Capacitor capacity testing mechanism

By designing a flat pin testing mechanism for capacitance detection, the measurement inaccurate problems caused by small contact surfaces and surface oxidation in the prior art are solved, and higher detection accuracy and testing efficiency are achieved.

CN222812888UActive Publication Date: 2025-04-29CHANGZHOU KUANGJING ELECTRONICS CO LTD
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Patent Information

Application Number
CN202420642730.0
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-03-29
Publication Date
2025-04-29
Estimated Expiration
2034-03-29

AI Technical Summary

Technical Problem

During long-term use of the existing capacitance capacity detection mechanism, the small contact surface when testing the circular leads leads to inaccurate measurements, and the oxidation of the surface of the clamping port affects the accuracy of detection.

Method used

A capacitance capacity testing mechanism is designed, and a flat pin test is used to increase the contact area, reduce oxidation phenomenon, and improve detection accuracy through the combination of workbench, telescopic rod, movable plate and clamping mechanism.

Benefits of technology

It improves detection accuracy, reduces test errors caused by pin surface oxidation, improves overall test efficiency, and is easy to widely promote and use.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to the technical field of testing mechanisms, in particular to a capacitor capacity testing mechanism, which comprises a workbench, a working window is arranged in the middle of the workbench, a telescopic rod is vertically mounted in the working window, a telescopic end of the telescopic rod extends out of the working window and then is connected with a movable plate, a base is horizontally arranged at the upper end of the movable plate, and the base is fixedly connected with the workbench. A test column is vertically arranged on the base, a clamping mechanism is arranged at the upper part of the test column, and the lower end of the test column penetrates through the base and then is connected with a test machine through a wire; the two sides of the test column are respectively provided with an insulating pressure plate, and the lower ends of the insulating pressure plates are fixed on the workbench through a first support. And one end of the insulating pressing plate is connected with a testing machine through a wire. According to the capacitor capacity testing mechanism, flat pin testing is adopted, the contact area is increased, the detection precision is improved, the problem of testing errors caused by pin surface oxidation is reduced, the overall testing efficiency is improved, and wide application and popularization are facilitated.
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Description

Technical Field

[0001] The utility model relates to the technical field of testing mechanisms, in particular to a capacitance testing mechanism. Background Art

[0002] With the continuous development of society, SMD aluminum electrolytic capacitors have been widely used in all walks of life. In the production process of SMD aluminum electrolytic capacitors, the capacitance is usually tested. The capacitance detection mechanism currently used has the following defects during long-term use: 1. When testing round leads, the contact surface is small, and poor contact often occurs, resulting in inaccurate measurements; 2. The test clamp often has surface oxidation, which affects the overall capacitance detection. Summary of the invention

[0003] The technical problem to be solved by the present invention is: in order to solve the problems existing in the above-mentioned background technology, a capacitance testing mechanism is provided, a flat pin test is provided, the contact area is increased, the detection accuracy is improved, the test error problem caused by pin surface oxidation is reduced, the overall test efficiency is improved, and it is convenient for wide promotion and use.

[0004] The utility model adopts the following technical scheme to solve the technical problem: a capacitance test mechanism, comprising a workbench, a work window is arranged in the middle of the workbench, a telescopic rod is vertically installed in the work window, the telescopic end of the telescopic rod is connected to a movable plate after extending out of the work window, a base is horizontally arranged at the upper end of the movable plate, a test column is vertically arranged on the base, a clamping mechanism is arranged at the upper part of the test column, the lower end of the test column passes through the base and is connected to a test machine through a wire; insulating pressure plates are respectively arranged on both sides of the test column, and the lower end of the insulating pressure plate is fixed on the workbench through a first bracket; one end of the insulating pressure plate is connected to the test machine through a wire.

[0005] It is further defined that in the above technical solution, guide sleeves are provided on both sides of the lower end of the movable plate, the guide sleeves are movably provided on guide posts, and the guide posts are vertically installed on the workbench.

[0006] It is further defined that, in the above technical solution, the telescopic rod is fixed in the workbench by a second bracket, which can ensure the stable operation of the telescopic rod.

[0007] It is further defined that, in the above technical solution, the clamping mechanism comprises clamping arms arranged opposite to each other; and a quick clamping test of the capacitor can be achieved by the clamping arms.

[0008] It is further defined that, in the above technical solution, the thickness of the clamping arm after clamping is smaller than the spacing between the insulating pressure plates; such a design is to avoid the clamping placement of the clamping arm interfering with the pressing of the insulating pressure plate.

[0009] Further, in the above technical solution, the movable plate can move up and down within a range of 10-30 mm. Such a design can enable the pins of the capacitor to be pressed by the insulating pressing plate and the test column through the upper and lower movements of the movable plate.

[0010] The beneficial effects of the utility model are as follows: the utility model proposes a capacitance testing mechanism, a flat pin test, which increases the contact area, improves the detection accuracy, reduces the test error problem caused by pin surface oxidation, improves the overall test efficiency, and is convenient for wide promotion and use. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] In order to more clearly illustrate the embodiments of the utility model or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in this application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0012] Figure 1 It is a structural schematic diagram of the utility model.

[0013] The numbers in the accompanying drawings are: 1. workbench, 2. work window, 3. telescopic rod, 4. movable plate, 5. base, 6. test column, 7. insulating pressure plate, 8. first bracket, 9. guide sleeve, 10. guide column, 11. second bracket, 12. clamping arm. DETAILED DESCRIPTION

[0014] In order to make the technical problems, technical solutions and beneficial effects solved by the utility model more clear, the utility model is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the utility model and are not used to limit the utility model.

[0015] In this application, the testing machine adopts the equipment currently used in the market. Such testing can realize the upper and lower pressing of the pins, realize the contact testing of the flat structure, increase the overall contact area, and improve the test accuracy.

[0016] See Figure 1The invention shows a capacitance testing mechanism, which comprises a workbench 1, a work window 2 is provided in the middle of the workbench 1, a telescopic rod 3 is vertically installed in the work window 2, the telescopic end of the telescopic rod 3 is extended out of the work window 2 and connected to a movable plate 4, a base 5 is horizontally provided on the upper end of the movable plate 4, a test column 6 is vertically provided on the base 5, a clamping mechanism is provided on the upper part of the test column 6, the lower end of the test column 6 passes through the base 5 and is connected to a test machine through a wire; insulating pressing plates 7 are respectively provided on both sides of the test column 6, the lower end of the insulating pressing plate 7 is fixed on the workbench 1 through a first bracket 8; one end of the insulating pressing plate 7 is connected to the test machine through a wire.

[0017] Wherein, guide sleeves 9 are arranged on both sides of the lower end of the movable plate 4, and the guide sleeves 9 are movably mounted on guide pillars 10, and the guide pillars 10 are vertically mounted on the workbench 1. The telescopic rod 3 is fixed in the workbench 1 through a second bracket 11. The clamping mechanism includes clamping arms 12 arranged oppositely. The thickness of the clamping arms 12 after clamping is less than the spacing between the insulating pressing plates 7. The range of the movable plate 4 moving up and down is 10-30mm.

[0018] The operating principle of the capacitance test mechanism is as follows:

[0019] First, the operator clamps the capacitor to be tested to the upper end of the test column 6 through the clamping mechanism, and then controls the telescopic rod 3 to extend, so that the movable plate 4 rises, driving the test column 6 to rise and directly against the lower end of the capacitor pin, so that the pin is pressed between the insulating pressure plate 7 and the test column 6 for testing, and the signal is transmitted to the tester in time, which makes the operation convenient and quick.

[0020] What is described above is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes within the technical scope disclosed by the present invention according to the technical scheme and the utility model concept of the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A capacitance testing mechanism, characterized in that: It comprises a workbench, a work window is provided in the middle of the workbench, a telescopic rod is vertically installed in the work window, the telescopic end of the telescopic rod is extended out of the work window and then connected to a movable plate, a base is horizontally arranged at the upper end of the movable plate, a test column is vertically arranged on the base, a clamping mechanism is arranged at the upper part of the test column, the lower end of the test column passes through the base and is connected to a test machine through a wire; insulating pressing plates are respectively arranged on both sides of the test column, the lower end of the insulating pressing plate is fixed to the workbench through a first bracket; one end of the insulating pressing plate is connected to the test machine through a wire.

2. A capacitance testing mechanism according to claim 1, characterized in that: Guide sleeves are arranged on both sides of the lower end of the movable plate, and the guide sleeves are movable sleeves arranged on guide pillars, and the guide pillars are vertically installed on the workbench.

3. A capacitance testing mechanism according to claim 1, characterized in that: The telescopic rod is fixed in the workbench through a second bracket.

4. A capacitance testing mechanism according to claim 1, characterized in that: The clamping mechanism comprises clamping arms which are arranged opposite to each other.

5. A capacitance testing mechanism according to claim 4, characterized in that: The thickness of the clamping arms after clamping is smaller than the spacing between the insulating pressing plates.

6. A capacitance testing mechanism according to claim 1, characterized in that: The movable plate can move up and down in a range of 10-30 mm.