Test device and test system

Abstract

The utility model provides a testing device and a testing system. The testing device comprises a testing base installed on a circuit board, and one side, close to the circuit board, of the testing base is provided with a groove which is used for accommodating a conductive adhesive tape; a positioning hole is formed in the groove, penetrates through the test base to the other side and is used for positioning a to-be-tested element; wherein the conductive adhesive tape is clamped between the groove of the test base and the circuit board, the to-be-tested element is in contact with the conductive adhesive tape through the positioning hole, and the to-be-tested element is electrically connected with the circuit board through the conductive adhesive tape; and the at least one moving part is arranged on the test base and is used for moving the conductive adhesive tape in the groove, so that the to-be-tested element is in contact with different areas of the conductive adhesive tape through the positioning hole.

Description

Technical Field

[0001] The utility model relates to the technical field of device testing, in particular to a testing device and a testing system. Background Art

[0002] Bulk Acoustic Wave (BAW) filters are made of Film Bulk Acoustic Resonator (FBAR) and are finally cut and packaged after going through coating, yellow light, etching and other process steps. To verify whether the BAW filter is qualified, parameter testing is required to detect whether the performance parameters of the chip meet the requirements.

[0003] However, the testing using the current testing device cannot meet the usage requirements, and the testing device needs to be improved urgently. Utility Model Content

[0004] In view of this, the utility model provides a testing device and a testing system.

[0005] In order to achieve the above object, the technical solution of the utility model is implemented as follows:

[0006] In a first aspect, the utility model provides a testing device, comprising: a testing base mounted on a circuit board, a groove being provided on a side of the testing base close to the circuit board, the groove being used to accommodate a conductive rubber strip; a positioning hole being provided in the groove, the positioning hole passing through the testing base to the other side, and being used to position a component to be tested; wherein the conductive rubber strip is clamped between the groove of the testing base and the circuit board, the component to be tested contacts the conductive rubber strip through the positioning hole, and the component to be tested is electrically connected to the circuit board through the conductive rubber strip; and at least one moving component being provided on the testing base, the moving component being used to move the conductive rubber strip in the groove, so that the component to be tested contacts different areas of the conductive rubber strip through the positioning hole.

[0007] In some embodiments, the groove has a first length along a first direction and a first width along a second direction; the groove extends along the first direction and penetrates the test base; wherein the first direction and the second direction intersect.

[0008] In some embodiments, the conductive adhesive strip has a second width along the second direction; wherein the first width and the second width are the same; the moving component is used to move the conductive adhesive strip so that the position of the conductive adhesive strip moves from the first area where the conductive adhesive strip is exposed by the positioning hole to the second area where the conductive adhesive strip is exposed by the positioning hole; wherein the direction from the first area to the second area is the first direction.

[0009] In some embodiments, the conductive adhesive strip has a second length along the first direction and a second width along the second direction; wherein, the first length is the same as the second length, and the first width is greater than the second width; the moving component is used to move the conductive adhesive strip so that the position of the conductive adhesive strip moves from the first area where the conductive adhesive strip is exposed by the positioning hole to the third area where the conductive adhesive strip is exposed by the positioning hole; wherein, the direction from the first area to the third area is the second direction.

[0010] In some embodiments, the testing device further includes: a gasket ring disposed between the conductive rubber strip and the circuit board.

[0011] In some embodiments, at least one through hole is further provided on the test base, and a fastener penetrates through the through hole to fix the test base and the circuit board together.

[0012] In some embodiments, the moving part includes a rolling gear.

[0013] In a second aspect, the utility model provides a test system, which includes: a test device as described in the first aspect of the utility model; a test machine, including a support table and a test socket located on the support table, and the test device is installed on the test socket; a network analyzer, which is electrically connected to a component to be tested through a circuit board and a conductive adhesive strip to test the component to be tested; and a control display table, which is connected to the test machine.

[0014] In some embodiments, the test machine further includes: a coarse height adjustment component, the coarse height adjustment component having a first end and a second end relatively arranged along a planar direction perpendicular to the support platform, and the first end of the coarse height adjustment component is fixedly connected to the support platform; a first rotating cross bar, the first rotating cross bar is arranged along a planar direction parallel to the support platform and the first rotating cross bar has a first end and a second end relatively arranged along an extension direction, and the first end of the first rotating cross bar is connected to the second end of the coarse height adjustment component; an adsorption component, the adsorption component is connected to the second end of the first rotating cross bar and is used to absorb the component to be tested, and the adsorption component is aligned with the test device; wherein, the coarse height adjustment component is used to drive the adsorption component to move along a planar direction perpendicular to the support platform, and the first rotating cross bar is used to drive the adsorption component to move along a planar direction parallel to the support platform.

[0015] In some embodiments, the test machine also includes: a height fine-adjustment component, which is connected to the second end of the first rotating cross bar and the adsorption component, and the height fine-adjustment component is used to drive the adsorption component to press down the component to be tested, so that the component to be tested, the conductive rubber strip and the circuit board are electrically connected.

[0016] In some embodiments, the testing machine further includes: a second rotating cross bar, which is arranged in a direction parallel to the plane of the support platform and connected to the height coarse adjustment component; and a spraying component, which is connected to the second rotating cross bar and is used to spray cleaning liquid onto the conductive rubber strip.

[0017] The embodiment of the utility model provides a test device and a test system. In the utility model, the test device includes a test base installed on a circuit board, the groove on the test base can be used to accommodate a conductive rubber strip, the positioning hole on the test base can be used to position the component to be tested, the conductive rubber strip is clamped between the test base and the circuit board, the component to be tested contacts the conductive rubber strip through the positioning hole, and the component to be tested is electrically connected to the circuit board through the conductive rubber strip; the test base is also provided with a moving part, the moving part is used to move the conductive rubber strip in the groove, so that the component to be tested contacts different areas of the conductive rubber strip through the positioning hole. In this way, the area where the conductive rubber strip contacts the component to be tested can be quickly changed, thereby extending the service life of the conductive rubber strip, reducing the number of times the conductive rubber strip is replaced, thereby saving operation time and improving test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 A schematic diagram of using a probe to test a component to be tested is provided for some examples;

[0019] Figure 2 A schematic diagram of the structure of the test device provided by the utility model;

[0020] Figure 3 A diagram showing the relative positions of the components to be tested, the conductive adhesive strips and the circuit board;

[0021] Figure 4 A front structural schematic diagram of the test device provided by the utility model;

[0022] Figure 5 A schematic diagram of the side structure of the test device provided by the utility model;

[0023] Figure 6 A schematic diagram of the back structure of the testing device provided by the utility model;

[0024] Figure 7 A schematic diagram of horizontally moving the conductive rubber strip in the test device provided by the utility model;

[0025] Figure 8 A schematic diagram of vertically moving the conductive rubber strip in the test device provided by the utility model;

[0026] Fig. 9 A schematic diagram of the cross-sectional structure of the test device provided by the utility model;

[0027] Fig.10 A schematic diagram of a test system provided by the utility model;

[0028] Fig.11 A schematic diagram of a test machine provided by the utility model. DETAILED DESCRIPTION

[0029] The following will combine the implementation mode of the utility model and the accompanying drawings to clearly and completely describe the technical solutions in the implementation mode of the utility model. Obviously, the described implementation mode is only a part of the implementation mode of the utility model, not all the implementation modes. Based on the implementation mode of the utility model, all other implementation modes obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0030] In the following description, a large number of specific details are given to provide a more thorough understanding of the utility model. However, it is obvious to those skilled in the art that the utility model can be implemented without one or more of these details. In other examples, in order to avoid confusion with the utility model, some technical features known in the art are not described; that is, all features of actual embodiments are not described here, and well-known functions and structures are not described in detail.

[0031] In the drawings, the sizes of layers, regions, elements and their relative sizes may be exaggerated for clarity. Like reference numerals denote like elements throughout.

[0032] It should be understood that when an element or layer is referred to as "on ...", "adjacent to ...", "connected to" or "coupled to" other elements or layers, it can be directly on, adjacent to, connected to or coupled to other elements or layers, or there can be intervening elements or layers. On the contrary, when an element is referred to as "directly on ...", "directly adjacent to ...", "directly connected to" or "directly coupled to" other elements or layers, there is no intervening element or layer. It should be understood that although the terms first, second, third, etc. can be used to describe various elements, components, regions, layers and / or parts, these elements, components, regions, layers and / or parts should not be limited by these terms. These terms are only used to distinguish one element, component, region, layer or part from another element, component, region, layer or part. Therefore, without departing from the teachings of the utility model, the first element, component, region, layer or part discussed below can be represented as the second element, component, region, layer or part. And when the second element, component, region, layer or part is discussed, it does not indicate that the utility model necessarily has the first element, component, region, layer or part.

[0033] Spatially relative terms such as "under", "beneath", "below", "under", "above", "above", etc., may be used here for convenience of description to describe the relationship between an element or feature shown in the figure and other elements or features. It should be understood that in addition to the orientation shown in the figure, the spatial relationship terms are intended to also include different orientations of the device in use and operation. For example, if the device in the accompanying drawings is turned over, then the elements or features described as "under other elements" or "under it" or "under it" will be oriented as "on" other elements or features. Therefore, the exemplary terms "under" and "under" may include both upper and lower orientations. The device can be oriented otherwise (rotated 90 degrees or other orientations) and the spatial descriptors used herein are interpreted accordingly.

[0034] The purpose of the terms used herein is only to describe specific embodiments and is not intended to be a limitation of the present invention. When used herein, the singular forms "one", "an" and "said / the" are also intended to include plural forms, unless the context clearly indicates otherwise. It should also be understood that the terms "consisting of" and / or "comprising" when used in this specification determine the presence of the features, integers, steps, operations, elements and / or parts, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, parts and / or groups. When used herein, the term "and / or" includes any and all combinations of the relevant listed items.

[0035] In order to thoroughly understand the present invention, detailed steps and detailed structures will be presented in the following description to illustrate the technical solution of the present invention. The preferred embodiments of the present invention are described in detail below, but in addition to these detailed descriptions, the present invention may also have other implementations.

[0036] Currently, a test socket can be used to fix the component to be tested on a circuit board. Through the electrical connection between a network analyzer and the circuit board, the component to be tested fixed by the test socket and the circuit board are installed as a whole on a test machine for testing.

[0037] refer to Figure 1 , Figure 1 Schematic diagram of using probes to test components to be tested is provided for some examples. Figure 1 As shown, the DUT 102 is electrically connected to the probe 104 on the circuit board 106 through the contact pad (PAD). The DUT 102 is provided with, for example, five contact pads.

[0038] Here, the circuit board 106 may be, for example, a printed circuit board (PCB).

[0039] It should be noted that, on the one hand, the contact position between the contact pad and the probe is limited. If the position of the contact pad is offset, it will lead to incomplete contact between it and the probe, resulting in poor contact and affecting the RF waveform and test value. On the other hand, the probe is expensive and has a short service life, which leads to higher test costs.

[0040] In view of this, in order to solve the above technical problems, the utility model uses a conductive rubber strip instead of a probe to achieve electrical connection between the component to be tested and the circuit board, and the conductive rubber strip contacts the five contact pads on the component to be tested to generate a radio frequency waveform. On the one hand, the contact between the conductive rubber strip and the contact pads on the component to be tested is complete, which can not only ensure the normal yield of the component to be tested, but also help to improve the stability of the test. On the other hand, compared with the probe, the conductive rubber strip has a lower cost and a longer service life, which can effectively reduce the test cost.

[0041] However, during the testing process, it was found that after long-term use, the contact surface of the conductive rubber strip would become worn or dirty, resulting in poor contact between the component to be tested and the circuit board.

[0042] In view of this, the utility model provides a test device and a test system. In the test device provided by the utility model, the contact area between the conductive rubber strip and the component to be tested can be quickly changed, thereby extending the service life of the conductive rubber strip, reducing the number of times the conductive rubber strip is replaced, thereby saving operation time and improving test efficiency. In addition, compared with the use of probes, the use of conductive rubber strips can significantly reduce test costs and improve test stability.

[0043] refer to Figure 2 and Figure 3 , Figure 2 This is a schematic diagram of the structure of the test device provided by the utility model. Figure 3 Figure 1 is a diagram showing the relative position relationship between the component to be tested, the conductive adhesive strip, and the circuit board. Figure 2 and Figure 3 As shown, the utility model provides a testing device 200, which includes: a testing base 204 installed on a circuit board 206, a groove 208 is provided on a side of the testing base 204 close to the circuit board 206, and the groove 208 is used to accommodate a conductive rubber strip 210; a positioning hole 214 is provided in the groove 208, and the positioning hole 214 passes through the testing base 204, and is used to position a component to be tested 202; wherein the conductive rubber strip 210 is sandwiched between the groove 208 of the testing base 204 and the circuit board 206, and the component to be tested 202 contacts the conductive rubber strip 210 through the positioning hole 214, and the component to be tested 202 is electrically connected to the circuit board 206 through the conductive rubber strip 210; at least one moving component 216 is provided on the testing base 204, and the moving component 216 is used to move the conductive rubber strip 210 in the groove 208, so that the component to be tested 202 contacts different areas of the conductive rubber strip 210 through the positioning hole 214.

[0044] For ease of description, a first direction (i.e., D1) and a second direction (i.e., D2) intersecting each other may be defined in the plane where the circuit board 206 is located, and a direction perpendicular to the plane where the circuit board 206 is located may be defined as a third direction (i.e., D3). In some embodiments, the first direction and the second direction may be perpendicular to each other. In other embodiments, the first direction and the second direction may not be perpendicular to each other.

[0045] Here, the test base 204 may include a front side and a back side disposed opposite to each other along a third direction. During the test, the back side of the test base 204 is close to the circuit board 206 , and the front side of the test base 204 is far away from the circuit board 206 .

[0046] Here, the groove 208 is provided on the back of the test base 204. The dimension of the test base 204 along the third direction can be used as the thickness of the test base 204, and the dimension of the groove 208 along the third direction can be used as the thickness of the groove 208. The thickness of the groove 208 is less than the thickness of the test base 204. Further, the thickness of the groove 208 is greater than or equal to the thickness of the conductive adhesive strip 210. The groove 208 can be used to accommodate the conductive adhesive strip 210. In this way, the conductive adhesive strip 210 is sandwiched between the back of the test base 204 and the circuit board 206, and the positioning hole 214 runs through the groove 208. In this way, the component to be tested 202 is provided on the front of the test base 204 and contacts the conductive adhesive strip 210 through the positioning hole 214.

[0047] For example, the shape of the groove 208 may be a rectangle, etc. The utility model has no special limitation on the shape of the groove 208. In practice, the shape of the conductive rubber strip 210 may be used as the standard. Figure 2 In the figure, the shape of the groove 208 is only a rectangle for exemplary description. Figure 2 The front side of the test base 204 is shown schematically, and the groove 208 is located at the back side of the test base 204 , so the outline of the groove 208 is a dotted line.

[0048] Here, the front of the test base 204 may be provided with a limiting groove 212, which can be used to accommodate the component to be tested 202 to achieve preliminary positioning of the component to be tested. The positioning hole 214 is set at the center of the limiting groove 212. The limiting groove 212 is connected to the groove 208 through the positioning hole 214. The opening of the groove 208 and the opening of the limiting groove 212 are relatively arranged along the direction from the front of the test base 204 to the back of the test base 204 (i.e., the third direction). The opening of the groove 208 faces the back of the test base 204, and the groove 208 is used to accommodate the conductive rubber strip 210; the opening of the limiting groove 212 faces the front of the test base 204, and the limiting groove 212 is used to accommodate the component to be tested 202. In this way, the component to be tested 202 contacts the conductive rubber strip 210 through the limiting groove 212 and the positioning hole 214.

[0049] For example, the shape of the limiting groove 212 may be circular, square, or diamond-shaped, etc. The limiting groove 212 may be set as follows according to the thickness of the test base 204: Figure 2 The two layers shown in the figure, the present invention has no special limitation on the shape and number of the limiting grooves 212, as long as the limiting grooves 212 can realize the preliminary positioning of the component to be tested 202 and accommodate the component to be tested 202. In addition, the limiting grooves 212 can also realize alignment with the adsorption components, which will be described in detail below in the test system of the present invention and will not be elaborated here. Figure 2 In the figure, the shape of the limiting groove 212 is only circular for exemplary description.

[0050] Here, the material of the test base 204 may include an insulating material.

[0051] Here, the circuit board 206 may be, for example, a PCB.

[0052] Here, at least one moving component 216 is further provided on the test base 204, and the moving component 216 is used to move the conductive rubber strip 210 in the groove 208, so that the component to be tested 202 contacts different areas of the conductive rubber strip 210 through the positioning hole 214. The moving component 216 can move the conductive rubber strip 210 in any direction in the plane where the circuit board 206 is located. Exemplarily, the moving component 216 can move the conductive rubber strip 210 in a first direction, or the moving component 216 can move the conductive rubber strip 210 in a second direction.

[0053] For example, the number of the moving parts 216 may be 1, 2, 3 or 4, etc. The present invention has no special limitation on the number of the moving parts 216, and those skilled in the art may flexibly select the number according to actual conditions.

[0054] For example, the moving part 216 may move the conductive rubber strip 210 in the groove 208 in a manner including dragging or sliding, etc. The present invention has no special limitation on the manner in which the moving part 216 moves the conductive rubber strip 210 in the groove 208. For example, a slide rail may be provided so that the conductive rubber strip can slide along the first direction or the second direction. For another example, a rolling gear may be provided so that the conductive rubber strip can be dragged along the first direction or the second direction.

[0055] In the test device provided by the utility model, a conductive rubber strip is placed in a groove, and a test base with the conductive rubber strip is fixed on a circuit board. The conductive rubber strip includes a front and a back side that are relatively arranged. The front side of the conductive rubber strip can contact the component to be tested through a positioning hole, and the back side of the conductive rubber strip contacts the circuit board. The component to be tested is placed in the positioning hole through a limiting groove for testing. After the test device is fixed on the test machine, a plurality of components to be tested are placed in the positioning hole through the limiting groove. The components to be tested are tested by contacting the conductive rubber through the positioning hole. During a long test process, part of the conductive rubber strip exposed by the positioning hole will frequently contact the component to be tested, so that the front side (i.e., the contact surface) of the conductive rubber strip is worn or dirty. By moving the conductive rubber strip to change the area where the conductive rubber strip contacts the component to be tested, the service life of the conductive rubber strip is extended, the number of times the conductive rubber strip is replaced is reduced, and thus operation time is saved and test efficiency is improved.

[0056] like Figure 2 As shown, in some embodiments, at least one through hole 218 is further provided on the test base 204 , and a fastener passes through the through hole 218 to fix the test base 204 and the circuit board 206 together.

[0057] Here, a through hole may also be provided at a corresponding position on the circuit board 206, and a fastener (e.g., a screw) may be passed through the through hole 218 on the test base 204 and the through hole on the circuit board 206 to fix the test base 204 and the circuit board 206. At this time, the conductive adhesive strip 210 provided in the groove 208 on the back of the test base 204 may be in close contact with the circuit board 206.

[0058] Exemplarily, the shape of the through hole 218 may be circular or square, etc. The utility model has no special limitation on the shape of the through hole 218. Figure 2 In the figure, the shape of the through hole 218 is only circular for exemplary description. For example, the number of the through holes 218 can be 1, 2, 3 or 4, etc. The utility model has no special limitation on the number of the through holes 218, and those skilled in the art can flexibly select according to actual conditions.

[0059] In some embodiments, the through holes 218 may be evenly distributed along the edge of the test base 204. In this way, when the test base and the circuit board are fixedly connected by fasteners passing through the through holes, the through holes on the test base are subjected to more even forces.

[0060] refer to Figure 4 , Figure 5 and Figure 6 , Figure 4 , Figure 5 and Figure 6 The front, side and back structural schematic diagrams of the test device provided by the utility model are shown respectively. Figure 4 , Figure 5 and Figure 6 As shown, in some embodiments, the moving member 216 includes a rolling gear.

[0061] Here, the moving part 216 may include a rolling gear. Figure 4 The illustrated moving component 216 is located at one end of the groove 208 along the first direction. The moving component 216 can drag the conductive rubber strip 210 in the groove 208 along the first direction.

[0062] Here, the limiting groove 212 is disposed on the front side of the test base 204, and the groove 208 is disposed on the back side of the test base 204. Figure 4 In the front structural diagram of the test device, the outline of the limit groove 212 is a solid line, and the outline of the groove 208 is a dotted line; Figure 6 In the schematic diagram of the back structure of the testing device, the outline of the limiting groove 212 is a dotted line, and the groove 208 is a solid line.

[0063] Here, the positioning hole 214 simultaneously penetrates the common bottom surface of the limiting groove 212 and the groove 208, so that the limiting groove 212 and the groove 208 are connected. Figure 4 The front structure diagram of the test device is shown. Figure 6 The outlines of the positioning holes 214 in the schematic diagram of the back structure of the testing device are all solid lines.

[0064] Here, the through hole 218 penetrates the test base 204 along the third direction. Figure 4 The front structure diagram of the test device is shown and Figure 6 In the schematic diagram of the back structure of the test device, the outlines of the through holes 218 are all solid lines.

[0065] refer to Figure 7 , Figure 7 This is a schematic diagram of horizontally moving the conductive rubber strip in the test device provided by the utility model. Figure 7 As shown, in some embodiments, the groove 208 has a first length (ie, L1) along a first direction and a first width (ie, W1) along a second direction; the groove 208 extends along the first direction and penetrates the test base; wherein the first direction and the second direction intersect.

[0066] Here, the groove 208 extending along the first direction and penetrating the test base means that the groove 208 extends along the first direction and the dimension of the groove 208 along the first direction (ie, the first length L1 ) is the same as the dimension of the test base along the first direction.

[0067] like Figure 7 As shown, in some embodiments, the conductive adhesive strip 210 has a second length (i.e., L2) along the first direction, and the conductive adhesive strip 210 has a second width (i.e., W2) along the second direction; wherein the first width W1 and the second width W2 are the same; the moving component is used to move the conductive adhesive strip 210, so that the position of the conductive adhesive strip 210 moves from the first area 210a where the conductive adhesive strip is exposed by the positioning hole to the second area 210b where the conductive adhesive strip is exposed by the positioning hole; wherein the direction from the first area 210a to the second area 210b is the first direction.

[0068] Here, the second width W2 of the conductive rubber strip 210 is the same as the first width W1 of the groove 208. The utility model has no special limitation on the size of the conductive rubber strip 210 along the first direction (i.e., the second length L2 of the conductive rubber strip 210). The size of the conductive rubber strip 210 along the first direction (i.e., the second length L2) can be the same as the size of the groove 208 along the first direction (i.e., the first length L1). The size of the conductive rubber strip 210 along the first direction (i.e., the second length L2) can be smaller than the size of the groove 208 along the first direction (i.e., the first length L1). The size of the conductive rubber strip 210 along the first direction (i.e., the second length L2) can be larger than the size of the groove 208 along the first direction (i.e., the first length L1). In this way, the moving component can move the conductive rubber strip 210 in the groove 208 along the first direction. Figure 7 Only the second length L2 of the conductive rubber strip 210 is less than the first length L1 of the groove 208, and the moving component moves the conductive rubber strip 210 in the groove 208 along the positive direction of the first direction as an example for illustrative description. Of course, the moving component can move the conductive rubber strip 210 in the groove 208 along the first direction, and the moving component can move the conductive rubber strip 210 in the groove 208 along the positive direction of the first direction, and the moving component can also move the conductive rubber strip 210 in the groove 208 along the negative direction of the first direction.

[0069] In the testing device provided by the utility model, when the surface of the conductive rubber strip is worn or dirty, that is, when the number of tests of the conductive rubber strip reaches a preset value N1 of the number of tests, the moving component is started to move the conductive rubber strip along the first direction to replace the area of ​​the conductive rubber strip that contacts the component to be tested.

[0070] refer to Figure 8 , Figure 8 This is a schematic diagram of vertically moving the conductive rubber strip in the test device provided by the utility model. Figure 8 As shown, in some embodiments, the conductive adhesive strip 210 has a second length (i.e., L3) along the first direction and a second width (i.e., W3) along the second direction; wherein the first length L1 and the second length L3 are the same, and the first width W1 is greater than the second width W3; the moving component is used to move the conductive adhesive strip 210, so that the position of the conductive adhesive strip 210 moves from the first area 210a where the conductive adhesive strip is exposed by the positioning hole to the third area 210c where the conductive adhesive strip is exposed by the positioning hole; wherein the direction from the first area 210a to the third area 210c is the second direction.

[0071] Here, the second length L3 of the conductive rubber strip 210 is the same as the first length L1 of the groove 208 , and the second width W3 of the conductive rubber strip 210 is smaller than the first width W1 of the groove 208 . Figure 8Only an example of the moving component moving the conductive rubber strip 210 in the groove 208 along the positive direction of the second direction is used for exemplary description. Of course, the moving component can move the conductive rubber strip 210 in the groove 208 along the second direction, and the moving component can move the conductive rubber strip 210 in the groove 208 along the positive direction of the second direction, and the moving component can also move the conductive rubber strip 210 in the groove 208 along the negative direction of the second direction.

[0072] In the testing device provided by the utility model, the conductive rubber strip and the groove are in non-tight contact in the second direction. When the surface of the conductive rubber strip is worn or dirty, that is, when the number of tests of the conductive rubber strip reaches a preset value N1 of the number of tests, the moving component is started to move the conductive rubber strip along the second direction to replace the area of ​​the conductive rubber strip in contact with the component to be tested.

[0073] It should be noted that the conductive rubber strip can be automatically adjusted to move in the horizontal direction (ie, the first direction) and the vertical direction (ie, the second direction), or can be manually adjusted to move in the horizontal direction and the vertical direction.

[0074] refer to Fig. 9 , Fig. 9 This is a schematic diagram of the cross-sectional structure of the test device provided by the utility model. Fig. 9 As shown, in some embodiments, the testing device 200 further includes: a gasket ring 220 disposed between the conductive rubber strip 210 and the circuit board 206 .

[0075] Here, the front side of the conductive rubber strip 210 contacts the component to be tested 202 through the positioning hole 214, and the back side of the conductive rubber strip 210 contacts the circuit board 206. As mentioned above, the fastener can pass through the through hole 218 on the test base 204 and the through hole on the circuit board 206 to fix the test base 204 and the circuit board 206. At this time, the conductive rubber strip 210 disposed in the groove 208 on the back side of the test base 204 can be in close contact with the circuit board 206. The front side of the completely tightly attached conductive rubber strip 210 is in close contact with the groove 208, and the back side of the conductive rubber strip 210 is in close contact with the circuit board 206. The conductive rubber strip 210 is easily worn, which affects the electrical performance.

[0076] Here, a gasket ring 220 is provided between the conductive rubber strip 210 and the circuit board 206. When the component to be tested 202 is not placed, the conductive rubber strip 210 and the circuit board 206 are separated by the gasket ring 220, so that the conductive rubber strip 210 and the circuit board 206 are prevented from being in contact for a long time and affecting the electrical performance. When the component to be tested 202 is placed, downward pressure can be applied to the component to be tested 202, so that the component to be tested 202 contacts the conductive rubber strip 210 through the positioning hole 214, and the conductive rubber strip 210 is deformed by the downward pressure so as to be in close contact with the circuit board 206.

[0077] refer to Fig.10 and Fig.11 , Fig.10 A schematic diagram of a test system provided by the utility model, Fig.11 This is a schematic diagram of the test machine provided by the utility model. Fig.10 and Fig.11 As shown, the utility model provides a test system 300, the test system 300 comprises: a test device 302 (such as Fig.10 The test machine 304 includes a support platform 328 and a test socket 322 located on the support platform 328, and the test device 302 is installed on the test socket 322; a network analyzer 306, the network analyzer 306 is electrically connected to the component to be tested through a circuit board 324 and a conductive adhesive strip to test the component to be tested; a control display platform 308, and the control display platform 308 is connected to the test machine 304.

[0078] It should be noted that, in order to facilitate the description of the connection relationship, Fig.10 The placement of the test device 302 on the test platform 304 is magnified and illustrated in FIG. Fig.10 The illustrated size relationship between the testing device 302 and the supporting platform 328 does not represent the actual size of the testing device 302 and the supporting platform 328 in actual applications.

[0079] Here, the test device 302 can be installed on the test socket 322 located on the support platform 328 in the test machine 304, and the circuit board 324 can be arranged between the test socket 322 and the test base 326 on the test machine 304. In the test device 302, the component to be tested can contact the conductive rubber strip exposed by the positioning hole, and the component to be tested can be electrically connected to the circuit board through the conductive rubber strip.

[0080] Here, the network analyzer 306 can be electrically connected to the circuit board 324, and the circuit board 324 is electrically connected to the component to be tested through a conductive adhesive strip, so the network analyzer 306 can be electrically connected to the component to be tested. In this way, the network analyzer 306 can be used to test the component to be tested.

[0081] Here, the test machine 304 includes a support platform 328 and a test seat 322 located on the support platform 328. Various connection circuits are arranged inside the support platform 328, and relevant parameters can be set through the control display platform 308 to control the test machine 304. The control display platform 308 can be used to display the operation and control status of the test machine 304, and can also be used to control related operations, such as inputting related parameters and setting related parameters to achieve control of the test machine 304.

[0082] like Fig.11 As shown, in some embodiments, the test platform 304 further includes: a height coarse adjustment component 310, the height coarse adjustment component 310 has a first end 310a and a second end 310b that are relatively arranged along a plane direction perpendicular to the support platform 328 (i.e., the third direction, i.e., D3), and the first end 310a of the height coarse adjustment component is fixedly connected to the support platform 328; a first rotating cross bar 312, the first rotating cross bar 312 is arranged along a plane direction parallel to the support platform 328 and has a relatively arranged first end 310a and a second end 310b along an extension direction. The first end 312a and the second end 312b of the height coarse adjustment component are connected, and the first end 312a of the first rotating cross bar is connected to the second end 310b of the height coarse adjustment component; the adsorption component 314 is connected to the second end 312b of the first rotating cross bar and is used to absorb the component to be tested; wherein the height coarse adjustment component 310 is used to drive the adsorption component 314 to move along a planar direction perpendicular to the support platform 328, and the first rotating cross bar 312 is used to drive the adsorption component 314 to move along a planar direction parallel to the support platform 328.

[0083] Here, the first end 310a of the height coarse adjustment component and the support platform 328 are fixedly connected at point A, point A is used as the origin of the three-dimensional coordinate system, the height coarse adjustment component 310 is used as the Z axis of the three-dimensional coordinate system, the X axis of the three-dimensional coordinate system passes through point A and extends along the first direction, and the Y axis of the three-dimensional coordinate system passes through point A and extends along the second direction.

[0084] Here, the height coarse adjustment component 310 can be raised and lowered along the third direction to adjust the height of the adsorption component 314 along the Z axis.

[0085] Here, the first rotating cross bar 312 is arranged along a plane direction parallel to the support platform 328, that is, the first rotating cross bar 312 can extend in any direction in a plane perpendicular to the third direction. The first rotating cross bar 312 can have a first end 312a and a second end 312b arranged opposite to each other along the extension direction. The first end 312a of the first rotating cross bar and the second end 310b of the height coarse adjustment component are fixedly connected at point B. The first rotating cross bar 312 can rotate 360 ​​degrees around point B to adjust the distance of the adsorption component 314 along the X-axis and the Y-axis.

[0086] Exemplarily, the first rotating cross bar 312 may also be a retractable cross bar, that is, the size of the first rotating cross bar 312 along its extension direction may be adjusted according to demand.

[0087] Here, the second end 312b of the first rotating cross bar can be connected to the adsorption component 314, which can absorb the component to be tested and place the component to be tested in the limiting groove of the test base by adjusting the distance of the adsorption component 314 along the X-axis, Y-axis and Z-axis.

[0088] In some embodiments, the test machine 304 further includes: a test seat 322 , the test seat 322 is disposed on a support platform 328 , and the test device 302 can be installed on the test seat 322 .

[0089] During the positioning adjustment, the positions of the test seat 322 and the first rotating cross bar 312 are adjusted so that the adsorption component 314 is aligned with the limiting groove of the test device 302 .

[0090] In some embodiments, the test machine 304 also includes: a height fine-adjustment component 316, the height fine-adjustment component 316 is connected to the second end 312b of the first rotating cross bar and the adsorption component 314, the height fine-adjustment component 316 is used to drive the adsorption component 314 to press down the component to be tested, so that the component to be tested, the conductive rubber strip and the circuit board are electrically connected.

[0091] Here, the height fine adjustment component 316 can be raised and lowered along the third direction to adjust the height of the adsorption component 314 along the Z axis.

[0092] In some embodiments, the testing machine 304 also includes: a second rotating cross bar 318, which is arranged along a planar direction parallel to the support platform 328 and is connected to the height coarse adjustment component 310; a spraying component 320, which is connected to the second rotating cross bar 318 and is used to spray cleaning liquid onto the conductive rubber strip.

[0093] Here, the second rotating cross bar 318 is arranged along a plane direction parallel to the support platform 328, that is, the second rotating cross bar 318 can extend in any direction in a plane perpendicular to the third direction. The second rotating cross bar 318 can have a first end 318a and a second end 318b arranged opposite to each other along the extension direction. The first end 318a of the second rotating cross bar and the height coarse adjustment component 310 are fixedly connected at point C. The second rotating cross bar 318 can rotate 360 ​​degrees around point C to adjust the distance of the spraying component 320 along the X-axis and the Y-axis.

[0094] Exemplarily, the second rotating cross bar 318 may also be a retractable cross bar, that is, the size of the second rotating cross bar 318 along its extension direction may be adjusted according to demand.

[0095] Here, the second end 318b of the second rotating cross bar may be connected to the spraying component 320, and the cleaning liquid may be sprayed onto the conductive rubber strip by adjusting the distance of the spraying component 320 along the X-axis, the Y-axis and the Z-axis.

[0096] Exemplarily, testing the component to be tested may include the following steps:

[0097] S1: Install a test base with a conductive rubber strip in a groove on a circuit board; install a test device including the test base, the conductive rubber strip and the circuit board on a test seat of a test machine.

[0098] S2: Use the adsorption component to adsorb the component to be tested, adjust the height of the adsorption component along the Z axis through the height coarse adjustment component, and adjust the distance of the adsorption component along the X axis and the Y axis through the first rotating cross bar, so that the orthographic projection of the component to be tested on the XY plane is located near the limit groove in the testing device.

[0099] The test seat is fine-tuned in the XY plane so that the orthographic projection of the component to be tested in the XY plane coincides with the position of the limit slot in the test device, or the placement position of the component to be tested is determined by the positioning hole.

[0100] S3: The height of the adsorption component along the Z axis is adjusted by the height fine adjustment component, the component to be tested adsorbed by the adsorption component is placed in the positioning hole, and downward pressure is applied to make the component to be tested, the conductive adhesive strip and the circuit board electrically connected, and the component to be tested is tested.

[0101] It should be noted that steps S1 and S2 can be performed before the formal test begins. After using the first component to be tested to align the adsorption component with the positioning hole on the test device, there is no need to repeatedly adjust the height and position of the relevant components on the test machine. The adsorption component can be directly used to adsorb the component to be tested and placed in the limit slot or positioning hole for testing.

[0102] S4: When the surface of the conductive rubber strip becomes dirty, the height of the spraying component along the Z axis can be adjusted by the coarse height adjustment component, and the distance of the spraying component along the X axis and the Y axis can be adjusted by the second rotating cross bar, so that the spraying component sprays the cleaning liquid onto the conductive rubber strip exposed by the positioning hole.

[0103] Here, the control display platform 308 can be used to control and display relevant parameters of the height coarse adjustment component 310, the first rotating cross bar 312, the height fine adjustment component 316 and the second rotating cross bar 318; for example, displaying the height adjustment value, rotation status, etc.; or pre-setting the height adjustment value, and subsequently controlling the height coarse adjustment component and the height fine adjustment component to automatically adjust the height value, so that the component to be tested adsorbed by the adsorption component can be aligned with the positioning hole, so that the component to be tested can be accurately placed in the limit groove.

[0104] Considering that during the test process of the component to be tested, the pressing height of the adsorption component can be determined according to the thickness of the component to be tested. Since too large a pressing height will result in excessive pressure and thus damage the conductive rubber strip, while too small a pressing height will result in too small a pressure and thus cause unstable test waveforms, it is necessary to adjust the pressing height of the adsorption component according to the thickness of the component to be tested, thereby delaying the service life of the conductive rubber strip. Considering that the thickness of each batch of components to be tested is different, when the thickness of the component to be tested is large, the pressing height of the adsorption component can be reduced, that is, the adsorption component can be raised; when the thickness of the component to be tested is small, the pressing height of the adsorption component can be increased, that is, the adsorption component can be lowered.

[0105] It should be noted that the coarse height adjustment component and the fine height adjustment component may be adjusted automatically or manually.

[0106] Here, the control and display station 308 can also be used to set and display the number of tests of the conductive rubber strip, and when the set test preset value is reached, control the moving parts or control the spraying of alcohol and alarm prompts and other operations.

[0107] For example, when the number of tests of the conductive rubber strip reaches the preset number of tests N1, the moving component is started to move the conductive rubber strip to replace the area of ​​the conductive rubber strip in contact with the component to be tested. When the number of tests of the conductive rubber strip is N2, the spraying component can be used to spray a cleaning liquid on the conductive rubber strip for cleaning, and the cleaning liquid can be, for example, alcohol. Wherein, 0<N2≤0.5N1.

[0108] For example, after long-term use, dirt will be formed on the surface of the conductive adhesive strip, which will affect the RF waveform. You can spray alcohol on it, clean it with an air gun, or use a sticky stick to remove the dirt. The conductive adhesive strip after cleaning will be consistent with the initial comparison verification waveform test value, so you can use alcohol to clean it to extend the test times of the conductive adhesive strip.

[0109] For example, the conductive rubber strips usually need to be cleaned of dirt after being used about 30,000 to 40,000 times, and the conductive rubber strips usually need to be replaced after being used about 100,000 to 120,000 times.

[0110] The embodiment of the utility model provides a test device and a test system. In the utility model, the test device includes a test base installed on a circuit board, the groove on the test base can be used to accommodate a conductive rubber strip, the positioning hole on the test base can be used to position the component to be tested, the conductive rubber strip is clamped between the test base and the circuit board, the component to be tested contacts the conductive rubber strip through the positioning hole, and the component to be tested is electrically connected to the circuit board through the conductive rubber strip; the test base is also provided with a moving part, the moving part is used to move the conductive rubber strip in the groove, so that the component to be tested contacts different areas of the conductive rubber strip through the positioning hole. In this way, the area where the conductive rubber strip contacts the component to be tested can be quickly changed, thereby extending the service life of the conductive rubber strip, reducing the number of times the conductive rubber strip is replaced, thereby saving operation time and improving test efficiency.

[0111] It should be understood that "one embodiment" or "an embodiment" mentioned throughout the specification means that specific features, structures or characteristics related to the embodiment are included in at least one embodiment of the utility model. Therefore, "in one embodiment" or "in an embodiment" appearing throughout the specification does not necessarily refer to the same embodiment. In addition, these specific features, structures or characteristics can be combined in one or more embodiments in any suitable manner. It should be understood that in various embodiments of the utility model, the size of the serial number of the above-mentioned processes does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiment of the utility model. The serial numbers of the above-mentioned embodiments of the utility model are only for description and do not represent the advantages and disadvantages of the embodiments.

[0112] The above description is only a preferred embodiment of the present invention, and does not limit the patent scope of the present invention. All equivalent structural changes made by using the contents of the present invention specification and drawings under the concept of the present invention, or directly / indirectly used in other related technical fields are included in the patent protection scope of the present invention.

Claims

1. A testing device, characterized in that: The testing device comprises: A test base is mounted on a circuit board, wherein a groove is provided on one side of the test base close to the circuit board, and the groove is used to accommodate a conductive rubber strip; a positioning hole is provided in the groove, and the positioning hole passes through the test base to the other side, and is used to position the component to be tested; wherein the conductive rubber strip is clamped between the groove of the test base and the circuit board, and the component to be tested contacts the conductive rubber strip through the positioning hole, and the component to be tested is electrically connected to the circuit board through the conductive rubber strip; At least one moving component is disposed on the test base, and the moving component is used to move the conductive rubber strip in the groove so that the component to be tested contacts different areas of the conductive rubber strip through the positioning hole.

2. The testing device according to claim 1, characterized in that: The groove has a first length along a first direction and a first width along a second direction; the groove extends along the first direction and penetrates the test base; wherein the first direction and the second direction intersect.

3. The testing device according to claim 2, characterized in that: The conductive rubber strip has a second width along the second direction; wherein the first width is the same as the second width; The moving component is used to move the conductive rubber strip so that the position of the conductive rubber strip moves from the first area where the conductive rubber strip is exposed by the positioning hole to the second area where the conductive rubber strip is exposed by the positioning hole; wherein the direction from the first area to the second area is the first direction.

4. The testing device according to claim 2, characterized in that: The conductive rubber strip has a second length along the first direction and a second width along the second direction; wherein the first length is the same as the second length, and the first width is greater than the second width; The moving component is used to move the conductive rubber strip so that the position of the conductive rubber strip moves from the first area where the conductive rubber strip is exposed by the positioning hole to the third area where the conductive rubber strip is exposed by the positioning hole; wherein the direction from the first area to the third area is the second direction.

5. The testing device according to any one of claims 1 to 4, characterized in that: The testing device also includes: A gasket ring is provided between the conductive rubber strip and the circuit board.

6. The testing device according to claim 1, characterized in that: The test base is also provided with at least one through hole, and a fastener penetrates through the through hole to fix the test base and the circuit board together.

7. The testing device according to claim 1, characterized in that: The moving part includes a rolling gear.

8. A testing system, characterized in that: The test system comprises: The testing device according to any one of claims 1 to 7; A test machine, comprising a support platform and a test seat located on the support platform, wherein the test device is installed on the test seat; A network analyzer, wherein the network analyzer is electrically connected to the component to be tested through a circuit board and a conductive adhesive strip to test the component to be tested; A control display platform is connected to the test machine.

9. The test system according to claim 8, characterized in that: The test machine also includes: A height coarse adjustment component, wherein the height coarse adjustment component has a first end and a second end that are arranged opposite to each other along a plane direction perpendicular to the support platform, and the first end of the height coarse adjustment component is fixedly connected to the support platform; A first rotating cross bar, the first rotating cross bar is arranged in a direction parallel to the plane of the support platform and has a first end and a second end arranged oppositely along an extension direction, and the first end of the first rotating cross bar is connected to the second end of the height coarse adjustment component; An adsorption component, which is connected to the second end of the first rotating cross bar and is used to absorb the component to be tested, and the adsorption component is aligned with the testing device; The coarse height adjustment component is used to drive the adsorption component to move along a plane direction perpendicular to the support platform, and the first rotating cross bar is used to drive the adsorption component to move along a plane direction parallel to the support platform.

10. The test system according to claim 9, characterized in that: The test machine also includes: A height fine-adjusting component is connected to the second end of the first rotating cross bar and the adsorption component, and the height fine-adjusting component is used to drive the adsorption component to press down the component to be tested, so that the component to be tested, the conductive rubber strip and the circuit board are electrically connected.

11. The test system according to claim 10, characterized in that: The test machine also includes: A second rotating cross bar, which is arranged in a direction parallel to the plane of the support platform and connected to the height coarse adjustment component; A spraying component is connected to the second rotating cross bar and is used for spraying cleaning liquid onto the conductive rubber strip.

Images