Test tool for integrated circuit chip

Abstract

The utility model relates to the technical field of integrated circuit chip testing, and discloses a test tool for an integrated circuit chip, which comprises a test board, the top of the test board is fixedly connected with a support rod, the top of the support rod is fixedly connected with a top plate, the bottom of the top plate is fixedly connected with an electric push rod, and the electric push rod is fixedly connected with a motor. The output end of the electric push rod is fixedly connected with a test probe, the interior of the test bench is rotatably connected with a disc, the outer side of the disc is rotatably connected with a moving block, one side of the moving block is fixedly connected with a spring rod, one end of the spring rod is fixedly connected with a clamping plate, and the interior of the test bench is provided with a driving assembly. According to the utility model, under the mutual cooperation of the disc, the motor, the rubber pad, the clamping plate and other structures, the integrated circuit chips with different sizes can be clamped and fixed, so that the chips are prevented from shaking, deviation during manual holding is prevented, the integrated circuit chips are more stable during testing, and the accuracy during testing is ensured.

Description

Technical Field

[0001] The utility model relates to the technical field of integrated circuit chip testing, in particular to a testing tool for integrated circuit chips. Background Art

[0002] Integrated circuit chips are microelectronic devices that can realize certain circuit functions. In order to ensure the stable and smooth operation of integrated circuit chips, it is necessary to test the integrated circuit chips and screen out defective products. The test tooling is a tool for fixing the integrated circuit chips to facilitate stable testing of the integrated circuit chips.

[0003] After searching, Chinese patent announcement number: CN216622608U discloses a test fixture for integrated circuit chips, specifically related to the field of integrated circuit technology, including a base and a support rod installed at the top edge of the base, a top plate is installed on the top of the support rod, a lower magnetic plate with a length greater than the width of the base is embedded in the middle of the top of the base, and the two ends of the lower magnetic plate extend a distance to both sides of the base, and a detachable chip carrier is provided on the lower magnetic plate, and the chip carrier is used to place the integrated circuit chip to be tested, and the chip carrier slides back and forth on the surface of the lower magnetic plate, and a test component installed on the top plate is provided above the chip carrier. The utility model allows the two processes of arranging the integrated circuit chip on the chip carrier and testing on the test fixture to be separated and carried out simultaneously, realizing the testing of multiple integrated circuit chips at one time, greatly improving the testing efficiency of integrated circuit chips.

[0004] Although the above technology can test multiple integrated circuit chips at the same time through the mutual cooperation of structures such as support rods, top plates, test components, and lower magnetic plates, thereby improving the testing efficiency of integrated circuit chips, there are still some shortcomings. When testing, the integrated circuit chips in the prior art are usually placed on top of the test bench or held by workers, and integrated circuit chips of different sizes cannot be effectively clamped and fixed, which leads to easy deviation during testing, affecting the accuracy of the integrated circuit chip testing. Therefore, a testing tool for integrated circuit chips is proposed to solve the above problems. Utility Model Content

[0005] In order to remedy the above deficiencies, the utility model provides a test fixture for integrated circuit chips, aiming to improve the problem in the prior art that integrated circuit chips of different sizes cannot be effectively clamped and fixed, thereby causing easy deviation during testing.

[0006] In order to achieve the above-mentioned purpose, the utility model adopts the following technical scheme: a test tool for integrated circuit chips, including a test bench, the top of the test bench is fixedly connected to a support rod, the top of the support rod is fixedly connected to a top plate, the bottom of the top plate is fixedly connected to an electric push rod, the output end of the electric push rod is fixedly connected to a test probe, the inside of the test bench is rotatably connected to a disk, the outside of the disk is rotatably connected to a moving block, one side of the moving block is fixedly connected to a spring rod, one end of the spring rod is fixedly connected to a clamping plate, and a drive assembly is provided inside the test bench.

[0007] As a further description of the above technical solution:

[0008] The driving assembly comprises a motor, the motor is fixedly connected to the inside of the test bench, and the middle part of the disc is fixedly connected to the output end of the motor.

[0009] As a further description of the above technical solution:

[0010] A transparent protective plate is fixedly connected to the top of the test bench, a movable plate is slidably connected to one side of the transparent protective plate, a handle is fixedly connected to one side of the movable plate, a sliding groove is opened inside the transparent protective plate, and a sliding component is provided on one side of the movable plate.

[0011] As a further description of the above technical solution:

[0012] The sliding assembly comprises a pulley, and the pulley is slidably connected to the middle part of the sliding groove.

[0013] As a further description of the above technical solution:

[0014] A plurality of bases are fixedly connected to the bottom of the test bench.

[0015] As a further description of the above technical solution:

[0016] A limiting groove is provided on the top of the test bench, and the moving block is slidably connected to the middle of the limiting groove.

[0017] As a further description of the above technical solution:

[0018] A rubber pad is fixedly connected to one side of the clamping plate.

[0019] As a further description of the above technical solution:

[0020] Specifically, a plurality of pulleys are provided, and the plurality of pulleys are rotatably connected to one side of the movable plate.

[0021] The utility model has the following beneficial effects:

[0022] 1. In the utility model, integrated circuit chips of different sizes can be clamped and fixed by the cooperation of the disc, motor, rubber pad, clamping plate and other structures, so as to avoid chip shaking and prevent deviation when manually held, making the integrated circuit chip more stable during testing and ensuring the accuracy of the test.

[0023] 2. In the utility model, with the cooperation of the movable plate, the slide groove, the pulley, the transparent protective plate and other structures, the integrated circuit chip can be observed while being tested, and the safety of the staff can be well protected if the parts collapse or short circuit occurs during the working process. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 This is a three-dimensional schematic diagram of a testing tool for integrated circuit chips proposed by the utility model;

[0025] Figure 2 This is a schematic structural diagram of a limit slot of a testing tool for integrated circuit chips proposed by the utility model;

[0026] Figure 3 This is a structural schematic diagram of a motor for an integrated circuit chip testing tool proposed by the utility model;

[0027] Figure 4 This is a structural schematic diagram of a pulley for an integrated circuit chip testing tool proposed by the utility model;

[0028] Figure 5 The utility model is a schematic diagram of the structure of a slideway of a testing tool for integrated circuit chips.

[0029] Legend:

[0030] 1. Base; 2. Test bench; 3. Support rod; 4. Top plate; 5. Electric push rod; 6. Test probe; 7. Transparent protective plate; 8. Movable plate; 9. Pulley; 10. Handle; 11. Disc; 12. Moving block; 13. Limiting groove; 14. Motor; 15. Spring rod; 16. Clamp; 17. Rubber pad; 18. Slide groove. DETAILED DESCRIPTION

[0031] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0032] Reference Figure 1-3The utility model provides an embodiment: a test fixture for integrated circuit chips, including a test bench 2, a support rod 3 is fixedly connected to the top of the test bench 2, a top plate 4 is fixedly connected to the top of the support rod 3, the support rod 3 is convenient for supporting the top plate 4, an electric push rod 5 is fixedly connected to the bottom of the top plate 4, and a test probe 6 is fixedly connected to the output end of the electric push rod 5. When the electric push rod 5 is working, it will drive the test probe 6 to move downward, so that the fixed integrated circuit chip can be tested. The internal rotation of the test bench 2 is connected to a disk 11, and the disk The outer side of 11 is rotatably connected to a moving block 12, one side of the moving block 12 is fixedly connected to a spring rod 15, and one end of the spring rod 15 is fixedly connected to a clamping plate 16. When the disc 11 rotates, the moving block 12 is driven to move, and when the moving block 12 moves, the spring rod 15 is driven to move. When the spring rod 15 moves, the clamping plate 16 is driven to move at the same time, so as to facilitate the clamping and fixing of integrated circuit chips of different sizes, prevent deviation during the test, and ensure the accuracy of the test. A driving component is arranged inside the test bench 2.

[0033] Reference Figure 2 , Figure 3 and Figure 4 The driving component includes a motor 14, which is fixedly connected to the inside of the test bench 2. The middle part of the disc 11 is fixedly connected to the output end of the motor 14. When the motor 14 is working, it will drive the disc 11 to rotate. A transparent protective plate 7 is fixedly connected to the top of the test bench 2, and a movable plate 8 is slidably connected to one side of the transparent protective plate 7. The transparent protective plate 7 and the movable plate 8 can well protect the safety of the staff and prevent the staff from being harmed by phenomena such as part collapse or short circuit during work. A handle 10 is fixedly connected to one side of the movable plate 8. The handle 10 is convenient for pulling the movable plate 8 up and down. A slide groove 18 is provided inside the transparent protective plate 7, and a sliding component is provided on one side of the movable plate 8.

[0034] Reference Figure 1 , Figure 2 and Figure 5 The sliding assembly includes a pulley 9, which is slidably connected to the middle of the slide groove 18. A plurality of bases 1 are fixedly connected to the bottom of the test bench 2. The plurality of bases 1 facilitate more stable support for the overall equipment. A limiting groove 13 is provided on the top of the test bench 2. The moving block 12 is slidably connected to the middle of the limiting groove 13. The limiting groove 13 can limit the moving block 12 to prevent the moving block 12 from offsetting during movement. A rubber pad 17 is fixedly connected to one side of the clamping plate 16. The rubber pad 17 is made of soft rubber to prevent damage to the surface of the integrated circuit chip during the clamping process. A plurality of pulleys 9 are specifically provided, and the plurality of pulleys 9 are rotatably connected to one side of the movable plate 8.

[0035] Working principle: When the integrated circuit chip is fixedly tested, the motor 14 will work, and when the motor 14 works, it will drive the disk 11 to rotate. When the disk 11 rotates, it will drive multiple moving blocks 12 to move at the same time. When the moving block 12 moves, it will drive the spring rod 15 to move. When the spring rod 15 moves, it will drive the splint 16 to move at the same time. When the splint 16 moves, it will drive the rubber pad 17 to move, thereby facilitating the effective fixation of integrated circuit chips of different sizes, avoiding the chip from shaking, making it more stable during testing, and ensuring the accuracy of the test.

[0036] When in use, by pulling the handle 10, the movable plate 8 will be driven to move upward, and when the movable plate 8 moves upward, the pulley 9 will be driven to rotate inside the slide groove 18, so that the movement is smoother. After opening, the integrated circuit chip is placed in the transparent protective plate 7 for fixation. After fixation, the movable plate 8 is driven downward by pulling the handle 10. The integrated circuit chip can be tested while being observed, and if parts collapse or short circuit occurs during work, the safety of the staff can be well protected. When testing, the electric push rod 5 will work, and when the electric push rod 5 works, it will drive the test probe 6 to move downward, so as to facilitate the testing of the integrated circuit chip.

[0037] Finally, it should be noted that the above is only a preferred embodiment of the present invention and is not intended to limit the present invention. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art can still modify the technical solutions described in the aforementioned embodiments or make equivalent substitutions for some of the technical features therein. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A test fixture for an integrated circuit chip, comprising a test bench (2), characterized in that: The top of the test bench (2) is fixedly connected to a support rod (3), the top of the support rod (3) is fixedly connected to a top plate (4), the bottom of the top plate (4) is fixedly connected to an electric push rod (5), the output end of the electric push rod (5) is fixedly connected to a test probe (6), the inside of the test bench (2) is rotatably connected to a disk (11), the outside of the disk (11) is rotatably connected to a moving block (12), one side of the moving block (12) is fixedly connected to a spring rod (15), one end of the spring rod (15) is fixedly connected to a clamping plate (16), and a drive component is provided inside the test bench (2).

2. A test fixture for integrated circuit chips according to claim 1, characterized in that: The driving assembly comprises a motor (14), the motor (14) is fixedly connected inside the test bench (2), and the middle part of the disc (11) is fixedly connected to the output end of the motor (14).

3. A test fixture for integrated circuit chips according to claim 1, characterized in that: A transparent protective plate (7) is fixedly connected to the top of the test bench (2); a movable plate (8) is slidably connected to one side of the transparent protective plate (7); a handle (10) is fixedly connected to one side of the movable plate (8); a sliding groove (18) is provided inside the transparent protective plate (7); and a sliding component is provided on one side of the movable plate (8).

4. A test fixture for integrated circuit chips according to claim 3, characterized in that: The sliding assembly comprises a pulley (9), and the pulley (9) is slidably connected to the middle part of the sliding groove (18).

5. The test tool for integrated circuit chips according to claim 1, characterized in that: A plurality of bases (1) are fixedly connected to the bottom of the test bench (2).

6. A test fixture for integrated circuit chips according to claim 1, characterized in that: A limiting groove (13) is provided on the top of the test bench (2), and the moving block (12) is slidably connected to the middle of the limiting groove (13).

7. A test fixture for integrated circuit chips according to claim 1, characterized in that: A rubber pad (17) is fixedly connected to one side of the clamping plate (16).

8. The test fixture for integrated circuit chips according to claim 4, characterized in that: Specifically, a plurality of pulleys (9) are provided, and the plurality of pulleys (9) are all rotatably connected to one side of the movable plate (8).

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