Curved glass profile tolerance measuring jig

Abstract

The utility model provides a curved glass profile tolerance measuring jig which comprises a supporting seat provided with a standard supporting curved surface, and the standard supporting curved surface can be completely attached to a standard glass plate; the plurality of dial indicators are adjacent to the standard supporting curved surface, and probes of the plurality of dial indicators face the standard supporting curved surface so as to detect whether the glass plate to be measured is attached to the standard supporting curved surface or not. According to the technical scheme, the plurality of dial indicators are arranged near the standard supporting curved surface for the irregular bending shape of the glass plate to be measured, so that the shape contour of each position can be measured more comprehensively, a single dial indicator does not need to be moved for measurement at a plurality of positions, the detection efficiency is improved, and the measurement accuracy is ensured.

Description

Technical Field

[0001] The present disclosure relates to the technical field of glass detection, and in particular to a curved glass profile measurement tool. Background Art

[0002] During the hot bending process of 3D curved glass, the glass surface will deform as a whole due to heat, and the glass plane and four corners will warp due to uneven force. During the hot bending process, the warping and flatness of the product plane cannot be effectively monitored, resulting in batch defects, inability to rework, product scrapping, and increased costs. Therefore, it is necessary to test the curved glass after hot bending to determine whether its shape meets the standard.

[0003] CN212363021U discloses a warpage measuring jig for a large-sized glass cover plate, but it is mainly used to measure the warpage of a flat glass plate, has no structure for supporting a curved glass plate, and is only provided with a dial indicator, which cannot more comprehensively measure whether the shape of each position of the curved glass plate meets the standard. Utility Model Content

[0004] A technical problem to be solved by the present disclosure is: how to comprehensively measure whether the shape of a curved glass plate meets the standards.

[0005] In order to solve the above technical problems, the present disclosure provides a curved glass profile measurement tool, which includes:

[0006] A support base, wherein the support base is provided with a standard support curved surface, and the standard support curved surface can be completely fitted with a standard glass plate; and

[0007] A plurality of micrometers are provided, wherein the plurality of micrometers are adjacent to the standard supporting curved surface, and the probes of the plurality of micrometers are all directed toward the standard supporting curved surface, so as to detect whether the glass plate to be measured is in contact with the standard supporting curved surface.

[0008] In some embodiments, the standard support curved surface includes a top support surface, two side support surfaces located at both ends of the top support surface in the longitudinal direction, and an arc-shaped support surface located between the top support surface and the side support surfaces.

[0009] In some embodiments, a limiting member capable of moving relative to the support seat is further included, and the limiting member can be pressed against the top support surface.

[0010] In some embodiments, two stoppers are provided at intervals along the longitudinal direction, and the micrometer includes a first micrometer provided between the two stoppers, and a probe of the first micrometer is vertically directed toward the top supporting surface.

[0011] In some embodiments, the micrometer includes a second micrometer disposed between the two stoppers, and a probe of the second micrometer is directed toward an edge of the top supporting surface along a lateral direction.

[0012] In some embodiments, the micrometer includes a third micrometer, and a probe of the third micrometer is oriented toward an edge of the arc-shaped supporting surface along a lateral direction.

[0013] In some embodiments, the micrometer includes a fourth micrometer, and the probe of the fourth micrometer is perpendicular to the side support surface.

[0014] In some embodiments, a support plate is also included, and the support seat, the micrometer and the limit member are arranged on the support plate.

[0015] In some embodiments, a support frame is further included, and the support plate is disposed on the support frame.

[0016] In some embodiments, it also includes a buckle arranged on the support frame, and the support plate is detachably buckled on the buckle.

[0017] Through the above technical solution, multiple micrometers are set near the standard supporting surface for the irregular curved shape of the glass plate to be measured, so that the shape contour of each position can be measured more comprehensively. There is no need to move a single micrometer to measure at multiple positions, which improves the detection efficiency and ensures the accuracy of the measurement. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the embodiments of the present disclosure or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present disclosure. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0019] Figure 1 is a schematic structural diagram of a curved glass profile measuring jig disclosed in an embodiment of the present disclosure;

[0020] Figure 2 It is a top view of the curved glass profile measuring fixture disclosed in an embodiment of the present disclosure.

[0021] Description of reference numerals:

[0022] 1. Support seat; 2. Top support surface; 3. Arc support surface; 4. Side support surface; 5. Limiting piece; 6. First micrometer; 7. Second micrometer; 8. Third micrometer; 9. Fourth micrometer; 10. Support plate; 11. Support frame; 12. Buckle. DETAILED DESCRIPTION

[0023] The following is a further detailed description of the embodiments of the present disclosure in conjunction with the accompanying drawings and examples. The detailed description of the following embodiments and the accompanying drawings are used to exemplarily illustrate the principles of the present disclosure, but cannot be used to limit the scope of the present disclosure. The present disclosure can be implemented in many different forms and is not limited to the specific embodiments disclosed herein, but includes all technical solutions that fall within the scope of the claims.

[0024] The present disclosure provides these embodiments to make the present disclosure thorough and complete, and to fully express the scope of the present disclosure to those skilled in the art. It should be noted that unless otherwise specifically stated, the relative arrangement of the parts and steps, the composition of the materials, the numerical expressions and the numerical values ​​set forth in these embodiments should be interpreted as being merely exemplary, and not as limiting.

[0025] It should be noted that, in the description of the present disclosure, unless otherwise specified, the meaning of "multiple" is greater than or equal to two; the terms "upper", "lower", "left", "right", "inner", "outer", etc., indicating the orientation or positional relationship, are only for the convenience of describing the present disclosure and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation of the present disclosure. When the absolute position of the object being described changes, the relative positional relationship may also change accordingly.

[0026] In addition, the words "first", "second" and similar words used in the present disclosure do not indicate any order, quantity or importance, but are only used to distinguish different parts. "Vertical" does not mean vertical in the strict sense, but is within the tolerance range. "Parallel" does not mean parallel in the strict sense, but is within the tolerance range. "Include" or "comprising" and similar words mean that the elements before the word include the elements listed after the word, and do not exclude the possibility of including other elements.

[0027] It should also be noted that in the description of the present disclosure, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be directly connected or indirectly connected through an intermediate medium. For ordinary technicians in this field, the specific meanings of the above terms in the present disclosure can be understood according to the specific circumstances. When a specific device is described as being located between a first device and a second device, there may or may not be an intermediate device between the specific device and the first device or the second device.

[0028] All terms used in the present disclosure have the same meanings as those understood by those of ordinary skill in the art to which the present disclosure belongs, unless otherwise specifically defined. It should also be understood that terms defined in general dictionaries, for example, should be interpreted as having meanings consistent with their meanings in the context of the relevant technology, and should not be interpreted in an idealized or extremely formal sense, unless explicitly defined as such herein.

[0029] Technologies, methods, and equipment known to ordinary technicians in the relevant art may not be discussed in detail, but where appropriate, the technologies, methods, and equipment should be considered part of the specification.

[0030] refer to Figure 1 and Figure 2 As shown, this solution provides a curved glass profile measurement fixture, which includes:

[0031] A support base 1, wherein the support base 1 is provided with a standard support curved surface, and the standard support curved surface can be completely fitted with a standard glass plate; and

[0032] A plurality of micrometers are provided, wherein the plurality of micrometers are adjacent to the standard supporting curved surface, and the probes of the plurality of micrometers are all directed toward the standard supporting curved surface, so as to detect whether the glass plate to be measured is in contact with the standard supporting curved surface.

[0033] The support seat 1 is used to support the glass plate to be measured, and a standard supporting curved surface is arranged on it. The standard supporting curved surface matches the shape of the standard glass plate. Therefore, when the standard glass plate is placed on the standard supporting curved surface, the two can fit completely. Of course, when the shape of the glass plate to be measured is different from that of the standard glass plate, it will not be able to fit completely on the standard supporting curved surface.

[0034] Multiple micrometers are kept at a suitable distance from the standard support surface, and their probes are facing the standard support surface. When the glass plate is placed on the standard support surface, the glass plate can touch the probe of the micrometer to change the reading of the micrometer. Therefore, the standard glass plate can be placed on the standard support surface first, and a set of readings of multiple micrometers can be read and recorded as standard readings. When measuring the glass plate to be measured, the measured readings can be compared with the standard readings. When the difference between the two is within the appropriate error range, it indicates that the shape of the glass plate to be measured meets the standard. If the difference between the two exceeds the error range, it indicates that the shape of the glass plate to be measured does not meet the standard, and the readings at different positions can reflect which position of the glass plate has a problem with the shape. Of course, when measuring the standard glass plate, each micrometer can be reset to zero to facilitate subsequent readings.

[0035] In this solution, multiple micrometers are set near the standard supporting surface for the irregular curved shape of the glass plate to be measured, so that the shape contour of each position can be measured more comprehensively. There is no need to move a single micrometer to measure at multiple positions, which improves the detection efficiency and ensures the accuracy of the measurement.

[0036] In some embodiments, the standard support curved surface includes a top support surface 2, two side support surfaces 4 located at both ends of the top support surface 2 along the longitudinal direction, and an arc-shaped support surface 3 located between the top support surface 2 and the side support surface 4. Figure 1 As shown, the top support surface 2 is roughly rectangular, and its two ends in the longitudinal direction are connected with arc-shaped support surfaces 3, and the arc-shaped support surface 3 is connected with the side support surface 4. The side support surface 4 can be roughly perpendicular to the top support surface 2, and the arc-shaped support surface 3 is the transition between the side support surface 4 and the top support surface 2. In addition, the top support surface 2 and the side support surface 4 can be substantially flat planes.

[0037] In addition, in some embodiments, the curved glass profile measurement jig further includes a stopper 5 that can move relative to the support seat 1, and the stopper 5 can be pressed against the top support surface 2. The stopper 5 can move relative to the support seat 1, for example, move away from the top support surface 2 to allow the glass plate to be measured to be set on the standard support curved surface, and can be moved to the top support surface 2 to press the glass plate to be measured. The stopper 5 can fix the glass plate to be measured on the top support surface 2 to prevent it from moving, and can use the fixed position as a reference point to detect whether the glass plate fits the standard support curved surface at other positions. Figure 1 and Figure 2 As shown, four limiting members 5 are provided on the top supporting surface 2 .

[0038] In addition, in some embodiments, the curved glass profile measuring jig includes two stoppers 5 spaced apart in the longitudinal direction, and the micrometer includes a first micrometer 6 disposed between the two stoppers 5, and the probe of the first micrometer 6 is perpendicularly directed toward the top support surface 2. The two stoppers 5 can press the glass plate against the top support surface 2, and the first micrometer 6 is used to detect whether the glass plate between the stoppers 5 is in contact with the top support surface 2.

[0039] In addition, in some embodiments, the micrometer includes a second micrometer 7 disposed between the two stoppers 5, and the probe of the second micrometer 7 is oriented in the lateral direction toward the edge of the top support surface 2. When the glass plate can be closely attached to the top support surface 2, the probe of the second micrometer 7 can contact the edge of the glass plate, causing its reading to change. When there is a gap between the glass plate and the top support surface 2, the probe of the second micrometer 7 cannot contact the edge of the glass plate, and its reading does not change. Therefore, it can be judged whether the glass plate between the two stoppers 5 is attached to the top support surface 2 according to the reading of the second micrometer 7.

[0040] In addition, in some embodiments, the micrometer includes a third micrometer 8, and the probe of the third micrometer 8 is oriented toward the edge of the arc-shaped support surface 3 in the lateral direction. Similar to the measurement method of the second micrometer 7, when the arc-shaped portion of the glass plate is completely in contact with the arc-shaped support surface 3, the third micrometer 8 can contact the edge of the arc-shaped portion of the glass plate, causing its reading to change. If there is a gap between the arc-shaped portion of the glass plate and the arc-shaped support surface 3, the third micrometer 8 cannot contact the edge of the arc-shaped portion of the glass plate, and its reading will not change. Therefore, it can be judged whether the glass plate is completely in contact with the arc-shaped support surface 3 based on the reading of the third micrometer 8. Figure 1 As shown, corresponding to the arc-shaped support surface 3, a plurality of third micrometer gauges 8 are arranged at intervals along its circumferential direction to improve the measurement accuracy and comprehensiveness.

[0041] In addition, in some embodiments, the micrometer includes a fourth micrometer 9, and the probe of the fourth micrometer 9 is perpendicular to the side support surface 4. The measurement method of the fourth micrometer 9 is similar to that of the first micrometer 6. When there are different spacings between the glass plate and the side support surface 4, the reading of the fourth micrometer 9 changes, thereby determining whether the glass plate is in contact with the side support surface 4. A plurality of fourth micrometers 9 spaced apart from each other may also be provided at the side support surface 4.

[0042] In addition, in some embodiments, the curved glass profile measuring jig further includes a support plate 10, and the support seat 1, the micrometer and the stopper 5 are arranged on the support plate 10. The support plate 10 provides a support basis for the support seat 1, each micrometer and the stopper 5, wherein the micrometer can be arranged on the support plate 10 through a support arm.

[0043] In addition, in some embodiments, the curved glass profile measurement jig further includes a support frame 11, and the support plate 10 is disposed on the support frame 11. The support frame 11 has a certain height, and when the support base (such as a desktop, the ground, etc.) on which the support frame 11 is located is a non-flat structure, some pads may be disposed at the bottom of the support frame 11 to ensure that the support plate 10 is in a horizontal state.

[0044] In addition, in some embodiments, the curved glass profile measuring jig further includes a buckle 12 disposed on the support frame 11, and the support plate 10 is detachably buckled on the buckle 12. The buckle 12 can detachably set the support plate 10 on the support frame 11.

[0045] So far, various embodiments of the present disclosure have been described in detail. In order to avoid obscuring the concept of the present disclosure, some details known in the art are not described. Based on the above description, those skilled in the art can fully understand how to implement the technical solution disclosed here.

[0046] Although some specific embodiments of the present disclosure have been described in detail by way of examples, it should be understood by those skilled in the art that the above examples are for illustration only and are not intended to limit the scope of the present disclosure. It should be understood by those skilled in the art that the above embodiments may be modified or some technical features may be replaced by equivalents without departing from the scope and spirit of the present disclosure. In particular, the various technical features mentioned in the various embodiments may be combined in any manner as long as there is no structural conflict.

Claims

1. A curved glass profile measuring jig, characterized in that: include: A support base (1), wherein the support base (1) is provided with a standard support curved surface, and the standard support curved surface can be completely fitted with a standard glass plate; as well as A plurality of micrometers are provided, wherein the micrometers are adjacent to the standard supporting curved surface, and probes of the micrometers are all directed toward the standard supporting curved surface, so as to detect whether the glass plate to be measured is in contact with the standard supporting curved surface.

2. The curved glass profile measuring jig according to claim 1, characterized in that: The standard support curved surface comprises a top support surface (2), two side support surfaces (4) located at both ends of the top support surface (2) in the longitudinal direction, and an arc-shaped support surface (3) located between the top support surface (2) and the side support surfaces (4).

3. The curved glass profile measuring jig according to claim 2, characterized in that: It also comprises a limiting member (5) which can move relative to the supporting seat (1), and the limiting member (5) can be pressed tightly against the top supporting surface (2).

4. The curved glass profile measuring jig according to claim 3, characterized in that: It comprises two stoppers (5) arranged at intervals along the longitudinal direction, and the micrometer comprises a first micrometer (6) arranged between the two stoppers (5), wherein the probe of the first micrometer (6) is perpendicularly directed toward the top supporting surface (2).

5. The curved glass profile measuring jig according to claim 4, characterized in that: The micrometer comprises a second micrometer (7) arranged between the two stoppers (5), and a probe of the second micrometer (7) is directed toward the edge of the top support surface (2) in a transverse direction.

6. The curved glass profile measuring jig according to claim 3, characterized in that: The micrometer comprises a third micrometer (8), the probe of the third micrometer (8) being directed toward the edge of the arc-shaped supporting surface (3) in the transverse direction.

7. The curved glass profile measuring jig according to claim 3, characterized in that: The micrometer comprises a fourth micrometer (9), the probe of the fourth micrometer (9) being perpendicularly oriented toward the side supporting surface (4).

8. The curved glass profile measuring jig according to claim 3, characterized in that: It also comprises a support plate (10), on which the support seat (1), the micrometer and the limiter (5) are arranged.

9. The curved glass profile measuring jig according to claim 8, characterized in that: It also comprises a support frame (11), and the support plate (10) is arranged on the support frame (11).

10. The curved glass profile measuring jig according to claim 9, characterized in that: It also comprises a buckle (12) arranged on the support frame (11), and the support plate (10) is detachably buckled on the buckle (12).

Images