Test base plate for integrated test of ambient brightness

Abstract

The embodiment of the utility model belongs to the technical field of ambient brightness testing. The utility model also relates to a test base plate for integrated test of ambient brightness, which comprises a test base plate main body, an ambient brightness test circuit is integrated on the test base plate main body, the ambient brightness test circuit is used for detecting the ambient brightness of the test base plate main body, and the ambient brightness test circuit is connected with a controller. The environment brightness test circuit comprises a driving IC connected with the controller, and the driving IC is connected with a temperature induction sensor. The environment brightness test circuit is integrated on the test base plate, and the environment brightness test circuit is used for detecting the environment brightness of the test base plate main body, so that the automatic test of the environment brightness can be directly completed on the test base plate main body, no environment brightness test equipment needs to be additionally configured, the detection process is simplified, and the detection efficiency is improved. As the environment brightness test circuit can automatically sample and measure the environment brightness, the influence of human factors is reduced.

Description

Technical Field

[0001] The utility model relates to the technical field of environmental brightness testing, and more specifically to a testing base plate for integrated testing of environmental brightness. Background Art

[0002] Display screens are widely used in today's society and can be seen everywhere. Through display screens, information can be expressed more intuitively and vividly. In the industrial and consumer fields, in addition to the products that commonly use display screens, such as monitors, telephones, handheld scanners, cameras, etc., many previously unused devices are now also beginning to use display screens, such as remote controls, ovens, refrigerators, etc. Display screens have a huge market for use, and the shipment volume of display screen modules is also huge. The test and shipment of display screen modules have special requirements for the ambient brightness of the functional inspection post. It cannot be too bright or too dark. If the ambient brightness is too bright or too dark, it will affect the functional inspection of the display screen, which will cause some display problems to be unable to be detected or the inspection judgment to be incorrect. Therefore, when using the test base plate to detect the display screen at the display screen function inspection post, it is necessary to configure the ambient brightness detection equipment to test and confirm whether the ambient brightness meets the specifications.

[0003] Traditional ambient brightness detection methods usually require manual operation of ambient brightness test equipment to sample and measure ambient brightness, and then compare it with the preset specification value. This method is not only cumbersome to operate, but also easily affected by human factors, resulting in low accuracy of the measurement results. In addition, the manual brightness detection operation delays the test time of the display, thus affecting production efficiency. Therefore, we have improved this and proposed a test baseboard for integrated testing of ambient brightness. Utility Model Content

[0004] The technical problem to be solved by the embodiments of the utility model is that the ambient brightness test equipment needs to be manually operated, and the measurement result has low accuracy and low efficiency.

[0005] In order to solve the above technical problems, the utility model adopts the following technical solutions:

[0006] A test baseboard for integrated testing of ambient brightness comprises: a test baseboard body, an ambient brightness test circuit integrated on the test baseboard body, the ambient brightness test circuit being used for the test baseboard body to detect ambient brightness, the ambient brightness test circuit being connected to a controller, the ambient brightness test circuit comprising a driver IC connected to the controller, the driver IC being connected to a temperature sensing sensor, by integrating the ambient brightness test circuit on the test baseboard, the ambient brightness test circuit being used for the test baseboard body to detect ambient brightness, thereby being able to directly complete an automatic test of ambient brightness on the test baseboard body, without the need to configure an additional ambient brightness test device, thereby simplifying the detection process, and since the ambient brightness test circuit can automatically perform sampling and measurement of ambient brightness, the influence of human factors is reduced, the accuracy of the measurement result is improved, and the production efficiency is improved.

[0007] As an improved method of the utility model, the temperature sensing sensor is used to test the detection of the ambient brightness of the bottom plate body, and the driver IC is used to drive the temperature sensing sensor and transmit the detection data of the temperature sensing sensor to the controller.

[0008] As an improved manner of the utility model, the controller is also connected to a buzzer circuit, and the buzzer circuit is connected to a buzzer.

[0009] As an improvement of the present invention, the controller is further connected to a touch screen, and the touch screen is used to display the detected brightness data.

[0010] As an improved manner of the utility model, the ambient brightness test circuit includes a control chip U, a pin No. of the control chip U is connected to a capacitor C, and the capacitor C is grounded, and a pin No. of the control chip U is also grounded.

[0011] As an improvement of the present invention, pin 3 of the control chip U1 is also connected to a digital power supply VDD.

[0012] As an improvement of the present invention, pin No. 6 of the control chip U1 is connected to a control line SCL and a resistor R2 , and the resistor R2 is connected to a digital power supply VDD.

[0013] As an improved approach of the present invention, pin No. 4 of the control chip U1 is connected to a control line SDA and a resistor R1 , and one end of the resistor R1 is connected between the resistor R2 and a digital power supply VDD.

[0014] As an improved manner of the utility model, the buzzer circuit includes a transistor Q8, the B pole of the transistor Q8 is connected to a resistor R21, and the resistor R21 is connected to a BEEP input terminal.

[0015] As an improvement of the utility model, the C pole of the transistor Q8 is connected to the diode D1, and the C pole of the transistor Q8 is also connected to the buzzer, the power supply VCC is connected between the buzzer and the diode D1, and the E pole of the transistor Q8 is grounded.

[0016] Compared with the prior art, the embodiments of the present invention mainly have the following beneficial effects:

[0017] In order to solve the problem in the prior art that the ambient brightness test equipment needs to be manually operated, and the measurement results have low accuracy and low efficiency, an ambient brightness test circuit is integrated on a test baseboard. The ambient brightness test circuit is used to test the ambient brightness of the test baseboard main body, so that the automatic test of the ambient brightness can be completed directly on the test baseboard main body without the need for additional configuration of the ambient brightness test equipment, thereby simplifying the detection process. Since the ambient brightness test circuit can automatically sample and measure the ambient brightness, the influence of human factors is reduced, the accuracy of the measurement results is improved, and the production efficiency is improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 A schematic diagram of the structure of the test baseboard for integrated testing of environmental brightness provided in this application;

[0019] Figure 2 A system diagram of a test baseboard for integrated testing of environmental brightness provided by this application;

[0020] Figure 3 A circuit diagram of an ambient brightness test circuit of a test baseboard for integrated testing of ambient brightness provided in the present application;

[0021] Figure 4 A circuit diagram of a temperature sensing sensor for a test baseboard for integrated testing of environmental brightness provided in the present application.

[0022] Indicated in the figure:

[0023] 100, test base plate body; 200, ambient brightness test circuit; 201, driver IC; 202, temperature sensor; 300, buzzer circuit. DETAILED DESCRIPTION

[0024] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those generally understood by those skilled in the art to which the present invention belongs; the terms used in the specification of the application herein are only for the purpose of describing specific embodiments and are not intended to limit the present invention. Reference to "embodiments" herein means that specific features, structures, or characteristics described in conjunction with the embodiments may be included in at least one embodiment of the present invention. The appearance of this phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0025] As described in the background technology, traditional ambient brightness detection methods usually require manual operation of ambient brightness test equipment to sample and measure the ambient brightness, and then compare it with the preset specification value. This method is not only cumbersome to operate, but also easily affected by human factors, resulting in low accuracy of the measurement results. The manual brightness detection operation delays the testing time of the display screen, thereby affecting production efficiency.

[0026] In order to solve this technical problem, the utility model provides a test base plate with integrated test environment brightness.

[0027] Specifically, please refer to Figure 1-Figure 2 , the test baseboard for integrated test environment brightness specifically includes:

[0028] The test base plate body 100 has an integrated ambient brightness test circuit 200, which is used to detect the ambient brightness of the test base plate body 100. The ambient brightness test circuit 200 is connected to a controller, and the ambient brightness test circuit 200 includes a driver IC 201 connected to the controller, and the driver IC 201 is connected to a temperature sensing sensor 202.

[0029] The utility model provides a test baseboard for integrated testing of ambient brightness. By integrating an ambient brightness test circuit 200 on the test baseboard, the ambient brightness test circuit 200 is used to test the baseboard main body 100 to detect the ambient brightness, so that the automatic test of the ambient brightness can be completed directly on 1 without the need for additional configuration of ambient brightness test equipment, thereby simplifying the detection process. Since the ambient brightness test circuit 200 can automatically sample and measure the ambient brightness, the influence of human factors is reduced, the accuracy of the measurement result is improved, and the production efficiency is improved.

[0030] In order to enable those skilled in the art to better understand the solution of the utility model, the technical solution in the embodiment of the utility model will be clearly and completely described below in conjunction with the accompanying drawings.

[0031] It should be noted that, in the absence of conflict, the embodiments of the present invention and the features and technical solutions in the embodiments may be combined with each other.

[0032] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0033] Embodiment 1 of the test baseboard for integrated testing of environmental brightness of the utility model

[0034] Please refer to Figure 1-Figure 2 The utility model integrates a test baseboard for testing ambient brightness, including: a test baseboard main body 100, an ambient brightness test circuit 200 integrated on the test baseboard main body 100, the ambient brightness test circuit 200 is used for the test baseboard main body 100 to detect ambient brightness, the ambient brightness test circuit 200 is connected to a controller, the ambient brightness test circuit 200 includes a driver IC 201 connected to the controller, the driver IC 201 is connected to a temperature sensing sensor 202, by integrating the ambient brightness test circuit 200 on the test baseboard, the ambient brightness test circuit 200 is used for the test baseboard main body 100 to detect ambient brightness, so that the automatic test of ambient brightness can be completed directly on the test baseboard main body 100, without the need to additionally configure ambient brightness test equipment, thereby simplifying the detection process, because the ambient brightness test circuit 200 can automatically sample and measure the ambient brightness, reducing the influence of human factors, improving the accuracy of the measurement results, and improving production efficiency.

[0035] Furthermore, the temperature sensing sensor 202 is used to test the detection of the ambient brightness by the base plate body 100, and the driver IC 201 is used to drive the temperature sensing sensor 202 and transmit the detection data of the temperature sensing sensor 202 to the controller. The controller can set the range value of the ambient brightness. If it exceeds the range value, a buzzer can be used to alarm. There is no need to use ambient brightness testing equipment to test the ambient brightness, thereby improving production efficiency.

[0036] Further, such as Figure 1 and Figure 2 As shown, the controller is also connected to a buzzer circuit 300, and the buzzer circuit 300 is connected to a buzzer. The buzzer can alarm when the ambient brightness exceeds a set range value, thereby reminding the staff to ensure that the control of the ambient brightness meets the requirements.

[0037] Further, such as Figure 2 As shown, the controller is also connected to a touch screen, which is used to display the detected brightness data, so that the staff can intuitively understand the brightness of the test environment, further improving the convenience and practicality of the test;

[0038] A buzzer is an integrated electronic sounder that is mainly used to send out sound signals. Its working principle is based on the piezoelectric effect or electromagnetic effect. When an alternating voltage is applied to it, the buzzer will generate mechanical vibrations, which in turn drive the air to vibrate and produce sound. Buzzers are widely used in many fields; buzzers play an important role in alarm systems.

[0039] Embodiment 2 of the utility model for testing the brightness of the integrated testing environment

[0040] The utility model further integrates the test base plate for testing the brightness of the environment, such as Figure 3 As shown, the ambient brightness test circuit 200 includes a control chip U1, pin 3 of the control chip U1 is connected to capacitor C1, and capacitor C1 is grounded, and pin 1 of the control chip U1 is also grounded. These detailed circuit designs provide a hardware basis for automatic testing of ambient brightness. Chip U1 is connected to capacitor C1 for power filtering or decoupling, and the other end of capacitor C1 is grounded to provide a stable voltage environment for the control chip U1. Pin 1 of the control chip U1 is also grounded, which is usually the reference ground of the chip or the negative pole of the power supply.

[0041] Further, such as Figure 3 As shown, pin 3 of the control chip U1 is also connected to a digital power supply VDD. In addition to being connected to the capacitor C1, pin 3 is also connected to the digital power supply VDD to provide the control chip U1 with the digital power required for operation.

[0042] Further, such as Figure 3 As shown, pin 6 of the control chip U1 is connected to the control line SCL and the resistor R2. The resistor R2 is connected to the digital power supply VDD. The resistor R2 plays a role of current limiting and protection, and ensures the stability of the signal on the control line SCL.

[0043] Further, such as Figure 3 As shown, pin 4 of the control chip U1 is connected to the control line SDA and the resistor R1. One end of the resistor R1 is connected between the resistor R2 and the digital power supply VDD. The function of the resistor R1 is similar to that of the resistor R2, ensuring the stability of the signal on the control line SDA. One end of the resistor R1 is connected between the resistor R2 and the digital power supply VDD to form a simple voltage divider circuit, which may provide a suitable voltage level for the control line SDA.

[0044] Embodiment 3 of the test baseboard for integrated testing of environmental brightness of the utility model

[0045] The utility model further integrates the test base plate for testing the brightness of the environment, such as Figure 4As shown, the buzzer circuit 300 includes a transistor Q8, the B pole of the transistor Q8 is connected to a resistor R21, and the resistor R21 is connected to a BEEP input terminal. The BEEP input terminal is a signal source from a controller and is used to control the switch of the buzzer.

[0046] Further, such as Figure 4 As shown, the C pole of transistor Q8 is connected to diode D1, and the C pole of transistor Q8 is also connected to the buzzer. A power supply VCC is connected between the buzzer and diode D1 to provide the required power for the buzzer. The E pole of transistor Q8 is grounded.

[0047] Obviously, the embodiments described above are only some embodiments of the utility model, rather than all embodiments. The preferred embodiments of the utility model are given in the accompanying drawings, but they do not limit the patent scope of the utility model. The utility model can be implemented in many different forms. On the contrary, the purpose of providing these embodiments is to make the understanding of the disclosure of the utility model more thorough and comprehensive. Although the utility model is described in detail with reference to the aforementioned embodiments, for those skilled in the art, it is still possible to modify the technical solutions recorded in the aforementioned specific implementation methods, or to replace some of the technical features therein with equivalents. Any equivalent structure made using the contents of the utility model specification and the accompanying drawings, directly or indirectly used in other related technical fields, is also within the scope of patent protection of the utility model.

Claims

1. A test baseboard for integrated test environment brightness, characterized in that: include: A test base plate body (100), wherein an ambient brightness test circuit (200) is integrated on the test base plate body (100), wherein the ambient brightness test circuit (200) is used for detecting ambient brightness of the test base plate body (100), wherein the ambient brightness test circuit (200) is connected to a controller, wherein the ambient brightness test circuit (200) comprises a driver IC (201) connected to the controller, and wherein the driver IC (201) is connected to a temperature sensing sensor (202).

2. The test baseboard for integrated test environment brightness according to claim 1, characterized in that: The temperature sensing sensor (202) is used to test the detection of ambient brightness by the bottom plate body (100), and the driving IC (201) is used to drive the temperature sensing sensor (202) and transmit the detection data of the temperature sensing sensor (202) to the controller.

3. The test baseboard for integrated test environment brightness according to claim 2, characterized in that: The controller is also connected to a buzzer circuit (300), and the buzzer circuit (300) is connected to a buzzer.

4. The test baseboard for integrated test environment brightness according to claim 3, characterized in that: The controller is also connected to a touch screen, and the touch screen is used to display the detected brightness data.

5. The test baseboard for integrated testing of environmental brightness according to claim 4, characterized in that: The ambient brightness test circuit (200) comprises a control chip U1, wherein pin No. 3 of the control chip U1 is connected to a capacitor C1, and the capacitor C1 is grounded, and pin No. 1 of the control chip U1 is also grounded.

6. The test baseboard for integrated testing of environmental brightness according to claim 5, characterized in that: Pin 3 of the control chip U1 is also connected to a digital power supply VDD.

7. The test baseboard for integrated testing of environmental brightness according to claim 6, characterized in that: Pin No. 6 of the control chip U1 is connected to a control line SCL and a resistor R2 , and the resistor R2 is connected to a digital power supply VDD.

8. The test baseboard for integrated testing of environmental brightness according to claim 7, characterized in that: Pin No. 4 of the control chip U1 is connected to a control line SDA and a resistor R1 , and one end of the resistor R1 is connected between the resistor R2 and a digital power supply VDD.

9. The test baseboard for integrated testing of environmental brightness according to claim 8, characterized in that: The buzzer circuit (300) comprises a transistor Q8, the B pole of the transistor Q8 is connected to a resistor R21, and the resistor R21 is connected to a BEEP input terminal.

10. The test baseboard for integrated testing of environmental brightness according to claim 9, characterized in that: The C pole of the transistor Q8 is connected to the diode D1, and the C pole of the transistor Q8 is also connected to the buzzer, a power source VCC is connected between the buzzer and the diode D1, and the E pole of the transistor Q8 is grounded.

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