Probe card plugging structure

Abstract

The utility model discloses a probe card plugging structure comprising a fixed pedestal, the left and right sides of the upper surface of the fixed pedestal are each vertically and fixedly provided with two positioning rods, the upper part of the interior of each positioning rod is connected and provided with a supporting frame, the supporting frames are U-shaped, a positioning plate is horizontally and fixedly connected between the positioning rods, and the positioning plates are fixedly connected with the positioning rods. A plurality of probe holes are formed in the middle of the positioning plate in a penetrating mode, a chip groove is formed in the middle of the upper surface of the fixed base, clamping plates are installed on the left side and the right side of the chip groove, a probe card body is horizontally connected and installed in the middle of the supporting frame, and brackets are installed below the left side and the right side of the probe card body in a supporting mode; a plurality of probe bodies are arranged in the middle of the bottom of the probe card body, the probe bodies penetrate through the probe holes, and the upper portions of the probe bodies are connected to the surface of the probe card body through connecting lines. According to the probe card plugging structure, the clamping and fixing structure is arranged on the chip, so that the position stability of the chip during detection is ensured; and meanwhile, the height-adjustable probe card is arranged, so that the probe contact is prevented from being damaged.

Description

Technical Field

[0001] The utility model relates to the technical field of probe cards, in particular to a probe card plug-in structure. Background Art

[0002] A probe card is a tool used for testing electronic devices. It usually consists of a card with multiple probes. Each probe can contact the electronic device on the wafer, and it is usually used in wafer testing. In wafer testing, the probe card is mainly installed on the tester through a plug-in structure to achieve conduction and signal transmission between the tester and the chip circuit. When the probe card is used for testing, the probe and the PCB board are easily damaged, and it is troublesome to repair or replace the probe and the PCB board. At the same time, when the probe card contacts the chip to be tested, an offset may occur, causing errors in the detection. However, the existing probe card plug-in structure still has certain problems when used:

[0003] For example, a vertical probe card for autonomous driving chip testing with announcement number CN211577232U has the following technical solutions: including a PCB board, a probe, a plug-in installation structure and a positioning structure; the plug-in installation structure includes a connecting wire, a metal slot and a U-shaped plug-in board; the positioning structure includes a spring, a rectangular sleeve rod, a slider, a plug-in rod, a detection fixing plate, a connecting rod and a limit plate. The plug-in installation structure can facilitate the disassembly and separation of the PCB board and the probe, making it more convenient and quick for the staff to replace or repair the probe and the PCB board. The positioning structure can fix the autonomous driving chip to be tested, and the limit plate can position the probe to avoid the probe from shifting when it contacts the chip. However, the existing probe card plug-in structure cannot fix the chip when it is placed, and it will shake in the chip slot. At the same time, the height of the probe cannot be controlled, and the probe contact will collide and be damaged during the detection.

[0004] In view of this, we conducted in-depth research on the above issues, which led to the present case.

[0005] In view of the above problems, an innovative design is carried out based on the original probe card plug-in structure. Utility Model Content

[0006] The utility model aims to provide a probe card plug-in structure to solve the problems in the above background technology that the chip cannot be completely fixed and the height of the probe cannot be guaranteed to cause damage to the contact.

[0007] In order to achieve the above purpose, the utility model provides the following technical solutions:

[0008] A probe card plug-in structure comprises a fixed base, two positioning rods are vertically fixedly installed on the left and right sides of the upper surface of the fixed base, and a support frame is connected and installed on the upper part of the positioning rods, and the support frame is "U"-shaped, a positioning plate is horizontally fixedly connected and installed between the positioning rods, and a plurality of probe holes are opened through the middle of the positioning plate, a chip slot is opened in the middle of the upper surface of the fixed base, and clamping plates are installed on the left and right sides of the chip slot, a probe card body is horizontally connected and installed in the middle of the support frame, and brackets are supported and installed below the left and right sides of the probe card body, a plurality of probe bodies are arranged in the middle of the bottom of the probe card body, and the probe bodies pass through the inside of the probe holes, and the top of the probe bodies is connected to the surface of the probe card body through connecting wires.

[0009] Preferably, a first rotating handle is provided on the right side of the fixed base, and a bidirectional threaded rod is connected and installed on the left end of the first rotating handle, and the left end of the bidirectional threaded rod is connected and installed on the left side inside the fixed base to form a rotating structure.

[0010] By adopting the above technical solution, when the first handle is manually rotated, the bidirectional threaded rod is simultaneously driven to rotate, thereby providing manual mechanical power for the clamping plate to fix and clamp the chip.

[0011] Preferably, moving blocks are threadedly installed on both sides of the bidirectional threaded rod, and a slider is fixedly installed on the bottom of the moving block, and the slider is located inside the horizontal slide groove at the bottom of the fixed base to form a left and right moving structure, and a clamping plate is fixedly installed on the top of the moving block, and the clamping plates move toward each other to form a clamping and fixing structure for the chip.

[0012] By adopting the above technical solution, when the bidirectional threaded rod rotates, the threaded movable block drives the clamping plate to clamp and fix the left and right sides of the protruding chip placed in the chip slot to ensure its stable position when the probe body is inserted into contact.

[0013] Preferably, a spring is provided inside the positioning rod, and the bottom of the spring is fixedly connected to the bottom surface inside the positioning rod, and an elastic block is fixedly installed above the spring.

[0014] By adopting the above technical solution, when the support frame is connected to the positioning rod, it is directly connected to the top of the elastic block. When the support frame is subjected to downward pressure, the probe body can be driven to elastically contact the chip.

[0015] Preferably, a second rotating handle is provided on the right side of the support frame, and a worm is connected and installed on the left end of the second rotating handle, and the left end of the worm is connected to the left side surface inside the support frame to form a rotating structure.

[0016] By adopting the above technical solution, manually rotating the second rotating handle drives the worm to rotate at the same time, thereby providing mechanical power for the bracket to drive the probe card body to move up and down.

[0017] Preferably, worm wheels are connected and installed on the rear sides of the left and right sides of the worm, and the upper end of the worm wheel is connected to the upper part of the support frame to form a rotating structure, and a threaded column is connected and installed below the worm wheel.

[0018] With the above technical solution, when the worm rotates, it drives the worm wheels on both sides to rotate, and at the same time drives the threaded column below to rotate, providing mechanical power for the bracket to drive the probe card body to move up and down.

[0019] Preferably, a bracket is installed on the outer side of the threaded column through a threaded connection, and the bracket is located inside the support frame to form a lifting structure, and the left and right brackets form a supporting structure for the probe card body.

[0020] By adopting the above technical solution, when the threaded column rotates, it drives the threaded bracket to support the probe card body to rise and fall, effectively controlling the height of the probe body at the bottom of the probe card body, and then performing downward pressure detection on the chip below to prevent the probe card body contacts from being directly pressed down and causing plug-in damage.

[0021] Compared with the prior art, the utility model has the following beneficial effects: the probe card plug-in structure,

[0022] 1. A clamping plate is provided to form a clamping structure for the chip. Moving blocks are threadedly installed on both sides of the bidirectional threaded rod, and a slider is fixedly installed at the bottom of the moving block, and the slider is located inside the horizontal slide groove at the bottom of the fixed base to form a left and right moving structure. A clamping plate is fixedly installed on the top of the moving block, and the clamping plates move toward each other to form a clamping and fixing structure for the chip. When the bidirectional threaded rod rotates, the threaded moving block drives the clamping plate to clamp and fix the left and right sides of the chip protruding from the chip slot, ensuring that its position is stable when the probe body is inserted into contact;

[0023] 2. A probe card body with adjustable height is provided, and a bracket is installed on the outer side of the threaded column through a threaded connection, and the bracket is located inside the support frame to form a lifting structure, and the left and right brackets constitute a supporting structure for the probe card body. When the threaded column rotates, it drives the threaded bracket to support the probe card body to rise and fall, effectively controlling the height of the probe body at the bottom of the probe card body, and then performing a downward pressure detection on the chip below to prevent the probe card body contacts from being directly pressed down and causing plug-in damage. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 This is a schematic diagram of the front main structure of the utility model;

[0025] Figure 2 This is a front sectional structural schematic diagram of the utility model;

[0026] Figure 3 For this utility model Figure 2 The enlarged structural diagram at A in the middle;

[0027] Figure 4 For this utility model Figure 2 The enlarged structural diagram at B in the middle;

[0028] Figure 5 It is a schematic diagram of the internal three-dimensional structure of the fixed base of the utility model.

[0029] In the figure: 1. fixed base; 2. positioning rod; 3. support frame; 4. chip slot; 5. first rotating handle; 6. bidirectional threaded rod; 7. moving block; 8. slider; 9. slide groove; 10. clamping plate; 11. positioning plate; 12. probe hole; 13. spring; 14. elastic block; 15. second rotating handle; 16. worm; 17. worm gear; 18. threaded column; 19. bracket; 20. probe card body; 21. probe body; 22. connecting line. DETAILED DESCRIPTION

[0030] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0031] See also Figure 1-5 , the utility model provides a technical solution:

[0032] A probe card plug-in structure includes a fixed base 1, two positioning rods 2 are vertically fixedly installed on the left and right sides of the upper surface of the fixed base 1, and a support frame 3 is connected and installed on the upper part of the positioning rods 2, and the support frame 3 is "U"-shaped, a positioning plate 11 is horizontally fixedly connected and installed between the positioning rods 2, and a plurality of probe holes 12 are penetrated in the middle of the positioning plate 11, a chip slot 4 is opened in the middle of the upper surface of the fixed base 1, and clamping plates 10 are installed on the left and right sides of the chip slot 4, a probe card body 20 is horizontally connected and installed in the middle of the support frame 3, and brackets 19 are supported and installed below the left and right sides of the probe card body 20, a plurality of probe bodies 21 are arranged in the middle of the bottom of the probe card body 20, and the probe bodies 21 penetrate the inside of the probe holes 12, and the top of the probe bodies 21 is connected to the surface of the probe card body 20 through connecting wires 22.

[0033] A first turning handle 5 is provided on the right side of the fixed base 1, and a bidirectional threaded rod 6 is connected and installed at the left end of the first turning handle 5, and the left end of the bidirectional threaded rod 6 is connected and installed on the left side of the fixed base 1 to form a rotating structure. Moving blocks 7 are threadedly connected and installed on both the left and right sides of the bidirectional threaded rod 6, and a slider 8 is fixedly installed at the bottom of the moving block 7, and the slider 8 is located inside the horizontal slide groove 9 at the bottom of the fixed base 1 to form a left-right moving structure, and a clamping plate 10 is fixedly installed on the top of the moving block 7, and the clamping plate 10 moves towards each other to form a clamping and fixing structure for the chip. When the first turning handle 5 is manually rotated, the bidirectional threaded rod 6 is driven to rotate at the same time, thereby providing manual mechanical power for the clamping plate 10 to fix and clamp the chip. When the bidirectional threaded rod 6 rotates, the threaded moving block 7 drives the clamping plate 10 to clamp and fix the left and right sides of the chip protruding from the chip slot 4, ensuring that its position is stable when the probe body 21 is inserted and contacted.

[0034] A spring 13 is provided inside the positioning rod 2, and the bottom of the spring 13 is fixedly connected to the bottom surface of the positioning rod 2, and an elastic block 14 is fixedly installed above the spring 13. When the support frame 3 is connected to the positioning rod 2, it is directly connected to the elastic block 14, and when the support frame 3 is subjected to downward pressure, the probe body 21 can be driven to elastically contact the chip.

[0035] A second handle 15 is provided on the right side of the support frame 3, and a worm 16 is connected to the left end of the second handle 15, and the left end of the worm 16 is connected to the left side of the support frame 3 to form a rotating structure. Worm wheels 17 are connected to the rear sides of the left and right sides of the worm 16, and the upper end of the worm wheel 17 is connected to the upper part of the support frame 3 to form a rotating structure, and a threaded column 18 is connected to the lower part of the worm wheel 17. A bracket 19 is threadedly connected to the outer side of the threaded column 18, and the bracket 19 is located inside the support frame 3 to form a lifting structure, and the left and right brackets 19 form a support structure for the probe card body 20. Manually rotating the second handle 15 drives the worm 16 to rotate at the same time, providing mechanical power for the bracket 19 to drive the probe card body 20 to move up and down. When the worm 16 rotates, it drives the worm wheels 17 on the left and right sides to rotate at the same time, and can drive the threaded column 18 below to rotate, providing mechanical power for the bracket 19 to drive the probe card body 20 to move up and down. When the threaded column 18 rotates, the threaded bracket 19 supports the probe card body 20 to rise and fall, effectively controlling the height of the probe body 21 at the bottom of the probe card body 20, and then performing a downward pressure test on the chip below to prevent the probe card body 20 contacts from being directly pressed down and causing damage to the connection.

[0036] Working principle:

[0037] When the utility model is in use, the chip is placed inside the chip slot 4, and the first turning handle 5 is manually rotated to drive the bidirectional threaded rod 6 to rotate at the same time, and the threaded moving block 7 drives the clamping plate 10 to clamp and fix the left and right sides of the chip protruding from the chip slot 4 to ensure that its position is stable when the probe body 21 is inserted and contacted, and the probe card body 20 is connected to the detection instrument, and the second turning handle 15 is manually rotated to drive the worm 16 to rotate at the same time, and drive the worm gears 17 on the left and right sides to rotate, and can also drive the threaded column 18 below to rotate, and drive the threaded bracket 19 to support the probe card body 20 to lift and lower, effectively controlling the height of the probe body 21 at the bottom of the probe card body 20, and then the chip below is pressed down for detection to prevent the probe card body 20 contacts from being directly pressed down and damaged during insertion.

[0038] The contents not described in detail in this specification belong to the prior art known to professional and technical personnel in this field.

[0039] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A probe card plug-in structure, comprising a fixed base (1), characterized in that: Two positioning rods (2) are vertically fixedly installed on the left and right sides of the upper surface of the fixed base (1), and a support frame (3) is connected and installed on the upper part of the positioning rods (2), and the support frame (3) is in a "U" shape. A positioning plate (11) is horizontally fixedly connected and installed between the positioning rods (2), and a plurality of probe holes (12) are opened through the middle of the positioning plate (11). A chip slot (4) is opened in the middle of the upper surface of the fixed base (1), and clamping plates (10) are installed on the left and right sides of the chip slot (4). A probe card body (20) is horizontally connected and installed in the middle of the support frame (3), and brackets (19) are supported and installed below the left and right sides of the probe card body (20). A plurality of probe bodies (21) are arranged in the middle of the bottom of the probe card body (20), and the probe bodies (21) pass through the inside of the probe holes (12), and the top of the probe bodies (21) are connected to the surface of the probe card body (20) through connecting wires (22).

2. A probe card plug-in structure according to claim 1, characterized in that: The right side surface of the fixed base (1) is provided with a first rotating handle (5), and the left end of the first rotating handle (5) is connected to and installed with a bidirectional threaded rod (6), and the left end of the bidirectional threaded rod (6) is connected to and installed on the left side surface inside the fixed base (1) to form a rotating structure.

3. A probe card plug-in structure according to claim 2, characterized in that: The two-way threaded rod (6) is threadedly connected to a moving block (7) on both sides, and a slider (8) is fixedly installed at the bottom of the moving block (7). The slider (8) is located inside a horizontal slide groove (9) at the bottom of the fixed base (1) to form a left-right moving structure. A clamping plate (10) is fixedly installed at the top of the moving block (7), and the clamping plates (10) move towards each other to form a clamping and fixing structure for the chip.

4. The probe card plug-in structure according to claim 1, characterized in that: A spring (13) is arranged inside the positioning rod (2), and the bottom of the spring (13) is fixedly connected to the bottom surface inside the positioning rod (2), and an elastic block (14) is fixedly installed above the spring (13).

5. The probe card plug-in structure according to claim 1, characterized in that: A second rotating handle (15) is arranged on the right side of the support frame (3), and a worm (16) is connected and installed at the left end of the second rotating handle (15), and the left end of the worm (16) is connected to the left side surface inside the support frame (3) to form a rotating structure.

6. The probe card plug-in structure according to claim 5, characterized in that: The rear sides of the left and right sides of the worm (16) are both connected and installed with worm wheels (17), and the upper end of the worm wheel (17) is connected to the upper part of the support frame (3) to form a rotating structure, and a threaded column (18) is connected and installed below the worm wheel (17).

7. The probe card plug-in structure according to claim 6, characterized in that: The threaded column (18) is threadedly connected to a bracket (19) installed on its outer side, and the bracket (19) is located inside the support frame (3) to form a lifting structure, and the left and right brackets (19) form a supporting structure for the probe card body (20).

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