Test fixture

Abstract

The utility model belongs to the technical field of test equipment, and discloses a test fixture, which comprises a frame body, a support plate, a movable plate and an adapter assembly, the frame body is provided with a connector, the support plate is fixed on the frame body, the movable plate is arranged on the frame body and positioned above the support plate, the movable plate is arranged in a lifting manner relative to the support plate, and the adapter assembly is connected with the connector. A test probe is arranged on the end face of the side, facing the supporting plate, of the movable plate, the switching assembly comprises an upper switching probe and a lower switching probe, the upper switching probe is arranged on the end face of the side, facing the supporting plate, of the movable plate, the lower switching probe is arranged on the end face of the side, facing the movable plate, of the supporting plate, and the upper switching probe is electrically connected with the test probe. The lower switching probe is electrically connected with the connector, and the upper switching probe is suitable for being connected with the lower switching probe in an inserted mode and electrically connected with the lower switching probe when the movable plate descends in place relative to the supporting plate. The test fixture is simple in structure, and the electrical connection between the test probe and the connector is hidden by using the switching assembly, so that the electrical connection is more reliable and stable.

Description

Technical Field

[0001] The utility model relates to the technical field of testing equipment, in particular to a testing fixture. Background Art

[0002] PCBA (Printed Circuit Board Assembly) is the entire process of assembling a printed circuit board, which is a blank PCB board that goes through SMT mounting and then DIP plug-in, referred to as PCBA.

[0003] At present, PCBA must be tested accordingly before leaving the factory to determine whether the PCBA functions normally. The test process usually uses a burner in conjunction with a test fixture to detect the PCBA. Specifically, the test fixture includes a support plate and a movable plate. The support plate is used to support the PCBA. The movable plate is arranged above the support plate and can be raised and lowered relative to the support plate. The movable plate is provided with a test probe that can be electrically conductive with the PCBA. In the prior art, the test probe is connected to the connector on the test fixture through an external wiring harness, and the external wiring harness is usually exposed to the external environment, which is cumbersome and disordered and lacks effective constraints. It will curl and move arbitrarily over a large range as the movable plate rises and falls. The external wiring harness will be pulled, entangled, damaged, etc., which will affect the overall service life and reliability of the equipment. Utility Model Content

[0004] The utility model aims to provide a test fixture, which uses a transfer assembly to hide the electrical connection between a test probe and a connector, so that the electrical connection is more reliable and stable.

[0005] To achieve this purpose, the utility model adopts the following technical solutions:

[0006] A test fixture, comprising:

[0007] A frame body provided with a connector;

[0008] A support plate, fixed on the frame;

[0009] A movable plate, arranged on the frame and located above the support plate, the movable plate can be raised and lowered relative to the support plate, and a test probe is arranged on the end surface of the movable plate facing the support plate;

[0010] The adapter assembly includes an upper adapter probe and a lower adapter probe, wherein the upper adapter probe is arranged on the end surface of the movable plate facing the support plate, and the lower adapter probe is arranged on the end surface of the support plate facing the movable plate, the upper adapter probe is electrically connected to the test probe, and the lower adapter probe is electrically connected to the connector;

[0011] The upper transfer probe is suitable for being plugged into and electrically connected with the lower transfer probe when the movable plate is lowered into position relative to the support plate.

[0012] Preferably, the test probe is electrically connected to the upper transfer probe via a data line, and the data line is located on a side of the movable plate away from the support plate.

[0013] Preferably, a cable tie is provided on the end surface of the movable plate away from the support plate, and the data cable passes through the cable tie.

[0014] Preferably, there are a plurality of cable tie buckles.

[0015] Preferably, a wiring groove is provided on an end surface of the movable plate away from the supporting plate, and the data line is arranged in the wiring groove.

[0016] Preferably, a limiting head is protrudingly provided on the end surface of the movable plate on the side facing the support plate, and the limiting head is suitable for abutting against the support plate when the movable plate is lowered into place relative to the support plate.

[0017] Preferably, a driving cylinder is provided on the frame, a cylinder body of the driving cylinder is fixed on the frame, and the movable plate is fixed on a cylinder rod of the driving cylinder.

[0018] Preferably, one of the movable plate and the support plate is provided with a guide shaft, and the other is provided with a guide hole, and the guide shaft is suitable for sliding through the guide hole during the process of the movable plate being lifted or lowered relative to the support plate.

[0019] Preferably, the movable plate is arranged opposite to the supporting plate.

[0020] Preferably, the upper adapter probe is arranged at an edge of an end surface of the movable plate facing the support plate, and the lower adapter probe is arranged at an edge of an end surface of the support plate facing the movable plate.

[0021] Beneficial effects:

[0022] The test fixture provided by the utility model is provided with a transfer assembly, and the transfer assembly includes an upper transfer probe and a lower transfer probe, the upper transfer probe is electrically connected to the test probe, and the lower transfer probe is electrically connected to the connector. When the PCBA is tested, the PCBA is supported on a support plate, and the movable plate is controlled to descend relative to the support plate so that the test probe can approach the PCBA. When the movable plate is lowered into place relative to the support plate, the test probe contacts the target conductive point on the PCBA, and the upper transfer probe and the lower transfer probe are plugged and electrically connected, so that the test probe can be electrically connected through the upper transfer probe, the lower transfer probe and the connector in turn, thereby enabling the PCBA to be electrically connected to the connector. The setting of the transfer assembly in the test fixture can hide the electrical connection between the test probe and the connector, so as to replace the redundant and disordered external wiring harness, so as to avoid the pulling, entanglement, damage and the like of the external wiring harness, and ensure the overall reliability of the equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 It is a structural schematic diagram of the test fixture provided by the utility model;

[0024] Figure 2 It is a partial structural schematic diagram of the test fixture provided by the utility model;

[0025] Figure 3 It is a partial structural schematic diagram of the test fixture provided by the utility model;

[0026] Figure 4 It is a partial structural schematic diagram of the test fixture provided by the utility model;

[0027] Figure 5 It is a partial structural schematic diagram of the test fixture provided by the utility model.

[0028] In the figure:

[0029] 1. Frame; 11. Driving cylinder;

[0030] 2. Support plate; 21. Guide shaft;

[0031] 3. movable plate; 31. test probe; 32. data cable; 33. cable buckle; 34. limit head; 35. sliding shaft; 351. guide hole;

[0032] 41. Upper transfer probe; 42. Lower transfer probe. DETAILED DESCRIPTION

[0033] The present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It is to be understood that the specific embodiments described herein are only used to explain the present invention, rather than to limit the present invention. It should also be noted that, for ease of description, only the parts related to the present invention, rather than all structures, are shown in the accompanying drawings.

[0034] In the description of the present invention, unless otherwise clearly specified and limited, the terms "connected", "connected", and "fixed" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0035] In the present utility model, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may include that the first and second features are in direct contact, or may include that the first and second features are not in direct contact but are in contact through another feature between them. Moreover, a first feature being "above", "above" and "above" a second feature includes that the first feature is directly above and obliquely above the second feature, or simply indicates that the first feature is higher in level than the second feature. A first feature being "below", "below" and "below" a second feature includes that the first feature is directly below and obliquely below the second feature, or simply indicates that the first feature is lower in level than the second feature.

[0036] In the description of this embodiment, the terms "upper", "lower", "right", etc., are based on the directions or positions shown in the drawings, and are only for the convenience of description and simplified operation, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore cannot be understood as a limitation of the present invention. In addition, the terms "first" and "second" are only used to distinguish in the description and have no special meaning.

[0037] This embodiment provides a test fixture. Figures 1 to 5As shown, the test fixture includes a frame 1, a support plate 2, a movable plate 3 and an adapter assembly, wherein the frame 1 is provided with a connector; the support plate 2 is fixed on the frame 1; the movable plate 3 is arranged on the frame 1 and is located above the support plate 2, the movable plate 3 can be raised and lowered relative to the support plate 2, and a test probe 31 is arranged on the end surface of the movable plate 3 facing the support plate 2; the adapter assembly includes an upper adapter probe 41 and a lower adapter probe 42, the upper adapter probe 41 is arranged on the end surface of the movable plate 3 facing the support plate 2, the lower adapter probe 42 is arranged on the end surface of the support plate 2 facing the movable plate 3, the upper adapter probe 41 is electrically connected to the test probe 31, and the lower adapter probe 42 is electrically connected to the connector; the upper adapter probe 41 is suitable for being plugged into and electrically connected with the lower adapter probe 42 when the movable plate 3 is lowered into place relative to the support plate 2.

[0038] In this embodiment, when the PCBA is tested, the PCBA is supported on the support plate 2, and the movable plate 3 is controlled to descend relative to the support plate so that the test probe 31 can approach the PCBA. When the movable plate 3 descends to the position relative to the support plate 2, the test probe 31 contacts the target conductive point on the PCBA, and the upper transfer probe 41 and the lower transfer probe 42 are plugged and electrically connected, so that the test probe 31 can be electrically connected through the upper transfer probe 41, the lower transfer probe 42 and the connector in turn, so that the PCBA and the connector are electrically connected. The setting of the transfer component in the test fixture can hide the electrical connection between the test probe 31 and the connector, so as to replace the redundant and disordered external wiring harness, so as to avoid the pulling, entanglement, damage and the like of the external wiring harness, and ensure the overall reliability of the equipment.

[0039] Specifically, the upper transfer probe 41 is arranged opposite to the lower transfer probe 42. The upper transfer probe 41 is arranged in a plug shape, and the lower transfer probe 42 is arranged in a cup head needle shape. The plug-shaped upper transfer probe 41 can be plugged into the cup head needle-shaped lower transfer probe 42, and fully contact to achieve electrical conduction.

[0040] In this embodiment, the movable plate 3 is arranged opposite to the support plate 2. Such an arrangement enables the test probes 31 on the movable plate 3 to contact the target conductive points on the PCBA more reliably and accurately.

[0041] In this embodiment, the upper transfer probe 41 is arranged at the edge of the end surface of the movable plate 3 facing the support plate 2, and the lower transfer probe 42 is arranged at the edge of the end surface of the support plate 2 facing the movable plate 3. Such an arrangement can provide sufficient placement space for the PCBA, and avoid the upper transfer probe 41 and the lower transfer probe 42 occupying the space of the PCBA.

[0042] Specifically, in this embodiment, the frame 1 includes a box seat and a support rod protruding from the box seat, the support plate 2 is fixedly arranged on the box seat, and the movable plate 3 can be raised and lowered on the support rod along the vertical direction. The connector is arranged on the box seat. The connector is electrically connected to the lower transfer probe 42 through a wiring harness. The wiring harness between the connector and the lower transfer probe 42 is arranged inside the box seat and will not be exposed to the external environment.

[0043] In this embodiment, the test probe 31 is electrically connected to the upper transfer probe 41 through the data line 32, and the data line 32 is located on the side of the movable plate 3 away from the support plate 2. It is worth mentioning that although the data line 32 is also used in this embodiment, it is different from the external wiring harness in the prior art. In this embodiment, the data line 32 plays the role of connecting the test probe 31 and the upper transfer probe 41. The data line 32 is located on the side of the movable plate 3 away from the support plate 2, away from the PCBA pick-up and placement operation space between the bottom of the movable plate 3 and the top of the support plate 2, and is not easily damaged by human beings. The relative position between the test probe 31 and the upper transfer probe 41 on the movable plate 3 is always kept relatively fixed, and the data line 32 will not be randomly curled and moved in a large range as the movable plate 3 rises and falls.

[0044] As an optional implementation, a cable tie 33 is provided on the end surface of the movable plate 3 away from the support plate 2, and the data cable 32 passes through the cable tie 33. By providing the cable tie 33, the data cable 32 passing through the cable tie 33 can effectively constrain the data cable 32, so that the data cable 32 is arranged in an orderly manner, and the data cable 32 itself is prevented from moving randomly.

[0045] The specific structure of the cable tie 33 is prior art and will not be described in detail here.

[0046] Preferably, there are multiple cable ties 33. Multiple cable ties 33 can jointly constrain the direction of the data line 32, further ensuring the constraining effect on the data line 32.

[0047] As an optional implementation, a wiring groove is provided on the end surface of the movable plate 3 away from the support plate 2, and the data cable 32 is arranged in the wiring groove. Specifically, in addition to using the cable buckle 33, the wiring direction of the data cable 32 can also be constrained by opening a wiring groove. The data cable 32 is arranged in the wiring groove, which can also effectively constrain the data cable 32 and prevent the data cable 32 from moving at will.

[0048] Optionally, the direction of the wiring groove is set according to the specific direction of the data line 32, and no further limitation is made here.

[0049] Furthermore, a limit head 34 is protrudingly provided on the end surface of the movable plate 3 facing the support plate 2, and the limit head 34 is suitable for abutting against the support plate 2 when the movable plate 3 is lowered into position relative to the support plate 2. Specifically, by providing the limit head 34, when the movable plate 3 is lowered into position relative to the support plate 2, the limit head 34 abuts against the support plate 2, and the movable plate 3 can be limited in its descent, so as to prevent the movable plate 3 from continuing to descend relative to the support plate 2, causing the test probe 31 to excessively squeeze the PCBA, thereby damaging the test probe and / or the PCBA.

[0050] In this embodiment, a driving cylinder 11 is provided on the frame 1, the cylinder body of the driving cylinder 11 is fixed on the frame 1, and the movable plate 3 is fixed on the cylinder rod of the driving cylinder 11. By providing the driving cylinder 11, the cylinder rod of the driving cylinder 11 is extended and retracted relative to the cylinder body, so that the movable plate 3 can be lifted and lowered relative to the supporting plate 2. The provision of the driving cylinder 11 can improve the overall automation of the equipment.

[0051] Further, one of the movable plate 3 and the support plate 2 is provided with a guide shaft 21, and the other is provided with a guide hole 351, and the guide shaft 21 is suitable for sliding through the guide hole 351 during the process of the movable plate 3 being lifted and lowered relative to the support plate 2. Specifically, the guide shaft 21 is fixedly provided on the support plate 2, and a sliding shaft 35 is fixedly provided on the movable plate 3, and the sliding shaft 35 is provided corresponding to the guide shaft 21, and a guide hole 351 is provided on the sliding shaft 35, and the sliding shaft 35 is slidably sleeved on the guide shaft 21 through the guide hole 351. When the movable plate 3 is lifted and lowered relative to the support plate 2, the sliding shaft 35 can slide up and down on the guide shaft 21 through the guide hole 351, and can guide the lifting and lowering of the movable plate 3 relative to the support plate 2, thereby ensuring the reliability and effectiveness of the lifting and lowering activities of the movable plate 3 relative to the support plate 2.

[0052] Obviously, the above embodiments of the present invention are merely examples for the purpose of clearly illustrating the present invention, and are not intended to limit the implementation methods of the present invention. For those skilled in the art, various obvious changes, readjustments and substitutions can be made without departing from the scope of protection of the present invention. It is not necessary and impossible to list all implementation methods here. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention shall be included in the scope of protection of the claims of the present invention.

Claims

1. A test fixture, characterized in that: include: A frame (1) is provided with a connector; A support plate (2) fixed on the frame (1); A movable plate (3) is arranged on the frame (1) and is located above the support plate (2); the movable plate (3) can be raised and lowered relative to the support plate (2); a test probe (31) is arranged on the end surface of the movable plate (3) facing the support plate (2); The adapter assembly comprises an upper adapter probe (41) and a lower adapter probe (42), wherein the upper adapter probe (41) is arranged on the end surface of the movable plate (3) facing the support plate (2), and the lower adapter probe (42) is arranged on the end surface of the support plate (2) facing the movable plate (3), the upper adapter probe (41) is electrically connected to the test probe (31), and the lower adapter probe (42) is electrically connected to the connector; The upper transfer probe (41) is suitable for being plugged into and electrically connected with the lower transfer probe (42) when the movable plate (3) is lowered into position relative to the support plate (2).

2. The test fixture according to claim 1, characterized in that: The test probe (31) is electrically connected to the upper transfer probe (41) via a data line (32), and the data line (32) is located on a side of the movable plate (3) away from the support plate (2).

3. The test fixture according to claim 2, characterized in that: A cable tie (33) is provided on the end surface of the movable plate (3) on the side away from the support plate (2), and the data cable (32) passes through the cable tie (33).

4. The test fixture according to claim 3, characterized in that: The number of the cable tie buckles (33) is plural.

5. The test fixture according to claim 2, characterized in that: A wiring groove is provided on the end surface of the movable plate (3) away from the support plate (2), and the data line (32) is arranged in the wiring groove.

6. The test fixture according to claim 1, characterized in that: A limit head (34) is protrudingly provided on the end surface of the movable plate (3) on the side facing the support plate (2), and the limit head (34) is suitable for abutting against the support plate (2) when the movable plate (3) is lowered into position relative to the support plate (2).

7. The test fixture according to claim 1, characterized in that: A driving cylinder (11) is arranged on the frame (1), a cylinder body of the driving cylinder (11) is fixed on the frame (1), and the movable plate (3) is fixed on a cylinder rod of the driving cylinder (11).

8. The test fixture according to claim 1, characterized in that: One of the movable plate (3) and the support plate (2) is provided with a guide shaft (21), and the other is provided with a guide hole (351), wherein the guide shaft (21) is suitable for sliding through the guide hole (351) during the process of the movable plate (3) rising and falling relative to the support plate (2).

9. The test fixture according to claim 1, characterized in that: The movable plate (3) is arranged opposite to the supporting plate (2).

10. The test fixture according to claim 1, characterized in that: The upper transfer probe (41) is arranged on the edge of the end surface of the movable plate (3) facing the support plate (2), and the lower transfer probe (42) is arranged on the edge of the end surface of the support plate (2) facing the movable plate (3).

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