Single event upset error correction method, programmable system on a chip, and computer readable medium
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SHENZHEN PANGO MICROSYST CO LTD
- Filing Date
- 2026-03-05
- Publication Date
- 2026-06-23
AI Technical Summary
In existing technologies, soft failure correction schemes using programmable on-chip systems waste a lot of resources.
A single-particle flip error correction method is provided, which obtains error frame information through a data detection module, determines whether all configuration data needs to be transmitted based on the error type, and only transmits the target frame data for updating, thereby reducing resource consumption.
It reduces the resource consumption of transmitted data, improves the efficiency of single-event error correction, and adapts to different reliability requirements.
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Figure CN122261884A_ABST