Ceramic waveguide filter

Abstract

The utility model discloses a ceramic waveguide filter comprising a filter body, the filter body is provided with debugging holes, and the debugging holes comprise a first debugging hole and a second debugging hole; the filter body is also provided with a capacitive coupling structure and an inductive coupling structure. The inductive coupling structure is coupled with the first debugging hole, and the second debugging hole is coupled with the capacitive coupling structure; the inductive coupling structure comprises a first debugging blind hole and a second debugging blind hole; the capacitive coupling structure comprises a third debugging blind hole and a fourth debugging blind hole. According to the utility model, capacitive and inductive coupling can be realized by adjusting the relative depths of the first debugging blind hole, the second debugging blind hole, the third debugging blind hole and the fourth debugging blind hole, and the depths of the first debugging blind hole and the third debugging blind hole are adjusted; the target requirement can be met by adjusting the depth of the first debugging blind hole, the depth of the second debugging blind hole and the depth of the fourth debugging blind hole, and the problems of difficulty, time consumption and poor debugging precision in current filter debugging are solved.

Description

Technical Field

[0001] The utility model belongs to the technical field of filters, in particular to a ceramic waveguide filter. Background Art

[0002] In the field of mobile communications, with the development of 5G base stations, higher requirements are placed on the performance and miniaturization of filters within the system. Ceramic materials have become the mainstream choice for contemporary base stations due to their high performance and small size.

[0003] According to the requirements of high-power microwave filters at the base station end of mobile communication systems for out-of-band frequency selection, it is usually necessary to introduce transmission zeros when designing filters. However, due to the limitations of powder materials and structures of dielectric filters, it is more difficult to achieve capacitive cross-coupling than metal filters. Patent No. 201380046875.9 proposes a dielectric filter, which has a unidirectional negative coupling hole on the upper surface at the center of the connection position of two resonators. It is worth noting that the depth of the hole is twice or more the depth of the debugging holes of the two resonators at the connection position.

[0004] In the prior art, the method for debugging the filter is to debug the depth of the negative coupling blind hole. During the debugging, irreversible situations are very likely to occur, and the debugging accuracy is poor, which greatly consumes time and cost. Utility Model Content

[0005] The purpose of the utility model is to provide a ceramic waveguide filter to solve the problems in the prior art mentioned in the background technology, that the filter debugging is very likely to be irreversible, and its debugging accuracy is poor, which greatly consumes time and costs.

[0006] In order to solve the above technical problems, the technical solution adopted by the utility model is:

[0007] A ceramic waveguide filter comprises a filter body, wherein the filter body is provided with debugging holes, wherein the debugging holes comprise a first debugging hole and a second debugging hole; wherein the first debugging hole and the second debugging hole are evenly arranged on the filter body;

[0008] A capacitive coupling structure and an inductive coupling structure are also provided on the filter body; wherein the first debugging hole is coupled with the inductive coupling structure, and the second debugging hole is coupled with the capacitive coupling structure; the inductive coupling structure comprises a first debugging blind hole and a second debugging blind hole, the first debugging blind hole and the second debugging blind hole are provided along the lateral direction of the filter body, and the first debugging blind hole and the second debugging blind hole both have a certain depth;

[0009] The capacitive coupling structure comprises a third debugging blind hole and a fourth debugging blind hole; the third debugging blind hole and the fourth debugging blind hole are arranged along the longitudinal direction of the filter body, and the third debugging blind hole and the fourth debugging blind hole both have a certain depth.

[0010] According to the above technical solution, the second debugging hole includes debugging hole A and debugging hole B; the capacitive coupling structure is arranged between debugging hole A and debugging hole B, and the inductive coupling structure is arranged between debugging hole A and the first debugging hole.

[0011] According to the above technical solution, two second debugging blind holes are provided, and the two second debugging blind holes are respectively provided on both sides of the first debugging blind hole.

[0012] According to the above technical solution, the centers of the first debugging blind hole and the second debugging blind hole are on the same horizontal line.

[0013] According to the above technical solution, two fourth debugging blind holes are provided, and the two fourth debugging blind holes are respectively provided on both sides of the third debugging blind hole.

[0014] According to the above technical solution, a coupling groove is also provided on the filter body, and the coupling groove is used to separate the capacitive and inductive coupling structures.

[0015] According to the above technical solution, two sets of coupling slots are provided, and the two sets of coupling slots are respectively provided at two ends of the filter body.

[0016] According to the above technical solution, a connection port is further provided below the filter body, and the connection port includes an input port and an output port.

[0017] According to the above technical solution, the first debugging blind hole, the second debugging blind hole, the third debugging blind hole and the fourth debugging blind hole are all provided with a conductive metal plating layer inside.

[0018] Compared with the prior art, the utility model has the following beneficial effects:

[0019] The utility model can realize capacitive and inductive coupling by adjusting the relative depths of the first debugging blind hole, the second debugging blind hole, the third debugging blind hole and the fourth debugging blind hole, and at the same time, the depths of the first debugging blind hole, the third debugging blind hole, the second debugging blind hole and the fourth debugging blind hole are debugged to meet the target requirements, thus solving the problems of difficulty, time-consuming and poor debugging accuracy in current filter debugging. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 It is a three-dimensional structural schematic diagram of the filter body of the utility model;

[0021] Figure 2 This is a schematic diagram of the lower surface structure of the filter body of the utility model;

[0022] Figure 3 It is a topological structure diagram of the filter body of the utility model;

[0023] Figure 4 It is a schematic diagram of the capacitive coupling structure of the filter body of the utility model;

[0024] Figure 5 It is a schematic diagram of the inductive coupling structure of the filter body of the utility model;

[0025] Figure 6 This is a schematic diagram of the installation structure of the filter body of the utility model;

[0026] Figure 7 This is a parameter diagram of the filter body of the utility model.

[0027] Markings in the figure: 100-filter body, 200-first debugging hole, 300-second debugging hole, 400-first debugging blind hole, 500-second debugging blind hole, 600-third debugging blind hole, 700-fourth debugging blind hole, 800-debugging hole A, 900-debugging hole B, 110-coupling slot, 111-output port, 112-input port, 113-conductive metal plating, 114-clamping plate, 115-clamping slot. DETAILED DESCRIPTION

[0028] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0029] Embodiment 1

[0030] like Figure 1 As shown, a ceramic waveguide filter includes a filter body 110, and the filter body 110 is provided with debugging holes, and the debugging holes include a first debugging hole 200 and a second debugging hole 300; wherein the first debugging hole 200 and the second debugging hole 300 are evenly arranged on the filter body 110;

[0031] A capacitive coupling structure and an inductive coupling structure are also provided on the filter body 110; wherein the first debugging hole 200 is coupled with the inductive coupling structure, and the second debugging hole 300 is coupled with the capacitive coupling structure; the inductive coupling structure includes a first debugging blind hole 400 and a second debugging blind hole 500, the first debugging blind hole 400 and the second debugging blind hole 500 are provided along the lateral direction of the filter body 110, and the first debugging blind hole 400 and the second debugging blind hole 500 both have a certain depth;

[0032] The capacitive coupling structure includes a third debugging blind hole 600 and a fourth debugging blind hole 700 ; the third debugging blind hole 600 and the fourth debugging blind hole 700 are arranged along the longitudinal direction of the filter body 110 , and both of the third debugging blind hole 600 and the fourth debugging blind hole 700 have a certain depth.

[0033] The utility model can realize capacitive and inductive coupling by adjusting the relative depths of the first debugging blind hole 400 and the second debugging blind hole 500, the third debugging blind hole 600 and the fourth debugging blind hole 700, and at the same time, the design optimization is carried out from three aspects: the depth of the first debugging blind hole 400 and the third debugging blind hole 600; the depth of the second debugging blind hole 500 and the fourth debugging blind hole 700; the hole distance between the first debugging blind hole 400 and the second debugging blind hole 500 and the hole distance between the third debugging blind hole 600 and the fourth debugging blind hole 700; during debugging, the first, second, third and fourth blind holes can be adjusted to achieve the target demand, thereby solving the problems of difficulty, time-consuming and poor debugging accuracy in current filter debugging.

[0034] Embodiment 2

[0035] This embodiment is a further refinement of the first embodiment.

[0036] The second debugging hole 300 includes a debugging hole A800 and a debugging hole B900 ; the capacitive coupling structure is arranged between the debugging hole A800 and the debugging hole B900 , and the inductive coupling structure is arranged between the debugging hole A800 and the first debugging hole 200 .

[0037] like Figure 3 As shown, the debugging hole A800 is coupled to the inductive coupling structure, and the debugging hole A800 and the debugging hole B900 are both coupled to the capacitive coupling structure.

[0038] like Figure 1 As shown, the debugging hole A800 is set at the lower right corner of the filter body 110, the debugging hole B900 is set at the upper right corner of the filter body 110, and a capacitive coupling structure is set between the debugging hole A800 and the debugging hole B900.

[0039] The debugging hole A800 and the debugging hole B900 are connected through a capacitive coupling structure, and the filtering capability of the filter is changed by adjusting the capacitive coupling structure.

[0040] There are two second debugging blind holes 500, which are respectively arranged on both sides of the first debugging blind hole 400. The centers of the first debugging blind hole 400 and the second debugging blind hole 500 are on the same horizontal line.

[0041] like Figure 4As shown, two second debugging blind holes 500 are respectively arranged on both sides of the first debugging blind hole 400, and three debugging blind holes are arranged along the width direction of the filter body 110, and the centers of the three debugging blind holes are on the same horizontal line.

[0042] Furthermore, the depth of the first debugging blind hole 400 is at most one-half of the height of the filter body 110 (for example, if the height of the filter body 110 is 6 mm, the depth of the first debugging blind hole 400 is at most 3 mm and the minimum is 0.1 mm), and the depth of the second debugging blind hole 500 needs to be less than half of the height of the filter body 110 and greater than the depth of the first debugging blind hole 400 (for example, the depth of the first debugging blind hole 400 is 1 mm, and the maximum depth of the second debugging blind hole 500 is 3 mm).

[0043] Two fourth debugging blind holes 700 are provided, and the two fourth debugging blind holes 700 are respectively provided on both sides of the third debugging blind hole 600 .

[0044] like Figure 5 As shown, two fourth debugging blind holes 700 are respectively arranged on both sides of the third debugging blind hole 600, and the three debugging blind holes are arranged along the length direction of the filter body 110, and the centers of the three debugging blind holes are on the same horizontal line.

[0045] Furthermore, the depth of the third debugging blind hole 600 is at least one-half of the height of the filter body 110 (for example, if the height of the filter body 110 is 6 mm, the depth of the third debugging blind hole 600 is at least 3.5 mm), and the depth of the fourth debugging blind hole 700 is not greater than the depth of the third debugging blind hole 600 (for example, if the depth of the third debugging blind hole 600 is 4 mm, the maximum depth of the fourth debugging blind hole 700 is 3 mm and the minimum depth is 0.1 mm).

[0046] In the inductive coupling structure, the first debugging blind hole 400 has the greatest influence on the inductive coupling amount, and the second debugging blind hole 500 has the second greatest influence. Therefore, when designing, the first debugging blind hole 400 is debugged first to achieve a large range, and then the second debugging blind hole 500 is debugged to achieve fine adjustment.

[0047] In the capacitive coupling structure, the third debugging blind hole has the greatest impact on the coupling amount, followed by the fourth debugging blind hole 700. Therefore, when designing, the third debugging blind hole 600 is mainly debugged first to achieve a large range, and then the fourth debugging blind hole 700 is debugged to achieve fine adjustment.

[0048] Debug coupling relationship: the farther the distance between the first debugging blind hole 400 and the second debugging blind hole 500 is, the smaller the coupling is. The deeper the first debugging blind hole 400 is, the greater the coupling is; the deeper the second debugging blind hole 500 is, the greater the coupling is; the deeper the third debugging blind hole 600 is, the smaller the coupling is; the deeper the fourth debugging blind hole 700 is, the smaller the coupling is.

[0049] like Figure 1 and Figure 2 As shown, a coupling slot 110 is also provided on the filter body 110, and the coupling slot 110 is used to separate the capacitive coupling structure and the inductive coupling structure. There are two sets of coupling slots 110, and the two sets of coupling slots 110 are respectively provided at both ends of the filter body 110.

[0050] Specifically, the coupling slot 110 is disposed throughout the filter body 110 .

[0051] Furthermore, there are four first debugging holes 200, which are evenly arranged on the filter body 110, wherein two first debugging holes 200 are arranged at the front end of the filter body 110, and two first debugging holes 200 are arranged at the rear end of the filter body 110, and the coupling slot 110 is used to separate adjacent first debugging holes 200.

[0052] In a specific implementation manner, the first debugging hole 200 includes a debugging hole C, a debugging hole D, a debugging hole E, and a debugging hole F; and the coupling slot 110 includes a first coupling slot 110 and a second coupling slot 110 .

[0053] The debugging hole E is arranged at the lower left corner of the filter body 110, the debugging hole F is arranged at the upper left corner of the filter body 110, the debugging hole C is arranged between the debugging hole E and the debugging hole A800, and the debugging hole C and the debugging hole E, the debugging hole E and the debugging hole F, and the debugging hole D and the debugging hole F are separated by the first coupling slot 110; the debugging hole D is arranged between the debugging hole F and the debugging hole B900, and the debugging hole C and the debugging hole D are separated by the second coupling slot 110;

[0054] like Figure 2 As shown, a connection port is further provided below the filter body 110 , and the connection port includes an input port 112 and an output port 111 .

[0055] like Figure 4 and Figure 5 As shown, the first debugging blind hole 400 , the second debugging blind hole 500 , the third debugging blind hole 600 and the fourth debugging blind hole 700 are all provided with a conductive metal plating layer 113 inside.

[0056] Further, the debugging hole A800 and the debugging hole B900 are arranged along the longitudinal direction of the filter body 110 .

[0057] The working principle of the utility model is as follows: the utility model can realize capacitive and inductive coupling by adjusting the relative depths of the first debugging blind hole 400 and the second debugging blind hole 500, the third debugging blind hole 600 and the fourth debugging blind hole 700, and at the same time, the depths of the first debugging blind hole 400 and the third debugging blind hole 600, the second debugging blind hole 500 and the fourth debugging blind hole 700 are adjusted, and the results are as follows: Figure 7 The target requirement can be achieved by using the filter as shown in the figure, thus solving the current problems of difficult and time-consuming filter debugging and poor debugging accuracy.

[0058] Another implementation manner: when digging the third debugging blind hole 600 and the fourth debugging blind hole 700, the third debugging blind hole 600 can be dug from the upper surface of the filter body 100, and the fourth debugging blind hole 700 can be dug from the lower surface of the filter body 100, thereby improving the design flexibility.

[0059] Another implementation manner: the third debugging blind hole 600 may be dug from the lower surface of the filter body 100 , and the fourth debugging blind hole 700 may be dug from the upper surface of the filter body 100 .

[0060] Embodiment 3

[0061] This embodiment provides a mounting structure for a ceramic waveguide filter.

[0062] A clamping plate 114 is provided on the side of the filter body 100. A rotation hole is provided at the end of the clamping plate 114. The clamping plate 114 is rotatably connected to the filter body 100 through the rotation hole. A clamping groove 115 is also provided on the clamping plate 114. The clamping groove 115 is an arc-shaped structure (such as Figure 6 As shown), a plurality of clamping grooves 115 are provided, and the plurality of clamping grooves 115 are evenly arranged on the clamping plate 114.

[0063] Furthermore, four clamping grooves 115 are provided.

[0064] Furthermore, a fixing hole is provided at the other end of the clamping plate 114 , and the clamping plate 114 is fixedly connected to the filter body 100 through the fixing hole.

[0065] Specifically, when in use, the clamping plate 114 is rotated to open the clamping plate 114, and the connecting wires required to connect the filter body 100 with other devices are installed inside the clamping groove 115, and then the other end of the clamping plate 114 is fixed to the filter body 100 (for example, by bolts). The connecting wires are fixed by the clamping groove 115, which improves the installation efficiency of the filter body 100 and prevents the filter body 100 from being affected by the connecting wires when in use.

[0066] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device.

[0067] Finally, it should be noted that the above description is only a preferred embodiment of the utility model and is not intended to limit the utility model. Although the utility model is described in detail with reference to the above embodiments, those skilled in the art can still modify the technical solutions recorded in the above embodiments or replace some of the technical features therein by equivalents. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the utility model shall be included in the protection scope of the utility model.

Claims

1. A ceramic waveguide filter, comprising a filter body (100), characterized in that: The filter body (100) is provided with debugging holes, which include a first debugging hole (200) and a second debugging hole (300); wherein the first debugging hole (200) and the second debugging hole (300) are evenly arranged on the filter body (100); A capacitive coupling structure and an inductive coupling structure are also provided on the filter body (100); wherein the first debugging hole (200) is coupled to the inductive coupling structure, and the second debugging hole (300) is coupled to the capacitive coupling structure; the inductive coupling structure comprises a first debugging blind hole (400) and a second debugging blind hole (500), the first debugging blind hole (400) and the second debugging blind hole (500) are provided along the width direction of the filter body (100), and the first debugging blind hole (400) and the second debugging blind hole (500) both have a certain depth; The capacitive coupling structure comprises a third debugging blind hole (600) and a fourth debugging blind hole (700); the third debugging blind hole (600) and the fourth debugging blind hole (700) are arranged along the length direction of the filter body (100), and the third debugging blind hole (600) and the fourth debugging blind hole (700) both have a certain depth.

2. A ceramic waveguide filter according to claim 1, characterized in that: The second debugging hole (300) comprises a debugging hole A (800) and a debugging hole B (900); the capacitive coupling structure is arranged between the debugging hole A (800) and the debugging hole B (900), and the inductive coupling structure is arranged between the debugging hole A (800) and the first debugging hole (200).

3. The ceramic waveguide filter according to claim 1, characterized in that: Two second debugging blind holes (500) are provided, and the two second debugging blind holes (500) are respectively provided on both sides of the first debugging blind hole (400).

4. A ceramic waveguide filter according to claim 3, characterized in that: The centers of the first debugging blind hole (400) and the second debugging blind hole (500) are located on the same horizontal line.

5. The ceramic waveguide filter according to claim 1, characterized in that: Two fourth debugging blind holes (700) are provided, and the two fourth debugging blind holes (700) are respectively provided on both sides of the third debugging blind hole (600).

6. The ceramic waveguide filter according to claim 1, characterized in that: A coupling groove (110) is also provided on the filter body (100), and the coupling groove (110) is used to separate the debugging holes.

7. The ceramic waveguide filter according to claim 1, characterized in that: Two sets of coupling slots (110) are provided, and the two sets of coupling slots (110) are respectively provided at two ends of the filter body (100).

8. The ceramic waveguide filter according to claim 1, characterized in that: A connection port is also provided below the filter body (100), and the connection port comprises an input port (112) and an output port (111).

9. The ceramic waveguide filter according to claim 1, characterized in that: Conductive metal plating layers (113) are arranged inside the first debugging blind hole (400), the second debugging blind hole (500), the third debugging blind hole (600) and the fourth debugging blind hole (700).

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