Geometric parameter controllable micro-nano single-flow channel structure and preparation method thereof
By using a micro/nano single-channel structure with controllable geometric parameters, and generating the channel centerline using a sinusoidal centerline and parameterized curves, the problem of difficulty in independently controlling curvature/torsion in existing technologies is solved. This enables single-variable comparative experiments, improves the comparability and processing consistency between samples, and supports the establishment of a standard sample library.
Patent Information
- Application Number
- CN202610302781.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-03-12
- Publication Date
- 2026-06-16
AI Technical Summary
In the existing technology of micro-nano manufacturing, the curvature/torsion is difficult to parameterize and control, making it difficult to systematically control the curvature/torsion as an independent adjustable variable. Furthermore, the curvature is strongly coupled with the channel length and width, making it difficult to achieve single-variable comparison.
Employing a micro/nano single-channel structure with controllable geometric parameters, the channel centerline is defined by a sinusoidal centerline and generated by a parametric curve. Combined with anodic bonding, direct bonding, thermocompression bonding, or adhesive encapsulation, independent control of curvature/torsion is achieved. Furthermore, through parametric layout generation and etching processes, decoupled control of curvature from length and width is ensured.
It realizes the systematic control of curvature as an independent and adjustable variable, meets the requirements of univariate comparative experiments, improves the comparability between samples and the causal credibility of the conclusions, reduces the influence of inter-slice drift, improves processing quality and batch consistency, and supports the establishment and large-scale preparation of standard sample libraries.
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