Adjusting mechanism of chip testing machine

Abstract

The utility model discloses an adjusting mechanism of a chip testing machine, which belongs to the technical field of chip testing, and comprises a bottom plate and a support rod arranged on the bottom plate, a first connecting plate is arranged on the support rod, a second connecting plate is arranged on the first connecting plate, a connecting block is arranged on the second connecting plate, a connecting rod is arranged on the connecting block, and the connecting rod is arranged on the connecting block. Third connecting plates are installed on the connecting rods, a first sliding rod is installed on one third connecting plate in a sliding mode, first limiting frames are installed on the first sliding rod and the other third connecting plate, and a limiting mechanism is installed on one third connecting plate. The distance between the two first limiting frames can be adjusted by arranging the sliding connection of the inner plate and the outer plate, the inserting blocks can slide into the first inserting grooves by arranging the sliding connection of the second sliding rods and the first limiting frames, and the adjusted first limiting frames can be limited; and therefore, chip testing machines with different sizes can be clamped.

Description

Technical Field

[0001] The utility model relates to an adjustment mechanism, in particular to an adjustment mechanism of a chip tester, belonging to the technical field of chip testing. Background Art

[0002] A chip tester is an electronic measuring instrument used in the field of electronics and communication technology. In the field of chip testing, the chip tester is generally placed on a fixed rack during chip testing. Before testing, an adjustment mechanism is required to connect the chip tester to the probe card and align it with the test wafer.

[0003] However, the adjustment mechanism of the existing chip tester cannot conveniently adjust the distance between the two limit frames during actual use, and thus cannot clamp chip testers of different sizes, resulting in poor applicability. Utility Model Content

[0004] The main purpose of the utility model is to solve the problem that the distance between two limiting frames cannot be conveniently adjusted, and to provide an adjustment mechanism for a chip testing machine.

[0005] The purpose of the utility model can be achieved by adopting the following technical solutions:

[0006] A chip tester adjustment mechanism comprises a base plate and a support rod mounted on the base plate, wherein a first connecting plate is mounted on the support rod, a second connecting plate is mounted on the first connecting plate, a connecting block is mounted on the second connecting plate, a connecting rod is mounted on the connecting block, and a third connecting plate is mounted on the connecting rod, a first sliding rod is slidably mounted on one of the third connecting plates, a first limiting frame is mounted on the first sliding rod and another of the third connecting plates, a limiting mechanism is mounted on one of the third connecting plates, one of the first limiting frames is rotatably connected to the third connecting plate, an outer plate is mounted on one of the first limiting frames, an inner plate slidably connected to the outer plate is mounted on another of the first limiting frames, a second sliding rod is slidably mounted on one of the third connecting plates, a limiting plate is mounted on one end of the second sliding rod, an insert block is mounted on the limiting plate, a first slot cooperating with the insert block is provided on both the outer plate and the inner plate, a second engaging mechanism is mounted on the second sliding rod, a first handle is mounted on the limiting plate, and a first anti-slip pad is mounted on the first handle.

[0007] Preferably, the second locking mechanism includes a second cavity, a second spring and a second locking ball, the second sliding rod is provided with a second cavity, a second spring is installed inside the second cavity, a second locking ball is installed at one end of the second spring, and the first limiting frame is provided with a plurality of second locking grooves that cooperate with the second locking balls.

[0008] Preferably, a rotating block is installed on one of the first limiting frames, a rotating groove cooperating with the first limiting frame is formed on the third connecting plate, a plurality of rotating cavities are formed on the rotating block, and balls are rotatably installed inside the rotating cavities.

[0009] Preferably, a baffle is slidably installed on the third connecting plate, a first slider is installed on the baffle, a first sliding groove cooperating with the first slider is provided on the third connecting plate, a first locking mechanism is installed on the first slider, an insertion rod is installed on the baffle, and a plurality of second slots cooperating with the insertion rods are provided on the rotating block.

[0010] Preferably, the first locking mechanism includes a first cavity, a first spring and a first locking ball, the first sliding block is provided with a first cavity, a first spring is installed inside the first cavity, a first locking ball is installed at one end of the first spring, and the third connecting plate is provided with a plurality of first locking grooves that cooperate with the first locking balls.

[0011] Preferably, a second handle is installed on the baffle, a second anti-slip pad is installed on the second handle, a turning handle is installed on one end of the first slide bar, and a third anti-slip pad is installed on the turning handle.

[0012] Preferably, a hydraulic telescopic rod is installed on the base plate, the output end of the hydraulic telescopic rod is connected to the bottom of the first connecting plate, a second sliding block is installed on the second connecting plate, and a second sliding groove cooperating with the second sliding block is opened on the support rod.

[0013] Preferably, a plurality of moving wheels are installed at the bottom of the base plate.

[0014] Beneficial technical effects of the utility model:

[0015] 1. According to the adjustment mechanism of the chip tester of the utility model, the distance between the two first limit frames can be adjusted by setting a sliding connection between the inner plate and the outer plate, and the insert block can be slid into the first slot by setting a second slide bar and a sliding connection with the first limit frame, so that the adjusted first limit frame can be limited, and chip testers of different sizes can be clamped.

[0016] 2. By setting the second locking ball to engage with the second locking groove, the second sliding rod can be limited after sliding, and the inserted plug can be limited. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a schematic diagram of the overall structure of the utility model;

[0018] Figure 2 This is a schematic diagram of the first sliding rod structure of the utility model;

[0019] Figure 3 This is a schematic diagram of the rotating block structure of the utility model;

[0020] Figure 4 This is a schematic diagram of the first ball-clamping structure of the utility model;

[0021] Figure 5 This is a schematic diagram of the inner plate structure of the utility model;

[0022] Figure 6 This is a schematic diagram of the plug-in structure of the utility model;

[0023] Figure 7 It is a schematic diagram of the second sliding block structure of the utility model.

[0024] In the figure: 1, bottom plate; 2, moving wheel; 3, support rod; 4, hydraulic telescopic rod; 5, first connecting plate; 6, second connecting plate; 7, connecting block; 8, third connecting plate; 9, first sliding rod; 10, turning handle; 11, first limiting frame; 12, outer plate; 13, connecting rod; 14, insert block; 15, limiting plate; 16, first grip; 17, turning block; 18, ball bearing; 19, insert rod; 20, baffle; 21, first sliding block; 22, first spring; 23, first clamping ball; 24, inner plate; 25, second sliding rod; 26, second clamping ball; 27, second spring; 28, second grip; 29, second sliding block. DETAILED DESCRIPTION

[0025] In order to make the technical solution of the present invention more clear and specific to those skilled in the art, the present invention is further described in detail below in conjunction with embodiments and drawings, but the implementation methods of the present invention are not limited thereto.

[0026] like Figure 1-Figure 7As shown, the adjustment mechanism of the chip tester provided in this embodiment includes a base plate 1 and a support rod 3 installed on the base plate 1, a first connecting plate 5 is installed on the support rod 3, a second connecting plate 6 is installed on the first connecting plate 5, a connecting block 7 is installed on the second connecting plate 6, a connecting rod 13 is installed on the connecting block 7, a third connecting plate 8 is installed on the connecting rod 13, a first sliding rod 9 is slidably installed on one of the third connecting plates 8, a first limiting frame 11 is installed on the first sliding rod 9 and the other third connecting plate 8, a limiting mechanism is installed on one of the third connecting plates 8, one of the first limiting frames 11 is rotatably connected to the third connecting plate 8, an outer plate 12 is installed on one of the first limiting frames 11, and another first limiting frame 11 is installed with a first limiting mechanism that is slidably connected to the outer plate 12. The inner plate 24, one of the third connecting plates 8 is slidably mounted with a second slide bar 25, one end of the second slide bar 25 is mounted with a limit plate 15, the limit plate 15 is mounted with an insert block 14, the outer plate 12 and the inner plate 24 are both provided with a first slot that cooperates with the insert block 14, the second locking mechanism is mounted on the second slide bar 25, the limit plate 15 is mounted with a first handle 16, the first handle 16 is mounted with a first anti-slip pad, by arranging the inner plate 24 and the outer plate 12 to be slidably connected, the distance between the two first limit frames 11 can be adjusted, by arranging the second slide bar 25 to be slidably connected with the first limit frame 11, the insert block 14 can be slid into the first slot, the adjusted first limit frame 11 can be limited, and then chip testers of different sizes can be clamped.

[0027] In this embodiment, if Figure 1 , Figure 2 , Figure 3 and Figure 6 As shown, the second locking mechanism includes a second cavity, a second spring 27 and a second locking ball 26. The second slide rod 25 is provided with a second cavity, the interior of the second cavity is installed with a second spring 27, and a second locking ball 26 is installed at one end of the second spring 27. The first limiting frame 11 is provided with a plurality of second locking grooves that cooperate with the second locking ball 26. By setting the second locking ball 26 to be engaged with the second locking groove, the second slide rod 25 can be limited after sliding, and then the inserted plug 14 can be limited.

[0028] In this embodiment, if Figure 1 , Figure 2 , Figure 3 , Figure 4 and Figure 5As shown, a rotating block 17 is installed on one of the first limit frames 11, and a rotating groove that cooperates with the first limit frame 11 is opened on the third connecting plate 8. A plurality of rotating cavities are opened on the rotating block 17, and a ball 18 is installed inside the rotating cavity for rotation. By setting the rotating block 17 and the rotating groove to be rotatably connected, it is convenient to drive the first limit frame 11 to rotate, so as to adjust the angle of the chip tester. By setting the ball 18, the friction force of the rotation of the rotating block 17 can be reduced. A baffle 20 is slidably installed on the third connecting plate 8, and a first slider 21 is installed on the baffle 20. A first sliding groove that cooperates with the first slider 21 is opened on the third connecting plate 8, and a first locking mechanism is installed on the first slider 21. A plug rod 19 is installed on the baffle 20, and a plurality of second slots that cooperate with the plug rod 19 are opened on the rotating block 17. By setting the first slider 21 to be slidably connected with the first sliding groove, it is convenient to insert the plug rod 19 into the second slot, so that the rotation of the chip tester can be adjusted. The first limiting frame 11 is used for limiting, and the first engaging mechanism includes a first cavity, a first spring 22 and a first engaging ball 23. The first cavity is provided on the first sliding block 21, and the first spring 22 is installed inside the first cavity. The first engaging ball 23 is installed at one end of the first spring 22, and a plurality of first engaging grooves that cooperate with the first engaging ball 23 are provided on the third connecting plate 8. By setting the first engaging ball 23 to engage with the first engaging groove, the sliding insertion rod 19 can be limited. A second grip 28 is installed on the baffle 20, and a second anti-slip pad is installed on the second grip 28. A turning handle 10 is installed at one end of the first sliding rod 9, and a third anti-slip pad is installed on the turning handle 10. By setting the second grip 28, it is convenient to pull the insertion rod 19, and by setting the second anti-slip pad, the friction of the second grip 28 can be increased, and by setting the turning handle 10, it is convenient to rotate the first sliding rod 9, and by setting the third anti-slip pad, the friction of the turning handle 10 can be increased.

[0029] In this embodiment, if Figure 1 and Figure 7 As shown, a hydraulic telescopic rod 4 is installed on the base plate 1, and the output end of the hydraulic telescopic rod 4 is connected to the bottom of the first connecting plate 5, and a second slider 29 is installed on the second connecting plate 6. A second slide groove that cooperates with the second slider 29 is opened on the support rod 3. By setting the hydraulic telescopic rod 4, the hydraulic telescopic rod 4 is started to drive the second connecting plate 6 to move the second slider 29 to slide in the second slide groove, so as to adjust the position of the first limit frame 11, and then the position of the chip tester can be adjusted. A plurality of moving wheels 2 are installed at the bottom of the base plate 1. By setting the moving wheels 2, the chip tester can be easily moved.

[0030] In this embodiment, if Figure 1-Figure 7 As shown, the working process of the adjustment mechanism of a chip tester provided in this embodiment is as follows:

[0031] Step 1: Move the chip tester to the working position by moving the wheel 2, slide the first limit frame 11, slide the inner plate 24 on the outer plate 12 to adjust the position of the first limit frame 11 to clamp the chip tester, slide the second slide bar 25, insert the plug 14 into the first slot to limit the first limit frame 11 after sliding, and the second card ball 26 is inserted into the card slot to limit the plug 14 after sliding;

[0032] Step 2: Turn the handle 10 to drive the first limit frame 11 to rotate and adjust the angle of the chip tester, slide the rod 19, the first slider 21 slides in the first slide groove, and insert the rod 19 into the second slot to limit the rotated first limit frame 11;

[0033] Step 3: The hydraulic telescopic rod 4 is started to drive the second connecting plate 6 to slide on the support rod 3, and the second sliding block 29 slides in the second sliding groove to adjust the height of the chip testing machine.

[0034] In summary, in this embodiment, according to the adjustment mechanism of the chip tester of this embodiment, by setting the inner plate 24 and the outer plate 12 to be slidably connected, the distance between the two first limit frames 11 can be adjusted; by setting the second slide bar 25 to be slidably connected with the first limit frame 11, the insertion block 14 can be slid into the first slot, the adjusted first limit frame 11 can be limited, and thus the chip testers of different sizes can be clamped; by setting the second card ball 26 to be engaged with the second card slot, the sliding second slide bar 25 can be limited, and thus the inserted insertion block 14 can be limited; by setting the rotating block 17 to be rotatably connected with the rotating slot, it is convenient to drive the first limit frame 11 to rotate, and thus the angle of the chip tester can be adjusted; by setting the ball 18, the friction force of the rotating block 17 can be reduced; Setting the first slider 21 to be slidably connected with the first slide groove can facilitate the insertion of the insertion rod 19 into the second slot, so as to limit the first limit frame 11 after rotation; setting the first card ball 23 to be engaged with the first card groove can limit the sliding insertion rod 19; setting the second handle 28 can facilitate pulling the insertion rod 19; setting the second anti-skid pad can increase the friction of the second handle 28; setting the turning handle 10 can facilitate the rotation of the first slide rod 9; setting the third anti-skid pad can increase the friction of the turning handle 10; setting the hydraulic telescopic rod 4, the hydraulic telescopic rod 4 is started to drive the second connecting plate 6 to move the second slider 29 to slide in the second slide groove, so as to adjust the position of the first limit frame 11, and then the position of the chip tester can be adjusted; setting the moving wheel 2 can facilitate the movement of the chip tester.

[0035] The above is only a further embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes within the scope disclosed by the present invention according to the technical solution and concept of the present invention, which fall within the protection scope of the present invention.

Claims

1. An adjustment mechanism for a chip tester, characterized in that: The invention comprises a base plate (1) and a support rod (3) mounted on the base plate (1); a first connecting plate (5) is mounted on the support rod (3); a second connecting plate (6) is mounted on the first connecting plate (5); a connecting block (7) is mounted on the second connecting plate (6); a connecting rod (13) is mounted on the connecting block (7); a third connecting plate (8) is mounted on the connecting rod (13); a first sliding rod (9) is slidably mounted on one of the third connecting plates (8); a first limiting frame (11) is mounted on the first sliding rod (9) and the other third connecting plate (8); a limiting mechanism is mounted on one of the third connecting plates (8); and one of the first limiting frames (11) and the third connecting plate ( 8) rotatably connected, one of the first limit frames (11) is equipped with an outer plate (12), the other first limit frame (11) is equipped with an inner plate (24) slidably connected to the outer plate (12), one of the third connecting plates (8) is slidably equipped with a second slide bar (25), one end of the second slide bar (25) is equipped with a limit plate (15), an insert block (14) is installed on the limit plate (15), the outer plate (12) and the inner plate (24) are both provided with a first slot that cooperates with the insert block (14), the second slide bar (25) is equipped with a second locking mechanism, the limit plate (15) is equipped with a first handle (16), and the first handle (16) is equipped with a first anti-slip pad.

2. The adjustment mechanism of a chip tester according to claim 1, characterized in that: The second locking mechanism comprises a second cavity, a second spring (27) and a second locking ball (26); the second sliding rod (25) is provided with a second cavity, a second spring (27) is installed inside the second cavity, a second locking ball (26) is installed at one end of the second spring (27), and the first limiting frame (11) is provided with a plurality of second locking grooves that cooperate with the second locking balls (26).

3. The adjustment mechanism of a chip tester according to claim 2, characterized in that: A rotating block (17) is installed on one of the first limiting frames (11), a rotating groove cooperating with the first limiting frame (11) is provided on the third connecting plate (8), a plurality of rotating cavities are provided on the rotating block (17), and a ball (18) is rotatably installed inside the rotating cavity.

4. The adjustment mechanism of a chip tester according to claim 3, characterized in that: A baffle (20) is slidably mounted on the third connecting plate (8), a first slider (21) is mounted on the baffle (20), a first sliding groove cooperating with the first slider (21) is provided on the third connecting plate (8), a first locking mechanism is mounted on the first slider (21), an insertion rod (19) is mounted on the baffle (20), and a plurality of second slots cooperating with the insertion rod (19) are provided on the rotating block (17).

5. The adjustment mechanism of a chip tester according to claim 4, characterized in that: The first engaging mechanism comprises a first cavity, a first spring (22) and a first locking ball (23); the first sliding block (21) is provided with a first cavity, the first spring (22) is installed inside the first cavity, the first locking ball (23) is installed at one end of the first spring (22), and the third connecting plate (8) is provided with a plurality of first locking grooves that cooperate with the first locking ball (23).

6. The adjustment mechanism of a chip tester according to claim 5, characterized in that: A second grip (28) is mounted on the baffle (20), a second anti-slip pad is mounted on the second grip (28), a turning handle (10) is mounted on one end of the first slide bar (9), and a third anti-slip pad is mounted on the turning handle (10).

7. The adjustment mechanism of a chip tester according to claim 6, characterized in that: A hydraulic telescopic rod (4) is installed on the base plate (1), the output end of the hydraulic telescopic rod (4) is connected to the bottom of the first connecting plate (5), a second sliding block (29) is installed on the second connecting plate (6), and a second sliding groove cooperating with the second sliding block (29) is provided on the support rod (3).

8. The adjustment mechanism of a chip tester according to claim 7, characterized in that: A plurality of moving wheels (2) are installed at the bottom of the base plate (1).

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