Aging test device

Abstract

The utility model relates to the related technical field of aging tests, and provides an aging test device. The aging test device comprises a box body which is internally used for containing a sample; the xenon lamp assembly is arranged on the box body, and the xenon lamp assembly is used for irradiating the interior of the box body so as to carry out a xenon lamp aging experiment on the sample in the box body; the temperature and humidity device is communicated with the box body, and the temperature and humidity device is used for heating and / or humidifying the interior of the box body so as to carry out a temperature and humidity aging test on the sample in the box body; the pressurizing device is communicated with the box body, and the pressurizing device is used for pressurizing the interior of the box body so as to carry out a high-pressure aging experiment on the sample in the box body. Based on the improvement of the aging test device, after the aging test device has multiple aging test functions, the time can be shortened to the maximum extent, test samples do not need to be taken out of the box body, and adverse factors on the process are reduced to the minimum.

Description

Technical Field

[0001] The utility model relates to the technical field related to aging tests, in particular to an aging test device. Background Art

[0002] In the related technology, the existing aging test equipment generally has relatively single functions, such as only being able to perform a single xenon lamp aging test, a single high-voltage accelerated aging test, a single temperature and humidity aging test, etc., and the equipment has a low degree of automation. If multiple performance indicators are required, it will lead to a long measurement cycle, which is not conducive to the progress of the test. Utility Model Content

[0003] In view of this, the purpose of the present application is to provide an aging test device to solve the technical problems existing in the prior art that the aging test equipment has a single function and a low degree of automation, which leads to a long experimental cycle.

[0004] In order to achieve the above objectives, this application provides the following technical solutions:

[0005] The present application provides an aging test device, comprising:

[0006] A box body, the interior of which is used to hold samples;

[0007] A xenon lamp assembly, which is arranged on the box and used to irradiate the interior of the box so as to perform a xenon lamp aging experiment on the samples in the box;

[0008] A temperature and humidity device, the temperature and humidity device is connected to the box, and the temperature and humidity device is used to heat and / or humidify the inside of the box to perform a temperature and humidity aging test on the samples in the box;

[0009] A pressurizing device is connected to the box and is used to pressurize the interior of the box so as to perform a high-pressure aging test on the sample in the box.

[0010] According to some embodiments of the present application, the box body includes: a sample chamber, the sample chamber is used to hold samples,

[0011] The xenon lamp assembly comprises: a xenon lamp, and the xenon lamp is arranged on the top of the sample chamber.

[0012] According to some embodiments of the present application, the box further comprises: a xenon lamp accommodating chamber, which is arranged above the sample chamber and communicates with the sample chamber via a xenon lamp inlet and outlet opened on the top of the sample chamber,

[0013] The xenon lamp assembly further comprises: a lifting assembly for placing the xenon lamp in the xenon lamp accommodating chamber,

[0014] The lifting assembly is used to control the xenon lamp to extend into the sample chamber or retract into the xenon lamp accommodating chamber through the xenon lamp inlet and outlet.

[0015] According to some embodiments of the present application, the box further includes:

[0016] A partition is arranged at the inlet and outlet of the xenon lamp and is used to close the inlet and outlet of the xenon lamp to protect the xenon lamp after the xenon lamp is retracted into the xenon lamp accommodating chamber.

[0017] According to some embodiments of the present application, the box is provided with a pressure relief switch for releasing the internal pressure of the box to cooperate with the pressurizing device to carry out the high-pressure aging experiment.

[0018] According to some embodiments of the present application, a sample placement platform is provided in the box for placing samples.

[0019] According to some embodiments of the present application, the sample placement platform includes:

[0020] A carrier plate for placing samples;

[0021] The lifting and rotating assembly is used to control the lifting and / or rotation of the carrier plate.

[0022] According to some embodiments of the present application, the sample chamber comprises:

[0023] The main chamber body is provided with a sample taking and placing port;

[0024] A sealed door is arranged at the sample access port, and a glass window is provided on the sealed door, and the glass window is used to observe the sample.

[0025] According to some embodiments of the present application, a pull curtain corresponding to the glass window is provided on the inner side of the sealed door, and the pull curtain is used to cover the glass window when the xenon lamp aging test is performed.

[0026] According to some embodiments of the present application, a control panel is integrated on the sealed door for controlling the xenon lamp assembly, the pressurizing device and the temperature and humidity device.

[0027] In the above technical solution, an aging test device is provided, which can perform one or more of the various tests such as xenon lamp aging test, high voltage aging test and temperature and humidity aging test. Based on the improvement of the aging test device, after it has multiple aging test functions, the time can be shortened to the greatest extent, and the test samples do not need to be taken out of the box, so as to minimize the adverse factors to the process. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0029] Figure 1 is a cross-sectional view of an aging test device according to an exemplary embodiment;

[0030] Figure 2 is a schematic diagram of an aging test device according to an exemplary embodiment.

[0031] In the figure: 101, sample compartment; 1011, xenon lamp inlet and outlet; 1012, sealed door; 1013, rotary switch; 102, xenon lamp accommodating chamber; 103, partition; 20, temperature and humidity device; 30, pressurizing device; 301, pressure relief switch; 302, pressure gauge; 401, lifting assembly; 402, xenon lamp; 50, control panel; 601, lifting and rotating assembly; 602, carrier board. DETAILED DESCRIPTION

[0032] The present application is further described in detail below through the accompanying drawings and embodiments. Through these descriptions, the characteristics and advantages of the present application will become clearer and more specific.

[0033] The word "exemplary" is used exclusively herein to mean "serving as an example, embodiment, or illustration." Any embodiment described herein as "exemplary" is not necessarily to be construed as preferred or advantageous over other embodiments. Although various aspects of the embodiments are shown in the drawings, the drawings are not necessarily drawn to scale unless otherwise noted.

[0034] In addition, the technical features involved in different embodiments of the present application described below can be combined with each other as long as they do not conflict with each other.

[0035] In the related technology, the existing aging test equipment has relatively simple functions and can only perform a single aging test, and has a low degree of automation. If multiple performance indicators need to be obtained, the measurement cycle will be longer, which is not conducive to the progress of the test.

[0036] The present application provides an aging test device, which integrates a xenon lamp assembly, a pressurizing device, and a temperature and humidity device, so that one or more of a variety of tests such as a xenon lamp aging test, a high-voltage aging test, and a temperature and humidity aging test can be performed. Based on the improvement of the aging test device, after it has multiple aging test functions, the time can be shortened to the greatest extent, and the test sample does not need to be taken out of the box, so that the adverse factors to the process are minimized.

[0037] The technical solution of this embodiment is described in detail below in conjunction with the accompanying drawings. The following embodiments and implementation methods can be combined with each other if there is no conflict.

[0038] In an exemplary embodiment of the present utility model, an aging test device is provided, such as Figure 1-Figure 2 As shown, Figure 1 is a schematic diagram of an aging test device according to an exemplary embodiment. The aging test device includes:

[0039] A box body, the interior of which is used to hold samples;

[0040] A xenon lamp assembly is arranged on the box body and is used to irradiate the interior of the box body so as to perform a xenon lamp aging test on the samples in the box body;

[0041] A temperature and humidity device 20, which is connected to the box and is used to heat and / or humidify the inside of the box to perform a temperature and humidity aging test on the samples in the box;

[0042] The pressurizing device 30 is connected to the box body and is used to pressurize the inside of the box body so as to perform a high-pressure aging test on the samples in the box body.

[0043] In this exemplary embodiment, the box in the aging test device is improved, and a xenon lamp assembly, a pressurizing device 30, and a temperature and humidity device 20 are integrated thereon. When one or more of the various tests such as the xenon lamp aging test, the high-voltage aging test, and the temperature and humidity aging test are required, it is only necessary to make corresponding selections according to the needs. It should be noted that when multiple aging tests are required, the corresponding tests can be performed separately in sequence, or they can be performed simultaneously after selecting the corresponding functions. Based on the improvement of the aging test device, after it has multiple aging test functions, the time can be shortened to the greatest extent, and the test samples do not need to be taken out of the box, so as to minimize the adverse factors to the process.

[0044] In some exemplary embodiments, Figure 1-Figure 2 As shown, in this exemplary embodiment, the box body includes: a sample chamber 101 , which is used to hold samples. The xenon lamp assembly includes: a xenon lamp 402 , which is arranged on the top of the sample chamber 101 .

[0045] The xenon lamp 402 is arranged on the top of the sample chamber 101. When performing the xenon lamp aging test, the sample is first placed inside the sample chamber 101, and then the xenon lamp 402 is used to irradiate the sample from the top downward. It should be noted that the installation position of the xenon lamp 402 can be designed according to actual needs. For example, the xenon lamp 402 can also be arranged on the side wall of the sample chamber 101. In addition, the number of xenon lamps 402 can also be configured according to the shape and size of the sample chamber 101.

[0046] In some exemplary embodiments, Figure 1-Figure 2 As shown, considering that the aging test device can not only perform xenon lamp aging test, but also high-voltage aging test and temperature and humidity aging test, in order to prevent the xenon lamp 402 from affecting other aging tests inside the sample chamber 101 and ensure the safety of the xenon lamp 402, the installation position and control of the xenon lamp 402 can also be optimized. In this exemplary embodiment, the box also includes: a xenon lamp accommodating chamber 102, which is arranged above the sample chamber 101 and is connected to the sample chamber 101 through a xenon lamp inlet and outlet 1011 opened on the top of the sample chamber 101. Correspondingly, the xenon lamp assembly also includes: a lifting assembly 401, which is used to connect the xenon lamp 402 to the xenon lamp accommodating chamber 102. The lifting assembly 401 controls the xenon lamp 402 to extend into the sample chamber 101 or retract into the xenon lamp accommodating chamber 102 through the xenon lamp inlet and outlet 1011. In this way, when performing the temperature and humidity aging test, the xenon lamp 402 is retracted into the xenon lamp accommodating chamber 102 to avoid or reduce the influence of moisture and high temperature.

[0047] It should be noted that the xenon lamp accommodating chamber 102 is arranged above the sample chamber 101, which can be understood as: protruding from the top of the sample chamber 101, or semi-hidden (partially protruding from the top of the sample chamber 101). Of course, the xenon lamp accommodating chamber 102 can also be on the top side of the sample chamber 101. The specific design method can be determined in combination with the size and shape of the sample chamber 101, which will not be repeated here.

[0048] In some exemplary embodiments, Figure 1-Figure 2 As shown, considering that the sample compartment 101 and the xenon lamp accommodating chamber 102 are designed to be connected, in order to further prevent the safety of the xenon lamp 402 from being affected during the temperature and humidity test, the xenon lamp inlet and outlet 1011 can also be optimized. In this embodiment, the box body also includes: a partition 103, which is arranged at the xenon lamp inlet and outlet 1011, and is used to close the xenon lamp inlet and outlet 1011 to protect the xenon lamp 402 after the xenon lamp 402 is returned to the xenon lamp accommodating chamber 102.

[0049] In some exemplary embodiments, Figure 1-Figure 2 As shown, a pressure relief switch 301 is provided on the box body, which is used to release the internal pressure of the box body, so as to cooperate with the pressurizing device 30 to perform the high-pressure aging test. When the high-pressure aging test is performed, the pressure relief switch 301 is closed, and the pressurizing device 30 pressurizes the sample chamber 101. After the high-pressure aging test is completed, the pressure relief switch 301 is opened to release the pressure in the sample chamber 101.

[0050] It should be noted that when the pressure relief switch 301 is not provided, a pressurizing device 30 with a pressure relief function can be selected to pressurize the sample chamber 101 , and after the high-pressure aging test is completed, the pressurizing device 30 is used to relieve the pressure.

[0051] In some exemplary embodiments, Figure 1-Figure 2 As shown, a sample placement platform is provided in the box for placing samples.

[0052] Optionally, the sample placement platform includes: a carrier plate 602 for placing samples; and a lifting and rotating assembly 601 for controlling the lifting and / or rotation of the carrier plate 602 .

[0053] When conducting xenon lamp aging tests and temperature and humidity aging tests, the lifting and rotating assembly 601 inside the box can be used to control the lifting and rotation of the carrier 602, thereby achieving the lifting and rotation of the sample, so that the sample can be fully irradiated or exposed to the temperature and humidity environment, and the test results are more accurate.

[0054] In some exemplary embodiments, Figure 1-Figure 2 As shown, the sample chamber 101 includes: a main chamber body, which is provided with a sample access opening; a sealing door 1012, which is arranged at the sample access opening, and has a glass window on the sealing door 1012, which is used to observe the sample. Based on the glass window, it is convenient for the staff to observe the changes of the sample at any time.

[0055] To avoid light pollution caused by the light of the xenon lamp 402 passing through the glass window when the xenon lamp 402 irradiates the sample, a curtain can be set on the glass window. Optionally, a curtain corresponding to the glass window is set on the inner side of the sealed door 1012, and the curtain is used to cover the glass window during the xenon lamp aging test.

[0056] Furthermore, in order to improve the irradiation effect of the xenon lamp 402, a flexible material with a certain reflective effect can be selected to make the curtain.

[0057] In some exemplary embodiments, Figure 1-Figure 2 As shown, a control panel 50 is integrated on the sealed door 1012, which is used to control the xenon lamp assembly, the pressurizing device 30 and the temperature and humidity device 20. In this embodiment, a sealed door 1012 is correspondingly arranged on the outer wall of the sample chamber 101, and a control panel 50 is arranged on the sealed door 1012, which can adjust the temperature and humidity in the box and the xenon lamp 402. There is also a corresponding circular pressure gauge 302 device on the sealed door 1012, which can display the pressure in the box when the pressure aging test is performed. The sealed door 1012 adopts a flat opening method, that is, a rotary switch 1013 is arranged on one side of the sealed door 1012. An observation window is arranged on the upper part of the control panel 50, and the material of the observation window can be explosion-proof glass. When performing the pressure aging test and the temperature and humidity aging test, the changes of the sample can be observed at any time. There is a curtain inside the observation window, and the curtain can be pulled down when performing the xenon lamp aging test. When performing the xenon lamp aging test and the temperature and humidity aging test, the sample can be lifted and rotated through the lifting and rotating assembly 601 inside the box, so that the sample is fully contacted and the test result is more accurate.

[0058] The working process of the aging test device introduced in at least one embodiment above is described below.

[0059] 1: When doing the xenon lamp aging test, at the xenon lamp inlet and outlet 1011, first open the partition 103, the xenon lamp 402 enters the sample chamber 101 through the lifting assembly 401, then pull down the curtain, close the sealed door 1012 through the rotary switch 1013, and then turn on the xenon lamp 402 to perform the xenon lamp aging test. During the experiment, the movement of the sample is controlled by the lifting and rotating assembly 601 so that the sample is fully irradiated. After the xenon lamp aging test is completed, the xenon lamp 402 can be returned to the xenon lamp accommodating chamber 102 through the lifting assembly 401, and then the partition 103 is controlled to close.

[0060] 2: When conducting the temperature and humidity aging test, turn on the temperature and humidity device 20 to conduct the temperature and humidity test. Control the lifting and rotating assembly 601 to make the sample fully contact the temperature and humidity environment formed in the sample chamber 101. Adjust the temperature and humidity through the control panel 50, and observe the changes of the sample through the observation window.

[0061] 3: When conducting the high-pressure aging test, close the sealing door 1012 through the rotary switch 1013, pressurize the sample chamber 101 by controlling the pressurizing device 30, and observe the reading through the pressure gauge 302 on the sealing door 1012. When the requirements are met, stop pressurizing. After the high-pressure aging test is completed, release the pressure through the pressure relief switch 301.

[0062] In the description of the present application, it should be noted that the terms "upper", "lower", "inside", "outside", "front", "back", "left", "right", etc. indicate directions or positional relationships based on the directions or positional relationships in the working state of the present application. They are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific direction, be constructed and operated in a specific direction. Therefore, they should not be understood as limitations on the present application.

[0063] In the description of this application, it should be noted that, unless otherwise clearly specified and limited, the terms "install", "connect" and "connect" should be understood in a broad sense. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0064] The present application has been described above in conjunction with preferred embodiments, but these embodiments are only exemplary and serve only as an illustration. On this basis, various replacements and improvements may be made to the present application, all of which fall within the scope of protection of the present application.

Claims

1. An aging test device, characterized in that: include: A box body, the interior of which is used to hold samples; A xenon lamp assembly, which is arranged on the box and used to irradiate the interior of the box so as to perform a xenon lamp aging experiment on the samples in the box; A temperature and humidity device, the temperature and humidity device is connected to the box, and the temperature and humidity device is used to heat and / or humidify the inside of the box to perform a temperature and humidity aging test on the samples in the box; A pressurizing device is connected to the box and is used to pressurize the interior of the box so as to perform a high-pressure aging test on the sample in the box.

2. The aging test device according to claim 1, characterized in that: The box body comprises: a sample chamber, the sample chamber is used to hold samples, The xenon lamp assembly comprises: a xenon lamp, and the xenon lamp is arranged on the top of the sample chamber.

3. The aging test device according to claim 2, characterized in that: The box body further comprises: a xenon lamp accommodating chamber, which is arranged above the sample chamber and communicates with the sample chamber via a xenon lamp inlet and outlet opened on the top of the sample chamber. The xenon lamp assembly further comprises: a lifting assembly for placing the xenon lamp in the xenon lamp accommodating chamber, The lifting assembly is used to control the xenon lamp to extend into the sample chamber or retract into the xenon lamp accommodating chamber through the xenon lamp inlet and outlet.

4. The aging test device according to claim 3, characterized in that: The box also includes: A partition is arranged at the inlet and outlet of the xenon lamp and is used to close the inlet and outlet of the xenon lamp to protect the xenon lamp after the xenon lamp is retracted into the xenon lamp accommodating chamber.

5. The aging test device according to claim 1, characterized in that: The box body is provided with a pressure relief switch for releasing the internal pressure of the box body so as to cooperate with the pressurizing device to carry out the high-pressure aging experiment.

6. The aging test device according to claim 1, characterized in that: A sample placement platform is provided in the box for placing samples.

7. The aging test device according to claim 6, characterized in that: The sample placement platform comprises: A carrier plate for placing samples; The lifting and rotating assembly is used to control the lifting and / or rotation of the carrier plate.

8. The aging test device according to any one of claims 2 to 4, characterized in that: The sample chamber comprises: The main chamber body is provided with a sample taking and placing port; A sealed door is arranged at the sample access port, and a glass window is provided on the sealed door, and the glass window is used to observe the sample.

9. The aging test device according to claim 8, characterized in that: A pull curtain corresponding to the glass window is provided on the inner side of the sealed door, and the pull curtain is used to cover the glass window when the xenon lamp aging test is carried out.

10. The aging test device according to claim 8, characterized in that: The sealed door is integrated with a control panel for controlling the xenon lamp assembly, the pressurizing device and the temperature and humidity device.

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