Circuit board multi-type defect intelligent identification method and system based on deep learning
By combining deep learning with multi-view consistency fusion and distribution difference analysis, the problem of unstable identification results in circuit board defect detection is solved. This method achieves stable differentiation between process-allowed fluctuations and real functional defects, as well as suppression of false defects, thereby improving the stability and accuracy of detection.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- GUANGZHOU ELECTROMECHANICAL SENIOR TECHN SCHOOL
- Filing Date
- 2026-02-05
- Publication Date
- 2026-06-05
AI Technical Summary
Existing circuit board defect detection technologies struggle to reliably distinguish between process-permissible fluctuations and genuine functional defects in scenarios where regular structures and irregular anomalies are mixed, leading to unstable identification results and limited adaptability to changes in imaging conditions and data distribution drift.
By using a deep learning-based intelligent identification method for multiple types of defects, printed circuit board inspection data and environmental historical auxiliary data are collected and preprocessed. Process semantic separable density ratio discrimination analysis is performed. Combined with multi-view consistency fusion and distribution difference joint drift alarm analysis, stable differentiation between process allowable fluctuations and real functional defects and closed-loop correction of imaging parameters are achieved.
It effectively solves the problem of unstable recognition results under mixed distribution of regular structures and irregular anomalies, suppresses false defects caused by reflection, occlusion and viewing angle differences, realizes effective characterization of small structural anomalies and weak contrast defects, and improves the consistency and reliability of detection.
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