Pole life assessment method and related apparatus

Abstract

The embodiment of the application provides a kind of pole life evaluation method and related device, it is related to battery technical field.The method comprises: extracting the life characteristic parameter of echo signal;Echo signal is the propagation reflection signal of pole to ultrasonic signal;Life characteristic parameter is used to carry out life evaluation to pole.The above-mentioned method, through the joint analysis and correction of initial wave signal and bottom wave signal amplitude, realizes the rapid detection of internal defect detection and life prediction of pole, solves the problems of insufficient internal defect identification precision, strong subjectivity of life evaluation and environmental interference sensitivity of traditional method, significantly improves the precision of lithium battery pole defect detection and the reliability of life evaluation.

Description

Technical Field

[0001] This application relates to the field of battery technology, and in particular to a method and related apparatus for evaluating the lifespan of terminals. Background Technology

[0002] As a key component connecting the battery cell to the external circuit, the electrode post must withstand complex conditions such as mechanical vibration, thermal cycling, and assembly stress over a long period of time. If there are defects such as impurities, pores, cracks, or delamination in its material, it is very easy to fail under external loads, which may lead to electrolyte leakage or even thermal runaway.

[0003] The current approach to detecting whether the terminal post has failed mainly relies on visual inspection or manual sampling, which makes it difficult to detect early defects within the material. While some non-destructive testing methods can identify the presence of anomalies, they cannot predict or assess the severity of defects or the risk of failure, making it difficult to meet the high safety requirements of power batteries. Summary of the Invention

[0004] This application provides a method and related apparatus for assessing electrode life, which can improve the accuracy and efficiency of electrode life assessment.

[0005] In a first aspect, embodiments of this application provide a method for evaluating pole life, including:

[0006] Lifetime characteristic parameters of the echo signal are extracted; the echo signal is the propagation and reflection signal of the ultrasonic signal by the pole.

[0007] The lifespan of the pole is assessed based on the lifespan characteristic parameters.

[0008] In some embodiments, the electrode post is fixed at a preset detection position by a fixing fixture, and the contact surface between the fixing fixture and the electrode post matches the shape of the electrode post.

[0009] In some embodiments, the lifetime characteristic parameters include the amplitude of the initial wave signal and the amplitude of the bottom wave signal, and the lifetime assessment of the pole based on the lifetime characteristic parameters includes:

[0010] The lifetime attenuation characteristic value of the pole is determined based on the difference between the amplitude of the initial wave signal and the amplitude of the bottom wave signal, and a preset first correction coefficient.

[0011] The lifespan of the pole is assessed based on the lifespan decay characteristic value.

[0012] In some embodiments, the method further includes:

[0013] The lifetime decay characteristic value is normalized to determine the lifetime status index of the electrode, and the lifetime status of the electrode is classified based on the lifetime status index.

[0014] And / or,

[0015] The lifespan degradation trend of the pole is evaluated based on the lifespan degradation characteristic value.

[0016] In some embodiments, the method further includes:

[0017] Obtain the material parameters of the electrode;

[0018] A second correction coefficient is determined based on the material parameters; the second correction coefficient is used to correct the influence of the material parameters on the echo signal.

[0019] The lifetime attenuation characteristic value of the pole is determined based on the second correction coefficient and the difference between the amplitude of the initial wave signal and the amplitude of the bottom wave signal.

[0020] In some embodiments, the method further includes:

[0021] Obtain the ambient temperature of the electrode surface or surrounding area;

[0022] A third correction factor is determined based on the ambient temperature; the third correction factor is used to correct the effect of the ambient temperature on the echo signal.

[0023] The lifetime attenuation characteristic value of the pole is determined based on the third correction coefficient and the difference between the amplitude of the initial wave signal and the amplitude of the bottom wave signal.

[0024] In some embodiments, the method further includes:

[0025] The coupling state between the pole and the fixed fixture is determined based on the amplitude of the initial wave signal.

[0026] A fourth correction factor is determined based on the coupling state; the fourth correction factor corrects the effect of the coupling state on the echo signal.

[0027] The lifetime attenuation characteristic value of the pole is determined based on the fourth correction coefficient and the difference between the amplitude of the initial wave signal and the amplitude of the bottom wave signal.

[0028] Secondly, embodiments of this application provide an electrode life assessment device, comprising:

[0029] The acquisition module is used to extract lifetime characteristic parameters of the echo signal; the echo signal is the propagation and reflection signal of the ultrasonic signal by the pole.

[0030] The processing module is used to perform a life assessment on the pole based on the life characteristic parameters.

[0031] Thirdly, embodiments of this application provide an electronic device, including a processor, a transceiver, and a memory; the processor is communicatively connected to both the transceiver and the memory.

[0032] The memory stores computer-executed instructions;

[0033] The transceiver communicates and interacts with external devices.

[0034] The processor executes computer execution instructions stored in the memory, causing the processor to perform the first aspect and / or various possible implementations of the first aspect as described above.

[0035] Fourthly, embodiments of this application provide a computer-readable storage medium storing computer-executable instructions, which, when executed by a processor, are used to implement the first aspect and / or various possible implementations of the first aspect.

[0036] Fifthly, embodiments of this application provide a computer program product, including a computer program that, when executed by a processor, implements the first aspect and / or various possible implementations of the first aspect.

[0037] The electrode life assessment method and related apparatus provided in this application extract life characteristic parameters from the echo signal; the echo signal is the propagation and reflection signal of the ultrasonic signal by the electrode; and the life of the electrode is assessed based on the life characteristic parameters. The above method, through joint analysis and correction of the amplitudes of the initial wave signal and the bottom wave signal, achieves rapid detection of internal defects and life prediction of the electrode, solving the problems of insufficient accuracy in internal defect identification, strong subjectivity in life assessment, and sensitivity to environmental interference in traditional methods, significantly improving the accuracy of lithium battery electrode defect detection and the reliability of life assessment. Attached Figure Description

[0038] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application.

[0039] Figure 1 A schematic diagram of the structure of an electrode life assessment device provided in this application embodiment;

[0040] Figure 2 This is a schematic flowchart of a pole life assessment method provided in this embodiment;

[0041] Figure 3This is a schematic diagram of amplitude difference and metallographic results provided in this embodiment of the application;

[0042] Figure 4 A schematic diagram of another pole life assessment device provided in this application;

[0043] Figure 5 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application.

[0044] The accompanying drawings illustrate specific embodiments of this application, which will be described in more detail below. These drawings and descriptions are not intended to limit the scope of the concept in any way, but rather to illustrate the concept of this application to those skilled in the art through reference to particular embodiments. Detailed Implementation

[0045] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numbers in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this application. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this application as detailed in the appended claims.

[0046] In the embodiments of this application, the terms "first" and "second" are used to distinguish identical or similar items with essentially the same function and effect, without limiting their order. Those skilled in the art will understand that the terms "first" and "second" do not limit the quantity or execution order, and that the terms "first" and "second" do not necessarily imply that they are different.

[0047] It should be noted that, in the embodiments of this application, the terms "exemplary" or "for example" are used to indicate examples, illustrations, or descriptions. Any embodiment or design scheme described as "exemplary" or "for example" in this application should not be construed as being more preferred or advantageous than other embodiments or design schemes. Specifically, the use of terms such as "exemplary" or "for example" is intended to present the relevant concepts in a specific manner.

[0048] With the rapid development of the new energy vehicle and energy storage industry, the safety requirements for batteries in vehicles and energy storage systems are constantly increasing.

[0049] A battery typically consists of a positive electrode, a negative electrode, a separator, an electrolyte, and a metal casing. The metal casing has positive and negative terminals for electrical connection. As a key component connecting the battery cell to the external circuit, the terminals must withstand vibration, shock, thermal stress, and assembly stress during long-term service. If there are defects such as impurities, pores, cracks, or delamination in the material, it is very easy for it to fail under external loads, which can lead to electrolyte leakage or even thermal runaway.

[0050] Currently, the detection technologies for electrode pins are mainly divided into the following three categories:

[0051] 1. Surface inspection technology: such as magnetic particle inspection and visual inspection, which judges defects by observing cracks or morphological changes on the surface of the pole, but has limited ability to detect internal defects (such as pores and microcracks).

[0052] 2. X-ray inspection: X-rays penetrate the electrode material and identify internal defects through imaging. However, it has problems such as expensive equipment, complicated operation, high radiation risk, and difficulty in quantifying the impact of defects on lifespan.

[0053] 3. AI Image Detection: Analyzes the defect features of the polar surface or depth map through deep learning models. However, due to limitations in sample diversity and model generalization ability, the accuracy of identifying complex internal defects is low, and it cannot predict the lifespan decay trend.

[0054] In addition, while some non-destructive testing methods can identify defects, they lack the ability to quantitatively assess the severity of defects and predict their lifespan.

[0055] To address the aforementioned issues, this application provides a method and related apparatus for assessing the lifespan of lithium battery terminals. Based on ultrasonic non-destructive testing technology, and through a multi-factor adaptive correction model and calculation of lifespan decay characteristic values, it enables accurate detection of internal defects in lithium battery terminals and graded assessment of their lifespan status. Specifically, it combines the physical characteristics of ultrasonic echo signals with terminal material and environmental parameters to form a dynamic correction mechanism, thereby achieving quantitative analysis of defects and prediction of lifespan trends.

[0056] The technical solution of this application and how the technical solution of this application solves the above-mentioned technical problems are described in detail below with specific embodiments. These specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described again in some embodiments. The embodiments of this application will now be described with reference to the accompanying drawings.

[0057] Figure 1 This is a schematic diagram of the structure of an electrode life assessment device provided in an embodiment of this application, as shown below. Figure 1 As shown, it includes a fixed fixture 1 and an pole post 2.

[0058] Fixture 1 is used to fix pole 2 at a preset detection position.

[0059] In some embodiments, the contact surface between the fixing fixture 1 and the pole post 2 matches the shape of the pole post 2. This ensures the consistency of the contact pressure and coupling state between the fixing fixture 1 and different pole posts 2.

[0060] For example, such as Figure 1As shown, when the pole post 2 is a cylindrical structure, the fixing fixture 1 is a wedge structure, and the contact surface of the wedge structure is arc-shaped to fit the cylindrical structure of the pole post 2.

[0061] In some embodiments, the ultrasonic probe can be positioned at the contact surface between the fixing fixture 1 and the electrode post 2. Since the contact surface between the fixing fixture 1 and the electrode post 2 matches the shape of the electrode post 2, the consistency of the contact pressure and coupling state between the ultrasonic probe and different electrode posts 2, as well as the consistency of the incident angle between the ultrasonic waves emitted by the ultrasonic probe and the electrode post, can be ensured. This reduces mechanical vibration and positional deviation during the detection process, thereby improving the accuracy and precision of electrode post life testing.

[0062] In some embodiments, when performing life testing on the electrode, the ultrasonic probe can emit an ultrasonic signal with a frequency of 5MHz to 20MHz to the electrode.

[0063] In some embodiments, the ultrasonic operating frequency is 12MHz~20MHz, thereby improving the detection capability of minute defects inside the electrode post, while avoiding the occurrence of detection failure due to excessive signal attenuation or deterioration of signal-to-noise ratio.

[0064] The ultrasonic signal emitted by the ultrasonic probe can form a starting wave signal on the upper surface where the ultrasonic probe contacts the electrode post. After the ultrasonic signal propagates inside the electrode post, it can form a bottom wave signal on the lower surface of the electrode post.

[0065] Based on the physical characteristics of ultrasonic wave propagation and reflection in solid materials, when ultrasonic waves propagate inside a battery terminal, if there are significant defects inside the terminal, the ultrasonic waves will form a stable bottom echo on the lower surface of the terminal. If there are defects such as impurities, pores, cracks, or delamination inside the terminal, reflection, scattering, or energy attenuation will occur at the defect interface, resulting in a decrease in the signal amplitude of the bottom echo and changes in the echo propagation time. Therefore, by emitting ultrasonic signals into the terminal and collecting the resulting initial wave and bottom wave signals, and analyzing the differences in the changes of the initial wave and bottom wave signals, it is possible to achieve quantitative analysis of terminal defects and prediction of lifespan trends.

[0066] Figure 1 Based on the illustrated embodiment, the following is combined with Figure 2 The electrode life assessment method provided in the embodiments of this application will be described in detail.

[0067] Figure 2 This is a flowchart illustrating a method for assessing electrode life provided in an embodiment of this application, as shown below. Figure 2 As shown, it includes:

[0068] S201. Extract the lifetime characteristic parameters of the echo signal; the echo signal is the propagation and reflection signal of the ultrasonic signal by the pole.

[0069] In some embodiments, the echo signal includes a starting signal and a bottom signal.

[0070] The lifetime characteristic parameters of the echo signal include the amplitude of the initial wave signal and the amplitude of the back wave signal. The amplitude of the initial wave signal reflects the coupling between the probe and the electrode post and the surface condition, while the amplitude of the back wave signal reflects the transmission and reflection capabilities of the internal structure of the electrode post for ultrasonic waves.

[0071] For example, after an ultrasonic probe emits an ultrasonic signal toward the electrode, it can receive the echo signal and send the echo signal to a host computer (such as an oscilloscope, data processing unit, processor, etc.).

[0072] After receiving the echo signal, the host computer can filter the echo signal to remove noise, and then perform waveform recognition to determine the initial wave signal and the bottom wave signal. For example, the first wave packet in the echo signal that exceeds the noise level (preset threshold) can be taken as the initial wave signal, and the second wave packet within a certain time period thereafter can be taken as the bottom wave signal.

[0073] After identifying the initial wave signal and the bottom wave signal, amplitude extraction can be performed on each signal to determine their amplitude values. For example, the maximum positive value or minimum negative value in the initial wave signal can be found and used as its amplitude. Alternatively, a Hilbert transform can be performed on the initial wave signal to obtain its envelope, and then the peak value of the envelope can be extracted as its amplitude. The method for extracting the amplitude of the bottom wave signal is similar to that for the initial wave signal and will not be elaborated here.

[0074] S202. Lifetime assessment of the pole based on lifetime characteristic parameters.

[0075] In some embodiments, after obtaining the amplitude of the initial wave signal and the amplitude of the bottom wave signal, the difference between the amplitude of the initial wave signal and the amplitude of the bottom wave signal can be analyzed to assess the lifespan of the pole.

[0076] In one possible implementation, a pre-trained neural network model or regression model can be used to analyze and process the amplitudes of the wave signal and the bottom wave signal to obtain the lifetime assessment result output by the model. For example, the model outputs the percentage of remaining lifetime, or whether the remaining lifetime is within the normal range, etc.

[0077] In one possible implementation: the lifetime attenuation characteristic value of the pole is determined based on the difference between the amplitude of the initial wave signal and the amplitude of the bottom wave signal, and a preset first correction coefficient; the lifetime of the pole is evaluated based on the lifetime attenuation characteristic value.

[0078] For example, the lifetime degradation characteristic value of the electrode post satisfies the following formula:

[0079]

[0080] Where S is the lifetime decay characteristic value, A is the amplitude of the initial wave signal, B is the amplitude of the bottom wave signal, and K0 is the first correction coefficient, which is used to correct for detection environment, coupling state and system error.

[0081] The above formula was established by conducting ultrasonic testing on a large number of normal samples and samples with different degrees of defects, and combining the results of metallographic analysis after physical cutting of the samples.

[0082] Through statistical regression analysis of a large amount of test data, the correction coefficient K0 is found to be between 0.8 and 0.9. For example, K0 is set to 0.85.

[0083] In some embodiments, after obtaining the lifetime decay characteristic value of the electrode, the lifetime of the electrode can be evaluated based on the relationship between the lifetime decay characteristic value of the electrode and a preset threshold.

[0084] For example, when S < 0.4, the electrode lifetime is in the low attenuation region, that is, the electrode lifetime is in good condition; when 0.4 ≤ S < 0.6, the electrode lifetime is in the medium attenuation region, that is, the electrode lifetime is average; when S ≥ 0.6, the electrode lifetime is in the high attenuation region, that is, the electrode lifetime is poor.

[0085] In practical production line applications, to improve detection efficiency, the determination relationship corresponding to the characteristic value S of electrode life decay can be:

[0086] When S < 0.4, the electrode is in a low attenuation state, and the system displays "OK";

[0087] When S≥0.4, the electrode is in a high attenuation state, and the system displays "NG".

[0088] It should be understood that the above thresholds can be adjusted based on actual needs or experience, and the embodiments of this application do not limit this.

[0089] Figure 3 This is a statistical fitting graph of the difference between the amplitude (A) of the initial wave signal and the amplitude (B) of the bottom wave signal of the pole and the metallographic results. The metallographic results of good samples are represented by the number 2, and the metallographic results of defective samples are represented by 1. When the difference between the amplitudes of A and B is greater than 0.4 (40%), the metallographic results correspond to defective products; when the difference between the amplitudes of A and B is less than 0.4 (40%), the metallographic results correspond to good products.

[0090] like Figure 3 As shown, without the correction factor K0, there was a misjudgment rate of approximately 5%. After introducing the correction factor K0, the misjudgment rate was reduced to less than 1%. By setting the correction factor K0, the accuracy of pole life assessment was effectively improved.

[0091] In some embodiments, due to the tiny size of the battery terminals, the propagation time of the ultrasonic signal inside the terminals is extremely short. Therefore, the echo propagation time can be disregarded in the terminal lifetime degradation characteristic value described above to obtain accurate detection results. If the size of the battery terminals changes, the echo propagation time can be incorporated into the determination of the terminal lifetime degradation characteristic value to further improve the accuracy of the terminal lifetime assessment results.

[0092] For example, the lifetime degradation characteristic value of the electrode post satisfies the following formula:

[0093]

[0094] Where T is the echo propagation time extracted from the echo signal. This refers to the echo propagation time of the standard sample.

[0095] The electrode lifetime assessment method provided in this application extracts lifetime characteristic parameters from the echo signal; the echo signal is the propagation and reflection signal of the ultrasonic signal by the electrode; and the lifetime of the electrode is assessed based on the lifetime characteristic parameters. This method, through joint analysis and correction of the amplitudes of the initial wave signal and the bottom wave signal, achieves rapid detection of internal defects and lifetime prediction of the electrode, solving the problems of insufficient accuracy in internal defect identification, strong subjectivity in lifetime assessment, and sensitivity to environmental interference in traditional methods. This significantly improves the accuracy of lithium battery electrode defect detection and the reliability of lifetime assessment.

[0096] In some embodiments, to further assess the lifespan of the electrode, trend analysis can be performed on the lifespan decay characteristic value S(t) obtained by the same electrode in multiple testing cycles to assess the failure trend of the electrode lifespan.

[0097] For example, the failure trend of the electrode lifetime can be evaluated using the following formula:

[0098]

[0099] Wherein, ΔS represents the lifetime decay rate, which is used to assess how fast the electrode's lifetime failure trend is.

[0100] If ΔS exceeds the preset decay rate during a certain detection cycle, it indicates that the electrode is undergoing accelerated degradation, which is an abnormal failure state. In this case, a warning message can be output to alert relevant users, thereby avoiding the risks caused by sudden electrode failure.

[0101] In some embodiments, to facilitate comparative analysis between different batches and models of poles, the pole lifetime decay characteristic value S can be normalized to construct a pole lifetime status index L(t), and the pole lifetime status can be graded based on the constructed pole lifetime status index L(t).

[0102] For example, the pole lifetime state index L(t) satisfies the following formula:

[0103]

[0104] Among them, S max This is the upper limit of the lifetime degradation characteristic value S obtained statistically in the failed pole sample, for example, S max =1.

[0105] After determining the pole lifetime status index L(t), the pole lifetime status can be classified according to the pole lifetime status index L(t) and preset index values. For example, it can be done in the following way:

[0106] When L(t)≥0.8, the pole lifetime state exhibits a low decay state, and the lifetime state is distributed in the healthy region.

[0107] When 0.6≤L(t)<0.8, the pole lifetime state exhibits a moderate decay state, and the lifetime state is distributed in the lifetime trend decreasing region.

[0108] When L(t) < 0.6, the pole lifetime state exhibits a high decay state, and the lifetime state is distributed in the failure risk zone.

[0109] It should be understood that the preset index values ​​can be values ​​determined based on actual experience or prior knowledge. In actual use, they can be adjusted according to needs, and this application embodiment does not limit this.

[0110] In some embodiments, different battery models may use terminals made of different materials during the battery manufacturing process. Because different materials have significant differences in parameters such as density, elastic modulus, and acoustic impedance, the amplitude of the ultrasonic echo signal obtained under the same detection parameters exhibits a systematic shift. If a uniform judgment method is used, it can easily lead to decreased detection accuracy or misjudgment.

[0111] Therefore, when calculating the lifetime attenuation characteristic value of the pole, the material parameters of the pole can also be obtained; a second correction coefficient is determined based on the material parameters; the second correction coefficient is used to correct the influence of the material parameters on the echo signal; and the lifetime attenuation characteristic value of the pole is determined based on the second correction coefficient and the difference between the amplitude of the initial wave signal and the amplitude of the bottom wave signal.

[0112] The material parameters of the pole may include the material acoustic impedance Z. m .

[0113] For example, before performing a life assessment on an electrode, the material type of the electrode can be read, and the corresponding material parameters can be retrieved from the database based on that material type. After obtaining the material parameters of the electrode, a correction factor can be determined based on the material parameters, the material parameters of the reference material, and the first correction factor.

[0114] For example, the second correction coefficient K m Satisfies the following formula:

[0115]

[0116] Among them, Z ref The acoustic impedance is used as a reference material.

[0117] Correspondingly, after introducing the second correction factor, the formula for calculating the lifetime decay characteristic value S of the pole is updated as follows:

[0118]

[0119] Among them, S m The characteristic value of the lifetime decay of the pole after introducing the second correction factor.

[0120] The lifetime degradation characteristic value of the electrode obtained after introducing the second correction coefficient can effectively eliminate the systematic amplitude difference caused by different materials, making the lifetime degradation characteristic values ​​of electrodes made of different materials comparable, thereby ensuring the comparability of lifetime assessment results. This significantly improves the universality and accuracy of the lifetime assessment model, avoids misjudgments caused by material differences, and provides a unified standard for cell sorting and safety assessment across material types.

[0121] In some embodiments, after introducing a second correction coefficient, to improve the efficiency of evaluating electrode life, the following determination method can be adopted during the testing process:

[0122] When S m When the value is less than 0.4, the system determines that the sample is in a normal state and displays "OK".

[0123] When S m When the value is ≥0.4, the system determines that the sample has abnormal lifespan or structural defects, and the system displays "NG".

[0124] In some embodiments, after introducing a second correction factor, to further assess the lifetime of the electrode, the lifetime decay characteristic values ​​S obtained at different time points for the same electrode can also be analyzed. m (t) Perform trend analysis to obtain the life decay rate of the poles related to the material.

[0125] For example, the lifetime decay rate ΔS of the electrode related to the material. mSatisfies the following formula:

[0126]

[0127] When ΔS m When the preset threshold is exceeded, the system will issue an early warning signal for the lifespan of the system.

[0128] In some embodiments, when assessing the lifespan of an electrode post, the ultrasonic testing results of the electrode post are easily affected by temperature fluctuations. To avoid decreased detection accuracy or misjudgment due to temperature changes, the ambient temperature of the electrode post surface or surrounding area can be obtained; a third correction coefficient is determined based on the ambient temperature; the third correction coefficient is used to correct the influence of ambient temperature on the echo signal; and the lifespan attenuation characteristic value of the electrode post is determined based on the third correction coefficient and the difference between the amplitude of the initial wave signal and the amplitude of the bottom wave signal.

[0129] For example, when performing ultrasonic testing on the electrode, the temperature of the electrode surface or surrounding environment can be collected simultaneously. Temperature collection methods include, but are not limited to, infrared temperature measurement modules, contact thermocouples, and internal temperature sensors of the equipment.

[0130] After obtaining the surface temperature of the pole or the surrounding environment, a third correction factor can be determined based on the ambient temperature and the reference temperature.

[0131] For example, the third correction factor K T Satisfies the following formula:

[0132]

[0133] Where β is the temperature sensitivity coefficient, the value of which is obtained through actual calibration; T is the current detection temperature; and T0 is the reference temperature.

[0134] In some embodiments, the temperature sensitivity coefficient β can be set according to the type of pole material to further improve the correction accuracy. After introducing the second and third correction coefficients, the lifetime decay characteristic value is updated as follows:

[0135]

[0136] Among them, S T The lifetime decay characteristic value after introducing the second and third correction factors.

[0137] In some embodiments, if only the effect of temperature on the evaluation results is considered, then the third correction factor K T Satisfies the following formula:

[0138]

[0139] Correspondingly, the lifetime decay characteristic value calculation is updated as follows:

[0140]

[0141] In some embodiments, fluctuations in the coupling state between the probe and the electrode can also affect the detection results when assessing the electrode's lifespan. Therefore, the coupling state between the electrode and the fixture can be determined based on the amplitude of the initial wave signal; a fourth correction coefficient can be determined based on the coupling state; the fourth correction coefficient corrects the influence of the coupling state on the echo signal; and the electrode's lifespan attenuation characteristic value can be determined based on the fourth correction coefficient and the difference between the amplitudes of the initial wave signal and the bottom wave signal.

[0142] For example, the coupling state C can satisfy the following formula:

[0143]

[0144] Where A is the amplitude of the initial wave signal of the current sample; A ref The initial signal amplitude reference value is set under standard coupling conditions. When C deviates from the preset range, the system determines that there is a coupling state fluctuation in the current detection.

[0145] The fourth correction factor can satisfy the following formula:

[0146]

[0147] In some embodiments, after introducing the second and fourth correction factors, the lifetime decay characteristic value is updated as follows:

[0148]

[0149] Among them, S C The lifetime decay characteristic value after introducing the second and fourth correction factors.

[0150] In some embodiments, if only the influence of coupling state on the evaluation result is considered, then the fourth correction coefficient K C Satisfies the following formula:

[0151]

[0152] Correspondingly, the lifetime decay characteristic value calculation is updated as follows:

[0153]

[0154] In summary, considering the influence of multiple factors, the calculation of the life decay eigenvalue can be performed as follows:

[0155] In some embodiments, if the effects of material, temperature, and coupling state are considered simultaneously, the lifetime decay characteristic value calculation is updated as follows:

[0156]

[0157] In some embodiments, if the effects of temperature and coupling state are considered simultaneously, the lifetime decay characteristic value is updated as follows:

[0158]

[0159] In some embodiments, if the effects of both material and coupling state are considered, the lifetime decay characteristic value is updated as follows:

[0160]

[0161] In some embodiments, if the effects of both material and temperature conditions are considered, the lifetime degradation characteristic value is updated as follows:

[0162]

[0163] In some embodiments, when considering the influence of multiple factors, the pole life trend can be determined in the following manner:

[0164] When S < 0.4, it is determined to be a low decay state.

[0165] When 0.4 ≤ S < 0.6, it is determined to be a moderate attenuation state.

[0166] When S≥0.6, it is determined to be a high attenuation state.

[0167] In some embodiments, the following conditions are met:

[0168] 1) KT exceeds the preset temperature correction range;

[0169] 2) KC exceeds the preset coupling correction range;

[0170] The system automatically marks the current test results as invalid data and prompts for retesting, thus avoiding interference from abnormal operating conditions on the life trend assessment results.

[0171] The electrode life assessment method provided in this application effectively distinguishes between minute defects (such as pores and impurities) and normal conditions within the electrode post through joint analysis of the initial and bottom wave amplitudes and multi-factor correction, reducing the false judgment rate. Based on dynamic correction of material properties, temperature, and coupling state, it achieves unified assessment of the life state of electrodes made of different materials, providing an objective basis for cell sorting and safety assessment. Through temperature sensitivity coefficient calibration and coupling state characterization parameter calculation, it eliminates the influence of environmental fluctuations on the test results, improving the stability of online testing on the production line. Through trend analysis of life decay rate, it identifies the performance degradation trend of the electrode post in advance, avoiding the risk of sudden failure. In summary, the technical solution of this application not only meets the high safety requirements of power batteries but can also be widely applied in energy storage systems, consumer electronics, and other fields, promoting the intelligent and precise development of battery non-destructive testing technology.

[0172] Based on the above embodiments, this application also provides a pole life assessment device.

[0173] Figure 4 This is a schematic diagram of the structure of an electrode life assessment device 40 provided in an embodiment of this application, as shown below. Figure 4 As shown, it includes:

[0174] The acquisition module 401 is used to extract the lifetime characteristic parameters of the echo signal; the echo signal is the propagation and reflection signal of the ultrasonic signal by the pole.

[0175] Processing module 402 is used to perform life assessment on the pole based on life characteristic parameters.

[0176] In some embodiments, the electrode post is fixed at a preset detection position by a fixing fixture, and the contact surface between the fixing fixture and the electrode post matches the shape of the electrode post.

[0177] In some embodiments, the lifetime characteristic parameters include the amplitude of the initial wave signal and the amplitude of the bottom wave signal; the processing module 402 is further configured to determine the lifetime decay characteristic value of the pole based on the difference between the amplitude of the initial wave signal and the amplitude of the bottom wave signal, and a preset first correction coefficient; and to perform a lifetime assessment on the pole based on the lifetime decay characteristic value.

[0178] In some embodiments, the processing module 402 is further configured to normalize the lifetime decay characteristic values, determine the lifetime status index of the electrode, and classify the lifetime status of the electrode based on the lifetime status index; and / or, evaluate the lifetime decay trend of the electrode based on the lifetime decay characteristic values.

[0179] In some embodiments, the processing module 402 is further configured to acquire the material parameters of the pole; determine a second correction coefficient based on the material parameters; the second correction coefficient is used to correct the influence of the material parameters on the echo signal; and determine the lifetime attenuation characteristic value of the pole based on the second correction coefficient and the difference between the amplitude of the initial wave signal and the amplitude of the bottom wave signal.

[0180] In some embodiments, the processing module 402 is further configured to acquire the ambient temperature of the electrode surface or surrounding area; determine a third correction coefficient based on the ambient temperature; the third correction coefficient is used to correct the influence of the ambient temperature on the echo signal; and determine the lifetime decay characteristic value of the electrode based on the third correction coefficient and the difference between the amplitude of the initial wave signal and the amplitude of the bottom wave signal.

[0181] In some embodiments, the processing module 402 is further configured to determine the coupling state between the pole and the fixed fixture based on the amplitude of the initial wave signal; determine a fourth correction coefficient based on the coupling state; the fourth correction coefficient is used to correct the influence of the coupling state on the echo signal; and determine the lifetime attenuation characteristic value of the pole based on the fourth correction coefficient and the difference between the amplitude of the initial wave signal and the amplitude of the bottom wave signal.

[0182] The electrode life assessment device provided in this embodiment can execute the method provided in any of the above embodiments of electrode life assessment method. The implementation principle and technical effect are similar, and will not be described in detail here.

[0183] This application also provides an electronic device.

[0184] Figure 5 This is a schematic diagram of the structure of the electronic device 50 provided in the embodiments of this application. The electronic device 50 can be a host computer as shown in any of the above embodiments, such as... Figure 5 As shown, the electronic device may include: a transceiver 501, a processor 502, and a memory 503.

[0185] Processor 502 executes computer execution instructions stored in memory, causing processor 502 to perform the scheme in the above embodiments. Processor 502 can be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it can also be a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components.

[0186] The memory 503 is connected to the processor 502 via the system bus and completes communication between them. The memory 503 is used to store computer program instructions.

[0187] Transceiver 501 can perform the functions of receiving and sending data and instructions.

[0188] Optionally, the electronic device 50 may also include a communication interface to communicate and interact with external or internal devices, such as client devices (e.g., mobile phones, tablets). In specific implementations, if the communication interface, memory 503, and processor 502 are implemented independently, they can be interconnected via a bus to complete communication with each other.

[0189] The system bus can be a Peripheral Component Interconnect (PCI) bus or an Extended Industry Standard Architecture (EISA) bus, etc. The system bus can be divided into address bus, data bus, control bus, etc. For ease of representation, only one thick line is used in the diagram, but this does not indicate that there is only one bus or one type of bus. Transceivers are used to enable communication between database access devices and other computers (e.g., clients, read-write libraries, and read-only libraries). Memory may include random access memory (RAM) and may also include non-volatile memory.

[0190] Optionally, in a specific implementation, if the communication interface, memory 503, and processor 502 are integrated on a single chip, then the communication interface, memory 503, and processor 502 can communicate through an internal interface.

[0191] This application also provides a chip for executing instructions, which is used to execute the technical solutions in the above embodiments.

[0192] This application also provides a computer-readable storage medium storing a computer program thereon. When the computer program is executed by a processor, it implements the technical solutions of the above embodiments. The implementation principle and technical effects are similar, and will not be repeated here.

[0193] In one possible implementation, a computer-readable medium may include random access memory (RAM), read-only memory (ROM), compact discread-only memory (CD-ROM) or other optical disc storage, disk storage or other magnetic storage devices, or any other medium targeted to carry or to store the required program code in the form of instructions or data structures, and accessible by a computer. Furthermore, any connection is appropriately referred to as a computer-readable medium. For example, if software is transmitted from a website, server, or other remote source using coaxial cable, fiber optic cable, twisted pair, Digital Subscriber Line (DSL), or wireless technologies such as infrared, radio, and microwave, then coaxial cable, fiber optic cable, twisted pair, DSL, or wireless technologies such as infrared, radio, and microwave are included in the definition of medium. As used herein, disks and optical discs include optical discs, laser discs, optical discs, Digital Versatile Discs (DVDs), floppy disks, and Blu-ray discs, where disks typically reproduce data magnetically, while optical discs optically reproduce data using lasers. Combinations of the above should also be included within the scope of computer-readable media.

[0194] This application also provides a computer program product, including a computer program that, when executed by a processor, implements the technical solutions of the above embodiments. Its implementation principle and technical effects are similar, and will not be repeated here.

[0195] In the specific implementation of the aforementioned terminal device or server, it should be understood that the processor can be a Central Processing Unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), etc. A general-purpose processor can be a microprocessor or any conventional processor. The steps of the method disclosed in the embodiments of this application can be directly manifested as execution by a hardware processor, or execution by a combination of hardware and software modules within the processor.

[0196] Those skilled in the art will understand that all or part of the steps in any of the above method embodiments can be implemented by hardware associated with program instructions. The aforementioned program can be stored in a computer-readable storage medium, and when the program is executed, all or part of the steps in the above method embodiments are performed.

[0197] If the technical solution of this application is implemented in software form and sold or used as a product, it can be stored in a computer-readable storage medium. Based on this understanding, all or part of the technical solution of this application can be embodied in the form of a software product, which is stored in a storage medium and includes a computer program or several instructions. This computer software product enables a computer device (which may be a personal computer, server, network device, or similar electronic device) to execute all or part of the steps of the methods in the embodiments of this application.

[0198] It should be noted that, for the sake of simplicity, the foregoing method embodiments are all described as a series of actions. However, those skilled in the art should understand that this application is not limited to the described order of actions, as some steps may be performed in other orders or simultaneously according to this application. Furthermore, those skilled in the art should also understand that the embodiments described in the specification are all optional embodiments, and the actions and modules involved are not necessarily essential to this application.

[0199] It should be further noted that although the steps in the flowchart are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowchart may include multiple sub-steps or multiple stages. These sub-steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these sub-steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the sub-steps or stages of other steps.

[0200] It should be understood that the above-described device embodiments are merely illustrative, and the device of this application can also be implemented in other ways. For example, the division of units / modules in the above embodiments is only a logical functional division, and there may be other division methods in actual implementation. For example, multiple units, modules, or components may be combined, or integrated into another system, or some features may be ignored or not executed.

[0201] Furthermore, unless otherwise specified, the functional units / modules in the various embodiments of this application can be integrated into one unit / module, or each unit / module can exist physically separately, or two or more units / modules can be integrated together. The integrated units / modules described above can be implemented in hardware or as software program modules.

[0202] When integrated units / modules are implemented in hardware, the hardware can be digital circuits, analog circuits, etc. The physical implementation of the hardware structure includes, but is not limited to, transistors, memristors, etc. Unless otherwise specified, the processor can be any suitable hardware processor, such as a CPU, GPU, FPGA, DSP, and ASIC, etc. Unless otherwise specified, the storage unit can be any suitable magnetic or magneto-optical storage medium, such as Resistive Random Access Memory (RRAM), Dynamic Random Access Memory (DRAM), Static Random Access Memory (SRAM), Enhanced Dynamic Random Access Memory (EDRAM), High-Bandwidth Memory (HBM), Hybrid Memory Cube (HMC), etc.

[0203] If the integrated unit / module is implemented as a software program module and sold or used as an independent product, it can be stored in a computer-readable storage device (CMD). Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a memory and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods of the various embodiments of this application. The aforementioned memory includes various media capable of storing program code, such as a USB flash drive, read-only memory (ROM), random access memory (RAM), portable hard drive, magnetic disk, or optical disk.

[0204] In the above embodiments, the descriptions of each embodiment have their own emphasis. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions of other embodiments. The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as the combination of these technical features does not contradict each other, it should be considered within the scope of this specification.

[0205] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

Claims

1. A method for evaluating the lifespan of an electrode post, characterized in that, include: Extract lifetime characteristic parameters of the echo signal; The echo signal is the propagation and reflection signal of the ultrasonic signal by the pole; The lifespan of the pole is assessed based on the lifespan characteristic parameters.

2. The method according to claim 1, characterized in that, The electrode post is fixed in a preset detection position by a fixing fixture, and the contact surface between the fixing fixture and the electrode post matches the shape of the electrode post.

3. The method according to claim 2, characterized in that, The lifetime characteristic parameters include the amplitude of the initial wave signal and the amplitude of the bottom wave signal. The lifetime assessment of the pole based on the lifetime characteristic parameters includes: The lifetime attenuation characteristic value of the pole is determined based on the difference between the amplitude of the initial wave signal and the amplitude of the bottom wave signal, and a preset first correction coefficient. The lifespan of the pole is assessed based on the lifespan decay characteristic value.

4. The method according to claim 3, characterized in that, The method further includes: The lifetime decay characteristic value is normalized to determine the lifetime status index of the electrode, and the lifetime status of the electrode is classified based on the lifetime status index. And / or, The lifespan degradation trend of the pole is evaluated based on the lifespan degradation characteristic value.

5. The method according to claim 3 or 4, characterized in that, The method further includes: Obtain the material parameters of the electrode; A second correction coefficient is determined based on the material parameters; the second correction coefficient is used to correct the influence of the material parameters on the echo signal. The lifetime attenuation characteristic value of the pole is determined based on the second correction coefficient and the difference between the amplitude of the initial wave signal and the amplitude of the bottom wave signal.

6. The method according to claim 3 or 4, characterized in that, The method further includes: Obtain the ambient temperature of the electrode surface or surrounding area; A third correction factor is determined based on the ambient temperature; the third correction factor is used to correct the effect of the ambient temperature on the echo signal. The lifetime attenuation characteristic value of the pole is determined based on the third correction coefficient and the difference between the amplitude of the initial wave signal and the amplitude of the bottom wave signal.

7. The method according to claim 3 or 4, characterized in that, The method further includes: The coupling state between the pole and the fixed fixture is determined based on the amplitude of the initial wave signal. A fourth correction coefficient is determined based on the coupling state; the fourth correction coefficient is used to correct the influence of the coupling state on the echo signal. The lifetime attenuation characteristic value of the pole is determined based on the fourth correction coefficient and the difference between the amplitude of the initial wave signal and the amplitude of the bottom wave signal.

8. An electronic device, characterized in that, include: The processor, transceiver, and memory are provided; the processor is communicatively connected to both the transceiver and the memory. The memory stores computer-executed instructions; The transceiver communicates and interacts with external devices. The processor executes computer execution instructions stored in the memory to implement the method as described in any one of claims 1-7.

9. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer-executable instructions, which, when executed by a processor, are used to implement the method as described in any one of claims 1-7.

10. A computer program product, characterized in that, Includes a computer program that, when executed by a processor, implements the method described in any one of claims 1-7.

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