Short-circuit protection circuit and test system
By designing a short circuit protection circuit, the logic unit and switching unit are used to detect the power pin status to prevent short circuits from occurring, the damage caused by metal debris during the test is solved, and the safety and reliability of the device and test configuration are achieved.
Patent Information
- Application Number
- CN202420774574.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-04-15
- Publication Date
- 2024-12-10
- Estimated Expiration
- 2034-04-15
AI Technical Summary
When testing semiconductor devices, short circuit problems caused by metal debris may occur due to the power pin and ground pin, resulting in damage to the device or test configuration.
A short circuit protection circuit is designed, including a test voltage input terminal, a resistor unit, a logic unit, a power supply voltage input terminal, a switching unit and a control unit. The logic unit detects the level status of the power pin and controls the switching unit to turn on or off. Turn on the supply voltage to prevent short circuits.
It effectively prevents short circuit problems of power pins caused by metal debris, protects the device and test configuration, and ensures the safety and reliability of the test process.
Smart Images
Figure CN222147161U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of protection circuits, in particular to a short-circuit protection circuit and a test system. Background Art
[0002] In the field of testing semiconductor devices, it is necessary to test whether there are any problems with the operation and performance of the product. Therefore, test boards and sockets are generally used for testing. However, when used to measure a large number of devices, some metal debris such as lead residues, metal burrs, etc. may exist in the socket or other places. If the power supply pin and the ground power supply pin of the device are short-circuited by these debris, even if the device is correctly inserted into the socket, it may cause damage to the device itself or the test configuration (test board, test socket, power supply). Utility Model Content
[0003] The utility model aims to overcome the problem that short circuit may occur when testing semiconductor devices, and provides a short circuit protection circuit and a testing system.
[0004] In order to achieve the above-mentioned object, the utility model provides a short-circuit protection circuit, comprising: a plurality of test voltage input terminals, a plurality of resistance units, a logic unit, a power supply voltage input terminal, a switch unit, a control unit and a plurality of power supply voltage input terminals; the control unit comprises a control subunit and a plurality of switch subunits, the first end of each switch subunit is respectively used to connect a corresponding power supply pin, and the second end of each switch subunit is respectively connected to a corresponding power supply voltage input terminal;
[0005] Each test voltage input terminal is used to provide a test voltage to a corresponding power pin through a corresponding resistor unit;
[0006] The logic unit has a plurality of input terminals, each of which is used to connect to a corresponding power pin, and outputs a first level when the inputs from the plurality of power pins to the logic unit are all high levels;
[0007] The switch unit is used for switching on the power supply voltage input terminal to supply power to the control subunit when the output of the logic unit is at the first level;
[0008] The control subunit is used to control the first end of the switch subunit and the second end of the switch subunit to be turned on when receiving power from the power supply voltage input terminal, so that multiple power supply voltage input terminals respectively supply power to corresponding power pins through corresponding switch subunits.
[0009] As an implementable embodiment, it also includes:
[0010] A jumper unit, wherein a first end of the jumper unit is connected to the power supply voltage input end, and a second end of the jumper unit is connected to the input end of the control subunit.
[0011] As an implementation method, the logic unit is an AND gate, and the multiple input ends of the AND gate serve as the multiple input ends of the logic unit, each input end of the AND gate corresponds to a power pin, the output end of the AND gate serves as the output end of the logic unit, and the output end of the AND gate is connected to the first input end of the switch unit.
[0012] As a possible implementation mode, the switch unit is a MOS tube, the gate of the MOS tube serves as the first input end of the switch unit, the gate of the MOS tube is connected to the output end of the logic unit, the drain of the MOS tube serves as the second input end of the switch unit, the drain of the MOS tube is connected to the power supply voltage input end, the source of the MOS tube serves as the output end of the switch unit, and the source of the MOS tube is connected to the input end of the control subunit; a diode is provided between the source and the drain of the MOS tube, the positive electrode of the diode is connected to the source of the MOS tube, and the negative electrode of the diode is connected to the drain of the MOS tube.
[0013] As an implementable embodiment, the control unit is a relay, the control subunit is an inductor, the first end of the inductor serves as the input end of the control subunit, and the second end of the inductor is connected to the ground end; the switch subunit is a normally open switch, and the normally open switch includes a common end, a normally open point, and a normally closed point. The common end of the switch subunit serves as the first end of the switch subunit, which is used to connect to the corresponding power pin, and the normally open point of the switch subunit serves as the second end of the switch subunit, which is used to connect to the corresponding power supply voltage input end.
[0014] As an implementable embodiment, each test voltage input terminal is directly connected to an input terminal of the logic unit through a corresponding resistor unit, so that each test voltage input terminal provides a test voltage to a corresponding power pin through a corresponding resistor unit.
[0015] As an implementation method, each test voltage input terminal is connected to the third end of a corresponding switch sub-unit through a corresponding resistor unit, and the first end of each switch sub-unit is connected to an input end of the logic unit. When the control sub-unit is not powered, the third end of the switch sub-unit is connected to the first end of the same switch sub-unit, so that each test voltage input terminal provides a test voltage to a corresponding power pin through a corresponding resistor unit.
[0016] Correspondingly, the utility model also provides a test system, including a socket and a test board, wherein the socket includes: a plurality of resistance units, a logic unit, and a switch unit; the test board includes a plurality of test voltage input terminals, a power supply voltage input terminal, a control unit, and a plurality of power supply voltage input terminals; the control unit includes a control subunit and a plurality of switch subunits, wherein the first end of each switch subunit is respectively used to connect to a corresponding power supply pin, and the second end of each switch subunit is respectively connected to a corresponding power supply voltage input terminal;
[0017] Each test voltage input terminal is used to provide a test voltage to a corresponding power pin through a corresponding resistor unit;
[0018] The logic unit has a plurality of input terminals, each of which is used to connect to a corresponding power pin, and outputs a first level when the inputs from the plurality of power pins to the logic unit are all high levels;
[0019] The switch unit is used for switching on the power supply voltage input terminal to supply power to the control subunit when the output of the logic unit is at the first level;
[0020] The control subunit is used to control the first end of the switch subunit and the second end of the switch subunit to be turned on when receiving power from the power supply voltage input terminal, so that multiple power supply voltage input terminals respectively supply power to corresponding power pins through corresponding switch subunits.
[0021] As an implementable embodiment, the test board further includes:
[0022] A jumper unit, wherein a first end of the jumper unit is connected to the power supply voltage input end, and a second end of the jumper unit is connected to the input end of the control subunit.
[0023] As an implementable embodiment, each test voltage input terminal is directly connected to an input terminal of the logic unit through a corresponding resistor unit, so that each test voltage input terminal provides a test voltage to a corresponding power pin through a corresponding resistor unit.
[0024] As an implementable embodiment, the socket is mounted on the test board.
[0025] Correspondingly, the utility model also provides a test system, including a socket and a test board, wherein the socket includes: a logic unit, a switch unit; the test board includes a plurality of test voltage input terminals, a plurality of resistance units, a power supply voltage input terminal, a control unit and a plurality of power supply voltage input terminals; the control unit includes a control subunit and a plurality of switch subunits, wherein the first end of each switch subunit is respectively used to connect a corresponding power supply pin, and the second end of each switch subunit is respectively connected to a corresponding power supply voltage input terminal;
[0026] Each test voltage input terminal is used to provide a test voltage to a corresponding power pin through a corresponding resistor unit;
[0027] The logic unit has a plurality of input terminals, each of which is used to connect to a corresponding power pin, and outputs a first level when the inputs from the plurality of power pins to the logic unit are all high levels;
[0028] The switch unit is used for switching on the power supply voltage input terminal to supply power to the control subunit when the output of the logic unit is at the first level;
[0029] The control subunit is used to control the first end of the switch subunit and the second end of the switch subunit to be turned on when receiving power from the power supply voltage input terminal, so that multiple power supply voltage input terminals respectively supply power to corresponding power pins through corresponding switch subunits.
[0030] As an implementable embodiment, the test board further includes:
[0031] A jumper unit, wherein a first end of the jumper unit is connected to the power supply voltage input end, and a second end of the jumper unit is connected to the input end of the control subunit.
[0032] As an implementation method, each test voltage input terminal is connected to the third end of a corresponding switch sub-unit through a corresponding resistor unit, and the first end of each switch sub-unit is connected to an input end of the logic unit. When the control sub-unit is not powered, the third end of the switch sub-unit is connected to the first end of the same switch sub-unit, so that each test voltage input terminal provides a test voltage to a corresponding power pin through a corresponding resistor unit.
[0033] As an implementable embodiment, the socket is mounted on the test board.
[0034] Beneficial effects of the utility model:
[0035] The utility model discloses a short-circuit protection circuit and a test system, comprising: a plurality of test voltage input terminals, a plurality of resistance units, a logic unit, a power supply voltage input terminal, a switch unit, a control unit and a plurality of power supply voltage input terminals; each test voltage input terminal provides a test voltage to a corresponding power supply pin through a corresponding resistance unit; when the outputs of the plurality of power supply pins are at a high level, the switch unit is turned on through the logic unit, and the power supply voltage input terminal supplies power to the control unit through the switch unit, so that the plurality of power supply voltage input terminals supplies power to the corresponding power supply pin through a corresponding switch sub-unit through the control unit, thereby preventing the problem of damage to the device and the test configuration caused by the short circuit problem of the power supply pin due to metal debris. BRIEF DESCRIPTION OF THE DRAWINGS
[0036] Figure 1-Figure 2 A schematic diagram of a short-circuit protection circuit provided in some embodiments of the utility model. DETAILED DESCRIPTION
[0037] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.
[0038] The technical terms or scientific terms used in this application should be understood by those skilled in the art in the ordinary sense. The terms "first", "second" and similar words used in the specification and claims of this application do not indicate any order, quantity or importance, but are only used to distinguish different components. Thus, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. It should be noted that the terms "including" and "having" and their variations involved in this application are intended to cover non-exclusive inclusions. In the description of the embodiments of the present application, unless otherwise stated, the meaning of "multiple" is two or more.
[0039] In this application document, unless otherwise clearly specified and limited, the terms "connected", "connection", etc. should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.
[0040] See also Figure 1 and Figure 2 Some embodiments of the utility model provide a short-circuit protection circuit, including: a plurality of test voltage input terminals S1, a plurality of resistor units R, a logic unit U, a power supply voltage input terminal VIN, a switch unit Q, a control unit K and a plurality of power supply voltage input terminals S2; the control unit K includes a control subunit L and a plurality of switch subunits SW, the first end of each switch subunit SW is respectively used to connect a corresponding power supply pin VDD, and the second end of each switch subunit SW is respectively connected to a corresponding power supply voltage input terminal S2; each test voltage input terminal VIN is used to provide a test voltage to a corresponding power supply pin VDD through a corresponding resistor unit R; The logic unit U has multiple input terminals, each of which is used to connect to a corresponding power pin VDD, and outputs a first level when the inputs of multiple power pins VDD to the logic unit U are all high levels; the switch unit Q is used to turn on the power supply voltage input terminal VIN to supply power to the control subunit L when the output of the logic unit U is the first level; the control subunit L is used to control the first terminal and the second terminal of the switch subunit SW to be turned on when the power supply voltage input terminal VIN is supplied, so as to realize that multiple power supply voltage input terminals S2 respectively supply power to the corresponding power pin VDD through the corresponding switch subunit SW.
[0041] Specifically, in the short-circuit protection circuit provided by the utility model, each test voltage input terminal S1 is used to provide a test voltage to a power pin VDD of the semiconductor device 100 through a corresponding resistor unit R; if the power pin VDD of the semiconductor device 100 is not short-circuited with the ground pin due to metal debris such as lead slag, metal burrs, etc., then multiple power pins VDD of the semiconductor device 100 will send a high level to the logic unit U, and the logic unit U is used to output a first level when the inputs of multiple power pins VDD to the logic unit U are all high levels; the switch unit Q is turned on based on the first level, and when the switch unit Q is turned on, the power voltage input terminal VIN starts to supply power to the control subunit L, so that the control subunit L can control the first end of the switch subunit SW and the second end of the switch subunit SW to be turned on, thereby realizing that multiple power supply voltage input terminals S2 respectively supply power to the corresponding power pins VDD. If at least one of the multiple power pins VDD of the semiconductor device 100 is short-circuited with the ground pin due to metal debris, at least one power pin VDD of the semiconductor device 100 will send a low level to the logic unit U, and the logic unit U outputs a second level. The switch unit Q remains in an off state based on the second level, and the control subunit L cannot obtain power from the power supply voltage input terminal VIN. The control subunit L cannot control the first end of the switch subunit SW and the second end of the switch subunit SW to be turned on. Then the first end of the switch subunit SW and the second end of the switch subunit SW are in a disconnected state, and multiple power supply voltage input terminals S2 cannot supply power to the corresponding power pins, thereby preventing the power supply voltage input terminal S2 from directly supplying power to the corresponding power pin VDD when a short circuit occurs in the power pin VDD of the semiconductor device, causing damage to the device itself or the test configuration (test board, test socket, power supply). Moreover, through the short-circuit protection circuit provided by the utility model, if during the process of the power supply voltage input terminal S2 supplying power to the corresponding power pin VDD, due to an unexpected short circuit problem caused during the test, one or more input terminals of the logic unit U are at a low level during the test, then the output of the logic unit U is also at a second level, thereby stopping the power supply voltage input terminal S2 from supplying power to the corresponding power pin VDD; thereby, the power pin status of the target semiconductor device can be monitored in real time.
[0042] For example, see Figure 1 and Figure 2 This is an example diagram for performing short-circuit protection and power supply on three power pins VDD of a semiconductor device. However, in other embodiments, a corresponding number of power pins VDD may be selected for short-circuit protection and power supply according to actual needs.
[0043] In some embodiments, the power pin VDD is a power pin VDD of the semiconductor device 100 .
[0044] In some embodiments, the voltage value of the voltage signal input by the test voltage input terminal VIN may be equal to or less than the voltage value of the voltage signal input by the power supply voltage input terminal S2. In some embodiments, the number of the test voltage input terminal S1, the resistor unit R, the power supply voltage input terminal S2 and the switch subunit SW is consistent.
[0045] In some embodiments, the plurality of test voltage input terminals S1 may be connected to the power voltage input terminal VIN, so that the plurality of test voltage input terminals S1 may draw power from the power voltage input terminal VIN.
[0046] In some embodiments, the first level is one of a high level and a low level, and the second level is the other of a high level and a low level. In the following text, the first level is understood as a high level and the second level is a low level.
[0047] In some embodiments, each test voltage input terminal S1 is respectively connected to one end of a corresponding resistor unit R, and the other end of each resistor unit R is respectively used to connect to a corresponding power pin VDD, each input terminal of the logic unit U is respectively connected to a corresponding power pin VDD, the output terminal of the logic unit U is connected to the first input terminal of the switch unit Q, the second input terminal of the switch unit Q is connected to the power voltage input terminal VIN, the output terminal of the switch unit Q is connected to the input terminal of the control subunit L, and the output terminal of the control subunit L is connected to the ground terminal.
[0048] In some embodiments, the resistor unit R is a pull-up resistor.
[0049] In some embodiments, the logic unit U is an AND gate, and multiple input terminals of the AND gate serve as multiple input terminals of the logic unit U. Each input terminal of the AND gate is respectively connected to a corresponding power supply pin VDD, and the output terminal of the AND gate serves as the output terminal of the logic unit U. The output terminal of the AND gate is connected to the first input terminal of the switch unit Q. When multiple input terminals of the AND gate are all high level inputs, the output terminal of the AND gate outputs a high level, and when at least one input terminal of the AND gate is low level input, the output terminal of the AND gate outputs a low level.
[0050] In some embodiments, the switch unit Q is a MOS tube, the gate of the MOS tube serves as the first input terminal of the switch unit Q, the gate of the MOS tube is connected to the output terminal of the logic unit U, the drain of the MOS tube serves as the second input terminal of the switch unit Q, the drain of the MOS tube is connected to the power supply voltage input terminal VIN, the source of the MOS tube serves as the output terminal of the switch unit Q, and the source of the MOS tube is connected to the input terminal of the control subunit L. A diode is provided between the source and drain of the MOS tube, the positive electrode of the diode is connected to the source of the MOS tube, and the negative electrode of the diode is connected to the drain of the MOS tube.
[0051] In some embodiments, the control unit K is a relay, the control subunit L is an inductor, the first end of the inductor serves as the input end of the control subunit L, the second end of the inductor is connected to the ground end, specifically connected to the ground end through a resistor, the switch subunit SW is a normally open switch, the normally open switch includes a common terminal COM, a normally open point NO and a normally closed point NC, the common terminal COM serves as the first end of the switch subunit SW, the common terminal COM is used to connect to the corresponding power pin VDD, the normally open point NO serves as the second end of the switch subunit SW, and the normally open point NO is connected to the corresponding power supply voltage input terminal S2. For example, see Figure 1 and Figure 2 It is a schematic diagram of three switch sub-units SW, the common terminal COM of each normally open switch is connected to a power pin VDD, and the normally open point NO of each normally open switch is connected to a power supply voltage input terminal V. When the inductor is not powered, the normally closed point of the normally open switch cannot be electromagnetically attracted, the common terminal COM of the normally open switch is connected to the normally closed point NC, and the power supply voltage input terminal S2 cannot supply power to the corresponding power pin VDD. When the inductor is powered, the normally closed point of the normally open switch is electromagnetically attracted, the common terminal COM of the normally open switch and the corresponding normally closed point NC are disconnected, the common terminal COM of the normally open switch and the corresponding normally open point NO are connected, and the power supply voltage input terminal S2 supplies power to the corresponding power pin VDD through the corresponding normally open switch.
[0052] In some embodiments, each test voltage input terminal S1 can be directly connected to an input terminal of the logic unit U through a corresponding resistor unit R, that is, one end of each resistor unit R is connected to a test voltage input terminal S1, and the other end of each resistor unit R can be directly connected to an input terminal of the logic unit U, thereby enabling the test voltage input terminal S1 to provide a test voltage to a corresponding power pin VDD through a corresponding resistor unit R.
[0053] In some embodiments, each test voltage input terminal S1 is respectively connected to the third end of the corresponding switch subunit SW through a corresponding resistor unit R, and the first end of each switch subunit SW is respectively connected to an input end of the logic unit U. When the control subunit L is not powered, the third end of the switch subunit SW is connected to the first end of the switch subunit SW, so that each test voltage input terminal S1 can be connected to an input end of the logic unit U through the corresponding resistor unit R and the corresponding switch subunit SW in sequence, so that each test voltage input terminal S1 provides a test voltage to a corresponding power pin VDD through a corresponding resistor unit R. In one embodiment, the third end of the switch subunit SW is the normally closed point NC of the normally open switch.
[0054] In some embodiments, the short-circuit protection circuit provided by the utility model further includes: a jumper unit J, a first end of the jumper unit J is connected to the power supply voltage input terminal VIN, and a second end of the jumper unit J is connected to the input terminal of the control subunit L. In some cases, the control subunit L can also obtain power from the power supply voltage input terminal VIN through the jumper unit J without passing through the logic unit U and the switch unit Q, so as to conduct the first end of the switch subunit SW and the second end of the switch subunit SW, thereby realizing that the power supply voltage input terminal S2 supplies power to the corresponding power pin VDD, which is applicable to various application scenarios.
[0055] Accordingly, see Figure 1The utility model also provides a test system, including a socket 200 and a test board 300, wherein the socket 200 includes: a plurality of resistor units R, a logic unit U, and a switch unit Q; the test board 300 includes a plurality of test voltage input terminals S1, a power supply voltage input terminal VIN, a control unit K, and a plurality of power supply voltage input terminals S2, wherein the control unit K includes a control subunit L and a plurality of switch subunits SW, wherein the first end of each switch subunit SW is respectively used to connect to a corresponding power supply pin VDD, and the second end of each switch subunit SW is respectively connected to a corresponding power supply voltage input terminal S2; each test voltage input terminal VIN is used to supply a corresponding power supply pin VDD to a corresponding power supply pin VDD through a corresponding resistor unit R. The source pin VDD provides a test voltage; the logic unit U has multiple input terminals, each of which is used to connect to a corresponding power pin VDD, and outputs a first level when the inputs of multiple power pins VDD to the logic unit U are all high levels; the switch unit Q is used to turn on the power supply voltage input terminal VIN to supply power to the control subunit L when the output of the logic unit U is the first level; the control subunit L is used to control the first terminal and the second terminal of the switch subunit SW to be turned on when the power supply voltage input terminal VIN is supplied, so as to realize that multiple power supply voltage input terminals S2 are respectively supplied with power to the corresponding power pin VDD through the corresponding switch subunit SW.
[0056] In some embodiments, the test board 300 further includes: a jumper unit J, a first end of the jumper unit J is connected to the power supply voltage input terminal VIN, and a second end of the jumper unit J is connected to the input terminal of the control subunit L. In some cases, the control subunit L can also obtain power from the power supply voltage input terminal VIN through the jumper unit J without the conduction of the logic unit U and the switch unit Q, so that the first end of the switch subunit SW and the second end of the switch subunit SW are turned on, and the power supply voltage input terminal S2 supplies power to the corresponding power pin VDD, which is applicable to various application scenarios.
[0057] In some embodiments, since the test voltage input terminal VIN and multiple resistor units R are arranged in the socket 200, each test voltage input terminal S1 can be directly connected to an input terminal of the logic unit U through a corresponding resistor unit R, that is, one end of each resistor unit R is connected to a test voltage input terminal S1, and the other end of each resistor unit R can be directly connected to an input terminal of the logic unit U, thereby realizing that the test voltage input terminal S1 provides a test voltage to a corresponding power pin VDD through a corresponding resistor unit R.
[0058] In some embodiments, the socket 200 and the test board 300 may be assembled together or may be two separate structures. In addition, it should be noted that for the relevant description of other units of the test system, please refer to the relevant description of the short-circuit protection circuit.
[0059] Accordingly, see Figure 2 The utility model also provides a test system, including a socket 200 and a test board 300, wherein the socket 200 includes: a logic unit U, a switch unit Q; the test board 300 includes a plurality of test voltage input terminals S1, a plurality of resistor units R, a power supply voltage input terminal VIN, a control unit K and a plurality of power supply voltage input terminals S2; the control unit K includes a control subunit L and a plurality of switch subunits SW, wherein the first end of each switch subunit SW is respectively used to connect a corresponding power supply pin VDD, and the second end of each switch subunit SW is respectively connected to a corresponding power supply voltage input terminal S2; each test voltage input terminal VIN is used to supply a corresponding power supply pin VDD to a corresponding power supply pin VDD through a corresponding resistor unit R. The source pin VDD provides a test voltage; the logic unit U has multiple input terminals, each of which is used to connect to a corresponding power pin VDD, and outputs a first level when the inputs of multiple power pins VDD to the logic unit U are all high levels; the switch unit Q is used to turn on the power supply voltage input terminal VIN to supply power to the control subunit L when the output of the logic unit U is the first level; the control subunit L is used to control the first terminal and the second terminal of the switch subunit SW to be turned on when the power supply voltage input terminal VIN is supplied, so as to realize that multiple power supply voltage input terminals S2 are respectively supplied with power to the corresponding power pin VDD through the corresponding switch subunit SW.
[0060] In some embodiments, the test board 300 further includes: a jumper unit J, a first end of the jumper unit J is connected to the power supply voltage input terminal VIN, and a second end of the jumper unit J is connected to the input terminal of the control subunit L. In some cases, the control subunit L can also obtain power from the power supply voltage input terminal VIN through the jumper unit J without the conduction of the logic unit U and the switch unit Q, so that the first end of the switch subunit SW and the second end of the switch subunit SW are turned on, and the power supply voltage input terminal S2 supplies power to the corresponding power pin VDD, which is applicable to various application scenarios.
[0061] In some embodiments, since the test voltage input terminal VIN and multiple resistor units R are arranged in the test board 300, each test voltage input terminal S1 is respectively connected to the third end of the corresponding switch subunit SW through a corresponding resistor unit R, and the first end of each switch subunit SW is respectively connected to an input end of the logic unit U. When the control subunit L is not powered, the third end of the switch subunit SW is connected to the first end of the switch subunit SW, so that each test voltage input terminal S1 can be connected to an input end of the logic unit U through the corresponding resistor unit R and the corresponding switch subunit SW in sequence, so that each test voltage input terminal S1 can provide a test voltage to a corresponding power pin VDD through a corresponding resistor unit R. In one embodiment, the third end of the switch subunit SW is the normally closed point NC of the normally open switch. In one embodiment, when the control unit K is a relay, the control subunit L is an inductor, and the switch subunit SW is a normally open switch, and the normally open switch includes a common terminal COM, a normally open point NO, and a normally closed point NC, then the third end of the switch subunit SW is the normally closed point NC of the normally open switch.
[0062] In some embodiments, the socket 200 and the test board 300 may be assembled together or may be two separate structures. In addition, it should be noted that for the relevant description of other units of the test system, please refer to the relevant description of the short-circuit protection circuit.
[0063] Although the utility model has been disclosed as above in the form of a preferred embodiment, it is not intended to limit the utility model. Any technical personnel in this field can make possible changes and modifications to the technical solution of the utility model by using the methods and technical contents disclosed above without departing from the spirit and scope of the utility model. Therefore, any simple modifications, equivalent changes and modifications made to the above embodiments based on the technical essence of the utility model without departing from the content of the technical solution of the utility model are within the protection scope of the technical solution of the utility model.
Claims
1. A short circuit protection circuit, characterized in that: include: A plurality of test voltage input terminals, a plurality of resistance units, a logic unit, a power supply voltage input terminal, a switch unit, a control unit and a plurality of power supply voltage input terminals; the control unit comprises a control subunit and a plurality of switch subunits, the first end of each switch subunit is respectively used to connect a corresponding power supply pin, and the second end of each switch subunit is respectively connected to a corresponding power supply voltage input terminal; Each test voltage input terminal is used to provide a test voltage to a corresponding power pin through a corresponding resistor unit; The logic unit has a plurality of input terminals, each of which is used to connect to a corresponding power pin, and outputs a first level when the inputs from the plurality of power pins to the logic unit are all high levels; The switch unit is used for switching on the power supply voltage input terminal to supply power to the control subunit when the output of the logic unit is at the first level; The control subunit is used to control the first end of the switch subunit and the second end of the switch subunit to be turned on when receiving power from the power supply voltage input terminal, so that multiple power supply voltage input terminals respectively supply power to corresponding power pins through corresponding switch subunits.
2. The short circuit protection circuit according to claim 1, characterized in that: Also includes: A jumper unit, wherein a first end of the jumper unit is connected to the power supply voltage input end, and a second end of the jumper unit is connected to the input end of the control subunit.
3. The short circuit protection circuit according to claim 1, characterized in that: The logic unit is an AND gate, and the multiple input ends of the AND gate serve as the multiple input ends of the logic unit. Each input end of the AND gate is respectively connected to a corresponding power pin, and the output end of the AND gate serves as the output end of the logic unit. The output end of the AND gate is connected to the first input end of the switch unit.
4. The short circuit protection circuit according to claim 1, characterized in that: The switch unit is a MOS tube, the gate of the MOS tube serves as the first input end of the switch unit, the gate of the MOS tube is connected to the output end of the logic unit, the drain of the MOS tube serves as the second input end of the switch unit, the drain of the MOS tube is connected to the power supply voltage input end, the source of the MOS tube serves as the output end of the switch unit, and the source of the MOS tube is connected to the input end of the control subunit; a diode is provided between the source and drain of the MOS tube, the positive electrode of the diode is connected to the source of the MOS tube, and the negative electrode of the diode is connected to the drain of the MOS tube.
5. The short circuit protection circuit according to claim 1, characterized in that: The control unit is a relay, the control subunit is an inductor, the first end of the inductor serves as the input end of the control subunit, and the second end of the inductor is connected to the ground end; the switch subunit is a normally open switch, and the normally open switch includes a common end, a normally open point, and a normally closed point. The common end of the switch subunit serves as the first end of the switch subunit, which is used to connect to the corresponding power pin, and the normally open point of the switch subunit serves as the second end of the switch subunit, which is used to connect to the corresponding power supply voltage input end.
6. The short circuit protection circuit according to claim 1, characterized in that: Each test voltage input terminal is directly connected to an input terminal of the logic unit through a corresponding resistor unit, so that each test voltage input terminal provides a test voltage to a corresponding power pin through a corresponding resistor unit.
7. The short circuit protection circuit according to claim 1, characterized in that: Each test voltage input terminal is connected to the third end of a corresponding switch sub-unit through a corresponding resistor unit, and the first end of each switch sub-unit is connected to an input end of the logic unit. When the control sub-unit is not powered, the third end of the switch sub-unit is connected to the first end of the same switch sub-unit, so that each test voltage input terminal provides a test voltage to a corresponding power pin through a corresponding resistor unit.
8. A testing system, characterized in that: It comprises a socket and a test board, wherein the socket comprises: a plurality of resistance units, a logic unit, and a switch unit; the test board comprises a plurality of test voltage input terminals, a power supply voltage input terminal, a control unit, and a plurality of power supply voltage input terminals; the control unit comprises a control subunit and a plurality of switch subunits, wherein the first end of each switch subunit is respectively used to connect to a corresponding power supply pin, and the second end of each switch subunit is respectively connected to a corresponding power supply voltage input terminal; Each test voltage input terminal is used to provide a test voltage to a corresponding power pin through a corresponding resistor unit; The logic unit has a plurality of input terminals, each of which is used to connect to a corresponding power pin, and outputs a first level when the inputs from the plurality of power pins to the logic unit are all high levels; The switch unit is used for switching on the power supply voltage input terminal to supply power to the control subunit when the output of the logic unit is at the first level; The control subunit is used to control the first end of the switch subunit and the second end of the switch subunit to be turned on when receiving power from the power supply voltage input terminal, so that multiple power supply voltage input terminals respectively supply power to corresponding power pins through corresponding switch subunits.
9. The test system according to claim 8, characterized in that: The test board also includes: A jumper unit, wherein a first end of the jumper unit is connected to the power supply voltage input end, and a second end of the jumper unit is connected to the input end of the control subunit.
10. The test system according to claim 8, characterized in that: Each test voltage input terminal is directly connected to an input terminal of the logic unit through a corresponding resistor unit, so that each test voltage input terminal provides a test voltage to a corresponding power pin through a corresponding resistor unit.
11. The test system according to claim 8, characterized in that: The socket is mounted on the test board.
12. A testing system, characterized in that: The invention comprises a socket and a test board, wherein the socket comprises: a logic unit and a switch unit; the test board comprises a plurality of test voltage input terminals, a plurality of resistance units, a power supply voltage input terminal, a control unit and a plurality of power supply voltage input terminals; the control unit comprises a control subunit and a plurality of switch subunits, wherein the first end of each switch subunit is respectively used to connect to a corresponding power supply pin, and the second end of each switch subunit is respectively connected to a corresponding power supply voltage input terminal; Each test voltage input terminal is used to provide a test voltage to a corresponding power pin through a corresponding resistor unit; The logic unit has a plurality of input terminals, each of which is used to connect to a corresponding power pin, and outputs a first level when the inputs from the plurality of power pins to the logic unit are all high levels; The switch unit is used for switching on the power supply voltage input terminal to supply power to the control subunit when the output of the logic unit is at the first level; The control subunit is used to control the first end of the switch subunit and the second end of the switch subunit to be turned on when receiving power from the power supply voltage input terminal, so that multiple power supply voltage input terminals respectively supply power to corresponding power pins through corresponding switch subunits.
13. The test system according to claim 12, characterized in that: The test board also includes: A jumper unit, wherein a first end of the jumper unit is connected to the power supply voltage input end, and a second end of the jumper unit is connected to the input end of the control subunit.
14. The test system according to claim 12, characterized in that: Each test voltage input terminal is connected to the third end of a corresponding switch sub-unit through a corresponding resistor unit, and the first end of each switch sub-unit is connected to an input end of the logic unit. When the control sub-unit is not powered, the third end of the switch sub-unit is connected to the first end of the same switch sub-unit, so that each test voltage input terminal provides a test voltage to a corresponding power pin through a corresponding resistor unit.
15. The test system according to claim 12, characterized in that: The socket is mounted on the test board.