Sample table device for vertical X-ray diffractometer

Abstract

The utility model relates to the technical field of material analysis and detection, in particular to a sample table device for a vertical X-ray diffractometer, which comprises a sample table adapter, a sample table base fixedly mounted at the bottom of the front side of the sample table adapter, and a reference surface rear adjusting seat fixedly mounted on the front side of the sample table adapter, a first light blocking cutter base is fixedly installed at the top of the front face of the sample table adapter, a primary light blocking cutter is fixedly installed at the bottom of the first light blocking cutter base, a second light blocking cutter base is fixedly installed on the right side of the sample table base, and a secondary light blocking cutter is fixedly installed at the top of the second light blocking cutter base. And a sample height adjusting mechanism is fixedly mounted at the bottom of the sample table base. According to the utility model, the adjustable primary light blocking knife and the secondary light blocking knife are adopted, so that the primary light blocking knife and the secondary light blocking knife can act simultaneously, and incident X-rays scattered by blocking backgrounds can be accurately controlled so as to reduce background interference, thereby improving the quality of diffraction signals.

Description

Technical Field

[0001] The utility model relates to the technical field of material analysis and detection, in particular to a sample stage device used in a vertical X-ray diffractometer. Background Art

[0002] X-ray diffraction technology is widely used in materials science, geology, biology and other fields to analyze crystal structure, material properties, etc. Sample stage devices are used during material analysis.

[0003] X-ray diffraction is achieved by irradiating a sample so that the atoms or crystal structures in the sample diffract the X-rays to form a diffraction pattern. However, during the measurement process, background scattering may be generated outside the sample or by the diffraction instrument itself, thereby reducing the clarity and accuracy of the signal. Background scattering is mainly caused by factors such as scattering outside the sample, scattering by the diffraction instrument, and scattering by the X-ray tube. These background scatterings will reduce the clarity of the diffraction signal and affect the accuracy and reliability of the experimental results. In order to solve the above technical problems, we have designed a sample stage device for use in a vertical X-ray diffractometer. Utility Model Content

[0004] The purpose of the utility model is to provide a sample stage device for a vertical X-ray diffractometer, which has the advantage of reducing background scattering during measurement and solves the problem that background scattering may be generated outside the sample or in the diffraction instrument itself, thereby reducing the clarity and accuracy of the signal.

[0005] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a sample stage device for a vertical X-ray diffractometer, comprising a sample stage adapter, a sample stage base is fixedly installed on the bottom of the front side of the sample stage adapter, a reference surface rear adjustment seat is fixedly installed on the front side of the sample stage adapter, a first light blocking knife base is fixedly installed on the top of the front side of the sample stage adapter, a primary light blocking knife is fixedly installed on the bottom of the first light blocking knife base, a second light blocking knife base is fixedly installed on the right side of the sample stage base, a secondary light blocking knife is fixedly installed on the top of the second light blocking knife base, a sample height adjustment mechanism is fixedly installed on the bottom of the sample stage base, and a sample cup is movably installed on the top of the sample stage base.

[0006] Preferably, the sample stage adapter is fixed on the goniometer of the vertical X-ray diffractometer, and a groove is provided on the front side of the reference surface rear adjustment seat.

[0007] Preferably, a reference surface front adjustment seat is fixedly installed on the front side of the sample stage base, and a rotating disk is fixedly connected to the bottom of the sample height adjustment mechanism.

[0008] Preferably, the tops of the reference surface front adjustment seat and the reference surface rear adjustment seat are penetrated by adjustment screw rods, and the number of the adjustment screw rods is three.

[0009] Preferably, a mounting rod is fixedly installed on the top of the primary light-blocking knife, and a positioning bolt is installed through the left side of the first light-blocking knife base.

[0010] Compared with the prior art, the beneficial effects of the utility model are as follows:

[0011] The utility model adopts the coordination of the sample stage adapter, the sample stage base, the reference surface rear adjustment seat, the first light shielding knife base, the primary light shielding knife, the reference surface front adjustment seat, the secondary light shielding knife, the second light shielding knife base, the sample height adjustment mechanism and the sample cup. The device adopts the adjustable primary light shielding knife and the secondary light shielding knife so that they can act at the same time, and can accurately control the incident X-rays scattered by shielding the background to reduce the background interference, thereby improving the quality of the diffraction signal. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] Figure 1 It is a three-dimensional diagram of the structure of the utility model;

[0013] Figure 2 It is a right side view schematic diagram of the structure of the utility model;

[0014] Figure 3 It is a left-side stereoscopic diagram of the structure of the utility model;

[0015] Figure 4 It is a schematic diagram of the main structure of the utility model.

[0016] In the figure: 1. Sample stage adapter; 2. Sample stage base; 3. Reference surface rear adjustment seat; 4. First light shielding knife base; 5. Primary light shielding knife; 6. Reference surface front adjustment seat; 7. Secondary light shielding knife; 8. Second light shielding knife base; 9. Sample height adjustment mechanism; 10. Sample cup. DETAILED DESCRIPTION

[0017] See also Figure 1-Figure 4 A sample stage device for a vertical X-ray diffractometer comprises a sample stage adapter 1, a sample stage base 2 is fixedly mounted on the bottom of the front side of the sample stage adapter 1, a reference surface rear adjustment seat 3 is fixedly mounted on the front side of the sample stage adapter 1, a first light blocking knife base 4 is fixedly mounted on the top of the front side of the sample stage adapter 1, a primary light blocking knife 5 is fixedly mounted on the bottom of the first light blocking knife base 4, a second light blocking knife base 8 is fixedly mounted on the right side of the sample stage base 2, a secondary light blocking knife 7 is fixedly mounted on the top of the second light blocking knife base 8, a sample height adjustment mechanism 9 is fixedly mounted on the bottom of the sample stage base 2, and a sample cup 10 is movably mounted on the top of the sample stage base 2.

[0018] See also Figure 1 and Figure 3 The sample stage adapter 1 is fixed on the goniometer of the vertical X-ray diffractometer, and a groove is provided on the front side of the reference plane rear adjustment seat 3. The groove is provided to facilitate the up and down movement of the primary light blocking knife 5 to prevent the reference plane rear adjustment seat 3 from blocking the primary light blocking knife 5.

[0019] See also Figure 1 and Figure 3 A reference surface front adjustment seat 6 is fixedly installed on the front side of the sample stage base 2, and a rotating disk is fixedly connected to the bottom of the sample height adjustment mechanism 9. By setting the rotating disk, it is convenient for the user to rotate the sample height adjustment mechanism 9 so as to adjust the height of the sample cup 10.

[0020] See also Figure 1 , Figure 3 and Figure 4 The tops of the reference surface front adjustment seat 6 and the reference surface rear adjustment seat 3 are both penetrated with adjustment screw rods, and the number of the adjustment screw rods is three. By setting the adjustment screw rods, the reference plane of the sample cup 10 can be adjusted.

[0021] See also Figure 1 , Figure 2 , Figure 3 and Figure 4 A mounting rod is fixedly installed on the top of the primary light blocking knife 5, and a positioning bolt is installed through the left side of the first light blocking knife base 4. By setting the mounting rod, the primary light blocking knife 5 can be positioned during installation so as to install the primary light blocking knife 5 on the first light blocking knife base 4.

[0022] During use, the user first fixes the sample stage adapter 1 on the goniometer of the vertical X-ray diffractometer, and then places the sample into the sample cup 10. Then the user adjusts the sample height adjustment mechanism 9 to adjust the height of the sample cup 10. After adjusting the position of the sample cup 10, the sample cup 10 is adjusted by the adjustment screws on the rear adjustment seat 3 and the front adjustment seat 6 of the reference plane to accurately adjust the reference plane of the sample cup 10. During measurement, the user can adjust the first light blocking knife base 4 or the second light blocking knife base 8 according to the irradiation situation, so that the first light blocking knife base 4 can drive the primary light blocking knife 5 to move up and down, so that the height of the primary light blocking knife 5 can be adjusted according to the needs. At the same time, the second light blocking knife base 8 can also drive the secondary light blocking knife 7 to move up and down, so that the height of the second light blocking knife base 8 can be adjusted according to the needs, thereby reducing the influence of background scattering on the sample during measurement.

[0023] In summary, the sample stage device used in the vertical X-ray diffractometer solves the problem that background scattering may be generated outside the sample or the diffraction instrument itself, thereby reducing the clarity and accuracy of the signal, through the cooperation of the sample stage adapter 1, the sample stage base 2, the reference surface rear adjustment seat 3, the first light shielding knife base 4, the primary light shielding knife 5, the reference surface front adjustment seat 6, the secondary light shielding knife 7, the second light shielding knife base 8, the sample height adjustment mechanism 9 and the sample cup 10.

Claims

1. A sample stage device for a vertical X-ray diffractometer, comprising a sample stage adapter (1), characterized in that: A sample stage base (2) is fixedly mounted on the bottom of the front side of the sample stage adapter (1); a reference surface rear adjustment seat (3) is fixedly mounted on the front side of the sample stage adapter (1); a first light-blocking knife base (4) is fixedly mounted on the top of the front side of the sample stage adapter (1); a primary light-blocking knife (5) is fixedly mounted on the bottom of the first light-blocking knife base (4); a second light-blocking knife base (8) is fixedly mounted on the right side of the sample stage base (2); a secondary light-blocking knife (7) is fixedly mounted on the top of the second light-blocking knife base (8); a sample height adjustment mechanism (9) is fixedly mounted on the bottom of the sample stage base (2); and a sample cup (10) is movably mounted on the top of the sample stage base (2).

2. The sample stage device for a vertical X-ray diffractometer according to claim 1, characterized in that: The sample stage adapter (1) is fixed on the goniometer of the vertical X-ray diffractometer, and a groove is provided on the front side of the reference surface rear adjustment seat (3).

3. The sample stage device for a vertical X-ray diffractometer according to claim 1, characterized in that: A reference surface front adjustment seat (6) is fixedly mounted on the front side of the sample stage base (2), and a rotating disk is fixedly connected to the bottom of the sample height adjustment mechanism (9).

4. The sample stage device for a vertical X-ray diffractometer according to claim 3, characterized in that: The tops of the reference surface front adjustment seat (6) and the reference surface rear adjustment seat (3) are both penetrated by adjustment screw rods, and the number of the adjustment screw rods is three.

5. The sample stage device for a vertical X-ray diffractometer according to claim 1, characterized in that: A mounting rod is fixedly mounted on the top of the primary light blocking knife (5), and a positioning bolt is penetrated and mounted on the left side of the first light blocking knife base (4).

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