Test equipment for IGBT (Insulated Gate Bipolar Translator) chip

Abstract

The utility model relates to the field of rail transit equipment testing, in particular to testing equipment for an IGBT chip (9). The test equipment comprises a main loop, a control loop, at least one test power supply, a set of contactor switch assembly (2), a programmable logic controller (4) and an upper computer (5). In the working process of the test equipment, the upper computer (5) can automatically control the test power supply to output set voltage or current, and controls the on-off of a corresponding contactor in the contactor switch assembly (2) through the programmable logic controller (4) so as to carry out corresponding parameter test on the IGBT chip (9), so that the test efficiency of the IGBT chip (9) can be improved.

Description

Technical Field

[0001] The present application relates to the field of rail transit equipment testing, and in particular to testing equipment for IGBT chips. Background Art

[0002] In the field of rail transportation, the traction drive system is the core component of EMUs, locomotives and other equipment, and the IGBT chip (insulated gate bipolar transistor) is the core component of the traction drive system. The IGBT chip is a key core component of automatic control and power conversion. The switching speed of the IGBT chip is nearly 10,000 times per second. The inverter circuit composed of the IGBT chip is used to achieve frequency and voltage regulation, thereby realizing the control of the speed of the high-speed train.

[0003] IGBT chips need to be tested for static parameters before leaving the factory. In the existing test method, the wires between the IGBT chip and the tester need to be manually connected, which requires a lot of manual participation and high operating skills. On the one hand, the existing test method requires high skills, and on the other hand, it also affects the test efficiency of the IGBT chip. Utility Model Content

[0004] In view of this, the present application proposes a test device for an IGBT chip to improve the test efficiency of the IGBT chip.

[0005] In one embodiment of the IGBT chip testing device provided in the present application, the testing device includes a main circuit, a control circuit, at least one test power supply, a set of contactor switch components, a programmable logic controller and a host computer.

[0006] Among them, the main circuit is provided with a main circuit collector circuit and a main circuit emitter circuit; a plurality of main collector probes are connected to the main circuit collector circuit, and each of the main collector probes is used to conductively contact a main circuit collector terminal of the IGBT chip; a plurality of main emitter probes are connected to the main circuit emitter circuit, and each of the main emitter probes is used to conductively contact a main circuit emitter terminal of the IGBT chip.

[0007] The control loop is provided with a control loop gate circuit and a control loop emitter circuit; the control loop gate circuit is connected to a control gate probe, and the control gate probe is used for conductively contacting the control loop gate terminal of the IGBT chip; the control loop emitter circuit is connected to a control emitter probe, and the control emitter probe is used for conductively contacting the control loop emitter terminal of the IGBT chip.

[0008] The test power supply supplies power to the IGBT chip to be tested through the main circuit or the control circuit. The contactor switch assembly is used to control the on and off of the output circuit of the test power supply, and whether the main circuit and the control circuit are short-circuited. The programmable logic controller signal controls the contactor switch assembly. The host computer is connected to the test power supply and the programmable logic controller in communication.

[0009] During the operation of the IGBT chip test equipment, the host computer can automatically control the test power supply to output the set voltage or current, and control the on and off of the corresponding contactor in the contactor switch assembly through the programmable logic controller to perform corresponding parameter tests on the IGBT chip. The IGBT chip can also receive the actual voltage value or actual current value fed back by the test power supply, and compare it with the standard value to obtain the result of whether the specific parameter test item is qualified. In this way, the test efficiency of the IGBT chip can be improved.

[0010] In a preferred implementation manner of the test device provided in the above embodiment, the test power supply includes a digital power supply, whose voltage output end is connected to the control circuit through its first group of power lines to supply voltage to the IGBT chip; the contactor switch assembly includes a first contactor and a second contactor, the first contactor is arranged on the first short-circuit of the main circuit, and the second contactor is arranged on the first group of power lines; wherein, when the test item is to test the gate-emitter leakage current I of the IGBT chip GES When the upper computer controls the first contactor and the second contactor to be in a closed state.

[0011] In a preferred implementation of the test device provided in the above embodiment, the test current output terminal of the digital power supply is connected to the main circuit through its second group of power lines; the contactor switch assembly also includes a third contactor, which is arranged on the second group of power lines; wherein, when the test item is to test the gate-emitter threshold voltage V GE(th) When the upper computer controls the second contactor and the third contactor to be in a closed state, and the first contactor to be in an open state.

[0012] In a preferred implementation of the test device provided in the above embodiment, the test power supply further includes a current source, the positive pole of the third group of power lines at the current output end of which is connected to the collector line of the main circuit, and the negative pole of the third group of power lines is connected to the emitter line of the main circuit; the contactor switch assembly further includes a fourth contactor, and the fourth contactor is arranged on the third group of power lines; wherein, when the test item is to test the collector-emitter saturation voltage V CE( sat )When the upper computer controls the second contactor and the fourth contactor to be in a closed state, and the first contactor to be in an open state.

[0013] In a preferred implementation manner of the testing device provided in the above embodiment, an internal voltage sensor is further provided in the current source, and the internal voltage sensor is connected in parallel to the power output terminal of the current source.

[0014] In a preferred implementation of the test device provided in the above embodiment, the current output end of the current source is also connected to a fourth group of power lines, the positive pole of the fourth group of power lines is connected to the emitter line of the main circuit, and the negative pole of the fourth group of power lines is connected to the collector line of the main circuit; the contactor switch assembly also includes a fifth contactor, and the fifth contactor is arranged on the fourth group of power lines; wherein, when the test item is to test the diode voltage drop value V of the IGBT chip F When the upper computer controls the second contactor and the fifth contactor to be in a closed state, and the first contactor to be in an open state.

[0015] In a preferred implementation of the test equipment provided in the above embodiment, the test power supply also includes a high-voltage tester, whose voltage output end is connected to a fifth group of power lines, and the fifth group of power lines is connected to the main circuit; the contactor switch assembly also includes a sixth contactor and a seventh contactor, the sixth contactor is connected to the second short-circuit of the control circuit, and the seventh contactor is arranged on the fifth group of power lines; wherein, when the test item is to test the collector-emitter cut-off current I of the IGBT chip CES When the upper computer controls the sixth contactor and the seventh contactor to be in a closed state.

[0016] In a preferred implementation manner of the test device provided in the above embodiment, the test device further comprises a current sensor, which is arranged between the main circuit collector line and the test power supply and is communicatively connected with the host computer.

[0017] In a preferred implementation manner of the test device provided in the above embodiment, the test device further comprises an external voltage sensor which is connected in parallel to the control loop, and the external voltage sensor is in communication connection with the host computer.

[0018] In a preferred implementation manner of the test device provided in the above embodiment, the test device further includes a barcode scanner, which is used to input label information on the IGBT chip and is communicatively connected with the host computer.

[0019] In a preferred implementation manner of the test device provided in the above embodiment, the test device further includes a display device, which is communicatively connected to the host computer and displays the test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] The preferred embodiments of the present application will be described in detail below with reference to the accompanying drawings, so that those skilled in the art can better understand the above and other features and advantages of the present application. In the accompanying drawings:

[0021] Figure 1 A schematic diagram of an embodiment of an IGBT chip.

[0022] Figure 2 This is a schematic diagram of circuit connections in a preferred embodiment of a test device for an IGBT chip.

[0023] Figure 3 Flow chart of a test process in a preferred embodiment of a test device for an IGBT chip.

[0024] Figure 4 The figure is a schematic diagram of signal connection relationship in a preferred embodiment of the test equipment for IGBT chip.

[0025] The reference numerals are as follows:

[0026] 11-main circuit collector circuit; 111-main collector probe;

[0027] 12-main circuit emitter circuit; 121-main emitter probe;

[0028] 13- first short circuit;

[0029] 14-control loop gate circuit; 141-control gate probe;

[0030] 15- control loop emitter circuit; 151- control emitter probe;

[0031] 2-contactor switch assembly; 21-first contactor; 22-second contactor; 23-third contactor; 24-fourth contactor; 25-fifth contactor; 26-sixth contactor; 27-seventh contactor;

[0032] 3-digital power supply; 31-first group of power lines; 32-second group of power lines;

[0033] 4- Programmable logic controller;

[0034] 5-host computer; 51-barcode scanner; 52-display device;

[0035] 61-current sensor; 62-external voltage sensor; 63-internal voltage sensor;

[0036] 7-current source; 71-third group of power lines; 72-fourth group of power lines;

[0037] 8-high voltage tester; 81-fifth power cord;

[0038] 9-IGBT chip; 91-main circuit collector terminal; 92-main circuit emitter terminal; 93-control circuit gate terminal; 94-control circuit emitter terminal; 95-control circuit collector terminal.

[0039] S1-Get the model information of the IGBT chip to be tested;

[0040] S2-matching a corresponding test task in a database based on the model information, wherein the test task has at least one test item;

[0041] S3-sending control information to the programmable logic controller and the corresponding test power supply according to each of the test items, so that the programmable logic controller controls the corresponding contactor switch to close, and the test power supply outputs current or voltage;

[0042] S4-receives the actual measured value of current or voltage;

[0043] S5-Compare the actual measured value with the standard value and obtain the test result of the item. DETAILED DESCRIPTION

[0044] In order to make the purpose, technical solution and advantages of the present application clearer, the present application is further described in detail with reference to the following embodiments. In the description of the present application, it should be understood that the terms "first", "second" and "third" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance.

[0045] In the field of rail transportation, the traction drive system is the core component of EMUs, locomotives and other equipment, and the IGBT chip 9 (insulated gate bipolar transistor) is the core component of the traction drive system. Figure 1As shown, there are three parallel thyristors in the IGBT chip 9, and the IGBT chip 9 has the following nine terminals: three main circuit collector terminals 91, three main circuit emitter terminals 92 located on the main circuit, and one control circuit gate terminal 93, one control circuit emitter terminal 94 and one control circuit collector terminal 95 located on the control circuit. When the IGBT chip 9 is working, the single-chip microcomputer or microprocessor (DSP) or other control circuit gives a high-level signal to the gate, and the switch (between the collector and the emitter) is turned on; and a reverse high-level signal is given to the gate, and the switch is turned off. The switching speed of the IGBT chip 91 is nearly 10,000 times per second. The inverter circuit composed of the IGBT chip 91 is used to realize frequency modulation and voltage regulation, thereby realizing the control of the speed of the high-speed train.

[0046] The IGBT chip 9 needs to be subjected to a static parameter test before leaving the factory. The test device for the IGBT chip 9 provided in this embodiment is used to realize the automation of the test of the IGBT chip 9 to improve the test efficiency of the IGBT chip 9 .

[0047] Reference Figure 2 The test equipment of the IGBT chip 9 includes a main circuit, a control circuit, at least one test power supply, a set of contactor switch components 2, a programmable logic controller 4 and a host computer 5. For example, the test power supply of this embodiment can be a digital power supply 3, a current source 7 and a high-voltage tester 8. The corresponding test power supply type can be selected for different test items, which will be described in detail below.

[0048] The main circuit is provided with a main circuit collector circuit 11 and a main circuit emitter circuit 12. The main circuit collector circuit 11 is connected to a plurality of main collector probes 111, each of which is used to conductively contact a main circuit collector terminal 91 of the IGBT chip 9. The main circuit emitter circuit 12 is connected to a plurality of main emitter probes 121, each of which is used to conductively contact a main circuit emitter terminal 92 of the IGBT chip 9.

[0049] The control loop is provided with a control loop gate line 14 and a control loop emitter line 15. A control gate probe 141 is connected to the control loop gate line 14, and the control gate probe 141 is used to conductively contact the control loop gate terminal 93 of the IGBT chip 9. A control emitter probe 151 is connected to the control loop emitter line 15, and the control emitter probe 151 is used to conductively contact the control loop emitter terminal 94 of the IGBT chip 9.

[0050] The test power supply supplies power to the IGBT chip to be tested through the main circuit or the control circuit. The contactor switch assembly 2 is used to control the on and off of the output circuit of the test power supply, and whether the main circuit and the control circuit are short-circuited. The programmable logic controller 4 controls the contactor switch assembly 2 by signal. The host computer 5 is connected to the test power supply and the programmable logic controller 4 in communication.

[0051] During the operation of the test equipment of the IGBT chip 9, the host computer 5 can automatically control the voltage or current set by the test power supply output, and control the on and off of the corresponding contactor in the contactor switch assembly 2 through the programmable logic controller 4 to perform corresponding parameter tests on the IGBT chip 9, and the IGBT chip 9 can also receive the actual voltage value or actual current value fed back by the test power supply, and obtain the result of whether the specific parameter test item is qualified by comparing with the standard value. In this way, the test efficiency of the IGBT chip 9 can be improved.

[0052] For example, in combination Figure 3 During the operation of the test equipment of the IGBT chip 9, the host computer 5 can perform the following operations:

[0053] Step S1, obtaining the model information of the IGBT chip to be tested.

[0054] Step S2: Match a corresponding test task in a database based on the model information, where the test task has at least one test item.

[0055] Step S3, sending control information to the programmable logic controller 4 and the corresponding test power supply according to each test item, so that the programmable logic controller 4 controls the corresponding contactor switch to close, and makes the test power supply output current or voltage (S3).

[0056] Step S4: receiving the actual measured value of the current or voltage.

[0057] Step S5, compare the actual measured value with the standard value, and obtain the test result of the item (S5).

[0058] The test equipment can complete each test item in the test task in sequence. For example, a test task may include at least one test item, and these test items may be: 1) testing the gate-emitter leakage current I of the IGBT chip 9 GES ; 2) Test the gate-emitter threshold voltage V of the IGBT chip 9 GE(th) ; 3) Test the collector-emitter saturation voltage V of the IGBT chip 9 CE( sat ) ; 4) Test the diode voltage drop value V of the IGBT chip 9 F ; 5) Test the collector-emitter cut-off current I of the IGBT chip 9 CES.

[0059] Optionally, the model information of the IGBT chip to be tested is obtained in step S1, which can be manually input or by using a barcode scanner 51, which is used to input the label information on the IGBT chip 9 and is connected to the host computer 5 for communication. The host computer 5 can obtain the model information of the IGBT chip to be tested based on the label information on the IGBT chip 9 input by the barcode scanner 51.

[0060] Optionally, in connection with step S5, the host computer 5 may be communicatively connected to a display device 52, which may be a display or a human-machine interface, capable of displaying test results, and each test may be displayed in green when it is qualified and in red when it is unqualified. In addition, the host computer 5 may also store the test results.

[0061] In a preferred implementation of the above embodiment, the test power supply may include a digital power supply 3, whose voltage output end is connected to the control circuit through its first group of power lines 31 to supply voltage to the IGBT chip 9. The contactor switch assembly 2 includes a first contactor 21 and a second contactor 22, the first contactor 21 is arranged on the first short-circuit line 13 of the main circuit, and the second contactor 22 is arranged on the first group of power lines 31.

[0062] Among them, when the test item is to test the gate-emitter leakage current I of the IGBT chip 9 GES , the host computer 5 controls the first contactor 21 and the second contactor 22 to be in a closed state, and controls the digital power supply 3 to output a first test voltage. After the host computer 5 receives the first actual current value fed back from the digital power supply 3, it compares the first actual current value with the first standard current value to determine the gate-emitter leakage current I GES Test whether the project is qualified.

[0063] Exemplarily, when the first contactor 21 is closed, the main circuit collector terminal 91 of the IGBT chip 9 is short-circuited with the main circuit emitter terminal 92; when the second contactor 22 is closed, the voltage output port of the digital power supply 3 is connected to the control circuit gate terminal 93 and the control circuit emitter terminal 94 of the IGBT chip 9. After the test, the host computer 5 controls the first contactor 21 and the second contactor 22 to be disconnected to isolate the test equipment from the IGBT chip 9. In this way, the gate-emitter leakage current I of the IGBT chip 9 can be reduced to 0. GES Automatic testing of.

[0064] In a preferred implementation of the above embodiment, the test device may further include a current sensor 61, which is arranged between the main circuit collector line 11 and the test power supply, and is connected to the host computer 5 for communication, and feeds back the actual current value of the main circuit to the host computer 5. In this way, in addition to receiving the first actual current value fed back from the digital power supply 3, the host computer 5 can also obtain the first actual current value required for the test according to the current sensor 61.

[0065] It should be noted that, in this manual, unless otherwise specified, when controlling certain contactors to close in a test item, other contactors need to be kept in the open state.

[0066] In a preferred implementation of the above-mentioned test equipment embodiment, the test current output end of the digital power supply 3 is connected to the main circuit through its second group of power lines 32; the contactor switch assembly 2 also includes a third contactor 23, which is arranged on the second group of power lines 32.

[0067] Among them, when the test item is to test the gate-emitter threshold voltage V of the IGBT chip 9 GE(th) , the host computer 5 controls the second contactor 22 and the third contactor 23 to be in a closed state, and the first contactor 21 to be in an open state; the host computer 5 also controls the digital power supply 3 to output a first test current. When the host computer 5 receives the first actual voltage value fed back from the digital power supply 3, it compares the first actual voltage value with the second standard voltage value to determine the gate-emitter threshold voltage V GE(th) Test whether the project is qualified.

[0068] Exemplarily, when the second contactor 22 is closed, the voltage output port of the digital power supply 3 is connected to the control circuit gate terminal 93 and the control circuit emitter terminal 94 of the IGBT chip 9. When the third contactor 23 is closed, the current output port of the digital power supply 3 is connected to the main circuit collector terminal 91 and the main circuit emitter terminal 92 of the IGBT chip 9. After the test, the host computer 5 controls the second contactor 22 and the third contactor 23 to be disconnected to isolate the test equipment from the IGBT chip 9. In this way, the gate-emitter threshold voltage V GE(th) Automatic testing of.

[0069] In a preferred implementation of the above embodiment, the test device may further include an external voltage sensor 62, which is connected in parallel to the control loop, and is in communication connection with the host computer 5, and feeds back the actual voltage value of the control loop to the host computer 5. In this way, in addition to receiving the first actual voltage value fed back from the digital power supply 3, the host computer 5 may also obtain the first actual voltage value through the external voltage sensor 62.

[0070] In a preferred implementation of the embodiment of the above-mentioned test equipment, the test power supply also includes a current source 7, the positive pole of the third group of power lines 71 at its current output end is connected to the main circuit collector line 11, and the negative pole of the third group of power lines 71 is connected to the main circuit emitter line 12; the contactor switch assembly 2 also includes a fourth contactor 24, and the fourth contactor 24 is arranged on the third group of power lines 71.

[0071] Among them, when the test item is to test the collector-emitter saturation voltage V of the IGBT chip 9 CE( sat ) , the host computer 5 controls the second contactor 22 and the fourth contactor 24 to be in a closed state, and the first contactor 21 to be in an open state; the host computer 5 also controls the digital power supply 3 to output a first control voltage, so that the thyristor of the IGBT chip 9 is turned on, and controls the current source 7 to supply a second test current to the thyristor of the IGBT chip 9. After the host computer 5 receives the second actual voltage value fed back from the current source 7, it compares the second actual voltage value with the second standard voltage value to determine the collector-emitter saturation voltage V CE( sat ) Test whether the project is qualified.

[0072] Exemplarily, when the second contactor 22 is closed, the voltage output port of the digital power supply 3 is connected to the control loop gate terminal 93 and the control loop emitter terminal 94 of the IGBT chip 9, and the digital power supply 3 outputs a thyristor conduction control voltage to turn on the thyristor in the IGBT chip 9. When the fourth contactor 24 is closed, the current output by the current source 7 flows through the thyristor in the IGBT, and the actual voltage value of the thyristor is measured to obtain a second actual voltage value. After the test, the host computer 5 controls the second contactor 22 and the fourth contactor 24 to be disconnected, and controls the digital power supply 3 to output a reverse control voltage to isolate the test equipment from the IGBT chip 9. In this way, the collector-emitter saturation voltage V CE( sat ) Automatic testing of.

[0073] Optionally, an internal voltage sensor 63 may be provided in the current source 7 , and the internal voltage sensor 63 is connected in parallel to the power output terminal of the current source 7 to obtain the second actual voltage value.

[0074] In a preferred implementation of the embodiment of the above-mentioned test device, the current output end of the current source 7 is also connected to a fourth group of power lines 72, the positive pole of the fourth group of power lines 72 is connected to the main circuit emitter line 12, and the negative pole of the fourth group of power lines 72 is connected to the main circuit collector line 11. The contactor switch assembly 2 also includes a fifth contactor 25, which is arranged on the fourth group of power lines 72.

[0075] Among them, when the test item is to test the diode voltage drop value V of the IGBT chip 9 F , the host computer 5 controls the second contactor 22 and the fifth contactor 25 to be in a closed state, and the first contactor 21 to be in an open state. The host computer 5 also controls the digital power supply 3 to output a second control voltage so that the thyristor of the IGBT chip 9 is turned off, and controls the current source 7 to supply a third test current to the diode of the IGBT chip 9. When the host computer 5 receives the third actual voltage value fed back from the current source 7, it compares the third actual voltage value with the third standard voltage value to determine the diode voltage drop value V of the IGBT chip 9. F Test whether the project is qualified.

[0076] Exemplarily, when the second contactor 22 is closed, the voltage output port of the digital power supply 3 is connected to the control circuit gate terminal 93 and the control circuit emitter terminal 94 of the IGBT chip 9, and the digital power supply 3 outputs the thyristor on-off voltage to turn off the thyristor in the IGBT chip 9. When the fifth contactor 25 is closed, the positive electrode of the current source 7 is connected to the main circuit emitter terminal 92 of the IGBT chip 9, and the negative electrode of the current source 7 is connected to the main circuit collector terminal 91 of the IGBT chip 9. The third actual voltage value received by the host computer 5 from the current source 7 as feedback is the voltage value of the diode in the IGBT chip 9. After the test is completed, the host computer 5 controls the second contactor 22 and the fifth contactor 25 to be disconnected to achieve isolation between the test equipment and the IGBT chip 9. In this way, the diode voltage drop value V of the IGBT chip 9 can be achieved. F Automatic testing of.

[0077] In a preferred implementation of the embodiment of the above-mentioned test device, the test power supply further includes a high voltage tester 8, whose voltage output end is connected to a fifth group of power lines 81, and the fifth group of power lines 81 is connected to the main circuit. The contactor switch assembly 2 also includes a sixth contactor 26 and a seventh contactor 27, the sixth contactor 26 is connected to the second short-circuit of the control circuit, and the seventh contactor 27 is arranged on the fifth group of power lines 81.

[0078] Among them, when the test item is to test the collector-emitter cut-off current I of the IGBT chip 9 CES, the host computer 5 controls the sixth contactor 26 and the seventh contactor 27 to be in a closed state, and the host computer 5 also controls the high-voltage tester 8 to output a second test voltage. After the host computer 5 receives the second actual current value fed back from the high-voltage tester 8, the second actual current value is compared with the second standard current value to determine the collector-emitter cut-off current I of the IGBT chip 9. CES Test whether the project is qualified.

[0079] Exemplarily, when the sixth contactor 26 is closed, the control circuit gate terminal 93 and the control circuit emitter terminal 94 of the IGBT chip 9 are short-circuited; when the seventh contactor 27 is closed, the positive and negative poles of the high-voltage tester 8 are connected to the main circuit collector terminal 91 and the main circuit emitter terminal 92 of the IGBT chip 9, and the second actual current value measured by the high-voltage tester 8 is the leakage current. After the test, the host computer 5 controls the sixth contactor 26 and the seventh contactor 27 to be disconnected to isolate the test equipment from the IGBT chip 9. In this way, the collector-emitter cutoff current I of the IGBT chip 9 can be achieved. CES Automatic testing of.

[0080] Finally, the overall signal connection relationship of the test equipment of the present application is summarized. The host computer 5 controls the first contactor 21, the second contactor 22, the third contactor 23, the fourth contactor 24, the fifth contactor 25, the sixth contactor 26 and the seventh contactor 27 through the programmable logic controller 4 to realize channel switching for different test items, and can realize the connection between different test power supplies and the IGBT chip 9 when testing different parameters. Rapid wiring, rapid switching, automatic control of the test equipment and recording of test results improve the test efficiency. At the same time, during the test process, only the contactors required for a specific test item are closed, and the other contactors play the role of isolation protection.

[0081] Furthermore, the host computer 5 can control the switches of different test power supplies and the set voltage or current of the output through communication connection with the test power supplies such as the digital power supply 3, the current source 7 and the high-voltage tester 8. Moreover, the host computer 5 also receives actual test data from different test power supply sides. Preferably, the host computer 5 is also communicated with the current sensor 61, the external voltage sensor 62 and the internal voltage sensor 63 to receive the actual current and voltage data to ensure the reliability of the test results.

[0082] Preferably, the host computer 5 is also connected to the barcode scanner 51 and the display device 52 for communication, so that the testing process is more convenient.

[0083] The present application relates to the field of rail transit equipment testing, in particular to a testing device for an IGBT chip 9. The testing device includes a main circuit, a control circuit, at least one testing power supply, a set of contactor switch components 2, a programmable logic controller 4 and a host computer 5. During the operation of the testing device, the host computer 5 can automatically control the test power supply to output a set voltage or current, and control the on and off of the corresponding contactor in the contactor switch component 2 through the programmable logic controller 4, so as to perform corresponding parameter tests on the IGBT chip 9, thereby improving the testing efficiency of the IGBT chip 9.

[0084] The above is only a preferred embodiment of the present application and is not intended to limit the present application. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application. The nouns and pronouns about people in this patent application are not limited to specific genders.

Claims

1. IGBT chip testing equipment, characterized in that: include: A main circuit is provided with a main circuit collector circuit (11) and a main circuit emitter circuit (12); a plurality of main collector probes (111) are connected to the main circuit collector circuit (11), and each of the main collector probes (111) is used for conductively contacting a main circuit collector terminal (91) of an IGBT chip (9IGBT); a plurality of main emitter probes (121) are connected to the main circuit emitter circuit (12), and each of the main emitter probes (121) is used for conductively contacting a main circuit emitter terminal (92) of an IGBT chip (9IGBT); A control loop is provided with a control loop gate line (14) and a control loop emitter line (15); the control loop gate line (14) is connected to a control gate probe (141), and the control gate probe (141) is used for conductively contacting a control loop gate terminal (93) of an IGBT chip (9IGBT); the control loop emitter line (15) is connected to a control emitter probe (151), and the control emitter probe (151) is used for conductively contacting a control loop emitter terminal (94) of an IGBT chip (9IGBT); At least one test power supply, which supplies power to the IGBT chip (9IGBT) to be tested through the main circuit or the control circuit; A set of contactor switch components (2) for controlling the on and off of the output circuit of the test power supply and whether the main circuit and the control circuit are short-circuited; a programmable logic controller (4) whose signals control the contactor switch assembly (2); A host computer (5) is communicatively connected with the test power supply and the programmable logic controller (4).

2. The test device according to claim 1, characterized in that The test power supply comprises a digital power supply (3), whose voltage output end is connected to the control circuit through its first group of power lines (31); The contactor switch assembly (2) comprises a first contactor (21) and a second contactor (22), the first contactor (21) being arranged on a first short-circuit circuit (13) (13), and the second contactor (22) being arranged on the first group of power lines (31); Among them, when testing the gate-emitter leakage current I of the IGBT chip (9IGBT), GES When the first contactor (21) and the second contactor (22) are in a closed state.

3. The testing device according to claim 2, characterized in that The current output end of the digital power supply (3) is connected to the main circuit through its second group of power lines (32); The contactor switch assembly (2) further comprises a third contactor (23), wherein the third contactor (23) is arranged on the second group of power lines (32); Among them, when testing the gate-emitter threshold voltage V of the IGBT chip (9IGBT), GE(th) When the second contactor (22) and the third contactor (23) are in a closed state, the first contactor (21) is in an open state.

4. The testing device according to claim 2, characterized in that The test power supply further comprises a current source (7), the positive electrode of the third group of power lines (71) at the current output end of which is connected to the main circuit collector line (11), and the negative electrode of the third group of power lines (71) is connected to the main circuit emitter line (12); The contactor switch assembly (2) further comprises a fourth contactor (24), wherein the fourth contactor (24) is arranged on the third group of power lines (71); Among them, when testing the collector-emitter saturation voltage V of the IGBT chip (9IGBT), CE -sat, the second contactor (22) and the fourth contactor (24) are in a closed state, and the first contactor (21) is in an open state.

5. The testing device according to claim 4, characterized in that An internal voltage sensor (63) is also provided in the current source (7), and the internal voltage sensor (63) is connected in parallel to the power output end of the current source (7).

6. The testing device according to claim 4, characterized in that The current output end of the current source (7) is also connected to a fourth group of power lines (72), the positive pole of the fourth group of power lines (72) is connected to the main circuit emitter line (12), and the negative pole of the fourth group of power lines (72) is connected to the main circuit collector line (11); The contactor switch assembly (2) further comprises a fifth contactor (25), wherein the fifth contactor (25) is arranged on the fourth group of power lines (72); Among them, when testing the diode voltage drop value V of the IGBT chip (9IGBT) F When the second contactor (22) and the fifth contactor (25) are in a closed state, the first contactor (21) is in an open state.

7. The testing device according to claim 1, characterized in that The test power supply further comprises a high voltage tester (8), a voltage output end of which is connected to a fifth group of power lines (81), and the fifth group of power lines (81) is connected to the main circuit; The contactor switch assembly (2) further comprises a sixth contactor (26) and a seventh contactor (27), wherein the sixth contactor (26) is connected to the second short-circuit of the control loop, and the seventh contactor (27) is arranged on the fifth group of power lines (81); Among them, when testing the collector-emitter cut-off current I of the IGBT chip (9IGBT), CES When the sixth contactor (26) and the seventh contactor (27) are in a closed state.

8. The testing device according to claim 1, characterized in that Also includes: a current sensor (61), which is arranged between the main circuit collector line (11) and the test power supply and is communicatively connected to the host computer (5); or, An external voltage sensor (62) is connected in parallel to the control loop, and the external voltage sensor (62) is communicatively connected to the host computer (5).

9. The testing device according to claim 1, characterized in that It also includes a barcode scanning gun (51), which is used to input label information on the IGBT chip (9IGBT) and is connected to the host computer (5) for communication.

10. The testing device according to claim 1, characterized in that Also includes: A display device (52) is connected to the host computer (5) for communication and displays the test results.

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