Positioning device for chip test
By introducing a cylinder-driven buffer test component into the chip test device and utilizing the buffer function of the slider and spring, the problem of damage caused by the lack of buffer during chip testing in the existing technology is solved, and a safer and more accurate test process is achieved.
Patent Information
- Application Number
- CN202420535349.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-03-19
- Publication Date
- 2025-01-21
- Estimated Expiration
- 2034-03-19
AI Technical Summary
Existing chip test devices lack buffering when contacting the pins with the chip's test points, resulting in the chip being easily damaged by impact.
A positioning device for chip testing is designed, which uses a cylinder to push the buffer test assembly and realizes the buffer function through sliding blocks and springs to avoid direct hard contact.
This effectively prevents the chip from being damaged due to impact during the test, improving the safety and accuracy of the test.
Smart Images
Figure CN222379748U_ABST
Abstract
Description
Technical Field
[0001] The utility model specifically relates to the field of positioning technology, in particular to a positioning device for chip testing. Background Art
[0002] System-level chip testing in the early design stage. SoC is based on deep submicron technology, so a completely new approach is needed to test SoC devices. Since each functional component has its own test requirements, design engineers must make test plans in the early design stage.
[0003] Existing chip testing devices usually use a test machine to contact the test pins with the test points of the chip, and then use the test machine to test the circuit and performance of the chip.
[0004] Generally, the test is performed by manual pin insertion, but this test is inefficient and labor-intensive. Currently, machine pin insertion test devices have emerged, but the existing mechanical test equipment has no buffering function when the pin contacts the test point of the chip, causing the chip to be damaged by impact. Utility Model Content
[0005] The purpose of the utility model is to provide a positioning device for chip testing, which selects several test points and performs contact testing on the chip under the push of a cylinder, and can buffer during the contact process to avoid direct hard contact and damage to the chip, so as to solve the technical problems raised in the above background technology.
[0006] In order to achieve the above purpose, the utility model provides the following technical solutions:
[0007] A positioning device for chip testing includes a testing machine and a cylinder; a push frame is fixed to the end of the cylinder rod of the cylinder; a plurality of buffer test assemblies are provided at the bottom of the push frame; the buffer test assembly includes a slide fixed to the bottom of the push frame, a fixed seat is fixed to the bottom of the slide; a sliding block is slidably connected above the fixed seat, a test pin electrically connected to the testing machine is embedded at the bottom of the sliding block; a spring is sleeved on the outside of the sliding block.
[0008] As a further technical solution of the utility model, the longitudinal section of the fixing seat is C-shaped, and sliding grooves are provided on both sides of the fixing seat to facilitate the sliding of the guide column; there are two guide columns fixed on both sides of the sliding block.
[0009] As a further technical solution of the utility model, the lower end of the spring is fixed to the lower end of the sliding block, and the upper end of the spring is stopped against the sliding rack.
[0010] As a further technical solution of the utility model, two cylinders are provided and fixed on the outer sides of the side plates; the side plates are fixed to the brackets.
[0011] As a further technical solution of the utility model, the bracket is fixed on the workbench; an outer frame and a base frame are fixed on the bottom of the workbench.
[0012] As a further technical solution of the utility model, the workbench is provided with a through slot for facilitating the sliding of the clamping frame, and the clamping frame is connected with a linear slide fixed to the bottom of the workbench; an L baffle is fixed at one end of the through slot away from the clamping frame.
[0013] As a further technical solution of the utility model, a test switch is also fixed on the workbench; the test switch is electrically connected to the linear slide and the solenoid valve of the control cylinder.
[0014] Compared with the prior art, the beneficial effects of the utility model are:
[0015] 1. In the utility model, when in use, first place the chip on the workbench, turn on the test switch, the linear slide drives the clamping frame to move horizontally, the chip is stopped on the L baffle, the cylinder rod of the cylinder extends, and the buffer test assembly is driven downward by the push frame. When the test needle at the bottom of the sliding block contacts the chip, there will be a reaction force. At this time, the test needle and the sliding block drive the spring to move upward to achieve a buffering function; this can not only ensure the contact between the test needle and the chip, but also achieve buffering, avoiding the situation where the chip is damaged due to a large impact. BRIEF DESCRIPTION OF THE DRAWINGS
[0016] Figure 1 It is a three-dimensional structural schematic diagram of the utility model.
[0017] Figure 2 This utility model Figure 1 Schematic diagram of the bottom structure.
[0018] Figure 3 This utility model Figure 1 main view.
[0019] Figure 4 This utility model Figure 1 Schematic diagram from another perspective.
[0020] Figure 5 This utility model Figure 4 An enlarged schematic diagram of the part.
[0021] In the figure: 1-outer frame, 2-workbench, 3-bracket, 4-testing machine, 5-side stand, 6-cylinder, 7-push frame, 8-buffer test assembly, 9-linear slide, 10-clamping frame, 11-test switch, 12-base frame;
[0022] 81-slide frame, 82-fixed seat, 83-sliding block, 84-spring, 85-guide column, 86-test needle. DETAILED DESCRIPTION
[0023] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.
[0024] See also Figure 1-5 In an embodiment of the utility model, a positioning device for chip testing includes a testing machine 4 and a cylinder 6; a push frame 7 is fixed to the end of the cylinder rod of the cylinder 6; a plurality of buffer test components 8 are provided at the bottom of the push frame 7; the buffer test component 8 includes a slide 81 fixed to the bottom of the push frame 7, and a fixed seat 82 is fixed to the bottom of the slide 81; a sliding block 83 is slidably connected above the fixed seat 82, and a test pin 86 electrically connected to the testing machine 4 is embedded at the bottom of the sliding block 83; a spring 84 is sleeved on the outside of the sliding block 83.
[0025] In the present invention, the longitudinal section of the fixing seat 82 is C-shaped, and sliding grooves are provided on both sides of the fixing seat 82 to facilitate the sliding of the guide column 85; two guide columns 85 are provided and fixed on both sides of the sliding block 83.
[0026] In the present invention, the lower end of the spring 84 is fixed to the lower end of the sliding block 83 , and the upper end of the spring 84 is abutted against the sliding bracket 81 .
[0027] In the utility model, two cylinders 6 are provided and fixed on the outer side of the side stand 5 ; the side stand 5 is fixed to the bracket 3 .
[0028] In the utility model, the bracket 3 is fixed on the workbench 2; the outer frame 1 and the bottom frame 12 are fixed on the bottom of the workbench 2.
[0029] In the utility model, a through slot is provided on the workbench 2 for facilitating the sliding of the clamping frame 10, and the clamping frame 10 is connected with a linear slide 9 fixed at the bottom of the workbench 2; an L baffle is fixed at one end of the through slot away from the clamping frame 10.
[0030] In the present invention, a test switch 11 is also fixed on the workbench 2 ; the test switch 11 is electrically connected to the linear slide 9 and the electromagnetic valve of the control cylinder 6 .
[0031] The working principle of the utility model is: when in use, first place the chip on the workbench, turn on the test switch 11, the linear slide 9 drives the clamping frame 10 to move horizontally, and the chip is stopped on the L baffle plate. The cylinder rod of the cylinder 6 extends out, and the buffer test component 8 is driven downward by the push frame 7. When the test needle 86 at the bottom of the sliding block 83 contacts the chip, there will be a reaction force. At this time, the test needle 86 and the sliding block 83 drive the spring 84 to move upward to achieve a buffering function; this can not only ensure the contact between the test needle 86 and the chip, but also achieve buffering, avoiding the situation where the chip is damaged due to a large impact.
[0032] It is obvious to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the present invention can be implemented in other specific forms without departing from the spirit or essential features of the present invention. Therefore, the embodiments should be regarded as exemplary and non-restrictive from any point of view, and the scope of the present invention is defined by the appended claims rather than the above description, and it is intended that all changes falling within the meaning and scope of the equivalent elements of the claims be included in the present invention. Any reference numeral in a claim should not be regarded as limiting the claim to which it relates.
[0033] In addition, it should be understood that although the present specification is described according to implementation modes, not every implementation mode contains only one independent technical solution. This description of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment may also be appropriately combined to form other implementation modes that can be understood by those skilled in the art.
Claims
1. A positioning device for chip testing, characterized in that: The invention comprises a testing machine (4) and a cylinder (6); a push frame (7) is fixed to the end of the cylinder rod of the cylinder (6); a plurality of buffer test assemblies (8) are arranged at the bottom of the push frame (7); the buffer test assembly (8) comprises a slide frame (81) fixed to the bottom of the push frame (7), a fixed seat (82) is fixed to the bottom of the slide frame (81); a sliding block (83) is slidably connected to the top of the fixed seat (82), a test pin (86) electrically connected to the testing machine (4) is embedded at the bottom of the sliding block (83); a spring (84) is sleeved on the outside of the sliding block (83).
2. The positioning device for chip testing according to claim 1, characterized in that: The fixing seat (82) has a C-shaped longitudinal section, and sliding grooves are provided on both sides of the fixing seat (82) to facilitate the sliding of the guide column (85); two guide columns (85) are provided and fixed on both sides of the sliding block (83).
3. The positioning device for chip testing according to claim 2, characterized in that: The lower end of the spring (84) is fixed to the lower end of the sliding block (83), and the upper end of the spring (84) is abutted against the sliding frame (81).
4. The positioning device for chip testing according to claim 1, characterized in that: The cylinders (6) are provided with two and are fixed on the outside of the side stand (5); the side stand (5) is fixed to the bracket (3).
5. The positioning device for chip testing according to claim 4, characterized in that: The support (3) is fixed on the workbench (2); an outer frame (1) and a bottom frame (12) are fixed on the bottom of the workbench (2).
6. The positioning device for chip testing according to claim 5, characterized in that: The workbench (2) is provided with a through slot for facilitating the sliding of the clamping frame (10); the clamping frame (10) is connected in cooperation with a linear slide (9) fixed at the bottom of the workbench (2); an L baffle is fixed at one end of the through slot away from the clamping frame (10).