Test structure for preventing V-CUT leakage

Abstract

The utility model relates to a leak-proof V-CUT test structure, the upper surface of a detection conveyer belt is provided with a test mechanism for V-CUT leak-proof test, and the upper surface of the detection conveyer belt is provided with a material pushing mechanism for cleaning unqualified products below the test mechanism. By arranging the testing mechanism, a to-be-detected PCB is conveyed to the position below the supporting frame through the detection conveying belt, then the position of the PCB is detected through the photoelectric sensor, movement of the detection conveying belt is stopped after detection is in place, the push plate further pushes the two on-off testing contacts to make corresponding contact with the contact positions on the PCB, and whether V-CUT is omitted or not is detected; when the PCB passes through the testing mechanism, if V-CUT is correctly completed, the contact displays an open circuit state; if the V-CUT is omitted, the contact will display a short circuit state, and the test host receives a signal from the on-off test contact and analyzes and judges whether the PCB is qualified or not.

Description

Technical Field

[0001] The utility model relates to the technical field of leak-proof V-CUT testing, in particular to a leak-proof V-CUT testing structure. Background Art

[0002] Radar PCB leak-proof V-Cut is a design and control method used to ensure that the V-Cut process of PCB (printed circuit board) is correctly executed during the production process, thereby avoiding quality problems caused by omitting the V-Cut process. V-Cut is a cutting technology used to divide a multi-plate set of PCB boards into single units for subsequent assembly and use.

[0003] As disclosed in Chinese patent announcement number (CN212904630U), a leak-proof V-CUT test structure is simple in structure, convenient for testing and capable of detecting the quality of V□CUT cutting edges. The utility model comprises two groups of leak-proof V-CUT test modules respectively arranged at both ends of the broken edge of a PCB. The leak-proof V-CUT test module comprises two pairs of test pads (1). The two pairs of test pads (1) are respectively located at both sides of the broken edge of the PCB. The two test pads (1) on the same side are connected through a connecting line (2). The end of the connecting line (2) is embedded in a position of 55%-70% of the width of a V-CUT groove (3) that has been planned but not yet gonged. There are two intersection points between the connecting line (2) and the V-CUT groove (3). The spacing between the two intersection points is 0.80-0.05mm. The two connecting lines (2) between the four test pads (1) on both sides intersect and have two intersection points. The utility model can be applied to the technical field of PCB production.

[0004] However, as in the above patent, there is still a problem of poor continuity leak detection effect for V-CUT. For example, in the above patent, four pairs of test pads are used, so four positions can be tested. However, this method requires leak testing after the V-CUT is welded. However, the PCB production process is long, and the V-Cut process is easy to be missed, resulting in the inability to separate the boards after SMT plug-in, causing irreparable scrapping and lack of effective process control capabilities. Utility Model Content

[0005] In view of the shortcomings of the prior art, the utility model provides a leak-proof V-CUT test structure, which has the advantages of good leak-proof detection effect, etc., and solves the problem of poor continuity leak-proof detection effect for V-CUT in the prior art.

[0006] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a leak-proof V-CUT test structure, comprising a detection conveyor belt, a test mechanism for V-CUT leak-proof test is provided on the upper surface of the detection conveyor belt, and a pusher mechanism for cleaning unqualified products is provided on the upper surface of the detection conveyor belt and below the test mechanism;

[0007] The testing mechanism includes a support frame, a first electric push rod, a push plate, two test guide plates, two on-off test contacts, two conductive circuits and a testing host. The support frame is fixed to the upper surface of the detection conveyor belt, the first electric push rod is fixed to the middle of the upper surface of the support frame, the push plate is fixed to the outer side of the output shaft of the first electric push rod, the two test guide plates are respectively fixed to the left and right sides of the lower surface of the push plate, the two on-off test contacts are respectively fixed to the lower surfaces of the two test guide plates, the testing host is fixed to the middle of the lower surface of the push plate, and the two ends of the two conductive circuits are respectively electrically connected to the two on-off test contacts and the side opposite to the testing host.

[0008] Furthermore, conveying ports are provided on both the left and right sides of the support frame, and the length of the test guide plate is equal to the width of the push plate.

[0009] Furthermore, guide rails are fixed to the inner walls on both sides of the support frame.

[0010] Furthermore, sliding grooves are provided on both the left and right sides of the push plate, and the push plate is slidably connected to the outer sides of the two guide rails through the two sliding grooves.

[0011] Furthermore, the pushing mechanism includes a connecting plate, two photoelectric sensors, a connecting frame, a second electric push rod, a cleaning plate and a deflector cover. The connecting plate is fixed to the upper surface of the detection conveyor belt and is located below the support frame. The two photoelectric sensors are respectively fixed to the left and right sides of the front of the connecting plate, the connecting frame is fixed to the back of the connecting plate, the second electric push rod is fixed to the back of the connecting frame, the cleaning plate is fixed to the outer side of the output shaft of the second electric push rod, and the deflector cover is fixed to the front of the detection conveyor belt.

[0012] Furthermore, a connecting port is provided on the front side of the connecting plate, and the cleaning plate is slidably connected to the inner wall of the connecting port.

[0013] Furthermore, a cleaning groove corresponding to the position of the air guide cover is provided on the upper surface of the detection conveyor belt.

[0014] Compared with the prior art, the technical solution of this application has the following beneficial effects:

[0015] 1. The test structure of the leak-proof V-CUT is equipped with a test mechanism. The PCB board to be tested is conveyed to the bottom of the support frame through the detection conveyor belt. Then the position of the PCB board is detected by the photoelectric sensor. After the position is detected, the detection conveyor belt is stopped. The push plate further pushes the two on-off test contacts to contact with the corresponding contact positions on the PCB board, which will be used to detect whether the V-CUT is missed. When the PCB board passes the test mechanism, if the V-CUT is completed correctly, the contact will show an open circuit state; if the V-CUT is missed, the contact will show a short circuit state. The test host receives the signal from the on-off test contact and analyzes and determines whether the PCB board is qualified.

[0016] 2. The test structure of the leak-proof V-CUT is equipped with a pushing mechanism. When the photoelectric sensor detects defective products, the second electric push rod is activated to push the cleaning plate to push the defective products off the conveyor belt and into the cleaning groove, thereby cleaning the defective products. It can automatically detect whether the V-CUT process is missed, and the pushing mechanism can remove the detected defective products from the conveyor belt to ensure that only qualified PCB boards continue to move along the production line. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a schematic diagram of the structure of the utility model;

[0018] Figure 2 This is a schematic diagram of the test mechanism of the utility model;

[0019] Figure 3 It is a partial schematic diagram of the testing mechanism of the utility model;

[0020] Figure 4 It is a top view of the pusher mechanism of the utility model.

[0021] In the figure: 1 detection conveyor belt, 2 test mechanism, 21 support frame, 22 first electric push rod, 23 push plate, 24 test guide plate, 25 on-off test contact, 26 conductive circuit, 27 test host, 28 guide rail, 3 push mechanism, 31 connecting plate, 32 photoelectric sensor, 33 connecting frame, 34 second electric push rod, 35 cleaning plate, 36 air deflector. DETAILED DESCRIPTION

[0022] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0023] See also Figure 1A leak-proof V-CUT test structure in this embodiment includes a detection conveyor belt 1, a test mechanism 2 for V-CUT leak-proof test is provided on the upper surface of the detection conveyor belt 1, and a pushing mechanism 3 for cleaning unqualified products is provided on the upper surface of the detection conveyor belt 1 and below the test mechanism 2.

[0024] See also Figure 2-3 In order to detect the leakage of V-CUT, the test mechanism 2 in this embodiment includes a support frame 21, a first electric push rod 22, a push plate 23, two test guide plates 24, two on-off test contacts 25, two conductive circuits 26 and a test host 27. The support frame 21 is fixed to the upper surface of the detection conveyor belt 1, the first electric push rod 22 is fixed to the middle of the upper surface of the support frame 21, and the push plate 23 is fixed to the outer side of the output shaft of the first electric push rod 22. The support frame 21 provides stable support for the entire test mechanism 2. The first electric push rod 22 is used to push the push plate 23 to move, and the moving direction is controlled by fixing the test guide plate 24. The two test guide plates 24 are respectively fixed to the left and right sides of the lower surface of the push plate 23. The two on-off test contacts 25 are fixed on the lower surfaces of the two test guides 24 respectively. The PCB board to be tested is transported to the bottom of the support frame 21 through the detection conveyor belt 1. The two on-off test contacts 25 are fixed to the lower surfaces of the two test guides 24 respectively. The test host 27 is fixed to the middle part of the lower surface of the push plate 23. The position of the PCB board is detected by the photoelectric sensor 32, and the movement of the detection conveyor belt 1 is stopped after the detection is in place. The push plate 23 further pushes the two on-off test contacts 25 to contact the corresponding contact positions on the PCB board, which will be used to detect whether the V-CUT is missed. The two ends of the two conductive circuits 26 are electrically connected to the opposite side of the two on-off test contacts 25 and the test host 27 respectively.

[0025] In this embodiment, conveying ports are provided on the left and right sides of the support frame 21, the length of the test guide plate 24 is equal to the width of the push plate 23, guide rails 28 are fixed to the inner walls on the left and right sides of the support frame 21, and slide grooves are provided on the left and right sides of the push plate 23, and the push plate 23 is slidably connected to the outer sides of the two guide rails 28 through two slide grooves. When the PCB board passes through the test mechanism 2, if the V-CUT is completed correctly, the contact will show an open circuit state; if the V-CUT is omitted, the contact will show a short circuit state, and the test host 27 receives the signal from the on-off test contact 25, and analyzes and determines whether the PCB board is qualified.

[0026] See also Figure 4In order to push and clean the unqualified products, the pushing mechanism 3 in this embodiment includes a connecting plate 31, two photoelectric sensors 32, a connecting frame 33, a second electric push rod 34, a cleaning plate 35 and a guide cover 36. The two photoelectric sensors 32 are used to detect the position of the PCB board, and the second electric push rod 34 is used to push the cleaning plate 35 to move. The connecting plate 31 is fixed to the upper surface of the detection conveyor belt 1 and is located below the support frame 21. The two photoelectric sensors 32 are fixed to the left and right sides of the front of the connecting plate 31 respectively, the connecting frame 33 is fixed to the back of the connecting plate 31, the second electric push rod 34 is fixed to the back of the connecting frame 33, and the cleaning plate 35 is fixed to the outer side of the output shaft of the second electric push rod 34. When unqualified products are detected, the cleaning plate 35 will move to push the unqualified products. The guide cover 36 corresponds to the position of the cleaning groove and is used to guide the path of the cleaning plate 35 to push the unqualified products. The guide cover 36 is fixed to the front of the detection conveyor belt 1.

[0027] In this embodiment, a connecting port is provided on the front side of the connecting plate 31. When the photoelectric sensor 32 detects defective products, the second electric push rod 34 is activated to push the cleaning plate 35 to push the defective products off the conveyor belt and into the cleaning groove, thereby cleaning the defective products. The cleaning plate 35 is slidably connected to the inner wall of the connecting port, and a cleaning groove corresponding to the position of the guide cover 36 is provided on the upper surface of the detection conveyor belt 1. It can automatically detect whether the V-CUT process is omitted, and the pushing mechanism 3 can remove the detected defective products from the conveyor belt to ensure that only qualified PCB boards continue to move along the production line.

[0028] The working principle of the above embodiment is:

[0029] (1) When used for V-CUT leak detection, the support frame 21 provides stable support for the entire test mechanism 2. The first electric push rod 22 is used to push the push plate 23 to move, and the moving direction is controlled by fixing the test guide plate 24. The two on-off test contacts 25 are respectively fixed on the lower surfaces of the two test guide plates 24. The PCB board to be tested is transported to the bottom of the support frame 21 through the detection conveyor belt 1. Then the position of the PCB board is detected by the photoelectric sensor 32, and the movement of the detection conveyor belt 1 is stopped after the position is detected. The push plate 23 further pushes the two on-off test contacts 25 to contact with the corresponding contact positions on the PCB board, which will be used to detect whether the V-CUT is missed. When the PCB board passes through the test mechanism 2, if the V-CUT is completed correctly, the contacts will show an open circuit state; if the V-CUT is missed, the contacts will show a short circuit state. The test host 27 receives the signal from the on-off test contacts 25, and analyzes and determines whether the PCB board is qualified.

[0030] (2) When the unqualified products are pushed and cleaned, the two photoelectric sensors 32 are used to detect the position of the PCB board, and the second electric push rod 34 is used to push the cleaning plate 35 to move. When unqualified products are detected, the cleaning plate 35 will move to push the unqualified products. The guide cover 36 corresponds to the position of the cleaning groove and is used to guide the cleaning plate 35 to push the unqualified products. When the photoelectric sensor 32 detects unqualified products, the second electric push rod 34 is activated to push the cleaning plate 35 to push the unqualified products off the conveyor belt and into the cleaning groove, thereby cleaning the unqualified products. It can automatically detect whether the V-CUT process is omitted, and the pushing mechanism 3 can remove the detected unqualified products from the conveyor belt to ensure that only qualified PCB boards continue to move along the production line.

[0031] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0032] The standard parts used in this application document can all be purchased from the market and can be customized according to the instructions and drawings. The specific connection methods of each part adopt conventional means such as mature bolts, rivets, welding, etc. in the prior art. The machinery, parts and equipment all adopt conventional models in the prior art. The control method is automatic control through a controller. The control circuit of the controller can be implemented through simple programming by technicians in this field, which is common knowledge in this field. Therefore, this application document will no longer explain the control method and circuit connection in detail.

[0033] Although the embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that many changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention.

Claims

1. A leak-proof V-CUT test structure, comprising a detection conveyor belt (1), characterized in that: The upper surface of the detection conveyor belt (1) is provided with a testing mechanism (2) for V-CUT leak-proof testing, and the upper surface of the detection conveyor belt (1) and below the testing mechanism (2) is provided with a pushing mechanism (3) for cleaning unqualified products; The testing mechanism (2) comprises a support frame (21), a first electric push rod (22), a push plate (23), two test guide plates (24), two on-off test contacts (25), two conductive circuits (26) and a testing host (27); the support frame (21) is fixed to the upper surface of the detection conveyor belt (1); the first electric push rod (22) is fixed to the middle of the upper surface of the support frame (21); the push plate (23) is fixed to the outer side of the output shaft of the first electric push rod (22); the two test guide plates (24) are respectively fixed to the left and right sides of the lower surface of the push plate (23); the two on-off test contacts (25) are respectively fixed to the lower surfaces of the two test guide plates (24); the testing host (27) is fixed to the middle of the lower surface of the push plate (23); and the two ends of the two conductive circuits (26) are respectively electrically connected to the opposite side of the two on-off test contacts (25) and the testing host (27).

2. A leak-proof V-CUT test structure according to claim 1, characterized in that: The left and right sides of the support frame (21) are both provided with delivery openings, and the length of the test guide plate (24) is equal to the width of the push plate (23).

3. The leak-proof V-CUT test structure according to claim 1, characterized in that: Guide rails (28) are fixed to the inner walls on both the left and right sides of the support frame (21).

4. The leak-proof V-CUT test structure according to claim 1, characterized in that: The left and right sides of the push plate (23) are both provided with sliding grooves, and the push plate (23) is slidably connected to the outer sides of the two guide rails (28) through the two sliding grooves.

5. The leak-proof V-CUT test structure according to claim 1, characterized in that: The pushing mechanism (3) comprises a connecting plate (31), two photoelectric sensors (32), a connecting frame (33), a second electric push rod (34), a cleaning plate (35) and a guide cover (36); the connecting plate (31) is fixed to the upper surface of the detection conveyor belt (1) and is located below the support frame (21); the two photoelectric sensors (32) are respectively fixed to the left and right sides of the front of the connecting plate (31); the connecting frame (33) is fixed to the back of the connecting plate (31); the second electric push rod (34) is fixed to the back of the connecting frame (33); the cleaning plate (35) is fixed to the outer side of the output shaft of the second electric push rod (34); and the guide cover (36) is fixed to the front of the detection conveyor belt (1).

6. A leak-proof V-CUT test structure according to claim 5, characterized in that: The front side of the connecting plate (31) is provided with a connecting port, and the cleaning plate (35) is slidably connected to the inner wall of the connecting port.

7. The leak-proof V-CUT test structure according to claim 5, characterized in that: The upper surface of the detection conveyor belt (1) is provided with a cleaning groove corresponding to the position of the air guide cover (36).

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