Chip testing and sorting device

Abstract

The utility model discloses a chip testing and sorting device, which belongs to the technical field of chip testing and comprises a supporting table and a first connecting plate mounted on the supporting table, a hydraulic telescopic rod mounted on the first connecting plate, a clamping frame mounted at the output end of the hydraulic telescopic rod, and a motor mounted on the supporting table. A placing plate is mounted at the output end of the motor, a first supporting leg is mounted on the first connecting plate, a top plate is arranged on the first supporting leg, a first connecting rod is mounted on the top plate, and a detector is mounted at the bottom of the first connecting rod. According to the utility model, the hydraulic telescopic rod is arranged, and the hydraulic telescopic rod is started to drive the clamping frame to move so as to clamp the chip on the placing plate, so that the chip can be prevented from deviating during testing to influence the testing effect.

Description

Technical Field

[0001] The utility model relates to a chip test, in particular to a chip test sorting device, belonging to the technical field of chip testing. Background Art

[0002] Chips are a way of miniaturizing circuits. Using a certain process, the transistors, resistors, capacitors, inductors and other components and wiring required in a circuit are interconnected and made on a small piece or several small pieces of semiconductor wafers or dielectric substrates. They are then packaged in a tube shell to become a miniature structure with the required circuit function. When chips are produced, their appearance quality must be tested to sort out finished chips and defective chips.

[0003] However, the existing chip testing and sorting devices cannot conveniently clamp and position the chips during actual use, which causes the chips to move during testing, thereby affecting the accuracy of chip test data. Utility Model Content

[0004] The main purpose of the utility model is to solve the problem that it is not convenient to clamp and position the chip, and to provide a chip testing and sorting device.

[0005] The purpose of the utility model can be achieved by adopting the following technical solutions:

[0006] A chip testing and sorting device comprises a support table and a first connecting plate installed on the support table, a hydraulic telescopic rod installed on the first connecting plate, a clamping frame installed on the output end of the hydraulic telescopic rod, a motor installed on the support table, a placement plate installed on the output end of the motor, a first supporting leg installed on the first connecting plate, a top plate arranged on the first supporting leg, a first connecting rod installed on the top plate, a detector installed on the bottom of the first connecting rod, a second connecting plate installed on the support table, an indicator light installed on the second connecting plate, a first storage box arranged below the support table, and a second collection box arranged on one side of the support table.

[0007] Preferably, a second connecting rod is installed on one side of the clamping frame, a second slider is installed on the second connecting rod, a second sliding groove cooperating with the second slider is opened on the second connecting plate, the second slider is a T-shaped slider, and the second sliding groove is a T-shaped sliding groove.

[0008] Preferably, a rotating block is installed on the placement plate, a rotating groove cooperating with the rotating block is provided on the support platform, a plurality of rotating cavities are provided on the rotating block, and balls are rotatably installed inside the rotating cavities.

[0009] Preferably, a second supporting leg is installed at the bottom of the support platform, a bottom plate is installed at the bottom of the second supporting leg, the first storage box is slidably installed on the bottom plate, a first handle is installed on the first storage box, and a first anti-slip pad is installed on the first handle.

[0010] Preferably, a first sliding block is installed at the bottom of the first storage box, a first sliding groove cooperating with the first sliding block is provided on the bottom plate, the first sliding block is a T-shaped sliding block, and the first sliding groove is a T-shaped sliding groove.

[0011] Preferably, a third connecting rod is installed on one side of the support platform, a connecting block is installed on the third connecting rod, a third connecting plate is installed on the second collecting box, an insert block is installed on the bottom of the third connecting plate, and a slot that cooperates with the insert block is opened on the connecting block.

[0012] Preferably, a plurality of partitions are installed inside the second collecting box, a plurality of second handles are installed on the second collecting box, and a second anti-slip pad is installed on the second handles.

[0013] Beneficial technical effects of the utility model:

[0014] 1. According to the chip testing and sorting device of the present invention, a hydraulic telescopic rod is provided, and the hydraulic telescopic rod is started to drive the clamping frame to move so as to clamp the chip on the placement board, thereby preventing the chip from being offset during the test and affecting the test effect.

[0015] 2. By setting a motor, the motor starts to drive the placement plate to rotate, so that unqualified chips can be transported to the first storage box, and the unqualified chips are stored and placed. By setting a second collection box, qualified chips can be easily stored. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a schematic diagram of the overall structure of the utility model;

[0017] Figure 2 This is a schematic diagram of the structure of the second slider of the utility model;

[0018] Figure 3 This is a schematic diagram of the rotating block structure of the utility model;

[0019] Figure 4 This is a schematic diagram of the first slider structure of the utility model;

[0020] Figure 5 This is a schematic diagram of the structure of the first collection box of the utility model;

[0021] Figure 6 This is a schematic diagram of the plug-in structure of the utility model.

[0022] In the figure: 1. support table; 2. first connecting plate; 3. first supporting leg; 4. top plate; 5. first connecting rod; 6. detector; 7. indicator light; 8. second connecting plate; 9. hydraulic telescopic rod; 10. second connecting rod; 11. placement plate; 12. motor; 13. second supporting leg; 14. bottom plate; 15. first storage box; 16. first slider; 17. first handle; 18. third connecting rod; 19. connecting block; 20. second collection box; 21. second handle; 22. partition; 23. third connecting plate; 24. clamping frame; 25. second slider; 26. rotating block; 27. ball bearing; 28. plug block. DETAILED DESCRIPTION

[0023] In order to make the technical solution of the present invention more clear and specific to those skilled in the art, the present invention is further described in detail below in conjunction with embodiments and drawings, but the implementation methods of the present invention are not limited thereto.

[0024] like Figure 1-Figure 6 As shown, the chip testing and sorting device provided in this embodiment includes a support table 1 and a first connecting plate 2 installed on the support table 1, a hydraulic telescopic rod 9 is installed on the first connecting plate 2, and a clamping frame 24 is installed at the output end of the hydraulic telescopic rod 9, a motor 12 is installed on the support table 1, and a placement plate 11 is installed at the output end of the motor 12, a first supporting leg 3 is installed on the first connecting plate 2, a top plate 4 is provided on the first supporting leg 3, a first connecting rod 5 is installed on the top plate 4, and a detector 6 is installed at the bottom of the first connecting rod 5, a second connecting plate 8 is installed on the support table 1, and the second connecting plate 8 An indicator light 7 is installed on it, a first storage box 15 is arranged under the support platform 1, and a second collection box 20 is arranged on one side of the support platform 1. By arranging a hydraulic telescopic rod 9, the hydraulic telescopic rod 9 is started to drive the clamping frame 24 to move so as to clamp the chip on the placement plate 11, so as to avoid the chip from shifting during the test and affecting the test effect. By arranging a motor 12, the motor 12 is started to drive the placement plate 11 to rotate so as to transport the unqualified chips to the first storage box 15, and the unqualified chips are stored and placed. By arranging the second collection box 20, it is convenient to store qualified chips.

[0025] In this embodiment, if Figure 1 and Figure 2 As shown, a second connecting rod 10 is installed on one side of the clamping frame 24, and a second slider 25 is installed on the second connecting rod 10. A second sliding groove that cooperates with the second slider 25 is opened on the second connecting plate 8. The second slider 25 is a T-shaped slider, and the second sliding groove is a T-shaped sliding groove. By setting the second slider 25 and the second sliding groove in sliding connection, the clamping frame 24 can be guided and limited.

[0026] In this embodiment, if Figure 1 , Figure 3 , Figure 4 and Figure 5 As shown, a rotating block 26 is installed on the placement plate 11, a rotating groove that cooperates with the rotating block 26 is opened on the support table 1, a plurality of rotating cavities are opened on the rotating block 26, and a ball 27 is rotatably installed inside the rotating cavity. By setting the rotating block 26 and the rotating groove to be rotatably connected, the placement plate 11 can be rotated on the support table 1 and the chip can be transported to the first storage box 15. By setting the ball 27, the friction force of the rotating block 26 can be reduced. A second supporting leg 13 is installed at the bottom of the support table 1, and a bottom plate 14 is installed at the bottom of the second supporting leg 13. A first storage box 15 is slidably installed on the bottom plate 14, a first handle 17 is installed on the first storage box 15, and a first handle 17 is installed on the first handle 17. A non-slip pad can support the support platform 1 by setting the second support leg 13, and can facilitate pulling and carrying the first storage box 15 by setting the first handle 17. The friction of the first handle 17 can be increased by setting the first non-slip pad. A first slider 16 is installed at the bottom of the first storage box 15, and a first slide groove that cooperates with the first slider 16 is opened on the bottom plate 14. The first slider 16 is a T-shaped slider, and the first slide groove is a T-shaped slide groove. By setting the first slider 16 to be slidably connected with the first slide groove, it is convenient to disassemble the first storage box 15 that is full of collection, and by setting the first slider 16 to be a T-shaped slider that cooperates with the T-shaped slide groove, the first storage box 15 can be guided and limited.

[0027] In this embodiment, if Figure 1 and Figure 6 As shown, a third connecting rod 18 is installed on one side of the support platform 1, and a connecting block 19 is installed on the third connecting rod 18. A third connecting plate 23 is installed on the second collection box 20, and an insert block 28 is installed on the bottom of the third connecting plate 23. A slot that cooperates with the insert block 28 is opened on the connecting block 19. The insert block 28 is connected to the slot by setting the insert block 28 to engage with the slot, and the second collection box 20 is pulled. The insert block 28 is pulled out of the slot and the full second collection box 20 can be disassembled. By setting the partition 22, the chips in the second collection box 20 can be separated and placed to avoid collision and damage between qualified chips. A plurality of partitions 22 are installed inside the second collection box 20, and a plurality of second handles 21 are installed on the second collection box 20. A second anti-slip pad is installed on the second handle 21. By setting the second handle 21, the second collection box 20 can be easily carried, and the friction of the second handle 21 can be increased by setting the second anti-slip pad.

[0028] In this embodiment, if Figure 1-Figure 6 As shown, the working process of a chip testing and sorting device provided in this embodiment is as follows:

[0029] Step 1: Place the chip on the placement plate 11, start the hydraulic telescopic rod 9 to drive the clamping frame 24 to move and clamp the chip, start the first connecting rod 5 to test the chip, after the test is completed, the indicator light 7 shows red light to indicate that the chip is unqualified, and the indicator light 7 shows green light to indicate that the chip is qualified;

[0030] Step 2: When the chip is unqualified, the hydraulic telescopic rod 9 starts to drive the clamping frame 24 away from the chip, and the motor 12 starts to drive the placement plate 11 to rotate and transport the chip to the first storage box 15 for collection. When the indicator light 7 shows green, the staff will place the chip in the second collection box 20 for collection. When the first storage box 15 is full, pull the first storage box 15, and the first slider 16 slides in the first slide groove to disassemble the full first storage box 15. When the second collection box 20 is full, pull the second collection box 20, and pull the plug 28 out of the slot to disassemble the full second collection box 20.

[0031] In summary, in the present embodiment, according to the chip testing and sorting device of the present embodiment, by setting a hydraulic telescopic rod 9, the hydraulic telescopic rod 9 is started to drive the clamping frame 24 to move so as to clamp the chip on the placement plate 11, so as to avoid the chip from being offset during the test and affecting the test effect; by setting a motor 12, the motor 12 is started to drive the placement plate 11 to rotate so as to transport the unqualified chips to the first storage box 15, so as to store and place the unqualified chips; by setting a second collection box 20, it is convenient to store qualified chips; by setting a second slider 25 and a second slide groove sliding connection, the clamping frame 24 can be guided and limited; by setting a rotating block 26 and a rotating groove rotation connection, the placement plate 11 can be rotated on the support table 1 and the chip can be transported to the first storage box 15; by setting a ball 27, the friction of the rotation of the rotating block 26 can be reduced; The legs 13 can support the support table 1. By setting the first handle 17, it is convenient to pull and carry the first storage box 15. By setting the first anti-skid pad, the friction of the first handle 17 can be increased. By setting the first slider 16 to be slidably connected with the first slide groove, it is convenient to disassemble the full first storage box 15. By setting the first slider 16 as a T-shaped slider and cooperating with the T-shaped slide groove, the first storage box 15 can be guided and limited. By setting the plug block 28 to be engaged with the slot, the second collection box 20 is pulled and the plug block 28 is pulled out of the slot to disassemble the full second collection box 20. By setting the partition 22, the chips in the second collection box 20 can be separated and placed to avoid collision and damage between qualified chips. By setting the second handle 21, it is convenient to carry the second collection box 20. By setting the second anti-skid pad, the friction of the second handle 21 can be increased.

[0032] The above is only a further embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes within the scope disclosed by the present invention according to the technical solution and concept of the present invention, which fall within the protection scope of the present invention.

Claims

1. A chip testing and sorting device, characterized in that: The invention comprises a support platform (1) and a first connecting plate (2) mounted on the support platform (1), a hydraulic telescopic rod (9) mounted on the first connecting plate (2), a clamping frame (24) mounted on the output end of the hydraulic telescopic rod (9), a motor (12) mounted on the support platform (1), a placement plate (11) mounted on the output end of the motor (12), a first supporting leg (3) mounted on the first connecting plate (2), a top plate (4) disposed on the first supporting leg (3), a first connecting rod (5) mounted on the top plate (4), a detector (6) mounted on the bottom of the first connecting rod (5), a second connecting plate (8) mounted on the support platform (1), an indicator light (7) mounted on the second connecting plate (8), a first storage box (15) disposed below the support platform (1), and a second collection box (20) disposed on one side of the support platform (1).

2. A chip testing and sorting device according to claim 1, characterized in that: A second connecting rod (10) is installed on one side of the clamping frame (24), a second sliding block (25) is installed on the second connecting rod (10), a second sliding groove cooperating with the second sliding block (25) is provided on the second connecting plate (8), the second sliding block (25) is a T-shaped sliding block, and the second sliding groove is a T-shaped sliding groove.

3. A chip testing and sorting device according to claim 2, characterized in that: A rotating block (26) is installed on the placement plate (11), a rotating groove cooperating with the rotating block (26) is provided on the support platform (1), a plurality of rotating cavities are provided on the rotating block (26), and a ball (27) is rotatably installed inside the rotating cavity.

4. A chip testing and sorting device according to claim 3, characterized in that: A second supporting leg (13) is installed at the bottom of the supporting platform (1), a bottom plate (14) is installed at the bottom of the second supporting leg (13), the first storage box (15) is slidably installed on the bottom plate (14), a first handle (17) is installed on the first storage box (15), and a first anti-slip pad is installed on the first handle (17).

5. A chip testing and sorting device according to claim 4, characterized in that: A first sliding block (16) is installed at the bottom of the first storage box (15), and a first sliding groove cooperating with the first sliding block (16) is opened on the bottom plate (14), the first sliding block (16) is a T-shaped sliding block, and the first sliding groove is a T-shaped sliding groove.

6. A chip testing and sorting device according to claim 5, characterized in that: A third connecting rod (18) is installed on one side of the support platform (1), a connecting block (19) is installed on the third connecting rod (18), a third connecting plate (23) is installed on the second collecting box (20), an insert block (28) is installed at the bottom of the third connecting plate (23), and a slot that cooperates with the insert block (28) is opened on the connecting block (19).

7. A chip testing and sorting device according to claim 6, characterized in that: A plurality of partitions (22) are installed inside the second collection box (20), a plurality of second handles (21) are installed on the second collection box (20), and a second anti-slip pad is installed on the second handle (21).

Images