PCIe Gen5 RDT stepping test room

Abstract

The utility model discloses a PCIe Gen5RDT stepping type test room, which comprises a refrigeration cabinet, an air circulation assembly, a plurality of test chambers and a drawer type cart, the refrigeration cabinet is respectively communicated with the plurality of test chambers through the air circulation assembly, the test chambers are provided with the drawer type cart, the drawer type cart comprises a plurality of test cavities, and the test cavities are communicated with the refrigeration cabinet through the air circulation assembly. And the test cavity is used for testing the SSD hard disk. According to the stepping type test room, air cooling and air circulation are combined, tunnel type air cooling is formed, and rapid heat dissipation of the SSD is effectively achieved.

Description

Technical Field

[0001] The utility model relates to the technical field of SSD testing equipment, in particular to a PCIe Gen5 RDT step-by-step testing room. Background Art

[0002] Traditional RDT test equipment mainly heats up and compensates for temperature, keeping the SSD chip core temperature between 70℃-90℃. It can only be used for SATA SSD, PCIe Gen3 SSD and PCIe Gen4 SSD, but not PCIe Gen5x4 SSD. The mainstream PCIe Gen5 x4 SSD M.2 2280 does not have a heat sink. Even if the ambient temperature is 25℃-30℃, the core temperature of the chip soars to over 105℃. Traditional RDT test equipment cannot be used for PCIe Gen5 x4 SSD. When the temperature of PCIe Gen5 x4 SSD exceeds 105℃, the SSD will enter self-protection mode, reduce the frequency or speed, or actively shut down and stop working.

[0003] Therefore, it is necessary to provide a PCIe Gen5 RDT step-by-step test room to solve the above problems. Utility Model Content

[0004] In order to overcome the shortcomings of the prior art, the utility model provides a PCIe Gen5 RDT step-type test room, which combines air cooling with air circulation to form tunnel-type air cooling, thereby effectively realizing rapid heat dissipation of SSD hard drives.

[0005] The technical solution adopted by the utility model to solve its technical problems is:

[0006] A PCIe Gen5 RDT step-by-step test room comprises a refrigeration cabinet, an air circulation component, a plurality of test chambers and a drawer-type trolley, wherein the refrigeration cabinet is connected to the plurality of test chambers respectively through the air circulation component, the test chamber is provided with the drawer-type trolley, the drawer-type trolley comprises a plurality of test cavities, and the test cavities are used to test SSD hard disks.

[0007] As a further improvement of the above technical solution, the test chamber is provided with a power supply, an aviation connector, a delay switch and a control switch, the control switch is connected to the delay switch, the delay switch is connected between the power supply and the aviation connector, and the aviation connector is connected to the drawer-type cart.

[0008] As a further improvement of the above technical solution, the test chamber is provided with a visual door, and the control switch is arranged on the visual door.

[0009] As a further improvement of the above technical solution, the air circulation component includes a return air duct and a circulation fan, one end of the return air duct is connected to the refrigeration cabinet, the other end of the return air duct is installed with the circulation fan, and the middle part of the return air duct is connected to the multiple test chambers.

[0010] As a further improvement of the above technical solution, the drawer-type cart is provided with a plurality of test cavities, a plurality of test trays are provided in the test cavities, and the SSD hard disk is installed on the test trays.

[0011] As a further improvement of the above technical solution, tank connection grooves are provided on both sides of the test tray, and one end of the tank connection groove is connected to the test tray, and the other end of the tank connection groove is connected to the side wall of the test cavity.

[0012] As a further improvement of the above technical solution, a step-down IC module is provided on the test tray, and the step-down IC module is connected to the aviation connector.

[0013] As a further improvement of the above technical solution, a heat sink and heat dissipation silica gel are arranged at the bottom of the test tray, and the heat dissipation silica gel is arranged between the SSD hard disk and the heat sink.

[0014] As a further improvement of the above technical solution, the refrigeration cabinet is provided with a temperature control device, and the temperature control device is connected to the control switch.

[0015] As a further improvement of the above technical solution, the temperature control device includes a temperature control display screen, a fan, a safety switch, a leakage protection switch, an ammeter, a voltmeter and an alarm light. The fan, safety switch, leakage protection switch, ammeter, voltmeter and alarm light are all connected to the temperature control display screen, the safety switch is connected to the fan, and the leakage protection switch, ammeter and voltmeter are respectively connected to the control switch of the test room.

[0016] The beneficial effects of the utility model are:

[0017] The utility model combines air cooling with air circulation to form tunnel-type air cooling, and modularizes the test room, which can be customized for on-site assembly according to on-site conditions, and will not affect the tests in adjacent test rooms, thereby effectively improving the test efficiency; at the same time, a drawer-type cart can be set up to load and unload products outside the test room, which does not occupy test equipment and improves turnover efficiency, and a radiator is added to the test tray to further improve the heat dissipation effect; in addition, the test room of the utility model can carry out large-scale tests, reduce surges and transient currents during power-on, avoid leakage protection from triggering protection and interrupting the test, and protect equipment and products. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The utility model is further described below in conjunction with the accompanying drawings and embodiments.

[0019] Figure 1 This is a front view structural diagram of the test room of the utility model;

[0020] Figure 2 It is a schematic diagram of the top view of the test room of the utility model;

[0021] Figure 3 It is a structural schematic diagram of the drawer-type cart of the utility model;

[0022] Figure 4 It is a schematic diagram of the top view of the test tray of the utility model;

[0023] Figure 5 It is a side view structural schematic diagram of the test tray of the utility model;

[0024] Figure 6 It is a schematic diagram of a circuit for connecting the refrigeration cabinet of the utility model with the test chamber;

[0025] Figure 7 The utility model is a circuit diagram of the connection between the test room and the drawer-type cart.

[0026] Figure numerals: 1. Refrigeration cabinet; 2. Air circulation component; 3. Test chamber; 31. Power supply; 32. Aviation connector; 33. Delay switch; 34. Control switch; 35. Visual door; 4. Drawer cart; 41. Test chamber; 42. Test tray; 43. Tank connection slot; 44. Step-down IC module; 5. SSD hard disk; 6. Radiator; 7. Heat dissipation silicone; 8. Temperature control device. DETAILED DESCRIPTION

[0027] The following will be combined with the embodiments and drawings to clearly and completely describe the concept, specific structure and technical effects of the utility model, so as to fully understand the purpose, characteristics and effects of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of them. Based on the embodiments of the utility model, other embodiments obtained by technicians in this field without creative work are all within the scope of protection of the utility model. In addition, all the connection / connection relationships involved in the patent do not refer to the direct connection of components, but refer to the fact that according to the specific implementation situation, a better connection structure can be formed by adding or reducing connection accessories. For example, fixed connection / fixed installation can be selected according to the needs of screw connection, bolt connection, pin connection, key connection, bonding, mortise and tenon connection, welding, riveting and other methods. For example, detachable connection can be selected according to the needs of screw connection, bolt connection, threaded connection, snap connection, mortise and tenon connection, Velcro connection and other methods. The various technical features in the creation of the utility model can be combined interactively without conflicting with each other.

[0028] Reference Figure 1 , Figure 2 A PCIe Gen5 RDT step-by-step test room comprises a refrigeration cabinet 1, an air circulation component 2, a test room 3 and a drawer-type trolley 4. In the present embodiment, four test rooms 3 are provided, and the refrigeration cabinet 1 is connected with the four test rooms 3 respectively through the air circulation component 2, so that a plurality of test rooms 3 share a set of air cooling and air circulation systems. In actual operation, the test of adjacent test rooms 3 can be avoided from being affected. The test room 3 is provided with the drawer-type trolley 4, and the drawer-type trolley 4 comprises a plurality of test cavities 41. The test cavities 41 are used to test an SSD hard disk 5. The SSD product is loaded on the movable drawer-type trolley 4, and the product can be loaded and unloaded outside the test room 3 without occupying equipment, thereby improving turnover efficiency and improving the test efficiency of the SSD hard disk 5. At the same time, the test room of the present embodiment adopts a modular design, which solves the problem of large-volume transportation and is convenient and quick to install.

[0029] Reference Figure 1 , Figure 6 In an embodiment of the utility model, the test chamber 3 includes a power supply 31, an aviation connector 32, a delay switch 33, a control switch 34 and a visual door 35, wherein the control switch 34 is connected to the delay switch 33, the delay switch 33 is connected between the power supply 31 and the aviation connector 32, and the aviation connector 32 is connected to the drawer trolley 4. After the drawer trolley 4 filled with SSD hard disks 5 is pushed into the step-in test chamber 3, the drawer trolley is quickly connected to the aviation connector 32, the cable is connected and the door is closed, and the visual door is opened. The control switch 34 on the door 35 starts the delay switch 33. The delay switch 33 can be set to provide a delay function. When the SSD product is stationary for a period of time and the temperature is stable, the delay ends, and the power supply 31 is connected to the test tray 42 on the drawer-type cart 4 to supply power to the SSD hard disk 5 to be tested, thereby ensuring the stability of the SSD test. The test chamber 3 is provided with a visual door 35, through which the test status of the SSD product in the test chamber 3 can be viewed, and the control switch 34 is set on the visual door 35 for more convenient operation.

[0030] In addition, the test chamber 3 in this embodiment is provided with a plurality of aviation connectors 32 and delay switches 33, see Figure 5, the output end of delay switch A1 is connected to aviation connector A1. When there is voltage at the output end of delay switch A1, it is fed back to delay switch A2, and the output end of delay switch A2 is connected to aviation connector A2; when there is voltage at the output end of delay switch A2, it is fed back to delay switch A3, and the output end of delay switch A3 is connected to aviation connector A3; when there is voltage at the output end of delay switch A3, it is fed back to delay switch A4, and the output end of delay switch A4 is connected to aviation connector A4, and so on. When power is turned on, all connections will not be opened instantly, but will be opened gradually in sequence. By adopting this design, transient current and surge current can be reduced, and the leakage switch can be prevented from being disconnected by mistake, causing test interruption and large current damage to test equipment and SSD hard drives.

[0031] Reference Figure 1 In an embodiment of the utility model, the air circulation component 3 includes a return air channel and a circulation fan. One end of the return air channel is connected to the refrigeration cabinet 1, and the circulation fan is installed at the other end of the return air channel. The middle part of the return air channel is connected to multiple test chambers 3. The temperature of the test chamber 3 can be controlled by the refrigeration cabinet 1, and the temperature of each test chamber 3 can be further uniformed by the forced exhaust circulation fan, so that multiple test chambers 3 can share a set of air cooling and air circulation systems, saving costs, and avoiding affecting the tests of adjacent test chambers 3, effectively improving the SSD test efficiency.

[0032] Reference Figure 3 , Figure 4 In an embodiment of the utility model, the drawer-type trolley 4 adopts a multi-section structural design and is provided with a plurality of test cavities 41. A plurality of test trays 42 are provided in the test cavities 41. Several of the SSD hard disks 5 are fixedly installed on the test trays 42 in a vertically spaced state, and tank connection grooves 43 are provided on both sides of the test tray 42, and one end of the tank connection groove 43 is connected to the test tray 42, and the other end of the tank connection groove 43 is connected to the side wall of the test cavity 41. When loading and unloading SSD products, the test tray 42 uses the three-section tank connection groove 43 as a guide rail to connect to the drawer-type trolley 4, and the test tray 42 can be pulled out to take and place the SSD hard disk 5, which is convenient and quick to operate.

[0033] Reference Figure 5 , Figure 7, the test tray 42 is provided with a step-down IC module 44, which is connected to the aviation connector 34. Since the working voltage of the SSD hard disk 5 is 3.3V±5, in order to avoid the voltage drop problem, the power supply 31 adopts the high voltage of the industrial power supply, such as the 12V test tray 42 is designed with a step-down IC module 44 and related circuits to step down the 12V to 3.3V. Similarly, the output end of the previous step-down IC module 44 can also be used to control whether the next step-down IC module starts to work, and the timing power-on is formed step by step to avoid synchronous large load power-on and reduce transient current and surge current.

[0034] Reference Figure 5 In an embodiment of the utility model, a radiator 6 and a heat dissipation silica gel 7 are provided at the bottom of the test tray 42, and the heat dissipation silica gel 7 is provided between the SSD hard disk 5 and the radiator 6, so that the radiator 6 can quickly dissipate heat for the SSD hard disk 5, thereby preventing the SSD from entering a self-protection mode and reducing the frequency or speed or actively powering off and stopping working due to excessively high temperature during the test, thereby ensuring the stability of the SSD hard disk test.

[0035] Reference Figure 6 In an embodiment of the utility model, the refrigeration cabinet 1 is provided with a temperature control device 8, and the temperature control device 8 is connected to the control switch 34, wherein the temperature control device 8 includes a temperature control display screen, a fan, a safety switch, a leakage protection switch, an ammeter, a voltmeter and an alarm light, and the fan, the safety switch, the leakage protection switch, the ammeter, the voltmeter and the alarm light are all connected to the temperature control display screen, and the safety switch is connected to the fan, and the leakage protection switch, the ammeter and the voltmeter are respectively connected to the control switch of the test room, and the current and voltage during the test can be checked through the ammeter and the voltmeter to avoid overvoltage and overload of the SSD product, and the fan can be controlled through the temperature control display screen and the safety switch to adjust the temperature of the test room 3, and the leakage protection switch and the alarm light can quickly stop the test or send an alarm when the test goes wrong, so as to reduce the damage of the test equipment and the SSD product.

[0036] The above is a specific description of the preferred implementation of the utility model, but the invention of the utility model is not limited to the described embodiments. Technical personnel familiar with the field can also make various equivalent deformations or substitutions without violating the spirit of the utility model. These equivalent deformations or substitutions are all included in the scope defined by the claims of this application.

Claims

1. A PCIe Gen5 RDT step-by-step test room, characterized by: The invention comprises a refrigerating cabinet, an air circulation component, a plurality of test chambers and a drawer-type trolley. The refrigerating cabinet is connected to the plurality of test chambers respectively through the air circulation component. The test chamber is provided with the drawer-type trolley. The drawer-type trolley comprises a plurality of test chambers for testing SSD hard disks.

2. A PCIe Gen5 RDT step-by-step test room according to claim 1, characterized in that: The test chamber is provided with a power supply, an aviation connector, a delay switch and a control switch, the control switch is connected to the delay switch, the delay switch is connected between the power supply and the aviation connector, and the aviation connector is connected to the drawer-type cart.

3. A PCIe Gen5 RDT step-by-step test room according to claim 2, characterized in that: The test chamber is provided with a visual door, and the control switch is arranged on the visual door.

4. The PCIe Gen5 RDT step-by-step test room according to claim 1, characterized in that: The air circulation component includes a return air channel and a circulation fan. One end of the return air channel is connected to the refrigeration cabinet, the other end of the return air channel is equipped with the circulation fan, and the middle part of the return air channel is connected to the plurality of test chambers.

5. The PCIe Gen5 RDT step-by-step test room according to claim 2, characterized in that: The drawer-type cart is provided with a plurality of test cavities, a plurality of test trays are provided in the test cavities, and the SSD hard disk is installed on the test trays.

6. A PCIe Gen5 RDT step-by-step test room according to claim 5, characterized in that: Tank connection grooves are provided on both sides of the test tray, and one end of the tank connection groove is connected to the test tray, and the other end of the tank connection groove is connected to the side wall of the test cavity.

7. The PCIe Gen5 RDT step-by-step test room according to claim 5, characterized in that: A step-down IC module is arranged on the test tray, and the step-down IC module is connected to the aviation connector.

8. The PCIe Gen5 RDT step-by-step test room according to claim 5, characterized in that: A radiator and heat dissipation silica gel are arranged at the bottom of the test tray, and the heat dissipation silica gel is arranged between the SSD hard disk and the radiator.

9. The PCIe Gen5 RDT step-by-step test room according to claim 2, characterized in that: The refrigerating cabinet is provided with a temperature control device, and the temperature control device is connected to the control switch.

10. The PCIe Gen5 RDT step-by-step test room according to claim 9, characterized in that: The temperature control device includes a temperature control display screen, a fan, a safety switch, a leakage protection switch, an ammeter, a voltmeter and an alarm light. The fan, the safety switch, the leakage protection switch, the ammeter, the voltmeter and the alarm light are all connected to the temperature control display screen, the safety switch is connected to the fan, and the leakage protection switch, the ammeter and the voltmeter are respectively connected to the control switch of the test room.

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