Integrated probe and test probe module

Abstract

The utility model provides an integrated probe and a test probe module. The integrated probe comprises: a connection plate; the probe shell is fixedly connected to the top of the connecting plate, a plurality of limiting rings are fixedly connected to the bottom of the inner wall of the probe shell, a connecting convex disc is installed in each limiting ring, a spring is fixedly connected to the top of each connecting convex disc, and a connecting rod is fixedly connected to the top end of each spring; the other end of each connecting rod is fixedly connected with a limiting disc, the top end of each limiting disc is fixedly connected with a probe, and the top end of each probe is provided with a contact head. The sealing plate is installed at the top of the probe shell, and a plurality of limiting holes are formed in the top of the sealing plate. According to the integrated probe and the test probe module provided by the utility model, through the structure, when the probe is used for testing, the movement stability of the probe can be improved, and the accuracy of test data can be improved.

Description

Technical Field

[0001] The utility model relates to the technical field of integrated probe testing, in particular to an integrated probe and a testing probe module. Background Art

[0002] The integrated probe is a test adapter developed to extend the test life of small-pitch multi-PIN products and reduce the false detection rate. It is mainly used in testing scenarios such as BTB connectors, FPCs, and PCB boards. The integrated probe is processed and assembled into a test module, which can be used to be installed on the fixture to test TPLCD, cameras, fingerprints, PCB boards and other products.

[0003] The integrated probe consists of a probe, a probe rod, and a lead wire. The probe consists of a conductive column with an insulating layer on the outside, and a conductive layer on the outside of the insulating layer. A terminal is provided inside the probe rod, and the conductive column and the conductive layer are connected to the lead wire to communicate with the machine.

[0004] When the integrated probe is tested by compression, the spring on the integrated probe will be compressed, which may easily cause the direction or angle of the probe to deviate during the test, thereby affecting the accuracy of the test data.

[0005] Therefore, it is necessary to provide an integrated probe and a test probe module to solve the above technical problems. Utility Model Content

[0006] The utility model provides an integrated probe and a test probe module, which solves the problem that when the integrated probe is tested by compression, there is a lack of a limiting structure for the probe, which causes the probe angle or direction to be easily offset during the test, thereby affecting the accuracy of the test data.

[0007] In order to solve the above technical problems, the utility model provides an integrated probe comprising: a connecting plate;

[0008] A probe shell, wherein the probe shell is fixedly connected to the top of the connecting plate, a plurality of limiting rings are fixedly connected to the bottom of the inner wall of the probe shell, a connecting convex disk is installed inside each limiting ring, a spring is fixedly connected to the top of the connecting convex disk, a connecting rod is fixedly connected to the top of the spring, the other end of the connecting rod is fixedly connected to the limiting disk, a probe is fixedly connected to the top of the limiting disk, and a contact head is installed on the top of the probe;

[0009] A sealing plate, the sealing plate is installed on the top of the probe housing, and a plurality of limiting holes are opened on the top of the sealing plate;

[0010] The probe passes through the limiting hole, and the limiting plate contacts the bottom of the sealing plate. The movement of the probe inside the limiting hole can increase the stability of the movement. The contact head is convenient for the probe to be powered on. The spring provides supporting force and also powers the material. The sealing plate is connected to the probe shell by bolts.

[0011] Preferably, a power block is provided at the bottom of the connecting plate, and the limiting ring is connected to the power block at the bottom of the connecting plate;

[0012] The integral probe is tested via the stop ring and connection plate.

[0013] A test probe module also includes a test shell, both sides of the test shell are fixedly connected with a mounting plate, and the top of the mounting plate is provided with two mounting holes;

[0014] The mounting hole is provided with threads inside, which is convenient for threaded connection with mounting bolts. The shape of the test shell is referenced Figure 1 or Figure 4 .

[0015] Preferably, the top of the mounting plate is threadedly connected with two mounting bolts, and the front of the test shell is provided with a bayonet;

[0016] The shape of the bayonet is the shape formed by the connecting plate and the probe shell.

[0017] Preferably, the top of the test shell is provided with a plurality of openings, and the back of the test shell is fixedly connected with a connecting rod;

[0018] Position reference of connecting rod Figure 4 , the diameter of the hole is the same as the limiting hole.

[0019] Preferably, the top of the connecting rod is rotatably connected to a pressing plate through a hinge, a docking plate is installed on the front of the pressing plate, and a handle is installed on the back of the pressing plate;

[0020] A power block in contact with the contact head is installed at the bottom of the docking plate.

[0021] Compared with the related art, the integrated probe and test probe module provided by the utility model have the following beneficial effects:

[0022] The utility model provides an integrated probe and a test probe module. In order to increase the accuracy of data during the integrated probe test, a connecting plate is first installed at the bottom of the probe shell to facilitate powering on the probe inside the probe shell, and a plurality of limiting rings are installed inside the probe shell, and connecting bosses are installed inside the limiting rings, and a limiting disk is installed on the top of each connecting boss through a spring and a connecting rod, and then it is only necessary to install the probe with a contact head on the limiting disk, and after the preparation is completed, it is only necessary to install a sealing plate with a limiting hole on the top of the probe shell, and let the probe pass through the limiting hole, and then the connecting plate and the probe shell are clamped to the bottom of the test shell, and the integrated probe can be tested, and the probe is limited by the limiting hole during the up and down movement, and then the up and down movement can avoid the angle or direction of the probe from being offset during the test process. Through this structure, when the probe is tested, it is beneficial to improve the stability of the probe activity and the accuracy of the test data. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 A schematic structural diagram of a preferred embodiment of the integrated probe and test probe module provided by the utility model;

[0024] Figure 2 A schematic diagram of the structure of a limit ring is provided for the utility model;

[0025] Figure 3 A structural schematic diagram of a spring is provided for the utility model;

[0026] Figure 4 A structural schematic diagram of a handle is provided for the utility model;

[0027] Figure 5 Provided for the utility model Figure 4 An enlarged view of point A is shown.

[0028] Numbers in the figure: 1. connecting plate, 2. probe shell, 3. mounting bolt, 4. mounting plate, 5. connecting rod, 6. hinge, 7. docking plate, 8. pressing plate, 9. test shell, 10. probe, 11. sealing plate, 12. limiting hole, 13. limiting ring, 14. connecting boss, 15. spring, 16. limiting disk, 17. contact head, 18. connecting rod, 19. handle, 20. bayonet, 21. mounting hole, 22. through-opening. DETAILED DESCRIPTION

[0029] The utility model is further described below in conjunction with the accompanying drawings and implementation modes.

[0030] Please refer to Figure 1 , Figure 2 , Figure 3 , Figure 4 and Figure 5 ,in, Figure 1 A schematic structural diagram of a preferred embodiment of the integrated probe and test probe module provided by the utility model; Figure 2 A schematic diagram of the structure of a limit ring is provided for the utility model; Figure 3 A structural schematic diagram of a spring is provided for the utility model; Figure 4 A structural schematic diagram of a handle is provided for the utility model; Figure 5 Provided for the utility model Figure 4 An enlarged view of point A is shown. The integrated probe and test probe module comprises: a connecting plate 1;

[0031] A probe shell 2, wherein the probe shell 2 is fixedly connected to the top of the connecting plate 1, a plurality of limiting rings 13 are fixedly connected to the bottom of the inner wall of the probe shell 2, a connecting flange 14 is installed inside each limiting ring 13, a spring 15 is fixedly connected to the top of the connecting flange 14, a connecting rod 18 is fixedly connected to the top of the spring 15, the other end of the connecting rod 18 is fixedly connected to a limiting disk 16, the top of the limiting disk 16 is fixedly connected to a probe 10, and a contact head 17 is installed on the top of the probe 10;

[0032] A sealing plate 11, wherein the sealing plate 11 is mounted on the top of the probe housing 2, and a plurality of limiting holes 12 are formed on the top of the sealing plate 11;

[0033] The probe 10 passes through the limiting hole 12, and the limiting plate 16 contacts the bottom of the sealing plate 11. The movement of the probe 10 inside the limiting hole 12 can increase the stability of the movement. The contact head 17 is convenient for the probe 10 to be powered on. The spring 15 provides supporting force and also powers the material. The sealing plate 11 is connected to the probe shell 2 by bolts.

[0034] A power block is provided at the bottom of the connecting plate 1, and the limiting ring 13 is connected to the power block at the bottom of the connecting plate 1;

[0035] The integral probe is tested through the limiting ring 13 and the connecting plate 1 .

[0036] A test probe module further includes a test shell 9, both sides of the test shell 9 are fixedly connected with a mounting plate 4, and the top of the mounting plate 4 is provided with two mounting holes 21;

[0037] The mounting hole 21 is provided with threads inside, which is convenient for threaded connection with the mounting bolt 3. The shape of the test shell 9 is referenced Figure 1 or Figure 4 .

[0038] The top of the mounting plate 4 is threadedly connected with two mounting bolts 3, and the front of the test shell 9 is provided with a bayonet 20;

[0039] The shape of the bayonet 20 is the shape formed by the connecting plate 1 and the probe housing 2 .

[0040] The top of the test shell 9 is provided with a plurality of openings 22, and the back of the test shell 9 is fixedly connected with a connecting rod 5;

[0041] Position reference of connecting rod 5 Figure 4 The diameter of the through opening 22 is the same as that of the limiting hole 12.

[0042] The top of the connecting rod 5 is rotatably connected to a pressing plate 8 through a hinge 6, a docking plate 7 is installed on the front of the pressing plate 8, and a handle 19 is installed on the back of the pressing plate 8;

[0043] A power block in contact with the contact head 17 is installed at the bottom of the docking plate 7 .

[0044] The working principle of the integrated probe and test probe module provided by the utility model is as follows:

[0045] First, a connecting plate 1 is installed at the bottom of the probe shell 2 to facilitate the power supply to the probe 10 inside the probe shell 2. A plurality of limiting rings 13 are installed inside the probe shell 2, and connecting bosses 14 are installed inside the limiting rings 13. A limiting disk 16 is installed at the top of each connecting boss 14 through a spring 15 and a connecting rod 18. Then, it is only necessary to install the probe 10 with the contact head 17 on the limiting disk 16. After the preparation is completed, it is only necessary to install the sealing plate 11 with the limiting hole 12 on the top of the probe shell 2, and let the probe 10 pass through the limiting hole 12. Then, the connecting plate 1 and the probe shell 2 are clamped to the bottom of the test shell 9, and the integrated probe can be tested. The probe 10 is restricted by the limiting hole 12 during the up and down movement. Then, the up and down movement can avoid the angle or direction of the probe 10 from being offset during the test process.

[0046] Compared with the related art, the integrated probe and test probe module provided by the utility model have the following beneficial effects:

[0047] In order to increase the accuracy of data during the integrated probe test, a connecting plate 1 is first installed at the bottom of the probe shell 2 to facilitate the power supply to the probe 10 inside the probe shell 2, and multiple limiting rings 13 are installed inside the probe shell 2, and connecting bosses 14 are installed inside the limiting rings 13, and limiting disks 16 are installed on the top of each connecting boss 14 through springs 15 and connecting rods 18. Then, it is only necessary to install the probe 10 with the contact head 17 on the limiting disk 16. After the preparation is completed, it is only necessary to install the sealing plate 11 with the limiting hole 12 on the top of the probe shell 2, and let the probe 10 pass through the limiting hole 12, and then the connecting plate 1 and the probe shell 2 are clamped to the bottom of the test shell 9, and the integrated probe can be tested. The probe 10 is restricted by the limiting hole 12 during the up and down movement. Then, the up and down movement can avoid the angle or direction of the probe 10 from being offset during the test process. Through this structure, when the probe 10 is tested, it is beneficial to improve the stability of the probe 10 activity and the accuracy of the test data.

[0048] The above description is only an embodiment of the present invention, and does not limit the patent scope of the present invention. Any equivalent structure or equivalent process transformation made by using the contents of the specification and drawings of the present invention, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. An integrated probe, characterized in that: include: Connecting plate; A probe shell, wherein the probe shell is fixedly connected to the top of the connecting plate, a plurality of limiting rings are fixedly connected to the bottom of the inner wall of the probe shell, a connecting convex disk is installed inside each limiting ring, a spring is fixedly connected to the top of the connecting convex disk, a connecting rod is fixedly connected to the top of the spring, the other end of the connecting rod is fixedly connected to the limiting disk, a probe is fixedly connected to the top of the limiting disk, and a contact head is installed on the top of the probe; A sealing plate is installed on the top of the probe housing, and a plurality of limiting holes are formed on the top of the sealing plate.

2. The integrated probe according to claim 1, characterized in that: A power-carrying block is arranged at the bottom of the connecting plate, and the limiting ring is connected to the power-carrying block at the bottom of the connecting plate.

3. A test probe module, comprising the integrated probe according to any one of claims 1 to 2, characterized in that: It also includes a test shell, both sides of which are fixedly connected with mounting plates, and the top of the mounting plate is provided with two mounting holes.

4. A test probe module according to claim 3, characterized in that: The top of the mounting plate is threadedly connected with two mounting bolts, and the front of the test shell is provided with a bayonet.

5. A test probe module according to claim 3, characterized in that: The top of the test shell is provided with a plurality of through openings, and the back of the test shell is fixedly connected with a connecting rod.

6. A test probe module according to claim 5, characterized in that: The top of the connecting rod is rotatably connected with a pressing plate through a hinge, a docking plate is installed on the front side of the pressing plate, and a handle is installed on the back side of the pressing plate.

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