Aging test board of intelligent display module
By designing an aging test board for intelligent display modules integrating the master chip and multiple ZIF connectors, the existing problems of long test time and low efficiency are solved, and the efficiency and cost reduction of simultaneous testing of multiple modules is achieved.
Patent Information
- Application Number
- CN202420927948.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-04-29
- Publication Date
- 2025-03-18
- Estimated Expiration
- 2034-04-29
Smart Images
Figure CN222636237U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of intelligent display module detection, in particular to an aging test board for the intelligent display module. Background Art
[0002] With the improvement of living standards, smart wearable devices such as bracelets or watches are becoming more and more common. PMOLED is widely used in entry-level wearable products such as bracelets due to its excellent contrast, ultra-wide viewing angle range, and high cost performance. PMOLED products adopt a common cathode design and passive drive. The module needs to undergo an aging test to screen out defective products such as cross-linking or anode- cathode short circuits to ensure the shipment quality. The aging time is usually 6 to 8 hours, which is relatively long. Therefore, this design scheme provides an aging test board for a smart display module, which can improve production efficiency and reduce testing costs. Utility Model Content
[0003] The purpose of the utility model is to overcome the shortcomings of the prior art and provide an aging test board for an intelligent display module.
[0004] The purpose of this utility model is achieved through the following technical solutions:
[0005] An aging test board for an intelligent display module comprises: a test board, an FPC and a display module; a main control chip is arranged on the right side of the front of the test board, a power socket is arranged on the top of the right side of the front of the test board, a group of buttons is arranged on the bottom of the right side of the front of the test board, a crystal oscillator is arranged on the right side of the front of the test board, and ZIF connectors are arranged on the top and bottom of the left side of the front of the test board at equal distances in the horizontal direction; the ZIF connector is connected to the FPC, and the FPC is connected to the display module.
[0006] In one of the embodiments, the main control chip is arranged at a position near the right side of the center of the front side of the test board, and the main control chip is electrically connected to the button, the ZIF connector, and the crystal oscillator.
[0007] In one of the embodiments, the button is arranged at the bottom of the right side of the front side of the test board, and the button is divided into two functions, namely reset and screen switching.
[0008] In one embodiment, there are a total of 0 ZIF connectors on the right side of the front side of the test board, arranged in two rows, and the two rows of ZIF connectors are mirror-imaged with the center of the test board as the center.
[0009] In one embodiment, the test board is a PCB board, and the front side of the test board is in a rectangular shape.
[0010] In one of the embodiments, a plurality of boost capacitors are disposed on the test board, and the boost capacitors are disposed around each of the ZIF connectors.
[0011] In one of the embodiments, the gold fingers of the display module are movably connected to the gold fingers of the FPC.
[0012] In one of the embodiments, the power socket is electrically connected to the test board.
[0013] In one embodiment, the ZIF connector and the main control chip are communicatively connected via PCB traces.
[0014] In one embodiment, a plurality of electronic components for heat dissipation are disposed on the left side of the back of the test board.
[0015] Compared with the prior art, the utility model has at least the following advantages:
[0016] The aging test board of the intelligent display module of the utility model can test multiple display modules at the same time by arranging a main control chip, a power socket, a button and a crystal oscillator on the test board, and cooperating with 10 ZIF connectors. Therefore, one main control chip can drive and light up 10 display modules at the same time, thereby reducing the cost of producing the test board and improving the test efficiency at the same time. BRIEF DESCRIPTION OF THE DRAWINGS
[0017] In order to more clearly illustrate the technical solutions of the embodiments of the utility model, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the utility model and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without paying creative work.
[0018] Figure 1 The figure is a schematic diagram of the overall structure of the front side of the aging test board of the intelligent display module of the utility model.
[0019] In the figure: 1. Test board; 11. Main control chip; 12. Power socket; 13. Button; 14. Crystal oscillator; 15. ZIF connector; 2. FPC; 3. Display module. DETAILED DESCRIPTION
[0020] In order to facilitate the understanding of the present invention, the present invention will be described more comprehensively with reference to the relevant drawings. The drawings provide preferred embodiments of the present invention. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present invention more thoroughly and comprehensively understood.
[0021] In the description of the present application, it should be understood that the terms "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.
[0022] Unless otherwise clearly stipulated and limited, terms such as "installed", "connected", "connected", "fixed", etc. should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integrated connection; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium; it can be the internal connection of two elements or the interaction relationship between two elements.
[0023] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art in the technical field of the present invention. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more related listed items.
[0024] like Figure 1 As shown, an aging test board for an intelligent display module includes: a test board 1, an FPC2 and a display module 3; a main control chip 11 is arranged on the right side of the front of the test board 1, a power socket 12 is arranged on the top of the right side of the front of the test board 1, a group of buttons 13 is arranged on the bottom of the right side of the front of the test board 1, a crystal oscillator 14 is arranged on the right side of the front of the test board 1, and ZIF connectors 15 are arranged at equal distances horizontally on the top and bottom of the left side of the front of the test board 1; the ZIF connector 15 is connected to the FPC2, and the FPC2 is connected to the display module 3.
[0025] like Figure 1As shown, in one embodiment, the main control chip 11 is arranged at a position near the right side of the front center of the test board 1, and the main control chip 11 is electrically connected to the button 13, the ZIF connector 15, and the crystal oscillator 14. The ZIF connector 15 and the main control chip 11 are communicated and connected through PCB traces. It should be noted that the 10 ZIF connectors 15 are all communicated and connected with the main control chip 11, and the button 13 can control the ZIF connector 15 through the main control chip 11 to achieve the purpose of testing 10 display modules 3 at the same time.
[0026] like Figure 1 As shown, in one embodiment, the button 13 is arranged at the bottom of the right side of the front of the test board 1, and the button 13 is divided into two functions, namely, reset and screen switching. It should be noted that the button 13 is connected to the main control chip 11 through a PCB circuit to realize reset and screen switching capabilities.
[0027] like Figure 1 As shown, in one embodiment, there are a total of 10 ZIF connectors 15 on the right side of the front of the test board 1, arranged in two rows of 5 each, and the two rows of 5 ZIF connectors 15 are mirror-set with the center of the test board 1 as the center. It should be noted that the ZIF connector 15 is arranged at a position away from the center of the test board 1.
[0028] like Figure 1 As shown, in one embodiment, the test board 1 is a PCB board, and the front of the test board 1 is in a rectangular shape. A plurality of boost capacitors are arranged on the test board 1, and the boost capacitors are arranged around each ZIF connector 15. It should be noted that the boost capacitors are arranged on the left and right sides of the ZIF connector 15.
[0029] like Figure 1 As shown, in one embodiment, the gold finger of the display module 3 is movably connected with the gold finger of the FPC 2. It should be noted that the gold finger of the display module 3 is connected with the gold finger of the FPC 2 by pressing, so that the display module 3 can be replaced and tested.
[0030] like Figure 1 As shown in one embodiment, the power socket 12 is connected to the test board 1. It should be noted that the test board 1 can provide power for the ZIF connector 15, the main control chip 11, and the button 13.
[0031] like Figure 1 As shown, in one embodiment, a plurality of electronic components for heat dissipation are arranged on the left side of the back of the test board 1. It should be noted that this design can enhance the service life of the test board 1.
[0032] The above-mentioned embodiments only express several implementation methods of the utility model, and the description is relatively specific and detailed, but it cannot be understood as limiting the scope of the utility model patent. It should be pointed out that for ordinary technicians in this field, several modifications and improvements can be made without departing from the concept of the utility model, which all belong to the protection scope of the utility model. Therefore, the protection scope of the utility model patent shall be based on the attached claims.
Claims
1. An aging test board for an intelligent display module, characterized in that: include: Test board (1), FPC (2) and display module (3); A main control chip (11) is arranged on the right side of the front of the test board (1), a power socket (12) is arranged on the top of the right side of the front of the test board (1), a group of buttons (13) is arranged on the bottom of the right side of the front of the test board (1), a crystal oscillator (14) is arranged on the right side of the front of the test board (1), and ZIF connectors (15) are arranged at equal distances horizontally on the top and bottom of the left side of the front of the test board (1); The ZIF connector (15) is connected to the FPC (2), and the FPC (2) is connected to the display module (3).
2. The aging test board of the intelligent display module according to claim 1, characterized in that: The main control chip (11) is arranged at a position close to the right side in the center of the front side of the test board (1), and the main control chip (11) is electrically connected to the button (13), the ZIF connector (15), and the crystal oscillator (14).
3. The aging test board of the intelligent display module according to claim 1, characterized in that: The button (13) is arranged at the bottom of the right side of the front side of the test board (1), and the button (13) is divided into two functions, namely, reset and screen switching.
4. The aging test board of the intelligent display module according to claim 1, characterized in that: There are a total of 10 ZIF connectors (15) on the right side of the front side of the test board (1), arranged in two upper and lower rows of 5 each, and the two rows of 5 ZIF connectors (15) are arranged in a mirror image with the center of the test board (1) as the center.
5. The aging test board of the intelligent display module according to claim 1, characterized in that: The test board (1) is a PCB board, and the front side of the test board (1) is in the shape of a rectangle.
6. The aging test board of the intelligent display module according to claim 1, characterized in that: The test board (1) is provided with a plurality of boost capacitors, which are arranged around each of the ZIF connectors (15).
7. The aging test board of the intelligent display module according to claim 1, characterized in that: The gold fingers of the display module (3) are movably connected to the gold fingers of the FPC (2).
8. The aging test board of the intelligent display module according to claim 1, characterized in that: The power socket (12) is connected to the test board (1) in a circuit.
9. The aging test board of the intelligent display module according to claim 1, characterized in that: The ZIF connector (15) and the main control chip (11) are communicatively connected via PCB wiring.
10. The aging test board of the intelligent display module according to claim 1, characterized in that: A plurality of electronic components for heat dissipation are arranged on the left side of the back of the test board (1).