Electronic component automatic testing machine

Abstract

An automatic testing machine for electronic components comprises a testing device, a feeding device and a transfer table, the feeding device and the transfer table are matched with the testing device, the testing device comprises two testing tables and a three-arm gripper, and the three-arm gripper is provided with three mechanical arms; the three-arm gripper comprises a mechanical arm installation plate capable of sliding on the horizontal sliding rail, the three mechanical arms are fixedly installed at the two ends and the center of the mechanical arm installation plate respectively, the distance between every two adjacent mechanical arms is equal and defined as S, and the mechanical arm installation plate can be driven by a horizontal driving air cylinder to move horizontally along the horizontal sliding rail. The distance between the transfer bench and the closest test bench and the distance between the adjacent test benches are equal to S. By adopting the automatic testing machine for the electronic components, automatic connection of each electronic component among testing processes can be realized through the three-arm gripper, and a plurality of electronic components can be tested at the same time, so that the working efficiency is improved.

Description

Technical Field

[0001] The utility model belongs to the field of electronic technology, relates to the manufacture of electronic components, and specifically relates to an automatic testing machine for electronic components. Background Art

[0002] After the common-mode inductors, network transformers and other electronic components are initially wound and assembled, they also need to undergo performance testing. After the test is qualified, unqualified products are detected. These electronic components generally require two steps of testing: first, a withstand voltage test, and then a product performance test. The tests need to be performed on different test benches. The test benches in the prior art do not realize automatic operation for loading and transportation between test benches. Manual operation requires multiple personnel to cooperate with each other, which is prone to missed detections and false detections. Utility Model Content

[0003] In order to overcome the defects in the prior art, the utility model discloses an automatic testing machine for electronic components.

[0004] The electronic component automatic testing machine described in the utility model includes a testing device and a feeding device and a transfer table coordinated with the testing device. The testing device includes two test tables and a three-arm gripper, wherein the three-arm gripper has three mechanical arms; the three-arm gripper includes a mechanical arm mounting plate that can slide on a horizontal slide rail, and the three mechanical arms are fixedly installed at both ends and the center of the mechanical arm mounting plate, respectively. The distances between adjacent mechanical arms are equal and defined as S. The mechanical arm mounting plate can be driven by a horizontal driving cylinder to translate along the horizontal slide rail, and the distances between the transfer table and the nearest test table and the adjacent test table are all equal to the S.

[0005] Preferably, the feeding device includes a pair of feeding support feet installed on the workbench, and also includes a feeding slide rail installed on the feeding support feet and a bearing slider arranged on the feeding slide rail, a feeding table that can be placed on the bearing slider and a bearing tooling that can be placed on the feeding table, the bearing tooling is provided with a plurality of bearing stations that match the shape of the electronic components to be tested, and the feeding device also includes a power device for pushing the bearing slider to step forward on the feeding slide rail.

[0006] Preferably, photoelectric induction switches are respectively provided at both ends of the feed slide rail.

[0007] Preferably, the test bench is JK7122 withstand voltage test machine of Jinke Company or ZX2789 comprehensive test machine of Zhixin Precision.

[0008] By adopting the electronic component automatic testing machine of the utility model, each electronic component can be automatically connected between various testing processes through the three-arm gripper, and multiple electronic components can be tested simultaneously, thereby improving work efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0009] Figure 1 It is a schematic diagram of a specific implementation of the electronic component automatic testing machine of the utility model;

[0010] Figure 2 It is a schematic diagram of a specific implementation of the feeding device of the utility model;

[0011] Figure 3 It is a schematic diagram of a specific implementation of the load-bearing tooling of the utility model;

[0012] Figure 4 It is another specific implementation diagram of the electronic component automatic testing machine of the utility model;

[0013] The names of the reference numerals in the figure are: 11-feeding slide rail, 12-feeding support foot, 13-feeding table, 14-carrying tooling, 15-photoelectric sensor switch, 16-electronic components to be tested, 17-carrying station, 21-first test bench, 22-second test bench, 23-first robotic arm, 24-second robotic arm, 25-third robotic arm, 26-horizontal slide rail, 27-robotic arm mounting plate, 28-transfer table. DETAILED DESCRIPTION

[0014] The specific implementation modes of the present utility model are further described in detail below.

[0015] In order to make the purpose, technical solution and advantages of the utility model clearer, the technical solution of the utility model will be clearly and completely described below in combination with the specific implementation methods of the utility model and the corresponding drawings. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments of the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0016] The specific implementation of the utility model is further described in detail below in conjunction with the accompanying drawings.

[0017] The electronic component automatic testing machine of the utility model comprises a testing device and a feeding device and a transfer table 28 matched with the testing device. The testing device comprises two testing tables and a three-arm gripper, wherein the three-arm gripper has three mechanical arms;

[0018] The three-arm gripper includes a robot arm mounting plate 27 that can slide on a horizontal slide rail 26. The three robot arms are fixedly installed at both ends and the center of the robot arm mounting plate. The distance between adjacent robot arms is equal and defined as S. The robot arm mounting plate 27 can be driven by a horizontal driving cylinder to translate along the horizontal slide rail 26. The distance between the transfer table 28 and the nearest test bench and the adjacent test bench is equal to the S.

[0019] like Figure 1 and Figure 4 As shown, the electronic component automatic testing machine includes a first test table 21 and a second test table 22 arranged in sequence, and a three-arm gripper arranged on the first test table 21, the second test table 22;

[0020] The first test bench 21 and the second test bench 22 are respectively used to measure different performances of the electronic components. For example, for a certain type of common-mode inductor, the withstand voltage performance of the electronic component is first tested by the first test bench 21, and then the function of the common-mode inductor is tested by the second test bench 22. During the test, the electronic component needs to be placed with the pin end facing down on the test station of the test bench. The test station is provided with a clamping and testing device 3 to perform performance tests on the electronic components. The test bench is a prior art in this field. For example, the JK7122 withstand voltage tester of Jinke Company or the ZX2789 comprehensive tester of Zhixin Precision can be used as a test bench to test the electronic components.

[0021] like Figure 1 As shown, the three-arm gripper includes a mechanical arm mounting plate 27 that can slide on a horizontal slide rail 26, on which the first mechanical arm 23 and the third mechanical arm 25 are fixedly mounted at both ends, respectively, and the second mechanical arm 24 is located in the center of the mechanical arm mounting plate 27, and is equidistant from the first mechanical arm 23 and the third mechanical arm 25, which is defined as S;

[0022] The mechanical arm mounting plate 27 can be driven by a horizontal driving cylinder to translate along the horizontal slide rail 26 to drive the third, fourth and third mechanical arms to move as a whole. After the mechanical arms are fixed, the distance between adjacent mechanical arms remains unchanged.

[0023] By setting the position of the feeding device, the distance between the position of the grasped workpiece on the feeding device and the first test table 21, the distance between the first test table 21 and the second test table 22, and the distance between the second test table 22 and the feeding device are all equal to the distance S between two adjacent robotic arms on the robotic arm mounting plate 27.

[0024] The robot arm mounting plate 27 of the three-arm gripper is first translated along the horizontal slide rail 26 toward the direction of the position of the grasped workpiece on the feeding device, so that the first robot arm 23 is located just above the grasped workpiece. Due to the distance setting between the first robot arm 23, the second robot arm 24 and the third robot arm 25, the second robot arm 24 and the third robot arm 25 are located just above the test stations of the first test bench 21 and the second test bench 22 respectively.

[0025] Then the three-arm gripper controls the three mechanical arms to descend simultaneously, and the grippers at the end simultaneously grab the electronic components located on the feeding device, the first test table 21 and the second test table 22;

[0026] After the three-arm gripper completes grabbing of electronic components, the three robotic arms rise and translate a distance S along the horizontal slide rail 26 in the direction away from the feeding device, so that the first robotic arm 23, the second robotic arm 24 and the third robotic arm 25 are located just above the first test table 21, the second test table 22 and the transfer table, respectively. The first robotic arm 23, the second robotic arm 24 and the third robotic arm 25 are controlled to descend at the same time to release the grabbed electronic components; and they are placed on the first test table 21, the second test table 22 and the transfer table, respectively.

[0027] After placement is completed, the first test station 21 and the second test station 22 test the electronic components thereon respectively, and the transfer station places the electronic components that have undergone two tests.

[0028] While the first test bench 21 and the second test bench 22 complete the test, the three-arm gripper is translated again toward the direction of the position of the feeding device, so that the first robotic arm 23, the second robotic arm 24 and the third robotic arm 25 are respectively located above the feeding device, the first test bench 21 and the second test bench 22, and then the robotic arms are lowered again to grab the electronic components at the corresponding positions.

[0029] The feeding device and the testing device perform corresponding coordinated operations. Each time the testing device 3 grabs an electronic component on the feeding device, the feeding device repositions another electronic component at a position that can be grabbed by the first robotic arm.

[0030] For example, suppose that the three electronic components placed on the feeding device in chronological order are X1, X2 and X3; suppose that there are no electronic components on the first test table 21 and the second test table 22 in the initial state;

[0031] First, the electronic component X1 is located at a position of the feeding device that can be grasped by the first robot arm, i.e., the grasping position. The three-arm gripper is translated to one side of the feeding device. The first robot arm 23 descends to grasp the electronic component X1, and then translates away from the feeding device to the top of the first test table 21, and X1 is placed on the first test table 21 for testing.

[0032] Then the three-arm gripper is translated to the side of the feeding device again. At this time, another electronic component X2 is placed on the gripping position of the feeding device, and there is an electronic component X1 that has been tested on the first test table 21. The first mechanical arm 23 descends to grab the electronic component X2, and the second mechanical arm 24 descends to grab the electronic component X1 on the first test table 21. After the three-arm gripper grabs, the mechanical arm is raised and translated away from the feeding device, so that the second mechanical arm 24 is located above the second test table 22. The first mechanical arm 23 and the second mechanical arm 24 descend again, and the electronic components X2 and X1 are placed on the first test table 21 and the second test table 22 for testing respectively.

[0033] Then the three-arm gripper is translated to the side of the feeding device again. At this time, the third electronic component X3 is placed on the gripping position of the feeding device, the first test table 21 has the electronic component X2 that has completed the first test, and the second test table 22 has the electronic component X1 that has completed the second test;

[0034] The first robotic arm 23 descends to grab the electronic component X3, and the second robotic arm 24 descends to grab the electronic component X2 on the first test table 21; the third robotic arm 25 descends to grab the electronic component X1 on the second test table 22. After grabbing, the three-arm gripper raises the robotic arms and translates them away from the feeding device, so that the first, second and third robotic arms 25 are located directly above the first test table 21, the second test table 22 and the transfer table, and controls the first robotic arm 23, the second robotic arm 24 and the third robotic arm 25 to descend at the same time to release the grabbed electronic components.

[0035] At this time, the electronic component X1 that has completed two tests is placed on the transfer table 28 by the third robot arm 25. If the test is qualified, it will enter the next process. If the test is unqualified, it will be screened out from the transfer table 28 and will not enter the next process; the electronic component X2 that has completed one test is placed on the second test table 22 by the second robot arm 24 for a second test, and the electronic component X3 that has not been tested yet is placed on the first test table 21 by the third robot arm 25 for a first test; the testing method of each subsequent component is similar, and through the reciprocating motion of the three-arm gripper, each electronic component is tested twice and then placed on the transfer table 28.

[0036] For each operation process, such as the first and second operations, if there is no electronic component on the first test bench 21 and / or the second test bench 22, the second robot arm at the corresponding position has no electronic component to grab.

[0037] like Figure 2 and Figure 3As shown, the feeding device 1 includes a pair of feeding support feet 12 installed on the workbench 9, a feeding slide rail 11 installed on the feeding support feet 12 and a bearing slider disposed on the feeding slide rail 11, a feeding table 13 that can be placed on the bearing slider and a bearing fixture 14 that can be placed on the feeding table 13, and the bearing fixture 14 is as shown in FIG. Figure 3 As shown, a plurality of carrying stations 17 are provided which match the shape of the electronic components 16 to be tested, and the electronic components 16 to be tested are placed on the carrying stations 17 .

[0038] The feeding device 1 also includes a power device for pushing the carrying slider to advance step by step on the feeding slide rail 11, which is usually a cylinder driven by a stepping motor. The carrying slider is driven to slide on the feeding slide rail 11 in a stepping manner, each time sliding a distance of the length of the carrying station 17, and pushing the electronic components to be inspected one by one to a position convenient for the robot to grasp in the next step.

[0039] In a preferred embodiment, photoelectric sensor switches 15 are provided at both ends of the feed slide rail 11 to determine the reset origin when the load-bearing slide block is limited and reset.

[0040] In a preferred embodiment, infrared emitting and receiving devices are respectively provided at both ends of the feed slide rail 11, and the height of the horizontal emission of infrared rays is flush with the height of the electronic component 16 to be detected. When an electronic component 16 to be detected is placed on any carrying station 17, the horizontally emitted infrared rays will be blocked by the electronic component 16 to be detected. When there are no electronic components 16 to be detected on all the carrying stations 17, it means that all the components to be detected have entered the next process, and no new carrying tooling 14 with the electronic components 16 to be detected has been placed. The horizontally emitted infrared rays will be received by the receiving device, and the system will take corresponding actions according to the settings, such as stopping the operation of each component after a certain period of time, and sounding an alarm to remind the staff to load and replace the new electronic component 16 to be detected.

[0041] The three-arm gripper can automatically connect each electronic component between various test processes, and operate and test multiple electronic components at the same time, which improves work efficiency. After the test is completed, it is placed on the transfer table for subsequent operation by manual or mechanical hands in the next process.

[0042] The foregoing describes various preferred embodiments of the utility model. If the preferred implementation modes in various preferred embodiments are not obviously self-contradictory or are based on a certain preferred implementation mode, various preferred implementation modes can be arbitrarily superimposed and used in combination. The embodiments and specific parameters in the embodiments are only for clearly describing the utility model verification process of the utility model owner, and are not used to limit the patent protection scope of the utility model. The patent protection scope of the utility model is still based on its claims. All equivalent structural changes made using the description and drawings of the utility model should be included in the protection scope of the utility model.

Claims

1. An automatic testing machine for electronic components, characterized in that: It comprises a testing device and a feeding device and a transfer table (28) matched with the testing device, wherein the testing device comprises two testing tables and a three-arm gripper, wherein the three-arm gripper has three mechanical arms; The three-arm gripper comprises a robot arm mounting plate (27) which can slide on a horizontal slide rail (26), and the three robot arms are fixedly mounted at both ends and the center of the robot arm mounting plate, respectively. The distances between adjacent robot arms are equal and defined as S. The robot arm mounting plate (27) can be driven by a horizontal driving cylinder to translate along the horizontal slide rail (26), and the distances between the transfer table and the nearest test table and the adjacent test table are equal to S.

2. The electronic component automatic testing machine as claimed in claim 1, characterized in that: The feeding device comprises a pair of feeding support feet (12) mounted on a workbench, a feeding slide rail (11) mounted on the feeding support feet and a bearing slider disposed on the feeding slide rail (11), a feeding table that can be placed on the bearing slider and a bearing fixture (14) that can be placed on the feeding table, wherein the bearing fixture is provided with a plurality of bearing stations (17) that match the shapes of the electronic components to be detected, and the feeding device also comprises a power device for pushing the bearing slider to step forward on the feeding slide rail.

3. The electronic component automatic testing machine as claimed in claim 1, characterized in that: Photoelectric induction switches are respectively arranged at both ends of the feed slide rail.

4. The electronic component automatic testing machine as claimed in claim 1, characterized in that: The test bench is JK7122 withstand voltage test machine of Jinke Company or ZX2789 comprehensive test machine of Zhixin Precision.

Images