COC test fixture

The COC test fixture addresses slow temperature control and scattered light issues by using lenses and TEC units to concentrate light beams and achieve uniform heating, enhancing testing efficiency and accuracy.

CN222188765UActive Publication Date: 2024-12-17ACCELINK TECHNOLOGIES CO LTD
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Patent Information

Application Number
CN202420077465.6
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-01-11
Publication Date
2024-12-17
Estimated Expiration
2034-01-11

AI Technical Summary

Technical Problem

Existing COC testing technologies face issues with slow temperature control speed, uneven temperature control, and low efficiency due to scattered light beams that cannot be fully coupled into optical fibers, leading to adverse effects such as energy loss, signal degradation, and test inaccuracies.

Method used

A COC test fixture equipped with lenses to concentrate light beams and thermoelectric cooler (TEC) units for precise temperature control, ensuring faster and uniform heating and alignment, thereby improving light coupling efficiency and test accuracy.

Benefits of technology

The fixture enhances light energy coupling efficiency, simplifies alignment, improves signal quality, and optimizes system performance by concentrating light beams and ensuring uniform temperature control, thus accelerating COC spectral testing.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to the field of optical devices, in particular to a COC test fixture, which comprises a COC fixture, a cover plate and a base, and is characterized in that the COC fixture is positioned between the cover plate and the base; a plurality of accommodating grooves are formed in the COC clamp, the accommodating grooves are used for accommodating COCs, a plurality of lenses are arranged on the two sides of the cover plate, and the lenses and the accommodating grooves are correspondingly arranged; a first TEC unit is arranged in the cover plate, a second TEC unit is arranged in the base, and the first TEC unit and the second TEC unit are used for heating the COC. The lens is arranged on the cover plate, so that the speed of coupling the light beam to the optical fiber is higher, and the positive effects of improving the light energy coupling efficiency, improving the signal quality, simplifying the alignment process, improving the test accuracy and optimizing the system performance are achieved; through temperature control of the first TEC unit in the cover plate and the second TEC unit on the base, the COC clamp can reach the test temperature more quickly, the temperature is more uniform, the temperature control speed and precision are improved, and the COC test efficiency is improved.
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Description

Technical Field

[0001] The utility model relates to the field of optical devices, in particular to a COC test fixture. Background Art

[0002] With the development of the optical communication industry, the requirements for the integration and speed of optical devices are getting higher and higher, and BOX packaging is becoming more and more common. The optical chip and substrate are assembled into a semi-finished optical device through eutectic and bonding processes, that is, a chip mounted on a carrier (Chip On Carrier, abbreviated as COC). COC can provide better electrical performance, higher integration, smaller size and lower cost, so it is widely used in communications, computers, consumer electronics and other fields.

[0003] COC needs to be packaged into BOX through processes such as mounting and coupling to become an optical device. Before COC packaging, a series of testing processes are required, including push-pull force testing and aging testing, to ensure that the optical device meets performance and reliability requirements. Since the substrate and chip size of COC are very small, the packaging and testing processes need to be carried out on a dedicated fixture. COC testing needs to be tested under certain temperature conditions, and the test content includes PIV (including optical power, threshold current, voltage), spectrum and other optical device parameters.

[0004] In the process of testing COC, it is necessary to couple the light beam generated by the optical device packaged in COC into the optical fiber for optical power analysis. In the coupling process, it is necessary to concentrate as much light generated by the optical device as possible and couple it into the optical fiber. The reasons are as follows: 1) Improve the efficiency of optical energy coupling: Concentrated light beams can effectively couple more light energy into the optical fiber, reduce the loss of light energy, and help improve the transmission efficiency and stability of optical signals. 2) Improve signal quality: Concentrated light beams can reduce the scattering and refraction of optical signals during transmission, thereby reducing noise and distortion, improving signal quality, and helping to obtain clearer and more accurate signals at the receiving end. 3) Simplify the alignment process: Concentrated light beams have a clear light intensity distribution and are easier to align with the optical fiber, which helps to simplify the alignment steps in the test process, reduce adjustment time, and improve test efficiency. 4) Improve test accuracy: Concentrated light beams can reduce the distortion of beam shape and intensity, thereby improving the accuracy and reliability of test data and helping to more accurately evaluate the performance of COC. 5) Optimize system performance: In practical applications, concentrated light beams can reduce the instability of optical fiber connections, thereby improving the performance and stability of the entire system and reducing the need for maintenance and troubleshooting.

[0005] However, in existing test equipment, the light beams generated by optical devices cannot be well concentrated, resulting in adverse effects such as light energy loss, signal quality degradation, increased alignment difficulty, affected system stability and test result errors.

[0006] In addition, during the COC testing process, the COC needs to be heated. The purpose of heating is usually to simulate the ambient temperature under actual working conditions and observe the performance of the COC at different temperatures. Specifically, the purpose of heating includes the following points: 1) Thermal stability test: By heating the COC to a certain temperature, observe whether its performance is stable to verify its reliability in a high temperature environment. 2) Thermal expansion coefficient measurement: Heating can help measure the thermal expansion coefficient of the COC material, which is a key parameter for understanding the dimensional stability of the material when the temperature changes. 3) Thermal stress analysis: Through the heating and cooling process, the thermal stress that the COC may encounter in actual applications can be simulated, and its ability to resist thermal stress can be evaluated. 4) Optoelectronic device performance evaluation: The performance of some optoelectronic devices may be affected by temperature. By heating, the performance of the COC-packaged optoelectronic devices at different temperatures can be evaluated, such as luminous efficiency, response speed, etc. 5) Thermal aging test: Long-term high temperature environment may cause COC material aging. By heating for aging test, the performance degradation of COC after long-term use can be predicted.

[0007] In the prior art, electric heating, hot air heating, infrared heating or microwave heating are usually used, but the above heating methods all have problems such as uneven heating or require special equipment and safety measures.

[0008] Therefore, in summary, the problems existing in the existing COC testing technology include: slow temperature control speed and uneven temperature control; and because the light generated by the optical device is relatively scattered and cannot be fully coupled into the optical fiber, resulting in low efficiency of COC testing.

[0009] In view of this, how to overcome the defects of the prior art and solve the above-mentioned technical problems is a difficult problem to be solved in this technical field. Utility Model Content

[0010] The utility model aims to overcome the problems in the existing COC testing technology of slow temperature control speed, uneven temperature control, and low efficiency of COC testing due to the fact that the light generated by the optical device is relatively scattered and cannot be fully coupled into the optical fiber.

[0011] The utility model is achieved in this way:

[0012] The utility model provides a COC test fixture, comprising: a COC fixture 1, a cover plate 2 and a base 3, wherein the COC fixture 1 is located between the cover plate 2 and the base 3;

[0013] The COC fixture 1 is provided with a plurality of receiving grooves 10, and the receiving grooves 10 are used to receive the COC. A plurality of lenses 20 are provided on both sides of the cover plate 2, and the lenses 20 are provided corresponding to the receiving grooves 10;

[0014] A first TEC unit 21 is disposed inside the cover plate 2 , and a second TEC unit 30 is disposed inside the base 3 . The first TEC unit 21 and the second TEC unit 30 are used to heat the COC.

[0015] Preferably, the base 3 is provided with a first groove 31 , and the COC fixture 1 is located in the first groove 31 .

[0016] Preferably, at least two limiting columns 310 are provided on the base 3, and the limiting columns 310 are provided in the first groove 31; the cover plate 2 is provided with a first through hole 22 corresponding to the limiting column 310, and the COC fixture 1 is provided with a second through hole 11 corresponding to the limiting column 310;

[0017] When the number of the limiting posts 310 is 2, the limiting posts 310 are diagonally arranged in the first groove 31 .

[0018] Preferably, a first fixing column 311 is provided on the base 3 , and the first fixing column 311 is used to fix the COC clamp 1 . A third through hole 12 is provided on the COC clamp 1 , and the third through hole 12 is provided corresponding to the first fixing column 311 .

[0019] Preferably, first bosses 32 are respectively provided on both sides of the base 3 , the first bosses 32 are located on both sides of the first groove 31 , and first probes 320 are provided on the first bosses 32 , and the first probes 320 are coupled to the circuit inside the cover plate 2 .

[0020] Preferably, second fixing columns 23 are respectively provided on both sides of the cover plate 2 , and the second fixing columns 23 are used to fix the cover plate 2 and the base 3 ; fourth through holes 321 are provided on the first boss 32 , and the fourth through holes 321 are correspondingly provided to the second fixing columns 23 .

[0021] Preferably, a plurality of second probes 24 are disposed on the inner side of the cover plate 2 , and the second probes 24 are disposed corresponding to the receiving grooves 10 , and the second probes 24 are used to power the COC.

[0022] Preferably, a second boss 25 is provided on the lower surface of the cover plate 2, and the second boss 25 is coupled with the first groove 31. A recess 250 is provided on the second boss 25, and a first plane 251 is formed between the recess 250 and the surface of the second boss 25. The second probe 24 for energizing the COC is provided on the first plane 251.

[0023] Preferably, third bosses 252 are respectively disposed on both sides of the first plane 251, and the second probe 24 is disposed between the third bosses 252 and the sink 250;

[0024] The third boss 252 is provided with a notch 2520 , and the notch 2520 is used for mounting the lens 20 .

[0025] Preferably, the distance between the inner sides of the two third bosses 252 matches the width of the COC fixture 1 .

[0026] Compared with the prior art, the beneficial effects of the utility model are: first, by installing a lens 20 on the cover plate 2, the light beam emitted by the COC packaged optical device is converged, the energy of the light beam is concentrated, and the speed of coupling the light beam to the optical fiber is faster, which has a positive effect on improving the light energy coupling efficiency, improving signal quality, simplifying the alignment process, improving test accuracy and optimizing system performance, thereby increasing the speed of COC spectral testing.

[0027] Secondly, by controlling the temperature through the first thermoelectric cooler (TEC) unit in the cover plate 2 and the second TEC unit 30 in the base 3, the COC fixture 1 can reach the test temperature faster, make the temperature more uniform, improve the temperature control speed and accuracy, and improve the efficiency of the COC test. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] In order to more clearly illustrate the embodiments of the utility model or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0029] Figure 1 A schematic diagram of the overall structure of a COC test fixture provided by an embodiment of the utility model;

[0030] Figure 2 An exploded diagram of a COC test fixture provided in an embodiment of the utility model;

[0031] Figure 3A cross-sectional view of a COC test fixture provided in an embodiment of the utility model;

[0032] Figure 4 A schematic diagram of a COC fixture and a base of a COC test fixture provided by an embodiment of the utility model;

[0033] Figure 5 A schematic diagram of a first through hole of a cover plate of a COC test fixture provided by an embodiment of the utility model;

[0034] Figure 6 A schematic diagram of a second probe of a COC test fixture provided by an embodiment of the utility model;

[0035] Figure 7 A schematic diagram of a base of a COC test fixture provided in an embodiment of the utility model;

[0036] Figure 8 A schematic diagram of a cover plate of a COC test fixture provided in an embodiment of the utility model.

[0037] Wherein, the accompanying drawings are marked as follows:

[0038] 1-COC fixture, 10-accommodating groove, 11-second through hole, 12-third through hole, 2-cover plate, 20-lens, 21-first TEC unit, 22-first through hole, 23-second fixing column, 24-second probe, 25-second boss, 250-sinking groove, 251-first plane, 252-third boss, 2520-notch, 253-second plane, 26-first thermistor, 3-base, 30-second TEC unit, 31-first groove, 310-limiting column, 311-first fixing column, 32-first boss, 320-first probe, 321-fourth through hole, 33-second thermistor. DETAILED DESCRIPTION

[0039] In the description of the present invention, the terms "inside", "outside", "longitudinal", "lateral", "upper", "lower", "top", "bottom" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings. They are only for the convenience of describing the present invention and do not require that the present invention must be constructed and operated in a specific orientation. Therefore, they should not be understood as limitations on the present invention.

[0040] The terms "first", "second", etc. in this utility model are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, features defined as "first", "second", etc. may explicitly or implicitly include one or more of the features. In the description of this utility model, unless otherwise specified, "plurality" means two or more.

[0041] In the present invention, unless otherwise specified or limited, the term "connection" should be understood in a broad sense. For example, "connection" can be a fixed connection, a detachable connection, or an integral connection; it can be a direct connection or an indirect connection through an intermediate medium. In addition, the term "coupling" can be a way of achieving electrical connection for signal transmission.

[0042] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments of the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0043] The present invention provides a COC test fixture. Figure 1 and Figure 2 As shown, it comprises: a COC fixture 1, a cover plate 2 and a base 3, wherein the COC fixture 1 is located between the cover plate 2 and the base 3; the COC fixture 1 is provided with a plurality of receiving grooves 10, wherein the receiving grooves 10 are used to receive COC, and a plurality of lenses 20 are provided on both sides of the cover plate 2, wherein the lenses 20 are provided corresponding to the receiving grooves 10. In one embodiment, as Figure 2 As shown, the receiving grooves 10 are arranged on both sides of the upper surface of the base 3, and lenses 20 are arranged at positions corresponding to each receiving groove 10 on the cover plate 2. The receiving grooves 10 accommodate the COC to be tested, and the light beam emitted by the optical device packaged by the COC is coupled into the core of the optical fiber through the corresponding lens 20. Since the lens 20 is a convex lens, it has the function of converging the light beam, and the divergence angle of the light beam is reduced, so the energy of the light beam can be concentrated, thereby improving the coupling efficiency of the light energy.

[0044] like Figure 3 As shown, a first TEC unit 21 is disposed inside the cover plate 2, and a second TEC unit 30 is disposed inside the base 3. The first TEC unit 21 and the second TEC unit 30 are used to heat the COC. In one embodiment, the first TEC unit 21 and the second TEC unit 30 also work in cooperation with the thermistor. In the circuit inside the cover plate 2 where the first TEC unit 21 is located, a first thermistor 26 is disposed; in the circuit inside the base 3 where the second TEC unit 30 is located, a second thermistor 33 is disposed. The first thermistor 26 and the second thermistor 33 sense the temperature of the test fixture. When the thermistor senses that the temperature is lower than a preset value, the first TEC unit 21 and the second TEC unit 30 heat the test fixture.

[0045] The implementation provided by the utility model has at least the following effects:

[0046] On the one hand, by installing a lens 20 on the cover plate 2, the light beam emitted by the COC packaged optical device is converged, the energy of the light beam is concentrated, and the light beam is coupled to the optical fiber faster, which has a positive effect on improving the light energy coupling efficiency, improving signal quality, simplifying the alignment process, improving test accuracy and optimizing system performance, thereby increasing the speed of COC spectrum testing.

[0047] Secondly, the temperature is controlled by the first TEC unit 21 in the cover plate 2 and the second TEC unit 30 in the base 3, so that the COC fixture 1 reaches the test temperature faster, the temperature is made more uniform, the temperature control speed and accuracy are improved, and the efficiency of the COC test is improved.

[0048] In order to fully illustrate the solution provided by the present invention, the details of the above structures will be further described below.

[0049] During the COC test, the positioning accuracy of the COC fixture 1 determines the alignment accuracy between the COC and the lens 20. Figure 4 As shown, the base 3 is provided with a first groove 31, and the COC fixture 1 is located in the first groove 31. In order to further ensure the stability of the COC fixture 1 in the first groove 31, at least two limiting columns 310 are provided on the base 3, and the limiting columns 310 are arranged in the first groove 31; Figure 5 , the cover plate 2 is provided with a first through hole 22 corresponding to the limiting column 310, and the COC fixture 1 is provided with a second through hole 11 corresponding to the limiting column 310. When assembling the test fixture, the COC fixture 1 is sleeved on the limiting column 310 through the second through hole 11, and then the cover plate 2 is sleeved on the limiting column 310 through the first through hole 22, so that the lens 20 on the cover plate 2 is aligned with the receiving groove 10. In addition, as Figure 6 As shown, a plurality of second probes 24 are arranged on the inner side of the cover plate 2, and the second probes 24 are arranged corresponding to the receiving groove 10, and the second probes 24 are used to power the COC. Therefore, the cover plate 2 and the COC fixture 1 are both sleeved on the limiting column 310, which also ensures the accuracy of the alignment of the second probes 24 with the receiving groove 10, so that the COC fixture 1 and the second probes 24 can be accurately matched together.

[0050] In one embodiment, see Figure 4As shown, when the number of the limiting posts 310 is 2, the limiting posts 310 are diagonally arranged in the first groove 31. Similarly, the number of the limiting posts 310 can also be 3 or 4, distributed at the four corners of the first groove 31. The purpose of preferably having 2 diagonally arranged limiting posts 310 is that it can achieve the expected limiting effect, save the material cost of the test fixture, reduce the overall weight of the test fixture, and play a positive role in lightweighting the equipment.

[0051] In order to further ensure the stability of the COC fixture 1, in one embodiment, continue to refer to Figure 4 The base 3 is provided with a first fixing column 311, and the first fixing column 311 is used to fix the COC fixture 1. The COC fixture 1 is provided with a third through hole 12, and the third through hole 12 is provided corresponding to the first fixing column 311. The height of the first fixing column 311 is equal to the thickness of the COC fixture 1.

[0052] like Figure 7 As shown, the base 3 forms a first boss 32 on both sides of the first groove 31, and the function of the first boss 32 is to cooperate with the limiting column 310 to fix the cover plate 2. Specifically, the first boss 32 is respectively provided on both sides of the base 3, and the first boss 32 is located on both sides of the first groove 31; in one embodiment, a first probe 320 is provided on the first boss 32, and the first probe 320 is coupled with the circuit inside the cover plate 2. Among them, the first probe 320 is connected to an external power supply to power the circuit inside the first cover plate 2. In addition to using the first probe 320 to power the circuit of the cover plate 2, since the cover plate 2 is an independent component, the cover plate 2 can also be independently connected to an external power supply to power the circuit inside the cover plate 2. In the preferred solution, the reason for selecting the first probe 320 connected to the base 3 to power the circuit inside the cover plate 2 is that the first probe 320 can share the same power supply with the circuit of the base 3. When the power supply of the external environment is limited, it is more convenient for the circuit on the cover plate 2 to share the power supply with the circuit on the base 3.

[0053] In order to firmly fix the cover plate 2 and the base 3, as Figure 7 and Figure 8 As shown, the cover plate 2 is provided with second fixing columns 23 on both sides, and the second fixing columns 23 are used to fix the cover plate 2 and the base 3; the first boss 32 is provided with a fourth through hole 321, and the fourth through hole 321 is provided corresponding to the second fixing column 23. In one embodiment, four second fixing columns 23 are respectively provided on the first boss 32 to ensure the reliability of fixing, and the number of the second fixing columns 23 can be set according to the design requirements, and is not limited in this embodiment.

[0054] In order to better install the second probe 24 and the lens 20, as Figure 8 As shown, a second boss 25 is provided on the lower surface of the cover plate 2, and the second boss 25 is coupled with the first groove 31. A recess 250 is provided on the second boss 25, and a first plane 251 is formed between the recess 250 and the surface of the second boss 25. The second probe 24 for energizing the COC is provided on the first plane 251.

[0055] During the COC test, the light-emitting surface of the optical device is located on a vertical plane, and the optical device emits a light beam into the optical fiber through the lens 20. Therefore, in order to facilitate the installation of the lens 20, third bosses 252 are respectively provided on both sides of the first plane 251, and the second probe 24 is provided between the third boss 252 and the sink 250; a notch 2520 is provided on the third boss 252, and the notch 2520 is used to install the lens 20. Among them, the inner wall of the lens 20 and the inner wall of the third boss 252 are located on the same horizontal plane, and in order to make the lens 20 and the light-emitting part of the optical device fit better, the distance between the inner sides of the two third bosses 252 matches the width of the COC fixture 1.

[0056] In addition, in order to prevent light other than the optical device from being coupled into the optical fiber, second planes 253 are respectively arranged on both sides perpendicular to the first plane 251. The second plane 253 and the first plane 251 form a groove 250. The second plane 253 is used to close the groove 250 to play a light shielding role.

[0057] In one embodiment, the COC test fixture provided by the present invention is also used in conjunction with system software for testing. In summary, the process of the COC test can be as follows:

[0058] 1. Place the COC into the receiving groove 10 on the COC fixture 1, install the COC fixture 1 on the base 3, place the cover plate 2 on the COC fixture 1 and connect it to the base 3 below.

[0059] 2. Open the test system software interface, set the test parameters, and start the test.

[0060] 3. The temperature control system works to control the temperature of the second TEC unit 30 in the base 3 and the first TEC unit 21 in the cover plate 2, and controls the test temperature to be stable at 45±0.1°C. After the temperature reaches the requirement, it is maintained for 3 minutes to ensure that the COC is heated evenly.

[0061] 4. Test COC photoelectric indicators, including threshold current, optical power, forward voltage drop and other indicators.

[0062] 5. Test spectrum, and realize the coupling of COC beam and optical fiber jumper by controlling the movement of multimode optical fiber. COC beam is converged by lens 20 on cover plate 2 and coupled to optical fiber jumper. The beam enters the spectrometer, and the spectrometer starts spectrum test.

[0063] 6. After the COC is tested, the test process for the next COC on COC fixture 1 begins.

[0064] 7. All COC test processes on COC fixture 1 are completed, and the system prompts that the test is over.

[0065] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A COC test fixture, characterized in that: include: A COC clamp (1), a cover plate (2) and a base (3), wherein the COC clamp (1) is located between the cover plate (2) and the base (3); The COC fixture (1) is provided with a plurality of receiving grooves (10), the receiving grooves (10) being used to receive the COC, and a plurality of lenses (20) are provided on both sides of the cover plate (2), the lenses (20) being arranged corresponding to the receiving grooves (10); A first TEC unit (21) is arranged inside the cover plate (2), and a second TEC unit (30) is arranged inside the base (3), wherein the first TEC unit (21) and the second TEC unit (30) are used to heat the COC.

2. The COC test fixture according to claim 1, characterized in that: The base (3) is provided with a first groove (31), and the COC clamp (1) is located in the first groove (31).

3. The COC test fixture according to claim 2, characterized in that: The base (3) is provided with at least two limiting columns (310), and the limiting columns (310) are arranged in the first groove (31); the cover plate (2) is provided with a first through hole (22) corresponding to the limiting column (310), and the COC clamp (1) is provided with a second through hole (11) corresponding to the limiting column (310); When the number of the limiting posts (310) is 2, the limiting posts (310) are diagonally arranged in the first groove (31).

4. The COC test fixture according to claim 2, characterized in that: The base (3) is provided with a first fixing column (311), the first fixing column (311) being used to fix the COC clamp (1), the COC clamp (1) is provided with a third through hole (12), the third through hole (12) being arranged corresponding to the first fixing column (311).

5. The COC test fixture according to claim 2, characterized in that: First bosses (32) are respectively arranged on both sides of the base (3), the first bosses (32) are located on both sides of the first groove (31), and first probes (320) are arranged on the first bosses (32), and the first probes (320) are coupled to the circuit inside the cover plate (2).

6. The COC test fixture according to claim 5, characterized in that: Second fixing columns (23) are respectively arranged on both sides of the cover plate (2), and the second fixing columns (23) are used to fix the cover plate (2) and the base (3); a fourth through hole (321) is arranged on the first boss (32), and the fourth through hole (321) is arranged corresponding to the second fixing column (23).

7. The COC test fixture according to claim 1, characterized in that: A plurality of second probes (24) are arranged on the inner side of the cover plate (2), the second probes (24) are arranged corresponding to the receiving grooves (10), and the second probes (24) are used to power the COC.

8. The COC test fixture according to claim 2, characterized in that: The lower surface of the cover plate (2) is provided with a second boss (25), the second boss (25) is coupled with the first groove (31), a recess (250) is provided on the second boss (25), a first plane (251) is formed between the recess (250) and the surface of the second boss (25), and a second probe (24) for energizing the COC is provided on the first plane (251).

9. The COC test fixture according to claim 8, characterized in that: A third boss (252) is respectively arranged on both sides of the first plane (251), and the second probe (24) is arranged between the third boss (252) and the sink (250); The third boss (252) is provided with a notch (2520), and the notch (2520) is used for mounting a lens (20).

10. The COC test fixture according to claim 9, characterized in that: The distance between the inner sides of the two third bosses (252) matches the width of the COC clamp (1).