A chip test socket

Abstract

The present application relates to a chip test seat, which relates to the field of chip testing, and includes a base, a groove for detecting a chip is provided in the middle of the top surface of the base, four groups of pressure plates are provided in the groove for pressing the four sides of the chip, and a limit assembly is also provided in the groove for respectively controlling the movement of the four groups of pressure plates. The present application has the effect of performing limit tests on chips of different specifications.

Description

Technical Field

[0001] The present application relates to the field of chip testing, and in particular to a chip testing socket. Background Art

[0002] Chip, also known as circuit, is a kind of high-tech product. Before the chip is officially put into use, the chip performance needs to be tested to avoid hidden dangers caused by defective chips. The chip test socket is needed to test the chip.

[0003] When testing, the existing chip test socket only installs and tests chips of a certain specification. When testing chips of different specifications and sizes, it is necessary to replace the chip test socket that is compatible with the chip body. Otherwise, poor contact between the chip pins and the test socket may occur, affecting subsequent chip testing. Utility Model Content

[0004] In order to adapt to chips of different shapes and achieve good chip testing results, the present application provides a chip test socket.

[0005] The chip test socket provided in this application adopts the following technical solution:

[0006] A chip test seat comprises a base, wherein a groove for detecting a chip is provided in the middle of the top surface of the base, four groups of pressure plates for pressing the four sides of the chip are arranged in the groove, and a limiting assembly for controlling the movement of the four groups of pressure plates respectively is also arranged in the groove.

[0007] Furthermore, the limiting assembly includes a connecting rod and a push block, and a accommodating groove for accommodating the connecting rod and the push block is provided on the peripheral wall of the groove, one end of the push block is connected to the pressure plate, and the other end of the push block is provided with a first inclined surface, and the distance from the first inclined surface to the bottom surface of the groove decreases from the end close to the pressure plate to the end away from the pressure plate, and a slide rail is provided on the first inclined surface, the connecting rod is vertically arranged, and a second inclined surface is provided at one end of the connecting rod, the first inclined surface and the second inclined surface are in contact with each other, and a slide groove for the slide rail to slide is provided on the connecting rod.

[0008] Furthermore, a limiting groove for limiting the moving direction of the connecting rod is provided on the groove wall of the accommodating groove, and a limiting block is provided on the connecting rod, and the limiting block is slidably connected to the limiting groove.

[0009] Furthermore, it also includes a control component for controlling the movement of the connecting rod, the control component includes a connecting plate and a plurality of bolt groups, the ends of the plurality of connecting rods away from the push block are connected to the connecting plate, the plurality of bolt groups each include a screw rod, a first nut and a second nut, the screw rod is vertically arranged, one end of the screw rod is fixedly connected to the top wall of the base and is threadedly connected to the first nut and the second nut, the other end of the screw rod passes through the connecting plate, and the base is arranged between the first nut and the second nut.

[0010] Furthermore, the connecting plate is provided with a through slot for passing the chip.

[0011] Furthermore, two groups of spirit levels are arranged on the top wall of the connecting plate, and the extension directions of the two groups of spirit levels are arranged vertically.

[0012] Furthermore, a pressure pad is provided on the side wall of the pressure plate facing the chip.

[0013] Furthermore, a plurality of probes are evenly arranged at the bottom of the groove.

[0014] In summary, this application includes the following beneficial technical effects:

[0015] 1. When testing the chip, first place the chip into the groove through the through slot, adjust the height of the connecting plate by adjusting the height of the first nut and the second nut, and the connecting plate drives the connecting rod to move in the vertical direction. Relative movement occurs between the connecting plate and the push block. When the connecting plate moves downward, the connecting plate drives the push block to move into the groove, and when the connecting plate moves upward, the connecting plate drives the push block to move away from the groove. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 This is a schematic diagram of the overall structure of a chip test socket in an embodiment of the present application.

[0017] Figure 2 for Figure 1 Section view of the AA plane.

[0018] Explanation of the reference numerals in the accompanying drawings: 1. base; 2. groove; 3. pressure plate; 4. limit assembly; 41. connecting rod; 42. push block; 5. control assembly; 51. connecting plate; 52. bolt group; 521. screw rod; 522. first nut; 523. second nut; 6. level; 7. probe; 8. through groove; 9. pressure pad; 10. accommodating groove; 11. limit groove; 12. limit block; 13. first inclined surface; 15. slide rail; 16. slide groove. DETAILED DESCRIPTION

[0019] The following is combined with Figure 1-2 This application is described in further detail.

[0020] The embodiment of the present application discloses a chip test socket.

[0021] Reference Figure 1 and Figure 2 A chip test seat includes a base 1, and a groove 2 for detecting a chip is opened in the middle of the top surface of the base 1. In this embodiment, the groove 2 is set as a square groove, and four groups of pressure plates 3 for pressing the four sides of the chip are arranged in the groove 2. A pressure pad 9 is arranged on the side wall of each group of pressure plates 3 facing the chip. A limiting component 4 for controlling the movement of the four groups of pressure plates 3 is also arranged in the groove 2, and each group of limiting components 4 is arranged in the middle of each side of the groove 2.

[0022] The limiting assembly 4 includes a connecting rod 41 and a push block 42. A receiving groove 10 for accommodating the connecting rod 41 and the push block 42 is provided on the peripheral wall of the groove 2. A limiting groove 11 for limiting the movement direction of the connecting rod 41 is provided on the groove wall of the accommodating groove 10. A limiting block 12 is provided on the connecting rod 41. The limiting block 12 and the limiting groove 11 are slidably connected. One end of the push block 42 is connected to the pressure plate 3. The other end of the push block 42 is provided with a first inclined surface 13. The distance from the first inclined surface 13 to the bottom surface of the groove 2 decreases from the end close to the pressure plate 3 to the end away from the pressure plate 3. A slide rail 15 is provided on the first inclined surface 13. The extension direction of the slide rail 15 is parallel to the extension direction of the first inclined surface 13. The connecting rod 41 is vertically arranged. A second inclined surface is provided at one end of the connecting rod 41. The first inclined surface 13 and the second inclined surface are in contact with each other. A slide groove 16 for the slide rail 15 to slide is provided on the connecting rod 41.

[0023] Reference Figure 2 A control component 5 for controlling the movement of the connecting rod 41 is provided on the base 1, and the control component 5 includes a connecting plate 51 and four groups of bolt groups 52. In the present embodiment, the connecting plate 51 is arranged in a square ring, and a through slot 8 for passing the chip is provided on the connecting plate 51. In the present embodiment, the connecting plate 51 is arranged in a square ring shape, and the four groups of bolt groups 52 correspond to the four corners of the connecting plate 51 one by one. One end of the connecting rod 41 away from the push block 42 is connected to the connecting plate 51, and each group of bolt groups 52 includes a screw rod 521, a first nut 522 and a second nut 523. The screw rod 521 is arranged vertically, and one end of the screw rod 521 is fixedly connected to the top wall of the base 1 and is threadedly connected to the first nut 522 and the second nut 523. The other end of the screw rod 521 passes through the connecting plate 51, and the base 1 is arranged between the first nut 522 and the second nut 523.

[0024] Reference Figure 1 Two groups of level gauges 6 are arranged on the top wall of the connecting plate 51, and the extending directions of the two groups of level gauges 6 are arranged vertically.

[0025] Reference Figure 1 , a number of probes 7 are evenly arranged at the bottom of the groove 2.

[0026] The implementation principle of a chip test seat in the embodiment of the present application is as follows: when testing chips of different specifications, first place the chip into the groove 2 through the through groove 8, and adjust the height of the connecting plate 51 by adjusting the height of the first nut 522 and the second nut 523. The connecting plate 51 drives the connecting rod 41 to move in the vertical direction, and relative movement occurs between the connecting plate 51 and the push block 42. When the connecting plate 51 moves downward, the first inclined surface 13 squeezes the second inclined surface, and the connecting plate 51 drives the push block 42 to move into the groove 2. When the connecting plate 51 moves upward, the slide rail 15 slides in the slide groove 16. The shoulder of the slide rail 15 and the slide groove 16 are used to make the connecting plate 51 drive the push block 42 to move away from the groove 2, which is conducive to achieving the effect of testing chips of different specifications.

[0027] The above are all preferred embodiments of the present application, and the protection scope of the present application is not limited thereto. Therefore, any equivalent changes made according to the structure, shape, and principle of the present application should be included in the protection scope of the present application.

Claims

1. A chip test socket, characterized in that: The invention comprises a base (1), wherein a groove (2) for detecting a chip is provided in the middle of the top surface of the base (1), four groups of pressure plates (3) for pressing the four sides of the chip are arranged in the groove (2), and a limiting assembly (4) for respectively controlling the movement of the four groups of pressure plates (3) is also arranged in the groove (2).

2. A chip test socket according to claim 1, characterized in that: The limiting assembly (4) comprises a connecting rod (41) and a push block (42); a receiving groove (10) for accommodating the connecting rod (41) and the push block (42) is provided on the peripheral wall of the groove (2); one end of the push block (42) is connected to the pressure plate (3); the other end of the push block (42) is provided with a first inclined surface (13); the distance from the first inclined surface (13) to the bottom surface of the groove (2) decreases from the end close to the pressure plate (3) to the end away from the pressure plate (3); a slide rail (15) is provided on the first inclined surface (13); the connecting rod (41) is vertically arranged; a second inclined surface is provided on one end of the connecting rod (41); the first inclined surface (13) and the second inclined surface are in contact with each other; and a slide groove (16) for the slide rail (15) to slide is provided on the connecting rod (41).

3. A chip test socket according to claim 2, characterized in that: A limiting groove (11) for limiting the moving direction of the connecting rod (41) is provided on the groove wall of the accommodating groove (10), and a limiting block (12) is provided on the connecting rod (41), and the limiting block (12) and the limiting groove (11) are slidably connected.

4. A chip test socket according to claim 2, characterized in that: It also includes a control component (5) for controlling the movement of the connecting rod (41), the control component (5) includes a connecting plate (51) and a plurality of bolt groups (52), the ends of the plurality of connecting rods (41) away from the push block (42) are connected to the connecting plate (51), the plurality of bolt groups (52) each include a screw rod (521), a first nut (522) and a second nut (523), the screw rod (521) is vertically arranged, one end of the screw rod (521) is fixedly connected to the top wall of the base (1) and is threadedly connected to the first nut (522) and the second nut (523), the other end of the screw rod (521) passes through the connecting plate (51), and the base (1) is arranged between the first nut (522) and the second nut (523).

5. A chip test socket according to claim 4, characterized in that: The connecting plate (51) is provided with a through slot (8) for passing the chip.

6. The chip test socket according to claim 4, characterized in that: Two groups of level gauges (6) are arranged on the top wall of the connecting plate (51), and the extension directions of the two groups of level gauges (6) are arranged vertically.

7. The chip test socket according to claim 1, characterized in that: A pressure pad (9) is arranged on the side wall of the pressure plate (3) facing the chip.

8. The chip test socket according to claim 1, characterized in that: A plurality of probes (7) are evenly arranged at the bottom of the groove (2).

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