Turnover chip test fixture
By designing a flipped chip test fixture, including a rotation adjustment mechanism, a chip clamping mechanism and a bottom lifting mechanism, the problems of chip angle adjustment in the prior art are solved, and the chip is stable and fixed and multi-dimensional. Testing improves the flexibility and efficiency of testing.
Patent Information
- Application Number
- CN202421014671.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-10
- Publication Date
- 2025-02-21
- Estimated Expiration
- 2034-05-10
AI Technical Summary
Existing chip test equipment cannot adjust the angle of the chip, resulting in limited viewing angle and test coverage of the chip during the test, and it is impossible to quickly and accurately adjust the chip to a specific test angle, while the chip cannot be stably and safely fixed to the test. Position, easy to shift or fall off during the test.
A flip-flopable chip test fixture is designed, including a flip plate, a rotation adjustment mechanism, a chip clamping mechanism and a bottom lifting mechanism. The rotary adjustment mechanism realizes precise rotation adjustment of the chip through the drive motor and belt system. The chip clamping mechanism ensures the stable fixation of the chip through the threaded bearing frame and lock rod design. The bottom lifting mechanism realizes the height adjustment of the fixture through the electric push rod.
It realizes stable fixed and multi-directional testing of the chip during the test process, improves the flexibility and efficiency of testing, avoids test errors caused by vibration, and simplifies the chip loading and unloading and position adjustment process.
Smart Images
Figure CN222514615U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of chip testing, and more specifically, to a flippable chip testing fixture. Background Art
[0002] A flip chip test fixture is a device used for chip testing. Its feature is that the chip can be easily flipped or rotated to achieve multiple test directions or modes. This design makes it possible to test the chip in all directions, improving the flexibility and efficiency of the test.
[0003] In the existing technology, firstly, some devices cannot adjust the angle of the chip, which greatly limits the viewing angle and test coverage of the chip during the test. The inability to quickly and accurately adjust the chip to a specific test angle may slow down the test process and affect the overall test process and efficiency. Secondly, the chips of some devices cannot be stably and safely fixed in the test position, and are prone to shifting or falling off during the test, affecting the accuracy of the test results. The lack of simple locking and adjustment mechanisms, such as locking blocks and turning handles, makes the loading and unloading and position adjustment of the chip before and after the test more difficult and time-consuming. Finally, some devices cannot adjust the height of the fixture to adapt to test equipment of different heights or to meet specific test requirements. The inability to accurately adjust the vertical position of the chip may lead to inaccurate testing. Utility Model Content
[0004] 1. Technical issues to be resolved
[0005] In view of the problems existing in the prior art, the utility model provides a flippable chip testing fixture to solve the technical problems mentioned in the background technology, such as the inability to adjust the angle of the chip and the inability to stably and safely fix the chip in the testing position.
[0006] (II) Technical solution
[0007] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a flippable chip testing fixture, comprising a flip plate, a rotation adjustment mechanism, a chip clamping mechanism and a bottom lifting mechanism, the rotation adjustment mechanism comprising a driving motor, a driving wheel, a driven wheel, a belt, a rotating rod and a turntable, the driving wheel is installed at the output end of the driving motor, the belt connects the driving wheel with the driven wheel, and the driven wheel is cooperatively connected to the rotating rod, the turntable is cooperatively installed at one end of the rotating rod, the chip clamping mechanism comprises a threaded support frame, a locking block, a turning handle, a locking rod and a clamping head, the outer surface of the locking rod is threaded, and one end of the locking rod cooperates to extend through the threaded support frame, and the clamping head is installed at one end of the locking rod, the locking block is installed at the other end of the locking rod, the turning handle is installed on the locking rod, and the turning handle is detachably arranged on the locking block.
[0008] The utility model is further configured as follows: the bottom lifting mechanism includes a bottom plate, a movable plate, an electric push rod and a motion groove, multiple groups of electric push rods are installed on the top end surface of the bottom plate, the movable plate is cooperatively connected with two sections of the electric push rods, a motion groove is provided in the center position of the movable plate, and the turntable can move in the motion groove, the rotation adjustment mechanism is installed on the top end surface of the bottom plate, and the chip clamping mechanism is installed on the top end surface of the movable plate.
[0009] The utility model is further configured such that a connecting rod is provided on the side end face of the flip plate, a flip assembly is provided on the side of the device, and the output end of the flip assembly is cooperatively connected with the connecting rod, the flip plate and the flip assembly realize the flipping operation of the chip, allowing the other side of the chip to be tested.
[0010] The utility model is further configured such that dustproof plates are provided on the outer sides of the moving grooves of the movable plates, and a plurality of groups of dustproof plates are provided. The provision of the dustproof plates facilitates improving the dustproof effect of the device.
[0011] The utility model is further configured such that a cleaning air slot is provided on the top end surface of the movable plate, and the cleaning air slot is arranged on the outer side of the dustproof plate, and the cleaning air slot helps to remove dust or debris that may be accumulated after the test to keep the fixture clean.
[0012] The utility model is further configured such that a guide frame is provided between the adjacent dustproof plates, and one end of the locking rod extends through the guide frame. The provision of the guide frame facilitates the guiding and locking operation of the locking rod.
[0013] The utility model is further configured that a limiting plate is provided on the inner wall of the motion groove, and the guide frame is installed on the top end surface of the limiting plate. The setting of the limiting plate prevents the turntable from excessively moving in the motion groove.
[0014] The utility model is further configured such that a mounting plate is provided on the top end surface of the turntable, and the chip is mounted on the top end surface of the mounting plate. The configuration of the mounting plate facilitates providing a mounting position for the chip.
[0015] (III) Beneficial effects
[0016] Compared with the prior art, the utility model provides a flippable chip test fixture, which has the following beneficial effects:
[0017] The utility model is provided with a rotation adjustment mechanism, which can accurately control the rotation angle of the turntable through the drive of the motor to adapt to different test requirements. The smooth rotation of the turntable ensures the stability of the chip during the test and avoids test errors caused by vibration.
[0018] The utility model is provided with a chip clamping mechanism, and the design of the threaded support frame and the locking rod ensures that the chip is firmly fixed during the test process, and the setting of the turning handle makes the position adjustment of the clamping head simple and quick, thereby improving the operating efficiency.
[0019] The utility model is provided with a bottom lifting mechanism, and the lifting movement of the electric push rod enables the movable plate to move up and down to adapt to test equipment and chips at different heights. The combination of the movable plate and the bottom plate provides a stable supporting platform for the entire test fixture. BRIEF DESCRIPTION OF THE DRAWINGS
[0020] Figure 1 This is a schematic diagram of the overall structure of the device in the present utility model when it is not in use;
[0021] Figure 2 It is a structural schematic diagram of the chip clamping mechanism in the utility model;
[0022] Figure 3 This is a structural schematic diagram of the connection method of the flip assembly in the utility model from a side view;
[0023] Figure 4 It is a structural schematic diagram of the rotary adjustment mechanism in the utility model;
[0024] Figure 5 It is a structural schematic diagram of the chip clamping mechanism in the present invention from a bottom perspective.
[0025] In the figure: 1. flip plate; 2. drive motor; 3. driving wheel; 4. driven wheel; 5. belt; 6. rotating rod; 7. turntable; 8. threaded support; 9. locking block; 10. turning handle; 11. locking rod; 12. clamping head; 13. bottom plate; 14. movable plate; 15. electric push rod; 16. moving groove; 17. connecting rod; 18. flip assembly; 19. dustproof plate; 20. multiple groups; 21. cleaning air trough; 22. guide frame; 23. limiting plate; 24. mounting plate. DETAILED DESCRIPTION
[0026] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application can be combined with each other. The present utility model will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.
[0027] It should be noted that, unless otherwise specified, all technical and scientific terms used in this application have the same meanings as commonly understood by ordinary technicians in the technical field to which this application belongs.
[0028] In the present invention, unless otherwise specified, directions such as "up" and "down" are usually used in reference to the directions shown in the drawings, or in reference to the vertical, perpendicular or gravity direction; similarly, for ease of understanding and description, "left" and "right" are usually used in reference to the left and right shown in the drawings; "inside" and "outside" refer to the inside and outside relative to the outline of each component itself, but the above-mentioned directions are not used to limit the present invention.
[0029] See also Figure 1-5 A flippable chip test fixture comprises a flip plate 1, a rotation adjustment mechanism, a chip clamping mechanism and a bottom lifting mechanism. The rotation adjustment mechanism comprises a driving motor 2, a driving wheel 3, a driven wheel 4, a belt 5, a rotating rod 6 and a rotating disk 7. The driving wheel 3 is installed at the output end of the driving motor 2. The belt 5 connects the driving wheel 3 with the driven wheel 4, and the driven wheel 4 is connected to the rotating rod 6. The rotating disk 7 is installed at one end of the rotating rod 6. The chip clamping mechanism comprises a threaded frame 8, a locking block 9, a turning handle 10, a locking rod 11 and a clamping head 12. The outer surface of the locking rod 11 is threaded, and one end of the locking rod 11 extends through the threaded frame 8. The clamping head 12 is installed at one end of the locking rod 11. The locking block 9 is installed at the other end of the locking rod 11. The turning handle 10 is installed on the locking rod 11, and the turning handle 10 is detachably arranged on the locking block 9.
[0030] In this embodiment, the driving motor 2 is started, and the active wheel 3 at its output end rotates. The active wheel 3 drives the driven wheel 4 through the belt 5 to achieve energy transmission and rotation speed adjustment. The driven wheel 4 is connected with the rotating rod 6 so that the rotating rod 6 rotates with the driven wheel 4. A turntable 7 is installed at one end of the rotating rod 6, and the turntable 7 rotates with the rotating rod 6 to achieve rotation adjustment during chip testing. The locking rod 11 extends through the threaded support 8, and the clamping head 12 is installed at one end of the locking rod 11 to fix the chip. The turning handle 10 is installed on the locking rod 11 and can be disassembled and assembled on the locking block 9. The extension length of the locking rod 11 is adjusted by rotating the turning handle 10, thereby adjusting the position of the clamping head 12. The operation of the turning handle 10 allows fine-tuning of the chip to ensure the correct position and firm fixation of the chip during the test.
[0031] The bottom lifting mechanism includes a bottom plate 13, a movable plate 14, an electric push rod 15 and a motion groove 16. Multiple groups of 20 electric push rods 15 are installed on the top end surface of the bottom plate 13. The movable plate 14 is cooperatively connected with two sections of the electric push rods 15. A motion groove 16 is provided in the center position of the movable plate 14, and the turntable 7 can move in the motion groove 16. The rotation adjustment mechanism is installed on the top end surface of the bottom plate 13, and the chip clamping mechanism is installed on the top end surface of the movable plate 14.
[0032] In this embodiment, the base plate 13 supports the entire fixture, and multiple groups of 20 electric push rods 15 are installed on the top end surface of the base plate 13. The operation of the electric push rods 15 causes the movable plate 14 to rise and fall. The motion groove 16 in the middle of the movable plate 14 allows the turntable 7 to move inside it to achieve height adjustment. The movement of the movable plate 14 not only adjusts the height of the fixture, but also cooperates with the rotation adjustment mechanism to keep the chip in a suitable position during the test.
[0033] See also Figure 1-5, as a supplementary implementation method of a flip chip test fixture for the rotation adjustment mechanism, the chip clamping mechanism and the bottom lifting mechanism: a connecting rod 17 is provided on the side end face of the flip plate 1, a flip assembly 18 is provided on the side of the device, and the output end of the flip assembly 18 is connected to the connecting rod 17, a dustproof plate 19 is provided on the outer side of the motion groove 16 of the movable plate 14, and the dustproof plate 19 is provided with a plurality of groups 20, a cleaning air groove 21 is provided on the top end face of the movable plate 14, and the cleaning air groove 21 is arranged on the outer side of the dustproof plate 19, a guide frame 22 is provided between adjacent dustproof plates 19, and one end of the locking rod 11 extends through the guide frame 22, a limiting plate 23 is provided on the inner wall of the motion groove 16, and the guide frame 22 is installed on the top end face of the limiting plate 23, a mounting plate 24 is provided on the top end face of the turntable 7, and the chip is installed on the top end face of the mounting plate 24.
[0034] More specifically, before starting the test, the chip is placed on the mounting plate 24 on top of the turntable 7, the drive motor 2 is started, and the chip is adjusted to the desired test angle by rotating the adjustment mechanism. At this time, the chip clamping mechanism is in operation, and the chip is fixed on the clamping head 12. Then the locking rod 11 is adjusted to ensure the stability of the chip. According to the test requirements, the electric push rod 15 is operated to adjust the height of the movable plate 14 to ensure the correct alignment of the chip with the test equipment. When a flip test is required, the chip is flipped by the flip plate 1 and the flip assembly 18 to allow the other side of the chip to be tested. The design of the moving groove 16 and the use of the dustproof plate 19 help keep the inside of the device clean and prevent dust and impurities from interfering with the test process. The cleaning air groove 21 helps remove dust or debris that may have accumulated after the test to keep the fixture clean.
[0035] In summary, when the overall equipment is in use or running: when the rotation adjustment mechanism needs to be operated, the drive motor 2 is started, and the active wheel 3 at its output end rotates, and the active wheel 3 drives the driven wheel 4 through the belt 5 to realize energy transmission and speed adjustment, and the driven wheel 4 is connected with the rotating rod 6 so that the rotating rod 6 rotates with the driven wheel 4. A turntable 7 is installed at one end of the rotating rod 6, and the turntable 7 rotates with the rotating rod 6 to realize rotation adjustment during chip testing.
[0036] When the chip clamping mechanism needs to be operated, the locking rod 11 extends through the threaded bracket 8, and the clamping head 12 is installed at one end of the locking rod 11 to fix the chip. The turning handle 10 is installed on the locking rod 11 and can be disassembled and assembled on the locking block 9. The extension length of the locking rod 11 is adjusted by turning the turning handle 10, thereby adjusting the position of the clamping head 12. The operation of the turning handle 10 allows fine-tuning of the chip to ensure the correct position and firm fixation of the chip during the test.
[0037] When the bottom lifting mechanism needs to be operated, the bottom plate 13 supports the entire fixture, and multiple groups of 20 electric push rods 15 are installed on the top end surface of the bottom plate 13. The operation of the electric push rods 15 causes the movable plate 14 to rise and fall. The motion groove 16 in the middle of the movable plate 14 allows the turntable 7 to move inside it to achieve height adjustment. The movement of the movable plate 14 not only adjusts the height of the fixture, but also cooperates with the rotation adjustment mechanism to keep the chip in a suitable position during the test.
[0038] Before starting the test, place the chip on the mounting plate 24 on top of the turntable 7, start the drive motor 2, and adjust the chip to the desired test angle by rotating the adjustment mechanism. At this time, the chip clamping mechanism is in operation, and the chip is fixed on the clamping head 12. Then adjust the locking rod 11 to ensure the stability of the chip. According to the test requirements, operate the electric push rod 15 to adjust the height of the movable plate 14 to ensure the correct alignment of the chip with the test equipment. When a flip test is required, the chip is flipped by the flip plate 1 and the flip assembly 18 to allow the other side of the chip to be tested. The design of the moving groove 16 and the use of the dustproof plate 19 help keep the inside of the device clean and prevent dust and impurities from interfering with the test process. The cleaning air groove 21 helps remove dust or debris that may have accumulated after the test to keep the fixture clean.
[0039] In all the schemes mentioned above, the connection between two parts can be selected according to actual conditions by welding, bolt and nut matching connection, bolt or screw connection or other well-known connection methods, which are not described here one by one. In the above, all fixed connections are preferably welded. Although the embodiments of the utility model have been shown and described, it can be understood by ordinary technicians in this field that various changes, modifications, substitutions and variations can be made to these embodiments without departing from the principle and spirit of the utility model. The scope of the utility model is defined by the attached claims and their equivalents.
Claims
1. A reversible chip testing fixture, comprising a reversing plate (1), a rotation adjustment mechanism, a chip clamping mechanism and a bottom lifting mechanism, wherein: The rotation adjustment mechanism comprises a driving motor (2), a driving wheel (3), a driven wheel (4), a belt (5), a rotating rod (6) and a rotating disk (7); the driving wheel (3) is mounted on the output end of the driving motor (2); the belt (5) connects the driving wheel (3) with the driven wheel (4), and the driven wheel (4) is cooperatively connected with the rotating rod (6); the rotating disk (7) is cooperatively mounted on one end of the rotating rod (6); the chip clamping mechanism comprises a threaded support frame (8), a locking block (9), a turning handle (10), a locking rod (11) and a clamping head (12); the outer surface of the locking rod (11) is threaded, and one end of the locking rod (11) cooperatively extends through the threaded support frame (8), and the clamping head (12) is mounted on one end of the locking rod (11); the locking block (9) is mounted on the other end of the locking rod (11), the turning handle (10) is mounted on the locking rod (11), and the turning handle (10) is detachably arranged on the locking block (9).
2. The reversible chip testing fixture according to claim 1 is characterized in that: The bottom lifting mechanism comprises a bottom plate (13), a movable plate (14), an electric push rod (15) and a motion groove (16); a plurality of groups (20) of electric push rods (15) are mounted on the top end surface of the bottom plate (13); the movable plate (14) is cooperatively connected with two sections of the electric push rods (15); a motion groove (16) is arranged at the middle position of the movable plate (14), and the turntable (7) can move in the motion groove (16); a rotation adjustment mechanism is mounted on the top end surface of the bottom plate (13); and a chip clamping mechanism is mounted on the top end surface of the movable plate (14).
3. The reversible chip testing fixture according to claim 1 is characterized in that: A connecting rod (17) is provided on the side end surface of the flip plate (1), a flip assembly (18) is provided on the side of the device, and the output end of the flip assembly (18) is cooperatively connected to the connecting rod (17).
4. The reversible chip testing fixture according to claim 2 is characterized in that: A dustproof plate (19) is provided on the outer side of the moving groove (16) of the movable plate (14), and the dustproof plate (19) is provided in multiple groups (20).
5. The reversible chip testing fixture according to claim 2, characterized in that: The top end surface of the movable plate (14) is provided with a cleaning air slot (21), and the cleaning air slot (21) is arranged on the outer side of the dustproof plate (19).
6. The flippable chip testing fixture according to claim 4, characterized in that: A guide frame (22) is provided between adjacent dustproof plates (19), and one end of the locking rod (11) extends through the guide frame (22).
7. The flippable chip testing fixture according to claim 2, characterized in that: A limiting plate (23) is provided on the inner wall of the movement groove (16), and the guide frame (22) is installed on the top end surface of the limiting plate (23).
8. The flippable chip testing fixture according to claim 1, characterized in that: The top end surface of the rotating disk (7) is provided with a mounting plate (24), and the chip is mounted on the top end surface of the mounting plate (24).