Laser wavelength locking device based on waveform feature analysis and Rydberg atom preparation system

Abstract

This invention provides a laser wavelength locking device based on waveform feature analysis. The device includes a signal acquisition module, a signal confirmation module, a signal adjustment module, and a laser wavelength locking module. The signal confirmation module is communicatively connected to the signal acquisition module, the signal adjustment module is communicatively connected to the signal confirmation module, and the laser wavelength locking module is communicatively connected to the signal adjustment module. The signal confirmation module is used to identify signal feature points that are laser detection signals and calculate the average index and index change value of the signal feature points. The signal adjustment module is used to adjust the voltage range of the laser driving signal. The laser wavelength locking module is used to use the voltage value corresponding to the target peak sampling point as the upper and lower limit thresholds of the voltage range of the laser driving signal, thereby achieving laser wavelength locking. This invention solves the problems of slow locking response speed and insufficient dynamic adjustment capability in existing technologies.

Description

Technical Field

[0001] This invention relates to the field of laser frequency locking technology, specifically to a laser wavelength locking device and a Rydberg atom preparation system based on waveform feature analysis. Background Technology

[0002] In the field of quantum sensing, the frequency of laser output can randomly drift due to factors such as ambient temperature fluctuations, pump current drift, resonant cavity vibration, and device aging. For example, in Rydberg atomic electric field measurement, a drift of only 0.5 MHz from the target resonance frequency by the laser frequency excited by the Rydberg level can directly deviate from the resonance window of the atomic level transition, causing the electric field measurement error to deteriorate from the ideal μV / cm level to the mV / cm level, thus losing the high sensitivity advantage of Rydberg atomic electric field measurement.

[0003] Existing laser frequency locking technologies typically employ two methods to achieve laser wavelength locking: one is a fixed threshold-based locking method, which uses a preset voltage threshold range and locks the laser signal by detecting whether it falls within that range. However, fixed thresholds cannot adapt to signal noise fluctuations, making them prone to noise-induced drift and exhibiting weak noise immunity. The other method is a simple peak detection-based locking method, which directly searches for peaks in the laser signal waveform and uses the peak position as the locking reference. This simple peak detection method does not consider overall waveform characteristics, such as rising / falling edge symmetry. When waveform distortions such as amplitude changes or baseline drift occur, the locking accuracy significantly decreases. Furthermore, neither of these methods can optimize voltage control parameters in real time based on waveform characteristics, resulting in slow locking response and insufficient dynamic adjustment capabilities.

[0004] Patent document CN118899742A discloses a laser control method based on Rydberg atoms, and specifically discloses how to perform data analysis on the first voltage waveform data to obtain the lowest peak voltage value of the falling edge waveform in the first voltage waveform data. It can be seen that the technical solution analyzes the local data of the falling edge, which is a locking scheme based on simple peak detection. Its shortcomings are as follows: In terms of waveform validity screening mechanism, there is no waveform integrity judgment step. It directly performs XOR processing on the intercepted falling edge data, which is susceptible to distortion and baseline drift waveform interference, leading to misjudgment; In terms of feature point extraction logic, it adopts an iterative method of finding peaks and stepping to narrow the voltage range using XOR operation, which approaches the unique lowest peak through repeated processing; In terms of voltage range adjustment strategy, it is based on iterative narrowing with a fixed step voltage: by repeatedly narrowing the triangular wave voltage range until the unique peak is found, the response speed is slow and it cannot adapt to dynamic changes in waveform; In terms of peak selection and application adaptability, it does not consider the deep correlation between laser wavelength locking and atomic energy level transitions, nor does it establish active control logic between waveform features and voltage parameters, and is only suitable for peak positioning scenarios of simple voltage waveforms. Summary of the Invention

[0005] To address the shortcomings of existing technologies, this invention provides a laser wavelength locking device and a Rydberg atom preparation system based on waveform feature analysis. By extracting signal feature points of the waveform, dynamically correlated voltage range, and peak selection based on the energy level transition characteristics of Rydberg atoms, precise locking of the laser wavelength is achieved. This solves the technical problems of existing technologies, such as a significant decrease in locking accuracy when signal waveform distortions occur, such as amplitude changes or baseline drift, as well as the problems of slow locking response speed and insufficient dynamic adjustment capability due to the inability to optimize voltage control parameters in real time based on waveform characteristics.

[0006] A laser wavelength locking device based on waveform feature analysis, the laser wavelength locking device comprising: The signal acquisition module and the signal confirmation module are used to acquire waveform sampling data of the laser detection signal.

[0007] The signal confirmation module is communicatively connected to the signal acquisition module. It is used to find multiple signal sampling points corresponding to the minimum signal amplitude in the waveform sampling data and multiple signal sampling points corresponding to the signal amplitude change exceeding the threshold, and confirm them as signal feature points of the laser detection signal. It also calculates the index average value and index change value of the signal feature points.

[0008] The signal adjustment module is communicatively connected to the signal confirmation module and is used to adjust the voltage range of the laser driving signal in real time according to the average index value of the signal feature points until the voltage range of the laser driving signal is consistent with the sampling point index range of the laser detection signal waveform.

[0009] A laser wavelength locking module, which is communicatively connected to a signal adjustment module, is used to perform peak detection on rising edge waveform data or falling edge waveform data to obtain multiple peak sampling points. Based on the energy level transition type of the cesium atom D2 line, a target peak sampling point is selected from the multiple peak sampling points, and the voltage value corresponding to the target peak sampling point is used as the upper and lower limit thresholds of the voltage range of the laser driving signal to achieve laser wavelength locking.

[0010] This invention achieves laser wavelength locking through sliding window noise reduction, waveform integrity judgment, dynamic correlation between signal feature points and voltage, and slope peak detection mechanism, effectively improving locking accuracy and anti-noise capability.

[0011] Furthermore, the laser wavelength locking device also includes: The signal waveform confirmation module is communicatively connected to both the signal acquisition module and the signal confirmation module. It is used to sequentially acquire the number of times the laser detection signal waveform effectively crosses the mean line and the difference between the average amplitude values ​​of the first and last data segments of the laser detection signal waveform. If the number of times crosses the mean line is greater than a preset value and the difference between the average amplitude values ​​is less than the first average amplitude value, then the laser detection signal waveform is confirmed to be a complete waveform.

[0012] In this invention, the signal waveform confirmation module uses a dual-condition waveform integrity determination based on the number of times the waveform effectively crosses the mean line and the difference between the first and last average amplitude values. This achieves improved adaptability to distorted waveforms, enhanced noise immunity, a balance between efficiency and accuracy, and adaptation to amplitude changes. Specifically, the signal waveform confirmation module, through dual-dimensional determination rules, can accurately identify abnormal waveforms such as baseline drift, local distortion, and sudden amplitude changes. Compared to single-dimensional determination methods, this improves adaptability to distorted waveforms and effectively avoids erroneous frequency locking operations based on invalid waveforms. The integrity determination and sliding window noise reduction in the signal waveform confirmation module create a synergistic effect, further reducing the false trigger rate of frequency locking caused by noise. Subsequent feature point extraction and voltage adjustment are performed only on complete waveforms, reducing redundant calculations and keeping the frequency locking response time within 50ms. At the same time, by excluding distorted waveforms, the feature point positioning error is further compressed to ±1 sampling point, and the first amplitude mean calculation error is consistently below 5%. The mean difference constraint rule is compatible with waveform amplitude changes of 10% to 50%. Even if laser power fluctuations cause overall waveform amplitude shifts, the waveform integrity can still be accurately determined without manual adjustment of the determination threshold.

[0013] Furthermore, the signal waveform confirmation module is used to obtain the effective number of times the laser detection signal waveform effectively crosses the mean line. The signal waveform confirmation module includes an effective number acquisition unit for obtaining the effective number of times the laser detection signal waveform crosses the mean line, a difference acquisition unit for obtaining the difference between the average amplitude values ​​of the first and last data segments of the laser detection signal waveform, and a waveform judgment unit for determining whether the waveform is valid based on the difference between the effective number and the average amplitude value.

[0014] Furthermore, the effective count acquisition unit includes: The mean line construction unit is used to preprocess the waveform sampling data to obtain the first amplitude mean of the waveform sampling data, and then construct the signal amplitude mean line based on the first amplitude mean.

[0015] The data judgment unit is communicatively connected to the mean line construction unit. It is used to traverse the waveform sampling data according to the sampling order, determine whether all data sampling points cross the signal amplitude mean line, and obtain the number of times all data sampling points have effectively crossed the signal amplitude mean line.

[0016] In this invention, the signal waveform confirmation module constructs a baseline based on the mean value after sliding window preprocessing, avoiding baseline offset caused by fixed threshold. Combined with the method of "adjacent two points crossing the mean line", it effectively improves the accuracy of determining the number of times the line is crossed and reduces the false judgment rate.

[0017] The data judgment unit includes: The data acquisition subunit is used to select two adjacent data sampling points in the waveform sampling data; The data judgment subunit is communicatively connected to the data acquisition subunit. It is used to determine that the laser detection signal waveform has effectively crossed the signal amplitude mean line once when the amplitude value of one of the two data sampling points is greater than the first amplitude mean and the amplitude value of the other data sampling point is less than the first amplitude mean.

[0018] In this invention, the data judgment unit uses the judgment rule of two adjacent data sampling points crossing the mean line, rather than comparing a single sampling point with the mean line, to filter out false threading signals caused by noise at a single point and reduce the false judgment rate of threading count.

[0019] The mean line construction unit includes: The data segment selection subunit is used to select K data segments containing M sampling points from the signal sampling data of the laser detection signal containing N data sampling points, starting from its starting end and following the temporal sequence of the signal sampling data. These data segments are denoted as the 1st to the Kth data segments. A mean line construction subunit is communicatively connected to a data segment selection unit. It is used to calculate the average amplitude value of each data segment in the first to the Kth data segments respectively. The K average amplitude values ​​together constitute the set of average amplitude values ​​of the K data segments. Then, the maximum and minimum average amplitude values ​​are selected from the set of average amplitude values. The sum of the maximum and minimum average amplitude values ​​is calculated and divided by 2 to obtain the first amplitude mean. Finally, the signal amplitude mean line is constructed based on the first amplitude mean.

[0020] In this invention, the mean line construction unit replaces the original single-point amplitude with the average amplitude value of K M-point data segments, which can effectively filter high-frequency random noise in the laser detection signal; the first amplitude mean is calculated based on the maximum and minimum average amplitude values, rather than the single-point extreme values ​​of the original data. The first amplitude mean is closer to the true amplitude range of the waveform, and the mean line construction error is reduced.

[0021] Furthermore, the difference acquisition unit includes: The first data segment construction unit is used to select M sampling points continuously from the beginning of the ordered sampling data of the laser detection signal containing N data sampling points to form the first data segment, where M is a positive integer and satisfies 1≤M<N; The second data segment construction unit is communicatively connected to the first data segment construction unit. It is used to select M sampling points continuously in reverse from the end of the signal sampling data, i.e. the Nth sampling point, to form the second data segment, where M is a positive integer and satisfies 1≤M<N. The calculation unit is communicatively connected to the second data segment construction unit and is used to calculate the average amplitude value A of the first data segment and the average amplitude value B of the second data segment, respectively, and then calculate the difference between the average amplitude value A and the average amplitude value B, |AB|, to obtain the difference between the average amplitude values ​​of the first and last data segments of the laser detection signal waveform.

[0022] The signal waveform confirmation module is mainly used to accurately identify the baseline shift at the beginning and end of the waveform caused by laser optical path drift and detector aging by quantizing the difference in the average amplitude values ​​of the first and last data segments of the waveform, thereby improving the recognition rate of incomplete waveforms with baseline drift.

[0023] Furthermore, the signal confirmation module is used to locate multiple signal sampling points whose signal amplitude changes exceed a threshold, and confirm them as signal feature points of the laser detection signal. The signal confirmation module includes: The first data calculation unit is used to calculate the difference between the signal amplitude value of the (K+1)th data sampling point and the signal amplitude value of the Kth data sampling point from the ordered sampled data of the laser detection signal containing N data sampling points, and to obtain the slope change value of the Kth data sampling point; and to calculate the slope change value of the (K+1)th data sampling point according to the method described above. The second data calculation unit, which is communicatively connected to the first data calculation unit, is used to calculate the difference between the slope change value of the Kth data sampling point and the slope change value of the (K+1)th data sampling point. If the difference is greater than a preset threshold, the Kth data sampling point is confirmed as a signal feature point of the laser detection signal.

[0024] In this invention, the signal confirmation module determines signal feature points based on the slope change difference rather than a single slope value. This can filter out minute amplitude fluctuations, accurately capture key feature boundaries of the waveform, reduce signal feature point positioning errors, and make signal feature points controllable. By calculating the slope change value point by point and comparing adjacent differences, the amplitude change characteristics of the waveform can be completely preserved, avoiding the omission of key abrupt changes, and providing an accurate index reference for adjusting the voltage range of the laser drive signal.

[0025] Furthermore, the signal adjustment module is used to adjust the voltage range of the laser drive signal in real time based on the average index value of the signal feature points. Therefore, the signal adjustment module includes: The acquisition unit is used to acquire the index values ​​of all signal feature points and calculate their average index value to obtain the average index of the signal feature points. A data search unit, which is communicatively connected to an acquisition unit, is used to search for the maximum value of a local index in the rising edge waveform data or falling edge waveform data, respectively, in the direction of decreasing and increasing of the average index of the signal feature points, based on the average index of the signal feature points, to obtain the first target local index and the second target local index corresponding to the two maximum values ​​of the local index. The data update unit, which is communicatively connected to the data lookup unit, is used to establish an index-voltage mapping relationship. Based on the relative positions corresponding to the first target local index and the second target local index, the minimum voltage threshold and the maximum voltage threshold of the laser driving signal are mapped. Then, the minimum voltage threshold and the maximum voltage threshold are used as the adjustment boundary values ​​of the laser driving signal to update the voltage range, thereby achieving real-time matching between the voltage range and waveform characteristics.

[0026] This invention employs a signal adjustment module to construct a dynamic correlation model between signal feature points and the voltage of the laser driving signal using signal feature point average indexing, local extremum search, indexing, and voltage mapping. This ensures that the voltage adjustment boundary closely matches the effective feature range of the waveform, improving the voltage range matching accuracy of the laser driving signal and avoiding frequency locking failure caused by a fixed voltage range. Simultaneously, the dynamic mapping model shortens the voltage range update response time, and combined with subsequent peak detection processes, the overall frequency locking response time is controlled within 50ms. The index-voltage mapping uses a linear correlation rule, independent of the voltage-wavelength curve for specific wavelengths, making it compatible with 852nm, 780nm, and other laser systems. Voltage adjustment is based on signal feature point indexes with an error within ±2 sampling points, further ensuring that the first amplitude mean calculation error is less than 5%, and the final locking accuracy is stabilized within ±0.1pm.

[0027] Furthermore, the laser wavelength locking module is used to select the target peak sampling point based on the energy level transition characteristics of the cesium atom D2 line. The laser wavelength locking module includes: The transition type confirmation unit is used to confirm the cesium atom transition types corresponding to the plurality of peak sampling points. The plurality of peak sampling points include a first resonance absorption peak sampling point, a first cross-peak sampling point, a second resonance absorption peak sampling point, a second cross-peak sampling point, a third cross-peak sampling point, and a third resonance absorption peak sampling point arranged sequentially. Specifically, the first resonance absorption peak sampling point corresponds to a cesium atom resonance transition type from the ground state F=4 to the low excited state F′=3; the second resonance absorption peak sampling point corresponds to a cesium atom resonance transition type from the ground state F=4 to the middle excited state F′=4; and the third resonance absorption peak sampling point corresponds to a cesium atom resonance transition from the ground state F=4 to the high excited state F′=5. The types are as follows: the first cross-peak sampling point corresponds to the cesium atom cross-transition type where the cesium atom resonance peak from the ground state F=4 to the low level F′=3 of the excited state overlaps with the cesium atom resonance peak from the ground state F=4 to the middle level F′=4 of the excited state; the second cross-peak sampling point corresponds to the cesium atom cross-transition type where the cesium atom resonance peak from the ground state F=4 to the low level F′=3 of the excited state overlaps with the cesium atom resonance peak from the ground state F=4 to the high level F′=5 of the excited state overlaps with the cesium atom resonance peak; and the third cross-peak sampling point corresponds to the cesium atom cross-transition type where the cesium atom resonance peak from the ground state F=4 to the middle level F′=4 of the excited state overlaps with the cesium atom resonance peak from the ground state F=4 to the high level F′=5 of the excited state overlaps with the cesium atom cross-transition type. The target peak sampling point confirmation unit is communicatively connected to the transition type confirmation unit. It is used to select the corresponding target peak sampling point according to the demand type. If the demand is to excite cesium atoms to the excited state, the third resonance absorption peak sampling point is selected as the target peak sampling point; if the demand is to achieve large-scale detuning locking of cooling light in the magneto-optical trap, the third cross peak sampling point is selected as the target peak sampling point; if the demand is to make cesium atoms spontaneously radiate to the ground state F=3, the second resonance absorption peak sampling point is selected as the target peak sampling point.

[0028] The laser wavelength locking module in this invention employs a customized peak selection strategy based on the energy level transition characteristics of the cesium atom's D2 line. Combined with a peak detection algorithm based on slope analysis, it ensures that the peak positioning error is less than ±2 sampling points, accurately identifying six characteristic peaks within a 50ms response time. Customized point selection strategies are tailored for three types of needs: excited-state excitation, magneto-optical trap cooling, and spontaneous emission. Combined with a baseline of less than 5% error in the first amplitude mean calculation, the laser energy utilization rate is increased to over 85% in different scenarios, effectively improving atom trapping and excitation efficiency. Furthermore, the peak classification logic is applicable to 852nm and 780nm laser systems using Rydberg atoms such as rubidium or cesium atoms, requiring only adjustment of the transition type correspondence, demonstrating significant versatility.

[0029] The present invention also provides a Rydberg atom preparation system, which includes the above-mentioned laser wavelength locking device based on waveform feature analysis.

[0030] The beneficial effects of this invention are as follows: 1. This invention uses a signal waveform confirmation module to determine waveform integrity based on two conditions: "number of times the signal crosses the mean line" and "difference between the average amplitude values ​​of the first and last data segments". The distortion waveform recognition rate reaches 100%, and the frequency locking false trigger rate is reduced from 15% to less than 1%. This solves the technical problem in the prior art where there is no waveform integrity judgment step and the XOR processing is performed directly on the intercepted falling edge data, which is easily affected by distortion and baseline drift waveform interference, leading to misjudgment.

[0031] This invention uses a signal confirmation module to accurately locate signal sampling points with abrupt amplitude changes in a waveform by "calculating the slope of adjacent sampling points and determining the difference in slope changes". For example, it locates two types of signal feature points: "bottom points" and "slope change feature boundary points". The positioning error of the signal feature points is controlled within ±2 sampling points, and the calculation error of the first amplitude mean is less than 5%, thereby improving the locking accuracy. Moreover, it solves the problem that key feature points are easily missed or feature points are misjudged due to noise when determining the threshold of a single amplitude change, and provides a reliable index reference for subsequent voltage range adjustment.

[0032] This invention constructs a signal feature point index-voltage dynamic correlation model through a signal adjustment module. Based on the average index of feature points, a mapping relationship is established by searching for the maximum value of local indexes, and the voltage range is updated in real time. The response time is shortened to less than 50ms, which solves the problems of existing technologies that require multiple narrowing of the triangular wave voltage range until a unique peak is found, resulting in slow response speed and inability to adapt to dynamic waveform changes.

[0033] This invention clarifies the correspondence between peak sampling points and cesium atom D2 line transition types through a laser wavelength locking module. It accurately selects target peaks based on the functional requirements of application scenarios, improving the adaptability of laser wavelength locking to different application scenarios such as cesium atom excited state excitation and magneto-optical trap cooling. It solves the technical problem in existing technologies where simple peak detection does not consider the overall waveform characteristics, such as rising / falling edge symmetry, and the locking accuracy significantly decreases when signal waveform distortions such as amplitude changes and baseline drift occur. Attached Figure Description

[0034] Figure 1 This is a schematic diagram of the structure of a laser wavelength locking device based on waveform feature analysis according to an embodiment of the present invention; Figure 2 Figure 1 shows the waveform of the laser detection signal acquired by the signal acquisition module according to the embodiment of the present invention within the sampling period, wherein Figure 2a is the rising edge waveform and Figure 3b is the falling edge waveform. Figure 3 This is a schematic diagram of the signal waveform confirmation module according to an embodiment of the present invention; Figure 4 This is a schematic diagram showing the results of the signal confirmation module locating two types of signal feature points, namely "bottom point" and "slope change feature boundary point", as described in this embodiment of the invention. Figure 5 This is a schematic diagram of the laser wavelength locking module based on the energy level transition of the cesium atom D2 line according to an embodiment of the present invention; Figure 6 This is a schematic diagram of six peak sampling points after peak detection by the laser wavelength locking module described in this embodiment of the invention, wherein 1-first resonant absorption peak sampling point, 2-first cross peak sampling point, 3-second resonant absorption peak sampling point, 4-second cross peak sampling point, 5-third cross peak sampling point, and 6-third resonant absorption peak sampling point. Detailed Implementation

[0035] To enable those skilled in the art to better understand the technical solutions in this application, the technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of this application.

[0036] As attached Figure 1 As shown, this embodiment of the invention provides a laser wavelength locking device based on waveform feature analysis, applied to an 852nm laser. The laser detection signal is output from the laser to the laser frequency stabilization device, and the laser drive signal is output from the laser frequency stabilization device to the laser. The laser wavelength locking device includes a signal acquisition module, a signal waveform confirmation module, a signal confirmation module, a signal adjustment module, and a laser wavelength locking module.

[0037] The signal acquisition module is used to acquire waveform sampling data of the laser detection signal. The waveform sampling data includes rising edge waveform data within half a sampling period or falling edge waveform data within the other half sampling period.

[0038] In this embodiment, the laser output from the 852nm laser passes through a cesium atom gas cell and is converted into an electrical signal, i.e., a laser detection signal, by a photodetector. The data acquisition module collects this electrical signal at a sampling frequency of 1kHz to obtain complete waveform sampling data containing 1000 ordered sampling points. The complete waveform sampling data corresponds to one sampling period and is finally obtained by the signal acquisition module.

[0039] As attached Figure 2 As shown, the signal acquisition module divides the complete waveform sampling data into half-sampling periods. The first 500 sampling points are rising edge waveform data, with the signal amplitude gradually increasing from a minimum of 0.5V to a maximum of 2.5V. The next 500 sampling points are falling edge waveform data, with the signal amplitude gradually decreasing from 2.5V to 0.5V. In this embodiment, the signal acquisition module prioritizes the rising edge waveform data for subsequent processing. The processing logic for the falling edge waveform data is the same, only the direction is reversed.

[0040] The signal waveform confirmation module sequentially obtains the number of times the waveform sampling data effectively crosses the mean line and the difference between the average amplitude values ​​of the first and last data segments of the laser detection signal waveform. If the number of times crosses the mean line is greater than the preset value and the difference between the average amplitude values ​​is less than the first average amplitude value, then the waveform of the laser detection signal is confirmed to be a complete waveform.

[0041] In this embodiment, the signal waveform confirmation module judges the integrity of the waveform. Its purpose is to filter valid waveforms and exclude noise, distortion or incomplete waveforms. Preferably, the signal waveform confirmation module makes a dual judgment based on "the number of times the signal crosses the mean line" and "the difference between the average amplitude values ​​of the first and last data segments". Specifically, it includes a valid number acquisition unit, a difference acquisition unit and a waveform judgment unit.

[0042] Preferably, the effective number acquisition unit is used to acquire the effective number of times the laser detection signal waveform effectively crosses the mean line, and it includes a mean line construction unit and a data judgment unit.

[0043] The mean line construction unit is used to preprocess the waveform sampling data to obtain the first amplitude mean of the waveform sampling data, and then construct the signal amplitude mean line based on the first amplitude mean. It includes a data segment selection subunit and a mean line construction subunit.

[0044] The data segment selection subunit is used to select K data segments containing M sampling points from the signal sampling data of the laser detection signal containing N data sampling points, starting from its starting end and following the temporal sequence of the signal sampling data. These data segments are denoted as the 1st to the Kth data segments.

[0045] In this embodiment, the data segment selection subunit samples the rising edge signal containing 500 data sampling points. Following the timing sequence of the rising edge signal sampling data, K=100 data segments containing M=5 sampling points are selected sequentially. For example, the first segment: point 1 to point 5, the second segment: point 6 to point 10, ..., the 100th segment: point 496 to point 500. This data segment is recorded as the first to the 100th data segments.

[0046] The mean line construction sub-unit is used to calculate the average amplitude value of each data segment in the first to Kth data segments respectively. Then, the maximum average amplitude value and the minimum average amplitude value are selected from the set of average amplitude values. The sum of the maximum average amplitude value and the minimum average amplitude value is calculated and divided by 2 to obtain the first amplitude mean value. Finally, the signal amplitude mean line is constructed based on the first amplitude mean value.

[0047] In this embodiment, 100 average amplitude values ​​together constitute a set of average amplitude values ​​for 100 data segments. The mean line construction subunit calculates the average amplitude value of each data segment from the 1st to the 100th data segment. For example, in the 1st data segment, the average amplitude value from point 1 to point 5 is calculated to be 0.7V, and in the 100th data segment, the average amplitude value from point 496 to point 500 is calculated to be 2.3V. After the mean line construction subunit traverses the 100 data segments, it obtains a set of average amplitude values, from which the maximum average amplitude value of 2.5V and the minimum average amplitude value of 0.5V are extracted. The first average amplitude value is 2V, and the voltage value of the average amplitude line is 1.5V, which serves as the horizontal baseline for the rising edge waveform.

[0048] The data judgment unit is connected in communication with the mean line construction unit. It is used to traverse the waveform sampling data according to the sampling order, determine whether all data sampling points cross the signal amplitude mean line, and obtain the number of times all data sampling points have effectively crossed the signal amplitude mean line.

[0049] Preferably, the data judgment unit includes a data acquisition subunit and a data judgment subunit.

[0050] The data acquisition subunit is used to select two adjacent data sampling points in the waveform sampling data.

[0051] In this embodiment, the data acquisition subunit traverses the rising edge waveform data in the sampling order from point 1 to point 500, and selects two adjacent sampling points one by one, for example, point 1 & point 2, point 2 & point 3, ..., point 499 & point 500.

[0052] The data judgment subunit is connected to the data acquisition subunit. It is used to determine that the laser detection signal waveform has effectively crossed the signal amplitude mean line once when the amplitude value of one of the two data sampling points is greater than the first amplitude mean and the amplitude value of the other data sampling point is less than the first amplitude mean.

[0053] In this embodiment, the data judgment subunit determines "valid crossing": if the amplitude value of one of two adjacent points is greater than 1.5V and the amplitude value of the other point is less than 1.5V, it is recorded as "valid crossing of the mean line once"; for example, the amplitude value of the 200th point is 1.4V and the amplitude value of the 201st point is 1.6V, which is determined as 1 valid crossing; after traversal, the number of valid crossings counted in this embodiment is equal to 8 times, which satisfies the preset condition of "2≤number≤20".

[0054] The difference acquisition unit is used to acquire the difference between the average amplitude values ​​of the first and last data segments of the laser detection signal waveform. It includes a first data segment construction unit, a second data segment construction unit, and a calculation unit.

[0055] The first data segment construction unit is used to select M sampling points continuously from the beginning of the ordered sampling data of the laser detection signal containing N data sampling points to form the first data segment, where M is a positive integer and satisfies 1≤M<N.

[0056] In this embodiment, the first data segment construction unit selects M=5 sampling points consecutively from the starting end of the rising edge waveform sampling data, i.e., the first sampling point, to form the first data segment.

[0057] The second data segment construction unit is communicatively connected to the first data segment construction unit. Starting from the end of the signal sampling data, i.e. the Nth sampling point, the second data segment construction unit continuously selects M sampling points in reverse to form the second data segment, where M is a positive integer and satisfies 1≤M<N.

[0058] In this embodiment, the second data segment construction unit selects M=5 sampling points in reverse order, starting from the end of the falling edge waveform sampling data, i.e., the 500th sampling point, i.e. the 996th to the 1000th sampling point, to form the second data segment.

[0059] The calculation unit is communicatively connected to the second data segment construction unit and is used to calculate the average amplitude value A of the first data segment and the average amplitude value B of the second data segment respectively, and then calculate the difference between the average amplitude value A and the average amplitude value B, |AB|, to obtain the difference between the average amplitude values ​​of the first and last data segments of the laser detection signal waveform.

[0060] In this embodiment, the calculation unit calculates the average amplitude value A=0.7V for the first data segment, calculates the average amplitude value B=0.65V for the second data segment, and then calculates the difference between the average amplitude value A and the average amplitude value B, |AB|, which equals 0.05V, and outputs it to the waveform judgment unit.

[0061] The waveform judgment unit is connected to the effective number acquisition unit and the difference acquisition unit, respectively, and is used to determine whether the rising edge data sampling waveform is a complete and valid waveform based on the effective number and the difference. In this embodiment, the waveform judgment unit determines that the rising edge data sampling waveform is a complete and valid waveform based on the statistical effective number of passes being equal to 8 times, which satisfies the preset condition of "2≤number≤20", and the calculated difference of the average amplitude value |AB| being 0.05V, which is less than the first amplitude average value of 2V.

[0062] The waveform judgment unit can effectively determine whether there are problems such as baseline drift and end distortion of the waveform by comparing the difference between the average amplitude values ​​at the beginning and end of the complete waveform. Combined with the dual-condition judgment of "number of times the average line is effectively crossed", it can accurately screen out the complete waveform without distortion, providing a reliable data basis for subsequent feature point positioning and voltage range adjustment.

[0063] The signal confirmation module communicates with the signal acquisition module to locate multiple signal sampling points corresponding to the minimum signal amplitude in the waveform sampling data, as well as multiple signal sampling points corresponding to signal amplitude changes exceeding a threshold. These are then identified as signal feature points of the laser detection signal, and the average index and index change value of the signal feature points are calculated. This step locates two types of signal feature points: "bottom points" and "slope change feature boundary points," as detailed below: In this embodiment, the signal confirmation module searches for multiple signal sampling points corresponding to the minimum signal amplitude in the waveform sampling data, that is, locates the "bottom point". In this embodiment, the "waveform sampling data" is the rising edge waveform sampling data. Specifically, the signal confirmation module traverses 500 sampling points of the rising edge waveform sampling data and extracts the sampling point with the smallest amplitude value. For example, the amplitude of points 50 to 52 is 0.5V. The signal confirmation module takes the average index of these 3 signal sampling points, 51, as the "bottom point index", and the corresponding sampling point is the "bottom point".

[0064] In this embodiment, the signal confirmation module finds multiple signal sampling points corresponding to signal amplitude changes exceeding a threshold, that is, it locates the "slope change feature boundary point". The signal confirmation module includes a first data calculation unit and a second data calculation unit.

[0065] In this embodiment, the first data calculation unit is used to calculate the difference between the signal amplitude value of the (K+1)th data sampling point and the signal amplitude value of the Kth data sampling point from the ordered sampling data of the laser detection signal containing N data sampling points, and obtain the slope change value of the Kth data sampling point; according to the method, the slope change value of the (K+1)th data sampling point is calculated.

[0066] The first data calculation unit calculates the slope change value for each sampling point. For the Kth sampling point, its slope k K It equals the signal amplitude value of the (K+1)th data sampling point minus the signal amplitude value of the Kth data sampling point. For example, if the signal amplitude value of the 100th data sampling point is 1V and the signal amplitude value of the 101st data sampling point is 1.2V, then k... 100 It is 0.2V.

[0067] The second data calculation unit is communicatively connected to the first data calculation unit. It is used to calculate the difference between the slope change value of the Kth data sampling point and the slope change value of the (K+1)th data sampling point. If the difference is greater than a preset threshold, the Kth data sampling point is confirmed as a signal feature point of the laser detection signal.

[0068] In this embodiment, the second data calculation unit determines a sudden change in slope. The preset threshold is the difference in slope changes between adjacent data sampling points. The preset threshold is 0.15V. For example, if the slope of the 150th signal sampling point is 0.1V and the slope of the 151st signal sampling point is 0.3V, then the difference in slope is 0.2V, which is greater than 0.15V. Therefore, the 150th signal sampling point is determined to be a signal feature point of the laser detection signal, and the index of the 150th signal sampling point is 150.

[0069] The signal adjustment module is communicatively connected to the signal confirmation module and is used to adjust the voltage range of the laser drive signal in real time based on the average index value of the signal feature points until the voltage range of the laser drive signal matches the sampling point index range of the laser detection signal waveform. Preferably, the signal adjustment module includes an acquisition unit, a data search unit, and a data update unit.

[0070] The acquisition unit is used to acquire the index values ​​of all signal feature points and calculate their average index value to obtain the average index of the signal feature points.

[0071] In this embodiment, all signal feature points include multiple "bottom points" and multiple "slope change feature boundary points". The average index value of all signal feature points is calculated. In this embodiment, the average index value of all signal feature points is 184.

[0072] The data search unit is communicatively connected to the acquisition unit and is used to search for the maximum value of the local index in the rising edge waveform data, based on the average index of the signal feature points, in the direction of decreasing and increasing of the average index of the signal feature points, respectively, to obtain the first target local index and the second target local index corresponding to the two maximum values ​​of the local index.

[0073] In this embodiment, the data lookup unit uses the average index of signal feature points with an index value of 184 as a reference. In the rising edge waveform data, it searches for the first target local index corresponding to the maximum value of the local index along the decreasing direction of the average index of signal feature points. For example, the decreasing direction of the average index of signal feature points includes signal sampling points 180-184, 179-183, etc. In this embodiment, the first target local index corresponding to the maximum value of the local index is 100. The data lookup unit also searches for the second target local index corresponding to the maximum value of the local index along the increasing direction of the average index of signal feature points. For example, the increasing direction of the average index of signal feature points includes signal sampling points 185-189, 190-194, etc. In this embodiment, the second target local index corresponding to the maximum value of the local index is 300.

[0074] The data update unit is connected to the data lookup unit to establish an index-voltage mapping relationship. Based on the relative positions of the first target local index and the second target local index, the minimum voltage threshold and the maximum voltage threshold of the laser driving signal are mapped. Then, the minimum voltage threshold and the maximum voltage threshold are used as the adjustment boundary values ​​of the laser driving signal to update the voltage range, thereby achieving real-time matching between the voltage range and waveform characteristics.

[0075] In this embodiment, the initial voltage range of the laser driving signal is 0~120V, and the initial index range of the rising edge waveform is 1 to 500 index points. They are linearly corresponding, i.e., "voltage value = (index / total number of indexes) × total voltage range". The data update unit finds the relative position corresponding to the first target local index 100 and maps it to a minimum voltage threshold of 20V. The relative position corresponding to the second target local index 300 and maps it to a maximum voltage threshold of 100V. Finally, the voltage range is updated: the laser driving signal voltage range is adjusted from the initial 0~120V to 20~100V, and the index range of the rising edge waveform is adjusted from the initial index range 1~500 to 100~300, so as to achieve the matching of voltage and waveform characteristics.

[0076] The data update unit and the data lookup unit are communicatively connected to perform peak detection on the rising edge waveform data, obtaining multiple peak sampling points. Based on the energy level transition type of the cesium atom D2 line, a target peak sampling point is selected from the multiple peak sampling points, and the voltage value corresponding to the target peak sampling point is used as the upper and lower limit thresholds of the voltage range of the laser driving signal to achieve laser wavelength locking; wherein, as shown in the appendix... Figure 5 As shown, the D2 line of the cesium atom refers to the electric dipole transition from the ground state to the excited state of the cesium atom, corresponding to a characteristic wavelength of approximately 852.34 nm. Specifically, the ground state of the cesium atom is the electronic configuration 6S. 1 The corresponding spectral term energy level 6 2 S 1 / 2 The excited state is the electronic configuration 6P. 1 The corresponding spectral term energy level 6 2 P 3 / 2 In alkali metal atoms, the outer electrons undergo energy level splitting due to spin-orbit coupling; for example, the 6p orbital of a cesium atom splits into 6p orbitals. 2 P 1 / 2 and 6 2 P 3 / 2 Two sub-levels, with the ground state being 6. 2 S 1 / 2 To 6 2 P 3 / 2 The transition is the D2 line, ground state 6. 2 S 1 / 2 To 6 2 P 1 / 2 The transition is to line D1.

[0077] In this embodiment, the data update unit performs peak detection on the rising edge waveform data. It identifies peaks based on slope changes, and when the slope changes from positive to negative, it is determined to be a peak point.

[0078] Preferably, the laser wavelength locking module includes: The transition type confirmation unit is used to confirm the cesium atom transition types corresponding to the six peak sampling points. Specifically, see attached... Figure 6 As shown, the six peak sampling points include a first resonance absorption peak sampling point, a first cross peak sampling point, a second resonance absorption peak sampling point, a second cross peak sampling point, a third cross peak sampling point, and a third resonance absorption peak sampling point arranged sequentially. In this embodiment, as shown in the attached diagram... Figure 6 As shown, based on the rising edge index range of 100~300, the index value of the first resonance absorption peak sampling point is 150, the index value of the first cross peak sampling point is 160, the index value of the second resonance absorption peak sampling point is 170, the index value of the second cross peak sampling point is 180, the index value of the third cross peak sampling point is 190, and the index value of the third resonance absorption peak sampling point is 200.

[0079] The first resonance absorption peak corresponds to the cesium atom resonance transition from the ground state F=4 to the excited state low energy level F′=3. Since the cesium atom population is large, the transmission intensity is high, and the signal amplitude of the first resonance absorption peak sampling point is 6.0. The second resonance absorption peak corresponds to the cesium atom resonance transition from the ground state F=4 to the excited state middle energy level F′=4. The absorption intensity is moderate, and the signal amplitude value further decreases, reaching 5.9. The third resonance absorption peak corresponds to the cesium atom resonance transition from the ground state F=4 to the excited state high energy level F′=5. The absorption intensity is strong but there is no overlap, and the signal amplitude value is 5.7.

[0080] The first cross-peak sampling point corresponds to the cesium atom cross-transition type that overlaps between the cesium atom resonance peak transitioning from the ground state F=4 to the low-energy level F′=3 of the excited state and the cesium atom resonance peak transitioning from the ground state F=4 to the middle-energy level F′=4 of the excited state. The first cross-peak sampling point is a resonance peak overlap, with an absorption intensity slightly stronger than 1 and a slightly lower signal amplitude value of 5.95. The second cross-peak sampling point corresponds to the cesium atom resonance peak transitioning from the ground state F=4 to the low-energy level F′=3 of the excited state. The cesium atom cross-transition type, which overlaps with the cesium atom resonance peak transitioning from the ground state F=4 to the excited state high energy level F′=5, has an absorption intensity stronger than 3, and the signal amplitude value drops to 5.85. The third cross-peak sampling point corresponds to the cesium atom cross-transition type, which overlaps with the cesium atom resonance peak transitioning from the ground state F=4 to the excited state high energy level F′=4 and the cesium atom resonance peak transitioning from the ground state F=4 to the excited state high energy level F′=5. Its signal amplitude value is the lowest, with a value of 5.6.

[0081] The target peak sampling point confirmation unit is communicatively connected to the transition type confirmation unit and is used to select the corresponding target peak sampling point according to the demand type.

[0082] Specifically, the target peak sampling point confirmation unit first calculates the voltage values ​​of the six peak sampling points using the following formula: ;in, This represents the lower limit of the laser drive signal voltage range. This represents the upper limit of the laser drive signal voltage range. This is the index of the peak sampling point; For the first target local index; For the second target local index; If the requirement is to excite cesium atoms to an excited state, the target peak sampling point confirmation unit selects the third resonance absorption peak sampling point as the target peak sampling point. In this embodiment, the target peak sampling point confirmation unit obtains the voltage value of the third resonance absorption peak sampling point as 60V according to the index 200 of the third resonance absorption peak sampling point. Therefore, the upper and lower limit thresholds of the voltage range of the laser driving signal are 60V, thereby achieving laser wavelength locking for this requirement type.

[0083] Locking effect: The target peak sampling point confirmation unit outputs a 60V voltage threshold to the voltage drive module of the laser frequency stabilization device, controlling the output wavelength of the 852nm laser to be stable within the characteristic wavelength range of 852.347nm±0.08pm for the transition from the ground state F=4 to the excited state F′=5 of the cesium atom. The excitation efficiency of the cesium atom excited state is ≥85%, meeting the application requirements of high-sensitivity sensing of the electric or magnetic field of Rydberg atoms.

[0084] If the requirement is a large-scale detuning lock of the cooling light in the magneto-optical trap, the target peak sampling point confirmation unit selects the third cross-peak sampling point as the target peak sampling point. In this embodiment, the target peak sampling point confirmation unit obtains the voltage value of the third resonant absorption peak sampling point as 56V based on the index 250 of the third resonant absorption peak sampling point. Therefore, the upper and lower limit thresholds of the voltage range of the laser driving signal are 56V, thus achieving laser wavelength locking for this requirement type.

[0085] Locking effect: The target peak sampling point confirmation unit outputs a voltage threshold of 56V to the voltage drive module, controlling the frequency detuning range of the laser output wavelength to cover -4MHz to +4MHz, which meets the large-range detuning requirements for cooling rubidium atoms in the magneto-optical trap, with an atom capture efficiency of ≥90% and an atom temperature of ≤100μK after cooling.

[0086] If the requirement is to induce spontaneous emission of cesium atoms to the ground state F=3, the target peak sampling point confirmation unit selects the second resonant absorption peak sampling point as the target peak sampling point. Based on the index 170 of the second resonant absorption peak sampling point, the target peak sampling point confirmation unit obtains a voltage value of 48V for the second resonant absorption peak sampling point. Therefore, the upper and lower limits of the laser drive signal voltage range are 48V, achieving laser wavelength locking for this requirement.

[0087] Locking effect: The target peak sampling point confirmation unit outputs a voltage threshold of 48V to the voltage drive module, controlling the laser output wavelength to be stable within the range of ±0.09pm of the characteristic wavelength of cesium atoms transitioning from the ground state F=4 to the excited state energy level F′=4. The proportion of rubidium atoms spontaneously radiating to the ground state F=3 is ≥90%, which meets the requirements of applications such as atomic state preparation and quantum storage.

[0088] This invention also provides a Rydberg atom preparation system, which includes the aforementioned laser wavelength locking device based on waveform feature analysis. Its technical effect is the same as that of the laser wavelength locking device based on waveform feature analysis, and will not be described again here.

Claims

1. A laser wavelength locking device based on waveform feature analysis, characterized in that, The laser wavelength locking device includes: The signal acquisition module, wherein the signal confirmation module is used to acquire waveform sampling data of the laser detection signal; The signal confirmation module is communicatively connected to the signal acquisition module. It is used to find multiple signal sampling points corresponding to the minimum signal amplitude in the waveform sampling data and multiple signal sampling points corresponding to the signal amplitude change exceeding the threshold, and confirm them as signal feature points of the laser detection signal. It also calculates the index average value and index change value of the signal feature points. The signal adjustment module is communicatively connected to the signal confirmation module and is used to adjust the voltage range of the laser driving signal in real time according to the average index value of the signal feature points until the voltage range of the laser driving signal is consistent with the sampling point index range of the laser detection signal waveform. A laser wavelength locking module, which is communicatively connected to a signal adjustment module, is used to perform peak detection on rising edge waveform data or falling edge waveform data to obtain multiple peak sampling points. Based on the energy level transition type of the cesium atom D2 line, a target peak sampling point is selected from the multiple peak sampling points, and the voltage value corresponding to the target peak sampling point is used as the upper and lower limit thresholds of the voltage range of the laser driving signal to achieve laser wavelength locking.

2. The laser wavelength locking device based on waveform feature analysis as described in claim 1, characterized in that, Also includes: The signal waveform confirmation module is communicatively connected to both the signal acquisition module and the signal confirmation module. It is used to sequentially acquire the number of times the laser detection signal waveform effectively crosses the mean line and the difference between the average amplitude values ​​of the first and last data segments of the laser detection signal waveform. If the number of times crosses the mean line is greater than a preset value and the difference between the average amplitude values ​​is less than the first average amplitude value, then the laser detection signal waveform is confirmed to be a complete waveform.

3. The laser wavelength locking device based on waveform feature analysis as described in claim 2, characterized in that, The signal waveform confirmation module includes an effective number acquisition unit for acquiring the effective number of times the laser detection signal waveform crosses the mean line, a difference acquisition unit for acquiring the difference between the average amplitude values ​​of the first and last data segments of the laser detection signal waveform, and a waveform judgment unit for determining whether the waveform is valid based on the difference between the effective number and the average amplitude value.

4. The laser wavelength locking device based on waveform feature analysis as described in claim 3, characterized in that, The valid count acquisition unit includes: The mean line construction unit is used to preprocess the waveform sampling data to obtain the first amplitude mean of the waveform sampling data, and then construct the signal amplitude mean line based on the first amplitude mean. The data judgment unit is communicatively connected to the mean line construction unit. It is used to traverse the waveform sampling data according to the sampling order, determine whether all data sampling points cross the signal amplitude mean line, and obtain the number of times all data sampling points effectively cross the signal amplitude mean line. The mean line construction unit includes: The data segment selection subunit is used to select K data segments containing M sampling points from the signal sampling data of the laser detection signal containing N data sampling points, starting from its starting end and following the temporal sequence of the signal sampling data. These data segments are denoted as the 1st to the Kth data segments. A mean line construction subunit is communicatively connected to a data segment selection unit. It is used to calculate the average amplitude value of each data segment in the first to the Kth data segments respectively. The K average amplitude values ​​together constitute the set of average amplitude values ​​of the K data segments. Then, the maximum average amplitude value and the minimum average amplitude value are selected from the set of average amplitude values. The sum of the maximum average amplitude value and the minimum average amplitude value is calculated and divided by 2 to obtain the first amplitude mean. Finally, the signal amplitude mean line is constructed based on the first amplitude mean. The data judgment unit includes: The data acquisition subunit is used to select two adjacent data sampling points in the waveform sampling data; The data judgment subunit is communicatively connected to the data acquisition subunit. It is used to determine that the laser detection signal waveform has effectively crossed the signal amplitude mean line once when the amplitude value of one of the two data sampling points is greater than the first amplitude mean and the amplitude value of the other data sampling point is less than the first amplitude mean.

5. A laser wavelength locking device based on waveform feature analysis as described in claim 3 or 4, characterized in that, The difference acquisition unit includes: The first data segment construction unit is used to select M sampling points continuously from the beginning of the ordered sampling data of the laser detection signal containing N data sampling points to form the first data segment, where M is a positive integer and satisfies 1≤M<N; The second data segment construction unit is communicatively connected to the first data segment construction unit. It is used to select M sampling points continuously in reverse from the end of the signal sampling data, i.e. the Nth sampling point, to form the second data segment, where M is a positive integer and satisfies 1≤M<N. The calculation unit is communicatively connected to the second data segment construction unit and is used to calculate the average amplitude value A of the first data segment and the average amplitude value B of the second data segment, respectively, and then calculate the difference between the average amplitude value A and the average amplitude value B, |AB|, to obtain the difference between the average amplitude values ​​of the first and last data segments of the laser detection signal waveform.

6. The laser wavelength locking device based on waveform feature analysis as described in claim 1, characterized in that, The signal confirmation module also includes: The first data calculation unit is used to calculate the difference between the signal amplitude value of the (K+1)th data sampling point and the signal amplitude value of the Kth data sampling point from the ordered sampled data of the laser detection signal containing N data sampling points, and to obtain the slope change value of the Kth data sampling point; and to calculate the slope change value of the (K+1)th data sampling point according to the method described above. The second data calculation unit, which is communicatively connected to the first data calculation unit, is used to calculate the difference between the slope change value of the Kth data sampling point and the slope change value of the (K+1)th data sampling point. If the difference is greater than a preset threshold, the Kth data sampling point is confirmed as a signal feature point of the laser detection signal.

7. The laser wavelength locking device based on waveform feature analysis as described in claim 1, characterized in that, The signal conditioning module includes: The acquisition unit is used to acquire the index values ​​of all signal feature points and calculate their average index value to obtain the average index of the signal feature points. A data search unit, which is communicatively connected to an acquisition unit, is used to search for the maximum value of a local index in the rising edge waveform data or falling edge waveform data, respectively, in the direction of decreasing and increasing of the average index of the signal feature points, based on the average index of the signal feature points, to obtain the first target local index and the second target local index corresponding to the two maximum values ​​of the local index. The data update unit, which is communicatively connected to the data lookup unit, is used to establish an index-voltage mapping relationship. Based on the relative positions corresponding to the first target local index and the second target local index, the minimum voltage threshold and the maximum voltage threshold of the laser driving signal are mapped. Then, the minimum voltage threshold and the maximum voltage threshold are used as the adjustment boundary values ​​of the laser driving signal to update the voltage range, thereby achieving real-time matching between the voltage range and waveform characteristics.

8. The laser wavelength locking device based on waveform feature analysis as described in claim 1, characterized in that, The laser wavelength locking module includes: The transition type confirmation unit is used to confirm the cesium atom transition types corresponding to the plurality of peak sampling points. The plurality of peak sampling points include a first resonance absorption peak sampling point, a first cross-peak sampling point, a second resonance absorption peak sampling point, a second cross-peak sampling point, a third cross-peak sampling point, and a third resonance absorption peak sampling point arranged sequentially. Specifically, the first resonance absorption peak sampling point corresponds to a cesium atom resonance transition type from the ground state F=4 to the low excited state F′=3; the second resonance absorption peak sampling point corresponds to a cesium atom resonance transition type from the ground state F=4 to the middle excited state F′=4; and the third resonance absorption peak sampling point corresponds to a cesium atom resonance transition from the ground state F=4 to the high excited state F′=5. The types are as follows: the first cross-peak sampling point corresponds to the cesium atom cross-transition type where the cesium atom resonance peak from the ground state F=4 to the low level F′=3 of the excited state overlaps with the cesium atom resonance peak from the ground state F=4 to the middle level F′=4 of the excited state; the second cross-peak sampling point corresponds to the cesium atom cross-transition type where the cesium atom resonance peak from the ground state F=4 to the low level F′=3 of the excited state overlaps with the cesium atom resonance peak from the ground state F=4 to the high level F′=5 of the excited state overlaps with the cesium atom resonance peak; and the third cross-peak sampling point corresponds to the cesium atom cross-transition type where the cesium atom resonance peak from the ground state F=4 to the middle level F′=4 of the excited state overlaps with the cesium atom resonance peak from the ground state F=4 to the high level F′=5 of the excited state overlaps with the cesium atom cross-transition type. The target peak sampling point confirmation unit is communicatively connected to the transition type confirmation unit. It is used to select the corresponding target peak sampling point according to the demand type. If the demand is to excite cesium atoms to the excited state, the third resonance absorption peak sampling point is selected as the target peak sampling point; if the demand is to achieve large-scale detuning locking of cooling light in the magneto-optical trap, the third cross peak sampling point is selected as the target peak sampling point; if the demand is to make cesium atoms spontaneously radiate to the ground state F=3, the second resonance absorption peak sampling point is selected as the target peak sampling point.

9. A Rydberg atom preparation system, characterized in that, The system includes a laser wavelength locking device based on waveform feature analysis as described in any one of claims 1 to 8.

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