Transparent conductive glass substrate detection equipment

Abstract

The utility model relates to the technical field of photovoltaic thin film batteries, and particularly discloses transparent conductive glass substrate detection equipment. The transparent conductive glass substrate detection equipment comprises a rack, a conveying mechanism and a detection assembly. The rack is provided with a detection station; the conveying mechanism drives the substrate to move towards the detection station in the first direction; the detection assembly carries out spot check on different point positions of the substrate in the first direction and / or the second direction, and a spot check path is formed. In the application, the detection assembly at least detects the resistance or the light transmittance of the transparent conductive glass substrate, the photovoltaic substrate does not need to be taken down from a production line, the detection process is simple, the detection efficiency is high, and the production is smoothly carried out; the substrate does not need to be damaged, procedures are reduced, and cost is saved; in addition, the detection assembly can detect each substrate, the detection data volume is large, the detection result is accurate, the objectivity is high, and errors are reduced.

Description

Technical Field

[0001] The present application relates to the technical field of photovoltaic thin-film batteries, and specifically discloses a transparent conductive glass substrate detection device. Background Art

[0002] This section is used to explain the content related to the present application, which is not necessarily the disclosed prior art.

[0003] In related technologies, the photoelectric conversion efficiency of photovoltaic thin-film cells is gradually improving. In the actual production of photovoltaic thin-film cells, for example, in the field of perovskite photovoltaic cells, in order to ensure the overall quality of the substrate, it is necessary to remove some transparent conductive glass substrates from the production line and cut them into multiple blocks for manual sampling. This process is relatively cumbersome, the detection takes a long time, the detection efficiency is low, and the production speed is slowed down; it also requires the destruction of some substrates, which consumes material costs; in addition, manual sampling lacks objectivity and is prone to detection errors. Utility Model Content

[0004] The purpose of this application is to solve at least part of the technical problems raised in the above content, and this purpose is achieved through the following technical solutions:

[0005] The present application proposes a transparent conductive glass substrate detection device, which includes a frame, a transmission mechanism and a detection component. The frame has a detection station; the transmission mechanism is installed on the frame, and the transmission mechanism can move the substrate toward the detection station along a first direction; the detection component is relatively displaced at the detection station of the frame, and the detection component includes a displacement module and a light-transmitting detection component and / or a square resistance detection component arranged on the displacement module. The detection component performs random inspections on different points of the substrate along the first direction and / or the second direction, and forms a random inspection path; wherein the first direction intersects with the second direction.

[0006] In some embodiments, the light-transmitting detection component includes a transmitter and a receiver; the transmitter and the receiver are respectively located on both sides of the transmission mechanism in the third direction, and the transmitter and the receiver move synchronously along the first direction and / or the second direction; wherein the first direction, the second direction and the third direction intersect with each other.

[0007] In some embodiments, the square resistance detection component includes an electromagnetic emission module and an induction probe module separately arranged on both sides of the detection station in the third direction, and the electromagnetic emission module and the induction probe module move synchronously.

[0008] In some embodiments, the square resistance detection member and the light transmission detection member move synchronously along the first direction and / or the second direction.

[0009] In some embodiments, the sampling path is in a "V" shape, a "W" shape, an "S" shape, a "Z" shape, or a "U" shape.

[0010] In some embodiments, the transparent conductive glass substrate inspection device further includes a visual component, which is fixed above the inspection station or synchronously displaced with the light transmission inspection component and / or the square resistance inspection component.

[0011] In some embodiments, the visual component includes a light source and a visual camera; the light source is installed at the inspection station of the frame, and the light emitted by the light source at least covers the inspection station; the visual camera is fixed above the inspection station or movably set on the displacement module, and the visual camera can capture the appearance image of the substrate.

[0012] In some embodiments, the displacement module is disposed on a frame or a fixed carrier, and the light transmission detection element and / or the square resistance detection element is disposed on the movable end of the displacement module.

[0013] In some embodiments, the transparent conductive glass substrate detection device further includes two positioning jaws installed on the frame, the two positioning jaws are separately arranged on both sides of the detection station in the second direction, and a substrate clamping space is formed between the two positioning jaws.

[0014] In some embodiments, the positioning jaws have a plurality of flexible teeth that press against the edge of the substrate.

[0015] The transparent conductive glass substrate detection device provided by the present application has at least the following technical effects:

[0016] In the present application, after the conveying mechanism moves the substrate along the first direction toward the inspection station, the inspection component performs random inspections on different points of the substrate along the first direction and / or the second direction, at least detecting the resistance or transmittance of the transparent conductive glass substrate. There is no need to remove the photovoltaic substrate from the production line. The inspection process is simple and the inspection efficiency is high, so that production can proceed smoothly. There is no need to damage the substrate, which reduces the process and saves costs. In addition, the inspection component can inspect each substrate, the amount of inspection data is large, the inspection results are accurate, the objectivity is strong, and the error is reduced. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to better combine the contents shown in the drawings of the specification with the contents described in the specific implementation methods, the drawings of the specification are briefly introduced below. It can be understood that the drawings of the specification mentioned below only schematically show some embodiments of the relevant technical solutions and the solutions of this application, and those skilled in the art can also make drawings showing other embodiments without creative work.

[0018] Specifically, the description of the drawings of the specification is as follows:

[0019] Figure 1 It is a front view schematic diagram of the transparent conductive glass substrate detection device according to the embodiment of the present application;

[0020] Figure 2 A schematic top view of a transparent conductive glass substrate detection device according to an embodiment of the present application;

[0021] Figure 3 This is a schematic diagram of the structure of the substrate described in the embodiment of the present application.

[0022] Specifically, the description of the accompanying drawings is as follows:

[0023] 100, transparent conductive glass substrate detection equipment; 110, frame; 120, transmission mechanism; 130, light transmission detection element; 131, transmitter; 132, receiver; 140, square resistance detection element; 150, light source element; 160, visual camera; 170, positioning jaws; 171, flexible teeth; 180, displacement module; 200, substrate; L1, engraved line; L2, sampling path; X, first direction; Y, second direction; Z, third direction. DETAILED DESCRIPTION

[0024] In order to make the contents of the embodiments of the present application clearer, the following description will be made in conjunction with the accompanying drawings. It can be understood that the contents mentioned below are only part of the embodiments of the present application, rather than all the embodiments. Based on this, other embodiments derived by those skilled in the art without creative work are within the scope of protection of this application.

[0025] It should be understood that the terms used herein are for the purpose of describing specific embodiments only and are not intended to be limiting, and unless the context clearly indicates otherwise, the singular forms "a", "an", and "the" as used herein may also be meant to include plural forms. The terms "include", "comprise", and "have" are inclusive and therefore specify the presence of stated features, elements, and / or components, but do not exclude the presence or addition of one or more other features, elements, components, and / or combinations thereof.

[0026] Although the terms first, second, etc. may be used in the text to describe multiple elements, components, regions, layers and / or sections, these elements, components, regions, layers and / or sections should not be limited by these terms. These terms may only be used to distinguish one element, component, region, layer or section from another region, layer or section. Unless the context clearly indicates otherwise, terms such as "first", "second" and other numerical terms do not imply order or sequence when used in the text. In addition, in the description of the present application, unless otherwise clearly specified and limited, the terms "set", "connect", and "install" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be directly connected or indirectly connected through an intermediate medium. For those skilled in the art, the specific meanings of the above terms in this application can be understood according to the specific circumstances.

[0027] For ease of description, spatial relative terms may be used herein to describe the relationship of one element or feature relative to another element or feature, such as "inside", "outside", "end", "side", "middle", "upper", "lower", "high", "lower", "axial", "circumferential", "radial", "horizontal", "vertical", "first direction", "second direction", etc. Such spatial relative terms are intended to include different orientations of the mechanism in use or operation in addition to the orientation shown in the figures.

[0028] The following mainly describes the embodiments of the present application in conjunction with the accompanying drawings.

[0029] Reference Figure 1 The present application proposes a transparent conductive glass substrate detection device 100, which includes a frame 110, a conveying mechanism 120 and a detection component. The frame 110 has a detection station; the conveying mechanism 120 is installed on the frame 110, and the conveying mechanism 120 can move the substrate 200 toward the detection station along the first direction X; the detection component is relatively displaced at the detection station of the frame 110, and the detection component includes a displacement module 180 and a light transmission detection member 130 and / or a square resistance detection member 140 arranged on the displacement module 180. The detection component performs random inspections on different points of the substrate 200 along the first direction X and / or the second direction Y, and forms a random inspection path L2; wherein the first direction X intersects with the second direction Y.

[0030] Preferably, the first direction X and the second direction Y are perpendicular to each other.

[0031] In the present application, after the conveying mechanism 120 moves the substrate 200 toward the detection station along the first direction X, the detection component performs random inspections on different points of the substrate 200 along the first direction X and / or the second direction Y, at least detecting the resistance or transmittance of the transparent conductive glass substrate 200, without removing the photovoltaic substrate 200 from the production line, the detection process is simple, the detection efficiency is high, and the production proceeds smoothly; and there is no need to destroy the substrate 200, the process is reduced, and the cost is saved; in addition, the detection component can detect each substrate 200, the detection data volume is large, the detection result is accurate, the objectivity is strong, and the error is reduced.

[0032] In addition, in some embodiments, the sampling path L2 is any one of a "V" shape, a "W" shape, an "S" shape, a "Z" shape, and a "U" shape, or a switching combination of any of the above. Figure 3 , the figure shows a “V”-shaped sampling path L2, and other forms of sampling paths L2 are no longer shown one by one.

[0033] In some embodiments, reference Figure 1 and Figure 2 , the light transmission detection member 130 includes a transmitter 131 and a receiver 132; the transmitter 131 and the receiver 132 are respectively located on both sides of the transmission mechanism 120 in the third direction Z, and the transmitter 131 and the receiver 132 move synchronously along the first direction X and / or the second direction Y; wherein the first direction X, the second direction Y and the third direction Z intersect each other. Further, in some embodiments, the square resistance detection member 140 includes an electromagnetic emission module and an induction probe module separately arranged at the detection station on both sides of the third direction Z, and the electromagnetic emission module and the induction probe module move synchronously. In addition, in some embodiments, the square resistance detection member 140 moves synchronously with the light transmission detection member 130 along the first direction X and / or the second direction Y.

[0034] Preferably, the first direction X, the second direction Y and the third direction Z are perpendicular to each other.

[0035] In the above embodiment, the light transmission detection element 130 is used to detect the transmittance of the substrate 200 to light within a specific wavelength or wavelength range, thereby evaluating the light transmission performance of the transparent conductive glass substrate 200, which is crucial to ensuring the photoelectric conversion efficiency of the solar cell. Specifically, in some embodiments, the transmitter 131 can emit a suitable light beam, which can be a light beam simulating sunlight or a monochromatic light of a specific wavelength to cover the spectral range to which the solar cell is sensitive; at the same time, the receiver 132 receives the light beam and records the light intensity after passing through the substrate 200, and compares it with the light intensity when it is emitted, thereby obtaining the transmittance expressed in the form of a percentage, and by analogy, the transmission spectrum at different wavelengths can be obtained.

[0036] In addition, it should be noted that square resistance refers to the resistance value of a specific area on the substrate 200. Square resistance detection is also called block resistance detection. It is an important step in the production process of solar cells. It is mainly used to measure the resistivity distribution of the substrate 200. Resistivity is one of the key factors affecting the performance of solar cells because it is directly related to the conductivity and photoelectric conversion efficiency of the battery.

[0037] Specifically, in the above embodiment, the square resistance detection element 140 measures the voltage and current at different points of the substrate 200 according to the cooperation between the electromagnetic emission module and the induction probe module, so that the square resistance value can be calculated. During the detection process, multiple test points are selected on the substrate 200 to ensure the representativeness and accuracy of the test results.

[0038] In addition, in some embodiments, reference Figure 1 The transparent conductive glass substrate detection device 100 also includes a displacement module 180, which includes a first displacement mechanism and a second displacement mechanism respectively arranged on the upper and lower sides of the detection station, a transmitter 131 and an electromagnetic transmission module are arranged at the displacement end of the first displacement mechanism, and a receiver 132 and a sensing probe module are arranged at the displacement end of the second displacement mechanism; specifically, the displacement module 180 can be a two-dimensional or three-dimensional displacement module.

[0039] In some embodiments, the transparent conductive glass substrate inspection device 100 further includes a visual component, which is fixed above the inspection station or synchronously displaced with the light transmission inspection component 130 and / or the square resistance inspection component 140. Specifically, in some embodiments, referring to Figure 1 and Figure 2 , the visual component includes a light source 150 and a visual camera 160; the light source 150 is installed at the detection station of the frame 110, and the light emitted by the light source 150 at least covers the detection station; the visual camera 160 is fixed above the detection station or movably set on the displacement module 180, and the visual camera 160 can collect the appearance image of the substrate 200. Further, in some embodiments, the displacement module 180 is set on the frame 110 or the fixed carrier, and the light transmission detection component 130 and / or the square resistance detection component 140 are set on the mobile end of the displacement module 180.

[0040] In the above embodiment, the light source 150 emits an illumination light covering the inspection station, and the visual camera 160 with high sensitivity and high resolution performs photosensitivity and imaging to identify tiny defects on the surface and / or inside of the substrate 200, such as hidden cracks, broken edges, color difference, missing corners, stains, bubbles, scratches, broken lines and other defects.

[0041] Furthermore, in actual production, the visual component works together with the light transmission detection component 130 and the square resistance detection component 140 to comprehensively evaluate the performance of the substrate 200; and the above detection components are all contactless detection, avoiding secondary damage to the substrate 200 during the detection process, while improving the detection efficiency and accuracy.

[0042] In some embodiments, the conveying mechanism 120 includes two sets of conveying roller modules, which are arranged at intervals perpendicular to the conveying direction. The conveying roller modules include a plurality of conveying rollers arranged at intervals along the conveying direction, that is, the conveying rollers are arranged corresponding to the edge areas of the substrate 200, and the intervals between the two sets of conveying roller modules are arranged in the second direction Y. The substrate 200 is mounted on the two sets of conveying roller modules and is transmitted forward. An unobstructed area for detecting the displacement and detection of the detection component is formed between the two sets of conveying roller modules.

[0043] In some embodiments, reference Figure 2 The transparent conductive glass substrate inspection device 100 further includes two positioning jaws 170 mounted on the frame 110. The two positioning jaws 170 are separately arranged on both sides of the inspection station in the second direction Y, and a substrate clamping space is formed between the two positioning jaws 170. Further, in some embodiments, the positioning jaws 170 have a plurality of flexible teeth 171, and the flexible teeth 171 are pressed against the edge of the substrate 200.

[0044] In the above embodiment, the two positioning jaws 170 are used to clamp the substrate 200 and center and position the substrate 200 perpendicular to the conveying direction of the conveying mechanism 120. Specifically, the two positioning jaws 170 can remain stationary, and the substrate 200 detection component moves to form a detection path; or the substrate 200 detection component can remain stationary, and the two positioning jaws 170 drive the substrate 200 to move, thereby generating relative displacement with the substrate 200 detection component to form a detection path. The above embodiments all fall within the scope of protection of this application. In addition, the positioning jaws 170 clamp the substrate 200 through the flexible clamping teeth 171, which can prevent damage to the substrate 200 while firmly clamping it.

[0045] In particular, the term "and / or" in this application should be understood as follows:

[0046] First, the term “and / or” located between a first subject and a second subject includes any one of the following meanings: (1) only the first subject; (2) only the second subject; and (3) the first subject and the second subject.

[0047] Secondly, the term "and / or" between the last two entities among three or more entities refers to at least any one of the entities. For example, "the first entity, the second entity and / or the third entity" has the same meaning as "the first entity and / or the second entity and / or the third entity", specifically including the following combinations: (1) only the first entity; (2) only the second entity; (3) only the third entity; (4) the first entity and the second entity without the third entity; (5) the first entity and the third entity without the second entity; (6) the second entity and the third entity without the first entity; and (7) the first entity, the second entity, and the third entity.

[0048] In addition, although the above content describes the embodiments of the present application in conjunction with the accompanying drawings, those skilled in the art can also make various modifications and variations without departing from the concept of the present application, and such modifications and variations are all within the scope defined by the attached claims.

Claims

1. A transparent conductive glass substrate detection device, characterized in that: include: A frame (110), wherein the frame (110) has a detection station; a conveying mechanism (120), the conveying mechanism (120) being mounted on the frame (110), and the conveying mechanism (120) being capable of moving the substrate (200) along a first direction (X) toward the inspection station; A detection component, the detection component is relatively displaced at a detection station of the frame (110), the detection component comprises a displacement module (180) and a light transmission detection component (130) and / or a square resistance detection component (140) arranged on the displacement module (180), the detection component performs random inspections on different points of the substrate (200) along a first direction (X) and / or a second direction (Y), and forms a random inspection path (L2); Wherein, the first direction (X) intersects with the second direction (Y).

2. The transparent conductive glass substrate detection device according to claim 1, characterized in that: The light transmission detection element (130) comprises a transmitter (131) and a receiver (132); The transmitter (131) and the receiver (132) are respectively located on both sides of the transmission mechanism (120) in the third direction (Z), and the transmitter (131) and the receiver (132) move synchronously along the first direction (X) and / or the second direction (Y); The first direction (X), the second direction (Y) and the third direction (Z) intersect each other.

3. The transparent conductive glass substrate detection device according to claim 2, characterized in that: The square resistance detection component (140) comprises an electromagnetic emission module and an induction probe module which are separately arranged on both sides of the detection station in the third direction (Z), and the electromagnetic emission module and the induction probe module are displaced synchronously.

4. The transparent conductive glass substrate detection device according to claim 3, characterized in that: The square resistance detection element (140) and the light transmission detection element (130) move synchronously along the first direction (X) and / or the second direction (Y).

5. The transparent conductive glass substrate detection device according to any one of claims 1 to 4, characterized in that: The sampling path (L2) is in a "V" shape, a "W" shape, an "S" shape, a "Z" shape or a "U" shape.

6. The transparent conductive glass substrate detection device according to any one of claims 1 to 4, characterized in that: The transparent conductive glass substrate detection device (100) further comprises a visual component, which is fixed above the detection station or synchronously displaced with the light transmission detection component (130) and / or the square resistance detection component (140).

7. The transparent conductive glass substrate detection device according to claim 6, characterized in that: The visual component comprises a light source (150) and a visual camera (160); The light source component (150) is installed at a detection station of the frame (110), and the light emitted by the light source component (150) at least covers the detection station; The visual camera (160) is fixed above the inspection station or movably arranged on the displacement module (180), and the visual camera (160) can collect an appearance image of the substrate (200).

8. The substrate inspection device according to claim 1, characterized in that: The displacement module (180) is arranged on a frame (110) or a fixed carrier, and the light transmission detection element (130) and / or the square resistance detection element (140) are arranged on a movable end of the displacement module (180).

9. The transparent conductive glass substrate detection device according to any one of claims 1 to 4, characterized in that: The transparent conductive glass substrate detection device (100) further comprises two positioning jaws (170) mounted on the frame (110), the two positioning jaws (170) being separately arranged on both sides of the detection station in the second direction (Y), and a substrate clamping space is formed between the two positioning jaws (170).

10. The transparent conductive glass substrate detection device according to claim 9, characterized in that: The positioning clamp (170) has a plurality of flexible latch teeth (171), and the flexible latch teeth (171) are pressed against the edge of the substrate (200).

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