Chip reliability test platform

Abstract

The utility model belongs to the technical field of detection, particularly relates to a chip reliability test platform, and aims to solve the problems that the test is influenced by unstable fixation and poor heat dissipation effect which are easily caused by fixing a chip through magnetic adsorption in the prior art, the chip reliability test platform comprises a shell, the top of the shell is provided with a clamp bin, and the clamp bin is provided with a clamp. The inner wall of one side of the clamp bin is provided with a plurality of ventilation holes used for ventilation, and the top of the shell is fixedly provided with a guide rail. According to the chip clamping device, the clamping assembly is arranged, the micro air cylinder and the clamping block are adopted to achieve automatic and stable clamping of chips of different specifications, instability and operation complexity of manual clamping are avoided, the clamping efficiency is improved, and the working efficiency is improved. According to the test platform, chips of different specifications are automatically powered on through the L-shaped moving frame and the power-on block, the test practicability is improved, the heat dissipation performance of the test platform is effectively improved by arranging the air holes and the heat dissipation fan, and the problem that the chips are overheated in the test process is solved.

Description

Technical Field

[0001] The utility model relates to the field of detection technology, in particular to a chip reliability testing platform. Background Art

[0002] With the rapid development of electronic technology, the reliability of chips, as the core components of electronic devices, is crucial to the performance and service life of the entire equipment. However, during the production and use of chips, various factors such as manufacturing process, material quality, working environment, etc. may cause chip failure or performance degradation. Therefore, reliability testing of chips is a necessary means to ensure product quality and stability.

[0003] After searching, the utility model with announcement number CN219758302U discloses a chip reliability testing device, including a testing machine main body, a chip fixing platform is installed at the lower side of the testing machine main body, a matching slide rail is opened above the chip fixing platform on one side of the testing machine main body, a power-on adjustment frame is fixed to the top of one side of the chip fixing platform, and an adjustment slider is slidably installed on the inner wall of the track of the power-on adjustment frame; the power-on slider realizes the power-on of the chip through the mutual contact between the power-on connection column and the chip, and realizes the reliability test of the chip through the mutual cooperation between the internal electrical components of the testing machine main body, so that there is no need to adjust the position of the chip during the power-on connection of the chip, which increases the work efficiency of the position movement of the chip during the power-on process and improves the practicality of the device.

[0004] The chip reliability testing device also has the following disadvantages: when the chip is clamped and fixed, multiple extrusion fixing blocks are adsorbed by multiple magnetic sheets, which makes the operation steps for fixing the chip cumbersome, and the magnetic attraction of the magnetic sheets is not enough, which can easily lead to unstable chip fixation and affect the test. When the device is cooled, the heat is only dissipated through the ventilation openings, resulting in poor heat dissipation effect, which affects the test. Therefore, we propose a chip reliability testing platform to solve the above problems. Utility Model Content

[0005] The utility model aims to solve the shortcomings of the prior art that the chip is fixed by magnetic adsorption, resulting in unstable fixation and affecting the test, and poor heat dissipation effect and affecting the test, and proposes a chip reliability test platform.

[0006] In order to achieve the above purpose, the utility model adopts the following technical solutions:

[0007] A chip reliability test platform comprises a shell, a fixture compartment is provided on the top of the shell, a plurality of ventilation holes are provided on one inner wall of the fixture compartment, a guide rail is fixedly provided on the top of the shell, a groove is provided on the top of the shell, and the chip reliability test platform further comprises:

[0008] A clamping assembly, wherein the clamping assembly is arranged inside the clamping chamber and is used to clamp and fix the chip;

[0009] The power-on component is arranged on the top of the shell and is used to power the chip.

[0010] In a possible design, the clamping assembly includes a clamp base, both sides of which are fixedly connected to the inner walls of the clamp bin on both sides, the top of the clamp base is symmetrically fixedly connected to two slide rails, the tops of the two slide rails are symmetrically fixedly connected to two micro cylinders, the output ends of the four micro cylinders are fixedly connected to clamp blocks, the four clamp blocks are respectively slidably connected to the corresponding slide rails, the air inlets of the four micro cylinders are fixedly connected to the same concave air pipe, and the concave air pipe is provided with a driving assembly for driving the four clamp blocks.

[0011] In one possible design, the driving assembly includes an air cylinder, which is fixedly arranged at the bottom of the clamp base, and the air outlet end of the air cylinder is fixedly connected to the concave air pipe, one end of the air cylinder is threadedly connected to a first threaded rod, one end of the first threaded rod is rotatably connected to a piston plate, and the piston plate is sealingly and slidably connected in the air cylinder, the bottom of the clamp base is symmetrically fixedly connected to two support blocks, the bottoms of the two support blocks are slidably connected to the same support plate, the bottom of the support plate is fixedly connected to a first motor, and the output end of the first motor is fixedly connected to the other end of the first threaded rod.

[0012] In a possible design, the power-on component includes an L-shaped movable frame, a sliding groove is provided at the bottom of the L-shaped movable frame, the sliding groove is slidably connected to the top of the guide rail, and one end of the L-shaped movable frame is located in the groove, and the inner walls on both sides of the groove are rotatably connected with a second threaded rod, the second threaded rod penetrates the L-shaped movable frame and is threadedly connected to the L-shaped movable frame, one end of the second threaded rod penetrates the shell and extends to the outside, a second motor is fixedly connected to one side of the shell, and the output end of the second motor is fixedly connected to the second threaded rod, and a notch is provided at the top of the L-shaped movable frame, and the inner walls on both sides of the notch are slidably connected with power-on blocks for powering the chip.

[0013] In a possible design, four support columns for supporting the chip are fixedly connected at equal intervals to the top of the clamp base, one side is provided with an inclined surface for clamping the chip, and a non-slip soft rubber pad is fixedly provided on one side of the inclined surface of the clamp block.

[0014] In a possible design, a plurality of heat dissipation holes are evenly spaced on the fixture base for dissipating heat from powered chips, and four through holes are formed on one side of the shell, and cooling fans for dissipating heat are fixedly connected to the inner walls of the four through holes.

[0015] In the present application, the chip to be tested is placed on four support columns on the fixture base, and the chip is supported by the four support columns. Then the first motor is started, and the first threaded rod is driven to rotate by the first motor, thereby driving the piston plate on the first threaded rod to move in the air cylinder, thereby generating an air pressure difference, driving the gas flow in the concave air pipe, so that the air flow enters the four micro-cylinders, and the output ends of the micro-cylinders are driven to make the four clamping blocks connected to the four micro-cylinders slide on the slide rails to achieve automatic clamping of the chip, and the anti-slip soft rubber pads arranged on the inclined surfaces of the four clamping blocks prevent the chip from sliding and failing to be fixed when the chip is clamped and fixed. The clamping force of the clamping blocks can be adjusted by adjusting the speed and direction of the first motor.

[0016] After the clamping is completed, the second motor is started, and the second threaded rod is driven to rotate by the second motor, thereby driving the L-shaped movable frame to slide on the guide rail, so that the power block on the L-shaped movable frame moves to the chip power connector for connection, and the chip is powered on for testing. The L-shaped movable frame is driven by the second motor to move to realize automatic power on and power off of the chip. During the test, air flow is generated by the rotation of the cooling fan to take away the heat in the fixture compartment. At the same time, the air vents are used to realize the circulation between the fixture compartment and the external air, thereby effectively improving the heat dissipation performance of the test platform.

[0017] Beneficial effects:

[0018] In the utility model, the chip reliability test platform, by setting a clamping assembly, adopts a micro cylinder and a clamping block to realize automatic clamping of chips of different specifications, the clamping is stable and reliable, and the instability and cumbersome operation of manual clamping are avoided;

[0019] In the utility model, the chip reliability test platform, by setting a power-on component, adopts an L-shaped moving frame and a power-on block to realize automatic power-on of chips of different specifications, thereby improving the practicality of the test;

[0020] In the utility model, the chip reliability test platform is provided with ventilation holes and cooling fans, which effectively improves the heat dissipation performance of the test platform and avoids the problem of chip overheating during the test process;

[0021] In the utility model, a clamping assembly is provided, and a micro-cylinder and a clamping block are used to realize automatic and stable clamping of chips of different specifications, thereby avoiding the instability and cumbersome operation of manual clamping. An L-shaped movable frame and a power-on block are used to realize automatic power-on of chips of different specifications, thereby improving the practicality of the test. By providing air holes and a cooling fan, the heat dissipation performance of the test platform is effectively improved, thereby avoiding the problem of overheating of the chip during the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1A three-dimensional structural schematic diagram of a chip reliability testing platform proposed by the utility model;

[0023] Figure 2 This is a schematic diagram of the three-dimensional structure of a shell of a chip reliability testing platform proposed by the utility model;

[0024] Figure 3 This is a three-dimensional structural schematic diagram of a clamping assembly of a chip reliability testing platform proposed by the utility model;

[0025] Figure 4 This is a bottom-up three-dimensional structural schematic diagram of a clamping assembly of a chip reliability testing platform proposed by the utility model;

[0026] Figure 5 The utility model provides a schematic diagram of the three-dimensional structure of the power-on components of a chip reliability testing platform.

[0027] In the figure: 1. Shell; 101. Clamp compartment; 102. Air vent; 103. Cooling fan; 104. Groove; 105. Guide rail; 2. Clamp base; 3. Slide rail; 4. Clamp block; 5. Micro cylinder; 6. Support column; 7. Concave air pipe; 8. Air cylinder; 9. First threaded rod; 10. First motor; 11. Support block; 12. Support plate; 13. L-shaped moving frame; 14. Second threaded rod; 15. Second motor; 16. Power block. DETAILED DESCRIPTION

[0028] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments.

[0029] Example 1

[0030] Reference Figure 1-5 A test platform includes a shell 1, a fixture compartment 101 is provided on the top, and a plurality of air holes 102 are provided on the side wall of the fixture compartment 101 to facilitate heat dissipation. A guide rail 105 and a groove 104 are also fixedly provided on the top of the shell 1. In addition, the test platform also includes a clamping component and a power-on component.

[0031] The clamping assembly is mainly used to clamp and fix the chip. Specifically, the clamping assembly includes a clamp base 2, and the two sides of the clamp base 2 are fixedly connected to the inner walls of the clamp bin 101 on both sides. The top of the clamp base 2 is symmetrically fixedly connected to two slide rails 3, and the top of each slide rail 3 is symmetrically fixedly connected to two micro cylinders 5. The output end of the micro cylinder 5 is fixedly connected to a clamp block 4, and the clamp block 4 is slidably connected to the corresponding slide rail 3 to achieve sliding along the slide rail 3. The air inlets of the four micro cylinders 5 are connected through a concave air pipe 7 to receive control from the same air source.

[0032] The driving assembly for driving the four clamping blocks 4 includes an air cylinder 8, which is fixedly arranged at the bottom of the clamp base 2, and its air outlet end is fixedly connected to the concave air pipe 7. One end of the air cylinder 8 is threadedly connected to a first threaded rod 9, and one end of the first threaded rod 9 is rotatably connected to a piston plate. The piston plate is symmetrically fixedly connected to the bottom of the sealing sliding clamp base 2 in the air cylinder 8. The bottom of the support block 11 is slidably connected to a support plate 12, and the bottom of the support plate 12 is fixedly connected to a first motor 10. The output end of the first motor 10 is fixedly connected to the other end of the first threaded rod 9. When the first motor 10 is working, it drives the first threaded rod 9 to rotate, and then drives the piston plate to move in the air cylinder 8, thereby controlling the air pressure in the air cylinder 8, thereby driving the synchronous extension and contraction of the four micro cylinders 5 to achieve clamping or loosening of the chip.

[0033] In order to increase the stability of clamping, four support columns 6 are fixedly connected at equal intervals on the top of the clamp base 2 to support the chip. One side of the clamp block 4 is provided with an inclined surface, and a non-slip soft rubber pad is fixed on the inclined surface to increase the friction during clamping and prevent the chip from sliding during the test.

[0034] In order to improve the heat dissipation effect of the chip, a plurality of heat dissipation holes are opened at equal intervals on the clamp base 2 to increase air circulation. In addition, four through holes are provided on one side of the shell 1, and the inner walls of the through holes are fixedly connected with a heat dissipation fan 103. Through the operation of the heat dissipation fan 103, the air circulation is further accelerated and the heat dissipation effect is improved.

[0035] The power-on component is mainly used for power-on testing of the chip. Specifically, the power-on component includes an L-shaped movable frame 13, a sliding groove is provided at the bottom of which, the sliding groove is slidably connected to the top of the guide rail 105, and one end of the L-shaped movable frame 13 is located in the groove 104, and the inner walls on both sides of the groove 104 are rotatably connected with a second threaded rod 14, the second threaded rod 14 penetrates the L-shaped movable frame 13 and is threadedly connected to the L-shaped movable frame 13, one end of the second threaded rod 14 penetrates the shell 1 and extends to the outside, and is fixedly connected to the output end of the second motor 15 fixed on one side of the shell 1. When the second motor 15 is working, it drives the second threaded rod 14 to rotate, thereby driving the L-shaped movable frame 13 to slide along the guide rail 105, thereby realizing the left and right movement of the L-shaped movable frame 13.

[0036] The present application can be used in the field of chip detection technology, and can also be used in other fields applicable to the present application.

[0037] Example 2

[0038] refer to Figure 1-3, improved on the basis of embodiment 1: a chip reliability testing platform, which is applied to the field of chip detection technology, a slot is provided on the top of the L-shaped movable frame 13, and power blocks 16 are slidably connected to the inner walls on both sides of the slot for powering the chip. When the L-shaped movable frame 13 moves to a specified position, the power blocks 16 contact the corresponding position on the chip to achieve powering.

[0039] However, as is well known to those skilled in the art, the working principles and wiring methods of the first motor 10 and the second motor 15 are commonplace, and are conventional means or common knowledge, and will not be elaborated here. Those skilled in the art may make any optional selections according to their needs or convenience.

[0040] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes within the technical scope disclosed by the present invention according to the technical scheme and the utility model concept of the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A chip reliability test platform, comprising a housing (1), a fixture compartment (101) is provided on the top of the housing (1), a plurality of ventilation holes (102) are provided on one inner wall of the fixture compartment (101), a guide rail (105) is fixedly provided on the top of the housing (1), and a groove (104) is provided on the top of the housing (1), characterized in that: The chip reliability test platform also includes: A clamping assembly, wherein the clamping assembly is arranged inside the clamping chamber (101) and is used to clamp and fix the chip; A power-on component is arranged on the top of the housing (1) and is used to power the chip.

2. A chip reliability testing platform according to claim 1, characterized in that: The clamping assembly comprises a clamp base (2), both sides of the clamp base (2) are fixedly connected to the inner walls of both sides of the clamp bin (101), the top of the clamp base (2) is symmetrically fixedly connected to two slide rails (3), the tops of the two slide rails (3) are symmetrically fixedly connected to two micro cylinders (5), the output ends of the four micro cylinders (5) are fixedly connected to clamp blocks (4), the four clamp blocks (4) are respectively slidably connected to the corresponding slide rails (3), the air inlets of the four micro cylinders (5) are fixedly connected to the same concave air pipe (7), and the concave air pipe (7) is provided with a driving assembly for driving the four clamp blocks (4).

3. A chip reliability testing platform according to claim 2, characterized in that: The driving assembly comprises an air cylinder (8), wherein the air cylinder (8) is fixedly arranged at the bottom of the clamp base (2), the air outlet end of the air cylinder (8) is fixedly connected to the concave air pipe (7), one end of the air cylinder (8) is threadedly connected to a first threaded rod (9), one end of the first threaded rod (9) is rotatably connected to a piston plate, and the piston plate is sealingly and slidably connected in the air cylinder (8), the bottom of the clamp base (2) is symmetrically and fixedly connected to two support blocks (11), the bottoms of the two support blocks (11) are slidably connected to the same support plate (12), the bottom of the support plate (12) is fixedly connected to a first motor (10), and the output end of the first motor (10) is fixedly connected to the other end of the first threaded rod (9).

4. A chip reliability testing platform according to claim 1, characterized in that: The power supply component comprises an L-shaped movable frame (13), a sliding groove is provided at the bottom of the L-shaped movable frame (13), the sliding groove is slidably connected to the top of the guide rail (105), and one end of the L-shaped movable frame (13) is located in the groove (104), and the inner walls on both sides of the groove (104) are rotatably connected with a second threaded rod (14), the second threaded rod (14) passes through the L-shaped movable frame (13) and is threadedly connected to the L-shaped movable frame (13), one end of the second threaded rod (14) passes through the shell (1) and extends to the outside, a second motor (15) is fixedly connected to one side of the shell (1), and the output end of the second motor (15) is fixedly connected to the second threaded rod (14), and a notch is provided at the top of the L-shaped movable frame (13), and the inner walls on both sides of the notch are slidably connected with power supply blocks (16) for powering the chip.

5. A chip reliability testing platform according to claim 3, characterized in that: Four support columns (6) for supporting the chip are fixedly connected at equal intervals to the top of the clamp base (2); one side of the clamp (4) is provided with an inclined surface for clamping the chip, and a non-slip soft rubber pad is fixedly provided on one side of the inclined surface of the clamp block (4).

6. A chip reliability testing platform according to claim 5, characterized in that: The fixture base (2) is provided with a plurality of heat dissipation holes at equal intervals for dissipating heat from the powered chip, and one side of the housing (1) is provided with four through holes, the inner walls of the four through holes being fixedly connected with a heat dissipation fan (103) for dissipating heat.

Images