedly connected to the lifting rod. The elastic member is capable of elastic deformation in the vertical direction. One end of the elastic member is fixedly connected to the first mounting plate in the vertical direction, and the other end is fixedly connected to the lifting rod. The motor is fixedly connected to the first mounting plate. The power output end of the motor is fixedly connected to the cam. The cam contacts the contact member. The elastic member is used to keep the contact member in contact with the cam.

[0008] In a specific embodiment of the present invention, the material loading mechanism includes a mounting rod, a discharge track, and a hopper assembly. The mounting rod and the discharge track are fixedly connected to the machine platform along the first direction, and the discharge track is located on the side of the mounting rod closer to the test platform. The length direction of the mounting rod is parallel to the first direction. The mounting rod has a mounting portion extending outside the machine platform, and the hopper assembly is fixedly connected to the mounting portion.

[0009] In a specific embodiment of the present invention, the hopper assembly includes a material pipe storage bin, a pusher sub-assembly, a first drive member, a receiving block, and a positioning block. The material pipe storage bin and the pusher sub-assembly are fixedly connected to the mounting portion, and the pusher sub-assembly is located on the side of the material pipe storage bin away from the discharge track along the first direction. The lower end of the material pipe storage bin is provided with a discharge port. The first drive member is fixedly connected to the mounting portion. The receiving block is fixedly connected to the power output end of the first drive member and is located below the discharge port. The positioning block is fixedly connected to the mounting portion, and the receiving block and the positioning block are arranged along the second direction. The top surface of the receiving block is provided with a first... A first slot is provided corresponding to the discharge port. A second slot is provided on the bottom surface of the positioning block. Both the first slot and the second slot are through slots extending along the first direction. In the second direction, the end of the first slot near the positioning block is open, and the end of the second slot near the receiving block is open. The first driving member is used to drive the receiving block to move towards the positioning block along the second direction, so that the first slot and the second slot form a limiting through hole. The limiting through hole is used to limit the position of the material tube so that the material tube is directly facing the discharge track along the first direction. The pushing sub-assembly is used to push the chip to be tested in the material tube in the limiting through hole to the discharge track.

[0010] In a specific embodiment of the present invention, the hopper assembly further includes a recycling tank, a second driving member, and a support block. The recycling tank is fixedly connected to the lower end of the mounting portion, the second driving member is connected to the mounting portion, and the support block is connected to the power output end of the second driving member. The support block is located below the outlet of the material tube storage hopper. The second driving member is used to drive the support block to move vertically. The support block is used to support the material tube, and the support block can prevent the empty material tube on the first slot from resetting with the support block.

[0011] The mounting part has a material discharge clearance through hole, which is located below the positioning block; the material discharge clearance through hole is used for the feeding pipe to fall into the recycling tank.

[0012] In a specific embodiment of the present invention, the material loading mechanism includes a second mounting plate, a conveying device, and a pallet hopper. The second mounting plate is fixedly connected to the machine platform and is located on one side of the test platform in the second direction. The conveying device and the pallet hopper are fixedly connected to the second mounting plate. The conveying direction of the conveying device is parallel to the first direction. The pallet hopper is provided at both ends of the conveying device in its conveying direction. One of the pallet hoppers at both ends of the conveying device is a first hopper and the other is a second hopper. The conveying device has a picking station located between the first hopper and the second hopper. The conveying device is used to transfer the pallet from the first hopper to the picking station and then to the second hopper.

[0013] In a specific embodiment of the present invention, the pallet hopper includes limiting posts, a first support component, and a second support component. The limiting posts are provided with multiple posts fixedly connected to a second mounting plate and extend vertically. The first support component is connected to the limiting posts. The multiple limiting posts and the first support component form a placement space for stacking and storing pallets. The conveying device extends below the placement space. The second support component is fixedly connected to the second mounting plate. The first support component supports the pallets within the placement space. The first support component can be activated to allow pallets to move upwards into the placement space or to allow pallets within the placement space to move downwards. The second support component can lift pallets on the conveying device to allow pallets to move upwards into the placement space or to support pallets moving downwards from the placement space and lower them onto the conveying device.

[0014] In a particular embodiment of the present invention, the tray has supporting lugs at opposite ends;

[0015] There are two first support components, and the two first support components respectively cooperate with the support ears at both ends of the tray. The first support component includes a mounting base, a third drive component and a first support plate. The mounting base is fixedly connected to two adjacent limit posts. The third drive component is fixedly connected to the mounting base. The power output end of the third drive component is fixedly connected to the first support plate. The third drive component is used to drive the first support plate to move horizontally so that the first support plate supports the corresponding support ear.

[0016] The second support assembly includes a fourth drive member and a second support plate. The fourth drive member is fixedly connected to the second mounting plate, and the power output end of the fourth drive member is fixedly connected to the second support plate. The fourth drive member is used to drive the second support plate to rise and fall so that the second support plate supports the bottom surface of the tray.

[0017] In a specific embodiment of the present invention, the transfer mechanism includes a first mounting frame, a second driving mechanism, a third driving mechanism, a second mounting frame, a fourth driving mechanism, and a nozzle assembly. The first mounting frame is slidably connected to the machine base. The second driving mechanism is fixedly connected to the machine base, and its power output end is fixedly connected to the first mounting frame. The second driving mechanism is used to drive the first mounting frame to move along the first direction. The third driving mechanism is fixedly connected to the first mounting frame, and its power output end is fixedly connected to the second mounting frame. The third driving mechanism is used to drive the second mounting frame to slide along the second direction. The fourth driving mechanism is fixedly connected to the second mounting frame, and its power output end is fixedly connected to the nozzle assembly. The fourth driving mechanism is used to drive the nozzle assembly to move vertically. The nozzle assembly is used to pick up and place chips.

[0018] The first mounting frame has a clearance space extending along the first direction, the second mounting plate and the conveying device pass through the clearance space, and the first mounting frame is located between the pallet bins at both ends of the conveying device.

[0019] One of the above-described technical solutions of the present invention has at least one of the following advantages or beneficial effects:

[0020] The test sorting machine of the present invention is provided with a tape and reel feeding mechanism, a tube feeding mechanism, and a tray feeding mechanism. The tape and reel feeding mechanism can supply the chip to be tested by outputting a tape loaded with chips. The tube feeding mechanism can supply the chip to be tested by outputting a tube loaded with chips. The tray feeding mechanism can supply the chip to be tested by outputting a tray loaded with chips. That is, the test sorting machine is equipped with multiple feeding mechanisms and can test chips in three packaging forms: tape and reel packaging, tube packaging, and tray packaging, with good compatibility.

[0021] In addition, the tape and tube feeding mechanism and the tube feeding mechanism are respectively located on both sides of the test platform in the first direction, and the tray feeding mechanism is located on one side of the test platform in the second direction. The three feeding mechanisms are arranged around the test platform in a reasonable layout, which facilitates the transfer mechanism to transfer the chip under test to the test fixture. Moreover, the tape and tube feeding mechanism, the tube feeding mechanism and the tray feeding mechanism are located in different positions and are not tightly integrated in the same position, which facilitates maintenance. Attached Figure Description

[0022] The present invention will be further described below with reference to the accompanying drawings and embodiments;

[0023] Figure 1 This is a structural diagram of the test sorting machine according to an embodiment of the present invention;

[0024] Figure 2 This is a structural diagram of the machine tool and the material transfer mechanism in an embodiment of the present invention;

[0025] Figure 3 This is a structural diagram of the test bench according to an embodiment of the present invention;

[0026] Figure 4 This is an exploded view of the test bench according to an embodiment of the present invention;

[0027] Figure 5 This is a structural diagram of the lifting rod, contact element, and cam assembly according to an embodiment of the present invention;

[0028] Figure 6 This is a structural diagram of the material loading mechanism of the material tube according to an embodiment of the present invention;

[0029] Figure 7 This is a structural diagram of the material loading mechanism of the material tube according to another embodiment of the present invention;

[0030] Figure 8 This is a structural diagram of the material loading mechanism of the material tube according to another embodiment of the present invention;

[0031] Figure 9 This is a structural diagram of the cooperation between the receiving block and the positioning block in an embodiment of the present invention;

[0032] Figure 10 This is a structural diagram of the material tray loading mechanism according to an embodiment of the present invention;

[0033] Figure 11 This is a structural diagram of the material tray loading mechanism and the pallet in an embodiment of the present invention;

[0034] Figure 12 This is an embodiment of the present invention. Figure 11 Enlarged diagram of A in the middle;

[0035] Figure 13 This is a structural diagram of the material tray loading mechanism from another angle according to an embodiment of the present invention;

[0036] Figure 14 This is an embodiment of the present invention. Figure 13 Enlarged diagram of B in the diagram.

[0037] The figure labels for each figure are as follows:

[0038] 1. Machine tool;

[0039] 2. Test bench; 21. Support platform; 21A. Mounting cavity; 22. First drive mechanism; 221. First mounting plate; 222. Contact element; 223. Elastic element; 224. Motor; 225. Cam; 23. Lifting rod; 23A. Receiving groove; 24. Force control sensor; 25. Connecting seat; 25A. First clearance hole;

[0040] 3. Tape and reel feeding mechanism;

[0041] 4. Material loading mechanism; 41. Mounting rod; 411. Mounting part; 411A. Material discharge clearance through hole; 42. Discharge track; 43. Material bin assembly; 431. Material storage bin; 4311. First column; 4311A. First material trough; 4312. Second column; 4312A. Second material trough; 432. Pusher assembly; 433. First drive component; 434. Receiving block; 434A. First slot; 435. Positioning block; 435A. Second slot; 436. Recycling trough; 4361. First trough body; 4362. Second trough body; 437. Second drive component; 438. Support block; 439. Support base;

[0042] 5. Material tray loading mechanism; 51. Second mounting plate; 52. Conveying device; 521. Pallet; 521A. Lifting and clearance through hole; 522. Second linear guide rail; 523. Fifth driving component; 524. Positioning assembly; 5241. First positioning post; 5242. Second positioning post; 53. Pallet hopper; 531. Limiting stop post; 532. First support assembly; 5321. Mounting base; 5322. Third driving component; 5323. First support plate; 5323A. Connecting plate part; 5323B. Support plate part; 5324. First linear guide rail; 533. Second support assembly; 5331. Fourth driving component; 5332. Second support plate;

[0043] 6. Material transfer mechanism; 61. First mounting bracket; 61A. Clearance space; 62. Second drive mechanism; 63. Third drive mechanism; 64. Second mounting bracket; 65. Fourth drive mechanism; 66. Nozzle assembly;

[0044] 7. Test fixture; 71. Test base; 72. Cover plate; 72A. Second clearance hole;

[0045] 8. First visual component;

[0046] 9. Second visual component;

[0047] 10. Material box;

[0048] 11. Suction nozzle storage;

[0049] 100. Pallet; 100A. Support lug;

[0050] 200. Limiting through hole;

[0051] X, the first direction; Y, the second direction. Detailed Implementation

[0052] Embodiments of the present invention are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and should not be construed as limiting the present invention.

[0053] Reference Figures 1 to 14 As shown, a preferred embodiment of the present application discloses a test sorting machine having a first direction X and a second direction Y that are perpendicular and horizontally extended. The test sorting machine includes a machine base 1 and a test table 2, a tape loading mechanism 3, a tube loading mechanism 4, a tray loading mechanism 5, and a transfer mechanism 6 connected to the machine base 1. A test fixture 7 is connected to the test table 2. The tape loading mechanism 3 and the tube loading mechanism 4 are respectively located on both sides of the test table 2 in the first direction X. The tray loading mechanism 5 is located on one side of the test table 2 in the second direction Y. At least one of the tape loading mechanism 3, the tube loading mechanism 4, and the tray loading mechanism 5 is used to supply the chip to be tested. The transfer mechanism 6 is used to transfer the chip to be tested onto the test fixture 7.

[0054] The testing and sorting machine of this application includes a tape and reel feeding mechanism 3, a tube feeding mechanism 4, and a tray feeding mechanism 5. The tape and reel feeding mechanism 3 can supply chips to be tested by outputting a tape loaded with chips; the tube feeding mechanism 4 can supply chips to be tested by outputting a tube loaded with chips; and the tray feeding mechanism 5 can supply chips to be tested by outputting a tray 100 loaded with chips. In other words, the testing and sorting machine is equipped with multiple feeding mechanisms, enabling it to package tape, tube, and tray 100 chips. The chips in three different packaging forms were tested and showed good compatibility. In addition, the tape and reel feeding mechanism 3 and the tube feeding mechanism 4 are respectively located on both sides of the test platform 2 in the first direction X, and the tray feeding mechanism 5 is located on one side of the test platform 2 in the second direction Y. The three feeding mechanisms are arranged around the test platform 2 in a reasonable layout, which facilitates the transfer mechanism 6 to transfer the chip under test to the test fixture 7. Moreover, the tape and reel feeding mechanism 3, the tube feeding mechanism 4 and the tray feeding mechanism 5 are located in different positions and are not tightly integrated in the same position, which facilitates maintenance.

[0055] In this application, the transfer mechanism 6 is also used to transfer and unload the tested chips from the test fixture 7. In practical applications, when the tube loading mechanism 4 acts as a feeding mechanism, the tape loading mechanism 3 and / or the tray loading mechanism 5 can act as chip unloading carriers. In this case, the tape loading mechanism 3 loads empty tape, and the tray loading mechanism 5 loads empty trays 100. That is, after the chips on the test fixture 7 are tested, the transfer mechanism 6 transfers the chips to the empty tape of the tape loading mechanism 3 or to the empty tray 100 of the tray loading mechanism 5. When one of the tape loading mechanism 3 and the tray loading mechanism 5 acts as a feeding mechanism, the other acts as a chip unloading carrier. In addition, the tape loading mechanism 3 can simultaneously act as a chip unloading carrier. The feeding and unloading mechanism 6 serves as the feeding and unloading mechanism. After the chips on the test fixture 7 have been tested, the transferring mechanism 6 transfers the qualified chips to the reel, resetting the chips. Unqualified chips are transferred to a preset recycling station. Similarly, the tray loading mechanism 5 can also function as the feeding and unloading mechanism. After the chips on the test fixture 7 have been tested, the transferring mechanism 6 transfers the qualified chips to the original tray 100, resetting the chips. Unqualified chips are transferred to a preset recycling station. Based on this, the test sorting machine of this application has multiple operating modes and high compatibility. It should be noted that the specific operating mode of the test sorting machine is determined according to the actual application, and this application does not impose any restrictions on it.

[0056] In this embodiment, the test fixture 7 includes a test seat 71 and a cover plate 72; the test platform 2 includes a support platform 21, a first drive mechanism 22, a lifting rod 23, a force control sensor 24, and a connecting seat 25. The support platform 21 is fixedly connected to the machine base 1, and the top surface of the support platform 21 is the bearing surface. The test seat 71 is detachably connected to the bearing surface. The support platform 21 has a mounting cavity 21A. The first drive mechanism 22 is fixedly connected to the mounting cavity 21A. One end of the lifting rod 23 along its length is fixedly connected to the first drive mechanism 22. The lifting rod 23 extends vertically and passes through the support platform 21. The other end of the lifting rod 23 is located above the bearing surface and is fixedly connected to the force control sensor 24. The force control sensor 24 is fixedly connected to the connecting seat 25. The cover plate 72 is detachably connected to the connecting seat 25. The test seat 71 and the cover plate 72 are connected along the length of the support platform 21. The chip is vertically spaced. The first drive mechanism 22 drives the lifting rod 23 to rise and fall, causing the connecting seat 25 to move the cover plate 72. The cover plate 72 is used to cover the test seat 71. The transfer mechanism 6 is used to transfer the chip to be tested to the test seat 71. In actual application, after the transfer mechanism 6 transfers the chip to be tested to the test seat 71, the first drive mechanism 22 drives the lifting rod 23 to fall. The lifting rod 23 carries the power control sensor 24, the connecting seat 25 and the cover plate 72 to fall, so that the cover plate 72 covers the test seat 71. Then the test seat 71 tests the chip. After the test is completed, the first drive mechanism 22 drives the lifting rod 23 to rise and reset, so that the cover plate 72 leaves the test seat 71 and rises and resets. Then the transfer mechanism 6 transfers the tested chip to the preset chip unloading carrier mechanism.

[0057] Specifically, the top surface of the machine base 1 has mounting holes, and the support platform 21 is at least partially inserted into the mounting holes. Therefore, the machine base 1 and test platform 2 occupy relatively little vertical space, resulting in a compact structure for the test sorting machine. Furthermore, since the first drive mechanism 22 is located within the mounting cavity 21A of the support platform 21, and the test seat 71 is located on the top surface of the support platform 21, the first drive mechanism 22 and the test seat 71 form a vertically arranged layout. The test platform 2 occupies a small area on the top surface of the machine base 1, resulting in high space utilization of the test sorting machine. The cover plate 72 is detachably connected to the connecting seat 25, and the test seat 71 is detachably connected to the support platform 21. Specifically, the cover plate 72 is connected to the mounting seat 5321 by screws, and the test seat 71 is connected to the support platform 21 by screws. Therefore, different specifications of chips can be tested by replacing different cover plates 72 and test seats 71, making the test sorting machine widely applicable. In this application, the test sorting machine also includes a control system. The force control sensor 24 and the motor 224 described below are both electrically connected to the control system. The force control sensor 24 is used to collect the contact pressure between the cover plate 72 and the test seat 71 in real time and generate a pressure signal that is transmitted to the control system. The control system adjusts the output of the motor 224 according to the pressure signal to control the closing pressure of the cover plate 72 on the test seat 71 to be within a preset range, so as to avoid excessive contact pressure and high structural reliability.

[0058] Furthermore, the lifting rod 23 has a receiving groove 23A, and the force control sensor 24 is located in the receiving groove 23A, which has a compact structure; while the connecting seat 25 has a first clearance hole 25A that runs vertically through it, and the cover plate 72 has a second clearance hole 72A that runs vertically through it. The first clearance hole 25A and the second clearance hole 72A are arranged vertically opposite each other. The function of the first clearance hole 25A and the second clearance hole 72A is to avoid the chip loading and unloading process on the test seat 71. The transfer mechanism 6 places the chip on the test seat 71 or picks up the chip on the test seat 71 through the first clearance hole 25A and the second clearance hole 72A, which facilitates chip loading and unloading.

[0059] In this embodiment, the first drive mechanism 22 includes a first mounting plate 221, a contact 222, an elastic element 223, a motor 224, and a cam 225. The first mounting plate 221 is fixedly connected to the mounting cavity 21A. The contact 222 is fixedly connected to the lifting rod 23. The elastic element 223 can elastically deform vertically. One end of the elastic element 223 is fixedly connected to the first mounting plate 221 in the vertical direction, and the other end is fixedly connected to the lifting rod 23. The motor 224 is fixedly connected to the first mounting plate 221. The first mounting plate 221 has a mounting through hole, the axis of which extends horizontally. The power output end of the motor 224 passes through the mounting through hole and is fixedly connected to the cam 225. The cam 225 and the contact 222 are arranged vertically, and the cam 225 contacts the contact 222. The elastic element 223 is used to keep the contact 222 in contact with the cam 225. Specifically, the elastic element 223 is a spring, which has a simple structure and is easy to install. Extending vertically, the first mounting plate 221 has connecting ears, and a spring is connected to the first mounting plate 221 through the connecting ears. In practical applications, after the chip is placed on the test base 71, the motor 224 drives the cam 225 to rotate, thereby driving the contact 222 to move vertically away from the test base 71. The contact 222 drives the lifting rod 23 to move away from the test base 71, so that the cover plate 72 closes on the test base 71. After the chip test is completed, the motor 224 drives the cam 225 to rotate and reset, and the lifting rod 23 resets under the action of the spring, so that the cover plate 72 resets and leaves the test base 71 for chip unloading. The first drive mechanism 22 with this structure is simple and reliable. For example, the contact 222 is a roller. It should be noted that the side of the support platform 21 is also provided with heat dissipation holes, which are connected to the mounting cavity 21A, so that the heat generated by the operation of the motor 224 can be dissipated to the external environment through the heat dissipation holes, avoiding heat accumulation in the support platform 21.

[0060] Furthermore, the first drive mechanism 22, the lifting rod 23, the force control sensor 24, the connecting seat 25, and the test fixture 7 constitute a test module. There are multiple test modules, which are arranged in a rectangular array on the support platform 21. Thus, the test platform 2 has multiple test stations while occupying a small area on the top surface of the machine 1, resulting in high space utilization of the test sorting machine. For example, there are eight test modules. Of course, in other embodiments, the number of test modules can be four, six, twelve, or more, and this application does not limit this.

[0061] In this embodiment, the material loading mechanism 4 includes a mounting rod 41, a discharge track 42, and a hopper assembly 43. The mounting rod 41 and the discharge track 42 are fixedly connected to the machine base 1 along the first direction X, and the discharge track 42 is located on the side of the mounting rod 41 closer to the test platform 2. The length direction of the mounting rod 41 is parallel to the first direction X. The mounting rod 41 has a mounting portion 411 extending outside the machine base 1. The hopper assembly 43 is fixedly connected to the mounting portion 411. The advantage of this structure is that the mounting portion 411 forms a cantilever structure, the machine base 1 is smaller, and it is beneficial for the lightweight design of the test sorting machine. In practical applications, the hopper assembly 43 accommodates the material tube and outputs the chip to be tested from the material tube to the discharge track 42. The transfer mechanism 6 picks up the chip to be tested on the discharge track 42.

[0062] Furthermore, the material loading mechanism 4 is detachably connected to the machine base 1. That is, the mounting rod 41 and the discharge track 42 are detachably connected to the machine base 1. For example, the mounting rod 41 and the discharge track 42 are detachably connected to the machine base 1 by means of screws. The test sorting machine also includes a flexible vibrating plate, which is detachably connected to the machine base 1. The position where the machine base 1 is connected to the material loading mechanism 4 is called the first position. In some other embodiments, the first position is not connected to the material loading mechanism 4, but the flexible vibrating plate is detachably connected to the first position of the machine base 1. Thus, the test sorting machine can feed the chip under test through the flexible vibrating plate, and the test sorting machine has good compatibility.

[0063] In this embodiment, the hopper assembly 43 includes a material tube storage bin 431, a pusher assembly 432, a first drive member 433, a receiving block 434, and a positioning block 435. The material tube storage bin 431 and the pusher assembly 432 are fixedly connected to the mounting part 411, and the pusher assembly 432 is located on the side of the material tube storage bin 431 away from the discharge track 42 along the first direction X. The lower end of the material tube storage bin 431 is provided with a discharge port. The first drive member 433 is fixedly connected to the mounting part 411. The receiving block 434 is fixedly connected to the power output end of the first drive member 433 and is located below the discharge port. The positioning block 435 is fixedly connected to the mounting part 411, and the receiving block 434 and the positioning block 435 are arranged along the second direction Y. The top surface of the receiving block 434 is provided with a first slot. 434A, the first slot 434A is set corresponding to the discharge port, and the bottom surface of the positioning block 435 is provided with a second slot 435A. The first slot 434A and the second slot 435A are both through slots extending along the first direction X. In the second direction Y, the end of the first slot 434A near the positioning block 435 is open, and the end of the second slot 435A near the receiving block 434 is open. The first driving member 433 is used to drive the receiving block 434 to move towards the positioning block 435 along the second direction Y, so that the first slot 434A and the second slot 435A form a limiting through hole 200. The limiting through hole 200 is used to limit the position of the material tube so that the material tube is directly facing the discharge track 42 along the first direction X. The pusher sub-assembly 432 is used to push the chip to be tested in the material tube in the limiting through hole 200 to the discharge track 42.In practical applications, the tube storage bin 431 stores multiple tubes, each containing multiple chips arranged along its length. The tubes are output from the outlet of the storage bin 431 to the first slot 434A of the receiving block 434. The tube in the first slot 434A closes the outlet of the storage bin 431, preventing other tubes from being output. When the tube-mounted chip feeding device feeds the equipment, the first driving member 433 drives the receiving block 434 towards the positioning block 435, causing the first slot 434A and the second slot 435A to engage and form a limiting through hole 200. This confines the tube within the limiting through hole 200, with the outer wall of the tube contacting the wall of the limiting through hole 200. This ensures stable tube arrangement, and the pusher assembly... The component 432 pushes the chips in the tube one by one to the discharge track 42. During this process, the receiving block 434 closes the discharge port of the tube storage bin 431 on the side facing the discharge port to prevent other tubes in the tube storage bin 431 from being output. After the chips in the tube located in the limiting through hole 200 are output, the tube is discharged. The first driving component 433 drives the receiving block 434 to reset to the position where the first slot 434A is facing the discharge port of the tube storage bin 431. The first slot 434A receives the next tube. The above process is repeated so that the tubes in the tube storage bin 431 are supplied one by one. Since the tube is limited within the limiting through hole 200 when outputting chips, the tube is stably arranged. Therefore, the bin assembly 43 can stably supply chips to the discharge track 42, and the sorting machine is tested to be reliable.

[0064] It should be noted that the feed tube and the pusher assembly 432 are both existing technologies. The feed tube is open at both ends along its length. The pusher assembly 432 includes a motor, rollers, pressure rollers, and a pusher rod. The rollers and pressure rollers clamp the pusher rod. The motor drives the rollers to rotate, thereby driving the pusher rod to move horizontally. The forward and reverse rotation of the rollers drives the pusher rod to extend and retract. The pusher rod passes through the opening at one end of the feed tube and enters the feed tube. The pusher rod pushes the chip inside the feed tube out from the opening at the other end to the discharge track 42. The feed tube and the pusher assembly 432 are not the innovations of this application, so they will not be described in detail here. The first driving component 433 can be a cylinder or an electric cylinder, and this application does not limit it.

[0065] In this embodiment, the hopper assembly 43 further includes a recovery trough 436, a second drive member 437, and a support block 438. The recovery trough 436 is fixedly connected to the lower end of the mounting part 411. The second drive member 437 is connected to the mounting part 411. The support block 438 is connected to the power output end of the second drive member 437 and is located below the outlet of the material tube storage hopper 431. The second drive member 437 is used to drive the support block 438 to move vertically. The support block 438 is used to support the material tube and can prevent the empty material tube on the first slot 434A from resetting with the receiving block 434. The mounting part 411 has a material discharge clearance through hole 411A, which is located below the positioning block 435. The material discharge clearance through hole 411A is used for the material tube to fall into the recovery trough 436. In practical applications, when the material tube is located in the limiting through hole 200... After the chip output is completed, the second driving component 437 drives the support block 438 to move toward the material tube storage bin 431 and rise, so as to block the material tube storage bin 431 outlet and contact the material tube located at the material tube storage bin 431 outlet. During the process of the first driving component 433 driving the receiving block 434 to reset, the support block 438 can block the material tube on the first slot 434A of the receiving block 434 to prevent the material tube from resetting with the receiving block 434, thereby causing the material tube to fall into the recycling bin 436 through the dropping clearance through hole 411A; in addition, after the receiving block 434 resets, the second driving component 437 drives the support block 438 to reset again. During this process, the material tube located at the material tube storage bin 431 outlet follows the support block 438 down and rests in the first slot 434A. The material tube will not fall directly, avoiding damage to the chip inside the material tube. The material bin assembly 43 has high structural reliability. Based on the setting of the recycling tank 436, the hopper component 43 can collect empty material tubes in a unified manner, which facilitates unified material unloading. Workers do not need to repeatedly perform the empty material tube unloading operation, reducing labor intensity.

[0066] It should be noted that the second driving component 437 can be a pneumatic cylinder or an electric cylinder, and this application does not limit this; the first driving component 433 and the receiving block 434 cooperate to form a receiving assembly, and there are two receiving assemblies. The two receiving assemblies are spaced apart along the first direction X and are used to receive the two ends of the material tube along its length direction. The number of positioning blocks 435 is adapted to the number of receiving blocks 434, that is, the first slots 434A of the two receiving blocks 434 respectively support the two ends of the material tube, and the material tube can be stably supported; while the second driving component 437 and the supporting block 438 cooperate to form a supporting assembly, and there are two supporting assemblies. The two supporting assemblies are spaced apart along the first direction X and are used to support the two ends of the material tube along its length direction. The two supporting assemblies are located between the two receiving assemblies, that is, the two supporting blocks 438 respectively support the two ends of the material tube. When the supporting blocks 438 drive the material tube to fall, they can prevent the material tube from tilting.

[0067] In this embodiment, the recycling tank 436 includes a first tank body 4361 and a second tank body 4362. The first tank body 4361 and the second tank body 4362 are both connected to the mounting part 411, and the first tank body 4361 and the second tank body 4362 are spaced apart along the first direction X. The first tank body 4361 is used to receive one end of the material tube along its length direction, and the second tank body 4362 is used to receive the other end of the material tube along its length direction. Specifically, the recycling tank 436 with this structure can effectively collect empty material tubes while having a simple structure, which simplifies the structure of the hopper assembly 43.

[0068] In this embodiment, the material storage bin 431 includes a first column 4311 and a second column 4312. The first column 4311 and the second column 4312 are vertically connected to the base, and the first column 4311 and the second column 4312 are spaced apart along a first direction X. The side of the first column 4311 facing the second column 4312 has a vertically extending first material trough 4311A, and the side of the second column 4312 facing the first column 4311 has a vertically extending second material trough 4312A. 11A is used to hold one end of the material tube along its length, and the second material trough 4312A is used to hold the other end of the material tube along its length. Based on this structure, the material tube storage bin 431 has multiple material tubes stacked vertically in the material tube storage bin 431. The material tubes can be output one by one based on gravity, and the structure is simple. The receiving block 434 is located between the first column 4311 and the second column 4312 to ensure that the first slot 434A of the receiving block 434 can receive the material tube output from the outlet of the material tube storage bin 431. The hopper assembly 43 also includes a support base 439, which is connected to the base and is located between the two support components. The support base 439 has an upward-facing support plane that is flush with the bottom surface of the first slot 434A. Specifically, since the material is a long and thin tube, when the tube falls into the first slot 434A under the action of the support block 438, the support base 439 located between the two support components can support the middle part of the tube, thereby keeping the tube straight.

[0069] In this embodiment, the material loading mechanism 5 includes a second mounting plate 51, a conveying device 52, and a pallet hopper 53. The second mounting plate 51 is fixedly connected to the machine base 1 and is located on one side of the test platform 2 in the second direction Y. The conveying device 52 and the pallet hopper 53 are fixedly connected to the second mounting plate 51. The conveying direction of the conveying device 52 is parallel to the first direction X. The conveying device 52 has pallet hoppers 53 at both ends in its conveying direction. One of the pallet hoppers 53 at both ends of the conveying device 52 is a first hopper and the other is a second hopper. The conveying device 52 has a picking station located between the first hopper and the second hopper. The conveying device 52 is used to transfer the pallet 100 from the first hopper to the picking station and then to the second hopper. In practical applications, when the tray loading mechanism 5 is used as a feeding mechanism, the first hopper is used to stack and accommodate multiple trays 100 loaded with chips, and the second hopper is used to accommodate empty trays 100. When there are a certain number of empty trays in the second hopper, they are fed out in a unified manner. The conveying device 52 and the tray hopper 53 are installed on the machine base 1 through the second mounting plate 51. The tray loading mechanism 5 has a modular design, which is simple in structure and easy to install.

[0070] Furthermore, in the first direction X, the pallet bins 53 are located on both sides of the machine base 1, thereby reducing the size of the machine base 1 and facilitating the lightweight design of the test sorting machine.

[0071] In this embodiment, the pallet hopper 53 includes a limiting post 531, a first support component 532, and a second support component 533. The limiting post 531 is provided with multiple posts fixedly connected to the second mounting plate 51 and extends vertically. The first support component 532 is connected to the limiting post 531. The multiple limiting posts 531 and the first support component 532 form a placement space for stacking and storing pallets 100. The conveying device 52 extends below the placement space. The second support component 533 is fixedly connected to the second mounting plate 51. The first support component 532 is used to support the pallets 100 in the placement space. The first support component 532 can move the pallets 100 upward into the placement space or move the pallets 100 in the placement space downward out. The second support component 533 is used to lift the pallets 100 on the conveying device 52 so that the pallets 100 move upward into the placement space or support the pallets 100 moving downward out of the placement space and place them onto the conveying device 52. Specifically, in the first hopper, the first support component 532 can cause the lowest tray 100 in the placement space to be output downwards. The second support component 533 is used to support the downward-output tray 100 in the placement space and place it onto the conveyor device 52. Specifically, when the tray 100 loading process is performed, the second support component 533 operates to support the tray 100 to be output in the placement space, and then the first support component 532 operates to allow the tray 100 to be output downwards. After that, the second support component 533 resets to allow the tray 100 to be lowered onto the conveyor device 52, and the first support component 532 resets to support the remaining trays 100 in the placement space. Finally, the conveyor device 52 transports the trays 100 to the picking station to supply chips, thereby completing the loading of the trays 100. The transfer mechanism 6 picks up the chips from the trays 100 at the picking station. In the second hopper, the first support component 532 can cause the tray 100 to be upwards... Upon entering the placement space, the second support component 533 is used to lift the pallet 100 on the conveying device 52 so that the pallet 100 enters the placement space upwards. Specifically, after the chips on the pallet 100 are supplied, the pallet 100 unloading process needs to be performed. At this time, the conveying device 52 transports the empty pallet 100 to the second hopper, and the second support component 533 lifts the pallet 100. The first support component 532 moves to allow the pallet 100 to enter the placement space upwards. Afterwards, the first support component 532 resets to support the pallet 100, thereby completing the unloading of the empty pallet 100. The second support component 533 resets to prepare to lift the next pallet 100. The pallet hopper 53 of this application, based on the arrangement of the first support component 532 and the second support component 533, can automatically load or unload the pallets 100 one by one without manual loading and unloading, which can reduce the labor intensity of the workers and ensure the transmission efficiency of the pallets 100.

[0072] In this embodiment, there are four limiting stops 531. In other embodiments, the number of limiting stops 531 may be six, eight or more, and this application does not limit this.

[0073] In this embodiment, the tray 100 has supporting ears 100A at opposite ends; there are two first support components 532, which respectively cooperate with the supporting ears 100A at both ends of the tray 100. The first support component 532 includes a mounting base 5321, a third drive member 5322, and a first support plate 5323. The mounting base 5321 is fixedly connected to two adjacent limiting posts 531. The third drive member 5322 is fixedly connected to the mounting base 5321. The power output end of the third drive member 5322 is fixedly connected to the first support plate 5323. The third drive member 5322 is used to drive the first support plate 5323 to move horizontally. The first support plate 5323 supports the corresponding support ear 100A. The second support assembly 533 includes a fourth drive member 5331 and a second support plate 5332. The fourth drive member 5331 is fixedly connected to the second mounting plate 51, and the power output end of the fourth drive member 5331 is fixedly connected to the second support plate 5332. The fourth drive member 5331 is used to drive the second support plate 5332 to rise and fall, so that the second support plate 5332 supports the bottom surface of the tray 100. The first support assembly 532 and the second support assembly 533 of this structure are simple in structure and easy to install. For example, the third drive member 5322 and the fourth drive member 5331 are both cylinders. In other embodiments, the third drive member 5322 and the fourth drive member 5331 can be electric cylinders, and this application does not limit this.

[0074] Furthermore, the third drive member 5322 is located above the mounting base 5321, and the power output end of the third drive member 5322 faces away from the placement space; the first support assembly 532 also includes a first linear guide rail 5324, and the first support plate 5323 includes a connecting plate portion 5323A and a support plate portion 5323B connected to each other. The connecting plate portion 5323A and the support plate portion 5323B are integrally connected. The connecting plate portion 5323A extends vertically and is fixedly connected to the power output end of the third drive member 5322. The support plate portion 5323B extends along the first direction X and is located below the mounting base 5321. The support plate portion 5323B is connected to the mounting base 5321 through the first linear guide rail 5324. The support plate portion 5323B is used to support the support ear 100A of the tray 100. The advantage of this structure is that the third driving component 5322 and the support plate 5323B are arranged vertically, resulting in a compact structure and reduced horizontal space occupation, which is beneficial for the compact design of the material tray loading mechanism 5. The first linear guide rail 5324 plays a guiding role, ensuring that the support plate 5323B can move smoothly. In addition, the support plate 5323B is connected to the first linear guide rail 5324, and the support plate 5323B is not suspended. Therefore, when the support plate 5323B supports the corresponding support lug 100A, the support plate 5323B is not prone to downward swaying due to force, resulting in high structural reliability.

[0075] Furthermore, in the second direction Y, the conveying device 52 is provided with second support components 533 on both sides. In the pallet bin 53, the second support plates 5332 on both sides of the conveying device 52 together form a stable supporting plane. In practical applications, the fourth drive components 5331 on both sides of the conveying device 52 move synchronously so that the supporting plane can stably support the pallet 100, prevent the pallet 100 from swaying in the vertical direction, and ensure that the pallet 100 remains horizontal.

[0076] In this embodiment, the conveying device 52 includes a pallet 521, a second linear guide rail 522, and a fifth driving member 523. The pallet 521 is fixedly connected to the slider of the second linear guide rail 522, and the pallet 521 is fixedly connected to the power output end of the fifth driving member 523. The pallet 521 is used to support the pallet 100. The second linear guide rail 522 extends along the first direction X. The fifth driving member 523 is used to drive the pallet 521 to reciprocate to convey the pallet 100. The fifth driving member 523 is a synchronous belt module. The pallet 521 is fixedly connected to the synchronous belt of the synchronous belt module and is driven by the synchronous belt to make linear motion. It should be noted that the synchronous belt module is conventional technology in the field, and this application will not elaborate on it. The second linear guide rail 522 can guide the movement of the pallet 521 and has high reliability. The conveying device 52 with this structure conveys the pallet 100 through the pallet 521, and its structure is simple and reliable.

[0077] Furthermore, in the second direction Y, both ends of the pallet 521 have vertically through-holes 521A for lifting and avoiding obstacles. The lifting and avoiding holes 521A are used to avoid the lifting and lowering of the second support plate 5332. Based on the lifting and avoiding holes 521A, the second support component 533 can be set close to the conveying device 52. The second support component 533 does not need to be placed on one side of the pallet 521. The layout is reasonable, saves space, and the structure of the material tray loading mechanism 5 is more compact.

[0078] Furthermore, in the second direction Y, the end of the lifting clearance through hole 521A away from the center of the support plate 521 is an open end. This type of support plate 521 has the characteristics of simple structure and convenient processing.

[0079] In this embodiment, in the pallet hopper 53, two first support components 532 are spaced apart along the first direction X. Along the first direction X, both ends of the pallet 521 are provided with positioning components 524. Each positioning component 524 includes a first positioning post 5241 and a second positioning post 5242. The first positioning post 5241 and the second positioning post 5242 are spaced apart along the second direction Y, forming a positioning space between them. This positioning space is used to accommodate the supporting ear 100A. In practical applications, when the pallet 100 is placed on the pallet 521 under the action of the second support components 533, the supporting ear 100A of the pallet 100 is located in the positioning space. The first positioning post 5241 and the second positioning post 5242 can limit the position of the pallet 100, allowing the pallet 100 to be placed stably on the pallet 521, resulting in a reliable structure.

[0080] Furthermore, both the first positioning post 5241 and the second positioning post 5242 are cylinders, and both have chamfers at their top ends. The chamfers can serve as guides to facilitate the insertion of the support ear 100A into the positioning space.

[0081] In this embodiment, the material transfer mechanism 6 includes a first mounting frame 61, a second drive mechanism 62, a third drive mechanism 63, a second mounting frame 64, a fourth drive mechanism 65, and a suction nozzle assembly 66. The first mounting frame 61 is slidably connected to the machine base 1, the second drive mechanism 62 is fixedly connected to the machine base 1, and the power output end of the second drive mechanism 62 is fixedly connected to the first mounting frame 61. The second drive mechanism 62 is used to drive the first mounting frame 61 to move along the first direction X. The third drive mechanism 63 is fixedly connected to the first mounting frame 61, and the power output end of the third drive mechanism 63 is fixedly connected to the second mounting frame 64. The driving mechanism 63 drives the second mounting bracket 64 to slide along the second direction Y. The fourth driving mechanism 65 is fixedly connected to the second mounting bracket 64, and the power output end of the fourth driving mechanism 65 is fixedly connected to the nozzle assembly 66. The fourth driving mechanism 65 drives the nozzle assembly 66 to move vertically, and the nozzle assembly 66 is used to pick up and place chips. In practical applications, the second driving mechanism 62, the third driving mechanism 63, and the fourth driving mechanism 65 form a three-axis driving module. This three-axis driving module drives the nozzle assembly 66 to move along the first direction X, the second direction Y, and the vertical direction, so that the nozzle assembly 66 can smoothly pick up chips. For example, the second driving mechanism 62, the third driving mechanism 63, and the fourth driving mechanism 65 are all synchronous belt modules.

[0082] Furthermore, the first mounting frame 61 has a clearance space 61A extending along the first direction X. The second mounting plate 51 and the conveying device 52 pass through the clearance space 61A, and the first mounting frame 61 is located between the pallet bins 53 at both ends of the conveying device 52. The advantage of this structure is that the material tray loading mechanism 5 is not located on one side of the first mounting frame 61 in the second direction Y, which reduces the space occupied. Therefore, the structure of the test sorting machine is more compact.

[0083] It should be noted that the nozzle assembly 66 is prior art. The nozzle assembly 66 is capable of rotating the chip, and the chip rotation axis extends vertically. Thus, the nozzle assembly 66 can adjust the chip's orientation to adapt the chip's orientation to the placement position of the test socket 71. Furthermore, a first vision component 8 is fixedly connected to the fourth drive mechanism 65. The first vision component 8 is used to photograph the feeding mechanism to determine the chip's position. The nozzle assembly 66 achieves accurate chip pickup based on the image information captured by the first vision component 8. The chip pickup achieved by the first vision component 8 and the nozzle assembly 66 is not an innovation of this application; it is prior art and will not be elaborated upon further.

[0084] Furthermore, the testing and sorting machine also includes a second vision component 9, a material box 10, and a nozzle magazine 11. The second vision component 9, material box 10, and nozzle magazine 11 are all fixedly connected to the top surface of the machine base 1. The second vision component 9 is located on one side of the testing platform 2 in the first direction X, and in the second direction Y, it is situated between the material tray loading mechanism 5 and the discharge track 42. There are two material boxes 10, respectively located on opposite sides of the testing platform 2 in the first direction X. The nozzle magazine 11 is located between the material tray loading mechanism 5 and the testing platform 2. The second vision component 9 is used to inspect the cores adsorbed by the nozzle component 66. When precise positioning of the chip is required, accuracy compensation is performed. That is, the second vision component 9 and the nozzle component 66 work together to adjust the chip's orientation so that the chip's orientation matches the placement position of the test holder 71. The material box 10 is used to collect qualified / unqualified chips, and the nozzle library 11 is used to store nozzles of various specifications. When testing chips of different specifications, the nozzle component 66 changes the corresponding nozzle at the nozzle library 11. The adjustment of the chip's orientation by the second vision component 9 and the nozzle component 66, and the changing of the corresponding nozzle by the nozzle component 66 at the nozzle library 11, are existing technologies and are not the innovation of this application. This application will not elaborate on them further. The placement of the second vision component 9, material box 10, and nozzle library 11 makes full use of the space on the top surface of the machine 1, resulting in high space utilization and a compact structure for the test sorting machine.

[0085] It should be noted that in this embodiment, the tape and reel feeding mechanism 3 adopts the existing chip tape and reel mechanism, which includes a feeding component, a take-up roller, an unwind roller and other structures. The specific structure of the tape and reel feeding mechanism 3 is not an innovation of this application, and this application will not elaborate on it.

[0086] In practical applications, the test sorter can be used with a heat flow meter to test chips. The outlet of the heat flow meter is located above the test stage 2, and the heat flow meter provides the ambient temperature required for chip testing.

[0087] Although embodiments of the invention have been shown and described, those skilled in the art will understand that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the claims and their equivalents.

Claims

1. A testing and sorting machine having a first direction (X) and a second direction (Y) extending perpendicularly and horizontally, characterized in that, The test sorting machine includes a machine base (1) and a test table (2), a tape loading mechanism (3), a tube loading mechanism (4), a tray loading mechanism (5), and a transfer mechanism (6) connected to the machine base (1). A test fixture (7) is connected to the test table (2). The tape loading mechanism (3) and the tube loading mechanism (4) are respectively located on both sides of the test table (2) in the first direction (X). The tray loading mechanism (5) is located on one side of the test table (2) in the second direction (Y). At least one of the tape loading mechanism (3), the tube loading mechanism (4), and the tray loading mechanism (5) is used to supply the chip to be tested. The transfer mechanism (6) is used to transfer the chip to be tested onto the test fixture (7).

2. The test sorting machine according to claim 1, characterized in that, The test fixture (7) includes a test base (71) and a cover plate (72); The test bench (2) includes a support platform (21), a first drive mechanism (22), a lifting rod (23), a force control sensor (24), and a connecting seat (25). The support platform (21) is fixedly connected to the machine base (1). The top surface of the support platform (21) is a bearing surface, and the test seat (71) is detachably connected to the bearing surface. The support platform (21) has a mounting cavity (21A). The first drive mechanism (22) is fixedly connected to the mounting cavity (21A). One end of the lifting rod (23) along its length direction is fixedly connected to the first drive mechanism (22). The lifting rod (23) is vertically... The lifting rod (23) extends and passes through the support platform (21). The other end of the lifting rod (23) is located above the support surface and is fixedly connected to the force control sensor (24). The force control sensor (24) is fixedly connected to the connecting seat (25). The cover plate (72) is detachably connected to the connecting seat (25). The first driving mechanism (22) is used to drive the lifting rod (23) to rise and fall, so that the connecting seat (25) drives the cover plate (72) to move. The cover plate (72) is used to cover the test seat (71). The transfer mechanism (6) is used to transfer the chip to be tested to the test seat (71).

3. The test sorting machine according to claim 2, characterized in that, The first drive mechanism (22) includes a first mounting plate (221), a contact (222), an elastic element (223), a motor (224), and a cam (225). The first mounting plate (221) is fixedly connected in the mounting cavity (21A). The contact (222) is fixedly connected to the lifting rod (23). The elastic element (223) can elastically deform in the vertical direction. One end of the elastic element (223) is fixedly connected to the first mounting plate (221) in the vertical direction, and the other end is fixedly connected to the lifting rod (23). The motor (224) is fixedly connected to the first mounting plate (221). The power output end of the motor (224) is fixedly connected to the cam (225). The cam (225) contacts the contact (222). The elastic element (223) is used to keep the contact (222) and the cam (225) in contact.

4. The test sorting machine according to claim 1, characterized in that, The material loading mechanism (4) includes a mounting rod (41), a discharge track (42), and a hopper assembly (43). The mounting rod (41) and the discharge track (42) are fixedly connected to the machine base (1) along the first direction (X), and the discharge track (42) is located on the side of the mounting rod (41) close to the test platform (2). The length direction of the mounting rod (41) is parallel to the first direction (X). The mounting rod (41) has a mounting part (411) extending outside the machine base (1), and the hopper assembly (43) is fixedly connected to the mounting part (411).

5. The test sorting machine according to claim 4, characterized in that, The hopper assembly (43) includes a material tube storage hopper (431), a pusher sub-assembly (432), a first drive component (433), a receiving block (434), and a positioning block (435). The material tube storage hopper (431) and the pusher sub-assembly (432) are fixedly connected to the mounting part (411), and the pusher sub-assembly (432) is located on the side of the material tube storage hopper (431) away from the discharge track (42) along the first direction (X). The lower end of the material tube storage hopper (431) is provided with an outlet. The material outlet is provided with the first driving member (433) fixedly connected to the mounting part (411), the receiving block (434) fixedly connected to the power output end of the first driving member (433), the receiving block (434) located below the material outlet, the positioning block (435) fixedly connected to the mounting part (411), and the receiving block (434) and the positioning block (435) arranged along the second direction (Y). The top surface of the receiving block (434) is provided with a first slot (434A). The first slot (434A) is provided corresponding to the discharge port. The bottom surface of the positioning block (435) is provided with a second slot (435A). Both the first slot (434A) and the second slot (435A) are through slots extending along the first direction (X). In the second direction (Y), the end of the first slot (434A) near the positioning block (435) is open, and the end of the second slot (435A) near the receiving block (434) is open. The first driving member (433) The receiving block (434) is used to drive the receiving block (434) to move towards the positioning block (435) along the second direction (Y), so that the first slot (434A) and the second slot (435A) form a limiting through hole (200). The limiting through hole (200) is used to limit the position of the material tube so that the material tube is directly facing the discharge track (42) along the first direction (X). The pushing sub-assembly (432) is used to push the chip to be tested in the material tube in the limiting through hole (200) to the discharge track (42).

6. The test sorting machine according to claim 5, characterized in that, The hopper assembly (43) further includes a recycling trough (436), a second drive member (437), and a support block (438). The recycling trough (436) is fixedly connected to the lower end of the mounting part (411). The second drive member (437) is connected to the mounting part (411). The support block (438) is connected to the power output end of the second drive member (437). The support block (438) is located below the outlet of the material tube storage hopper (431). The second drive member (437) is used to drive the support block (438) to move vertically. The support block (438) is used to support the material tube. The support block (438) can prevent the empty material tube on the first slot (434A) from resetting with the receiving block (434). The mounting part (411) has a material discharge clearance through hole (411A), which is located below the positioning block (435); the material discharge clearance through hole (411A) is used for the feeding pipe to fall into the recycling tank (436).

7. The test sorting machine according to claim 1, characterized in that, The material loading mechanism (5) includes a second mounting plate (51), a conveying device (52), and a pallet hopper (53). The second mounting plate (51) is fixedly connected to the machine base (1) and is located on one side of the test platform (2) in the second direction (Y). The conveying device (52) and the pallet hopper (53) are fixedly connected to the second mounting plate (51). The conveying direction of the conveying device (52) is parallel to the first direction (X). The pallet hopper (53) is provided at both ends of the conveying device (52) in its conveying direction. One of the pallet hoppers (53) at both ends of the conveying device (52) is a first hopper and the other is a second hopper. The conveying device (52) has a picking station located between the first hopper and the second hopper. The conveying device (52) is used to transfer the pallet (100) from the first hopper to the picking station and then to the second hopper.

8. The test sorting machine according to claim 7, characterized in that, The pallet hopper (53) includes limiting posts (531), a first support assembly (532), and a second support assembly (533). Multiple limiting posts (531) are provided and fixedly connected to the second mounting plate (51). The limiting posts (531) extend vertically. The first support assembly (532) is connected to the limiting posts (531). The multiple limiting posts (531) and the first support assembly (532) form a placement space for stacking and storing pallets (100). The conveying device (52) extends below the placement space. The support component (533) is fixedly connected to the second mounting plate (51). The first support component (532) is used to support the pallet (100) in the placement space. The first support component (532) can move the pallet (100) upward into the placement space or cause the pallet (100) in the placement space to be output downward. The second support component (533) is used to lift the pallet (100) on the conveying device (52) so that the pallet (100) moves upward into the placement space, or supports the pallet (100) output downward in the placement space and lowers it onto the conveying device (52).

9. The test sorting machine according to claim 8, characterized in that, The tray (100) has supporting lugs (100A) at opposite ends. There are two first support components (532), and the two first support components (532) respectively cooperate with the support ears (100A) at both ends of the tray (100). The first support component (532) includes a mounting base (5321), a third drive member (5322) and a first support plate (5323). The mounting base (5321) is fixedly connected to two adjacent limit posts (531). The third drive member (5322) is fixedly connected to the mounting base (5321). The power output end of the third drive member (5322) is fixedly connected to the first support plate (5323). The third drive member (5322) is used to drive the first support plate (5323) to move horizontally so that the first support plate (5323) supports the corresponding support ear (100A). The second support assembly (533) includes a fourth drive member (5331) and a second support plate (5332). The fourth drive member (5331) is fixedly connected to the second mounting plate (51). The power output end of the fourth drive member (5331) is fixedly connected to the second support plate (5332). The fourth drive member (5331) is used to drive the second support plate (5332) to rise and fall so that the second support plate (5332) supports the bottom surface of the tray (100).

10. The test sorting machine according to claim 7, characterized in that, The material transfer mechanism (6) includes a first mounting frame (61), a second drive mechanism (62), a third drive mechanism (63), a second mounting frame (64), a fourth drive mechanism (65), and a suction nozzle assembly (66). The first mounting frame (61) is slidably connected to the machine base (1), and the second drive mechanism (62) is fixedly connected to the machine base (1). The power output end of the second drive mechanism (62) is fixedly connected to the first mounting frame (61). The second drive mechanism (62) is used to drive the first mounting frame (61) to move along the first direction (X). The third drive mechanism (64) 63) Fixedly connected to the first mounting bracket (61), the power output end of the third drive mechanism (63) is fixedly connected to the second mounting bracket (64), the third drive mechanism (63) is used to drive the second mounting bracket (64) to slide along the second direction (Y), the fourth drive mechanism (65) is fixedly connected to the second mounting bracket (64), the power output end of the fourth drive mechanism (65) is fixedly connected to the nozzle assembly (66), the fourth drive mechanism (65) is used to drive the nozzle assembly (66) to move vertically, and the nozzle assembly (66) is used to pick up and place chips; The first mounting frame (61) has a clearance space (61A) extending along the first direction (X), the second mounting plate (51) and the conveying device (52) passing through the clearance space (61A), and the first mounting frame (61) is located between the pallet bins (53) at both ends of the conveying device (52).

Images