Power device aging test method and related device

Abstract

The embodiment of the invention provides an aging test method of a power device and a related device, and the method comprises the steps: obtaining the test current information of a to-be-tested power device during the aging test, and obtaining the use environment information and the use duration of the to-be-tested power device; according to the current information and the attribute information of the to-be-tested power device, determining a target temperature curve of the to-be-tested power device during testing; determining first aging information of the to-be-tested power device according to the target temperature curve; determining second aging information according to the use environment information and the use duration; and performing fusion processing on the first aging information and the second aging information to obtain target aging information of the to-be-tested power device, so that the accuracy of aging test on the power device can be improved.

Description

Technical Field

[0001] The present application relates to the field of aging testing and data processing technology, and in particular to an aging testing method for a power device and related devices. Background Art

[0002] Power devices are widely used electronic devices. The service life of power devices usually affects the service life of the entire system containing the power devices. At the same time, due to the particularity of power devices during use, for example, power devices used for switch control will be turned on and off at high frequencies during use, which makes their aging rate higher than that of ordinary devices. Therefore, it is necessary to perform aging tests on power devices. In existing aging test schemes, a variable voltage is usually applied to the power device to change the current flowing through it and generate a change in the heat power, so as to compare the generated temperatures and finally determine the aging information. When performing aging tests in the above manner, since the characteristics of the power device will change with the use time, the accuracy of the aging information obtained by the test is low. Summary of the invention

[0003] The embodiments of the present application provide an aging test method and related apparatus for a power device, which can improve the accuracy of aging test on the power device.

[0004] A first aspect of an embodiment of the present application provides an aging test method for a power device, the method comprising:

[0005] Acquire test current information of the power device to be tested during aging test, and acquire use environment information and use time of the power device to be tested;

[0006] Determining a target temperature curve of the power device to be tested when testing the power device to be tested according to the current information and the property information of the power device to be tested;

[0007] Determining first aging information of the power device to be tested according to the target temperature curve;

[0008] determining second aging information according to the usage environment information and the usage duration;

[0009] The first aging information and the second aging information are fused to obtain target aging information of the power device to be tested.

[0010] In this example, by obtaining the test current information of the power device to be tested during the aging test, and obtaining the usage environment information and the usage time of the power device to be tested, the target temperature curve of the power device to be tested during the test is determined according to the current information and the attribute information of the power device to be tested, and the first aging information of the power device to be tested is determined according to the target temperature curve. The second aging information is determined according to the usage environment information and the usage time. The first aging information and the second aging information are fused to obtain the target aging information of the power device to be tested. Therefore, the target aging information of the power device to be tested can be determined by testing the current information and combining the usage environment information and the usage time, thereby improving the accuracy of determining the target aging information.

[0011] In a possible implementation, determining a target temperature curve of the power device to be tested when testing the power device to be tested according to the current information and the property information of the power device to be tested includes:

[0012] Extracting switch energy loss information and thermal resistance information of the power device to be tested from the property information of the power device to be tested;

[0013] Determining a reference temperature curve according to the current information, the switch energy loss information and the thermal resistance information of the power device to be tested;

[0014] Extracting temperature characteristic information from the property information of the power device to be tested;

[0015] The reference temperature curve is adjusted according to the temperature characteristic information to obtain the target temperature curve.

[0016] In a possible implementation, determining the second aging information according to the usage environment information and the usage duration includes:

[0017] Determining inherent loss information of the power device to be tested according to the usage time;

[0018] Determining target loss adjustment information according to the usage environment information;

[0019] The inherent loss information is adjusted using the target loss adjustment information to obtain actual loss information;

[0020] The second aging information is determined according to the actual loss information.

[0021] In a possible implementation manner, determining the target loss adjustment information according to the usage environment information includes:

[0022] Extracting ambient temperature information, application scenario information and user usage parameters from the usage environment information;

[0023] Determine first reference loss adjustment information according to the ambient temperature information and preset ambient temperature information of the power device to be tested;

[0024] Determining usage standardization information according to the user usage parameters;

[0025] Determine second reference loss adjustment information according to the usage specification information and the application scenario information;

[0026] The first reference loss adjustment information and the second reference loss adjustment information are merged to obtain the target loss adjustment information.

[0027] In a possible implementation manner, the determining the second reference loss adjustment information according to the usage specification information and the application scenario information includes:

[0028] Determine application scenario loss information according to the application scenario information;

[0029] Obtain the influence of usage norms on application scenario information;

[0030] Determining a loss impact factor based on the impact degree and usage specification information;

[0031] The loss impact factor is used to adjust the application scenario loss information to obtain the second reference loss adjustment information.

[0032] A second aspect of an embodiment of the present application provides an aging test device for a power device, the device comprising:

[0033] An acquisition unit, used to acquire test current information of a power device to be tested during an aging test, and to acquire use environment information and use duration of the power device to be tested;

[0034] A first determining unit, configured to determine a target temperature curve of the power device to be tested when testing the power device to be tested according to the current information and the property information of the power device to be tested;

[0035] A second determining unit, configured to determine first aging information of the power device to be tested according to the target temperature curve;

[0036] A third determining unit, configured to determine second aging information according to the usage environment information and the usage duration;

[0037] A fusion unit is used to fuse the first aging information and the second aging information to obtain target aging information of the power device to be tested.

[0038] In a possible implementation manner, the first determining unit is specifically configured to:

[0039] Extracting switch energy loss information and thermal resistance information of the power device to be tested from the property information of the power device to be tested;

[0040] Determining a reference temperature curve according to the current information, the switch energy loss information and the thermal resistance information of the power device to be tested;

[0041] Extracting temperature characteristic information from the property information of the power device to be tested;

[0042] The reference temperature curve is adjusted according to the temperature characteristic information to obtain the target temperature curve.

[0043] In a possible implementation manner, the third determining unit is specifically configured to:

[0044] Determining inherent loss information of the power device to be tested according to the usage time;

[0045] Determining target loss adjustment information according to the usage environment information;

[0046] The inherent loss information is adjusted using the target loss adjustment information to obtain actual loss information;

[0047] The second aging information is determined according to the actual loss information.

[0048] In a possible implementation manner, in determining the target loss adjustment information according to the usage environment information, the third determining unit is specifically configured to:

[0049] Extracting ambient temperature information, application scenario information and user usage parameters from the usage environment information;

[0050] Determine first reference loss adjustment information according to the ambient temperature information and preset ambient temperature information of the power device to be tested;

[0051] Determining usage standardization information according to the user usage parameters;

[0052] Determine second reference loss adjustment information according to the usage specification information and the application scenario information;

[0053] The first reference loss adjustment information and the second reference loss adjustment information are merged to obtain the target loss adjustment information.

[0054] In a possible implementation manner, in determining the second reference loss adjustment information according to the usage specification information and the application scenario information, the third determining unit is specifically configured to:

[0055] Determine application scenario loss information according to the application scenario information;

[0056] Obtain the influence of usage norms on application scenario information;

[0057] Determining a loss impact factor based on the impact degree and usage specification information;

[0058] The loss impact factor is used to adjust the application scenario loss information to obtain the second reference loss adjustment information.

[0059] A third aspect of an embodiment of the present application provides a terminal, comprising a processor, an input device, an output device and a memory, wherein the processor, input device, output device and memory are interconnected, wherein the memory is used to store a computer program, the computer program comprises program instructions, and the processor is configured to call the program instructions to execute the step instructions in the first aspect of the embodiment of the present application.

[0060] The fourth aspect of the embodiments of the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program for electronic data exchange, wherein the computer program enables a computer to execute part or all of the steps described in the first aspect of the embodiments of the present application.

[0061] A fifth aspect of the embodiments of the present application provides a computer program product, wherein the computer program product includes a non-transitory computer-readable storage medium storing a computer program, and the computer program is operable to cause a computer to execute some or all of the steps described in the first aspect of the embodiments of the present application. The computer program product may be a software installation package. BRIEF DESCRIPTION OF THE DRAWINGS

[0062] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0063] Figure 1 A schematic flow chart of an aging test method for a power device is provided for an embodiment of the present application;

[0064] Figure 2 A schematic diagram of the structure of a terminal provided in an embodiment of the present application;

[0065] Figure 3 A schematic structural diagram of an aging test device for a power device is provided for an embodiment of the present application. DETAILED DESCRIPTION

[0066] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0067] The terms "first", "second", etc. in the specification and claims of this application and the above-mentioned drawings are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but optionally includes steps or units that are not listed, or optionally includes other steps or units inherent to these processes, methods, products or devices.

[0068] Reference to "embodiments" in this application means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described in this application may be combined with other embodiments.

[0069] In order to better understand the aging test method of a power device provided in an embodiment of the present application, the aging test method of a power device in an existing solution is briefly introduced below. In the existing solution, when performing an aging test on a power device, a changing voltage is usually applied to the power device so that the current flowing through changes and the heat power changes, and the generated temperature is compared to finally determine the aging information. When performing an aging test in the above manner, since the characteristics of the power device will change with the use time, a large deviation may occur when using a single performance parameter to evaluate the aging of the power device, thereby reducing the accuracy of the acquired aging information.

[0070] In order to solve the above-mentioned problems, an embodiment of the present application provides an aging test method for a power device, which can determine the target aging information of the power device to be tested by testing the current information of the power device to be tested and combining the usage environment information and the usage time, thereby improving the accuracy of determining the target aging information and also being able to quickly obtain the target aging information.

[0071] See also Figure 1 , Figure 1 The present invention provides a schematic flow chart of an aging test method for a power device. Figure 1 As shown, the method includes:

[0072] 101. Acquire test current information of a power device to be tested during an aging test, and acquire use environment information and use duration of the power device to be tested.

[0073] The current value of the aging device to be tested can be obtained by acquiring the current value of the load module connected in series with the power device to be tested, thereby obtaining the current value of the aging device to be tested, and thus obtaining the test current information.

[0074] The use environment information may include ambient temperature information, application scenario information and user usage parameters. The ambient temperature information includes the average ambient temperature, maximum ambient temperature, minimum ambient temperature, duration of the maximum ambient temperature, duration of the minimum ambient temperature, etc. of the power device to be tested during actual use. The application scenario information can be understood as the device in which the power device to be tested is applied, for example, the power device to be tested is applied to switches, routers, servers, etc. The user usage parameters can be understood as the user's usage information when using the device where the power device to be tested is located, for example, it may include the continuous use time, whether the device is frequently turned on and off, whether the device collides, etc.

[0075] 102. Determine a target temperature curve of the power device to be tested when testing the power device to be tested according to the current information and the property information of the power device to be tested.

[0076] Among them, the attribute information of the power device to be tested includes switch energy loss information and thermal resistance information of the power device to be tested. The switch energy loss information includes turn-on energy loss information and turn-off energy loss information. Then, the reference temperature curve is determined according to the current information, switch energy loss information and thermal resistance information, and finally, the reference temperature curve is adjusted according to the temperature characteristic information of the power device to be tested to obtain the target temperature curve. Therefore, the reference temperature curve can be adjusted in combination with the temperature characteristic information to obtain the target temperature curve, which improves the accuracy of obtaining the target temperature curve.

[0077] 103. Determine first aging information of the power device to be tested according to the target temperature curve.

[0078] The target temperature curve and the preset temperature curve corresponding to the power device to be tested can be used to extract the difference information to obtain the temperature difference information; the first aging information can be determined based on the temperature difference information. The aging information can reflect the aging degree of the power device to be tested. Specifically, for example, the greater the temperature difference value corresponding to the temperature difference information, the greater the corresponding aging degree. The aging degree can be represented by a percentage, for example, the aging degree is 30%. The temperature difference information will correspond to the sampling time point, and the average value of the temperature difference information corresponding to each sampling time point can be determined as the temperature difference information.

[0079] 104. Determine second aging information according to the usage environment information and the usage duration.

[0080] Among them, the inherent loss information of the power device to be tested can be determined according to the usage time, and then the loss adjustment information can be determined according to the usage environment information, and finally the inherent loss information can be adjusted using the loss adjustment information to finally obtain the second aging information. Therefore, the second aging information can be determined by combining the usage environment information and the usage time information, which improves the accuracy of determining the second aging information.

[0081] 105. Perform fusion processing on the first aging information and the second aging information to obtain target aging information of the power device to be tested.

[0082] The weights corresponding to the first aging information and the second aging information may be obtained respectively, and then a weight calculation may be performed based on the weights to finally obtain the target aging information. Specifically, for example, a first weight corresponding to the first aging information is obtained, and a second weight corresponding to the second aging information is obtained, and then the product of the first aging information and the first weight is added, and the product of the second aging information and the second weight is added to obtain the target aging information. The first weight and the second weight may be preset, for example, and may be set by experience or historical data.

[0083] In this example, by obtaining the test current information of the power device to be tested during the aging test, and obtaining the usage environment information and the usage time of the power device to be tested, the target temperature curve of the power device to be tested during the test is determined according to the current information and the attribute information of the power device to be tested, and the first aging information of the power device to be tested is determined according to the target temperature curve. The second aging information is determined according to the usage environment information and the usage time. The first aging information and the second aging information are fused to obtain the target aging information of the power device to be tested. Therefore, the target aging information of the power device to be tested can be determined by testing the current information and combining the usage environment information and the usage time, thereby improving the accuracy of determining the target aging information.

[0084] In a possible implementation, a method for determining a target temperature curve of the power device to be tested when testing the power device to be tested according to the current information and the property information of the power device to be tested includes:

[0085] A1. extracting switch energy loss information and thermal resistance information of the power device to be tested from the property information of the power device to be tested;

[0086] A2. determining a reference temperature curve according to the current information, the switch energy loss information and the thermal resistance information of the power device to be tested;

[0087] A3. extracting temperature characteristic information from the property information of the power device to be tested;

[0088] A4. Adjust the reference temperature curve according to the temperature characteristic information to obtain the target temperature curve.

[0089] Among them, since the attribute information of the power device to be tested includes the switching energy loss information and the thermal resistance information of the power device to be tested, the switching energy loss information and the thermal resistance information of the power device to be tested can be extracted from the attribute information of the power device to be tested.

[0090] The heat loss of the power device to be tested during use can be determined based on the current value, opening energy loss information and closing energy loss information in the current information; then the temperature information of the power device to be tested can be determined based on the heat loss and thermal resistance information, and then a reference temperature curve can be constructed based on the temperature information and the corresponding time. The horizontal axis of the reference temperature curve is the time axis, and the vertical axis is the temperature value. The temperature information of the power device to be tested can be determined by the method shown in the following formula, specifically:

[0091] P = k[I*V+j(E n +E f )*s];

[0092] T = P * m;

[0093] Where, T is the temperature value, m is the thermal resistance parameter, j is the switching frequency of the power device to be tested, s is the frequency compensation coefficient, P is the heat loss, k is the loss correction parameter, I is the current value, V is the static parameter of the power device to be tested, E n To enable energy loss information, E f is the energy loss information of the switch off. The frequency compensation coefficient increases with the increase of the switching frequency. k is the loss correction parameter set by the system parameters.

[0094] The attribute information includes temperature characteristic information, which can be understood as the temperature variation characteristics over time when the power device to be tested is running. For example, the temperature will fluctuate as the running time increases. At this time, the fluctuation can be superimposed on the reference temperature curve to obtain the target temperature curve.

[0095] In this example, the target temperature curve is obtained by superimposing the temperature characteristic information on the reference temperature curve. The target temperature curve can be determined by combining the loss information of the power device to be tested and the temperature characteristics, thereby improving the accuracy of obtaining the target temperature curve.

[0096] In a possible implementation, a method for determining second aging information according to the usage environment information and the usage duration includes:

[0097] B1. determining the inherent loss information of the power device to be tested according to the usage time;

[0098] B2. determining target loss adjustment information according to the usage environment information;

[0099] B3. Using the target loss adjustment information to adjust the inherent loss information to obtain actual loss information;

[0100] B4. Determine the second aging information according to the actual loss information.

[0101] The inherent loss information can be determined by the usage time according to the inherent loss parameters of the power device to be tested, etc. The inherent loss parameters of the power device to be tested include a function of the loss of the power device to be tested as the usage time increases, so that the inherent loss information corresponding to the usage time can be determined according to the function.

[0102] The target loss adjustment information can be determined based on the ambient temperature information, application scenario information, and user usage parameters in the usage environment information. After the target loss adjustment information is determined, the inherent loss information is adjusted using the target loss adjustment information to obtain the actual loss information. Specifically, the product of the target loss adjustment information and the inherent loss information can be determined as the actual loss information. The loss information here can be converted into a numerical value that can be calculated through parameter conversion, so as to perform subsequent multiplication operations, etc.

[0103] The first reference loss adjustment information can be determined by using ambient temperature information and preset ambient temperature information, and the second reference loss adjustment information can be determined by using usage specification information and application scenario information of user usage parameters. Finally, the first reference loss adjustment information and the second reference loss adjustment information are fused to obtain the target loss adjustment information.

[0104] The actual loss information may be converted into a percentage to obtain a conversion value, and the conversion value may be determined as the second aging information. The actual loss information may be converted into a percentage to obtain a conversion value. A general conversion method may be used to perform conversion processing to obtain a conversion value.

[0105] In this example, inherent loss information is determined based on usage time, and target loss adjustment information is determined based on usage environment information to adjust the inherent loss information to obtain actual loss information. Finally, second aging information is determined based on the actual loss information, thereby improving the accuracy of determining the second aging information.

[0106] In a possible implementation, a method for determining target loss adjustment information according to the usage environment information includes:

[0107] C1. extracting ambient temperature information, application scenario information and user usage parameters from the usage environment information;

[0108] C2. determining first reference loss adjustment information according to the ambient temperature information and the preset ambient temperature information of the power device to be tested;

[0109] C3. Determining usage standardization information according to the user usage parameters;

[0110] C4. Determine second reference loss adjustment information according to the usage standardization information and the application scenario information;

[0111] C5. Merge the first reference loss adjustment information and the second reference loss adjustment information to obtain the target loss adjustment information.

[0112] Among them, the first similarity between the ambient temperature information and the preset ambient temperature information can be obtained, and the first reference loss adjustment information is determined according to the first similarity. The higher the similarity, the smaller the adjustment strength of the first reference loss adjustment information; the lower the similarity, the higher the adjustment strength of the first reference loss adjustment information. The adjustment strength can be understood as the adjustment amplitude when adjusting the parameters. The larger the adjustment amplitude, the larger the adjustment amount; the smaller the adjustment amplitude, the smaller the adjustment amount.

[0113] The usage parameters can be compared with the preset usage parameters to obtain a second similarity, and the first reference usage normative information can be determined based on the second similarity; and the third similarity between the core usage parameters in the usage parameters and the core usage parameters in the preset usage parameters can be extracted, and the second reference usage normative information can be determined based on the third similarity; the first reference usage normative information and the second reference usage normative information can be merged to obtain the usage normative information corresponding to the user usage parameters. The higher the similarity, the greater the usage normative parameter value in the usage normative information, and the lower the similarity, the smaller the usage normative parameter value in the usage normative information.

[0114] If the third similarity is higher than the preset similarity threshold, it indicates that the user uses the application in accordance with the usage specifications in most cases. In this case, a smaller weight can be set for the first reference usage specification information, and a larger weight can be set for the second reference usage specification information. The weight calculation is performed to obtain the usage specification information corresponding to the user usage parameters.

[0115] If the third similarity is lower than the preset similarity threshold, it means that the user does not use the device in accordance with the usage specifications in most cases. Then, a larger weight can be set for the first reference usage specification information, and a smaller weight can be set for the second reference usage specification information. The weight calculation is performed to obtain the usage specification information corresponding to the user usage parameters. The sum of the weights in the weight calculation is 1. The larger and smaller here are relative. For example, the larger weight can be a weight greater than 0.7, and the smaller weight is a weight less than 0.3. In order to highlight the importance of the core usage parameters, the core usage parameters can be understood as the usage parameters whose influence is higher than the preset influence when the power device to be tested is used.

[0116] Different application scenarios have different impacts on the loss of the power device to be tested, so the corresponding application scenario loss information can be determined according to the specific application scenario information, and the product of the application scenario loss information and the impact determined by the use specification information is determined as the second reference loss adjustment information. Finally, the sum of the first reference loss adjustment information and the second reference loss adjustment information can be determined as the target loss adjustment information.

[0117] In this example, the target loss adjustment information is finally determined through the ambient temperature information, the application scenario information and the user usage parameters, thereby improving the accuracy of determining the target loss adjustment information.

[0118] In a possible implementation, a method for determining second reference loss adjustment information according to the usage specification information and the application scenario information includes:

[0119] D1. Determine application scenario loss information based on application scenario information;

[0120] D2, obtain the influence of usage norms on application scenario information;

[0121] D3. Determine the loss impact factor according to the impact degree and the usage specification information;

[0122] D4. Use the loss impact factor to adjust the application scenario loss information to obtain the second reference loss adjustment information.

[0123] Among them, different application scenarios have different impacts on the loss of the power device to be tested, so the corresponding application scenario loss information can be determined according to the specific application scenario information.

[0124] Since the influence of the usage specification on the loss is different in different scenarios, the influence of the usage specification on the application scenario information can be determined according to the influence relationship between the usage specification corresponding to the application scenario.

[0125] The product of the impact degree and the usage specification information can be determined as the loss impact factor. Finally, the product of the loss impact factor and the application scenario loss information is determined as the second reference loss adjustment information.

[0126] In this example, the application scenario loss information is determined based on the application scenario, and the influence of the usage specification on the application scenario information is obtained. Then, the loss influence factor is determined based on the influence and the usage specification information. Finally, the application scenario loss information is adjusted using the loss influence factor to obtain the second reference loss adjustment information, thereby improving the accuracy of obtaining the second reference loss adjustment information.

[0127] For the above embodiments, please refer to Figure 2 , Figure 2 A schematic diagram of the structure of a terminal provided in an embodiment of the present application, as shown in the figure, includes a processor, an input device, an output device and a memory, the processor, the input device, the output device and the memory are interconnected, wherein the memory is used to store a computer program, the computer program includes program instructions, the processor is configured to call the program instructions, and the program includes instructions for executing the following steps;

[0128] Acquire test current information of the power device to be tested during aging test, and acquire use environment information and use time of the power device to be tested;

[0129] Determining a target temperature curve of the power device to be tested when testing the power device to be tested according to the current information and the property information of the power device to be tested;

[0130] Determining first aging information of the power device to be tested according to the target temperature curve;

[0131] determining second aging information according to the usage environment information and the usage duration;

[0132] The first aging information and the second aging information are fused to obtain target aging information of the power device to be tested.

[0133] The above mainly introduces the scheme of the embodiment of the present application from the perspective of the execution process on the method side. It is understandable that in order to realize the above functions, the terminal includes a hardware structure and / or software module corresponding to the execution of each function. Those skilled in the art should easily realize that, in combination with the units and algorithm steps of each example described in the embodiments provided herein, the present application can be implemented in the form of hardware or a combination of hardware and computer software. Whether a function is executed in the form of hardware or computer software driving hardware depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0134] The embodiment of the present application can divide the terminal into functional units according to the above method example. For example, each functional unit can be divided according to each function, or two or more functions can be integrated into one processing unit. The above integrated unit can be implemented in the form of hardware or in the form of software functional units. It should be noted that the division of units in the embodiment of the present application is schematic and is only a logical function division. There may be other division methods in actual implementation.

[0135] In line with the above, see Figure 3 , Figure 3 The present invention provides a schematic diagram of a power device aging test device. Figure 3 As shown, the device comprises:

[0136] An acquisition unit 301 is used to acquire test current information of a power device to be tested during an aging test, and to acquire use environment information and use duration of the power device to be tested;

[0137] A first determining unit 302, configured to determine a target temperature curve of the power device to be tested when testing the power device to be tested according to the current information and the property information of the power device to be tested;

[0138] A second determining unit 303, configured to determine first aging information of the power device to be tested according to the target temperature curve;

[0139] A third determining unit 304 is used to determine second aging information according to the usage environment information and the usage duration;

[0140] The fusion unit 305 is used to fuse the first aging information and the second aging information to obtain target aging information of the power device to be tested.

[0141] In a possible implementation, the first determining unit 302 is specifically configured to:

[0142] Extracting switch energy loss information and thermal resistance information of the power device to be tested from the property information of the power device to be tested;

[0143] Determining a reference temperature curve according to the current information, the switch energy loss information and the thermal resistance information of the power device to be tested;

[0144] Extracting temperature characteristic information from the property information of the power device to be tested;

[0145] The reference temperature curve is adjusted according to the temperature characteristic information to obtain the target temperature curve.

[0146] In a possible implementation, the third determining unit 304 is specifically configured to:

[0147] Determining inherent loss information of the power device to be tested according to the usage time;

[0148] Determining target loss adjustment information according to the usage environment information;

[0149] The inherent loss information is adjusted using the target loss adjustment information to obtain actual loss information;

[0150] The second aging information is determined according to the actual loss information.

[0151] In a possible implementation manner, in determining the target loss adjustment information according to the usage environment information, the third determining unit 304 is specifically configured to:

[0152] Extracting ambient temperature information, application scenario information and user usage parameters from the usage environment information;

[0153] Determine first reference loss adjustment information according to the ambient temperature information and preset ambient temperature information of the power device to be tested;

[0154] Determining usage standardization information according to the user usage parameters;

[0155] Determine second reference loss adjustment information according to the usage specification information and the application scenario information;

[0156] The first reference loss adjustment information and the second reference loss adjustment information are merged to obtain the target loss adjustment information.

[0157] In a possible implementation manner, in determining the second reference loss adjustment information according to the usage specification information and the application scenario information, the third determining unit 304 is specifically configured to:

[0158] Determine application scenario loss information according to the application scenario information;

[0159] Obtain the influence of usage norms on application scenario information;

[0160] Determining a loss impact factor based on the impact degree and usage specification information;

[0161] The loss impact factor is used to adjust the application scenario loss information to obtain the second reference loss adjustment information.

[0162] An embodiment of the present application also provides a computer storage medium, wherein the computer storage medium stores a computer program for electronic data exchange, and the computer program enables a computer to execute part or all of the steps of any one of the power device aging test methods recorded in the above method embodiments.

[0163] An embodiment of the present application also provides a computer program product, which includes a non-transitory computer-readable storage medium storing a computer program, and the computer program enables a computer to execute part or all of the steps of any power device aging test method recorded in the above method embodiments.

[0164] It should be noted that, for the aforementioned method embodiments, for the sake of simplicity, they are all expressed as a series of action combinations, but those skilled in the art should be aware that the present application is not limited by the described order of actions, because according to the present application, certain steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily required by the present application.

[0165] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0166] In the several embodiments provided in the present application, it should be understood that the disclosed device can be implemented in other ways. For example, the device embodiments described above are only schematic, such as the division of the units, which is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, and the indirect coupling or communication connection of the device or unit can be electrical or other forms.

[0167] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0168] In addition, the functional units in the various embodiments of the application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated units may be implemented in the form of hardware or in the form of software program modules.

[0169] If the integrated unit is implemented in the form of a software program module and sold or used as an independent product, it can be stored in a computer-readable memory. Based on this understanding, the technical solution of the present application is essentially or the part that contributes to the prior art or all or part of the technical solution can be embodied in the form of a software product, and the computer software product is stored in a memory, including a number of instructions to enable a computer device (which can be a personal computer, server or network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present application. The aforementioned memory includes: U disk, read-only memory (ROM), random access memory (RAM), mobile hard disk, disk or optical disk and other media that can store program codes.

[0170] A person of ordinary skill in the art can understand that all or part of the steps in the various methods of the above embodiments can be completed by instructing related hardware through a program, and the program can be stored in a computer-readable memory, which can include: a flash drive, a read-only memory, a random access memory, a magnetic disk or an optical disk, etc.

[0171] The embodiments of the present application are introduced in detail above. Specific examples are used in this article to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the method and core idea of ​​the present application. At the same time, for general technical personnel in this field, according to the idea of ​​the present application, there will be changes in the specific implementation method and application scope. In summary, the content of this specification should not be understood as a limitation on the present application.

Claims

1. A method for aging test of a power device, characterized in that: The method comprises: Acquire test current information of the power device to be tested during aging test, and acquire use environment information and use time of the power device to be tested; Determining a target temperature curve of the power device to be tested when testing the power device to be tested according to the current information and the property information of the power device to be tested; Determining first aging information of the power device to be tested according to the target temperature curve; determining second aging information according to the usage environment information and the usage duration; The first aging information and the second aging information are fused to obtain target aging information of the power device to be tested.

2. The aging test method for power devices according to claim 1, characterized in that: Determining a target temperature curve of the power device to be tested when testing the power device to be tested according to the current information and the property information of the power device to be tested includes: Extracting switch energy loss information and thermal resistance information of the power device to be tested from the property information of the power device to be tested; Determining a reference temperature curve according to the current information, the switch energy loss information and the thermal resistance information of the power device to be tested; Extracting temperature characteristic information from the property information of the power device to be tested; The reference temperature curve is adjusted according to the temperature characteristic information to obtain the target temperature curve.

3. The aging test method for power devices according to claim 1, characterized in that: The determining the second aging information according to the usage environment information and the usage duration includes: Determining inherent loss information of the power device to be tested according to the usage time; Determining target loss adjustment information according to the usage environment information; The inherent loss information is adjusted using the target loss adjustment information to obtain actual loss information; The second aging information is determined according to the actual loss information.

4. The aging test method for power devices according to claim 3, characterized in that: The determining the target loss adjustment information according to the usage environment information includes: Extracting ambient temperature information, application scenario information and user usage parameters from the usage environment information; Determine first reference loss adjustment information according to the ambient temperature information and preset ambient temperature information of the power device to be tested; Determining usage standardization information according to the user usage parameters; Determine second reference loss adjustment information according to the usage specification information and the application scenario information; The first reference loss adjustment information and the second reference loss adjustment information are merged to obtain the target loss adjustment information.

5. The aging test method for power devices according to claim 4, characterized in that: The determining the second reference loss adjustment information according to the usage specification information and the application scenario information includes: Determine application scenario loss information according to the application scenario information; Obtain the influence of usage norms on application scenario information; Determining a loss impact factor based on the impact degree and usage specification information; The loss impact factor is used to adjust the application scenario loss information to obtain the second reference loss adjustment information.

6. A power device aging test device, characterized in that: The device comprises: An acquisition unit, used to acquire test current information of a power device to be tested during an aging test, and to acquire use environment information and use duration of the power device to be tested; A first determining unit, configured to determine a target temperature curve of the power device to be tested when testing the power device to be tested according to the current information and the property information of the power device to be tested; A second determining unit, configured to determine first aging information of the power device to be tested according to the target temperature curve; A third determining unit, configured to determine second aging information according to the usage environment information and the usage duration; A fusion unit is used to fuse the first aging information and the second aging information to obtain target aging information of the power device to be tested.

7. The aging test device for power devices according to claim 6, characterized in that: The first determining unit is specifically configured to: Extracting switch energy loss information and thermal resistance information of the power device to be tested from the property information of the power device to be tested; Determining a reference temperature curve according to the current information, the switch energy loss information and the thermal resistance information of the power device to be tested; Extracting temperature characteristic information from the property information of the power device to be tested; The reference temperature curve is adjusted according to the temperature characteristic information to obtain the target temperature curve.

8. The aging test device for power devices according to claim 6, characterized in that: The third determining unit is specifically configured to: Determining inherent loss information of the power device to be tested according to the usage time; Determining target loss adjustment information according to the usage environment information; The inherent loss information is adjusted using the target loss adjustment information to obtain actual loss information; The second aging information is determined according to the actual loss information.

9. A terminal, characterized in that: The method comprises a processor, an input device, an output device and a memory, wherein the processor, the input device, the output device and the memory are interconnected, wherein the memory is used to store a computer program, the computer program comprises program instructions, and the processor is configured to call the program instructions to execute the method according to any one of claims 1 to 5.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, wherein the computer program includes program instructions, and when the program instructions are executed by a processor, the processor is caused to perform the method according to any one of claims 1 to 5.

Images