Jig for measuring temperature of quartz crystal

Abstract

The utility model discloses a jig for measuring the temperature of a quartz crystal, which comprises a probe plate, a plurality of magnets are arranged at two ends of the probe plate at intervals, a slot is arranged in the middle of the probe plate, a Tray plate is arranged on the upper side of the slot, a plurality of placing grooves for placing the quartz crystal are uniformly arranged on the upper side of the Tray plate, and the probe plate is arranged in the placing grooves. Test probes are arranged at four corners of the placement groove in a penetrating manner, and the test probes are in sliding connection with the probe plate; the positioning probe is arranged in the middle of the probe plate in a sliding manner; the heat conducting plate is arranged on the upper side of the probe plate, a groove is formed in the middle of the heat conducting plate, a plurality of stand columns are arranged in the groove, and the stand columns are far away from or abut against the corresponding quartz crystals; the magnetic conductive blocks are symmetrically arranged in the middle of the lower side of the heat conducting plate and located on the two sides of the groove, and the structure is simple. The quartz crystal temperature measuring jig can solve the problems that an existing quartz crystal temperature measuring jig is tedious in operation, prone to missing detection and low in efficiency.

Description

Technical Field

[0001] The utility model relates to the technical field of quartz crystal temperature measurement, in particular to a fixture used for quartz crystal temperature measurement. Background Art

[0002] As an important piezoelectric material, quartz crystal is widely used in electronics, communications, optics and other fields. In the research and development, production and application of quartz crystal, accurate and fast temperature measurement is particularly important. However, the traditional fixture for quartz crystal temperature measurement has problems such as cumbersome operation, easy to miss detection, low efficiency, etc., which is difficult to meet the current usage needs. Therefore, it is necessary to design a fixture that meets the current testing needs. Utility Model Content

[0003] The utility model provides a jig for measuring the temperature of a quartz crystal, which can solve the problems of complicated operation, easy missed detection and low efficiency of the existing jig for measuring the temperature of a quartz crystal.

[0004] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a fixture for quartz crystal temperature measurement, including a probe plate, a plurality of magnets are arranged at intervals at both ends of the probe plate, a slot is arranged in the middle of the probe plate, a tray plate is arranged on the upper side of the slot, the tray plate is a standard tray used in the production and transportation of quartz crystals, a plurality of placement slots for placing quartz crystals are evenly arranged on the upper side of the tray plate, test probes are pierced at the four corners of the placement slots, and the test probes are slidably connected to the probe plate; a positioning probe is slidably arranged in the middle of the probe plate; a heat conducting plate, which can be moved up and down and is arranged on the upper side of the probe plate, a groove is arranged in the middle of the heat conducting plate, and a plurality of columns are arranged in the groove, and the columns are away from or abut the corresponding quartz crystals; a magnetic conductive block is symmetrically arranged in the middle of the lower side of the heat conducting plate on both sides of the groove, which has a simple structure and is convenient for detection, thereby improving the accuracy and stability of temperature measurement.

[0005] Preferably, the probe plate is provided with probe vias adapted to the test probe and the positioning probe, and the probe plate is provided with first guide pillars and second guide pillars on both sides of the groove, which has a simple structure and is easy to process.

[0006] Preferably, the Tray plate is provided with a first via hole matching the first guide column, and the lower side of the Tray plate is provided with an avoidance groove directly above the positioning probe, so that the Tray plate is lifted up by the elastic characteristics of the positioning probe.

[0007] Preferably, the heat conducting plate is provided with a second through hole matching the second guide pillar, which is slidably fitted and has high positioning accuracy.

[0008] Preferably, a mounting plate is provided on the lower side of the probe card for easy installation.

[0009] Compared with the prior art, the beneficial effects of the utility model are:

[0010] The device has a simple structure and is easy to operate, which improves the accuracy and stability of quartz crystal temperature measurement and can solve the problems of complicated operation, easy missed detection and low efficiency of existing quartz crystal temperature measurement fixtures. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] Figure 1 It is a three-dimensional structural diagram of the utility model;

[0012] Figure 2 It is the front view of the utility model;

[0013] Figure 3 It is an exploded view of the utility model;

[0014] Figure 4 It is a partial structural diagram of the heat conducting plate of the utility model;

[0015] Figure 5 It is a three-dimensional structural diagram of the probe card of the utility model;

[0016] Figure 6 This is a schematic diagram of the assembly structure of the probe board of the utility model;

[0017] Figure 7 This is a three-dimensional structural diagram of the Tray board of the utility model;

[0018] Figure 8 The three-dimensional structure diagrams of the tray plate at different angles of the present invention.

[0019] Reference numerals:

[0020] 1. Probe plate, 11. Slot, 12. Probe via, 13. First guide column, 14. Second guide column, 2. Magnet, 3. Tray plate, 31. Placement slot, 32. First via, 33. Avoid slot, 4. Quartz crystal, 5. Test probe, 6. Positioning probe, 7. Thermal conductive plate, 71. Groove, 72. Pillar, 73. Second via, 8. Magnetic block, 9. Mounting plate. DETAILED DESCRIPTION

[0021] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the accompanying drawings in the embodiments of the present invention.

[0022] like Figure 1-8As shown, the utility model provides the following technical solutions to solve the problems of complicated operation, easy to miss detection and low efficiency in the existing quartz crystal temperature measurement fixture: a fixture for quartz crystal temperature measurement, including a probe plate 1, a plurality of magnets 2 are arranged at intervals at both ends of the probe plate 1, a slot 11 is arranged in the middle of the probe plate 1, a tray plate 3 is arranged on the upper side of the slot 11, the tray plate 3 is a standard tray used for quartz crystal 4 in the production and transportation process, a plurality of placement slots 31 for placing quartz crystal 4 are evenly arranged on the upper side of the tray plate 3, and the placement slots 31 are arranged on the upper side of the tray plate 3. Test probes 5 are pierced through the four corners of the slot 31, and the test probes 5 are slidably connected to the probe plate 1; positioning probes 6 are slidably arranged in the middle of the probe plate 1; a heat conducting plate 7 is movably arranged on the upper side of the probe plate 1, and a groove 71 is arranged in the middle of the heat conducting plate 7, and a plurality of columns 72 are arranged in the groove 71, and the columns 72 are away from or abut against the corresponding quartz crystal 4; magnetic blocks 8 are symmetrically arranged in the middle of the lower side of the heat conducting plate 7 on both sides of the groove 71, with a simple structure and convenient detection, thereby improving the accuracy and stability of temperature measurement.

[0023] In this embodiment, if Figure 5 As shown, the probe plate 1 is provided with a probe via 12 adapted to the test probe 5 and the positioning probe 6 , and the probe plate 1 is provided with a first guide post 13 and a second guide post 14 on both sides of the groove 71 , which has a simple structure and is easy to process.

[0024] In this embodiment, if Figure 7-8 As shown, the Tray plate 3 is provided with a first through hole 32 matching the first guide column 13, and the lower side of the Tray plate 3 is provided with an avoidance groove 33 just above the positioning probe 6, and the Tray plate is lifted up by the elastic characteristics of the positioning probe.

[0025] In this embodiment, if Figure 4 As shown, the heat conducting plate 7 is provided with a second through hole 73 matching the second guide pillar 14 , which is slidably fitted and has high positioning accuracy.

[0026] In this embodiment, if Figure 1 As shown, a mounting plate 9 is provided on the lower side of the probe card 1 for easy installation.

[0027] In this embodiment, if Figure 1As shown, the magnet 2 is installed above the probe board 1, the positioning probe 6 and the test probe 4 are inserted into the probe board 1, and the mounting plate 9 is installed on the lower side of the probe board 1. The positioning probe 6 and the test probe 5 can slide in the probe via 12, and the Tray board 3 is placed on the probe board 1. The first guide column 13 is arranged in the first via 32. Through the elastic characteristics of the positioning probe 6, the Tray board 3 is lifted up so that the test probe 5 will not leak out of the placement groove 31, and the heat conducting plate 7 is installed in it. The second guide column 14 is arranged in the second via 73, and the magnetic block 8 on the heat conducting plate 7 is attracted to the magnet 2 on the probe board 1, and the heat conducting plate 7 is fitted with the Tray board 3 on the probe board 1; the column 72 abuts the quartz crystal 4, forcing the Tray board 3 to move downward, so that the positioning probe 6 is compressed, so that the test probe 5 is exposed from the placement groove 31 to contact the quartz crystal 4, thereby completing the measurement of the quartz crystal 4.

[0028] It should be noted that all directional indications (such as up, down, left, right, front, back, etc.) in the embodiments of the present invention are only used to explain the relative position relationship, movement status, etc. between the components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly.

[0029] In addition, in the present invention, the descriptions of "first", "second", etc. are only used for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" or "second" may explicitly or implicitly include at least one of the features. In the description of the present invention, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0030] In the present invention, unless otherwise clearly specified and limited, the terms "connection", "fixation", etc. should be understood in a broad sense. For example, "fixation" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0031] In addition, the technical solutions between the various embodiments of the present invention can be combined with each other, but it must be based on the fact that ordinary technicians in the field can implement it. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

Claims

1. A fixture for quartz crystal temperature measurement, characterized in that: include: A probe plate (1), wherein a plurality of magnets (2) are spaced apart at both ends of the probe plate (1), a slot (11) is provided in the middle of the probe plate (1), a tray plate (3) is provided on the upper side of the slot (11), a plurality of placement slots (31) for placing quartz crystals (4) are evenly arranged on the upper side of the tray plate (3), test probes (5) are provided at the four corners of the placement slots (31), and the test probes (5) are slidably connected to the probe plate (1); A plurality of positioning probes (6) are slidably arranged in the middle of the probe plate (1); A heat conducting plate (7) which is movable up and down and is arranged on the upper side of the probe plate (1); a groove (71) is arranged in the middle of the heat conducting plate (7); a plurality of columns (72) are arranged in the groove (71); the columns (72) are away from or abut against the corresponding quartz crystal (4); The magnetic conductive blocks (8) are symmetrically arranged in the middle of the lower side of the heat conductive plate (7) and on both sides of the groove (71).

2. The fixture for quartz crystal temperature measurement according to claim 1, characterized in that: The probe board (1) is provided with a probe via (12) adapted to the test probe (5) and the positioning probe (6), and the probe board (1) is provided with a first guide column (13) and a second guide column (14) on both sides of the groove (71).

3. The fixture for quartz crystal temperature measurement according to claim 2, characterized in that: The Tray plate (3) is provided with a first through hole (32) matching the first guide column (13), and the lower side of the Tray plate (3) is provided with an avoidance groove (33) just above the positioning probe (6).

4. The fixture for quartz crystal temperature measurement according to claim 2, characterized in that: The heat conducting plate (7) is provided with a second through hole (73) matching the second guide column (14).

5. The fixture for quartz crystal temperature measurement according to claim 1, characterized in that: A mounting plate (9) is provided on the lower side of the probe card (1).

Images