Simple adjustable external spline cross-rod distance measuring instrument

Abstract

The utility model mainly relates to a simple adjustable external spline cross-rod distance measuring instrument, which comprises a base body, a measuring end and an adjusting end, the base body is symmetrically provided with a through hole and a threaded hole, the adjusting end comprises a lower measuring head seat, a fixing block and a lower measuring head, and the measuring end comprises a fixing sleeve, a gauge chuck and a dial gauge. During measurement, a workpiece is placed between the upper measuring head and the lower measuring head, whether the workpiece is qualified or not can be judged by observing whether the scale value on the dial indicator is within a qualified range or not, the detection is very convenient, and the detection efficiency is improved.

Description

Technical Field

[0001] The present invention relates to a measuring instrument, in particular to a simple and adjustable external spline span measuring instrument. Background Art

[0002] The span is an indirect parameter that indicates tooth thickness. Two small round rods are placed in opposing tooth grooves, and the outer edge dimension is measured. This is the span, M, which is the distance between the external tangents of the two rods. To measure this, two round rods of the same diameter are placed in opposing tooth grooves, and the distance between the external tangents of the two rods is measured. Currently, the span of external splines is primarily measured by operators using round rods and a vernier caliper. The operator first manually positions the round rods and the component being measured, then uses a vernier caliper to measure the distance between the external tangents of the two rods.

[0003] Patent publication number CN205228345U discloses a device for quickly measuring the span of external splines. The device includes a measuring platform, a gauge body, and a calibration block. The measuring platform is connected to a swivel arm, which is fixed to a positioning sleeve. A micrometer is screwed onto the gauge body, with the measuring head positioned at the end face of the workpiece to be measured. The calibration block is installed in the gauge body during calibration. The workpiece to be tested is inserted into the gauge body, held perpendicular to the gauge body, and moved left and right to find the maximum value. The value measured by the dial indicator pointer is the external spline span measurement.

[0004] In the above patent, the measuring head of the micrometer abuts against the end face of the workpiece to be measured. Since the elastic force of the measuring head of the micrometer is not large, the abutment against the workpiece is not tight enough, resulting in a certain measurement error. Summary of the Invention

[0005] The present invention proposes a simple adjustable external spline span measuring instrument. When measuring a workpiece, the workpiece is placed between the upper probe and the lower probe. At this time, the spring is in a compressed state, and the workpiece is in close contact with the thimble of the upper probe. Its size is displayed on the micrometer. It is only necessary to observe whether the scale value on the micrometer 19 is within the qualified range to determine whether the workpiece is qualified.

[0006] The present invention provides a simple and adjustable external spline span measuring instrument, comprising:

[0007] The base 1 comprises a measuring end and an adjusting end. The base 1 is symmetrically provided with a through hole 2 and a threaded hole 3 . A locking threaded hole 13 is provided on the back of the through hole 2 .

[0008] The adjusting end includes a lower probe seat 4, a fixed block 5 and a lower probe 7. The lower probe seat 4 is provided with a lower connecting external thread 6 on the outside, the upper end of which cooperates with the threaded hole 3, and the lower end cooperates with the internal thread on the fixed block 5.

[0009] The lower probe internal thread 9 provided at the upper end of the lower probe base 4 cooperates with the lower probe external thread 8 provided at the tail end of the lower probe 7 .

[0010] The measuring end includes a fixing sleeve 10, a dial chuck 16 and a micrometer 19. The fixing sleeve 10 is provided with large and small ends. The small end is inserted into the through-hole 2 and is locked by the bolt of the locking threaded hole 13. The large end of the fixing sleeve 10 is provided with a large through-hole 11 and the small end is provided with a small through-hole 12.

[0011] A slider 15 is provided inside the large through-hole 11 , and a slide rod 14 at its tail passes through the small through-hole 12 . An upper probe internal thread 23 provided at the end of the slide rod 14 cooperates with an upper probe external thread 22 provided at the tail of the upper probe 21 .

[0012] A spring 20 is provided between the watch chuck 16 and the slider 15 , one end of which abuts against the ring end surface of the watch chuck 16 and the other end abuts against the slider 15 .

[0013] The large hole external thread 18 provided on the outside of the dial clamp 16 cooperates with the large hole internal thread 17 provided on the inner wall of the large through-hole 11 to fix the micrometer 19. The thimble of the micrometer 19 passes through the dial clamp 16 and the spring 20 and abuts against the top surface of the slider 15.

[0014] Before measurement, check whether the bolts locking the threaded holes 13 are tightened on the measuring end, and then use the calibration block 24 for calibration, and make the first slot 25 and the second slot 26 of the calibration block 24 correspond to the upper probe 21 and the lower probe 7 respectively.

[0015] That is: the upper probe 21 is plugged into the first slot 25, and the lower probe 7 is plugged into the second slot 26. At this time, the upper probe 21 pushes the slide bar 14 to move upward, and the slide bar 14 drives the upper slider 15 to move upward. At this time, the spring 20 is compressed, and the slider 15 pushes the pin of the dial indicator 19 to move upward. Observe whether the reading of the dial indicator 19 returns to zero to determine whether the distance between the lower probe 7 and the upper probe 21 is accurate.

[0016] If it is inaccurate, rotate the fixed block 5 and then rotate the lower probe base 4 to return the reading of the lower dial indicator 19 to zero, then lock the fixed block 5 to lock the position of the lower probe base 4 and complete the calibration adjustment.

[0017] After calibration is completed, the workpiece can be placed between the upper probe 21 and the lower probe 7. At this time, the spring 20 is in a compressed state, and the workpiece is in close contact with the ejector pin of the upper probe 21. Its size is displayed on the micrometer 19.

[0018] It is only necessary to observe whether the scale value on the micrometer 19 is within the qualified range to determine whether the workpiece is qualified. The detection is very convenient and the detection efficiency is improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 This is a schematic diagram of a simple adjustable external spline span gauge;

[0020] Figure 2 for Figure 1 A partial enlarged view of point I in the middle;

[0021] Figure 3 for Figure 1 A partial enlarged view of position II in the middle;

[0022] Figure 4 This is a schematic diagram of the structure of the calibration block for the proofreading block;

[0023] Figure 5 It is a cross-sectional view of the substrate AA.

[0024] In the figure: 1. base; 2. through-hole; 3. threaded hole; 4. lower probe base; 5. fixing block; 6. lower connecting external thread; 7. lower probe; 8. lower probe external thread; 9. lower probe internal thread; 10. fixing sleeve; 11. large through-hole; 12. small through-hole; 13. locking threaded hole; 14. slide bar; 15. slide block; 16. dial chuck; 17. large hole internal thread; 18. large hole external thread; 19. micrometer; 20. spring; 21. upper probe; 22. upper probe external thread; 23. upper probe internal thread; 24. calibration block; 25. first slot; 26. second slot. DETAILED DESCRIPTION

[0025] like Figure 1-5 As shown, the present invention provides a simple and adjustable external spline span measuring instrument, comprising:

[0026] The base 1 comprises a measuring end and an adjusting end. The base 1 is symmetrically provided with a through hole 2 and a threaded hole 3 . A locking threaded hole 13 is provided on the back of the through hole 2 .

[0027] The adjusting end includes a lower probe seat 4, a fixed block 5 and a lower probe 7. The lower probe seat 4 is provided with a lower connecting external thread 6 on the outside, the upper end of which cooperates with the threaded hole 3, and the lower end cooperates with the internal thread on the fixed block 5.

[0028] The lower probe internal thread 9 provided at the upper end of the lower probe base 4 cooperates with the lower probe external thread 8 provided at the tail end of the lower probe 7 .

[0029] The measuring end includes a fixing sleeve 10, a dial chuck 16 and a micrometer 19. The fixing sleeve 10 is provided with large and small ends. The small end is inserted into the through-hole 2 and is locked by the bolt of the locking threaded hole 13. The large end of the fixing sleeve 10 is provided with a large through-hole 11 and the small end is provided with a small through-hole 12.

[0030] A slider 15 is provided inside the large through-hole 11 , and a slide rod 14 at its tail passes through the small through-hole 12 . An upper probe internal thread 23 provided at the end of the slide rod 14 cooperates with an upper probe external thread 22 provided at the tail of the upper probe 21 .

[0031] A spring 20 is provided between the watch chuck 16 and the slider 15 , one end of which abuts against the ring end surface of the watch chuck 16 and the other end abuts against the slider 15 .

[0032] The large hole external thread 18 provided on the outside of the dial clamp 16 cooperates with the large hole internal thread 17 provided on the inner wall of the large through-hole 11 to fix the micrometer 19. The thimble of the micrometer 19 passes through the dial clamp 16 and the spring 20 and abuts against the top surface of the slider 15.

[0033] Calibration process: First check whether the bolts locking the threaded holes 13 are tightened on the measuring end, then use the calibration block 24 for calibration, and adjust the first slot 25 and the second slot 26 of the calibration block 24 to correspond to the upper probe 21 and the lower probe 7 respectively.

[0034] That is: the upper probe 21 is plugged into the first slot 25, and the lower probe 7 is plugged into the second slot 26. At this time, the upper probe 21 pushes the slide bar 14 to move upward, and the slide bar 14 drives the upper slider 15 to move upward. At this time, the spring 20 is compressed, and the slider 15 pushes the pin of the dial indicator 19 to move upward. Observe whether the reading of the dial indicator 19 returns to zero to determine whether the distance between the lower probe 7 and the upper probe 21 is accurate.

[0035] If it is inaccurate, rotate the fixed block 5 and then rotate the lower probe base 4 to return the reading of the lower dial indicator 19 to zero, then lock the fixed block 5 to lock the position of the lower probe base 4 and complete the calibration adjustment.

[0036] Measuring process: The workpiece can be placed between the upper probe 21 and the lower probe 7. At this time, the spring 20 is in a compressed state, and the workpiece is in close contact with the ejector pin of the upper probe 21. Its size is displayed on the micrometer 19.

[0037] It is only necessary to observe whether the scale value on the micrometer 19 is within the qualified range to determine whether the workpiece is qualified. The detection is very convenient and the detection efficiency is improved.

[0038] Technical effect:

[0039] 1. The workpiece is placed between the upper and lower probes. At this time, the spring is in a compressed state, giving the upper probe a downward force, so that the upper probe is closely in contact with the groove of the workpiece, making the measurement more accurate.

[0040] 2. Adjust the fixed block and rotate the lower probe seat to adjust the lower probe to the accurate position. Then rotate the fixed block to abut against the outer wall of the base, thereby locking the position of the lower probe seat. It is very convenient to complete the calibration adjustment.

[0041] 3. You only need to observe whether the scale value of the micrometer is within the qualified scale range to determine whether the workpiece is qualified. The detection is very convenient and improves the detection efficiency.

[0042] The above are only preferred implementations of the present invention, which are intended to reflect the outstanding technical effects and advantages of the present invention, and are not intended to limit the technical solutions of the present invention.

[0043] Those skilled in the art should understand that all modifications, changes or replacement technical features based on the technical content of the utility model should be included in the technical scope claimed by the claims attached to the utility model.

Claims

1. A simple and adjustable external spline span measuring instrument, characterized in that: It comprises a base (1), a measuring end and an adjusting end. The base (1) is symmetrically provided with a through hole (2) and a threaded hole (3). The back side of the through hole (2) is provided with a locking threaded hole (13).

2. A simple adjustable external spline span measuring instrument according to claim 1, characterized in that: The adjusting end comprises a lower probe seat (4), a fixing block (5) and a lower probe (7); the lower probe seat (4) is provided with a lower connecting external thread (6) on the outside, the upper end of which cooperates with the threaded hole (3) and the lower end cooperates with the internal thread on the fixing block (5).

3. A simple adjustable external spline span measuring instrument according to claim 2, characterized in that: The lower probe internal thread (9) provided at the upper end of the lower probe seat (4) cooperates with the lower probe external thread (8) provided at the rear end of the lower probe (7).

4. A simple adjustable external spline span measuring instrument according to claim 1, characterized in that: The measuring end comprises a fixing sleeve (10), a gauge chuck (16) and a micrometer (19); the fixing sleeve (10) is provided with two ends, large and small; the small end is inserted into the through hole (2) and is locked by a bolt through a locking threaded hole (13); the large end of the fixing sleeve (10) is provided with a large through hole (11) and the small end is provided with a small through hole (12).

5. A simple adjustable external spline span measuring instrument according to claim 4, characterized in that: A slider (15) is provided inside the large through hole (11), and a slider (14) at the tail thereof passes through the small through hole (12). An upper probe internal thread (23) provided at the end of the slider (14) cooperates with an upper probe external thread (22) provided at the tail of the upper probe (21).

6. A simple adjustable external spline span measuring instrument according to claim 4, characterized in that: A spring (20) is provided between the watch chuck (16) and the slider (15), one end of which abuts against the ring end surface of the watch chuck (16) and the other end of which abuts against the slider (15).

7. A simple adjustable external spline span measuring instrument according to claim 4 or 6, characterized in that: The large hole external thread (18) provided on the outside of the dial chuck (16) cooperates with the large hole internal thread (17) provided on the inner wall of the large through hole (11) to fix the micrometer (19); the ejector pin of the micrometer (19) passes through the dial chuck (16) and the spring (20) and abuts against the top surface of the slider (15).

Images