Crimping mechanism for testing power semiconductor device and testing equipment

Abstract

The invention relates to a crimping mechanism and testing equipment for testing a power semiconductor device, the device comprises a substrate, the substrate is provided with a wiring terminal, and the crimping mechanism comprises a bearing jig and a power supply jig which can move relatively; the inner supporting assembly is arranged on the power supply jig and is opposite to the substrate, and the inner supporting assembly comprises an inner sliding block; the test terminal is arranged on the power supply jig and is in contact with the wiring terminal to connect the device with an external power supply; wherein in the relative movement process of the power supply jig and the bearing jig, after the inner supporting assembly is in contact with the bearing jig, the inner sliding block is driven to move towards the wiring terminal until the inner sliding block is in contact with one side face of the wiring terminal; after the inner supporting assembly is separated from the bearing jig, the inner sliding block resets. Therefore, the adaptability of the crimping mechanism is improved, good contact between the limiting structure and the wiring terminal is ensured, deformation of the wiring terminal is avoided, a terminal of a device is protected, the device can be reused, and meanwhile the device is smoothly separated from a power supply jig.

Description

Technical Field

[0001] The present invention relates to the technical field of power semiconductor device testing, and in particular to a crimping mechanism and a testing device for power semiconductor device testing. Background Art

[0002] When detecting a power semiconductor device (hereinafter referred to as "device"), it is usually necessary to use a crimping mechanism to closely fit the wiring terminal of the device with a flexible copper bar (testing terminal) to ensure stable power supply. The crimping mechanism plays an important role in the tightness of the fit between the wiring terminal of the device and the power supply flexible copper bar, the efficiency and reliability of device detection.

[0003] Most of the wiring terminals of existing devices are horizontal wiring terminals. There are a large number of adapted crimping mechanisms for horizontal wiring terminals. For devices with vertical wiring terminals, there are fewer adapted crimping mechanisms. The traditional crimping mechanism mainly drives through cylinders in the horizontal and vertical directions to realize the movement of the wiring terminal relative to the flexible copper bar in two directions, connect the device with the test circuit after the two are fitted, and usually set a limit block on one side of the wiring terminal. When the flexible copper bar is crimped with the wiring terminal, the limit block plays a role in preventing the wiring terminal from deforming.

[0004] In the above crimping mechanism, the degree of fit between the wiring terminal and the limit block is unstable, it is difficult to avoid the wiring terminal being bent, which will lead to difficulty in removing the device from the limit block after the test is completed, or the wiring terminal cannot smoothly disengage from the limit block, resulting in the automatic test process of the device not proceeding smoothly and affecting the detection efficiency. Summary of the Invention

[0005] The applicant of the present invention aims at the above-mentioned disadvantages in the existing production technology, and provides a crimping mechanism and a testing device for power semiconductor device testing, so as to improve the adaptability of the crimping mechanism, ensure good contact between the limit structure and the wiring terminal, avoid deformation of the wiring terminal, protect the terminal of the device, enable the device to be reused, and at the same time enable the device to smoothly disengage from the power supply fixture.

[0006] The technical solution adopted by the present invention is as follows:

[0007] A crimping mechanism for power semiconductor device testing, the device includes a substrate, a wiring terminal is arranged on the substrate, the wiring terminal is vertical, and the crimping mechanism includes:

[0008] A carrying fixture for placing the device;

[0009] A power supply fixture, which is arranged opposite to the carrying fixture and can move relative to the carrying fixture;

[0010] An inner support assembly, which is arranged on the power supply fixture and opposite to the substrate, and the inner support assembly includes an inner slider;

[0011] The test terminal is arranged on the power supply fixture. After the inner slider and the test terminal respectively contact both side surfaces of the wiring terminal, the device is connected to an external power supply.

[0012] Wherein, during the relative movement between the power supply fixture and the carrying fixture, after the inner support assembly contacts the carrying fixture, it drives the inner slider to move towards the wiring terminal until the inner slider contacts one side surface of the wiring terminal; after the inner support assembly disengages from the carrying fixture, the inner slider resets.

[0013] As a further improvement of the above technical solution:

[0014] The structure of the inner support assembly includes:

[0015] The inner support base is movably installed on the first fixture base of the power supply fixture;

[0016] The inner slider is slidably installed on one side of the inner support base facing away from the first fixture base;

[0017] The first elastic body elastically connects the inner slider and the inner support base;

[0018] The inner support driving block has one end fixedly connected to the first fixture base, and the side surface of the other end contacts one end of the inner slider under the elastic force of the first elastic body;

[0019] Wherein, when the inner support base contacts the carrying fixture, it drives the inner support base to move towards the first fixture base, and then the inner support driving block drives the inner slider to move, so that the inner slider contacts the wiring terminal. When the carrying fixture moves in the reverse direction, the inner slider resets.

[0020] One side of the end of the inner support driving block is provided with a first driving inclined surface, and the first driving inclined surface is in sliding fit with the end of the inner slider, converting the relative displacement between the inner support base and the inner support driving block into the relative displacement between the inner slider and the inner support base.

[0021] The inner support assembly further includes a first limiting member and a second elastic body. One end of the first limiting member is connected to the inner support base, and the other end of the first limiting member is connected to the first fixture base, for limiting the maximum distance between the inner support base and the first fixture base;

[0022] The second elastic body is arranged between the first fixture base and the inner support base, elastically connecting the first fixture base and the inner support base. The second elastic body is in a compressed state, for providing a thrust to make the inner support base move away from the first fixture base.

[0023] A first groove is provided on the inner support base, and a second groove is provided on the inner slider. One end of the first elastic body abuts against the inner wall of the first groove, and the other end of the first elastic body abuts against the inner wall of the second groove. When the inner slider slides relative to the inner support base, the first groove and the second groove move relative to each other, changing the compression amount of the first elastic body.

[0024] A moving component is provided on the power supply jig. The moving component includes an outer slider slidably mounted on the first jig base of the power supply jig, and the test terminal is mounted on the outer slider.

[0025] It further includes a driving part. After the inner slider contacts one side surface of the wiring terminal, the driving part drives the outer slider to move towards or away from the wiring terminal.

[0026] The moving component further includes a third elastic body, and the outer slider is elastically connected to the first jig base through the third elastic body.

[0027] The carrying jig includes a second jig base, and the driving part is provided on the second jig base.

[0028] A support seat is movably mounted on the second jig base. The support seat is used to carry the device. There is a floating gap between the support seat and the second jig base. The support seat contacts the inner support assembly to apply a thrust to the inner slider, so that the inner slider contacts the wiring terminal.

[0029] During the process of the power supply jig and the second jig base moving towards each other, after the driving part contacts the outer slider and applies a thrust to the outer slider, the floating gap decreases, and the outer slider moves towards the wiring terminal. When the driving part disengages from the outer slider, the floating gap returns to its original size, and the outer slider resets under the elastic action of the third elastic body.

[0030] A second driving inclined surface is provided on the driving part, and a roller is provided on the outer slider. The roller is slidably matched with the second driving inclined surface to apply a thrust to the outer slider, so that the outer slider moves towards the wiring terminal after overcoming the elastic force of the third elastic body.

[0031] The carrying jig includes a fourth elastic body. The support seat and the second jig base are elastically connected through the fourth elastic body. It further includes a second limiting member, and the second limiting member limits the maximum value of the floating gap and keeps the fourth elastic body in a compressed state.

[0032] A testing device includes a crimping mechanism for testing power semiconductor devices as described in any one of the above.

[0033] The beneficial effects of the present invention are as follows:

[0034] The structure of the present invention is compact and reasonable, and it is convenient to operate. By the relative movement of the power supply fixture and the carrier fixture, the contact and separation between the inner slider in the inner support assembly and the wiring terminal are driven, ensuring good contact between the inner support assembly and the wiring terminal, providing a supporting force for the wiring terminal, avoiding deformation of the wiring terminal, protecting the wiring terminal of the device, enabling the device to be reused, and at the same time enabling the device to smoothly disengage from the power supply fixture.

[0035] Meanwhile, the present invention also has the following advantages:

[0036] (1) The inner support base is movably installed on the first fixture base of the power supply fixture, and the inner support driving block is fixedly installed. The relative movement of the power supply fixture and the carrier fixture is converted into the relative movement of the inner support base and the inner support driving block, so that the inner support driving block acts on the inner slider that is slidably and elastically installed on the inner support base, driving the inner slider to move against the elastic force and reset under the action of the elastic force.

[0037] (2) The inner support base of the inner support assembly is movably connected to the first fixture base through the first limiting member and the second elastic body, so that during the relative movement of the carrier fixture and the power supply fixture, the inner support base can smoothly follow, realizing the relative movement of the carrier fixture and the power supply fixture to drive the inner slider to move.

[0038] (3) By providing a first groove on the inner support base and a second groove on the inner slider, the first groove and the second groove form an installation cavity for installing the first elastic body. The installation cavity is located between the inner slider and the inner support base, and under the limiting action of the inner support driving block, the first elastic body is kept in a compressed deformation. While realizing the function of the inner support assembly, the overall structural size of the inner support assembly is reduced, making the outer shape of the inner support assembly simple and easy to adapt to the device.

[0039] (4) By the action of the elastically resetable outer slider and the driving part on the carrier fixture, the relative displacement of the carrier fixture and the power supply fixture is converted into the relative displacement of the outer slider, reducing the number of driving mechanisms and miniaturizing the crimping mechanism.

[0040] (5) The support seat is movably installed on the second fixture base through the fourth elastic body and the second limiting member, so that there is a floating gap between the support seat and the second fixture base, which can change with the continuous relative movement of the power supply fixture and the carrier fixture. When the test terminal moves towards the wiring terminal, the second fixture base keeps the limit on the inner support base, thereby ensuring the effective contact between the inner slider and the wiring terminal. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] Figure 1 It is a schematic structural diagram of the test equipment of the present invention.

[0042] Figure 2 Schematic diagram of the power supply fixture of the present invention.

[0043] Figure 3 Schematic diagram of the working process of the crimping mechanism of the present invention.

[0044] Figure 4 Schematic diagram of the working process of the crimping mechanism of the present invention (section view).

[0045] Figure 5 Schematic diagram of the structure of the inner support assembly of the present invention.

[0046] Figure 6 Exploded view of the structure of the inner support assembly of the present invention.

[0047] Figure 7 Schematic diagram of two states of the inner support assembly of the present invention.

[0048] Figure 8 Schematic diagram of the structure of the carrier fixture of the present invention.

[0049] Figure 9 is Figure 8 Cross-sectional view of section A-A in

[0050] Figure 10 is Figure 8 Cross-sectional view of section B-B in

[0051] Wherein:

[0052] 1. Power supply fixture;

[0053] 11. First fixture base;

[0054] 12. Test terminal;

[0055] 13. Inner support assembly;

[0056] 131. Inner slider; 1311. Slide bar; 1312. Second groove; 1313. Guide inclined surface;

[0057] 132. Inner support driving block; 1321. First driving inclined surface;

[0058] 133. Inner support base; 1331. Pressing block; 1332. Guide block; 1333. First groove;

[0059] 134. Second elastic body; 135. First guide post; 136. First limiting member; 137. First elastic body; 138. Moving hole;

[0060] 14. First limiting post;

[0061] 15. Moving assembly; 151. Outer slider; 152. Third elastic body; 153. Roller; 154. Fifth elastic body;

[0062] 2. Carrying fixture;

[0063] 21. driving part; 211. second driving inclined surface;

[0064] 22. Support seat; 221. Fourth elastic body; 222. Second stopper; 223. Second guide column;

[0065] 23. The second limiting column;

[0066] 24. Second fixture base; 241. Second countersunk hole;

[0067] 3. Device; 31. Terminal block; 32. Reference plane; 33. Substrate;

[0068] 4. Driving mechanism. DETAILED DESCRIPTION

[0069] The specific implementation of the present invention will be described below in conjunction with the accompanying drawings.

[0070] like Figures 1 - 4 As shown, an embodiment of the present application provides a crimping mechanism for testing a power semiconductor device, wherein the device 3 includes a substrate 33, on which a wiring terminal 31 is provided, and the wiring terminal 31 is vertical, and the crimping mechanism includes a supporting fixture 2, a power supply fixture 1, an internal support component 13 and a test terminal 12.

[0071] A carrying fixture 2, used for placing a device 3;

[0072] The power supply fixture 1 is arranged opposite to the carrying fixture 2 and can move relative to the carrying fixture 2;

[0073] The inner support assembly 13 is disposed on the power supply fixture 1 and opposite to the substrate 33. The inner support assembly 13 includes an inner slider 131;

[0074] The test terminal 12 is arranged on the power supply fixture 1. After the inner slider 131 and the test terminal 12 are in contact with the two side surfaces of the wiring terminal 31 respectively, the device 3 is connected to the external power supply. The inner slider 131 is used to support the wiring terminal 31 from the side of the wiring terminal 31 away from the test terminal 12 to prevent the wiring terminal 31 from being bent when being crimped with the test terminal 12;

[0075] During the relative movement between the power supply fixture 1 and the supporting fixture 2, the inner support component 13 contacts the supporting fixture 2 and drives the inner slider 131 to move toward the terminal 31 until the inner slider 131 contacts one side of the terminal 31; after the inner support component 13 is separated from the supporting fixture 2, the inner slider 131 is reset.

[0076] Specifically, during the relative movement of the power supply fixture 1 and the carrier fixture 2, the inner support assembly 13 contacts and disengages from the carrier fixture 2. After the inner slider 131 contacts the wiring terminal 31, the test terminal 12 is then pressed onto the wiring terminal 31. When the test terminal 12 disengages from the wiring terminal 31, the inner slider 131 resets, ensuring that the wiring terminal 31 can be well supported during the pressing process, avoiding being deformed by the test terminal 12. At the same time, when disconnecting the test circuit from the wiring terminal 31, after the inner slider 131 moves away from the wiring terminal 31, the power supply fixture 1 then moves away from the carrier fixture 2, enabling the device 3 to smoothly disengage from the power supply fixture 1.

[0077] The relative movement of the power supply fixture 1 and the carrier fixture 2 drives the contact and disengagement between the inner slider 131 in the inner support assembly 13 and the wiring terminal 31, ensuring good contact between the inner support assembly 13 and the wiring terminal 31, providing a supporting force for the wiring terminal 31, avoiding deformation of the wiring terminal 31, protecting the wiring terminal 31 of the device 3 to enable the device 3 to be reused, and at the same time enabling the device 3 to smoothly disengage from the power supply fixture 1.

[0078] As Figure 1 、 Figure 3 、 Figure 4 shown, usually, the wiring terminal 31 is in a sheet shape, perpendicular to the reference plane 32 of the substrate 33 and located at the edge of the substrate 33. The number of wiring terminals 31 of the device 3 is multiple, arranged side by side at the edge position of the reference plane 32.

[0079] In an exemplary embodiment, after the wiring terminal 31 of the device 3 is connected to the test terminal 12, the device 3 can be subjected to a reactive power aging test or other tests. As Figure 3 shown, among the multiple wiring terminals 31, there is an AC power terminal and three DC power terminals. The three DC power terminals are arranged side by side. Generally, when testing the device 3, multiple devices 3 can be placed side by side to improve the test efficiency.

[0080] The AC power terminal and the DC power terminals of the device 3 are arranged oppositely, that is, the wiring terminals 31 of the multiple devices 3 form two rows. The inner support assembly 13 corresponds to the reference plane 32 between the two rows of wiring terminals 31. Adaptively, there are two sets of inner sliders 131 and test terminals 12. Among them, the test terminal 12 can be a copper row.

[0081] The crimping mechanism of this embodiment has particularly significant advantages for the case where the wiring terminals 31 form two rows. As Figure 1 、 Figure 4As shown, the device 3 has two sets of terminal blocks 31 arranged oppositely. Inner sliders 131 are provided on both inner support bases 133 on both sides of the inner support driving block 132. After the inner sliders 131 on both sides of the inner support driving block 132 move synchronously under the drive of the inner support driving block 132, they respectively come into contact with the two sets of terminal blocks 31.

[0082] By driving the contact and separation of the inner slider 131 and the terminal block 31 in the inner support assembly 13 through the relative movement of the power supply fixture 1 and the carrier fixture 2, it is possible to prevent the device 3 from being hung on the limiting structure (inner support assembly 13) after the deformation of the terminal block 31, so that the device 3 can smoothly disengage from the power supply fixture 1.

[0083] In an exemplary embodiment, the power supply fixture 1 is located above the carrier fixture 2. The carrier fixture 2 is driven by a driving mechanism 4 to move up and down. The driving mechanism 4 can be a cylinder. The reference surface 32 of the substrate 33 faces the carrier fixture 2, and the moving direction of the carrier fixture 2 is perpendicular to the thickness direction of the terminal block 31.

[0084] In an exemplary embodiment, the inner support assembly 13 is optimized, such as Figures 4 - 7 As shown, the structure of the inner support assembly 13 includes an inner support base 133, an inner slider 131, a first elastic body 137, and an inner support driving block 132.

[0085] The inner support base 133 is movably installed on the first fixture base 11 of the power supply fixture 1;

[0086] The inner slider 131 is slidably installed on the side of the inner support base 133 facing away from the first fixture base 11;

[0087] The first elastic body 137 elastically connects the inner slider 131 and the inner support base 133;

[0088] The inner support driving block 132 is fixedly connected to one end of the first fixture base 11, and the other end side contacts one end of the inner slider 131 under the elastic force of the first elastic body 137;

[0089] Among them, the inner support base 133 contacts the carrier fixture 2 to drive the inner support base 133 to move towards the first fixture base 11. Then, the inner support driving block 132 drives the inner slider 131 to move, so that the inner slider 131 contacts the terminal block 31. When the carrier fixture 2 moves in the reverse direction, the inner slider 131 is reset.

[0090] Specifically, as Figure 4 shown, in Figure a, it is when the carrier fixture 2 does not contact the inner support base 133;

[0091] After the inner support base 133 contacts the carrier fixture 2, during the movement of the carrier fixture 2 towards the first fixture base 11, the inner support base 133 moves relative to the inner support driving block 132, and the inner support driving block 132 pushes the inner slider 131 to move, causing the first elastic body 137 to be compressed until the other end of the inner slider 131 contacts the terminal 31 after the first fixture base 11 contacts the inner support base 133, as shown in Figure 4 Figure b in Figure 7 Figure d in

[0092] After the carrier fixture 2 moves reversely away from the first fixture base 11, the inner support base 133 moves away from the first fixture base 11, the inner support driving block 132 moves reversely relative to the inner support base 133, the first elastic body 137 elongates, that is, the inner slider 131 resets under the action of the first elastic body 137, the inner slider 131 moves away from the terminal 31, and the inner support assembly 13 returns to the state shown in Figure 4 Figure a in Figure 7 Figure e in

[0093] Exemplarily, a power supply device is provided on the first fixture base 11, and the power supply device is electrically connected to the test terminal 12; an activity hole 138 is provided on the inner support base 133, the middle part of the inner support driving block 132 is located in the activity hole 138, when the inner support base 133 moves relative to the first fixture base 11, the moving direction of the inner support driving block 132 and the inner support base 133 is the same as the axis direction of the activity hole 138, and the moving direction is perpendicular to the sliding direction of the inner slider 131; the first elastic body 137 can be a spring in a compressed state, and keeps contacting the inner slider 131 and the inner support driving block 132 through the elastic force; a pressing block 1331 is installed on the inner support base 133, and the contact between the inner support base 133 and the carrier fixture 2 is realized through the pressing block 1331.

[0094] The inner support base 133 is movably installed on the first fixture base 11 of the power supply fixture 1, the inner support driving block 132 is fixedly installed, and the relative movement between the power supply fixture 1 and the carrier fixture 2 is converted into the relative movement between the inner support base 133 and the inner support driving block 132, so that the inner support driving block 132 acts on the inner slider 131 which is slidably and elastically installed on the inner support base 133, driving the inner slider 131 to move against the elastic force and reset under the action of the elastic force.

[0095] In this embodiment, as shown in Figure 6 one side of the end of the inner support driving block 132 is provided with a first driving inclined surface 1321, and the first driving inclined surface 1321 is slidably matched with the end of the inner slider 131, converting the relative displacement between the inner support base 133 and the inner support driving block 132 into the relative displacement between the inner slider 131 and the inner support base 133.

[0096] Specifically, a guiding inclined surface 1313 which is slidably engaged with the first driving inclined surface 1321 is provided on the inner slider 131, making the process of the first driving inclined surface 1321 pushing the inner slider 131 smoother.

[0097] The installation structure of the inner slider 131 is as Figure 6 shown. A pair of guiding blocks 1332 are installed on the inner supporting base 133, forming a sliding groove with the surface of the inner supporting base 133. Sliding strips 1311 are provided on both sides of the inner slider 131. The sliding strips 1311 are slidably engaged with the sliding groove and limit the position of the inner slider 131 in the direction perpendicular to the sliding direction of the inner slider 131.

[0098] In the previous exemplary embodiment, as Figure 5 、 Figure 6 shown, the inner supporting assembly 13 further includes a first limiting member 136 and a second elastic body 134. One end of the first limiting member 136 is connected to the inner supporting base 133, and the other end of the first limiting member 136 is connected to the first fixture base 11, for limiting the maximum distance between the inner supporting base 133 and the first fixture base 11;

[0099] The second elastic body 134 is arranged between the first fixture base 11 and the inner supporting base 133, elastically connecting the first fixture base 11 and the inner supporting base 133. The second elastic body 134 is in a compressed state, for providing a thrust force to make the inner supporting base 133 move away from the first fixture base 11.

[0100] Specifically, the second elastic body 134 can specifically be a spring, and the first limiting member 136 is a first screw installed on the inner supporting base 133. The head of the first screw is engaged with a first counterbore located on the first fixture base 11.

[0101] To ensure the stability of the moving direction of the inner supporting base 133 relative to the first fixture base 11, a first guiding post 135 is installed on the inner supporting base 133. The first guiding post 135 is slidably engaged with the first fixture base 11.

[0102] The inner supporting base 133 of the inner supporting assembly 13 is movably connected to the first fixture base 11 through the first limiting member 136 and the second elastic body 134. During the relative movement of the carrier fixture 2 and the power supply fixture 1, the inner supporting base 133 can smoothly follow the movement, realizing that the relative movement of the carrier fixture 2 and the power supply fixture 1 drives the inner slider 131 to move.

[0103] The installation method of the first elastic body 137 can be various, as long as it maintains contact with the inner slider 131 and the inner supporting driving block 132 through elastic force. However, limited by the structure of the device 3, the structural space layout of the inner supporting assembly 13 is limited. In order to make the outer shape of the inner supporting assembly 13 simple and occupy less space, in another exemplary embodiment, a solution is given, as Figure 6 、Figure 7 As shown, a first groove 1333 is provided on the inner support base 133 of this embodiment, and a second groove 1312 is provided on the inner slider 131. One end of the first elastic body 137 abuts against the inner wall of the first groove 1333, and the other end of the first elastic body 137 abuts against the inner wall of the second groove 1312. When the inner slider 131 slides relative to the inner support base 133, the first groove 1333 and the second groove 1312 move relative to each other, changing the compression amount of the first elastic body 137.

[0104] By providing a first groove 1333 on the inner support base 133 and a second groove 1312 on the inner slider 131, the first groove 1333 and the second groove 1312 form an installation cavity for installing the first elastic body 137. The installation cavity is located between the inner slider 131 and the inner support base 133, and under the limiting action of the inner support driving block 132, the compression deformation of the first elastic body 137 is maintained. While realizing the function of the inner support assembly 13, the overall structural size of the inner support assembly 13 is reduced, making the outer shape of the inner support assembly 13 simple and easy to adapt to the device 3.

[0105] Generally, the test terminal 12 is movably arranged on the first fixture base 11 of the power supply fixture 1, and the test terminal 12 can be driven to move by a cylinder installed on the first fixture base 11 to realize the contact connection and separation disconnection between the test terminal 12 and the wiring terminal 31.

[0106] In an exemplary embodiment, a moving component 15 is provided on the power supply fixture 1. The moving component 15 includes an outer slider 151. The outer slider 151 is slidably installed on the first fixture base 11 of the power supply fixture 1, and the test terminal 12 is installed on the outer slider 151;

[0107] It further includes a driving part 21. After the inner slider 131 contacts one side surface of the wiring terminal 31, the driving part 21 drives the outer slider 151 to move towards or away from the wiring terminal 31.

[0108] Specifically, there is sufficient installation space on the power supply fixture 1, and the outer slider 151 can be slidably connected to the first fixture base 11 through a guide rail slider structure.

[0109] When the inner slider 131 contacts to support the wiring terminal 31, then the test terminal 12 is moved towards the wiring terminal 31 to make the test terminal 12 contact or separate from the wiring terminal 31, ensuring that the wiring terminal 31 does not deform.

[0110] Among them, the driving part 21 can be a cylinder installed on the first fixture base 11 of the power supply fixture 1.

[0111] For the case where the wiring terminals 31 are arranged in two rows, there are two sets of corresponding moving components 15 and driving parts 21.

[0112] In another exemplary embodiment, as Figures 1 - 4 shown, the moving component 15 further includes a third elastomer 152, and the outer slider 151 is elastically connected to the first fixture base 11 through the third elastomer 152;

[0113] The carrier fixture 2 includes a second fixture base 24, and a driving part 21 is arranged on the second fixture base 24;

[0114] A support seat 22 is movably installed on the second fixture base 24. The support seat 22 is used to carry the device 3. There is a floating gap between the support seat 22 and the second fixture base 24. The support seat 22 contacts the inner support assembly 13 to apply a thrust to the inner slider 131, so that the inner slider 131 contacts the wiring terminal 31;

[0115] During the process of the power supply fixture 1 and the second fixture base 24 moving towards each other, after the driving part 21 contacts the outer slider 151 and applies a thrust to the outer slider 151, the floating gap decreases, and the outer slider 151 moves towards the wiring terminal 31. When the driving part 21 disengages from the outer slider 151, the floating gap returns to the original size, and the outer slider 151 is reset under the elastic action of the third elastomer 152.

[0116] Specifically, the second fixture base 24 is a water-cooled plate.

[0117] During the process of the carrier fixture 2 moving towards the power supply fixture 1, as Figure 3 、 Figure 4 shown in Figure a in the middle, first, the pressing block 1331 on the inner support base 133 contacts the support seat 22. Under the thrust of the support seat 22, the second elastomer 134 is compressed, and the inner support base 133 moves relative to the inner support driving block 132 until the inner support base 133 contacts the first fixture base 11 and the inner slider 131 contacts the wiring terminal 31, and then the driving part 21 on the second fixture base 24 contacts the outer slider 151, as Figure 4 shown in Figure b in the middle;

[0118] The carrier fixture 2 continues to move towards the power supply fixture 1. During the process of the driving part 21 applying a thrust to the outer slider 151, the support seat 22 and the second fixture base 24 approach each other, and the floating gap decreases until the test terminal 12 on the outer slider 151 contacts the wiring terminal 31 and then the support seat 22 and the second fixture base 24 stop approaching each other. At this time, the connection between the device 3 and the test circuit is completed, as Figure 4 shown in Figure c in the middle.

[0119] By the action of the elastically resetable outer slider 151 and the driving part 21 on the carrier fixture 2, the relative displacement between the carrier fixture 2 and the power supply fixture 1 is converted into the relative displacement of the outer slider 151, reducing the number of driving mechanisms and miniaturizing the crimping mechanism.

[0120] In this embodiment, as Figure 3 Figure 4 shown, a second driving inclined surface 211 is provided on the driving part 21, a roller 153 is provided on the outer slider 151, and the roller 153 is in sliding fit with the second driving inclined surface 211 to apply a thrust force to the outer slider 151, so that the outer slider 151 moves towards the terminal 31 after overcoming the elastic force of the third elastic body 152.

[0121] Specifically, the included angle between the relative movement direction of the power supply fixture 1 and the carrier fixture 2 and the second driving inclined surface 211 is forty-five degrees.

[0122] In this embodiment, as Figures 8 - 10 shown, the carrier fixture 2 includes a fourth elastic body 221, and the support base 22 and the second fixture base 24 are elastically connected through the fourth elastic body 221. It further includes a second limiting member 222, and the second limiting member 222 limits the maximum value of the floating gap and keeps the fourth elastic body 221 in a compressed state.

[0123] Specifically, the fourth elastic body 221 can be a spring, the second limiting member 222 is a second screw, one end of the second screw is fixedly connected to the support base 22, the other end of the second screw is matched with a second counterbore 241 on the second fixture base 24, and a second guiding column 223 slidably connected to the second fixture base 24 is further provided on the support base 22; wherein the pre-compression force of the fourth elastic body 221 is greater than the maximum compression elastic force of the second elastic body 134 during the working process of the crimping mechanism.

[0124] The support base 22 is movably installed on the second fixture base 24 through the fourth elastic body 221 and the second limiting member 222, so that there is a floating gap between the support base 22 and the second fixture base 24, which can change as the power supply fixture 1 and the carrier fixture 2 continue to move relatively. During the movement of the test terminal 12 towards the terminal 31, the second fixture base 24 keeps the limit on the inner support base 133, thereby ensuring the effective contact between the inner slider 131 and the terminal 31.

[0125] A first limiting column 14 is provided on the first fixture base 11, and a second limiting column 23 is provided on the second fixture base 24. The contact between the first limiting column 14 and the second limiting column 23 plays a role of limiting and protecting.

[0126] In order to ensure good contact between the terminal 31 and the test terminal 12, as Figure 4 shown, a fifth elastic body 154 is provided on the outer slider 151. The fifth elastic body 154 can be a spring. The fifth elastic body 154 is installed on the outer slider 151 through a limiting and guiding structure. The fifth elastic body 154 elastically connects the test terminal 12 and the outer slider 151 to ensure good contact between the test terminal 12 and the terminal 31.

[0127] In an exemplary embodiment, the present application provides a test device, including the crimping mechanism for testing power semiconductor devices described in any one of the above.

[0128] The above description is an explanation of the present invention, not a limitation of the invention. For the scope defined by the present invention, refer to the claims. Any form of modification may be made within the protection scope of the present invention.

Claims

1. A crimping mechanism for testing power semiconductor devices, characterized in that: The device (3) comprises a substrate (33), on which a connection terminal (31) is arranged, the connection terminal (31) is vertical, and the crimping mechanism comprises: A carrying fixture (2) for placing the device (3); A power supply jig (1) is arranged opposite to the supporting jig (2) and is movable relative to the supporting jig (2); An inner support component (13) is arranged on the power supply fixture (1) and is opposite to the base plate (33), and the inner support component (13) comprises an inner sliding block (131); A test terminal (12) is arranged on the power supply fixture (1), and after the inner slider (131) and the test terminal (12) are in contact with two side surfaces of the connection terminal (31) respectively, the device (3) is connected to an external power source; In which, during the relative movement of the power supply jig (1) and the supporting jig (2), the inner support component (13) contacts the supporting jig (2) and drives the inner slider (131) to move toward the connecting terminal (31) until the inner slider (131) contacts a side surface of the connecting terminal (31); and after the inner support component (13) is separated from the supporting jig (2), the inner slider (131) is reset.

2. The crimping mechanism for testing power semiconductor devices according to claim 1, characterized in that: The structure of the inner support assembly (13) comprises: An inner support base (133) movably mounted on the first fixture base (11) of the power supply fixture (1); The inner sliding block (131) is slidably mounted on a side of the inner supporting base (133) facing away from the first fixture base (11); A first elastic body (137) elastically connects the inner sliding block (131) and the inner supporting base (133); An inner support driving block (132), one end of which is fixedly connected to the first fixture base (11), and the side surface of the other end contacts one end of the inner sliding block (131) under the elastic force of the first elastic body (137); The inner support base (133) contacts the supporting fixture (2) to drive the inner support base (133) to move toward the first fixture base (11), and then the inner support driving block (132) drives the inner slider (131) to move, so that the inner slider (131) contacts the connecting terminal (31), and the supporting fixture (2) moves in the opposite direction to reset the inner slider (131).

3. The crimping mechanism for testing power semiconductor devices according to claim 2, characterized in that: A first driving inclined surface (1321) is provided on one side of the end of the inner support driving block (132), and the first driving inclined surface (1321) is slidably matched with the end of the inner sliding block (131) to convert the relative displacement between the inner support base (133) and the inner support driving block (132) into the relative displacement between the inner sliding block (131) and the inner support base (133).

4. The crimping mechanism for testing power semiconductor devices according to claim 2, characterized in that: The inner support assembly (13) further comprises a first limiting member (136) and a second elastic body (134), wherein one end of the first limiting member (136) is connected to the inner support base (133), and the other end of the first limiting member (136) is connected to the first fixture base (11), and is used to limit the maximum distance between the inner support base (133) and the first fixture base (11); The second elastic body (134) is arranged between the first jig base (11) and the inner support base (133) to elastically connect the first jig base (11) and the inner support base (133); the second elastic body (134) is in a compressed state to provide a thrust to move the inner support base (133) away from the first jig base (11).

5. The crimping mechanism for testing power semiconductor devices according to claim 2, characterized in that: The inner support base (133) is provided with a first groove (1333), and the inner sliding block (131) is provided with a second groove (1312). The inner wall of the first groove (1333) abuts against one end of the first elastic body (137), and the inner wall of the second groove (1312) abuts against the other end of the first elastic body (137). When the inner sliding block (131) slides relative to the inner support base (133), the first groove (1333) and the second groove (1312) move relative to each other, thereby changing the compression amount of the first elastic body (137).

6. The crimping mechanism for testing power semiconductor devices according to claim 1, characterized in that: The power supply fixture (1) is provided with a moving component (15), the moving component (15) comprising an outer slider (151), the outer slider (151) being slidably mounted on a first fixture base (11) of the power supply fixture (1), and the test terminal (12) being mounted on the outer slider (151); It also comprises a driving part (21), and after the inner slider (131) contacts a side surface of the connecting terminal (31), the driving part (21) drives the outer slider (151) to move toward the connecting terminal (31) or away from the connecting terminal (31).

7. The crimping mechanism for testing power semiconductor devices according to claim 6, characterized in that: The moving assembly (15) further comprises a third elastic body (152), and the outer sliding block (151) is elastically connected to the first fixture base (11) via the third elastic body (152); The carrying jig (2) comprises a second jig base (24), and the driving part (21) is arranged on the second jig base (24); A support seat (22) is movably mounted on the second fixture base (24), the support seat (22) being used to carry the device (3), a floating gap being provided between the support seat (22) and the second fixture base (24), the support seat (22) being in contact with the inner support assembly (13) to apply a thrust to the inner slide block (131), so that the inner slide block (131) is in contact with the connection terminal (31); During the process of the power supply fixture (1) and the second fixture base (24) moving toward each other, after the driving part (21) contacts the outer slider (151) and applies a thrust to the outer slider (151), the floating gap is reduced, and the outer slider (151) moves toward the connecting terminal (31). When the driving part (21) is separated from the outer slider (151), the floating gap returns to its original size, and the outer slider (151) is reset under the elastic action of the third elastic body (152).

8. The crimping mechanism for testing power semiconductor devices according to claim 7, characterized in that: The driving portion (21) is provided with a second driving inclined surface (211), and the outer sliding block (151) is provided with a roller (153). The roller (153) and the second driving inclined surface (211) are slidably matched to apply a thrust to the outer sliding block (151), so that the outer sliding block (151) overcomes the elastic force of the third elastic body (152) and moves toward the connecting terminal (31).

9. The crimping mechanism for testing power semiconductor devices according to claim 7, characterized in that: The bearing fixture (2) includes a fourth elastic body (221), the support seat (22) and the second fixture base (24) are elastically connected via the fourth elastic body (221), and also includes a second limiting member (222), the second limiting member (222) limits the maximum value of the floating gap and puts the fourth elastic body (221) in a compressed state.

10. A testing device, characterized in that: The invention comprises a crimping mechanism for testing a power semiconductor device as claimed in any one of claims 1 to 9.

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