Drive sampling circuits, chips and electronic devices

Abstract

The utility model provides a driving sampling circuit, a chip and an electronic device. The driving sampling circuit comprises: a driving circuit, which is used for receiving a driving signal to drive a buzzer to work; a detection circuit, which is connected to the driving circuit and is used for receiving a voltage signal to perform AD sampling; and an isolation circuit, which is respectively connected to the detection circuit and the driving circuit and is used for isolating the driving circuit and the detection circuit when the detection circuit performs AD sampling. The utility model avoids the adverse effect of the resistance value changed at both ends of the buzzer in the driving circuit on the voltage value sampled by the detection circuit when the detection circuit performs AD sampling, so that the detection circuit can sample a normal temperature value, thereby ensuring the correctness of the AD sampling.

Description

Technical Field

[0001] The utility model relates to the technical field of chips, in particular to a driving sampling circuit, a chip and an electronic device. Background Art

[0002] In the related art, the driving sampling circuit can be used to detect the anti-dry burning. When the buzzer is turned on or off or inputs a command, the driving sampling circuit outputs a level to trigger the buzzer to work, such as Figure 1 As shown, the circuit diagram of the driving sampling circuit in the related art. The MCU (Microcontroller Unit) performs time-division multiplexing through an IO (input / output) port to drive the buzzer and detect the AD (Analog to Digital Converter). When the IO port is in the output state, the MCU outputs a PWM (Pulse Width Modulation) signal through the IO port to drive the buzzer; when the IO port is in the input state, the MCU performs AD sampling on the voltage division value of the detection circuit where the NTC (Negative Temperature Coefficient) resistor is located through the IO port to determine the temperature value.

[0003] However, when the above method is used, the resistance value at both ends of the buzzer changes. For example, when the buzzer becomes damp and water vapor enters and produces electrical corrosion, the resistance value at both ends of the buzzer will become smaller. When the resistance value at both ends of the buzzer becomes smaller, it will affect the voltage value of the detection circuit of the NTC resistor, that is, the sampled temperature value deviates from the actual voltage divider value, and the smaller the resistance value at both ends of the buzzer, the greater the deviation, thereby causing abnormal AD sampling. Utility Model Content

[0004] The utility model aims to solve at least one of the technical problems existing in the prior art.

[0005] To this end, one purpose of the utility model is to propose a drive sampling circuit, which can avoid the adverse effect of the changing resistance value of the buzzer at both ends of the drive circuit on the voltage value sampled by the detection circuit when the detection circuit performs AD sampling, so that the detection circuit can sample a normal temperature value, thereby ensuring the correctness of AD sampling.

[0006] Therefore, a second objective of the present invention is to provide a chip.

[0007] Therefore, the third objective of the present invention is to provide an electronic device.

[0008] In order to achieve the above-mentioned purpose, an embodiment of the first aspect of the utility model proposes a drive sampling circuit, which includes: a drive circuit, which is used to receive a drive signal to drive a buzzer to work; a detection circuit, which is connected to the drive circuit and is used to receive a voltage signal to perform AD sampling; an isolation circuit, which is respectively connected to the detection circuit and the drive circuit, and is used to isolate the drive circuit and the detection circuit when the detection circuit performs AD sampling.

[0009] According to the drive sampling circuit of the embodiment of the utility model, an isolation circuit is set between the detection circuit and the drive circuit to isolate the drive circuit and the detection circuit, thereby avoiding the adverse effect of the changing resistance value of the buzzer at both ends of the drive circuit on the voltage value sampled by the detection circuit when the detection circuit performs AD sampling, so that the detection circuit can sample a normal temperature value, thereby ensuring the correctness of AD sampling.

[0010] In some embodiments, the driving circuit includes: a first resistor, one end of which is connected to the buzzer; a second resistor, the other end of which is connected to the other end of the first resistor; a third resistor, one end of which is connected to one end of the second resistor, and the other end of the third resistor is grounded.

[0011] In some embodiments, the isolation circuit includes: a first capacitor, one end of the first capacitor is connected to the other end of the first resistor, and the other end of the first capacitor is connected to the other end of the second resistor, and is used to isolate the driving circuit and the detection circuit when the detection circuit performs AD sampling.

[0012] In some embodiments, the isolation circuit includes: an isolation sub-circuit, a first end of the isolation sub-circuit is connected to the other end of the first resistor, a second end of the isolation sub-circuit is grounded, and a third end of the isolation sub-circuit is connected to the other end of the second resistor, and is used to isolate the driving circuit and the detection circuit when the detection circuit performs AD sampling.

[0013] In some embodiments, the isolation subcircuit includes: a first MOS (Metal Oxide Semiconductor Field Effect Transistor) tube, the drain of the first MOS tube is connected to the other end of the first resistor, the source of the first MOS tube is grounded, and the gate of the first MOS tube is connected to the other end of the second resistor, which is used to shut down when the detection circuit performs AD sampling.

[0014] In some embodiments, the isolation sub-circuit further includes: a second capacitor, one end of the second capacitor is connected to the gate of the second MOS tube, and the other end of the second capacitor is grounded.

[0015] In some embodiments, the driving circuit further includes: a fourth resistor, one end of the fourth resistor is connected to the other end of the second resistor, and the other end of the fourth resistor is connected to the gate of the first MOS tube.

[0016] In some embodiments, the drive sampling circuit further includes: a fifth resistor, one end of the fifth resistor is connected to the power supply, and the other end of the fifth resistor is respectively connected to one end of the second resistor and the third resistor to form the detection circuit with the second resistor and the third resistor.

[0017] In order to achieve the above-mentioned purpose, an embodiment of the second aspect of the utility model proposes a chip, which includes: an IO port; a driving sampling circuit as described in the above embodiment, connected to the IO port, and used to perform a driving function or a sampling function according to the state of the IO port.

[0018] According to the chip of the embodiment of the utility model, an isolation circuit is set between the detection circuit and the drive circuit to isolate the drive circuit from the detection circuit, thereby avoiding the adverse effect of the changing resistance value at both ends of the buzzer in the drive circuit on the voltage value sampled by the detection circuit when the detection circuit performs AD sampling, so that the detection circuit can sample a normal temperature value, thereby ensuring the correctness of AD sampling.

[0019] In order to achieve the above object, an embodiment of a third aspect of the present utility model provides an electronic device, wherein the electronic device includes the chip described in the above embodiment.

[0020] According to the electronic device of the embodiment of the utility model, an isolation circuit is set between the detection circuit and the drive circuit to isolate the drive circuit from the detection circuit, thereby avoiding the adverse effect of the changing resistance value of the buzzer at both ends of the drive circuit on the voltage value sampled by the detection circuit when the detection circuit performs AD sampling, so that the detection circuit can sample a normal temperature value, thereby ensuring the correctness of AD sampling.

[0021] Additional aspects and advantages of the present invention will be given in part in the following description, and in part will become apparent from the following description, or will be learned through the practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] The above and / or additional aspects and advantages of the present invention will become apparent and easily understood from the description of the embodiments in conjunction with the following drawings, in which:

[0023] Figure 1 is a circuit diagram of a driving sampling circuit in the related art;

[0024] Figure 2 is a schematic diagram of an equivalent circuit of a failure of a driving sampling circuit in the related art;

[0025] Figure 3 is a circuit diagram of a driving sampling circuit according to an embodiment of the utility model;

[0026] Figure 4 is a circuit diagram of a driving sampling circuit according to another embodiment of the utility model;

[0027] Figure 5 is a circuit diagram of a driving sampling circuit according to another embodiment of the utility model;

[0028] Figure 6 is a structural block diagram of a chip according to an embodiment of the utility model;

[0029] Figure 7 It is a structural block diagram of an electronic device according to an embodiment of the utility model.

[0030] Reference numerals: driving sampling circuit 10;

[0031] Isolation circuit 1; Detection circuit 2;

[0032] Isolation sub-circuit 11;

[0033] Chip 100;

[0034] IO port 101;

[0035] Electronic device 200. DETAILED DESCRIPTION

[0036] The embodiments of the present utility model are described in detail below. The embodiments described with reference to the accompanying drawings are exemplary. The embodiments of the present utility model are described in detail below.

[0037] In related technologies, such as Figure 2As shown, it is a schematic diagram of an equivalent circuit for failure of a driving sampling circuit in the related art. When the resistance value at both ends of the buzzer changes, for example, due to moisture in the buzzer and electrical corrosion, the resistance value at both ends of the buzzer will decrease, thereby generating an equivalent resistor R5. It should be noted that the equivalent resistor R5 does not exist in the actual circuit. The reduced resistance value is equivalent to a resistor R5 connected in parallel at both ends of the buzzer. The power supply VCC connected to the buzzer is grounded through the equivalent resistor R5, resistor R1, resistor R2 and resistor R4 to form a complete DC circuit. At this time, it will affect the detection circuit of the NTC resistor, namely the resistor R3, and the sampled temperature value will be abnormal, thereby causing abnormal AD sampling.

[0038] Reference below Figure 3-Figure 5 The driving sampling circuit 10 according to the embodiment of the present invention is described.

[0039] like Figure 3-Figure 5 As shown, the drive sampling circuit 10 of the embodiment of the utility model includes: a drive circuit (not shown in the figure), a detection circuit 2 and an isolation circuit 1, wherein:

[0040] The driving circuit is used to receive a driving signal to drive the buzzer to work; the detection circuit 2 is connected to the driving circuit and is used to receive a voltage signal for AD sampling; the isolation circuit 1 is respectively connected to the detection circuit 2 and the driving circuit and is used to isolate the driving circuit and the detection circuit 2 when the detection circuit 2 performs AD sampling.

[0041] In the embodiment, the MCU outputs a driving signal through the IO port. After the driving circuit receives the driving signal, the power supply VCC connected to the buzzer is grounded through the driving circuit to form a complete DC loop, thereby driving the buzzer to drive the buzzer to work; the MCU outputs a voltage signal through the IO port. After the detection circuit 2 receives the voltage signal, the power supply VCC connected to the detection circuit 2 is grounded through the detection circuit 2 to form a complete DC loop to perform AD sampling on the voltage value of the detection circuit.

[0042] When the detection circuit 2 performs AD sampling, if the resistance value at both ends of the buzzer changes, for example, because the buzzer becomes damp and water vapor enters and produces electrical corrosion, the resistance value at both ends of the buzzer becomes smaller, which may affect the voltage value of the detection circuit 2 performing AD sampling. In this way, an isolation circuit 1 is set between the detection circuit 2 and the drive circuit to isolate the drive circuit and the detection circuit 2 when the detection circuit 2 performs AD sampling, so that the DC circuit of the original drive circuit is destroyed, which is equivalent to the drive circuit being open-circuited, thereby preventing the changed resistance value in the drive circuit from affecting the voltage value of the detection circuit 2, thereby sampling a normal temperature value.

[0043] According to the drive sampling circuit 10 of the embodiment of the utility model, an isolation circuit 1 is set between the detection circuit 2 and the drive circuit to isolate the drive circuit and the detection circuit 2, thereby avoiding the adverse effect of the changing resistance value of the buzzer at both ends of the drive circuit on the voltage value sampled by the detection circuit 2 when the detection circuit 2 performs AD sampling, so that the detection circuit 2 can sample a normal temperature value, thereby ensuring the correctness of AD sampling.

[0044] In some embodiments, the driving circuit includes: a first resistor R1, a second resistor R2 and a third resistor R4, wherein one end of the first resistor R1 is connected to the buzzer; the other end of the second resistor R2 is connected to the other end of the first resistor R1; one end of the third resistor R4 is connected to one end of the second resistor R2, and the other end of the third resistor R4 is grounded.

[0045] In the embodiment, the MCU outputs a driving signal through the IO port. After the driving circuit receives the driving signal output by the MCU, the power supply VCC connected to the buzzer is grounded through the first resistor R1, the second resistor R2 and the third resistor R4 to form a complete DC circuit, thereby driving the buzzer to work.

[0046] In some embodiments, Figure 3 FIG. 1 is a schematic diagram of a driving sampling circuit of an embodiment of the utility model. The isolation circuit 1 includes: a first capacitor C1, one end of the first capacitor C1 is connected to the other end of the first resistor R1, and the other end of the first capacitor C1 is connected to the other end of the second resistor R2, and is used to isolate the driving circuit and the detection circuit 2 when the detection circuit 2 performs AD sampling.

[0047] In an embodiment, when the detection circuit 2 performs AD sampling, if the resistance value at both ends of the buzzer changes, for example, because the buzzer becomes damp and water vapor enters and produces electrical corrosion, the resistance value at both ends of the buzzer becomes smaller, which may affect the voltage value of the detection circuit 2 performing AD sampling. In this way, a first capacitor C1 is set between the first resistor R1 and the second resistor R2, so that when the detection circuit 2 performs AD sampling, the AC-passing and DC-isolating characteristics of the capacitor are used to isolate the drive circuit and the detection circuit 2, so that the DC circuit of the original drive circuit is destroyed, which is equivalent to the drive circuit being open-circuited and disconnected, thereby preventing the changed resistance value in the drive circuit from affecting the voltage value of the detection circuit 2, thereby sampling a normal temperature value.

[0048] In some embodiments, the isolation circuit 1 includes: an isolation sub-circuit 11, a first end of the isolation sub-circuit 11 is connected to the other end of the first resistor R1, a second end of the isolation sub-circuit 11 is grounded, and a third end of the isolation sub-circuit 11 is connected to the other end of the second resistor R2, and is used to isolate the driving circuit and the detection circuit 2 when the detection circuit 2 performs AD sampling.

[0049] In an embodiment, when the detection circuit 2 performs AD sampling, if the resistance value at both ends of the buzzer changes, for example, because the buzzer becomes damp and water vapor enters and produces electrical corrosion, the resistance value at both ends of the buzzer becomes smaller, which may affect the voltage value of the detection circuit 2 performing AD sampling. In this way, an isolation sub-circuit 11 is set between the first resistor R1 and the second resistor R2, and the third end of the isolation sub-circuit 11 is grounded, so as to isolate the drive circuit and the detection circuit 2 when the detection circuit 2 performs AD sampling, so that the DC circuit of the original drive circuit is destroyed, which is equivalent to the drive circuit being open-circuited and disconnected, thereby preventing the changed resistance value in the drive circuit from affecting the voltage value of the detection circuit 2, thereby sampling a normal temperature value.

[0050] In some embodiments, Figure 4 , which is a circuit diagram of a driving sampling circuit of another embodiment of the utility model. The isolation subcircuit 11 includes: a first MOS transistor Q1, the drain of the first MOS transistor Q1 is connected to the other end of the first resistor R1, the source of the first MOS transistor Q1 is grounded, and the gate of the first MOS transistor Q1 is connected to the other end of the second resistor R2, which is used to shut down when the detection circuit 2 performs AD sampling.

[0051] In the embodiment, the MCU outputs a driving signal through the IO port. After the driving circuit receives the driving signal, the first MOS tube Q1 is turned on, and the power supply VCC connected to the buzzer is grounded through the first resistor R1 and the drain and source of the first MOS tube Q1 to form a complete DC loop, thereby driving the buzzer to work.

[0052] When the detection circuit 2 performs AD sampling, if the resistance value at both ends of the buzzer changes, for example, because the buzzer is damp and water vapor enters and produces electrical corrosion, the resistance value at both ends of the buzzer becomes smaller, which may affect the voltage value of the AD sampling of the detection circuit 2. Then, the gate of the first MOS tube Q1 does not output the corresponding level. By turning off the first MOS tube Q1 to isolate the drive circuit and the detection circuit 2, the DC circuit of the original drive circuit is destroyed, which is equivalent to the drive circuit being open-circuited, thereby preventing the changed resistance value in the drive circuit from affecting the voltage value of the detection circuit 2, thereby sampling a normal temperature value.

[0053] In some embodiments, Figure 5 FIG. 1 is a schematic diagram of a driving sampling circuit according to another embodiment of the present invention. The isolation subcircuit 11 further includes: a second capacitor C2, one end of the second capacitor C2 is connected to the gate of the second MOS transistor Q2, and the other end of the second capacitor C2 is grounded.

[0054] In the embodiment, when the detection circuit 2 performs AD sampling, if the resistance value at both ends of the buzzer changes, for example, because the buzzer is damp and water vapor enters and generates electrical corrosion, the resistance value at both ends of the buzzer becomes smaller, which may affect the voltage value of the detection circuit 2 performing AD sampling, then the gate of the second MOS tube Q2 does not output the corresponding level, and the second MOS tube Q2 is connected in series with the second capacitor C2, and the drive circuit and the detection circuit 2 are isolated by turning off the second MOS tube Q2, and the AC-passing and DC-isolating characteristics of the capacitor are used to further isolate the drive circuit and the detection circuit 2, so that the DC circuit of the original drive circuit is destroyed, which is equivalent to the open circuit of the drive circuit, so as to prevent the changed resistance value in the drive circuit from affecting the voltage value of the detection circuit 2, thereby sampling a normal temperature value, and by simultaneously providing the second MOS tube Q2 and the second capacitor C2, a double isolation effect is achieved, and even if the second MOS tube Q2 fails, the accuracy of the AD sampling is improved due to the isolation effect of the second capacitor C2.

[0055] In some embodiments, the driving circuit further includes: a fourth resistor R5, one end of the fourth resistor R5 is connected to the other end of the second resistor R2, and the other end of the fourth resistor R5 is connected to the gate of the first MOS transistor Q1.

[0056] In some embodiments, the driving circuit also includes: a fifth resistor R3, one end of the fifth resistor R3 is connected to the power supply VCC, and the other end of the fifth resistor R3 is respectively connected to one end of the second resistor R2 and the third resistor R4, so as to form a detection circuit 2 with the second resistor R2 and the third resistor R4, and the fifth resistor R3, the second resistor R2 and the third resistor R4 cooperate with each other to realize the sampling function, so as to perform AD sampling on the voltage division value of the NTC resistor, i.e., the fifth resistor R3, so as to determine the temperature value.

[0057] According to the drive sampling circuit 10 of the embodiment of the utility model, an isolation circuit 1 is set between the detection circuit 2 and the drive circuit to isolate the drive circuit and the detection circuit 2, thereby avoiding the adverse effect of the changing resistance value of the buzzer at both ends of the drive circuit on the voltage value sampled by the detection circuit 2 when the detection circuit 2 performs AD sampling, so that the detection circuit 2 can sample a normal temperature value, thereby ensuring the correctness of AD sampling.

[0058] Combine the following Figure 6 The chip 100 of the present invention is described.

[0059] As shown in the figure, the chip 100 of the present invention includes: an IO port 101 and a drive sampling circuit 10, wherein:

[0060] The driving sampling circuit 10 is connected to the IO port 101 and is used to perform a driving function or a sampling function according to the state of the IO port 101 .

[0061] In the embodiment, the MCU performs time-division multiplexing through the IO port 101 to perform buzzer driving and AD sampling. When the IO port 101 is in the output state, the MCU outputs a driving signal through the IO port 101. After the driving circuit in the driving sampling circuit 10 receives the driving signal, the power supply VCC connected to the buzzer is grounded through the driving circuit to form a complete DC circuit, thereby realizing the driving function of the buzzer to drive the buzzer to work.

[0062] When the IO port 101 is in the input state, the MCU outputs a voltage signal through the IO port 101. After the detection circuit 2 in the driving sampling circuit 10 receives the voltage signal, the power supply VCC connected to the detection circuit 2 is grounded through the detection circuit 2 to form a complete DC loop to sample the voltage value of the detection circuit and realize the AD sampling function.

[0063] When the detection circuit 2 performs AD sampling, if the resistance value at both ends of the buzzer changes, for example, because the buzzer becomes damp and water vapor enters and produces electrical corrosion, the resistance value at both ends of the buzzer becomes smaller, which may affect the voltage value of the detection circuit 2 performing AD sampling. In this way, an isolation circuit 1 is set between the detection circuit 2 and the drive circuit to isolate the drive circuit and the detection circuit 2 when the detection circuit 2 performs AD sampling, so that the DC circuit of the original drive circuit is destroyed, which is equivalent to the drive circuit being open-circuited, thereby preventing the changed resistance value in the drive circuit from affecting the voltage value of the detection circuit 2, thereby sampling a normal temperature value.

[0064] According to the chip 100 of the embodiment of the utility model, an isolation circuit 1 is set between the detection circuit 2 and the driving circuit to isolate the driving circuit and the detection circuit 2, thereby avoiding the adverse effect of the changing resistance value at both ends of the buzzer in the driving circuit on the voltage value sampled by the detection circuit 2 when the detection circuit 2 performs AD sampling, so that the detection circuit 2 can sample a normal temperature value, thereby ensuring the correctness of AD sampling.

[0065] Combine the following Figure 7 An electronic device 200 of the present invention is described.

[0066] like Figure 7 As shown, the electronic device 200 of the present invention includes the chip 100 of the above embodiment.

[0067] According to the electronic device 200 of the embodiment of the utility model, an isolation circuit 1 is set between the detection circuit 2 and the driving circuit to isolate the driving circuit and the detection circuit 2, thereby avoiding the adverse effect of the changing resistance value at both ends of the buzzer in the driving circuit on the voltage value sampled by the detection circuit 2 when the detection circuit 2 performs AD sampling, so that the detection circuit 2 can sample a normal temperature value, thereby ensuring the correctness of the AD sampling.

[0068] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "illustrative embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials, or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the utility model. In this specification, the schematic expressions of the above terms do not necessarily refer to the same embodiment or example.

[0069] Although the embodiments of the present invention have been shown and described, those skilled in the art will appreciate that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the claims and their equivalents.

Claims

1. A drive sampling circuit, characterized in that: include: A driving circuit, used for receiving a driving signal to drive the buzzer to work; A detection circuit, connected to the driving circuit, for receiving a voltage signal for AD sampling; The isolation circuit is connected to the detection circuit and the driving circuit respectively, and is used to isolate the driving circuit from the detection circuit when the detection circuit performs AD sampling.

2. The driving sampling circuit according to claim 1, characterized in that: The driving circuit comprises: a first resistor, one end of which is connected to the buzzer; a second resistor, the other end of the second resistor being connected to the other end of the first resistor; A third resistor, one end of the third resistor is connected to one end of the second resistor, and the other end of the third resistor is grounded.

3. The driving sampling circuit according to claim 2, characterized in that: The isolation circuit comprises: A first capacitor, one end of which is connected to the other end of the first resistor, and the other end of which is connected to the other end of the second resistor, is used to isolate the driving circuit and the detection circuit when the detection circuit performs AD sampling.

4. The driving sampling circuit according to claim 2, characterized in that: The isolation circuit comprises: An isolation sub-circuit, wherein a first end of the isolation sub-circuit is connected to the other end of the first resistor, a second end of the isolation sub-circuit is grounded, and a third end of the isolation sub-circuit is connected to the other end of the second resistor, and is used to isolate the drive circuit and the detection circuit when the detection circuit performs AD sampling.

5. The driving sampling circuit according to claim 4, characterized in that: The isolation subcircuit comprises: A first MOS transistor, wherein the drain of the first MOS transistor is connected to the other end of the first resistor, the source of the first MOS transistor is grounded, and the gate of the first MOS transistor is connected to the other end of the second resistor, and is used to be turned off when the detection circuit performs AD sampling.

6. The driving sampling circuit according to claim 5, characterized in that: The isolation subcircuit also includes: A second capacitor, one end of the second capacitor is connected to the gate of the second MOS tube, and the other end of the second capacitor is grounded.

7. The driving sampling circuit according to claim 5, characterized in that: The driving circuit further includes: A fourth resistor, one end of the fourth resistor is connected to the other end of the second resistor, and the other end of the fourth resistor is connected to the gate of the first MOS tube.

8. The driving sampling circuit according to claim 2, characterized in that: The driving sampling circuit also includes: A fifth resistor, one end of the fifth resistor is connected to the power supply, and the other end of the fifth resistor is respectively connected to one end of the second resistor and the third resistor to form the detection circuit with the second resistor and the third resistor.

9. A chip, characterized in that: include: IO ports; The drive sampling circuit according to any one of claims 1 to 8, connected to the IO port, and configured to perform a drive function or a sampling function according to a state of the IO port.

10. An electronic device, characterized in that: include: The chip as claimed in claim 9.

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