Triode test fixture with PNP type triode protection function
By designing a transistor test fixture with PNP type transistor protection function, using the combination of threaded rod and rotating handle, efficient clamping and fixing of a variety of transistors is achieved, solving the problem of low testing efficiency in the prior art.
Patent Information
- Application Number
- CN202323505711.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2023-12-22
- Publication Date
- 2024-12-27
- Estimated Expiration
- 2033-12-22
AI Technical Summary
Existing transistor test fixtures cannot be used simultaneously or with PNP type transistors in multiple package forms and pin arrangements, resulting in inefficient testing.
A transistor test fixture with PNP type transistor protection function is designed, including base, fixture seat, clamping plate, limiting column and threaded rod. Through the cooperation of threaded rod and rotating handle, multiple different models are realized. PNP type transistor clamping fixation and testing, suitable for a variety of transistors.
It realizes efficient clamping and fixing of multiple PNP transistors, prevents shaking and offsets, improves testing efficiency, and is adapted to a variety of transistor packaging forms and pin arrangements.
Smart Images
Figure CN222259387U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of triode fixtures, in particular to a triode test fixture with a PNP type triode protection function. Background Art
[0002] A semiconductor transistor, also known as a bipolar transistor or a crystal transistor, is a semiconductor device that controls current. Its function is to amplify weak signals into electrical signals with larger amplitudes. The crystal transistor is one of the basic semiconductor components and is also a core component of electronic circuits. There are two arrangements of transistors: PNP and NPN. The PNP transistor is a transistor composed of two P-type semiconductors with an N-type semiconductor sandwiched between them.
[0003] Before using a PNP transistor, it is necessary to detect whether the transistor can be used normally. In the existing fixtures for detecting transistors, for example, Chinese Patent No. CN 215768654 U discloses a transistor test fixture with a transistor protection function, in which the transistor is clamped by a clamping plate, and then a metal groove and a transistor pin clamping plate protect the transistor. During the test, only one transistor can be clamped for testing. When another transistor needs to be tested, the clamping plate needs to be loosened and placed again to clamp the transistor. Multiple transistors cannot be clamped and fixed at the same time. If there are multiple transistors with different packaging forms or pin arrangements, different fixtures may be required, so that multiple transistors cannot be adapted, which reduces the efficiency of testing PNP transistors. Utility Model Content
[0004] The utility model aims to solve the shortcomings in the prior art and proposes a transistor test fixture with a PNP transistor protection function.
[0005] In order to achieve the above purpose, the utility model adopts the following technical solutions:
[0006] A transistor test fixture with a PNP transistor protection function comprises a base, a fixture seat is fixedly connected to the base, a plurality of transistor placement grooves are provided on the fixture seat, PNP transistors are placed in the transistor placement grooves, a clamping plate is arranged above the transistor, a clamping concave block is fixedly connected to one side of the clamping plate, limiting columns are fixedly connected to both sides of the clamping concave block, and limiting holes matched with the limiting columns are provided on the base.
[0007] Preferably, a connecting plate is fixedly connected to the top of the clamping plate, a threaded rod is fixedly connected to a side of the connecting plate away from the clamping plate, and a rotating handle is fixedly connected to one end of the threaded rod.
[0008] Preferably, a lower recess is fixedly connected to the base, one side of the lower recess is movably connected to an upper recess via a connecting shaft, and a threaded hole matching the threaded rod is provided on one side of the lower recess and the upper recess close to the threaded rod.
[0009] Preferably, a positioning hole is formed on one side of the lower recess close to the upper recess, and a positioning pin matching the positioning hole is fixedly connected to the bottom of the upper recess.
[0010] Preferably, a plurality of test holes are provided on one side of the fixture seat, and the test holes are connected to the transistor placement slot.
[0011] Preferably, a receiving hole for the transistor pins to pass through is provided on one side of the clamping plate, and the bottom of the clamping plate matches the shape of the transistor placement groove.
[0012] The beneficial effects of the utility model are:
[0013] The plurality of PNP transistors with different package forms or pin arrangements are placed in the transistor placement groove in sequence, and the threaded rod is driven to rotate by the rotating handle. The threaded rod drives the connecting plate and the clamping plate to push the clamping recess to one side through the action of the thread. During the movement of the clamping recess, the clamping recess gradually approaches the head part of the PNP transistor, so that the head part of the PNP transistor is clamped into the clamping recess, which is beneficial to clamping and fixing the PNP transistor. At the same time, the limiting column is clamped into the limiting hole, so as to prevent the PNP transistor from shaking and deviating during the test. The test hole can be used to test a plurality of PNP transistors in sequence, which is suitable for a variety of transistors. There is no need to clamp the transistor separately, thereby improving the work efficiency when testing the PNP transistor.
[0014] By rotating the upper recess, the upper recess is rotated with the connecting shaft as the fulcrum, so that the positioning pin at the bottom of the upper recess is clamped into the positioning hole of the lower recess during the rotation of the upper recess, which is beneficial to restrict the threaded rod in the threaded hole, preventing the threaded rod from rotating, thereby restricting the movement of the clamping plate, and further limiting the position and fixing the PNP transistor. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] Figure 1 This is a schematic diagram of the overall structure of a transistor test fixture with a PNP transistor protection function proposed by the utility model;
[0016] Figure 2 This is a schematic diagram of the connection structure between the base and the fixture seat of a transistor test fixture with a PNP transistor protection function proposed by the utility model;
[0017] Figure 3This is a schematic diagram of the fixture seat structure of a transistor test fixture with a PNP transistor protection function proposed by the utility model;
[0018] Figure 4 The utility model discloses a schematic diagram of a connecting plate structure of a transistor test fixture with a PNP transistor protection function.
[0019] In the figure:
[0020] 1. Base; 2. Clamp seat; 3. Transistor placement slot; 4. Clamping plate; 5. Clamping recess; 6. Limiting column; 7. Limiting hole; 8. Connecting plate; 9. Threaded rod; 10. Rotating handle; 11. Lower recess; 12. Upper recess; 13. Test hole; 14. Accommodating hole. DETAILED DESCRIPTION
[0021] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments.
[0022] The contents not described in detail in this specification belong to the prior art known to professional and technical personnel in this field.
[0023] The standard parts used in the utility model can all be purchased from the market, and special-shaped parts can be customized according to the instructions and the drawings. The specific connection methods of each part adopt the conventional means such as mature bolts, rivets, welding, etc. in the existing technology. The machinery, parts and equipment all adopt the conventional models in the existing technology, and the circuit connection adopts the conventional connection method in the existing technology, which will not be described in detail here.
[0024] Example:
[0025] Reference Figure 1-4 A transistor test fixture with a PNP transistor protection function comprises a base 1, a fixture seat 2 is fixedly connected to the base 1, a plurality of transistor placement slots 3 are provided on the fixture seat 2, PNP transistors are placed in the transistor placement slots 3, a clamping plate 4 is arranged above the transistor, a clamping concave block 5 is fixedly connected to one side of the clamping plate 4, limiting columns 6 are fixedly connected to both sides of the clamping concave block 5, and a limiting hole 7 matching with the limiting column 6 is provided on the base 1.
[0026] A connecting plate 8 is fixedly connected to the top of the clamping plate 4 , a threaded rod 9 is fixedly connected to the side of the connecting plate 8 away from the clamping plate 4 , and a rotating handle 10 is fixedly connected to one end of the threaded rod 9 .
[0027] A lower recess 11 is fixedly connected to the base 1 , and an upper recess 12 is movably connected to one side of the lower recess 11 through a connecting shaft. Threaded holes matching the threaded rod 9 are provided on the sides of the lower recess 11 and the upper recess 12 close to the threaded rod 9 .
[0028] A positioning hole is formed on one side of the lower recess 11 close to the upper recess 12 , and a positioning pin matching the positioning hole is fixedly connected to the bottom of the upper recess 12 .
[0029] A plurality of test holes 13 are provided on one side of the fixture seat 2 , and the test holes 13 are communicated with the transistor placement slot 3 .
[0030] One side of the clamping plate 4 is provided with an accommodating hole 14 for the transistor pins to pass through, and the bottom of the clamping plate 4 matches the shape of the transistor placement slot 3 .
[0031] In the present embodiment, when it is necessary to test the PNP type transistor, firstly, a plurality of PNP type transistors of different models are placed in the transistor placement slot 3 in sequence, and the pins of the PNP type transistor are inserted into the test hole 13, and then the rotating handle 10 is rotated. When the rotating handle 10 is rotated, the threaded rod 9 is driven to rotate, and the threaded rod 9 is moved to one side under the action of the thread when it is rotated. During the movement of the threaded rod 9, the connecting plate 8 is driven to move, and when the connecting plate 8 moves, the clamping plate 4 is driven to move to one side. During the movement of the clamping plate 4, the clamping recess 5 is pushed to one side, and during the movement of the clamping recess 5, it gradually approaches the head part of the PNP type transistor, so that the head part of the PNP type transistor is embedded in the clamping recess 5, and the PNP The type transistor is clamped and fixed. After the PNP type transistor is fixed, the limiting columns 6 on both sides of the clamping recess 5 are embedded in the limiting holes 7, thereby preventing the PNP type transistor from shaking and deviating during the test. Subsequently, the upper recess 12 is rotated so that the upper recess 12 is rotated with the connecting shaft as a fulcrum, so that the locating pin at the bottom of the upper recess 12 is clamped into the locating hole of the lower recess 11 during the rotation of the upper recess 12, thereby restricting the threaded rod 9 in the threaded hole and preventing the threaded rod 9 from rotating, thereby further restricting the movement of the clamping plate 4, and then the test pen of the multimeter is extended into the test hole 13, so that the pins of the PNP type transistor can be tested in turn, completing the test of the PNP type transistor.
[0032] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.
[0033] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present utility model, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.
[0034] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes within the technical scope disclosed by the present invention according to the technical scheme and the utility model concept of the present invention, which should be covered by the protection scope of the present invention.
Claims
1. A transistor test fixture with a PNP transistor protection function, comprising a base (1), characterized in that: The base (1) is fixedly connected to a clamp seat (2), the clamp seat (2) is provided with a plurality of transistor placement grooves (3), PNP-type transistors are placed in the transistor placement grooves (3), a clamping plate (4) is arranged above the transistor, a clamping recess (5) is fixedly connected to one side of the clamping plate (4), and limiting columns (6) are fixedly connected to both sides of the clamping recess (5), and the base (1) is provided with limiting holes (7) that match the limiting columns (6).
2. The transistor test fixture with PNP transistor protection function according to claim 1, characterized in that: A connecting plate (8) is fixedly connected above the clamping plate (4), a threaded rod (9) is fixedly connected to the side of the connecting plate (8) away from the clamping plate (4), and a rotating handle (10) is fixedly connected to one end of the threaded rod (9).
3. The transistor test fixture with PNP transistor protection function according to claim 2, characterized in that: A lower recess (11) is fixedly connected to the base (1), one side of the lower recess (11) is movably connected to an upper recess (12) via a connecting shaft, and threaded holes matching the threaded rod (9) are provided on the sides of the lower recess (11) and the upper recess (12) close to the threaded rod (9).
4. The transistor test fixture with PNP transistor protection function according to claim 3, characterized in that: A positioning hole is provided on one side of the lower recess (11) close to the upper recess (12), and a positioning pin matching the positioning hole is fixedly connected to the bottom of the upper recess (12).
5. The transistor test fixture with PNP transistor protection function according to claim 1, characterized in that: A plurality of test holes (13) are provided on one side of the clamp seat (2), and the test holes (13) are connected to the transistor placement slot (3).
6. The transistor test fixture with PNP transistor protection function according to claim 1, characterized in that: One side of the clamping plate (4) is provided with a receiving hole (14) for the transistor pin to pass through, and the bottom of the clamping plate (4) matches the shape of the transistor placement groove (3).