High-voltage detection device for power electronic chip

Abstract

The utility model relates to a high-voltage detection device of a power electronic chip, which comprises a detection box, a detection mechanism arranged in the detection box and a supporting seat used for supporting the chip, and is characterized in that the detection mechanism comprises a high-voltage probe assembly, a first limiting and fixing structure and a driving part used for driving the high-voltage probe assembly to move up and down; the high-voltage probe assembly is provided with a test probe, the first limiting and fixing structure comprises a fixing rod, the fixing rod and the high-voltage probe assembly are connected and move synchronously, the top end of the fixing rod is fixed through a spring, the bottom end of the fixing rod is used for pressing a chip to be tested when the fixing rod moves downwards in place, and the lowest point of the fixing rod is lower than the lowest point of the test probe. According to the detection device, the limiting and fixing structure is adopted to press, fix and position more than two positions of the chip, the structure is simple and convenient, the chip can be tightly fixed, the probe can conveniently probe downwards to test the chip, the detection device can be suitable for testing chips of different models, the whole operation is fast and convenient, and the test efficiency is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of electronic chip detection, in particular to a high-voltage detection device for a power electronic chip. Background Art

[0002] With the continuous development of power electronics technology, power electronic chips are increasingly used in power systems. However, since power electronic chips need to withstand harsh environments such as high voltage and high current, high voltage detection is crucial.

[0003] After searching, the Chinese patent with patent number CN215375503U discloses a high-voltage resistance test device for MOS bipolar chips, including a base, a pad, a support column, a support plate, a buffer pressing device, a support platform, a high-voltage detection mechanism, a detection probe, a pillar and a placement plate. The pads are evenly arranged under the base, the support columns are arranged on the base, and the support columns are arranged in two groups with the vertical center line of the base as the symmetry axis. The support plate is arranged on the support column to play a role of fixed support to make the whole more stable. The buffer pressing device is arranged on the support plate, which can press down the MOS bipolar chip, so that the MOS bipolar chip is in further contact with the detection probe.

[0004] When the above patent is in use, the chip is placed in the groove and a high voltage test can be performed on the chip. However, the size of the chip tested is fixed and it is only applicable to chips of a specific type or specification. It may not be applicable to other types of chips. It is not convenient to test chips of different sizes and has a narrow scope of application. Utility Model Content

[0005] In view of this, a high-voltage detection device for power electronic chips is provided which is easy to operate and suitable for testing chips of various models and sizes.

[0006] A high-voltage detection device for a power electronic chip comprises a detection box, a detection mechanism arranged in the detection box and a support seat for supporting the chip, the detection mechanism comprises a high-voltage probe assembly, a first limiting and fixing structure, and a driving member for driving the high-voltage probe assembly to move up and down, the high-voltage probe assembly has a test probe, the first limiting and fixing structure comprises a fixing rod, the fixing rod is connected to the high-voltage probe assembly and moves synchronously, the top end of the fixing rod is fixed by a spring and the bottom end is used to press the chip to be tested when it moves down into place, and the lowest point of the fixing rod is lower than the lowest point of the test probe.

[0007] Preferably, the high-voltage probe assembly includes a probe outer box and a connecting shaft, the probe is installed at the bottom end of the connecting shaft, both sides of the probe outer box are respectively connected to connecting rods, and the first limiting fixing structure has two connecting rods connected to both sides of the probe outer box.

[0008] Preferably, the high-voltage detection device of the power electronic chip has a base, a mounting frame is provided on the base, the mounting frame has a cross beam, the outer wall of the fixed rod is movably connected with a movable rod, the outer walls on both sides of the high-voltage probe assembly are fixedly connected with connecting rods, the other end of the connecting rod is fixedly connected to the outer wall of the movable rod, the outer wall of the fixed rod is sleeved with a spring, one end of the spring is fixedly connected to the outer wall of the movable rod, the other end of the spring is fixedly connected to the outer wall of the fixed rod, and the end of the movable rod away from the fixed rod is fixedly connected with a pressure plate for pressing the chip during testing.

[0009] Preferably, the support seat is supported on a base through a support rod, and a placement plate is provided on the support seat for placing the chip, and the placement plate is opposite to the test probe.

[0010] Preferably, the high-voltage detection device of the power electronic chip also includes a second position-limiting fixing structure, which includes a slide groove, a double-headed screw arranged on the slide groove, and two sliders threadedly assembled on the double-headed screw. The two sliders are respectively located on both sides of the support seat, and each slider is connected to a connecting plate. Each of the connecting plates is fixedly connected to a clamping plate at one end away from the slider, and the two sides of the chip are clamped by the clamping plate. Through the coordinated use of the first position-limiting fixing structure and the second position-limiting fixing structure, the chip is accurately fixed and protected, which is suitable for fixing chips of different sizes and avoids damage to the chip caused by clamping too tightly.

[0011] Preferably, the double-headed screw corresponds to the opposite direction of the threads in contact with the two sliders, the connecting plate and the clamping plate are symmetrically arranged on both sides of the chip, and the connecting plate is bent and bypasses the edge of the support seat so that the clamping plate can approach and clamp the chip.

[0012] Preferably, the top surface of the base is provided with the slide groove, the slider is in sliding contact with the inner wall of the slide groove, both ends of the double-headed screw rod extend out of the slide groove and the base, and a motor is installed at at least one of the extended outer ends.

[0013] Preferably, the clamping plates are all U-shaped plates, the U-shaped opening of the clamping plate faces the chip position, and the U-shaped inner wall of the clamping plate is fixedly connected with a first rubber protective pad.

[0014] Preferably, a second rubber protective pad is fixedly connected to the bottom outer wall of the pressure plate.

[0015] Preferably, the driving member is a cylinder, and the cylinder, motor, and high-voltage probe assembly are all electrically connected to a controller through a power line. The controller controls the movement of the cylinder and motor, reads the measurement data of the high-voltage probe assembly through the controller, and transmits the data to a computer or external device through the power line for further processing. Therefore, the movement of each component is accurately controlled by the controller without excessive manual intervention, which simplifies the operation process. The use of the high-voltage probe assembly and the cylinder makes high-voltage detection more accurate and convenient.

[0016] In the high-voltage detection device for the power electronic chip mentioned above, a limit fixing structure is used to press the chip downward from the top and fix it to the support seat. The structure is simple, and the chip can be tightly fixed, which is convenient for the probe to further probe the chip for testing. Since there is no restriction on the fixed position of the chip on the support seat, it can be suitable for testing different types of chips. During operation, the probe is driven downward by the driving member, and the chip is first pressed by the limit fixing structure, and then the probe is further moved downward to contact the chip for testing. The entire operation is quick and convenient, which improves the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 A schematic diagram of the three-dimensional structure of a high-voltage detection device for a power electronic chip provided in an embodiment of the utility model;

[0018] Figure 2 A partial structural diagram of a high voltage detection device for a power electronic chip provided by an embodiment of the utility model;

[0019] Figure 3 for Figure 1 Schematic diagram of the internal structure of the detection box;

[0020] Figure 4 for Figure 3 Enlarged structural diagram at A in the middle.

[0021] In the figure: 1. detection box; 2. box door; 3. controller; 4. base; 5. support rod; 6. support seat; 7. placement plate; 8. chip; 9. mounting frame; 10. cylinder; 11. high-voltage probe assembly; 12. limit fixing structure 1; 121. slide groove; 122. double-headed screw rod; 123. motor; 124. slider; 125. connecting plate; 126. clamping plate; 127. rubber protection pad 1; 13. limit fixing structure 2; 131. fixed rod; 132. spring; 133. movable rod; 134. pressure plate; 135. rubber protection pad 2; 14. connecting rod. DETAILED DESCRIPTION

[0022] The technical solutions in the embodiments of the utility model will be clearly and completely described below in conjunction with the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, rather than all of the embodiments; based on the embodiments of the utility model, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the utility model.

[0023] See also Figures 1 to 4 , showing a high-voltage detection device for a power electronic chip provided by an embodiment of the utility model, comprising a detection box 1, a detection mechanism arranged in the detection box 1 and a support seat 6 for supporting a chip 8, the detection mechanism comprising a high-voltage probe assembly 11, a first limiting and fixing structure 13, and a driving member for driving the high-voltage probe assembly to move up and down, the high-voltage probe assembly 11 having a test probe, the first limiting and fixing structure 13 comprising a fixing rod 131, the fixing rod 131 is connected to the high-voltage probe assembly 11 and moves synchronously, the top end of the fixing rod 131 is fixed by a spring and the bottom end is used to press the chip to be tested 8 when it moves down to its position, and the lowest point of the fixing rod 131 is lower than the lowest point of the test probe.

[0024] In addition, the outer wall of the test box 1 is hinged with a box door 2, and the outer wall of the box door 2 is fixedly connected with a controller 3. The box door 2 is preferably a transparent door. During the test, the box door is closed to protect the staff. The box door is made of transparent material to facilitate observation of the fixing of the chip 8.

[0025] Specifically, the high-voltage probe assembly 11 includes a probe outer box and a connecting shaft. The probe is installed at the bottom end of the connecting shaft. The two sides of the probe outer box are respectively connected with connecting rods 14. The first limiting fixing structure 13 has two, which are respectively connected to the two sides of the probe outer box through connecting rods 14.

[0026] Furthermore, the high-voltage detection device of the power electronic chip 8 has a base 4, on which a mounting frame 9 is provided, and the mounting frame 9 has a crossbeam, and the mounting frame 9 is preferably a gantry structure or a U-shaped structure. The outer wall of the fixed rod 131 is movably connected with a movable rod 133, and the outer walls on both sides of the high-voltage probe assembly 11 are fixedly connected with connecting rods 14, and the other end of the connecting rod 14 is fixedly connected to the outer wall of the movable rod 133. The outer wall of the fixed rod 131 is sleeved with a spring 132, and one end of the spring 132 is fixedly connected to the outer wall of the movable rod 133, and the other end of the spring 132 is fixedly connected to the outer wall of the fixed rod 131. The end of the movable rod 133 away from the fixed rod 131 is fixedly connected with a pressing plate 134 for pressing the chip 8 during testing.

[0027] Specifically, the support seat 6 is supported on a base 4 through a support rod 5, and a placement plate 7 is provided on the support seat 6 for placing a chip 8, and the placement plate 7 is opposite to the test probe. Preferably, the support seat 6 and the placement plate 7 are both rectangular, and the length and width of the placement plate 7 are smaller than the length and width of the support seat 6. The base 4 is movably or moveably arranged in the detection box 1 through the support legs, and is specifically installed on the bottom wall of the detection box 1. There are multiple support rods 5, four of which are shown in the figure, to evenly support the support seat 6.

[0028] In another embodiment of the utility model, the high-voltage detection device of the power electronic chip 8 further includes a second position-limiting fixing structure 12, the second position-limiting fixing structure 12 includes a slide groove 121, a double-headed screw 122 arranged on the slide groove 121, and two sliders 124 threadedly assembled on the double-headed screw, the two sliders 124 are respectively located on both sides of the support seat, each slider 124 is connected to a connecting plate 125, and each of the connecting plates 125 is fixedly connected to a clamping plate 126 at one end away from the slider 124, and the two sides of the chip 8 are clamped by the clamping plate 126. The support seat 6 is supported by the support rod 5, thereby having a certain height, and there is a certain space between the support seat 6 and the base 4. In a preferred embodiment, the second position-limiting fixing structure 12 is arranged on the base 4 and is located below the support seat 6, preferably at the lower central axis position, so as to stably clamp the two sides of the chip 8 from both sides.

[0029] Specifically, the double-ended screw 122 corresponds to the opposite direction of the threads in contact with the two sliders 124. In this way, when the two opposite threads on the double-ended screw 122 rotate synchronously, the two sliders 124 are driven to move toward each other, that is, move in the direction away from the two sides of the chip 8 or close to the two sides of the chip 8 at the same time. The connecting plate 125 and the clamping plate 126 are symmetrically arranged on both sides of the chip 8. The connecting plate 125 is bent and bypasses the edge of the support seat 6 so that the clamping plate 126 can approach and clamp the chip 8. The clamping plate 126 preferably moves along the surface of the support seat 6 for more stability.

[0030] The top surface of the base 4 is provided with the slide groove 121, the slider 124 is in sliding contact with the inner wall of the slide groove 121, both ends of the double-ended screw rod 122 extend out of the slide groove 121 and the base 4, and a motor 123 is installed at at least one of the extended outer ends. In this way, the slider 124 can move smoothly and linearly, and the moving distance can be accurately controlled by the controller.

[0031] Preferably, the clamping plates 126 are all U-shaped plates, the U-shaped opening of the clamping plates 126 faces the position of the chip 8, and the U-shaped inner wall of the clamping plates 126 is fixedly connected with a first rubber protective pad 127. When clamping the chip 8, the U-shaped opening is loaded into the edge of the chip 8, and the first rubber protective pad 127 provides protection to avoid over-tightening and damage to the chip 8.

[0032] Preferably, a second rubber protective pad 135 is fixedly connected to the bottom outer wall of the pressing plate 134 , mainly to provide buffering and protection when pressing the chip 8 , so as to avoid damage to the chip 8 due to over-tightening.

[0033] Preferably, the driving member is a cylinder 10, and the cylinder 10, the motor 123, and the high-voltage probe assembly 11 are all electrically connected to a controller 3 through a power line, and the controller 3 controls the movement of the cylinder 10 and the motor 123. Thus, the movement distance of the clamping plate 126 and the pressing plate 134 can be accurately controlled by the controller 3. The measurement data of the high-voltage probe assembly 11 is read by the controller 3, and the data is transmitted to a computer or an external device through the power line for further processing.

[0034] In this embodiment, the operator opens the box door 2 and places the chip 8 on the placement plate 7, and controls the motor 123 through the controller 3 to drive the double-headed screw 122 to rotate, so that the slider 124 slides in the slide groove 121, thereby adjusting the position of the clamping plate 126. When the slider 124 moves toward the middle at the same time, the two connecting plates 125 and the clamping plate 126 move toward the middle accordingly, and the clamping plate 126 clamps and fixes the chip 8.

[0035] Working principle: When in use, the operator opens the box door 2 and places the chip 8 on the placement plate 7. The controller 3 controls the motor 123 to drive the double-headed screw 122 to rotate, so that the slider 124 slides in the slide groove 121, thereby adjusting the position of the clamping plate 126. When the slider 124 moves toward the middle at the same time, the two connecting plates 125 and the clamping plate 126 move toward the middle accordingly, and the clamping plate 126 clamps and fixes the chip 8. Then close the box door 2, which is made of transparent material for easy viewing.

[0036] After the chip 8 is fixed, the controller 3 controls the cylinder 10 to move downward. During this process, the movable rod 133 in the second position-limiting fixing structure 13 expands outward under the action of the spring 132, so that the pressing plate 134 contacts the chip 8 to further fix the chip 8. Since the distance from the second position-limiting fixing structure 13 to the chip 8 is smaller than the distance from the high-voltage probe assembly 11 to the chip 8, the pressing plate 134 contacts the chip 8 first to further fix the chip 8. When the fixing rod 131 is lowered to press the edge of the chip 8, the probe can continue to move downward and contact the chip 8 to test it.

[0037] When the high-voltage probe assembly 11 contacts the chip 8, the controller 3 reads the measurement data of the high-voltage probe assembly 11 and transmits the data to a computer or other external device through a power line for further processing.

[0038] Therefore, the high-voltage detection device for the power electronic chip of the present embodiment accurately controls the movement of each component through the controller 3, does not require excessive manual intervention, simplifies the operation process, and adopts the coordinated use of the high-voltage probe assembly 11 and the cylinder 10, so that the high-voltage detection is more accurate and convenient, and the test efficiency is improved. Secondly, through the coordinated use of the first limit fixing structure 13 and the second limit fixing structure 12, the chip 8 is accurately fixed and protected, which is suitable for the fixation of chips of different sizes and avoids damage to the chip caused by clamping too tightly. Furthermore, during the test, the detection device of the present embodiment closes the box door to protect the staff. The box door is made of transparent material, which is convenient for observing the fixation of the chip.

[0039] It should be noted that the present invention is not limited to the above-mentioned embodiments. According to the creative spirit of the present invention, technical personnel in this field can also make other changes. These changes made according to the creative spirit of the present invention should be included in the scope of protection required by the present invention.

Claims

1. A high-voltage detection device for a power electronic chip, comprising a detection box (1), a detection mechanism arranged in the detection box (1), and a support seat (6) for supporting the chip, characterized in that: The detection mechanism comprises a high-voltage probe assembly, a first position-limiting fixing structure (13), and a driving member for driving the high-voltage probe assembly to move up and down, the high-voltage probe assembly (11) having a test probe, the first position-limiting fixing structure (13) comprising a fixing rod (131), the fixing rod (131) being connected to the high-voltage probe assembly (11) and moving synchronously, the top end of the fixing rod (131) being fixed by a spring and the bottom end being used to press the chip to be tested when it moves down to a position, and the lowest point of the fixing rod (131) being lower than the lowest point of the test probe.

2. The high voltage detection device for a power electronic chip according to claim 1, characterized in that: The high-voltage probe assembly (11) comprises a probe outer box and a connecting shaft, the probe is mounted on the bottom end of the connecting shaft, both sides of the probe outer box are respectively connected to connecting rods (14), and the first limiting fixing structure (13) has two connecting rods (14) respectively connected to both sides of the probe outer box.

3. The high voltage detection device for a power electronic chip according to claim 2, characterized in that: The high-voltage detection device for a power electronic chip comprises a base (4), a mounting frame (9) being provided on the base (4), the mounting frame (9) having a crossbeam, the outer wall of the fixed rod (131) being movably connected to a movable rod (133), both sides of the outer wall of the high-voltage probe assembly (11) being fixedly connected to connecting rods (14), the other end of the connecting rod (14) being fixedly connected to the outer wall of the movable rod (133), the outer wall of the fixed rod (131) being sleeved with a spring (132), one end of the spring (132) being fixedly connected to the outer wall of the movable rod (133), the other end of the spring (132) being fixedly connected to the outer wall of the fixed rod (131), and one end of the movable rod (133) being fixedly connected to a pressing plate (134) for pressing the chip during testing.

4. The high voltage detection device for a power electronic chip according to claim 1, characterized in that: The support seat (6) is supported on a base (4) via a support rod (5); a placement plate (7) is provided on the support seat (6) for placing a chip; the placement plate (7) is located opposite to the test probe.

5. The high voltage detection device for a power electronic chip according to claim 4, characterized in that: The high-voltage detection device for the power electronic chip also includes a second position-limiting fixing structure (12), the second position-limiting fixing structure (12) including a slide groove (121), a double-headed screw (122) arranged on the slide groove (121), and two sliders (124) threadedly assembled on the double-headed screw, the two sliders (124) are respectively located on two sides of the support seat, each slider (124) is connected to a connecting plate (125), and each connecting plate (125) is fixedly connected to a clamping plate (126) at one end away from the slider (124), and the two side edges of the chip are clamped by the clamping plate (126).

6. The high voltage detection device for a power electronic chip according to claim 5, characterized in that: The double-headed screw (122) corresponds to the two sliders (124) with threads in opposite directions. The connecting plate (125) and the clamping plate (126) are symmetrically arranged on both sides of the chip (8). The connecting plate (125) is bent and bypasses the edge of the support seat (6) so that the clamping plate (126) can approach and clamp the chip.

7. The high voltage detection device for a power electronic chip according to claim 5, characterized in that: The top surface of the base (4) is provided with the slide groove (121), the slider (124) is in sliding contact with the inner wall of the slide groove (121), both ends of the double-headed screw rod (122) extend out of the slide groove (121) and the base (4), and a motor (123) is installed on at least one of the extended outer ends.

8. The high voltage detection device for a power electronic chip according to claim 5, characterized in that: The clamping plates (126) are all U-shaped plates, the U-shaped opening of the clamping plates (126) faces the chip position, and the U-shaped inner wall of the clamping plates (126) is fixedly connected to a first rubber protection pad (127).

9. The high voltage detection device for a power electronic chip according to claim 3, characterized in that: A second rubber protection pad (135) is fixedly connected to the bottom outer wall of the pressure plate (134).

10. The high voltage detection device for a power electronic chip according to claim 7, characterized in that: The driving member is a cylinder (10); the cylinder (10), the motor (123), and the high-voltage probe assembly (11) are all electrically connected to a controller (3) via a power line; the controller (3) controls the movement of the cylinder (10) and the motor (123); the controller (3) reads measurement data of the high-voltage probe assembly (11), and transmits the data to a computer or an external device via the power line for further processing.

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