Crystal detection device

Abstract

The embodiment of the utility model provides a crystal detection device, which comprises a laser emission unit, a laser detection unit, a control unit and a display unit, and is characterized in that the laser emission unit is configured to generate laser for irradiating a to-be-detected crystal; the fixing assembly is configured to bear a to-be-detected crystal; an image is generated on the imaging screen after the laser irradiates the crystal to be detected; a camera configured to capture an image on the imaging screen; the imaging screen is of a semitransparent structure, the laser emitting unit and the camera are located on the two sides of the imaging screen, and the fixing assembly is located between the laser emitting unit and the imaging screen. According to the crystal detection device, the camera and the laser emitting unit are located on the two sides of the imaging screen respectively, and the imaging screen is of the semitransparent structure, so that after an image is generated on one side of the imaging screen, the camera can shoot the image generated on the imaging screen from the other side of the imaging screen, and due to shielding of the imaging screen, the image can be shot more accurately. The laser does not directly irradiate the camera, thereby effectively preventing the camera from being damaged by the laser, and prolonging the service life of the camera.

Description

Technical Field

[0001] The present invention relates to the field of crystal detection technology, and in particular to a crystal detection device. Background Art

[0002] The ordered structure of crystals has always been the core foundation of crystal material research due to its regularity. Crystal defects refer to the incomplete lattice structure of the crystal, where there are broken locations. Crystal defects will affect the performance of crystal materials. The scattering particles inside the crystal are mainly composed of defects such as microbubbles and inclusions. They can be illuminated by a laser to observe the light path of the laser inside the crystal. If there is no scattering in the crystal with no structural defects, the laser passes directly and no scattering light path can be observed; if there are scattering points such as microbubbles inside the crystal, there will be an obvious scattering light path, and the scattering points inside the crystal can be observed. At the same time, the type of point defects can be determined by observing the morphology of the scattering points inside the crystal.

[0003] This specification provides a crystal inspection device, which is intended to use a camera to capture the laser light path image generated on an imaging screen after the laser irradiates the crystal to be inspected, and determine the quality of the crystal to be inspected based on the captured image, so as to quickly and effectively detect whether the crystal has defects and the distribution of the defects. Utility Model Content

[0004] Some embodiments of the present specification provide a crystal detection device, comprising: a laser emitting unit, configured to generate a laser for irradiating the crystal to be detected; a fixing component, configured to carry the crystal to be detected; an imaging screen, on which an image is generated after the laser irradiates the crystal to be detected; a camera, configured to capture the image on the imaging screen; the imaging screen is a translucent structure, the laser emitting unit and the camera are located on both sides of the imaging screen, and the fixing component is located between the laser emitting unit and the imaging screen.

[0005] In some embodiments, the imaging screen is provided with a photosensitive element, the photosensitive element is communicatively connected with the camera, and the photosensitive element is configured to control the camera to capture the image when detecting that the image is generated on the imaging screen.

[0006] In some embodiments, the fixing assembly includes a base and a mounting platform, the mounting platform is fixedly connected to the base, and the mounting platform is located between the laser emitting unit and the imaging screen, and the crystal to be detected is set on the table top of the mounting platform.

[0007] In some embodiments, the fixing assembly includes a base and a mounting table, the mounting table is rotatably connected to the base, and the mounting table is located between the laser emitting unit and the imaging screen, and the crystal to be detected is set on the table top of the mounting table.

[0008] In some embodiments, the fixing assembly further includes a lifting mechanism, the mounting platform and the base are connected via the lifting mechanism, and the lifting mechanism is configured to drive the mounting platform to move in a direction perpendicular to a surface of the mounting platform.

[0009] In some embodiments, the fixing assembly further includes a limiting mechanism, and the limiting mechanism is configured to limit the movement of the crystal to be detected relative to the table surface of the mounting table.

[0010] In some embodiments, a conveying unit is further included, wherein the conveying unit is located between the laser emitting unit and the imaging screen, the fixing component is arranged on the conveying unit, and the conveying direction of the conveying unit is perpendicular to the laser emitting direction generated by the laser emitting unit and the movement direction of the lifting mechanism.

[0011] In some embodiments, the transport unit includes a transport track, which includes a curved track and a straight track, at least one end of the straight track is connected to the curved track, and the transport direction of the straight track is perpendicular to the laser emission direction generated by the laser emitting unit and the movement direction of the lifting mechanism; the crystal detection device also includes a storage table and a transfer mechanism, and the transfer mechanism is configured to transfer the crystal to be detected on the storage table and the fixed component carrying the crystal to be detected to the curved track, and to transfer the detected crystal on the curved track and the fixed component carrying the detected crystal to the storage table.

[0012] In some embodiments, the laser emission direction is parallel to the table surface of the mounting table.

[0013] In some embodiments, a scale line is provided between the laser emitting unit and the fixing component. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] This specification will be further described in the form of exemplary embodiments, which will be described in detail by the accompanying drawings. These embodiments are not restrictive, and in these embodiments, the same number represents the same structure, wherein:

[0015] Figure 1 is a schematic diagram of a module of a crystal detection device according to some embodiments of this specification;

[0016] Figure 2is a schematic diagram of the structure of a crystal detection device according to some embodiments of this specification;

[0017] Figure 3 is a top view of a crystal detection device according to some embodiments of this specification;

[0018] Figure 4 is a top view of a crystal detection device according to other embodiments of this specification;

[0019] Figure 5 It is a top view of a crystal detection device shown in some other embodiments of this specification.

[0020] Figure numerals: crystal detection device 100; laser emitting unit 10; fixing assembly 20; base 21; mounting table 22; imaging screen 30; camera 40; limiting mechanism 50; groove 51; conveying unit 60; conveying track 61; straight track 611; curved track 612; storage table 70; scale line 80; crystal to be detected 200. DETAILED DESCRIPTION

[0021] In order to more clearly illustrate the technical solution of the present application, the following is a brief introduction to the drawings required for the description of the embodiments. Obviously, the drawings described below are only some examples or embodiments of the present specification. For ordinary technicians in this field, the present specification can also be applied to other similar scenarios based on these drawings without creative work. Unless it is obvious from the language environment or otherwise explained, the same reference numerals in the figures represent the same structure or operation.

[0022] As shown in this specification and claims, unless the context clearly indicates an exception, the words "a", "an", "an" and / or "the" do not refer to the singular and may also include the plural, unless the context clearly indicates an exception. Generally speaking, the terms "include" and "comprise" only indicate the inclusion of clearly identified steps and elements, and these steps and elements do not constitute an exclusive list. The method or device may also include other steps or elements. The term "based on" means "at least partially based on". The term "some embodiments" means "at least one embodiment"; the term "other embodiments" means "at least one other embodiment", and the relevant definitions of other terms will be given in the description below.

[0023] Since the position of the product in this specification can be changed at will, the directional words such as "upper", "lower", "left", "right", "front", "back" and so on described in this specification only indicate relative positional relationships and are not used to limit absolute positional relationships. In addition, the "front end" and "distal end" described in this specification refer to the end away from the surgical operator, and the "rear end", "proximal end" and "end" refer to the end close to the surgical operator.

[0024] In some schemes, the inspection of crystals is mainly carried out by the operator shining a hand-held flashlight on the crystal, and then observing the scattered light path inside the crystal from the other end to determine whether the crystal has defects and the distribution of the defects. However, the inspection method of illuminating the crystal with a hand-held flashlight not only requires a lot of labor costs, but also due to the small size of the crystal, the human eye may have deviations when observing the scattered light path inside the crystal, resulting in inaccurate inspection results.

[0025] Some embodiments of the present specification provide a crystal detection device, which includes a laser emitting unit, a fixing component, an imaging screen and a camera. The fixing component can fix the crystal to be detected, and the laser emitted by the laser emitting unit can irradiate the crystal to be detected. When the laser passes through the crystal to be detected, an image will be generated on the imaging screen. Finally, the image on the imaging screen is photographed by the camera, and the presence of defects in the crystal to be detected and the distribution of the defects are determined based on the photographed image. The crystal detection device provided in the present specification can reduce the time investment of the operator, improve efficiency, and thus reduce the cost of detection. At the same time, the camera of the crystal detection device can record and store a large amount of detection image data, making data management more convenient and reducing the risk of errors.

[0026] In some embodiments, in combination Figure 1-Figure 2 As shown, the crystal detection device 100 includes a laser emitting unit 10, a fixing component 20, an imaging screen 30 and a camera 40. The laser emitting unit 10 is configured to generate a laser for irradiating a crystal 200 to be detected. The fixing component 20 is configured to carry the crystal 200 to be detected. The imaging screen 30 is a translucent structure, the laser emitting unit 10 and the camera 40 are located on both sides of the imaging screen 30, and the fixing component 20 is located between the laser emitting unit 10 and the imaging screen 30. After the laser irradiates the crystal 200 to be detected, an image is generated on the imaging screen 30. The camera 40 is configured to capture the image on the imaging screen 30. Among them, the two sides of the imaging screen 30 refer to the two sides in the thickness direction of the imaging screen 30, and the thickness direction of the imaging screen 30 can be measured by Figure 2 The imaging screen 30 is a semi-transparent structure, which means that the transmittance of the imaging screen 30 can generate an image (such as a light spot) when the laser passes through the crystal 200 to be detected and irradiates the imaging screen 30, and the camera 40 can capture the generated image from the other side of the imaging screen 30.

[0027] In this embodiment, the laser emitted by the laser emitting unit 10 can irradiate the crystal 200 to be detected. In the process of the laser passing through the crystal 200 to be detected, the optical path of the laser will produce different changes according to the defects inside the crystal 200 to be detected, for example, scattering occurs. After the laser passes through the crystal 200 to be detected, the laser optical path can generate an image on the imaging screen 30, and the camera 40 can shoot the generated image, and then identify the quality of the crystal 200 to be detected based on the captured laser optical path image. In some cases, since the camera 40 and the laser emitting unit 10 are respectively located on both sides of the imaging screen 30 and the imaging screen 30 is a translucent structure, after the image is generated on one side of the imaging screen 30, the camera 40 can shoot the image generated on the imaging screen 30 from the other side of the imaging screen 30, and due to the shielding of the imaging screen 30, the laser will not directly irradiate the camera 40, which can effectively prevent the camera 40 from being damaged by the laser and improve the service life of the camera.

[0028] In some embodiments, the shape of the crystal to be detected 200 may include regular or irregular shapes such as a cube, a cuboid, a prism, a cylinder, etc. For the convenience of description, the crystal to be detected 200 mentioned in the embodiments of this specification is a cuboid.

[0029] In some embodiments, the laser emission direction can be parallel to the length direction, height direction or width direction of the crystal 200 to be detected, and perpendicular to the imaging screen 30, so that the laser can completely pass through the crystal 200 to be detected along the length direction, height direction or width direction of the crystal 200 to be detected, ensuring a comprehensive detection of the crystal 200 to be detected.

[0030] In some embodiments, the size of the laser beam emitted by the laser emitting unit 10 can be smaller than the size of the crystal 200 to be detected, so as to avoid the laser directly irradiating the imaging screen 30 without passing through the crystal 200 to be detected, thereby avoiding interfering with the image generated on the imaging screen 30 captured by the camera 40.

[0031] In some embodiments, the laser emitting unit 10 may further include a beam splitter (not shown in the figure), which may be disposed at the emitting end of the laser emitting unit 10, and the beam splitter is configured to limit the size of the laser beam emitted by the laser emitting unit 10. In some cases, after the beam splitter is disposed at the emitting end of the laser emitting unit 10, when detecting crystals 200 of different sizes to be detected, the size of the laser beam irradiated on the crystal 200 to be detected may be adjusted according to the size of the crystal 200 to be detected, so as to ensure that the size of the laser beam is smaller than the size of the crystal 200 to be detected, thereby eliminating the need to adjust the parameters of the laser emitting unit 10.

[0032] In some embodiments, the material of the imaging screen 30 may include any one or more of glass, plastic, resin, etc.

[0033] In some embodiments, the number of cameras 40 may be one or more. As an example only, the camera 40 may include multiple cameras, and the multiple cameras 40 may be used to respectively capture a portion of the imaging screen 30. The quality of the crystal 200 to be detected may be determined by combining the images captured by the multiple cameras 40. In another example, the camera 40 may be one, and the crystal detection device 100 may include a camera moving component, which is configured to drive the camera 40 to move in at least one of the height direction, width direction, and thickness direction of the imaging screen 30 to adjust the position between the camera 40 and the imaging screen 30, so that the camera 40 can capture the image on the imaging screen 30 more accurately and comprehensively. The height direction of the imaging screen 30 can be adjusted by adjusting the height direction of the imaging screen 30. Figure 2 As shown by the arrow X in FIG. 1 , the width direction of the imaging screen 30 can be Figure 2 As shown by the arrow Y in FIG. 1 , the thickness direction of the imaging screen 30 can be Figure 2 In some embodiments, the camera moving assembly may include a manipulator, a slide rail and a slider mechanism, etc., which will not be described in detail here.

[0034] In some embodiments, a photosensitive element is provided on the imaging screen 30, and the photosensitive element is in communication connection with the camera 40. The photosensitive element is configured to control the camera 40 to capture an image when detecting that an image is generated on the imaging screen 30. For example, when the photosensitive element detects that an image is generated on the imaging screen 30, the photosensitive element may issue a capture instruction to the camera 40 to control the camera 40 to capture. When the photosensitive element does not detect that an image is generated on the imaging screen 30, the photosensitive element will not issue a capture instruction to the camera 40. When the camera 40 does not receive a capture instruction, the camera 40 may be in a standby state or a shutdown state. In some embodiments, the photosensitive element may be integrated with the camera 40, for example, the photosensitive element is disposed in the camera 40. In some embodiments, the photosensitive element may include a CCD (Chagre Couled Device), a CMOS (Complementary Metal Oxide Semiconductor), and the like.

[0035] In some embodiments, the camera 40 may include a processor, and the processor may analyze the image captured by the camera 40 to determine the quality of the crystal 200 to be detected. For example, the processor may analyze and compare the image captured by the camera 40 with an existing standard image, and then determine the quality of the crystal to be detected based on the similarity between the image captured by the camera 40 and the existing standard image. The existing standard image may include an image when there are defects inside the crystal and an image when there are no defects inside the crystal. In some cases, the crystal detection device 100 integrates a data analysis tool that can automatically process and analyze the measurement data to better display the results. In addition, the crystal detection device can accurately perform measurement and analysis tasks, reduce the risk of human error, and thus improve the accuracy of the detection results.

[0036] In some embodiments, the processor can be independently arranged relative to the camera 40, or the data of the camera 40 (such as the captured image) can be transmitted to other mobile terminals for processing via a wired or wireless network. In some embodiments, the processor can be integrated with the camera 40.

[0037] In some embodiments, the fixing assembly 20 includes a base 21 and a mounting platform 22 . The mounting platform 22 is connected to the base 21 . The mounting platform 22 is located between the laser emitting unit 10 and the imaging screen 30 . The crystal 200 to be detected is set on the table top of the mounting platform 22 .

[0038] In some embodiments, the laser emission direction may be parallel to the table surface of the mounting table 22. For example, the table surface of the mounting table 22 may be perpendicular to the imaging screen 30. When the laser emission direction is parallel to the table surface of the mounting table 22, the laser emission direction may be parallel to the length direction, height direction or width direction of the crystal 200 to be detected by changing the posture of the crystal 200 to be detected placed on the table surface of the mounting table 22, thereby making the laser irradiate the crystal 200 to be detected more comprehensively and accurately.

[0039] In some embodiments, the mounting platform 22 is relatively fixed to the base 21, that is, the mounting platform 22 and the base 21 cannot move relative to each other. In some embodiments, the mounting platform 22 is non-detachably connected to the base 21, and exemplary non-detachable connection methods include welding, bonding, integral molding, etc. In some embodiments, the mounting platform 22 is detachably connected to the base 21, and exemplary detachable connection methods include magnetic connection, snap connection, etc.

[0040] In some application scenarios, the paths of the laser passing through the crystal 200 to be detected are different, so the images of the laser light path finally obtained on the imaging screen 30 are also different. For example, when the length direction of the crystal 200 to be detected is parallel to the laser emission direction, the laser generates a light spot on the imaging screen 30 after irradiating the crystal 200 to be detected; when the height direction of the crystal 200 to be detected is parallel to the laser emission direction, the laser generates multiple light spots on the imaging screen 30 after irradiating the crystal 200 to be detected. The above two irradiation results of the crystal 200 to be detected correspond to completely different quality evaluations of the crystal 200 to be detected. If the crystal 200 to be detected is evaluated based only on the image when the length direction of the crystal 200 to be detected is parallel to the laser emission direction, since only one light spot is generated on the imaging screen 30, that is, the laser is not scattered, it may be mistakenly judged that the quality of the crystal 200 to be detected is good. If only the height direction of the crystal 200 to be detected is parallel to the laser emission direction, since multiple light spots are generated on the imaging screen 30, the laser is scattered, it may be mistakenly judged that the quality of the crystal 200 to be detected is poor.

[0041] In some embodiments, the mounting table 22 is movably connected to the base 21. In some embodiments, the mounting table 22 is rotatably connected to the base 21, and the mounting table 22 is located between the laser emitting unit 10 and the imaging screen 30, and the crystal 200 to be detected is set on the table of the mounting table 22. For example, the base 21 and the mounting table 22 can be connected by a bearing, so that the mounting table 22 can rotate relative to the base 21, thereby driving the crystal 200 to be detected to rotate. In some cases, since the mounting table 22 is rotatably connected to the base 21, during the process of irradiating the crystal 200 to be detected, the laser can be irradiated at different positions of the crystal 200 to be detected by rotating the mounting table 22. For example, before adjustment, the laser emission direction is parallel to the length direction of the crystal 200 to be detected. At this time, the laser emission direction can be parallel to the height direction or width direction of the crystal 200 to be detected by rotating the mounting table 22, so as to obtain the image of the crystal 200 to be detected more comprehensively and accurately, so that the crystal detection result is more accurate.

[0042] In some embodiments, the fixing assembly 20 may further include a lifting mechanism (not shown in the figure), the mounting platform 22 and the base 21 are connected by the lifting mechanism, and the lifting mechanism is configured to drive the mounting platform 22 to move in a direction perpendicular to the surface of the mounting platform 22. The direction perpendicular to the surface of the mounting platform 22 can be Figure 2 In some cases, after the lifting mechanism is set, the mounting platform 22 can be controlled to move up and down relative to the base 21 to drive the crystal 200 to move up and down, thereby more comprehensively testing the crystal 200 to improve the accuracy of the test result.

[0043] In some embodiments, the lifting mechanism may include a gear rack mechanism, a screw nut mechanism, a slider guide rail mechanism, etc. Exemplarily, the lifting mechanism may include a lifting rail, a lifting slider adapted to the lifting rail, and a driving member (e.g., a motor, a cylinder, etc.). The lifting rail is connected to the base 21 and the extension direction of the lifting rail is perpendicular to the table surface of the mounting table 22. The lifting slider is arranged on the mounting table 22 and the lifting slider can move along the lifting rail. The driving member can drive the lifting slider to move along the lifting rail, thereby driving the crystal 200 to be detected to be lifted and lowered.

[0044] In some embodiments, the mounting table 22 is connected to the base 21 through a lifting mechanism, and the mounting table 22 is rotatably connected to the base 21, that is, the mounting table 22 can move relative to the base 21 in a direction perpendicular to the table surface of the mounting table 22, and can also rotate relative to the base 21, so as to facilitate flexible adjustment of the position of the crystal 200 to be detected, so that the laser can be irradiated at different positions of the crystal 200 to be detected, so as to help the operator obtain the quality status of the crystal 200 to be detected more accurately.

[0045] In some embodiments, Figure 1 As shown, the fixing assembly 20 further includes a limiting mechanism 50. The limiting mechanism 50 is configured to limit the movement of the crystal 200 to be tested relative to the table surface of the mounting table 22, thereby ensuring that the crystal remains relatively still with respect to the fixing assembly 20 during the testing process, thereby improving the testing accuracy.

[0046] In some embodiments, in combination Figure 1 and Figure 2 As shown, the limiting mechanism 50 may include a groove 51 provided on the table surface of the mounting table 22, and the crystal 200 to be detected may be placed in the groove 51, and the movement of the crystal 200 to be detected relative to the mounting table 22 is limited by the groove 51. In some embodiments, the grooves 51 on the tables of different mounting tables 22 may have different sizes so as to place crystals 200 to be detected of different sizes, so that a suitable mounting table 22 may be selected according to the size of the crystal 200 to be detected, so that the groove 51 can effectively limit the crystal 200 to be detected.

[0047] In some embodiments, the limiting mechanism 50 may include a clamping member, and the clamping member is configured to clamp the crystal 200 to be detected. For example, the clamping member may include two movable first clamping arms and a second clamping arm. When it is necessary to clamp the crystal 200 to be detected, the first clamping arm and the second clamping arm may be controlled to move in opposite directions, and then the crystal 200 to be detected may be placed between the first clamping arm and the second clamping arm, and finally the first clamping arm and the second clamping arm may be controlled to move closer to each other, so that the clamping is completed; and the first clamping arm and the second clamping arm may be controlled to move in opposite directions again, so that the crystal 200 to be detected may be removed. For another example, the first clamping arm may move relative to the second clamping arm, while the first clamping arm is stationary relative to the mounting table 22. Similarly, the crystal 200 to be detected may be clamped and removed from the clamping member by controlling the second clamping arm to move relative to the first clamping arm.

[0048] In some embodiments, the limiting mechanism 50 can be used in combination with the mounting platform 22 in other embodiments of the present specification. For example, the mounting platform 22 can be rotatably connected to the base 21, and a groove 51 is provided on the surface of the mounting platform 22. For another example, the mounting platform 22 can be connected to the base 21 through a lifting mechanism, and a clamping arm is provided on the mounting platform 22.

[0049] In some embodiments, in combination Figure 1 and Figure 4 As shown, the crystal detection device 100 may also include a transmission unit 60, which is located between the laser emitting unit 10 and the imaging screen 30. The fixing component 20 is disposed on the transmission unit 60. The transmission direction of the transmission unit 60 is perpendicular to the laser emission direction generated by the laser emitting unit 10 and the movement direction of the lifting mechanism. The movement direction of the lifting mechanism refers to the direction perpendicular to the table surface of the mounting table 22. The movement direction of the lifting mechanism can be parallel to the height direction of the imaging screen 30, and the laser emission direction can be parallel to the thickness direction of the imaging screen 30. Therefore, the transmission direction of the transmission unit 60 can be parallel to the width direction of the imaging screen 30. The laser emission direction can be determined by Figure 4 The height direction of the imaging screen 30 can be represented by the arrow X in Figure 4 The arrow Z in FIG. 1 indicates that the transmission direction of the transmission unit 60 can be Figure 4 It is indicated by the arrow Y in the figure.

[0050] In this embodiment, since the conveying direction of the conveying unit 60 is perpendicular to the laser emitting direction generated by the laser emitting unit 10 and the moving direction of the lifting mechanism, the position of the crystal 200 to be detected in the width direction of the imaging screen 30 can be adjusted by setting the conveying unit 60. In addition, when multiple fixing components 20 are set on the conveying unit 60, the position of the fixing component 20 in the width direction of the imaging screen 30 can be adjusted by the conveying unit 60, so as to detect different crystals 200 to be detected. For example, after one of the crystals 200 to be detected is detected, the crystal 200 to be detected (i.e., the detected crystal) can be moved out of the irradiation range of the laser by the conveying unit 60, and then another crystal 200 to be detected can be moved into the irradiation range of the laser by the conveying unit 60, and the crystal can continue to be detected, thereby realizing automatic batch detection of crystals.

[0051] In some embodiments, the transmission unit 60 can be combined with the fixing assembly 20 in other embodiments of the present specification. For example, the mounting table 22 is rotatably connected to the base 21, so that the crystal detection device 100 has the functions of adjusting the position of the crystal 200 to be detected in the width direction of the imaging screen 30 and rotating the crystal 200 to be detected.

[0052] In some embodiments, Figure 4 As shown, the transport unit 60 includes a transport track 61, and the transport track 61 includes a curved track 612 and a straight track 611. At least one end of the straight track 611 is connected to the curved track 612, and the transport direction of the straight track 611 is perpendicular to the laser emission direction generated by the laser emission unit 10 and the movement direction of the lifting mechanism. The crystal detection device 100 also includes a storage table 70 and a transfer mechanism, and the transfer mechanism is configured to transfer the crystal 200 to be detected on the storage table 70 and the fixed component 20 carrying the crystal 200 to be detected to the curved track 612, and transfer the detected crystal on the curved track 612 and the fixed component 20 carrying the detected crystal to the storage table 70.

[0053] In this embodiment, since the conveying direction of the linear track 611 is perpendicular to the laser emitting direction generated by the laser emitting unit 10 and the moving direction of the lifting mechanism, the position of the crystal 200 to be detected in the width direction of the imaging screen 30 can be adjusted by setting the linear track 611. In addition, after the storage table 70 and the transfer mechanism are set, the detected crystal can be transferred from the conveying track 61 to the storage table 70, and the crystal 200 to be detected can be transferred from the storage table 70 to the conveying track 61 through the transfer mechanism, thereby realizing the automatic detection of the crystal and improving the efficiency of crystal detection.

[0054] In some embodiments, the conveying track 61 may be a circular track. For example, the conveying track 61 may be Figure 4In some embodiments, the transport track 61 may include a straight track 611 and two curved tracks 612. The two curved tracks 612 are respectively connected to the two ends of the straight track 611, and a storage platform 70 is respectively provided at the two ends of the straight track 611, wherein one storage platform 70 is used to place the crystal 200 to be detected and the fixed component 20 carrying the crystal 200 to be detected, and the other storage platform 70 is used to place the detected crystal and the fixed component 20 carrying the detected crystal.

[0055] In some embodiments, the transfer mechanism may include a robot arm and a transfer track for the robot arm to move, the robot arm is configured to move along the transfer track between the storage table 70 and the curved track 612, grab the fixed assembly 20 carrying the crystal 200 to be detected from the storage table 70 and transfer it to the curved track 612, and grab the fixed assembly 20 carrying the detected crystal from the curved track 612 and transfer it to the storage table 70. For example, the robot arm includes two, one robot arm is used to grab the fixed assembly 20 carrying the crystal 200 to be detected from the storage table 70 and transfer it to the curved track 612, and the other robot arm is used to grab the fixed assembly 20 carrying the detected crystal from the curved track 612 and transfer it to the storage table 70.

[0056] In some embodiments, Figure 5 As shown, the curved track 612 may not be necessary, and the transfer track 61 may only include a straight track 611, and the fixing assembly 20 may reciprocate on the straight track 611. A storage platform 70 is provided at each end of the straight track 611, and each storage platform 70 is correspondingly provided with a robot arm for transferring the fixing assembly 20.

[0057] In some embodiments, in combination Figure 1-Figure 5 As shown, a scale line 80 is also provided between the laser emitting unit 10 and the fixing component 20, and the scale line 80 can help the operator determine the distance between the laser emitting unit 10 and the fixing component 20, thereby facilitating the adjustment of the distance between the laser emitting unit 10 and the crystal 200 to be detected.

[0058] In some embodiments, the crystal detection device 100 may further include a second transmission unit (not shown in the figure), the second transmission unit is located between the laser emitting unit 10 and the imaging screen 30, the fixing component 20 is disposed on the second transmission unit, and the transmission direction of the second transmission unit is parallel to the laser emission direction generated by the laser emitting unit 10. The transmission direction of the second transmission unit can be Figure 4 In this embodiment, since the transmission direction of the second transmission unit is parallel to the laser emission direction generated by the laser emission unit 10, the distance between the crystal 200 to be detected and the laser emission unit 10 can be adjusted by setting the second transmission unit.

[0059] In some embodiments, the second conveying unit may include a second conveying track, the extension direction of the second conveying track is parallel to the laser emission direction, and the fixing assembly 20 may be disposed on the second conveying track. In some embodiments, the second conveying unit may be used in combination with the conveying unit 60 in other embodiments of the present specification. For example, the conveying unit 60 may be disposed on the second conveying track, and the conveying unit 60 may move along the second conveying track. In some embodiments, a scale line 80 may be disposed on the second conveying track to help the operator determine the distance between the crystal 200 to be detected and the laser emission unit 10.

[0060] The beneficial effects that may be brought about by the crystal detection device in the embodiments of this specification include but are not limited to: (1) Since the camera and the laser emitting unit are respectively located on both sides of the imaging screen and the imaging screen is a translucent structure, when an image is generated on one side of the imaging screen, the camera can capture the image generated on the imaging screen from the other side of the imaging screen, and due to the shielding of the imaging screen, the laser will not directly irradiate the camera, which can effectively prevent the camera from being damaged by the laser and increase the service life of the camera; (2) After a beam splitter is set at the emitting end of the laser emitting unit, when detecting crystals of different sizes to be detected, the size of the laser beam irradiated on the crystal to be detected can be adjusted according to the size of the crystal to be detected, ensuring that the size of the laser beam is smaller than the size of the crystal to be detected, thereby eliminating the need to adjust the parameters of the laser emitting unit; (3) By making the mounting table rotatably connected to the base, during the process of irradiating the crystal to be detected, the laser can be irradiated at different positions of the crystal to be detected by rotating the mounting table, so as to obtain the image of the crystal to be detected more comprehensively and accurately, and judge the quality of the crystal to be detected more accurately; (4) by setting a lifting mechanism, the crystal to be detected can be driven to move up and down by controlling the mounting table to lift relative to the base, so as to detect the crystal to be detected more comprehensively and improve the accuracy of detection; (5) by setting a transmission unit, the position of the crystal to be detected in the width direction of the imaging screen can be adjusted; (6) by setting a scale line between the laser emitting unit and the fixed component, the operator is helped to determine the distance between the laser emitting unit and the fixed component, so as to facilitate the adjustment of the distance between the laser emitting unit and the crystal to be detected. It should be noted that different embodiments may produce different beneficial effects. In different embodiments, the beneficial effects that may be produced may be any one or a combination of the above, or any other beneficial effects that may be obtained.

[0061] The basic concepts have been described above. Obviously, for those skilled in the art, the above detailed disclosure is only for example and does not constitute a limitation of this specification. Although not explicitly stated here, those skilled in the art may make various modifications, improvements and corrections to this specification. Such modifications, improvements and corrections are suggested in this specification, so such modifications, improvements and corrections still belong to the spirit and scope of the exemplary embodiments of this specification.

Claims

1. A crystal detection device, characterized in that: include: A laser emitting unit configured to generate laser light for irradiating a crystal to be inspected; A fixing assembly configured to carry the crystal to be detected; An imaging screen, on which an image is generated after the laser irradiates the crystal to be detected; a camera configured to capture the image on the imaging screen; The imaging screen is a semi-transparent structure, the laser emitting unit and the camera are located on both sides of the imaging screen, and the fixing component is located between the laser emitting unit and the imaging screen; It also includes a transmission unit, which is located between the laser emitting unit and the imaging screen. The fixing component is arranged on the transmission unit. The transmission direction of the transmission unit is perpendicular to the laser emitting direction generated by the laser emitting unit and the height direction of the imaging screen.

2. The crystal detection device according to claim 1, characterized in that: The imaging screen is provided with a photosensitive element, the photosensitive element is communicatively connected with the camera, and the photosensitive element is configured to control the camera to capture the image when detecting that the image is generated on the imaging screen.

3. The crystal detection device according to claim 1, characterized in that: The fixing assembly comprises a base and a mounting platform, wherein the mounting platform is fixedly connected to the base and is located between the laser emitting unit and the imaging screen, and the crystal to be detected is arranged on the table top of the mounting platform.

4. The crystal detection device according to claim 1, characterized in that: The fixing assembly comprises a base and a mounting platform, the mounting platform is rotatably connected to the base, and the mounting platform is located between the laser emitting unit and the imaging screen, and the crystal to be detected is arranged on the table top of the mounting platform.

5. The crystal detection device according to claim 3 or 4, characterized in that: The fixing assembly further includes a lifting mechanism, the mounting platform and the base are connected via the lifting mechanism, and the lifting mechanism is configured to drive the mounting platform to move in a direction perpendicular to a surface of the mounting platform.

6. The crystal detection device according to claim 5, characterized in that: The fixing assembly further includes a limiting mechanism, and the limiting mechanism is configured to limit the movement of the crystal to be detected relative to the table surface of the mounting table.

7. The crystal detection device according to claim 1, characterized in that: The conveying unit includes a conveying track, the conveying track includes a curved track and a straight track, at least one end of the straight track is connected to the curved track, and the conveying direction of the straight track is perpendicular to the laser emitting direction generated by the laser emitting unit and the height direction of the imaging screen; The crystal detection device also includes a storage table and a transfer mechanism, wherein the transfer mechanism is configured to transfer the crystal to be detected on the storage table and the fixed component carrying the crystal to be detected to the curved track, and to transfer the detected crystal on the curved track and the fixed component carrying the detected crystal to the storage table.

8. The crystal detection device according to claim 3 or 4, characterized in that: The laser emission direction is parallel to the table surface of the mounting table.

9. The crystal detection device according to claim 1, characterized in that: A scale line is provided between the laser emitting unit and the fixing component.

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