Atomic force microscope based nanoscale photothermal ion in-situ characterization device

CN122171843APending Publication Date: 2026-06-09SHANGHAI INST OF CERAMIC CHEM & TECH CHINESE ACAD OF SCI
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
SHANGHAI INST OF CERAMIC CHEM & TECH CHINESE ACAD OF SCI
Filing Date
2024-12-09
Publication Date
2026-06-09

AI Technical Summary

Technical Problem

Existing technologies for in-situ nanoscale characterization of battery materials suffer from insufficient accuracy and excessive cost. In particular, commercial electrochemical strain microscopy techniques struggle to distinguish the source of probe electromechanical effects, affecting the accuracy of battery material characterization. Furthermore, they impose specific requirements on AFM conductive probes, leading to increased costs.

Method used

A nanoscale photothermal ion in-situ characterization device based on atomic force microscopy is used. By combining the photothermal ion effect of pulsed mid-infrared laser with the sample under test, nanoscale detection by atomic force microscopy probe and Fourier transform of periodic signal, the photothermal ion second harmonic signal is obtained, realizing high-resolution nanoscale microscopic imaging of ion transport characteristics.

Benefits of technology

It achieves high-resolution nanoscale microscopic imaging of ion transport properties, reduces the requirements for AFM conductive probes, reduces characterization costs, and is suitable for industrialization and mass production.

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Abstract

An atomic force microscope-based nanoscale photothermal ion in-situ characterization device, comprising: an atomic force microscope module comprising an AFM conductive probe in contact with a to-be-measured region of a to-be-measured sample; a nanometer infrared photothermal excitation module for emitting pulsed mid-infrared laser to the to-be-measured region to cause the micro-cantilever of the AFM conductive probe to deform; a photothermal ion signal detection module comprising a signal detection unit and a data processing and display unit in communication, the signal detection unit being used to acquire the micro-cantilever signal of the AFM conductive probe; wherein the data processing and display unit acquires the photothermal ion second-harmonic signal of the to-be-measured region based on the micro-cantilever signal of the AFM conductive probe to display the image of the ion transport micro-region surface distribution of the to-be-measured region.
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