Special clamp for testing memory chip

Abstract

The utility model relates to the technical field of chip testing, in particular to a special clamp for testing a memory chip, which comprises a bottom cover and a top cover, the top of the bottom cover is provided with a detection groove, the inner wall of the detection groove is provided with two grooves, the inner walls of the grooves are connected with limiting frame plates in a sliding manner, one side of each limiting frame plate is fixedly connected with a connecting plate, and the other side of each limiting frame plate is connected with a clamping plate. A small motor is arranged on one side of the bottom cover, a two-way lead screw is fixedly installed on one side of the small motor through a coupler, and a connecting plate is in threaded connection with the surface of the two-way lead screw. Compared with the prior art, the memory chip detection device has the advantages that through cooperation of the bottom cover, the top cover, the detection groove, the groove, the limiting frame, the connecting plate, the small motor, the two-way lead screw, the pressing block, the adsorption head and the air suction channel, friction between a memory chip and the side wall can be reduced when the memory chip is taken out and put in, damage caused by collision and friction to the memory chip can be reduced, and the memory chip detection efficiency is improved. And meanwhile, the memory chip can be quickly taken out.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, in particular to a special fixture for memory chip testing. Background Art

[0002] A fixture is a device used to fix the object to be processed in the mechanical manufacturing process so that it occupies the correct position for construction or testing. It is also called a fixture. In a broad sense, any device used to quickly, conveniently and safely install the workpiece in any process can be called a fixture. During the memory chip testing process, a fixture is used to fix the memory chip. The existing fixtures generally fix the memory chip after placing it in a groove, which is troublesome during placement and is easy to bump or scratch the chip. Utility Model Content

[0003] The purpose of the present invention is to solve at least one of the above technical deficiencies.

[0004] Therefore, one purpose of the present invention is to provide a special fixture for memory chip testing to solve the problems mentioned in the background technology and overcome the shortcomings of the prior art.

[0005] In order to achieve the above-mentioned purpose, an embodiment of one aspect of the utility model provides a special fixture for testing memory chips, including a bottom cover and a top cover, the top of the bottom cover is provided with a detection groove, the inner wall of the detection groove is provided with two grooves, the inner wall of the groove is slidably connected to a limit frame, one side of the limit frame is fixedly connected to a connecting plate, a small motor is arranged on one side of the bottom cover, a bidirectional screw rod is fixedly installed on one side of the small motor through a coupling, the surface of the bidirectional screw rod is threadedly connected to a connecting plate, a pressure block is fixedly installed on the bottom of the top cover, an adsorption head is fixedly installed on one side of the pressure block, an air suction channel is provided inside the top cover, and an upper The technical effect achieved by the above scheme is: the memory chip is placed into the detection groove, and then the small motor drives the limit frame to move to clamp and fix the memory chip, and then the top cover is lowered so that the pressure block is pressed on the memory chip for subsequent detection. When the detection operation is completed, the small motor drives the bidirectional screw to rotate, thereby moving the limit frame, so that the two sides of the limit frame are separated from the memory chip, and then the suction channel forms a negative pressure so that the adsorption head adsorbs the memory chip and takes it out, which can reduce the friction between the memory chip and the side wall, thereby reducing the damage to the memory chip caused by collision and friction, and at the same time, the memory chip can be quickly taken out.

[0006] Preferably, any of the above schemes is that the shape of the limit frame is U-shaped, the inner wall of the detection groove is provided with an avoidance groove, the number of the limit frames is two, and the two limit frames are symmetrically distributed inside the detection groove. The technical effect achieved by adopting the above scheme is: the memory chip can be clamped and fixed by the limit frame, and the side wall of the limit frame can be separated from the memory chip by the movement of the limit frame, thereby reducing the friction on both sides, and the friction of the memory chip on both sides can be reduced by the avoidance groove.

[0007] Preferably, any of the above schemes is provided with a limiting groove inside the bottom cover, and the height of the limiting groove is the same as the height of the connecting plate. The technical effect achieved by adopting the above scheme is that the movement of the connecting plate can be guided by the limiting groove, so that the limiting frame can move more stably to clamp and fix the memory chip.

[0008] Preferably, any of the above schemes is that the small motor is fixedly mounted on one side of the bottom cover, a vertical plate is fixedly mounted on one side of the bottom cover, and a bidirectional screw rod is rotatably connected to one side of the vertical plate. The technical effect achieved by adopting the above scheme is that one end of the bidirectional screw rod can be positioned by the vertical plate, so that the bidirectional screw rod can rotate stably.

[0009] Preferably, any of the above schemes is that the air intake channel includes an air intake branch pipe, the air intake branch pipe is located inside the bottom cover, one end of the air intake branch pipe passes through the bottom of the adsorption head, one end of the air intake branch pipe is connected to the air intake main pipe, and the number of the air intake branch pipes and the adsorption heads are both four. The technical effect achieved by adopting the above scheme is: one end of the air intake main pipe is connected to the exhaust structure, and then the adsorption branch pipe cooperates with the adsorption head to adsorb the memory chip, so that the memory chip can be taken out when the top cover rises.

[0010] Preferably, any of the above schemes is that the top of the bottom cover is fixedly connected to a guide frame, the surface of the guide frame is slidably connected to a top cover, and adsorption plates are fixedly installed on the bottom of the guide frame and the top of the top cover. The technical effect achieved by adopting the above scheme is that the top cover and the bottom cover can be adsorbed and fixed by the adsorption plate, thereby facilitating the placement and removal of memory chips.

[0011] Preferably, any of the above schemes is that a telescopic guide plate is fixedly installed inside the bottom cover, and a top cover is fixedly installed on one end of the telescopic guide plate. The technical effect achieved by adopting the above scheme is that the connection between the bottom cover and the top cover can be made more stable by the telescopic guide plate.

[0012] Compared with the prior art, the advantages and beneficial effects of the utility model are:

[0013] This special fixture for testing memory chips can reduce the friction between the memory chip and the side wall when the memory chip is taken out and put in, thereby reducing the damage to the memory chip caused by collision and friction, and can quickly take out the memory chip through the cooperation between the bottom cover, the top cover, the detection slot, the groove, the limit frame, the connecting plate, the small motor, the bidirectional screw rod, the pressure block, the adsorption head and the suction channel. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 This is a schematic diagram of the structure of the first perspective of the embodiment of the utility model;

[0015] Figure 2 This is the first embodiment of the utility model Figure 1 A schematic diagram of the structure at A;

[0016] Figure 3 This is a schematic diagram of the structure of the first embodiment of the utility model from a second viewing angle;

[0017] Figure 4 This is the first embodiment of the utility model Figure 3 Schematic diagram of the structure at B;

[0018] Figure 5 This is a schematic diagram of the structure of the first embodiment of the utility model from a third viewing angle;

[0019] Figure 6 This is a schematic diagram of the structure of the first embodiment of the utility model from a fourth viewing angle;

[0020] Figure 7 This is the first embodiment of the utility model Figure 6 Schematic diagram of the structure at C.

[0021] Among them: 1-bottom cover, 2-top cover, 3-detection slot, 4-groove, 5-limiting frame, 6-connecting plate, 7-small motor, 8-bidirectional screw, 9-pressure block, 10-adsorption head, 11-suction channel, 1101-suction branch pipe, 1102-suction main pipe, 12-avoidance groove, 13-limiting slide groove, 14-vertical plate, 15-guide frame, 16-adsorption plate, 17-telescopic guide plate. DETAILED DESCRIPTION

[0022] The present invention is further described below in conjunction with the accompanying drawings, but the protection scope of the present invention is not limited to the following description.

[0023] Embodiment 1: Figures 1 to 7As shown, a special fixture for testing memory chips includes a bottom cover 1 and a top cover 2. A detection groove 3 is provided on the top of the bottom cover 1. Two grooves 4 are provided on the inner wall of the detection groove 3. A limit plate 5 is slidably connected to the inner wall of the groove 4. A connecting plate 6 is fixedly connected to one side of the limit plate 5. A small motor 7 is provided on one side of the bottom cover 1. A bidirectional screw rod 8 is fixedly installed on one side of the small motor 7 through a coupling. The connecting plate 6 is threadedly connected to the surface of the bidirectional screw rod 8. A pressure block 9 is fixedly installed on the bottom of the top cover 2. A suction head 10 is fixedly installed on one side of the pressure block 9. An air suction channel 11 is provided inside the top cover 2. The memory chip is placed into The inside of the detection slot 3 is then driven by the small motor 7 to move the limit frame 5 to clamp and fix the memory chip, and then the top cover 2 is lowered so that the pressure block 9 is pressed on the memory chip for subsequent detection. When the detection operation is completed, the small motor 7 drives the bidirectional screw 8 to rotate, thereby moving the limit frame 5, so that the two sides of the limit frame 5 are separated from the memory chip, and then the suction channel 11 forms a negative pressure so that the adsorption head 10 adsorbs the memory chip and takes it out, which can reduce the friction between the memory chip and the side wall, thereby reducing the damage to the memory chip caused by collision and friction, and at the same time can quickly take out the memory chip.

[0024] As an optional technical solution of the present utility model, the shape of the limit frame 5 is U-shaped, the inner wall of the detection groove 3 is provided with an avoidance groove 12, the number of the limit frames 5 is two, and the two limit frames 5 are symmetrically distributed inside the detection groove 3. The memory chip can be clamped and fixed by the limit frame 5, and the side wall of the limit frame 5 can be separated from the memory chip by moving the limit frame 5, thereby reducing the friction on both sides. At the same time, the avoidance groove 12 can reduce the friction of the memory chip on both sides.

[0025] As an optional technical solution of the present invention, a limiting slide groove 13 is opened inside the bottom cover 1, and the height of the limiting slide groove 13 is the same as the height of the connecting plate 6. The limiting slide groove 13 can guide the movement of the connecting plate 6, so that the limiting frame 5 can move more stably to clamp and fix the memory chip.

[0026] As an optional technical solution of the present utility model, the small motor 7 is fixedly installed on one side of the bottom cover 1, and a vertical plate 14 is fixedly installed on one side of the bottom cover 1. One side of the vertical plate 14 is rotatably connected to a bidirectional screw rod 8. One end of the bidirectional screw rod 8 can be positioned through the vertical plate 14, so that the bidirectional screw rod 8 can rotate stably.

[0027] As an optional technical solution of the utility model, the air intake channel 11 includes an air intake branch pipe 1101, which is located inside the bottom cover 1, and one end of the air intake branch pipe 1101 passes through the bottom of the adsorption head 10, and one end of the air intake branch pipe 1101 is connected to the air intake main pipe 1102. There are four air intake branch pipes 1101 and four adsorption heads 10, which are connected to the exhaust structure through one end of the air intake main pipe 1102, and then the adsorption branch pipe 1101 cooperates with the adsorption head 10 to adsorb the memory chip, so that the memory chip can be taken out when the top cover 2 rises.

[0028] As an optional technical solution of the present invention, the top of the bottom cover 1 is fixedly connected to a guide frame 15, the surface of the guide frame 15 is slidably connected to the top cover 2, and the bottom of the guide frame 15 and the top of the top cover 2 are fixedly installed with an adsorption plate 16, through which the top cover 2 and the bottom cover 1 can be adsorbed and fixed, thereby facilitating the placement and removal of memory chips.

[0029] As an optional technical solution of the present invention, a telescopic guide plate 17 is fixedly installed inside the bottom cover 1, and a top cover 2 is fixedly installed on one end of the telescopic guide plate 17. The telescopic guide plate 17 can make the connection between the bottom cover 1 and the top cover 2 more stable.

[0030] A special fixture for testing memory chips has the following working principle: a memory chip is placed into a testing slot 3, and then a small motor 7 is operated to drive a limit frame 5 to move and clamp the memory chip, and then a top cover 2 is lowered so that a pressure block 9 is pressed on the memory chip for subsequent testing. When the testing operation is completed, the small motor 7 is operated to drive a bidirectional screw rod 8 to rotate, thereby moving the limit frame 5, so that the two sides of the limit frame 5 are separated from the memory chip, and then a suction channel 11 forms a negative pressure so that an adsorption head 10 adsorbs the memory chip and takes it out, which can reduce the friction between the memory chip and the side wall, thereby reducing the damage to the memory chip caused by collision and friction, and can quickly take out the memory chip.

[0031] To sum up, the special fixture for memory chip testing, through the cooperation between the bottom cover 1, the top cover 2, the detection slot 3, the groove 4, the limit frame 5, the connecting plate 6, the small motor 7, the bidirectional screw 8, the pressure block 9, the adsorption head 10 and the suction channel 11, can reduce the friction between the memory chip and the side wall when the memory chip is taken out and put in, thereby reducing the damage to the memory chip caused by collision and friction, and at the same time can quickly take out the memory chip.

[0032] Embodiment 2 is a special fixture for testing memory chips. Based on the above embodiment, a protective cover is fixedly installed on one end of the adsorption head 10 in this embodiment, so that the collision with the memory chip can be reduced during adsorption.

Claims

1. A special fixture for testing memory chips, comprising a bottom cover (1) and a top cover (2), characterized in that: The top of the bottom cover (1) is provided with a detection groove (3), the inner wall of the detection groove (3) is provided with two grooves (4), the inner wall of the groove (4) is slidably connected to a limit frame (5), one side of the limit frame (5) is fixedly connected to a connecting plate (6), a small motor (7) is arranged on one side of the bottom cover (1), a bidirectional screw rod (8) is fixedly installed on one side of the small motor (7) through a coupling, the surface of the bidirectional screw rod (8) is threadedly connected to the connecting plate (6), a pressure block (9) is fixedly installed on the bottom of the top cover (2), an adsorption head (10) is fixedly installed on one side of the pressure block (9), and an air suction channel (11) is provided inside the top cover (2).

2. The special fixture for memory chip testing according to claim 1, characterized in that: The shape of the limiting frame (5) is U-shaped, the inner wall of the detection groove (3) is provided with an avoidance groove (12), the number of the limiting frames (5) is two, and the two limiting frames (5) are symmetrically distributed inside the detection groove (3).

3. The special fixture for memory chip testing according to claim 2, characterized in that: A limiting sliding groove (13) is provided inside the bottom cover (1), and the height of the limiting sliding groove (13) is the same as the height of the connecting plate (6).

4. The special fixture for memory chip testing according to claim 3, characterized in that: The small motor (7) is fixedly mounted on one side of the bottom cover (1), a vertical plate (14) is fixedly mounted on one side of the bottom cover (1), and a bidirectional screw rod (8) is rotatably connected to one side of the vertical plate (14).

5. The special fixture for memory chip testing according to claim 4, characterized in that: The air intake channel (11) comprises an air intake branch pipe (1101), wherein the air intake branch pipe (1101) is located inside the bottom cover (1), one end of the air intake branch pipe (1101) passes through the bottom of the adsorption head (10), and one end of the air intake branch pipe (1101) is connected to an air intake main pipe (1102), and the number of the air intake branch pipes (1101) and the number of the adsorption heads (10) are both four.

6. The special fixture for memory chip testing according to claim 5, characterized in that: The top of the bottom cover (1) is fixedly connected to a guide frame (15), the surface of the guide frame (15) is slidably connected to a top cover (2), and adsorption plates (16) are fixedly mounted on the bottom of the guide frame (15) and the top of the top cover (2).

7. The special fixture for memory chip testing according to claim 6, characterized in that: A telescopic guide plate (17) is fixedly mounted inside the bottom cover (1), and a top cover (2) is fixedly mounted on one end of the telescopic guide plate (17).

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